CN113791245A

CN113791245A - Capacitor power-on test fixture

Info

Publication number: CN113791245A
Application number: CN202110998490.9A
Authority: CN
Inventors: 刘迎春
Original assignee: Kunshanqiu Titanium Photoelectric Technology Co Ltd
Current assignee: Kunshanqiu Titanium Photoelectric Technology Co Ltd
Priority date: 2021-08-27
Filing date: 2021-08-27
Publication date: 2021-12-14

Abstract

The invention provides a capacitor electrification test jig which comprises a top plate, an insulation fixing layer and a bottom plate which are sequentially connected from top to bottom; the insulating fixing layer is provided with a plurality of mounting holes for fixing the capacitor; a cavity for placing the capacitor is formed between the top plate and the insulating fixing layer; wherein, the bottom plate and the top plate are electrified, and the electric polarity of the bottom plate is opposite to that of the top plate. The surface of the bottom plate provided by the invention is a plane, a half-open groove can be formed between the mounting hole arranged on the insulating fixing layer and the bottom plate for placing a capacitor, and the insulating fixing layer plays a role in assisting in fixing the capacitor; when the capacitor is placed in the mounting hole, the capacitor can be in contact with the bottom plate; when the capacitor is subjected to electrical test, the capacitor is directly placed on the insulating fixing layer, and the top plate is installed; simple structure, convenient operation is swift.

Description

Capacitor power-on test fixture

Technical Field

The present invention relates to the field of testing tools, and more particularly, to a testing tool for testing power-on of a capacitor.

Background

In the production process of the capacitor, electric performance tests such as electric capacity, loss tangent, insulation resistance, dielectric withstand voltage, temperature characteristics and the like need to be carried out so as to ensure the quality consistency, environmental adaptability and reliability of products. The conventional fixture method is to weld the product to the test substrate and then perform the test. The method has the defects of easy damage to products, incapability of recycling, low testing accuracy and the like. Meanwhile, the old test fixture can only perform single electrical property test and cannot be switched. In the process of testing the electrical property of the capacitor, the traditional clamp is not easy to place the capacitor and is easy to damage a gold layer electrode on the surface of the capacitor, so that the reliability and the result of the test are influenced; and poor contact is easy to occur between the testing top end and the capacitor in the high and low temperature testing process, so that the measurement is failed, and various electrical properties of the capacitor cannot be accurately tested. Each time the test fails, the test needs to be repeated, and even the product is welded again, so that the test efficiency is influenced. In particular, small-sized products cannot be accurately and efficiently tested.

Because the volume of the capacitor is too small, the minimum size is only 0.15mm multiplied by 0.05mm, the surface of the electrode of the product is a gold electrode, the traditional test fixture is easy to damage the gold plating layer of the product, the electrical property of the product is influenced, meanwhile, the product is welded on a test substrate, and after a certain performance test is finished, the product cannot be taken down for testing other projects, and needs to be welded again.

Disclosure of Invention

In view of the above disadvantages, an object of the present invention is to provide a capacitor power-on test fixture, which solves the problem that it is difficult to take off a capacitor for testing other items after the capacitor is welded to a test substrate, and improves the test efficiency of the capacitor.

The embodiment of the invention provides a capacitor electrifying test fixture, which comprises: the top plate, the insulating fixing layer and the bottom plate are sequentially connected from top to bottom; the insulating fixed layer is provided with an installation part for fixing the capacitor; a cavity for placing the capacitor is formed between the top plate and the insulating fixing layer;

wherein the bottom plate and the top plate are electrically connected, and the electric polarity of the bottom plate is opposite to that of the top plate.

Furthermore, the middle part of the top plate protrudes towards the direction of the insulating fixing layer to form a connecting part, and the end face of the connecting part abuts against the insulating fixing layer; the connecting part divides the cavity into two parts.

Furthermore, the capacitance electrifying test fixture also comprises a probe, the top plate is provided with a plurality of first through holes for the probe to pass through, and the probe is electrically connected with the top plate; one end of the probe penetrates through the first through hole to be electrically connected with the capacitor.

Further, the probe is a spring probe.

Further, the capacitor has a first end and a second end, the capacitor is placed on the mounting portion, and the first end is in contact with the bottom plate to form an electrical connection; the second end is electrically connected with the top plate.

Furthermore, a second through hole is formed in the top plate, a third through hole is formed in the insulating fixing layer, a fourth through hole is formed in the bottom plate, and the second through hole, the third through hole and the fourth through hole are coaxially arranged; the capacitor electrification testing jig is further provided with a fastener, the fastener sequentially passes through the second through hole, the third through hole and the fourth through hole to connect the top plate, the insulation fixing layer and the bottom plate together, and a convex block is further arranged in the middle of one side of the bottom plate, which is far away from the insulation fixing layer; the fourth through hole penetrates through the lug.

Furthermore, auxiliary fixed blocks are further arranged on two sides of one side, away from the insulating fixed layer, of the bottom plate, and the thickness of each auxiliary fixed block is larger than or equal to that of the corresponding bump; the bottom plate is provided with the fifth through-hole, supplementary fixed block is provided with the sixth through-hole, the fifth through-hole with the sixth through-hole intercommunication, the bottom plate with supplementary fixed block can dismantle the connection.

Further, the insulating fixing layer is made of polymethyl methacrylate.

Furthermore, the bottom plate and the top plate are made of conductive metal materials.

Further, the mounting portion includes a plurality of mounting holes.

Adopt above-mentioned scheme, the electric test fixture on electric capacity that this embodiment provided, its beneficial effect lies in: the surface of the bottom plate is a plane, a half-open groove can be formed between the mounting hole arranged on the insulating fixing layer and the bottom plate for placing a capacitor, and the insulating fixing layer plays a role in assisting in fixing the capacitor; and when the capacitor is placed on the mounting part, the capacitor can be in contact with the bottom plate; when the capacitor is subjected to electrical test, the capacitor is directly placed on the insulating fixing layer, and the top plate is installed; simple structure, convenient operation is swift. The test fixture is used for nondestructive testing, can be repeatedly used, does not damage the capacitor and the insulating fixing layer for fixing the capacitor, and simultaneously improves the test efficiency and reduces the test cost due to the reduction of welding steps.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.

Fig. 1 is a schematic view of an overall structure of a capacitive power-up test fixture according to a first embodiment of the invention.

Fig. 2 is an exploded view of the capacitive power-up test fixture of fig. 1.

Fig. 3 is a partially enlarged schematic view of a in fig. 1.

Fig. 4 is a partially enlarged schematic view of b in fig. 2.

FIG. 5 is a diagram of a capacitor according to a first embodiment of the present invention.

Fig. 6 is a bottom structure view of the bottom plate 30 in fig. 1.

Fig. 7 is a schematic view of an overall structure of a capacitive power-up test fixture according to a second embodiment of the invention.

In the figure, 10-top plate, 11-connecting part, 12-first through hole, 13-second through hole, 20-insulating fixing layer, 21-mounting hole, 23-third through hole, 30-bottom plate, 31-fifth through hole, 32-bump, 33-fourth through hole, 34-auxiliary fixing block, 341-sixth through hole, 40-probe, 50-capacitor, 51-first end, 52-second end.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

In the description of the present invention, it is to be understood that the terms "central," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the invention and to simplify the description, and are not intended to indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and are therefore not to be considered limiting of the invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.

[ first embodiment ]

Referring to fig. 1 to 6, in the embodiment of the invention, the capacitor power-on test fixture includes a top plate 10, an insulating fixing layer 20 and a bottom plate 30 sequentially connected from top to bottom; the insulating fixing layer 20 is provided with a plurality of mounting holes 21 for fixing the capacitor 50; a cavity for placing the capacitor 50 is formed between the top plate 10 and the insulating fixing layer 20; since the capacitor 50 has a small volume and is in the shape of a chip (as shown in fig. 4), when the power-up test is required to be performed on the two ends of the capacitor 50, the capacitor 50 can be conveniently and quickly fixed by directly placing the capacitor on the insulating fixing layer 20. Because the upper surface of the bottom plate 30 is a plane, a half-open groove is formed between the mounting hole 21 arranged on the insulating fixing layer 20 and the bottom plate 30, and the capacitor 50 is placed; and the capacitor 50 is placed in the mounting hole 21, the capacitor 50 can be brought into contact with the bottom plate 30.

The bottom plate 30 and the top plate 10 are electrically connected, and the bottom plate 30 has an electric polarity opposite to that of the top plate 10 to form an electric circuit. The bottom plate 30 is charged with an electrical polarity opposite to that of the top plate 10. That is, when the electrode of the bottom plate 30 is positive, the electrode attached to the top plate 10 is negative. When the electrode of the bottom plate 30 is a negative electrode, the electrode attached to the top plate 10 is a positive electrode. The top plate 10 and the bottom plate 30 may be directly powered on or charged by connecting charged electrode plates, and are not limited herein.

Specifically, the middle part of the top plate 10 protrudes towards the insulating fixed layer 20 to form a connecting part 11, and the end surface of the connecting part 11 abuts against the insulating fixed layer 20; the connecting portion 11 divides the cavity into two small cavities. In the present embodiment, the connection portion 11 is disposed in the middle of the top plate 10, so that the top plate 10, the insulating fixing layer 20 and the connection portion 11 form two left and right cavities.

Specifically, referring to fig. 4, the capacitor 50 has a first end 51 and a second end 52, the capacitor 50 is disposed in the mounting hole 21, and the first end 51 is in contact with the bottom plate 30 to form an electrical connection; the second end 52 is electrically connected to the top plate 10.

Specifically, the capacitance electrification testing jig further comprises a probe 40, the top plate 10 is provided with a plurality of first through holes 12 for the probe 40 to pass through, and the probe 40 is electrically connected with the top plate 10; one end of the probe 40 passes through the first through hole 12 to electrically connect with the capacitor 50, i.e. in the present embodiment, the second end 52 of the capacitor 50 is electrically connected with the capacitor 50 by contacting with the probe 40. In actual use, it is often necessary to pick and place the capacitor 50, and the top plate 10 needs to be removed in the process of picking and placing the capacitor 50. In order to prevent the probe pin 40 from falling off when the top plate 10 is removed or attached, the probe pin 40 is welded to the top plate 10. One end of the probe 40 is electrically connected to the capacitor 50 after passing through the first via 12. Since the capacitors 50 have a certain tolerance in the manufacturing process, in order to ensure that each capacitor 50 can be electrically connected to the top plate 10 and the bottom plate 30 during the power-on test of the capacitors 50, the probe 40 provided on the top plate 10 can further extend toward the capacitor 50.

Specifically, the probe 40 is a spring probe. The end of the spring probe is provided with an elastic conductor, and the elastic conductor can deform when external force occurs. In actual testing, the capacitor 50 is pressed against the electrode of the capacitor 50 with a certain pressure by the elastic conductor at the end of the probe 40, and the capacitor 50 is positioned by being placed on the insulating fixing layer 20 so that the first end 51 of the capacitor 50 is pressed against the bottom plate 30 and the second end 52 of the capacitor 50 is electrically connected to the end of the probe 40.

Specifically, the top plate 10 is provided with a second through hole 13, the insulating fixing layer 20 is provided with a third through hole 23, the bottom plate 30 is provided with a fourth through hole 33, and the second through hole 13, the third through hole 23 and the fourth through hole 33 are coaxially arranged; the capacitive electrification testing jig is further provided with a fastener (such as a screw or a bolt), and the fastener connects the top plate 10, the insulating fixing layer 20 and the bottom plate 30 together sequentially through the second through hole 13, the third through hole 23 and the fourth through hole 33. When the capacitor 50 is tested, the fastener releases the top plate 10 and the capacitor 50 can be removed.

