CN114062979B - 磁传感器电路 - Google Patents

磁传感器电路

Info

Publication number
CN114062979B
CN114062979B CN202110836083.8A CN202110836083A CN114062979B CN 114062979 B CN114062979 B CN 114062979B CN 202110836083 A CN202110836083 A CN 202110836083A CN 114062979 B CN114062979 B CN 114062979B
Authority
CN
China
Prior art keywords
signal
output voltage
circuit
voltage
mode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202110836083.8A
Other languages
English (en)
Chinese (zh)
Other versions
CN114062979A (zh
Inventor
挽地友生
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ablic Inc
Original Assignee
Ablic Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ablic Inc filed Critical Ablic Inc
Publication of CN114062979A publication Critical patent/CN114062979A/zh
Application granted granted Critical
Publication of CN114062979B publication Critical patent/CN114062979B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/0206—Three-component magnetometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0084—Measuring voltage only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0005—Geometrical arrangement of magnetic sensor elements; Apparatus combining different magnetic sensor types

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Measuring Magnetic Variables (AREA)
CN202110836083.8A 2020-08-03 2021-07-23 磁传感器电路 Active CN114062979B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020131417A JP7465173B2 (ja) 2020-08-03 2020-08-03 磁気センサ回路
JP2020-131417 2020-08-03

Publications (2)

Publication Number Publication Date
CN114062979A CN114062979A (zh) 2022-02-18
CN114062979B true CN114062979B (zh) 2026-07-24

Family

ID=80002834

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202110836083.8A Active CN114062979B (zh) 2020-08-03 2021-07-23 磁传感器电路

Country Status (3)

Country Link
US (1) US11408946B2 (cg-RX-API-DMAC7.html)
JP (1) JP7465173B2 (cg-RX-API-DMAC7.html)
CN (1) CN114062979B (cg-RX-API-DMAC7.html)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009031225A (ja) * 2007-07-30 2009-02-12 Panasonic Corp 磁界検出装置
JP2019078714A (ja) * 2017-10-27 2019-05-23 協立電機株式会社 フラックスゲートセンサ

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003025757A (ja) 2001-07-16 2003-01-29 Toppan Printing Co Ltd 上製本用表紙の製造方法及び上製本の製造方法
JP2012063211A (ja) * 2010-09-15 2012-03-29 Toshiba Corp 磁気検出装置
US10073136B2 (en) * 2013-12-26 2018-09-11 Allegro Microsystems, Llc Methods and apparatus for sensor diagnostics including sensing element operation
US9851416B2 (en) 2014-07-22 2017-12-26 Allegro Microsystems, Llc Systems and methods for magnetic field sensors with self-test
US10191124B2 (en) * 2016-08-26 2019-01-29 Sii Semiconductor Corporation Sensor circuit
JP6883482B2 (ja) 2016-08-26 2021-06-09 エイブリック株式会社 センサ回路

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009031225A (ja) * 2007-07-30 2009-02-12 Panasonic Corp 磁界検出装置
JP2019078714A (ja) * 2017-10-27 2019-05-23 協立電機株式会社 フラックスゲートセンサ

Also Published As

Publication number Publication date
JP7465173B2 (ja) 2024-04-10
US20220034979A1 (en) 2022-02-03
US11408946B2 (en) 2022-08-09
CN114062979A (zh) 2022-02-18
JP2022028179A (ja) 2022-02-16

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
CB02 Change of applicant information
CB02 Change of applicant information

Address after: Udaida 4106-73, Daizi, Udaida cho, Kitakyuku, Nagano Prefecture, Japan (postcode: 389-0293)

Applicant after: ABLIC Inc.

Address before: 9-6, 3-dingmu, Mita, Tokyo, Japan

Applicant before: ABLIC Inc.

SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant