CN114226359A - Cleaning system and cleaning method for removing pollutants from battery test probe - Google Patents
Cleaning system and cleaning method for removing pollutants from battery test probe Download PDFInfo
- Publication number
- CN114226359A CN114226359A CN202111507962.2A CN202111507962A CN114226359A CN 114226359 A CN114226359 A CN 114226359A CN 202111507962 A CN202111507962 A CN 202111507962A CN 114226359 A CN114226359 A CN 114226359A
- Authority
- CN
- China
- Prior art keywords
- laser beam
- polluted
- face
- battery test
- pulse high
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
- B08B7/0035—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by radiant energy, e.g. UV, laser, light beam or the like
- B08B7/0042—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by radiant energy, e.g. UV, laser, light beam or the like by laser
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B13/00—Accessories or details of general applicability for machines or apparatus for cleaning
Abstract
The invention relates to the technical field of laser cleaning, in particular to a cleaning system and a cleaning method for removing pollutants of a battery test probe. The device comprises a clamping module, a cleaning module and a cleaning module, wherein the clamping module is used for clamping a battery test probe to be cleaned to expose a polluted end face to be cleaned; the semiconductor continuous laser beam emitting module is used for emitting semiconductor continuous laser beams to the polluted end face of the battery test probe to be cleaned so as to expand pollutants; and the pulse high-frequency laser beam transmitting module is used for transmitting a pulse high-frequency laser beam to the polluted end face of the battery test probe to be cleaned so as to break the pollutants. The invention utilizes the composite laser formed by the continuous laser beam and the pulse high-frequency laser to form high-frequency light particles, generates impact on a pollution layer, leads pollutants on a polluted end surface to fall off, achieves the aim of cleaning the polluted end surface, does not generate any damage to a battery test probe, has good cleaning effect and has great popularization value.
Description
Technical Field
The invention relates to the technical field of laser cleaning, in particular to a cleaning system and a cleaning method for removing pollutants of a battery test probe.
Background
With the development of science and technology and society, lithium batteries have become the mainstream of the battery industry due to the unique performance advantages of the lithium batteries. The lithium ion battery is widely applied to portable electrical appliances such as notebook computers, video cameras, mobile communication equipment and the like, and a high-capacity lithium ion battery is used in electric automobiles, the lithium ion battery is used as one of main power sources of the electric automobiles, the consumption of the lithium ion battery is greatly increased along with the popularization of the electric automobiles, the lithium ion battery is used for a battery test probe used in the steps of battery performance, current, aging test and the like in the generation process, the usage of the lithium ion battery test probe is rapidly consumed along with the increase of the output of the lithium ion battery, the consumption is greatly increased, the battery test probe is in a complex workshop environment in the generation process, a layer of pollutants is extremely easily formed on the surface of the battery test probe, the pollutants comprise electrolyte (the electrolyte is easily formed into white crystals at room temperature and then is adhered to the test probe), the pollutants such as metal oxides and the like, and the pollutants on the surface of the battery test probe greatly influence the test performance of the battery test probe in the test process, The method comprises the steps of testing efficiency and the service life of a battery test probe, easily forming impedance, causing inaccuracy of test data, prolonging the service life and performance of the battery test probe, quickly and conveniently and effectively cleaning electrolyte crystals and pollutants on the surface of the battery probe, becoming a key technical process for saving cost, improving yield and the like in battery production, and adopting a conventional method that the battery test probe is manually dismounted when the surface of the battery test probe is dirty or the electrolyte is crystallized, then manually cleaning and wiping the battery test probe by using an organic solvent, or manually cleaning and wiping the battery test probe by using a liquid solid strong impact method, a high-frequency ultrasonic cleaning method and the like to clean the dirty of the polluted electrolyte crystals and the like on the surface. The lithium battery test probe is generally made of high-quality copper materials, then the copper materials are subjected to carving treatment, a nickel-base plating film is plated on the copper materials, liquid solid strong impact cleaning and high-frequency ultrasonic cleaning are carried out, and a brush is cleaned to easily cause gold plating layer falling off, so that the detection performance is reduced.
For example, in the chinese invention patent "CN 202020239853.1" entitled "cleaning device and cleaning system for square lithium battery test probe and negative pressure suction nozzle", the cleaning device cleans contaminants on the battery test probe by high frequency ultrasound, and then cleans the contaminants by using negative pressure technology, but actually the battery test probe is vibrated by high frequency ultrasound, which easily causes damage to the gold plating layer. Moreover, the high-frequency ultrasonic wave cannot play any cleaning role on lipid attachments on the battery test probe, and can be cleaned only by secondary wiping.