Specifically, a bump 32 is further disposed in the middle of one side of the bottom plate 30 away from the insulating fixing layer 20; the fourth through hole 33 penetrates the bump 32. Since the capacitor 50 has a small volume, the thicknesses of the top plate 10 and the bottom plate 30 are relatively thin, and the bumps 32 are provided to increase the thickness of the bottom plate 30, so that the capacitor is more convenient to fix, and the top plate 10 and the bottom plate 30 are not easily deformed when being fixed. In this embodiment, in order to ensure the balance of the power-on jig, the thickness of the auxiliary fixing block 34 is equal to the thickness of the bump 32, so that the stability of the power-on jig in the testing process is ensured, and the power-on jig is prevented from shaking.

Specifically, two sides of one side of the bottom plate 30, which faces away from the insulating fixing layer 20, are further provided with auxiliary fixing blocks 34, and the thickness of the auxiliary fixing blocks 34 is greater than or equal to that of the bumps 32; the bottom plate 30 is provided with a fifth through hole 31, the auxiliary fixing block 34 is provided with a sixth through hole 341, the fifth through hole 31 is communicated with the sixth through hole 341, and the bottom plate 30 is detachably connected with the auxiliary fixing block 34.

Specifically, the insulating fixing layer 20 is made of polymethyl Methacrylate (PMMA), which is named as acrylic or organic glass in chinese, and has good transparency, chemical stability and weather resistance, and when the insulating fixing layer 20 is used to fix the capacitor 50, it can play an insulating role, so as to prevent the insulating fixing layer 20 from being conducted with the capacitor 50, thereby affecting the testing effect.

Specifically, the bottom plate 30 and the top plate 10 are made of conductive metal materials, so that the bottom plate 30 and the top plate 10 can be electrified conveniently.

In this embodiment, since the bottom plate 30 is a plane, the chip-shaped capacitor 50 is not easily stood up for power-up test, and the insulating fixing layer 20 having the mounting hole 21 is placed on the bottom plate 30 to assist in fixing the capacitor 50. Since the insulating fixing layer 20 is made of an insulating material, conduction is not formed even if the first terminal 51 or the second terminal 52 of the capacitor 50 is contacted. Capacitor 50 is placed in mounting hole 21 with first end 51 of capacitor 50 in electrical communication with bottom plate 30 and bottom plate 30 when energized, with probe 40 in contact with second end 52 of capacitor 50 when top plate 10 is mounted, and with top plate 10 in electrical communication with second end 52 of capacitor 50 through probe 40 when top plate 10 is energized, thereby completing the electrical testing of capacitor 50.

[ second embodiment ]

Referring to fig. 7, the difference between the present embodiment and the previous embodiment is: the top plate 10 is in direct contact with the second end 52 of the capacitor 50 to form an electrical connection, i.e., no probe 40 is disposed on the top plate 10. In order to ensure that the bottom plate 30 and the top plate 10 can both contact the capacitor 50 when the bottom plate 30 and the top plate 10 are powered on, the distance between the first end 51 and the second end 52 of the capacitor 50 (i.e. the height of the capacitor 50 in the vertical direction) is equal to or slightly greater than the height of the connecting portion 11, so as to ensure that the top plate 10 and the bottom plate 30 can both contact the capacitor 50 after the top plate 10 and the bottom plate 30 are assembled. When the capacitor 50 needs to be subjected to a power-on test, the top plate 10 is detached, the capacitor 50 is placed on the insulating fixing layer 20, and then the top plate 10 is installed and screwed through a fastener (e.g., a screw).

