CN113820550A

CN113820550A - Debugging card and debugging device

Info

Publication number: CN113820550A
Application number: CN202010566031.9A
Authority: CN
Inventors: 彭章龙
Original assignee: Hongfujin Precision Industry Wuhan Co Ltd; Hon Hai Precision Industry Co Ltd
Current assignee: Hongfujin Precision Industry Wuhan Co Ltd; Hon Hai Precision Industry Co Ltd
Priority date: 2020-06-19
Filing date: 2020-06-19
Publication date: 2021-12-21

Abstract

A debug card and a debug apparatus are provided. The debugging card is electrically connected with the electronic device and used for testing the functions of the electronic device. The debugging card can send a test request signal to the electronic device, and the electronic device responds to the test request signal to execute a corresponding program and return detection data to the debugging card. The debugging card comprises a connector, a voltage level shifting circuit and a programmable logic chip. The connector establishes electrical connection between the debug card and the electronic device to enable data communication. The voltage level shift circuit converts the detection data into conversion data based on the specified voltage level. The programmable logic chip is electrically connected with the connector through the voltage level translation circuit and used for analyzing the corresponding functions of the electronic device according to the conversion data and obtaining a detection result.

Description

Debugging card and debugging device

Technical Field

The present invention relates to a debug card and a debug apparatus for debugging functions of an electronic device.

Background

With the rapid development of computer technology, the updating is faster and faster, and the development cycle of computer systems is shorter and shorter. Various tests are required during the development phase of the computer motherboard. Various problems are encountered in the testing stage, and the developer needs to identify the problems existing in the current mainboard by means of debug card. The mainboard can carry out data transmission through different types of interfaces. Common interfaces include a Low Pin Count (LPC) Interface and an Enhanced Serial Peripheral Interface (eSPI) Interface. The voltage levels corresponding to different interfaces are different, the voltage level of the LPC interface is 3.3V, and the voltage level of the eSPI interface is 1.8V. Therefore, because the interface types of the motherboards are different, the debug card with two interfaces and the corresponding motherboard are required to perform data transmission, which further increases the test cost.

Disclosure of Invention

In view of the above, there is a need to provide a debugging apparatus, which aims to solve the problem of the prior art that the testing cost is increased during the assembling process.

A debugging device is electrically connected with an electronic device and used for testing the function of the electronic device; the debugging card can send a test request signal to the electronic device, and the electronic device responds to the test request signal to execute a corresponding program and return detection data to the debugging card; the debug card includes:

the connector is used for establishing electrical connection between the debugging card and the electronic device so as to realize data communication;

a voltage level shift circuit for converting the detection data into conversion data based on a specified voltage level;

and the programmable logic chip is electrically connected with the connector through the voltage level translation circuit and used for analyzing the corresponding function of the electronic device according to the conversion data and obtaining a detection result.

The debugging device comprises a display module and a debugging card; the debugging card is electrically connected with the electronic device and used for testing the function of the electronic device; the debugging card can send a test request signal to the electronic device, and the electronic device responds to the test request signal to execute a corresponding program and return detection data to the debugging card; the debug card includes:

According to the debugging card and the debugging device, the voltage level translation circuit is arranged, so that data transmission between the connector and the programmable logic chip based on different voltage levels can be realized, the test cost is reduced, and meanwhile, the application range of the debugging card and the debugging device is improved.

Drawings

FIG. 1 is a diagram illustrating a debugging apparatus according to a preferred embodiment of the present invention.

FIG. 2 is a block diagram of the voltage level shifting circuit shown in FIG. 1.

Fig. 3 is a circuit diagram of the shift unit in fig. 2.

Description of the main elements

Debugging device 100

Electronic device 200

Debug card 10

Display module 30

Connector 11

Connecting pins P1-P5

Voltage level shift circuit 13

Programmable logic chip 15

Functional pin P1 '-P5'

Translation unit 130

Input terminal IN

Output terminal OUT

First voltage terminal V1

Second voltage terminal V2

First resistor R1

Second resistor R2

Third resistor R3

Switching element Q1

The following detailed description will further illustrate the invention in conjunction with the above-described figures.

Detailed Description

In order to make the technical solutions of the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

In the description of the embodiments of the present invention, it should be noted that, unless explicitly stated or limited otherwise, the term "connected" is to be interpreted broadly, e.g. as a fixed connection, a detachable connection, or an integral connection; may be mechanically connected, may be electrically connected or may be in communication with each other; either directly or indirectly through intervening elements, either internally or in any other relationship. The specific meaning of the above terms in the present invention can be determined as the case may be, by those of ordinary skill in the art.

The terms "first," "second," and "third," etc. in the description and claims of the present invention and the above-described drawings are used for distinguishing between different objects and not for describing a particular order. Furthermore, the terms "comprises" and any variations thereof, are intended to cover non-exclusive inclusions.

Hereinafter, a liquid crystal display panel according to an embodiment of the present invention will be described with reference to the drawings.

Fig. 1 to fig. 3 are a block diagram of a debugging apparatus 100, a block diagram of a voltage level shifting circuit, and a circuit diagram of a shifting unit according to a preferred embodiment of the invention. The debugging apparatus 100 is electrically connected to the electronic device 200. The debugging apparatus 100 is used for testing the functions of the electronic device 200. In at least one embodiment of the present invention, the electronic device 200 may be a motherboard. In other embodiments, the electronic device 200 may also be other electronic devices such as a chip. The electronic device 200 may be adapted to communicate with other external circuits via the first type of interface and may be adapted to communicate with other external circuits via the second type of interface. The first type Interface is an enhanced Serial Peripheral Interface (eSPI) Interface; the second type interface is a Low Pin Count (LPC) interface. Wherein the first type interface is used for transmitting data based on a first voltage level; the second type interface is used for transmitting data based on a second voltage level. The first voltage level is 3.3 volts, and the second voltage level is 1.8 volts.

The debugging apparatus 100 includes a debugging card 10 and a display module 30. The debug card 10 can communicate with the display module 30 via a data bus. In at least one embodiment of the present invention, the debug card 10 and the display module 30 are two separate components. The display module 30 may be an electronic device with a display function, such as a mobile electronic device like a Personal computer, a tablet computer, a smart phone, and a Personal Digital Assistant (PDA), or a fixed electronic device like a desktop computer.

The debug card 10 may send a test request signal to the electronic device 200 and receive the test request signal from the electronic device 200 to execute a corresponding program and return test data.

The debug card 10 includes a connector 11, a voltage level shifter 13, and a programmable logic chip 15.

The connector 11 is used to establish an electrical connection between the debug card 10 and the electronic device 200, so as to implement data communication. In at least one embodiment of the present invention, the connector may be a connector having a first type of interface, and may also be a connector having a second type of interface. The connector 11 may receive the inspection data of the electronic device 200.

In at least one embodiment of the present invention, the connector 11 has a plurality of connection pins P1-P5. The connection pins P1-P5 receive different signals, respectively. For example, the connection pin P1 may receive a reset signal (P1_ RST); the connection pin P2 may receive a chip select signal (P2_ CS); the connection pin P3 can receive an input-output signal (P3_ IO); the connection pin P4 may receive a clock signal (P4_ CLK); the connection pin P5 may receive a reset signal (P5_ RES). There may be a plurality of the connection pins P3 for receiving input and output signals.

The programmable logic chip 15 is electrically connected to the connector 11 through the voltage level shifting circuit 13 to receive data based on a specified voltage level. The programmable logic chip 15 analyzes the corresponding function of the electronic device 200 according to the conversion data and obtains a detection result. The programmable logic chip 15 has a plurality of functional pins P1 '-P5'. Each of the functional pins P1 '-P5' corresponds to one of the connection pins P1-P5. For example, the function pin P1' corresponds to the connection pin P1; the function pin P2' corresponds to the connection pin P2; the function pin P3' corresponds to the connection pin P3; the function pin P4' corresponds to the connection pin P4; the function pin P5' corresponds to the connection pin P5. The programmable logic chip 15 may also include other functional pins that are different from the connector 11. In at least one embodiment of the present invention, the Programmable Logic chip 15 is a Complex Programmable Logic Device (CPLD).

The voltage level shifting circuit 13 is electrically connected between the connector 11 and the programmable logic chip 15. The voltage level shift circuit 13 converts the detection data received by the connector 11 into conversion data based on a specified voltage level. In at least one embodiment of the present invention, the specified voltage level is 3.3 volts. The voltage level shifting circuit 13 includes a plurality of shifting units 130. Each of the translation units 130 is connected between one of the connection pins Pi and the corresponding function pin Pi'.