Laser cleaning is a good cleaning method, but in the technical scheme disclosed at present, single pulse laser is adopted to clean the surface of an object to be cleaned. For example, a chinese utility model patent entitled "portable line scanning laser cleaning device" with patent number "CN 208495239U" introduces a laser cleaning device, in which a laser output head, a beam shaping structure and a focusing structure are sequentially arranged on a path of laser in a housing of the device; the laser output head is provided with a laser connecting end; the beam shaping structure adjusts the laser emitted by the laser output head into a linear light source; the focusing structure focuses the line light source on the surface of the workpiece; the laser output head is a collimation head; an electric control structure is also arranged in the shell and is connected with the laser, the beam shaping structure and the focusing structure. The device is with laser output head, beam shaping structure, focus structure integration in the shell, conveniently carries and handheld operation, and laser output head is connected the transmission laser with the laser instrument, and beam shaping structure adjusts laser for the line source shines focus structure, and focus structure compresses the light beam size with the line source, focuses on the work piece surface, washs the work piece. However, the device adopts single pulse laser, and the single pulse laser is used for cleaning the battery test probe, so that the battery test probe is locally heated, and the gold layer on the surface of the battery probe is cracked.
Disclosure of Invention
The present invention is directed to solving the above-mentioned shortcomings of the prior art, and provides a cleaning system and a cleaning method for removing contaminants from a battery test probe.
The technical scheme of the invention is as follows: a cleaning system for removing contaminants from a battery test probe includes,
the clamping module is used for clamping the battery test probe to be cleaned to expose the polluted end face to be cleaned;
the semiconductor continuous laser beam emitting module is used for emitting continuous laser beams to the polluted end face to expand pollutants;
and the pulse high-frequency laser beam transmitting module is used for transmitting a pulse high-frequency laser beam to the polluted end face to break the pollutants.
Further the semiconductor continuous laser beam emitting module includes,
the continuous laser emitting module is used for emitting continuous laser beams;
the first beam expander is positioned on the light path of the continuous laser beam and is used for expanding the continuous laser beam;
the first focusing lens is positioned on the light path of the continuous laser beam and behind the first beam expander and used for focusing the expanded continuous laser beam and adjusting the focus position;
and the irradiation range adjusting module is used for adjusting the transmission path and the irradiation range of the focused continuous laser beam.
Further the illumination range adjusting module comprises a light source,
the X-axis scanning lens is positioned behind the first focusing lens and used for changing the X-direction position of the light spot reflected to the polluted end face;
and the Y-axis scanning lens is positioned behind the first focusing lens and is parallel to the X-axis scanning lens, and is used for reflecting the focused continuous laser beam to the polluted end face in cooperation with the X-axis scanning lens and adjusting the Y-direction position of the light spot reflected to the polluted end face by changing the deflection angle.
Further the pulsed high frequency laser beam emitting module includes,
the pulse high-frequency laser emission module is used for generating pulse high-frequency laser beams;
the second beam expander is positioned on the light path of the pulse high-frequency laser beam and is used for expanding the pulse high-frequency laser beam;
and the second focusing lens is positioned on the light path of the pulse high-frequency laser beam and behind the second beam expanding lens and is used for focusing the expanded pulse high-frequency laser beam and adjusting the position of a focus.
The method further comprises the following steps of,
and the beam combining mirror is positioned on the light paths of the continuous laser beam and the pulse high-frequency laser beam and is used for combining the focused continuous laser beam and the focused pulse high-frequency laser beam to form a composite laser beam irradiated on the polluted end face.
The continuous laser emission module further comprises a semiconductor continuous laser for emitting continuous laser beams with the wavelength of 808nm-915 nm.
The pulse high-frequency laser emission module further comprises a pulse laser used for emitting pulse high-frequency laser beams with the wavelength of 1060nm-1070 nm.
Further included is a vacuum adsorption module for adsorbing contaminants dislodged from the battery test probes.
A cleaning method of a cleaning system for removing pollutants from a battery test probe comprises the steps of fixing the battery test probe to be cleaned, exposing a polluted end face, emitting continuous laser beams by a semiconductor continuous laser beam emitting module, emitting pulse high-frequency laser beams by a pulse high-frequency laser beam emitting module, combining the continuous laser beams and the pulse high-frequency laser beams to form a composite laser beam, collecting the composite laser beam to the polluted end face until a pollution layer on the polluted end face is completely removed, and cleaning the pollutants from the battery test probe.
The method further comprises the following steps:
1) fixing the battery test probe to be cleaned, and exposing the polluted end face;
2) the semiconductor continuous laser beam emitting module emits continuous laser beams, the continuous laser beams are expanded, the expanded continuous laser beams are focused, the focusing position is adjusted to enable focusing spots to form focusing points on the contaminated end face, the moving speed of the focusing points of the continuous laser beams on the contaminated end face is adjusted, and the continuous laser beams cover the contaminated end face of the battery test probe in a scanning mode;
3) the pulse high-frequency laser beam emitting module emits a pulse high-frequency laser beam, the pulse high-frequency laser beam is expanded, the expanded pulse high-frequency laser beam is focused, and the focusing position is adjusted to enable a focusing light spot to cover the polluted end face;
4) combining the focused continuous laser beam and the pulse high-frequency laser beam with the adjusted path to form a composite laser beam, and converging the composite laser beam to the polluted end face to strip the pollutants from the polluted end face;
5) and removing the pollutants separated from the polluted end face by using a vacuum suction mode until the polluted layer of the polluted end face is completely removed, and finishing the pollutant cleaning of the battery test probe.
The invention has the advantages that: 1. according to the invention, the continuous laser beam and the pulse high-frequency laser beam act on the polluted end face of the battery test probe together, and the composite laser formed by the continuous laser beam and the pulse high-frequency laser is utilized to form high-frequency light particles, so that the pollution layer is impacted, pollutants on the polluted end face fall off, the purpose of cleaning the polluted end face is achieved, the battery test probe cannot be damaged at all, the cleaning effect is good, and the battery test probe has great popularization value;
2. the continuous laser beam emitted by the semiconductor continuous laser beam emitting module is subjected to beam expanding treatment and focusing treatment, the purpose of beam expanding is to avoid the problem that the emitted continuous laser beam is too small to cause difficulty in later adjustment, and the light spots of the continuous laser beam can be adjusted more easily through beam expanding and focusing;
3. the continuous laser beam is focused and then the light path needs to be adjusted so as to be matched with the pulse high-frequency laser beam, the continuous laser beam can be conveniently reflected to a polluted end face by matching the X-axis scanning lens and the Y-axis scanning lens, and the range of an irradiation light spot on the polluted end face can be conveniently adjusted by adjusting the X-axis scanning lens and the Y-axis scanning lens;
4. the pulse high-frequency laser beam is subjected to beam expansion and focusing treatment, the purpose of beam expansion is to expand the laser beam with too small original beam, the problem that the later adjustment is difficult is avoided, the energy can be conveniently concentrated on the polluted end face by focusing, and the irradiation position of the pulse laser beam can be conveniently adjusted by adjusting the second focusing lens;
5. the beam combining mirror is arranged on the light paths of the pulse high-frequency laser beam and the continuous laser beam, projects the continuous laser beam, reflects the pulse high-frequency laser beam, combines the continuous laser beam and the pulse high-frequency laser beam together to form a laser beam, and acts on a polluted end face to clean the polluted end face;
6. the invention adopts the continuous laser beam with the wavelength of 808nm-915nm, and the continuous laser beam with the wavelength can be quickly absorbed by pollutants on the polluted end face, so that the pollutants expand, air holes are formed in the pollutants, and the falling of the pollutants is accelerated;
7. the invention adopts the pulse high-frequency laser beam with the wavelength of 1060nm to 1070nm, the pulse high-frequency laser beam with the wavelength can act on air holes inside pollutants to generate particle shock waves in the air holes inside the pollutants, and the shock waves enable the pollutants to be broken into pieces so as to further promote the shedding of the pollutants;
8. the vacuum adsorption module is also arranged, the vacuum adsorption module is used for absorbing the separated pollutants, and the vacuum adsorption module can generate certain negative pressure to accelerate the process of separating the pollutants from the polluted end face;
9. the cleaning process of the battery test probe is very convenient and fast, the battery test probe cannot be damaged at all, and the battery test probe has great popularization value;
10. the cleaning method of the battery test probe is extremely simple, pollutants can be quickly stripped from the battery test probe through the continuous laser beam and the pulse high-frequency laser beam, the coating of the battery test probe cannot be damaged, and the cleaning efficiency is extremely high.
Compared with the traditional method for removing the pollution layer by organic solvent cleaning and wiping, liquid solid strong impact cleaning, high-frequency ultrasonic cleaning and the like, the traditional method for removing the pollution layer is a contact type method, mechanical force is applied to the surface of the gold plating layer of the battery test probe, the gold plating layer on the surface of the gold plating layer of the battery test probe is damaged, the performance of the gold plating layer is influenced, or insoluble media are attached to the surface of the gold plating layer of the battery test probe and cannot be removed, secondary pollution is generated, and the gold plating layer falls off due to high-frequency ultrasonic cleaning. The problem of environmental pollution caused by chemical removal can be easily solved.
Compared with the traditional single-wavelength laser and single-process step processing mode, the invention adopts the multi-wavelength composite laser to reduce the required short-wavelength laser power because the laser absorptivity of different substances to different wavelengths is inconsistent, thereby avoiding the service life attenuation caused by the temperature rise of a battery test probe, avoiding the damage of high-peak pulse laser to a gold-plated layer and avoiding the heat accumulation causing the damage of the processed surface.
Compared with the traditional laser cleaning mode, the laser cleaning method has the advantages that the impact characteristic of the optical particles of the composite laser is utilized, the required laser function of the laser is greatly reduced, the low-power laser is adopted, and the laser cleaning method has the fundamental advantages of reducing the production cost and reducing the energy consumption.
Drawings
FIG. 1: a schematic contaminated end face of the battery test probe of the present example;
FIG. 2: the optical path transmission diagram of the embodiment;
FIG. 3: the shell structure of the embodiment is schematically shown;
wherein: 1-battery test probe; 2-contaminated end face; 3, a shell; 4-circular jack catch; 5, vacuum adsorption interface; 6-a first beam expander; 7-a first focusing mirror; 8-X axis scanning optics; 9-Y-axis scanning optics; 10-a second beam expander; 11-a second focusing mirror; 12-a beam combiner; 13 — a first fixed structure; 14-a second fixed structure.
Detailed Description
Reference will now be made in detail to the embodiments of the present invention, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below with reference to the drawings are illustrative and intended to be illustrative of the invention and are not to be construed as limiting the invention.
In the description of the present invention, it is to be understood that the terms "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, are not to be construed as limiting the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.
The invention is described in further detail below with reference to the figures and the specific embodiments.
As shown in fig. 1-3, the present embodiment relates to a cleaning system for cleaning up contaminants on a battery test probe 1, and mainly for cleaning up contaminants on an end surface of the battery test probe 1, as shown in fig. 1, a contaminated end surface 2 of the electrical test probe 1 is an end surface that needs to be cleaned up by the cleaning system of the present embodiment.
The cleaning system of the embodiment comprises a shell 3, wherein a clamping module used for clamping the battery test probe 1 to be cleaned and exposing the contaminated end face 2 to be cleaned, a semiconductor continuous laser beam emitting module used for emitting a semiconductor continuous laser beam to the contaminated end face 2 to be cleaned of the battery test probe 1 to expand pollutants, and a pulse high-frequency laser beam emitting module used for emitting a pulse high-frequency laser beam to the contaminated end face 2 to be cleaned of the battery test probe 1 to break the pollutants are integrated in the shell 3.
The clamping module comprises a circular clamping jaw 4 used for clamping the battery test probe 1, the size of the circular clamping jaw 4 can be adjusted, the battery test probe 1 is adaptive to the battery test probes 1 with different sizes, the circular clamping jaw 4 clamps the end face of the upper end area of the battery test probe 1, the polluted end face 2 is just opposite to the area where the composite laser beam is focused, and the composite laser beam cannot be reflected to other areas.
The continuous laser beam and the pulse high-frequency laser beam of the embodiment are laser beams with two different wavelengths, the semiconductor continuous laser beam emitting module comprises a semiconductor continuous laser (fixed on a first fixing structure 13 on a shell 3) and emits the continuous laser beam, the wavelength of the continuous laser beam is 808-915 nm, the average power is 10-30W, the semiconductor continuous laser cannot set frequency and pulse width, the ellipticity of the output facula beam is more than 90%, the divergence angle of the beam is less than 0.5 milliradian, the peak power is avoided, the continuous laser beam emitted by the semiconductor continuous laser acts on pollutants on a polluted end face 2 by utilizing the characteristic of laser photon energy, and the pollutants are thermally expanded to form air holes to accelerate the falling-off stripping process by utilizing the principle that the continuous laser beam reflects on a gold-plated surface.
The pulse high-frequency laser beam emitting module comprises an MOPA (metal oxide optical power) pulse laser (fixed on a second fixing structure 14 on the shell 3) and is used for emitting pulse high-frequency laser beams with narrow pulse widths, the parameters of the pulse high-frequency laser beams are 1060nm-1070nm in wavelength, the average power is 5-20W, the pulse width is 1-10 ns, the frequency is 500 KHz-4000 KHz, and the energy of single-point pulses is less than 0.8 mJ. The beam quality M2 factor of the pulsed high-frequency laser beam is less than or equal to 1.4. The pollutants on the surface of the polluted end face 2 are impacted by using the characteristics of high peak frequency, low pulse energy and photon energy reflection of the pulse high-frequency laser beam, and polluted particles are decomposed.
In addition, in this embodiment, an optical system is disposed in the housing 3, and specifically includes a first beam expander 6, a first focusing lens 7, an X-axis scanning lens 8, and a Y-axis scanning lens 9, which are located on the continuous laser beam optical path, and includes a second beam expander 10, a second focusing lens 11, and a beam combiner 12, which are located on the pulsed laser beam optical path. Because the laser beams generated by the semiconductor continuous laser and the MOPA pulse laser are too small and need to be expanded, in this embodiment, the continuous laser beams are expanded by the first beam expander 6, the pulse high-frequency laser beams are expanded by the second beam expander 10, the lens of the first beam expander 6 is coated with an anti-reflection film with the wavelength of 1060nm-1070nm for 2-time beam expansion, and the lens of the second beam expander 10 is coated with an anti-reflection film with the wavelength of 808nm-915nm for 5-time beam expansion.
The laser beam needs to be focused again after being expanded, and the focusing aims to concentrate the energy of the laser beam and then facilitate the adjustment of the irradiation range of the laser beam. The first focusing mirror 7 of this embodiment is located behind the first beam expander 6, the lens of the first focusing mirror 7 is coated with an antireflection film with a wavelength of 1060nm-1070nm, the focal length is 200mm, and the position of the first focusing mirror 7 in the housing 3 can be adjusted to adjust the focal position of the continuous laser beam. The second focusing lens 11 is located behind the second beam expander 10, an antireflection film with the wavelength of 808nm-915nm is coated on a lens of the second focusing lens 11, the focal length is 150mm, and the position of the second focusing lens 11 in the shell 3 can be adjusted to adjust the focal position of the pulse high-frequency laser beam.
The X-axis scanning lens 8 and the Y-axis scanning lens 9 are matched to adjust the propagation light path of the continuous laser beam and reflect the continuous laser beam, so that the arrangement of the continuous laser beam and the pulse high-frequency laser beam is facilitated, and the combination of the two laser beams is facilitated. The X-axis scanning lens 8 is a square lens with the diameter of 20mm and is coated with a reflective film with the wavelength of 1060nm-1070nm, and the Y-axis scanning lens 9 is a square lens with the diameter of 20mm and is coated with a reflective film with the wavelength of 1060nm-1070 nm. The spot range of the continuous laser beam can be conveniently adjusted by adjusting the X-axis scanning lens 8 and the Y-axis scanning lens 9, so that the irradiation range of the continuous laser beam can be conveniently controlled.
And finally, the continuous laser beam and the pulse high-frequency laser beam are converged to form a composite laser beam, the beam combination is realized through the beam combination mirror 12, the continuous laser beam can irradiate the polluted end face 2 through the beam combination mirror 12, and the pulse high-frequency laser beam can be reflected to the polluted end face 2 by the beam combination mirror 12. The double-sided lens of the beam combiner 12 is coated with an antireflection film with the wavelength of 1060nm-1070nm at 45 degrees, and one side of the double-sided lens is coated with a reflecting film with the wavelength of 808nm-915nm at 45 degrees. The continuous laser beam penetrates through the beam combining mirror 12 and then is converged with the pulse high-frequency laser beam to form a composite laser beam.
Micrometer scales are installed on the first focusing mirror 7 and the second focusing mirror 11, and the first focusing mirror 7 and the second focusing mirror 11 can be conveniently adjusted through the micrometer scales so as to adjust the light spots of the continuous laser beams and the pulse high-frequency laser beams.
This embodiment still installs vacuum adsorption interface 5 near circular jack catch 4's position on casing 3, sucks the inside pollutant that breaks away from of casing 3 through vacuum adsorption interface 5, and vacuum adsorption interface 5 itself can produce certain negative pressure to the pollutant on the contaminated end face 2, and the process of peeling off is taken off to the pollutant with higher speed.
The specific cleaning method comprises the following steps:
1) fixing the battery test probe 1 to be cleaned, fixing the battery test probe 1 by using a circular clamping jaw 4, adjusting the diameter of the circular clamping jaw 4 to enable the circular clamping jaw 4 to correspond to the battery test probe 1, exposing the polluted end face 2 to be cleaned of the battery test probe 1, and aligning the polluted end face to the position where the laser beam is focused;
2) the semiconductor continuous laser emits continuous laser beams, the continuous laser beams are expanded by a first beam expanding lens 6, the expanded continuous laser beams are focused by a first focusing lens 7, the focused continuous laser beams irradiate an X-axis scanning lens 8 and a Y-axis scanning lens 9, the light path paths are changed by the reflection of the X-axis scanning lens 8 and the Y-axis scanning lens 9, and the light paths irradiate on a beam combining lens 12;
3) the MOPA pulse laser emits pulse high-frequency laser beams, the pulse high-frequency laser beams are expanded through a second beam expanding lens 10, the expanded pulse high-frequency laser beams are focused through a second focusing lens 11, and the focused pulse high-frequency laser beams irradiate a beam combining lens 12;
4) the continuous laser beam transmits through the beam combining mirror 12, the pulse high-frequency laser beam is reflected by the beam combining mirror 12, the pulse high-frequency laser beam and the continuous laser beam are combined to form a composite laser beam, and the composite laser beam is converged to the polluted end face 2;
5) and the composite laser beam acts on the polluted end face 2 to peel off pollutants on the polluted end face 2, and pollutants separated from the polluted end face 2 are removed by utilizing a vacuum adsorption interface 5 vacuumizing mode until a pollution layer of the polluted end face 2 is completely removed, so that the pollutant cleaning of the battery test probe 1 is completed.
Firstly adjusting the position of a first focusing mirror 7 to focus continuous laser beams into points on a contaminated end face 2 of a battery test probe 1, then adjusting and controlling the scanning angle and the scanning speed of an X-axis scanning lens 8 and a Y-axis scanning lens 9 to enable the continuous laser beams to cover the contaminated end face 2 of the whole battery test probe 1, and finally adjusting a second focusing mirror 11 to enable pulse high-frequency laser beams to be focused into a circular light spot which covers the whole contaminated end face 2, so that the two laser beams are superposed, and two beams of laser simultaneously emit light to act on the contaminated end face 2.