Understandably, a capacitor electrification test fixture comprises a top plate 10, an insulating fixed layer 20 and a bottom plate 30 which are sequentially connected from top to bottom, wherein a capacitor 50 to be tested is placed on the insulating fixed layer 20 and is fixed through the insulating fixed layer 20. The capacitor 50 is tested with the bottom plate 30 having an electrode opposite the electrode of the top plate 10. The test fixture is a non-destructive test, can be repeatedly used, does not damage the capacitor 50 and the insulating fixing layer 20 for fixing the capacitor 50, and simultaneously improves the test efficiency and reduces the test cost due to the reduction of welding steps; meanwhile, the insulating fixing layer 20 is provided with a plurality of mounting holes 21 for fixing the capacitors 50, that is, a plurality of capacitors 50 can be tested at one time, and the number of the actual mounting holes 21 can be set according to actual requirements. The power-on test fixture is suitable for high-temperature or normal-temperature test environments and the like.

The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.

Claims

1. The utility model provides a test fixture on electric capacity which characterized in that includes: the top plate (10), the insulating fixing layer (20) and the bottom plate (30) are sequentially connected from top to bottom; the insulating fixing layer (20) is provided with an installation part for fixing the capacitor (50); a cavity for placing the capacitor (50) is formed between the top plate (10) and the insulating fixing layer (20);

wherein the bottom plate (30) and the top plate (10) are electrically connected, and the electric polarity of the bottom plate (30) is opposite to the electric polarity of the top plate (10).

2. The capacitive power-on test fixture of claim 1, wherein: the middle part of the top plate (10) protrudes towards the direction of the insulating fixing layer (20) to form a connecting part (11), and the end face of the connecting part (11) abuts against the insulating fixing layer (20); the connecting part (11) divides the cavity into two parts.

3. The capacitive power-on test fixture of claim 1, wherein: the capacitance electrifying test fixture further comprises a probe (40), the top plate (10) is provided with a plurality of first through holes (12) for the probe (40) to pass through, and the probe (40) is electrically connected with the top plate (10); one end of the probe (40) penetrates through the first through hole (12) to be electrically connected with the capacitor (50).

4. The capacitive power-on test fixture of claim 3, wherein: the probe (40) is a spring probe.

5. The capacitive power-on test fixture of claim 1, wherein: the capacitor (50) is provided with a first end (51) and a second end (52), the capacitor (50) is placed on the mounting part, and the first end (51) is in contact with the bottom plate (30) to form an electric connection; the second end (52) is electrically connected to the top plate (10).

6. The capacitive power-on test fixture of claim 1, wherein: a second through hole (13) is formed in the top plate (10), a third through hole (23) is formed in the insulating fixing layer (20), a fourth through hole (33) is formed in the bottom plate (30), and the second through hole (13), the third through hole (23) and the fourth through hole (33) are coaxially arranged; the capacitor electrification testing jig is further provided with a fastener, the fastener sequentially passes through the second through hole (13), the third through hole (23) and the fourth through hole (33) to connect the top plate (10), the insulating fixing layer (20) and the bottom plate (30) together, and a convex block (32) is further arranged in the middle of one surface, deviating from the insulating fixing layer (20), of the bottom plate (30); the fourth through hole (33) penetrates through the bump (32).

7. The capacitive power-on test fixture of claim 6, wherein: two sides of one side, away from the insulating fixing layer (20), of the bottom plate (30) are also provided with auxiliary fixing blocks (34), and the thickness of each auxiliary fixing block (34) is larger than or equal to that of each bump (32); the bottom plate (30) is provided with a fifth through hole (31), the auxiliary fixing block (34) is provided with a sixth through hole (341), the fifth through hole (31) is communicated with the sixth through hole (341), and the bottom plate (30) is detachably connected with the auxiliary fixing block (34).

8. The capacitive power-on test fixture of claim 1, wherein: the insulating fixing layer (20) is made of polymethyl methacrylate.

9. The capacitive power-on test fixture of claim 1, wherein: the bottom plate (30) and the top plate (10) are made of conductive metal materials.

10. The capacitive power-on test fixture of claim 1, wherein: the mounting portion includes a plurality of mounting holes (21).