The shift unit 130 includes a first voltage terminal V1, a second voltage terminal V2, a switching element Q1, an input terminal IN, and an output terminal OUT. The control terminal of the switching element Q1 is electrically connected to the first voltage terminal V1 through a first resistor R1, the first connection terminal of the switching element Q1 is electrically connected to one of the connection pins Pi through the input terminal IN, and the second connection terminal of the switching element Q1 is electrically connected to the corresponding function pin Pi' through the third resistor R3 and the output terminal OUT. The second voltage terminal V2 is electrically connected to the output terminal OUT through the second resistor R2. In at least one embodiment of the present invention, the voltage of the first voltage terminal V1 is the second voltage level, and the voltage of the second voltage terminal V2 is the designated voltage level. In at least one embodiment of the present invention, the switching element Q1 is a triode. The control end is a base electrode, the first connecting end is an emitting electrode, and the second connecting end is a collector electrode. In other embodiments, the switching element Q1 may also be a thin film transistor or other electronic element with similar functions.

The display module 30 is electrically connected to the programmable logic chip 15. The display module 30 displays the detection result. In at least one embodiment of the present invention, the display module 30 displays the detection result in a digital form. The user can recognize whether the electronic device 200 functions normally according to the displayed numbers. The display module 30 further displays an error code when there is an error in the electronic device 200. The user can analyze and debug the malfunction of the electronic device 200 according to the display content of the display module 30.

The above-mentioned debug card 10 and the debug apparatus 100 can realize data transmission between the connector 11 and the programmable logic chip 15 based on different voltage levels by setting the voltage level shift circuit 13, so as to reduce the test cost, and improve the application range of the debug card 10 and the debug apparatus 100.

It will be appreciated by those skilled in the art that the above embodiments are illustrative only and not intended to be limiting, and that suitable modifications and variations may be made to the above embodiments without departing from the true spirit and scope of the invention.

Claims

1. A debugging card is electrically connected with an electronic device and used for testing the function of the electronic device; the debugging card can send a test request signal to the electronic device, and the electronic device responds to the test request signal to execute a corresponding program and return detection data to the debugging card; the method is characterized in that: the debug card includes:

2. The debug card of claim 1, wherein: when the connector is an enhanced serial peripheral interface, the detection data is data based on a first voltage level; the first voltage level is equal to the specified voltage level.

3. The debug card of claim 1, wherein: when the connector is a low pin count interface, the detection data is data based on a second voltage level; the second voltage level is less than the specified voltage level.

4. The debug card of claim 3, wherein: the voltage level shifting circuit comprises a plurality of shifting units; each translation unit is correspondingly connected between one connecting pin of the connector and the corresponding functional pin of the programmable logic chip; each translation unit comprises a first voltage end, a second voltage end, a switch element, an input end and an output end; the control end of the switch element is electrically connected with the first voltage end, the first connection end of the switch element is electrically connected with the connection pin of the connector through the input end, and the second connection end of the switch element is electrically connected with the function pin corresponding to the editable logic chip through the output end; the second voltage end is electrically connected with the output end.

5. The debug card of claim 4, wherein: the voltage of the first voltage end is the second voltage quasi-level, and the voltage of the second voltage end is the appointed voltage quasi-level.

6. The debug card of claim 3, wherein: the specified voltage level is 3.3V volts, and the second voltage level is 1.8V.

7. The debug card of claim 1, wherein: the debugging card is electrically connected with the display module; the display module is used for displaying the detection result.

8. A debugging device comprises a display module and a debugging card; the debugging card is electrically connected with the electronic device and used for testing the function of the electronic device; the debugging card can send a test request signal to the electronic device, and the electronic device responds to the test request signal to execute a corresponding program and return detection data to the debugging card; the method is characterized in that: the debug card includes:

9. The debugging apparatus according to claim 8, wherein: when the connector is an enhanced serial peripheral interface, the detection data is data based on a first voltage level; the first voltage level is equal to the specified voltage level; when the connector is a low pin count interface, the detection data is data based on a second voltage level; the second voltage level is less than the specified voltage level.

10. The debugging apparatus according to claim 8, wherein: the voltage level shifting circuit comprises a plurality of shifting units; each translation unit is correspondingly connected between one connecting pin of the connector and the corresponding functional pin of the programmable logic chip; each translation unit comprises a first voltage end, a second voltage end, a switch element, an input end and an output end; the control end of the switch element is electrically connected with the first voltage end, the first connection end of the switch element is electrically connected with the connection pin of the connector through the input end, and the second connection end of the switch element is electrically connected with the function pin corresponding to the editable logic chip through the output end; the second voltage end is electrically connected with the output end.