The foregoing shows and describes the general principles, essential features, and advantages of the invention. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are given by way of illustration of the principles of the present invention, and that various changes and modifications may be made without departing from the spirit and scope of the invention as defined by the appended claims. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (10)
1. A cleaning system for removing contaminants from a battery test probe, comprising: comprises the steps of (a) preparing a mixture of a plurality of raw materials,
the clamping module is used for clamping a battery test probe (1) to be cleaned to expose a polluted end face (2) to be cleaned;
the semiconductor continuous laser beam emitting module is used for emitting continuous laser beams to the polluted end face (2) to expand pollutants;
and the pulse high-frequency laser beam transmitting module is used for transmitting a pulse high-frequency laser beam to the polluted end face (2) to break the pollutants.
2. A cleaning system for removing contaminants from a battery test probe as recited in claim 1, wherein: the semiconductor continuous laser beam emitting module comprises a semiconductor continuous laser beam emitting module,
the continuous laser emitting module is used for emitting continuous laser beams;
the first beam expander (6) is positioned on the light path of the continuous laser beam and is used for expanding the continuous laser beam;
the first focusing lens (7) is positioned on the light path of the continuous laser beam and behind the first beam expanding lens (6) and is used for focusing the expanded continuous laser beam and adjusting the focus position;
and the irradiation range adjusting module is used for adjusting the transmission path and the irradiation range of the focused continuous laser beam.
3. A cleaning system for removing contaminants from battery test probes according to claim 2, wherein: the irradiation range adjusting module comprises a light source module,
the X-axis scanning lens (8) is positioned behind the first focusing lens (7) and used for changing the X-direction position of the light spot reflected to the polluted end face (2);
and the Y-axis scanning lens (9) is positioned behind the first focusing mirror (7) and is parallel to the X-axis scanning lens (8) and used for reflecting the focused continuous laser beam to the polluted end face (2) in cooperation with the X-axis scanning lens (8) and adjusting the Y-direction position of the light spot reflected to the polluted end face (2) by changing the deflection angle.
4. A cleaning system for removing contaminants from a battery test probe as recited in claim 1, wherein: the pulse high-frequency laser beam emitting module comprises,
the pulse high-frequency laser emission module is used for generating pulse high-frequency laser beams;
the second beam expander (10) is positioned on the light path of the pulse high-frequency laser beam and is used for expanding the pulse high-frequency laser beam;
and the second focusing lens (11) is positioned on the light path of the pulse high-frequency laser beam and behind the second beam expanding lens (10) and is used for focusing the expanded pulse high-frequency laser beam and adjusting the focus position.
5. A cleaning system for removing contaminants from a battery test probe as recited in claim 1, wherein: also comprises the following steps of (1) preparing,
and the beam combining mirror (12) is positioned on the light paths of the continuous laser beams and the pulse high-frequency laser beams and is used for combining the focused continuous laser beams and the focused pulse high-frequency laser beams to form a composite laser beam irradiated on the polluted end face (2).
6. A cleaning system for removing contaminants from battery test probes according to claim 2, wherein: the continuous laser emission module comprises a semiconductor continuous laser for emitting continuous laser beams with the wavelength of 808nm-915 nm.
7. A cleaning system for removing contaminants from battery test probes according to claim 4, wherein: the pulse high-frequency laser emitting module comprises a pulse laser for emitting pulse high-frequency laser beams with the wavelength of 1060nm-1070 nm.
8. A cleaning system for removing contaminants from a battery test probe as recited in claim 1, wherein: also comprises a vacuum adsorption module for adsorbing the pollutants separated from the battery test probe (1).
9. A cleaning method of a cleaning system for removing contaminants from a battery test probe according to any of claims 1 to 8, comprising: fixing a battery test probe (1) to be cleaned, exposing a polluted end face (2), emitting continuous laser beams by a semiconductor continuous laser beam emitting module, emitting pulse high-frequency laser beams by a pulse high-frequency laser beam emitting module, combining the continuous laser beams and the pulse high-frequency laser beams to form composite laser beams, collecting the composite laser beams to the polluted end face (2) until a polluted layer on the polluted end face (2) is completely removed, and finishing pollutant cleaning of the battery test probe (1).
