CN114264867B - Method for switching operation mode and production test mode of electronic equipment - Google Patents
Method for switching operation mode and production test mode of electronic equipment Download PDFInfo
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- 238000012360 testing method Methods 0.000 title claims abstract description 48
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 39
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Abstract
The invention discloses a switching method of an electronic equipment operation mode and a production test mode, which comprises the following steps: step one, switching a specific operating voltage V in an electronic device setting mode 1 The specific operating voltage V 1 Belongs to rated operating voltage V of electronic equipment r Within a range and not equal to the standard fixed voltage V of the electronic equipment 0 The method comprises the steps of carrying out a first treatment on the surface of the Step two, the electronic equipment is connected with working voltage through an equipment power interface, and an external power voltage sampling circuit identifies the working voltage; step three, the external power supply voltage sampling circuit compares the working voltage with the standard fixed voltage V 0 Or a specific operating voltage V 1 And calling a corresponding mode program to switch an operation mode or a production test mode. The electronic equipment is more convenient to switch between the operation mode and the production test mode, and the switching can be completed by changing the input voltage through the power interface, so that the defects in the traditional scheme are overcome.
Description
Technical Field
The invention particularly relates to a switching method of an electronic equipment operation mode and a production test mode.
Background
Embedded electronic devices typically exist in two modes of operation, namely an operational mode and a production test mode. Different modes call different handlers. The operation mode is an operation mode of the embedded electronic device in a normal use state. And the production test mode is a working mode of the embedded electronic device for testing, verifying or calibrating the functions of the embedded electronic device in the production process or the debugging process.
The existing methods for switching between an operation mode and a production test mode of an embedded electronic device include the following methods:
1) Mode switching is realized by a method of independently burning programs in different working modes. The method separates the run mode program and the production test mode program of the device. In the production process, the production test mode program is burnt, and after the test diagnosis is finished, the operation mode program is burnt. The method not only needs to reserve a program burning interface, but also can prolong the whole production time of the equipment and increase the production cost. In addition, when a problem occurs in the equipment during use, the equipment failure cannot be diagnosed by using the production test mode.
2) And realizing mode switching by a method of reserving equipment measuring points. In the method, a test fixture is used in the production process of the embedded electronic equipment, and the equipment is switched into a production test mode by detecting the test point signals of the circuit board of the equipment. After the equipment test diagnosis is finished, the test fixture is removed, the equipment is restarted, and the operation mode is entered. The method can enter a production test mode only by contacting the test points reserved on the circuit control board of the equipment through the test fixture, so that the defect that the equipment failure can not be diagnosed by utilizing the production test mode when the equipment is in a problem in the use process is also overcome.
3) The mode switching is realized through the key or the dial switch in the equipment. In the production process of the embedded electronic equipment, an interface reserved at the equipment shell is used for touching a key or a dial switch in the equipment to set the key or the dial switch to a specified state, so that the equipment is switched to enter a production test mode. After the equipment test diagnosis is finished, the original state of the key or the dial switch in the equipment is restored, and the switching equipment returns to the running mode. The method needs to reserve a key or dial switch interface on the equipment shell, so that the tightness of the equipment shell can be influenced, and the design and production cost of the equipment shell can be additionally increased.
4) The mode switching is realized through the combined operation of the existing keys outside the equipment. According to the method, a tester operates according to the preset key sequence in the production process of the embedded electronic equipment, and the calling program is switched to the production test mode. The possibility that the user is switched into the production test mode due to misoperation in the normal use process of the equipment is increased, and the operation difficulty is increased by setting complex key combination operation, so that the overall test time of the equipment is prolonged.
The operation mode and the production test mode of the electronic equipment are all disadvantageous.
Disclosure of Invention
Aiming at the defects existing in the prior art, the invention aims to provide a switching method which is convenient for electronic equipment to switch an operation mode and a production test mode.
