CN114264867A - Method for switching operation mode and production test mode of electronic equipment - Google Patents
Method for switching operation mode and production test mode of electronic equipment Download PDFInfo
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- CN114264867A CN114264867A CN202111537011.XA CN202111537011A CN114264867A CN 114264867 A CN114264867 A CN 114264867A CN 202111537011 A CN202111537011 A CN 202111537011A CN 114264867 A CN114264867 A CN 114264867A
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 36
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- 238000006243 chemical reaction Methods 0.000 claims description 17
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- 230000007547 defect Effects 0.000 abstract description 4
- 238000003745 diagnosis Methods 0.000 description 8
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Abstract
The invention discloses a method for switching an operation mode and a production test mode of electronic equipment, which comprises the following steps: step one, switching a specific working voltage V in a setting mode of the electronic equipment1Said specific operating voltage V1Belonging to the rated working voltage V of electronic equipmentrWithin the range and not equal to the standard fixed voltage V of the electronic equipment0(ii) a Step two, working voltage is accessed to the electronic equipment through an equipment power interface, and the external power voltage sampling circuit identifies the working voltage; step three, the external power supply voltage sampling circuit compares the working voltage with a standard fixed voltage V0Or a specific operating voltage V1And calling a corresponding mode program to switch the running mode or the production test mode. The electronic equipment is more convenient to switch the operation mode and the production test mode, the switching can be completed by changing the input voltage through the power interface, and the defects in the traditional scheme are overcome.
Description
Technical Field
The invention particularly relates to a method for switching an operation mode and a production test mode of electronic equipment.
Background
There are generally two modes of operation of an embedded electronic device, namely an operational mode and a production test mode. Different modes invoke different handlers. The operation mode is a working mode of the embedded electronic equipment in a normal use state. The production test mode is a working mode in which the embedded electronic equipment tests, verifies or calibrates the functions of the embedded electronic equipment in the production process or the debugging process.
The existing methods for switching the operation mode and the production test mode of the embedded electronic device include the following steps:
1) mode switching is realized by a method of independently burning different working mode programs. The method separates the run mode program and the production test mode program of the device. In the production process, a production test mode program is burnt, and after the test diagnosis is finished, an operation mode program is burnt. The method not only needs to reserve a program burning interface, but also can prolong the whole production time of the equipment and increase the production cost. In addition, when a problem occurs in the use of the device, the device failure cannot be diagnosed by using the production test mode.
2) Mode switching is realized by a method of reserving equipment measuring points. In the method, a test fixture is used in the production process of the embedded electronic equipment, and the equipment is switched into a production test mode by detecting a test point signal of an equipment circuit board. And after the equipment test and diagnosis are finished, removing the test fixture, restarting the equipment, and entering an operation mode. The method can enter a production test mode only by contacting the test jig with the test points reserved on the circuit control board of the equipment, so that the defect that the equipment fault can not be diagnosed by using the production test mode when the equipment has problems in the use process is also existed.
3) Mode switching is realized through a key or a dial switch inside the equipment. In the production process of the embedded electronic equipment, a key or a dial switch in the equipment is touched through an interface reserved at the shell of the equipment, and the key or the dial switch is set to be in an appointed state, so that the equipment is switched to enter a production test mode. And after the test diagnosis of the equipment is completed, the original state of a key or a dial switch in the equipment is recovered, and the equipment is switched back to the running mode. The method needs to reserve a key or a dial switch interface on the equipment shell, so that the sealing performance of the equipment shell is influenced, and the design and production cost of the equipment shell is additionally increased.
4) Mode switching is achieved through combined operation of existing keys outside the device. The method enables a tester to operate according to a preset key sequence in the production process of the embedded electronic equipment, and calls a program to switch to a production test mode. The possibility that a user enters a production test mode due to misoperation in the normal use process of the equipment is existed, the operation difficulty is increased by setting a complex key combination operation, and the whole test time of the equipment is prolonged.
The switching of the operation mode and the production test mode of the above-mentioned several electronic devices has drawbacks.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide a switching method for conveniently switching an operation mode and a production test mode of electronic equipment.
In order to achieve the purpose, the invention provides the following technical scheme:
a method for switching an operation mode and a production test mode of electronic equipment comprises the following steps:
step one, switching a specific working voltage V in a setting mode of the electronic equipment1Said specific operating voltage V1Belonging to the rated working voltage V of electronic equipmentrWithin the range and not equal to the standard fixed voltage V of the electronic equipment0；
Step two, working voltage is accessed to the electronic equipment through an equipment power interface, and the external power voltage sampling circuit identifies the working voltage;
step three, the external power supply voltage sampling circuit compares the working voltage with a standard fixed voltage V0Or a specific operating voltage V1And calling a corresponding mode program to switch the running mode or the production test mode.
The external power supply voltage sampling circuit comprises a processor, a digital-to-analog conversion controller, a first resistor R1 and a second resistor R2, wherein one end of the first resistor R1 is connected with an external power supply through an equipment power interface, the other end of the first resistor R1 is electrically connected with the input ends of the second resistor R2 and the digital-to-analog conversion controller respectively, and the digital-to-analog conversion controller is electrically connected with the processor.
The specific operating voltage V1The external power supply voltage sampling circuit has a function of identifying a waveform for a specific waveform operating voltage.
The waveform of the specific waveform working voltage is a square wave.
And the high and low levels of the specific waveform working voltage waveform are input to the electronic equipment through serial differencing processing.
The serial differencing process comprises the steps of:
step one, setting voltage offset Voffset；
Step two, the high level is adjusted to be output first for duration T0High voltage V ofh＝V0+VoffsetThen outputs the duration T0Low voltage V ofl＝V0-Voffset；
Step three, adjusting the low level to output duration 2T0Standard fixed voltage V of0。
The voltage offset VoffsetLess than or equal to the standard fixed voltage V010% of the total.
The invention has the beneficial effects that: the electronic equipment is more convenient to switch the operation mode and the production test mode, the switching can be completed by changing the input voltage through the power interface, and the defects in the traditional scheme are overcome.
Drawings
Fig. 1 is a circuit diagram of an external power voltage sampling circuit according to the present invention.
Fig. 2 is a flow chart of device mode switching according to the present invention.
FIG. 3 is a diagram of specific waveforms for mode switching according to the present invention.
FIG. 4 is a schematic diagram of the mode-switching specific waveform differencing process of the present invention.
FIG. 5 is a schematic diagram of mode-switching specific waveform differencing noise immunity in accordance with the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that all the directional indicators (such as up, down, left, right, front, and rear … …) in the embodiment of the present invention are only used to explain the relative position relationship between the components, the movement situation, etc. in a specific posture (as shown in the drawing), and if the specific posture is changed, the directional indicator is changed accordingly.
In the present invention, unless otherwise expressly stated or limited, the terms "connected," "secured," and the like are to be construed broadly, and for example, "secured" may be a fixed connection, a removable connection, or an integral part; can be mechanically connected or connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In addition, the descriptions related to "first", "second", etc. in the present invention are only for descriptive purposes and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present invention.
A method for switching an operation mode and a production test mode of electronic equipment comprises the following steps:
step one, switching a specific working voltage V in a setting mode of the electronic equipment1Said specific operating voltage V1Belonging to the rated working voltage V of electronic equipment1Within the range and not equal to the standard fixed voltage V of the electronic equipment0；
Step two, working voltage is accessed to the electronic equipment through an equipment power interface, and the external power voltage sampling circuit identifies the working voltage;
step three, the external power supply voltage sampling circuit compares the working voltage with a standard fixed voltage V0Or a specific operating voltage V1And calling a corresponding mode program to switch the running mode or the production test mode.