10. A cleaning method for a cleaning system for removing contaminants from battery test probes according to claim 9, comprising: the method comprises the following steps:
1) fixing a battery test probe (1) to be cleaned, and exposing a polluted end face (2);
2) the semiconductor continuous laser beam emitting module emits continuous laser beams, the continuous laser beams are expanded, the expanded continuous laser beams are focused, the focusing position is adjusted to enable focusing spots to form focusing points on the contaminated end face, the moving speed of the focusing points of the continuous laser beams on the contaminated end face is adjusted, and the continuous laser beams cover the contaminated end face (2) of the battery test probe in a scanning mode;
3) the pulse high-frequency laser beam emitting module emits a pulse high-frequency laser beam, the pulse high-frequency laser beam is expanded, the expanded pulse high-frequency laser beam is focused, and the focusing position is adjusted to enable a focusing light spot to cover the polluted end face (2);
4) combining the focused continuous laser beam and the pulse high-frequency laser beam with the adjusted path to form a composite laser beam, and converging the composite laser beam to the polluted end face (2) to strip the pollutants from the polluted end face (2);
5) and removing the pollutants separated from the polluted end face (2) by using a vacuum suction mode until the polluted layer of the polluted end face (2) is completely removed, and finishing the pollutant cleaning of the battery test probe (1).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111507962.2A CN114226359B (en) | 2021-12-10 | 2021-12-10 | Cleaning system and cleaning method for removing pollutants from battery test probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111507962.2A CN114226359B (en) | 2021-12-10 | 2021-12-10 | Cleaning system and cleaning method for removing pollutants from battery test probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN114226359A true CN114226359A (en) | 2022-03-25 |
| CN114226359B CN114226359B (en) | 2023-04-07 |
Family
ID=80754653
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111507962.2A Active CN114226359B (en) | 2021-12-10 | 2021-12-10 | Cleaning system and cleaning method for removing pollutants from battery test probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114226359B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115446037A (en) * | 2022-09-26 | 2022-12-09 | 北京百慕合金有限责任公司 | Method and system for rapidly treating attachments in vacuum furnace |
| CN117443858A (en) * | 2023-12-26 | 2024-01-26 | 合肥国镜仪器科技有限公司 | Cleaning method and cleaning system for cold field electron source |
Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6450180B1 (en) * | 1996-11-21 | 2002-09-17 | Oramir Semiconductor Equipment Ltd. | Method and apparatus for the laser processing of substrate surfaces |
| CN201346667Y (en) * | 2008-12-29 | 2009-11-18 | 广州瑞通千里激光设备有限公司 | Optical-fiber laser dynamic focusing vibrating lens scanning spot welding system |
| CN203448339U (en) * | 2013-07-30 | 2014-02-26 | 湖北星业光电科技有限公司 | Flexible laser cleaner |
| CN103817113A (en) * | 2014-03-14 | 2014-05-28 | 华中科技大学 | Metallic surface dirt laser cleaning system and method |
| CN105195468A (en) * | 2014-06-25 | 2015-12-30 | 核工业西南物理研究院 | Method and device for online cleaning and detection of first lens of fusion device |
| CN107096920A (en) * | 2017-05-25 | 2017-08-29 | 华南理工大学 | A kind of non-average dual-beam synchronous scanning selective laser melting appartus and its light path synthetic method |
| CN107695040A (en) * | 2017-10-20 | 2018-02-16 | 大族激光科技产业集团股份有限公司 | Laser cleaning system and method |
| CN108212947A (en) * | 2017-12-27 | 2018-06-29 | 武汉金顿激光科技有限公司 | Laser cleaning technique |
| CN109719088A (en) * | 2019-01-24 | 2019-05-07 | 武汉锐科光纤激光技术股份有限公司 | Laser cleaner |
| CN110116117A (en) * | 2019-06-06 | 2019-08-13 | 哈尔滨工业大学 | A kind of laser composite cleaning system and method |
| CN210333608U (en) * | 2019-07-26 | 2020-04-17 | 中国工程物理研究院激光聚变研究中心 | High-efficient cleaning system of laser |
| CN112122790A (en) * | 2020-08-04 | 2020-12-25 | 深圳华工激光设备有限公司 | Processing method and system for explosion-proof line of lithium battery explosion-proof valve |
| US20210053160A1 (en) * | 2019-08-21 | 2021-02-25 | Rochester Institute Of Technology | Method and System for Ultrafast Laser-based Material Removal, Figuring and Polishing |
| CN112845392A (en) * | 2021-04-02 | 2021-05-28 | 西南交通大学 | Accurate nondestructive laser decontamination method for polluted metal parts on surface of nuclear facility |
| CN113058935A (en) * | 2021-04-30 | 2021-07-02 | 浙江工业大学 | Method for cleaning micro-nano particles by underwater double-beam pulse laser induced shock waves |
-
2021
- 2021-12-10 CN CN202111507962.2A patent/CN114226359B/en active Active