In order to achieve the above purpose, the present invention provides the following technical solutions:
a switching method of an electronic equipment operation mode and a production test mode comprises the following steps:
step one, setting a mode switching feature in an electronic deviceConstant operating voltage V 1 The specific operating voltage V 1 Belongs to rated operating voltage V of electronic equipment r Within a range and not equal to the standard fixed voltage V of the electronic equipment 0 ；
Step two, the electronic equipment is connected with working voltage through an equipment power interface, and an external power voltage sampling circuit identifies the working voltage;
step three, the external power supply voltage sampling circuit compares the working voltage with the standard fixed voltage V 0 Or a specific operating voltage V 1 And calling a corresponding mode program to switch an operation mode or a production test mode.
The external power supply voltage sampling circuit comprises a processor, a digital-to-analog conversion controller, a first resistor R1 and a second resistor R2, wherein one end of the first resistor R1 is connected with an external power supply through an equipment power interface, the other end of the first resistor R1 is respectively and electrically connected with the second resistor R2 and the input end of the digital-to-analog conversion controller, and the digital-to-analog conversion controller is electrically connected with the processor.
The specific operating voltage V 1 The external power supply voltage sampling circuit has a function of identifying a waveform for a specific waveform operation voltage.
The waveform of the specific waveform working voltage is a square wave.
The high and low levels of the specific waveform working voltage waveform are input to the electronic equipment through serial differentiation processing.
The serial differentiation processing includes the steps of:
step one, setting a voltage offset V offset ；
Step two, the high level is adjusted to be output for a duration T 0 High voltage V of (2) h ＝V 0 +V offset Re-outputting duration T 0 Low voltage V of (2) l ＝V 0 -V offset ；
Step three, the low level is adjusted to be output with the duration of 2T 0 Standard fixed voltage V of (2) 0 。
The voltage offset V offset Less than or equal to a standard fixed voltage V 0 10% of (C).
The invention has the beneficial effects that: the electronic equipment is more convenient to switch between the operation mode and the production test mode, and the switching can be completed by changing the input voltage through the power interface, so that the defects in the traditional scheme are overcome.
Drawings
Fig. 1 is a circuit diagram of an external power supply voltage sampling circuit of the present invention.
Fig. 2 is a device mode switching flowchart of the present invention.
Fig. 3 is a pattern switching specific waveform diagram of the present invention.
Fig. 4 is a schematic diagram of a mode switching specific waveform differential differentiation process according to the present invention.
FIG. 5 is a schematic diagram of anti-noise for the mode-switching specific waveform differentiation process of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be noted that all directional indicators (such as up, down, left, right, front, and rear … …) in the embodiments of the present invention are merely used to explain the relative positional relationship, movement, etc. between the components in a particular posture (as shown in the drawings), and if the particular posture is changed, the directional indicator is changed accordingly.
In the present invention, unless specifically stated and limited otherwise, the terms "connected," "affixed," and the like are to be construed broadly, and for example, "affixed" may be a fixed connection, a removable connection, or an integral body; the connection can be mechanical connection or connection; either directly or indirectly, through intermediaries, or both, may be in communication with each other or in interaction with each other, unless expressly defined otherwise. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to the specific circumstances.
Furthermore, descriptions such as those referred to as "first," "second," and the like, are provided for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implying an order of magnitude of the indicated technical features in the present disclosure. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In addition, the technical solutions of the embodiments may be combined with each other, but it is necessary to base that the technical solutions can be realized by those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should be considered to be absent and not within the scope of protection claimed in the present invention.
A switching method of an electronic equipment operation mode and a production test mode comprises the following steps:
step one, switching a specific operating voltage V in an electronic device setting mode 1 The specific operating voltage V 1 Belongs to rated operating voltage V of electronic equipment 1 Within a range and not equal to the standard fixed voltage V of the electronic equipment 0 ；
Step two, the electronic equipment is connected with working voltage through an equipment power interface, and an external power voltage sampling circuit identifies the working voltage;
step three, the external power supply voltage sampling circuit compares the working voltage with the standard fixed voltage V 0 Or a specific operating voltage V 1 And calling a corresponding mode program to switch an operation mode or a production test mode.
Embodiment one:
let the electronic equipment use a standard fixed voltage V 0 Its rated operating voltage range is V E ＝V u 20%, set the mode-switching specific operating voltage to V 1 ∈V E . When the equipment needs to enter an operation mode, the standard fixed voltage V is accessed to the equipment through the equipment power interface 0 External power supply voltage sampling circuit identifies V 0 After that, the device operation mode is invokedA program to cause the device to enter an operational mode; when the equipment needs to enter a test diagnosis mode, a specific working voltage is switched to be V for an access mode through the equipment power interface 1 External power supply voltage sampling circuit identifies V 1 And then, calling a device test diagnosis program to enable the device to enter a test diagnosis mode.
As shown in fig. 1, the external power supply voltage sampling circuit includes a processor, a digital-to-analog conversion controller, a first resistor R1, and a second resistor R2, where one end of the first resistor R1 is connected with an external power supply through a device power interface, and the other end is electrically connected with the second resistor R2 and the input end of the digital-to-analog conversion controller, and the digital-to-analog conversion controller is electrically connected with the processor.
Let the resistance of the first resistor be R 1 The resistance value of the second resistor is R 2 The reference voltage of the digital-to-analog converter is V ref The sampling precision is n bits. When the power interface of the equipment is connected with the standard fixed voltage V 0 When the voltage on the input pin of the digital-to-analog conversion controller isThe conversion result of the digital-to-analog conversion controller is +.>When the power interface of the equipment is connected to the mode switch, the specific working voltage V is switched 1 When the voltage on the input pin of the digital-to-analog conversion controller isThe conversion result of the digital-to-analog conversion controller is +.>
As shown in FIG. 2, the processor repeatedly polls the DAC controller to obtain the conversion result value ADC of the voltage signal on the input pin 0 …ADC n Then, data jitter is removed in a data windowing average mode to obtain dataThen will->And ADC (analog to digital converter) 0 Compare if->Within its predetermined range epsilon 0 In, the calling program enters the run mode. If not within the predetermined range epsilon 0 In the interior, will be->And ADC (analog to digital converter) 1 Compare if->Within its predetermined range epsilon 1 In this, the calling program enters a diagnostic test mode.
Embodiment two:
on the basis of the first embodiment, a specific operating voltage V of the electronic device is input 1 In this embodiment, a waveform decoding program is set in the processor of the external power supply voltage sampling circuit for a specific waveform operating voltage, and an additional waveform decoding module may be set to identify and compare waveforms. Providing a standard fixed voltage V to the device when the device is required to be in an operational mode 0 The method comprises the steps of carrying out a first treatment on the surface of the When the device needs to enter a test diagnostic mode, the device is provided with a specific waveform operating voltage that differs from a standard fixed voltage. The device determines what program to call to enter a specific working mode by the external power supply voltage sampling circuit in cooperation with an internal software waveform decoding program.
As shown in fig. 3, the mode switching specific waveform frequency of the present embodiment selects f 0 ∈[80Hz，160Hz]The mode switching specific waveform adopts square wave, or can adopt sine wave, cosine wave or combination of square wave and sine wave, and its period T 0 ＝1/f 0 Amplitude A 0 The specific square wave sequence is repeatedly output, wherein 1 represents high and 0 represents low, and the period of the specific square wave sequence is T=6T 0 Corresponding digital codeThe code is 001101.
When the external DC power supply provides the standard fixed voltage V 0 When larger fluctuation exists, the value of the voltage conversion result obtained by the external power supply voltage sampling circuit inside the equipment also has larger fluctuation. In this case, the device internal software may erroneously recognize that some voltage fluctuations are switching to a particular operating voltage for the external access mode, resulting in a false triggering of the device switch to the test diagnostic mode. The mode switching caused by voltage fluctuation can be effectively avoided by switching the operation mode and the test diagnosis mode of the electronic equipment by decoding the working voltage with the specific waveform.
Embodiment III:
on the basis of the second embodiment, the high and low levels of the specific waveform working voltage waveform are subjected to serial differentiation processing, and the embedded electronic equipment uses the standard fixed voltage as V 0 The voltage offset of the level difference differentiation treatment is V offset ≤V 0 X 10%. If the required output duration T 0 First outputs high voltage V h ＝V 0 +V offset Duration T 0 Then output low voltage V l ＝V 0 -V offset And again lasting for a time T 0 . If the required output duration T 0 Low level of (2), output voltage V 0 Duration 2T 0 。
As shown in FIG. 4, the voltage value of the differential device is V 0 、V h Or V l And (5) up-wave.
The voltage value of the equipment power interface is obtained at fixed time through an external power supply voltage sampling circuit, and is sequentially cached to form a voltage data set V 1 …V n . From V 1 Initially, 2 data V are taken out at a time m And V m+1 Comparing if V m+1 -V m ＞V offset X 2 x 80%, then data bit 1 is considered received; if V is m+1 -V m ＜V offset X 2 x 20), then data bit 0 is considered received; if none of the above conditions is met, skip the current 1 stData V m 1 data V is retrieved m+2 Then, the above-described judgment is made again. After the waveform reception decoding of the duration T is continuously completed, the received code is started to be compared with the code corresponding to the actual mode switching specific waveform, as shown in fig. 3 as code 001101. If there is a difference, the received voltage data is continued to be decoded and code compared. If the two are the same, the module switching condition is considered to trigger, and the calling program enters a diagnosis test mode.
Serial differentiation processing is carried out on the high level and the low level of the working voltage waveform of the specific waveform, and then the noise duration time T is calculated E ＞2T 0 And the noise immunity is good under the condition of covering a single period of the original signal. As shown in fig. 5, after the noise is superimposed on the original waveform, the difference between two adjacent sampling points has a smaller change from the original sampling difference of the original waveform, and still exceeds the high-level signal judgment threshold represented by the original waveform, and the data bit received after decoding is still 1.
The examples should not be construed as limiting the invention, but any modifications based on the spirit of the invention should be within the scope of the invention.
Claims (5)
1. A switching method of an electronic equipment operation mode and a production test mode is characterized in that: the method comprises the following steps:
step one, switching a specific operating voltage V in an electronic device setting mode 1 The specific operating voltage V 1 Belongs to rated operating voltage V of electronic equipment r Within a range and not equal to the standard fixed voltage V of the electronic equipment 0 The specific operating voltage V 1 Operating voltage for a specific waveform;
step two, the electronic equipment is connected with working voltage through an equipment power interface, and an external power voltage sampling circuit identifies the working voltage;
step three, the external power supply voltage sampling circuit compares the working voltage with the standard fixed voltage V 0 Or a specific operating voltage V 1 Calling a corresponding mode program to perform an operation mode or a production test modeSwitching of formula (I);
the high and low levels of the specific waveform working voltage waveform are input to the electronic equipment through serial differentiation processing; the serial differentiation processing includes the steps of:
step one, setting a voltage offset V offset ；
Step two, the high level is adjusted to be output for a duration T 0 High voltage V of (2) h ＝V 0 +V offset Re-outputting duration T 0 Low voltage V of (2) l ＝V 0 -V offset ；
Step three, the low level is adjusted to be output with the duration of 2T 0 Standard fixed voltage V of (2) 0 。
2. The method for switching between an operation mode and a production test mode of an electronic device according to claim 1, wherein: the external power supply voltage sampling circuit comprises a processor, a digital-to-analog conversion controller, a first resistor R1 and a second resistor R2, wherein one end of the first resistor R1 is connected with an external power supply through an equipment power interface, the other end of the first resistor R1 is respectively and electrically connected with the second resistor R2 and the input end of the digital-to-analog conversion controller, and the digital-to-analog conversion controller is electrically connected with the processor.
3. The method for switching between an operation mode and a production test mode of an electronic device according to claim 1, wherein: the external power supply voltage sampling circuit has a function of recognizing a waveform.
4. A method for switching between an operation mode and a production test mode of an electronic device according to claim 3, wherein: the waveform of the specific waveform working voltage is a square wave.
5. The method for switching between an operation mode and a production test mode of an electronic device according to claim 4, wherein: the voltage offset V offset Less than or equal to a standard fixed voltage V 0 10% of (C).
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