The first embodiment is as follows:
let the standard fixed voltage used by the electronic equipment be V0Rated operating voltage range of VE＝VuPlus or minus 20%, setting the specific working voltage for mode switching to be V1∈VE. When the equipment needs to enter the operation mode, the standard fixed voltage V is accessed to the equipment through the power supply interface of the equipment0External power supply voltage sampling circuit identification V0Then, calling an equipment operation mode program to enable the equipment to enter an operation mode; when the equipment needs to enter a test diagnosis mode, the specific working voltage is switched to be V for the access mode of the equipment through the power interface of the equipment1External power supply voltage sampling circuit identification V1And calling a device test diagnosis program to enable the device to enter a test diagnosis mode.
As shown in fig. 1, the external power voltage sampling circuit includes a processor, a digital-to-analog conversion controller, a first resistor R1, and a second resistor R2, where one end of the first resistor R1 is connected to an external power source through an equipment power interface, the other end of the first resistor R1 is electrically connected to the second resistor R2 and the input end of the digital-to-analog conversion controller, and the digital-to-analog conversion controller is electrically connected to the processor.
Let the first resistance be R1The second resistance value is R2Reference voltage of D/A converter is VrefThe sampling precision is n bits. When the power interface of the equipment is connected with a standard fixed voltage V0When the voltage on the input pin of the digital-to-analog conversion controller is
The conversion result of the digital-to-analog conversion controller is
When the power interface of the equipment is switched into the mode, the specific working voltage is switchedV1When the voltage on the input pin of the digital-to-analog conversion controller is
The conversion result of the digital-to-analog conversion controller is
As shown in FIG. 2, the processor repeatedly polls the DAC controller to obtain the conversion result value ADC of the voltage signal on its input pin0…ADCnAnd then carrying out data jitter removal by a data windowing average mode to obtain data
Then will be
And ADC0Make a comparison if
Within its predetermined range epsilon0In this case, the calling program enters the run mode. If not in the predetermined range ε0In the interior, then will
And ADC1Make a comparison if
Within its predetermined range epsilon1The program is called to enter a diagnostic test mode.
Example two:
inputting the specific operating voltage V of the electronic device based on the first embodiment1In this embodiment, a waveform decoding program is set in the processor of the external power voltage sampling circuit, or an additional waveform decoding module may be additionally provided to identify and compare waveforms. When the equipment needs to be in the operation mode, the standard fixed voltage V is provided for the equipment0(ii) a When the equipment needs to enterIn the test diagnosis mode, a specific waveform operating voltage different from a standard fixed voltage is provided for the device. The internal part of the device determines which program is called to enter a specific working mode by matching an external power supply voltage sampling circuit with an internal software waveform decoding program.
As shown in FIG. 3, the present embodiment mode switches the specific waveform frequency selection f0∈[80Hz，160Hz]The specific waveform for mode switching is square wave, and may also be sine wave, cosine wave or combination of square wave and sine wave, with period T0＝1/f0Amplitude of A0The specific square wave sequence is repeatedly output, 1 represents high, 0 represents low, and the period of the specific square wave sequence in the example is T-6T0The corresponding number is encoded as 001101.
When the standard fixed voltage V provided by the external DC power supply0When large fluctuation exists, the voltage conversion result value obtained by the external power supply voltage sampling circuit in the equipment also fluctuates greatly. In this case, the software inside the device may erroneously recognize some voltage fluctuations as the external access mode switching specific operating voltage, resulting in false triggering of the device switching into the test diagnosis mode. The electronic equipment operation mode and the test diagnosis mode are switched by decoding the specific waveform working voltage, so that the mode switching caused by voltage fluctuation can be effectively avoided.
Example three:
in the second embodiment, serial differentiation processing is performed on the high and low levels of the specific waveform operating voltage waveform, and the standard fixed voltage used by the embedded electronic device is set as V0The voltage offset of the level differentiation process is Voffset≤V0X 10%. If necessary, outputting the duration T0High level of (1), first outputting a high voltage Vh＝V0+VoffsetDuration T0Then outputs a low voltage Vl＝V0-VoffsetAnd again for a time T0. If necessary, outputting the duration T0Low level of (3), then the output voltage V0Duration 2T0。
As shown in fig. 4It is shown that the voltage value of the device operating voltage waveform after the differentiation processing of the specific waveform shown in FIG. 3 is V0、VhOr VlAnd (4) fluctuating upwards.
The voltage value of the equipment power interface is obtained at regular time through an external power voltage sampling circuit, and a voltage data set V is formed by sequentially caching1…Vn. From V1At the beginning, 2 data V are fetched at a timemAnd Vm+1Making a comparison if Vm+1-Vm＞VoffsetX 2 x 80%, then data bit 1 is considered received; if Vm+1-Vm＜VoffsetX 2 x 20%, then data bit 0 is considered received; if none of the above conditions is true, skipping the current 1 st data VmRetrieve 1 data Vm+2Then, the above determination is made again. After the waveform reception decoding of the duration T is continuously completed, the received code starts to be compared with the code corresponding to the actual mode switching specific waveform, as shown in fig. 3 as code 001101. If the difference exists, the received voltage data is continuously decoded and compared with the code. If the two are the same, the module switching condition is considered to be triggered, and the calling program enters a diagnostic test mode.
After serial differentiation processing is carried out on high and low levels of specific waveform working voltage waveform, the noise duration T is obtainedE＞2T0And the anti-noise performance is good under the condition of covering the single period of the original signal. As shown in fig. 5, after the original waveform is superimposed with noise, the difference between two adjacent sampling points and the original sampling difference of the original waveform are changed slightly, and still exceed the high-level signal judgment threshold represented by the original waveform, and the received data bit after decoding is still 1.
The examples should not be construed as limiting the present invention, but any modifications made based on the spirit of the present invention should be within the scope of protection of the present invention.
Claims (7)
1. A method for switching an operation mode and a production test mode of electronic equipment is characterized in that: the method comprises the following steps:
step one, switching a specific working voltage V in a setting mode of the electronic equipment1Said specific operating voltage V1Belonging to the rated working voltage V of electronic equipmentrWithin the range and not equal to the standard fixed voltage V of the electronic equipment0；
Step two, working voltage is accessed to the electronic equipment through an equipment power interface, and the external power voltage sampling circuit identifies the working voltage;
step three, the external power supply voltage sampling circuit compares the working voltage with a standard fixed voltage V0Or a specific operating voltage V1And calling a corresponding mode program to switch the running mode or the production test mode.
2. The method of claim 1, wherein the method comprises: the external power supply voltage sampling circuit comprises a processor, a digital-to-analog conversion controller, a first resistor R1 and a second resistor R2, wherein one end of the first resistor R1 is connected with an external power supply through an equipment power interface, the other end of the first resistor R1 is electrically connected with the input ends of the second resistor R2 and the digital-to-analog conversion controller respectively, and the digital-to-analog conversion controller is electrically connected with the processor.
3. The method of claim 1, wherein the method comprises: the specific operating voltage V1The external power supply voltage sampling circuit has a function of identifying a waveform for a specific waveform operating voltage.
4. The method of claim 3, wherein the method comprises: the waveform of the specific waveform working voltage is a square wave.
5. The method for switching between an operation mode and a production test mode of an electronic device according to claim 4, wherein: and the high and low levels of the specific waveform working voltage waveform are input to the electronic equipment through serial differencing processing.
6. The method of claim 5, wherein the method comprises: the serial differencing process comprises the steps of:
step one, setting voltage offset Voffset；
Step two, the high level is adjusted to be output first for duration T0High voltage V ofh＝V0+VoffsetThen outputs the duration T0Low voltage V ofl＝V0-Voffset；
Step three, adjusting the low level to output duration 2T0Standard fixed voltage V of0。
7. The method of claim 6, wherein the method comprises: the voltage offset VoffsetLess than or equal to the standard fixed voltage V010% of the total.
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