Patent Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6450180B1 (en) * | 1996-11-21 | 2002-09-17 | Oramir Semiconductor Equipment Ltd. | Method and apparatus for the laser processing of substrate surfaces |
| CN201346667Y (en) * | 2008-12-29 | 2009-11-18 | 广州瑞通千里激光设备有限公司 | Optical-fiber laser dynamic focusing vibrating lens scanning spot welding system |
| CN203448339U (en) * | 2013-07-30 | 2014-02-26 | 湖北星业光电科技有限公司 | Flexible laser cleaner |
| CN103817113A (en) * | 2014-03-14 | 2014-05-28 | 华中科技大学 | Metallic surface dirt laser cleaning system and method |
| CN105195468A (en) * | 2014-06-25 | 2015-12-30 | 核工业西南物理研究院 | Method and device for online cleaning and detection of first lens of fusion device |
| CN107096920A (en) * | 2017-05-25 | 2017-08-29 | 华南理工大学 | A kind of non-average dual-beam synchronous scanning selective laser melting appartus and its light path synthetic method |
| CN107695040A (en) * | 2017-10-20 | 2018-02-16 | 大族激光科技产业集团股份有限公司 | Laser cleaning system and method |
| CN108212947A (en) * | 2017-12-27 | 2018-06-29 | 武汉金顿激光科技有限公司 | Laser cleaning technique |
| CN109719088A (en) * | 2019-01-24 | 2019-05-07 | 武汉锐科光纤激光技术股份有限公司 | Laser cleaner |
| CN110116117A (en) * | 2019-06-06 | 2019-08-13 | 哈尔滨工业大学 | A kind of laser composite cleaning system and method |
| CN210333608U (en) * | 2019-07-26 | 2020-04-17 | 中国工程物理研究院激光聚变研究中心 | High-efficient cleaning system of laser |
| US20210053160A1 (en) * | 2019-08-21 | 2021-02-25 | Rochester Institute Of Technology | Method and System for Ultrafast Laser-based Material Removal, Figuring and Polishing |
| CN112122790A (en) * | 2020-08-04 | 2020-12-25 | 深圳华工激光设备有限公司 | Processing method and system for explosion-proof line of lithium battery explosion-proof valve |
| CN112845392A (en) * | 2021-04-02 | 2021-05-28 | 西南交通大学 | Accurate nondestructive laser decontamination method for polluted metal parts on surface of nuclear facility |
| CN113058935A (en) * | 2021-04-30 | 2021-07-02 | 浙江工业大学 | Method for cleaning micro-nano particles by underwater double-beam pulse laser induced shock waves |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115446037A (en) * | 2022-09-26 | 2022-12-09 | 北京百慕合金有限责任公司 | Method and system for rapidly treating attachments in vacuum furnace |
| CN115446037B (en) * | 2022-09-26 | 2024-01-02 | 北京百慕合金有限责任公司 | Quick processing method and processing system for attachments in vacuum furnace |
| CN117443858A (en) * | 2023-12-26 | 2024-01-26 | 合肥国镜仪器科技有限公司 | Cleaning method and cleaning system for cold field electron source |
| CN117443858B (en) * | 2023-12-26 | 2024-03-05 | 合肥国镜仪器科技有限公司 | Cleaning method and cleaning system for cold field electron source |
Also Published As
| Publication number | Publication date |
|---|---|
| CN114226359B (en) | 2023-04-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN114226359B (en) | Cleaning system and cleaning method for removing pollutants from battery test probe | |
| CN101733556B (en) | Laser cutting machine | |
| CN113199160B (en) | Laser synchronous scanning group hole machining system and scanning method | |
| CN208033201U (en) | The cleaning device of battery pole piece coating | |
| CN110449417B (en) | Multifocal laser belt cleaning device | |
| JPH10242489A (en) | Fabrication of thin film solar cell | |
| CN111230309B (en) | Novel coating cleaning method | |
| CN202155335U (en) | Laser cleaning device | |
| CN102916081A (en) | Edge deletion method for thin-film solar cells | |
| CN101249580A (en) | Electrochemistry-laser mask focusing micro etch method for processing and device thereof | |
| CN115666003B (en) | Circuit board blind slot manufacturing method and system | |
| CN110504099A (en) | A kind of method and system of laser ablation inductance copper coil paint layer | |
| CN111940421A (en) | Efficient laser cleaning device and method | |
| CN115382852A (en) | Device and method for removing residual glue on PCB | |
| CN109570151B (en) | Device and method for cleaning optical element by liquid flow ultrasonic composite auxiliary laser | |
| CN215658436U (en) | Solar cell film edge cleaning light path system | |
| CN109465542B (en) | High-efficient belt cleaning device of overlength line facula laser | |
| CN203390393U (en) | Laser device used for wafer surface treatment | |
| CN115846871B (en) | System and method for welding middle frame assembly of aluminum alloy mobile phone | |
| CN212858217U (en) | Laser cutting optical system integrating coaxial vision | |
| CN113058935A (en) | Method for cleaning micro-nano particles by underwater double-beam pulse laser induced shock waves | |
| JP2023525724A (en) | Laser processing apparatus and method of operating same to facilitate directed inspection of laser processed workpieces | |
| CN202398941U (en) | Device for etching copper conductive film on glass substrate printing ink through pulse laser | |
| CN102248289A (en) | Laser scribing insulation equipment for crystalline silicon solar cell | |
| CN215236484U (en) | Laser cleaning head and laser edge cleaning equipment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |