CN113742153A - Equipment testing method and device, readable medium and electronic equipment - Google Patents
Equipment testing method and device, readable medium and electronic equipment Download PDFInfo
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Abstract
The disclosure relates to a device testing method, a device testing device, a readable medium and an electronic device. The method comprises the following steps: obtaining a device test parameter corresponding to target device; acquiring a target parameter value corresponding to the equipment test parameter in a to-be-tested environment; and then testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested. Wherein the current environment and the environment to be tested are different environments. Therefore, the target parameter value of the equipment testing parameter can be set in the current conventional environment, the equipment testing in the environment to be tested is simulated, and the same testing effect as that in the actual environment to be tested is obtained, so that the equipment problem can be found more efficiently, the testing cost is reduced, and the testing efficiency is improved.
Description
Technical Field
The present disclosure relates to the field of computer technologies, and in particular, to a device testing method and apparatus, a readable medium, and an electronic device.
Background
With the development and progress of internet technology, a plurality of target servers are needed to provide services for users, and in order to ensure the reliability and the availability of the target servers, more stress tests are performed during the development and the production of the target servers. However, after the target server is subjected to the stress test in the conventional environment, the problem that the failure rate of the target server is high in practical use still occurs. In order to better discover the failure of the target server through the pressure test, the pressure test can be performed in a high-temperature and high-humidity environment, which can make the problematic modules more easily exposed to the problems. For example, a memory module is difficult to find problems in a normal environment, but is easy to test in a high-temperature and high-humidity environment. However, in the related art, the configuration of the high temperature and high humidity environment is complicated, resulting in high test cost and low test efficiency.
Disclosure of Invention
This summary is provided to introduce a selection of concepts in a simplified form that are further described below in the detailed description. This summary is not intended to identify key features or essential features of the claimed subject matter, nor is it intended to be used to limit the scope of the claimed subject matter.
In a first aspect, the present disclosure provides a device testing method, the method comprising:
acquiring equipment test parameters corresponding to target equipment;
acquiring a target parameter value corresponding to the equipment test parameter in a to-be-tested environment;
and testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested, wherein the current environment and the environment to be tested are different environments.
Optionally, the environment to be tested comprises a high-temperature high-humidity environment, wherein the high-temperature high-humidity environment is a test environment with an environment temperature greater than or equal to a preset temperature threshold and an environment humidity greater than or equal to a preset humidity threshold; the obtaining of the target parameter value corresponding to the device test parameter in the environment to be tested includes:
under the condition that the environment to be tested is the high-temperature high-humidity environment, acquiring a first target parameter value corresponding to the high-temperature high-humidity environment according to a preset parameter environment corresponding relation; the preset parameter environment corresponding relation comprises target parameter values of equipment test parameters corresponding to different environments to be tested.
Optionally, the testing the target device according to the target parameter value in the current environment includes:
setting a value of a device test parameter of the target device as the target parameter value;
and testing the target equipment in the current environment.
Optionally, the testing the target device in the current environment includes:
in the current environment, running a target load program through the target equipment so as to test the target equipment; the target load program is a program comprising an operating system and a target business system.
Optionally, the target device is a target server; before the obtaining of the target parameter value corresponding to the device test parameter in the environment to be tested, the method further includes:
and determining the environment to be tested according to the starting parameters of the target server.
Optionally, the starting parameter of the target server includes a preset parameter of a motherboard basic input/output system of the target server.
Optionally, the starting parameter of the target server includes a pin voltage of a preset pin of a motherboard starting chip of the target server.
In a second aspect, the present disclosure provides a device testing apparatus, the apparatus comprising:
the test parameter acquisition module is used for acquiring device test parameters corresponding to the target device;
the parameter value acquisition module is used for acquiring a target parameter value corresponding to the equipment test parameter in a to-be-tested environment;
and the device testing module is used for testing the target device in the current environment according to the target parameter value so as to obtain a testing result of the target device in the environment to be tested, wherein the current environment and the environment to be tested are different environments.
Optionally, the environment to be tested comprises a high-temperature high-humidity environment, wherein the high-temperature high-humidity environment is a test environment with an environment temperature greater than or equal to a preset temperature threshold and an environment humidity greater than or equal to a preset humidity threshold; the parameter value acquisition module is used for acquiring a first target parameter value corresponding to the high-temperature high-humidity environment according to a preset parameter environment corresponding relation under the condition that the environment to be tested is the high-temperature high-humidity environment; the preset parameter environment corresponding relation comprises target parameter values of equipment test parameters corresponding to different environments to be tested.
Optionally, the device testing module is configured to set a value of a device testing parameter of the target device as the target parameter value; and testing the target equipment in the current environment.
Optionally, the device testing module is configured to run a target load program through the target device in the current environment, so as to test the target device; the target load program is a program comprising an operating system and a target business system.
Optionally, the apparatus further comprises:
and the to-be-tested environment determining module is used for determining the to-be-tested environment according to the starting parameters of the target server.
Optionally, the starting parameter of the target server includes a preset parameter of a motherboard basic input/output system of the target server.
Optionally, the starting parameter of the target server includes a pin voltage of a preset pin of a motherboard starting chip of the target server.
In a third aspect, the present disclosure provides a computer readable medium having stored thereon a computer program which, when executed by a processing apparatus, performs the steps of the method of the first aspect of the present disclosure.
In a fourth aspect, the present disclosure provides an electronic device comprising:
a storage device having a computer program stored thereon;
processing means for executing the computer program in the storage means to implement the steps of the method of the first aspect of the present disclosure.
By adopting the technical scheme, the device test parameters corresponding to the target device are obtained; acquiring a target parameter value corresponding to the equipment test parameter in a to-be-tested environment; and then testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested. Wherein the current environment and the environment to be tested are different environments. Therefore, the target parameter values of the equipment testing parameters can be set in the current conventional environment, the equipment testing in the environment to be tested (such as a high-temperature high-humidity environment) is simulated, and the same testing effect as that in the actual environment to be tested is obtained, so that the equipment problems can be found more efficiently, the testing cost is reduced, and the testing efficiency is improved.
Additional features and advantages of the disclosure will be set forth in the detailed description which follows.
Drawings
The above and other features, advantages and aspects of various embodiments of the present disclosure will become more apparent by referring to the following detailed description when taken in conjunction with the accompanying drawings. Throughout the drawings, the same or similar reference numbers refer to the same or similar elements. It should be understood that the drawings are schematic and that elements and features are not necessarily drawn to scale. In the drawings:
FIG. 1 is a flow chart illustrating a method of device testing according to an exemplary embodiment.
Fig. 2 is a flowchart illustrating a step S103 according to the embodiment shown in fig. 1.
FIG. 3 is a flow chart illustrating another method of device testing according to an example embodiment.
FIG. 4 is a block diagram illustrating a device testing apparatus according to an exemplary embodiment.
FIG. 5 is a block diagram illustrating another device testing apparatus according to an example embodiment.
FIG. 6 is a block diagram illustrating an electronic device in accordance with an example embodiment.
Detailed Description
Embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While certain embodiments of the present disclosure are shown in the drawings, it is to be understood that the present disclosure may be embodied in various forms and should not be construed as limited to the embodiments set forth herein, but rather are provided for a more thorough and complete understanding of the present disclosure. It should be understood that the drawings and embodiments of the disclosure are for illustration purposes only and are not intended to limit the scope of the disclosure.
It should be understood that the various steps recited in the method embodiments of the present disclosure may be performed in a different order, and/or performed in parallel. Moreover, method embodiments may include additional steps and/or omit performing the illustrated steps. The scope of the present disclosure is not limited in this respect.
The term "include" and variations thereof as used herein are open-ended, i.e., "including but not limited to". The term "based on" is "based, at least in part, on". The term "one embodiment" means "at least one embodiment"; the term "another embodiment" means "at least one additional embodiment"; the term "some embodiments" means "at least some embodiments". Relevant definitions for other terms will be given in the following description.
It should be noted that the terms "first", "second", and the like in the present disclosure are only used for distinguishing different devices, modules or units, and are not used for limiting the order or interdependence relationship of the functions performed by the devices, modules or units.
It is noted that references to "a", "an", and "the" modifications in this disclosure are intended to be illustrative rather than limiting, and that those skilled in the art will recognize that "one or more" may be used unless the context clearly dictates otherwise.
The names of messages or information exchanged between devices in the embodiments of the present disclosure are for illustrative purposes only, and are not intended to limit the scope of the messages or information.
First, an application scenario of the present disclosure will be explained. The present disclosure may be applied to device testing scenarios, such as stress testing of a target server. In order to better discover equipment failure through pressure testing, pressure testing can be performed in a high temperature and high humidity environment, which can make problematic modules more easily exposed to problems. For example, the memory module of the target server is difficult to find problems in a conventional environment, but the problems are easy to detect in a high-temperature and high-humidity environment. In the related art, in order to perform a test in a high-temperature and high-humidity environment, a professional temperature and humidity test room needs to be constructed, and the high-temperature and high-humidity environment is constructed through the temperature and humidity of the paper temperature and humidity test room to perform the test. In the method, the structure of a temperature and humidity test room and the temperature and humidity control are complex, and a professional test device is generally needed to construct the test environment, so that the test cost is high and the test efficiency is low.
In order to solve the above problems, the present disclosure provides a method, an apparatus, a readable medium, and an electronic device for device testing, where device testing parameters corresponding to a target device are obtained; acquiring a target parameter value corresponding to the equipment test parameter in a to-be-tested environment; and then testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested. Wherein the current environment and the environment to be tested are different environments. Therefore, the target parameter value of the equipment testing parameter can be set in the current conventional environment, the equipment testing in the environment to be tested is simulated, and the same testing effect as that in the actual environment to be tested is obtained, so that the equipment problem can be found more efficiently, the testing cost is reduced, and the testing efficiency is improved.
The following detailed description of specific embodiments of the present disclosure is provided in connection with the accompanying drawings.
FIG. 1 is an illustration of a method of device testing, as shown in FIG. 1, in accordance with an exemplary embodiment, the method comprising:
And 102, acquiring a target parameter value corresponding to the equipment test parameter in the to-be-tested environment.
Step 103, testing the target device in the current environment according to the target parameter value to obtain a test result of the target device in the environment to be tested.
Wherein the current environment and the environment to be tested are different environments.
Illustratively, the target device may be a target server, terminal, or other electronic device. The target device may include a processor and a memory, the processor may be a CPU (Central Processing Unit) or a GPU (Graphics Processing Unit), and the memory may be a memory or a hard disk; the device test parameters may include device parameters of a processor or a memory. For example, the device test parameters may include a refresh rate, voltage, or other parameters of the memory.
Further, the environment to be tested may be a high temperature and high humidity environment, a high temperature environment, a high humidity or low temperature environment, etc., and the current environment may be a normal environment with moderate temperature and humidity. As an example, a test environment having a temperature of 18 to 30 degrees celsius and a humidity of 30% to 60% may be used as the normal environment. It is to be noted that the convention is moderate in temperature and humidity.
By adopting the method, the device test parameters corresponding to the target device are obtained; acquiring a target parameter value corresponding to the equipment test parameter in a to-be-tested environment; and then testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested. Wherein the current environment and the environment to be tested are different environments. Therefore, the target parameter values of the equipment testing parameters can be set in the current conventional environment, the equipment testing in the environment to be tested (such as a high-temperature high-humidity environment) is simulated, and the same testing effect as that in the actual environment to be tested is obtained, so that the equipment problems can be found more efficiently, the testing cost is reduced, and the testing efficiency is improved.
In another embodiment of the present disclosure, the presetting of different target parameter values for different environments to be tested may specifically include any one of the following manners:
the first mode is that the environment to be tested comprises a high-temperature high-humidity environment, and the high-temperature high-humidity environment is a testing environment with the environment temperature being greater than or equal to a preset temperature threshold value and the environment humidity being greater than or equal to a preset humidity threshold value. Therefore, under the condition that the environment to be tested is the high-temperature high-humidity environment, the first target parameter value corresponding to the high-temperature high-humidity environment can be obtained according to the corresponding relation of the preset parameter environment; the preset parameter environment corresponding relation comprises target parameter values of equipment test parameters corresponding to different environments to be tested.
For example, the preset temperature threshold may be 40 degrees celsius, 60 degrees celsius, or 85 degrees celsius, and the preset humidity threshold may be 60%, 70%, or 85%; and taking the test environment with the environment temperature being more than or equal to a preset temperature threshold and the environment humidity being more than or equal to a preset humidity threshold as the high-temperature high-humidity environment. In the case that the target device includes a memory, the device test parameters may include tREF (Refresh Period), tWR (Write Recovery Time), and VDD (Voltage Drain-to-Drain) of the memory. The step of obtaining a first target parameter value of the device test parameter in the high-temperature environment according to the preset parameter environment corresponding relationship includes: tREF 15.6 microseconds, tWR 10 nanoseconds, and VDD 1.2 volts.
It should be noted that, the first target parameter value is taken as an example, and the preset parameter environment corresponding relationships corresponding to different device types may be different, for example, different preset parameter environment corresponding relationships may be preset according to different memory models.
Therefore, the target parameter value of the device test parameter corresponding to the high-temperature high-humidity environment can be obtained through the preset parameter environment corresponding relation, the target device is tested in the current environment (such as a normal-temperature environment) according to the target parameter value, the high-temperature high-humidity environment can be simulated, the test result of the target device in the high-temperature high-humidity environment is obtained, the fault detection rate of the target device is improved, and the test efficiency is also improved.
In a second mode, the environment to be tested may include a high temperature environment, where the high temperature environment is a test environment with an ambient temperature greater than or equal to a preset temperature threshold. Therefore, under the condition that the environment to be tested is the high-temperature environment, the second target parameter value corresponding to the high-temperature environment can be obtained according to the preset parameter environment corresponding relation; the preset parameter environment corresponding relation comprises target parameter values of equipment test parameters corresponding to different environments to be tested.
Similarly, the preset temperature threshold may be 40 degrees celsius, 60 degrees celsius, or 85 degrees celsius; and taking the environment which is greater than or equal to the preset temperature threshold value as a high-temperature environment. In the case that the target device includes a memory, the device test parameters may include tREF, tWR, and VDD of the memory. The step of obtaining a second target parameter value of the device test parameter in the high-temperature environment according to the preset parameter environment corresponding relationship includes: tREF 7.8 μ s, tWR 10 ns, and VDD 1.2 v.
It should be noted that, the second target parameter value is an example, and the preset parameter environment corresponding relationships corresponding to different device types may be different, for example, different preset parameter environment corresponding relationships may be preset according to different memory models.
Therefore, the target parameter value of the equipment test parameter corresponding to the high-temperature environment can be obtained through the preset parameter environment corresponding relation, the target equipment is tested in the current environment (normal-temperature environment) according to the target parameter value, the high-temperature environment can be simulated, the test result of the target equipment in the high-temperature environment is obtained, the fault detection rate of the target equipment is improved, and the test efficiency is also improved.
In a second mode, the environment to be tested may include a high humidity environment, where the high humidity environment is a test environment with an environmental humidity greater than or equal to a preset humidity threshold. Thus, under the condition that the environment to be tested is the high-humidity environment, a third target parameter value corresponding to the high-humidity environment is obtained according to the corresponding relation of the preset parameter environment; the preset parameter environment corresponding relation comprises target parameter values of equipment test parameters corresponding to different environments to be tested.
For example, the preset humidity threshold may be 60%, 70%, or 85%, and an environment greater than or equal to the preset humidity threshold may be used as a high humidity environment. Under the condition that the target device includes a memory, obtaining a third target parameter value of the device test parameter in the high-humidity environment through the preset parameter environment corresponding relationship includes: tREF 7.8 μ s, tWR 10 ns, and VDD 1.21 v.
It should be noted that, the first target parameter value is taken as an example, and the preset parameter environment corresponding relationships corresponding to different device types may be different, for example, different preset parameter environment corresponding relationships may be preset according to different memory models.
Therefore, the target parameter value of the equipment test parameter corresponding to the high-humidity environment can be obtained through the preset parameter environment corresponding relation, the target equipment is tested according to the target parameter value in the current environment, the high-humidity environment can be simulated, the test result of the target equipment in the high-humidity environment is obtained, the fault detection rate of the target equipment is improved, and the test efficiency is also improved.
In another embodiment of the present disclosure, the step 103 of testing the target device according to the target parameter value in the current environment may include the following steps:
first, the value of the device test parameter of the target device is set as the target parameter value.
The target device is then tested in the current environment.
Also exemplarily, in a case where the target device includes a memory, tREF of the memory may be set to 15.6 microseconds, tWR may be set to 10 nanoseconds, and VDD may be set to 1.2 volts according to the preset parameter environment correspondence; the target device is then tested in the current environment.
Therefore, the target equipment can be tested by simulating the environment to be tested by changing the value of the equipment test parameter, the fault detection rate of the target equipment is improved, and the test efficiency is also improved.
Further, when the device test parameter of the target device is multiple, the target parameter value of each device test parameter may be set in sequence, and the target device may be tested multiple times in the current environment.
Fig. 2 is a flowchart of a step S103 according to the embodiment shown in fig. 1, where, as shown in fig. 2, in the case that the device test parameters of the target device include tREF, tWR and VDD, the step 103 of testing the target device according to the target parameter value in the current environment may include the following steps:
and step 1031, setting the device test parameters as default values, and testing the target device in the current environment.
Step 1032, setting the tREF to a preset tREF test value, and testing the target device in the current environment.
Illustratively, the preset tREF test value may be 7.8 microseconds.
Further, the value of tREF may also be set to change back and forth between 7.8 microseconds and 15.6 microseconds with a preset period.
Step 1033, setting tREF to a first preset tWR test value, and testing the target device in the current environment.
Illustratively, the first preset tWR test value may be 8 nanoseconds or 10 nanoseconds.
Likewise, the value of tWR may be set to change back and forth between 8 nanoseconds and 10 nanoseconds with a preset period.
Step 1034, setting tREF to a first preset VDD test value, and testing the target device in the current environment.
Illustratively, the first preset VDD test value may be any value within a range of 1.2V ± 10%.
Step 1035, setting tREF to a second preset VDD test value, and setting tREF to the second preset VDD test value, and testing the target device in the current environment.
Illustratively, the second preset VDD test value may be any value within a range of 1.2V ± 10%; the second preset tWR test value may be 8 nanoseconds.
Therefore, the fault detection rate of the target equipment can be further improved by testing the target parameter values of the multiple equipment test parameters of the equipment for multiple times.
Further, the manner of testing the target device in the current environment may include: running a target load program through the target equipment in the current environment so as to test the target equipment; the target load program is a program comprising an operating system and a target business system.
It should be noted that, in the related art, the test in the high-temperature and high-humidity environment is a test in a Pre-OS (Pre Operating System, no Operating System) mode, that is, a device which is not deployed with an Operating System and a service System is used for testing, and only a fixed test program or code stream is used for performing a simple test in the high-temperature and high-humidity environment. The method is difficult to simulate the actual target load program, so that the problem cannot be found during the test, but the problem is easy to occur during the actual operation of the target load program, and the problem omission ratio of the test is high. By adopting the method in the disclosure, the target load program can be run through the target device in the current environment, and the target load program is a program comprising an operating system and a target service system, so that the targeted test can be performed by running the actual operating system and the target service system program, the problem in the actual running of the device can be found more easily, and the accuracy of the target device test is improved.
Further, the manner of testing the target device in the current environment may include: in the current environment, running a memory read-write test program through the target equipment so as to test the target equipment; the memory read-write test program is used for repeatedly reading and writing the target memory position according to a preset sequence.
The memory read-write test program may run in an environment without an operating system, and for example, the memory read-write program may include:
and performing multiple read-write operations on the target memory position according to a preset sequence, and comparing the read data with the written data to determine whether the memory position fails. Alternatively, the first and second electrodes may be,
and performing multiple read-write operations on the target memory position and the adjacent position of the target memory position, and comparing the read data with the written data to determine whether the memory position and the adjacent position have faults.
Therefore, under the condition that the target equipment is not provided with the operating system and the real service system, the target equipment can be tested through the memory read-write test program.
In another embodiment of the present disclosure, the target device is a target server; before the obtaining of the target parameter value corresponding to the device test parameter in the environment to be tested, the method may further include: and determining the environment to be tested according to the starting parameters of the target server.
The starting parameter of the target server may include a preset parameter of a main board BIOS (Basic Input Output System) of the target server, and the preset parameter may be used to determine an environment to be tested. By way of example, the environment to be tested can be characterized as a high-temperature and high-humidity environment by a value of 1, the environment to be tested is characterized as a high-temperature environment by a value of 2, the environment to be tested is characterized as a high-humidity environment by a value of 3, and the environment to be tested is characterized as a low-temperature environment by a value of 4.
Further, the boot parameters of the target server may further include a pin voltage of a preset pin of a motherboard boot chip of the target server. The preset pin may be one or more pins of a motherboard startup chip. The pin voltage may be used to determine the environment to be tested.
Therefore, the environment to be tested is determined through the starting parameters, automatic testing can be realized, and testing efficiency is improved.
FIG. 3 is another method of device testing, shown in FIG. 3, which may include, according to an example embodiment:
Step 302, initializing a target device bottom platform component.
Illustratively, the initialization of various platform components including DDR SDRAM (Double Data Rate Synchronous Random Access Memory), PCIe (Peripheral Component Interconnect express), and the like.
Step 303, obtaining a starting parameter of the target device, and determining an environment to be tested according to the starting parameter.
For example, the boot parameter may be a preset parameter of a main board BIOS (Basic Input Output System) of the target server, or a pin voltage of a preset pin of a main board boot chip of the target server.
And step 304, acquiring device test parameters corresponding to the target device.
And 305, acquiring a target parameter value corresponding to the device test parameter in the to-be-tested environment according to the to-be-tested environment.
Step 307, in the current environment, the operating system in the target load program is started by the target device.
In summary, by adopting the above scheme, the device test parameters corresponding to the target device are obtained; acquiring a target parameter value corresponding to the equipment test parameter in a to-be-tested environment; and then testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested. Wherein the current environment and the environment to be tested are different environments. Therefore, the target parameter values of the equipment testing parameters can be set in the current conventional environment, the equipment testing in the environment to be tested (such as a high-temperature high-humidity environment) is simulated, and the same testing effect as that in the actual environment to be tested is obtained, so that the equipment problems can be found more efficiently, the testing cost is reduced, and the testing efficiency is improved.
FIG. 4 is a block diagram illustrating a device testing apparatus according to an exemplary embodiment. As shown in fig. 4, the device testing apparatus includes:
a test parameter obtaining module 401, configured to obtain a device test parameter corresponding to a target device;
a parameter value obtaining module 402, configured to obtain a target parameter value corresponding to the device test parameter in an environment to be tested;
the device testing module 403 is configured to test the target device in a current environment according to the target parameter value to obtain a test result of the target device in the environment to be tested, where the current environment is different from the environment to be tested.
Optionally, the environment to be tested comprises a high-temperature high-humidity environment, wherein the high-temperature high-humidity environment is a test environment with an environment temperature greater than or equal to a preset temperature threshold and an environment humidity greater than or equal to a preset humidity threshold; the parameter value obtaining module 402 is configured to, when the environment to be tested is the high-temperature high-humidity environment, obtain a first target parameter value corresponding to the high-temperature high-humidity environment according to a preset parameter environment corresponding relationship; the preset parameter environment corresponding relation comprises target parameter values of equipment test parameters corresponding to different environments to be tested.
Optionally, the device testing module 403 is configured to set a value of a device testing parameter of the target device as the target parameter value; the target device is tested in the current environment.
Optionally, the device testing module 403 is configured to run a target load program through the target device in the current environment, so as to test the target device; the target load program is a program comprising an operating system and a target business system.
FIG. 5 is a block diagram illustrating a device testing apparatus according to an exemplary embodiment. As shown in fig. 5, the device testing apparatus further includes:
a to-be-tested environment determining module 501, configured to determine the to-be-tested environment according to the starting parameter of the target server.
Optionally, the starting parameter of the target server includes a preset parameter of a motherboard basic input/output system of the target server.
Optionally, the start parameter of the target server includes a pin voltage of a preset pin of a motherboard start chip of the target server.
By adopting the device, the device test parameters corresponding to the target device can be obtained; acquiring a target parameter value corresponding to the equipment test parameter in a to-be-tested environment; and then testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested. Therefore, the target parameter value of the equipment testing parameter can be set in the current conventional environment, the equipment testing in the environment to be tested is simulated, and the same testing effect as that in the actual environment to be tested is obtained, so that the equipment problem can be found more efficiently, the testing cost is reduced, and the testing efficiency is improved.
Referring now to FIG. 6, a block diagram of an electronic device 600 suitable for use in implementing embodiments of the present disclosure is shown. The terminal device in the embodiments of the present disclosure may include, but is not limited to, a mobile terminal such as a mobile phone, a notebook computer, a digital broadcast receiver, a PDA (personal digital assistant), a PAD (tablet computer), a PMP (portable multimedia player), a vehicle terminal (e.g., a car navigation terminal), and the like, and a stationary terminal such as a digital TV, a desktop computer, and the like. The electronic device shown in fig. 6 is only an example, and should not bring any limitation to the functions and the scope of use of the embodiments of the present disclosure.
As shown in fig. 6, electronic device 600 may include a processing means (e.g., central processing unit, graphics processor, etc.) 601 that may perform various appropriate actions and processes in accordance with a program stored in a Read Only Memory (ROM)602 or a program loaded from a storage means 608 into a Random Access Memory (RAM) 603. In the RAM603, various programs and data necessary for the operation of the electronic apparatus 600 are also stored. The processing device 601, the ROM602, and the RAM603 are connected to each other via a bus 604. An input/output (I/O) interface 605 is also connected to bus 604.
Generally, the following devices may be connected to the I/O interface 605: input devices 606 including, for example, a touch screen, touch pad, keyboard, mouse, camera, microphone, accelerometer, gyroscope, etc.; output devices 607 including, for example, a Liquid Crystal Display (LCD), a speaker, a vibrator, and the like; storage 608 including, for example, tape, hard disk, etc.; and a communication device 609. The communication means 609 may allow the electronic device 600 to communicate with other devices wirelessly or by wire to exchange data. While fig. 6 illustrates an electronic device 600 having various means, it is to be understood that not all illustrated means are required to be implemented or provided. More or fewer devices may alternatively be implemented or provided.
In particular, according to an embodiment of the present disclosure, the processes described above with reference to the flowcharts may be implemented as computer software programs. For example, embodiments of the present disclosure include a computer program product comprising a computer program carried on a non-transitory computer readable medium, the computer program containing program code for performing the method illustrated by the flow chart. In such an embodiment, the computer program may be downloaded and installed from a network via the communication means 609, or may be installed from the storage means 608, or may be installed from the ROM 602. The computer program, when executed by the processing device 601, performs the above-described functions defined in the methods of the embodiments of the present disclosure.
It should be noted that the computer readable medium in the present disclosure can be a computer readable signal medium or a computer readable storage medium or any combination of the two. A computer readable storage medium may be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination of the foregoing. More specific examples of the computer readable storage medium may include, but are not limited to: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In the present disclosure, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device. In contrast, in the present disclosure, a computer readable signal medium may comprise a propagated data signal with computer readable program code embodied therein, either in baseband or as part of a carrier wave. Such a propagated data signal may take many forms, including, but not limited to, electro-magnetic, optical, or any suitable combination thereof. A computer readable signal medium may also be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device. Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to: electrical wires, optical cables, RF (radio frequency), etc., or any suitable combination of the foregoing.
In some embodiments, the clients, servers may communicate using any currently known or future developed network Protocol, such as HTTP (HyperText Transfer Protocol), and may interconnect with any form or medium of digital data communication (e.g., a communications network). Examples of communication networks include a local area network ("LAN"), a wide area network ("WAN"), the Internet (e.g., the Internet), and peer-to-peer networks (e.g., ad hoc peer-to-peer networks), as well as any currently known or future developed network.
The computer readable medium may be embodied in the electronic device; or may exist separately without being assembled into the electronic device.
The computer readable medium carries one or more programs which, when executed by the electronic device, cause the electronic device to: obtaining a device test parameter corresponding to target device; acquiring a target parameter value corresponding to the equipment test parameter in a to-be-tested environment; and then testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested. Wherein the current environment and the environment to be tested are different environments.
Computer program code for carrying out operations for the present disclosure may be written in any combination of one or more programming languages, including but not limited to an object oriented programming language such as Java, Smalltalk, C + +, and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet using an Internet service provider).
The flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present disclosure. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
The modules described in the embodiments of the present disclosure may be implemented by software or hardware. The name of the module does not in some cases form a limitation on the module itself, and for example, the test parameter acquiring module may also be described as a "module that acquires device test parameters corresponding to the target device".
The functions described herein above may be performed, at least in part, by one or more hardware logic components. For example, without limitation, exemplary types of hardware logic components that may be used include: field Programmable Gate Arrays (FPGAs), Application Specific Integrated Circuits (ASICs), Application Specific Standard Products (ASSPs), systems on a chip (SOCs), Complex Programmable Logic Devices (CPLDs), and the like.
In the context of this disclosure, a machine-readable medium may be a tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device. The machine-readable medium may be a machine-readable signal medium or a machine-readable storage medium. A machine-readable medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
Example 1 provides, in accordance with one or more embodiments of the present disclosure, a device testing method, the method comprising:
acquiring equipment test parameters corresponding to target equipment;
acquiring a target parameter value corresponding to the equipment test parameter in a to-be-tested environment;
and testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested, wherein the current environment and the environment to be tested are different environments.
Example 2 provides the method of example 1, the environment to be tested comprising a high temperature and high humidity environment, the high temperature and high humidity environment being a test environment with an ambient temperature greater than or equal to a preset temperature threshold and an ambient humidity greater than or equal to a preset humidity threshold; the obtaining of the target parameter value corresponding to the device test parameter in the environment to be tested includes:
under the condition that the environment to be tested is the high-temperature high-humidity environment, acquiring a first target parameter value corresponding to the high-temperature high-humidity environment according to a preset parameter environment corresponding relation; the preset parameter environment corresponding relation comprises target parameter values of equipment test parameters corresponding to different environments to be tested.
Example 3 provides the method of example 1, wherein testing the target device at the target parameter value in the current environment comprises:
setting a value of a device test parameter of the target device as the target parameter value;
and testing the target equipment in the current environment.
Example 4 provides the method of example 3, wherein testing the target device in the current environment comprises:
in the current environment, running a target load program through the target equipment so as to test the target equipment; the target load program is a program comprising an operating system and a target business system.
Example 5 provides the method of any one of examples 1 to 4, the target device being a target server, according to one or more embodiments of the present disclosure; before the obtaining of the target parameter value corresponding to the device test parameter in the environment to be tested, the method further includes:
and determining the environment to be tested according to the starting parameters of the target server.
Example 6 provides the method of example 5, the boot parameters of the target server including preset parameters of a motherboard basic input output system of the target server, according to one or more embodiments of the present disclosure.
Example 7 provides the method of example 5, the boot parameters of the target server including a pin voltage of a preset pin of a motherboard boot chip of the target server, according to one or more embodiments of the present disclosure.
Example 8 provides, in accordance with one or more embodiments of the present disclosure, a device testing apparatus, the apparatus comprising:
the test parameter acquisition module is used for acquiring device test parameters corresponding to the target device;
the parameter value acquisition module is used for acquiring a target parameter value corresponding to the equipment test parameter in a to-be-tested environment;
and the device testing module is used for testing the target device in the current environment according to the target parameter value so as to obtain a testing result of the target device in the environment to be tested, wherein the current environment and the environment to be tested are different environments.
Example 9 provides a computer-readable medium having stored thereon a computer program that, when executed by a processing apparatus, implements the steps of the methods of examples 1-7, in accordance with one or more embodiments of the present disclosure.
Example 10 provides, in accordance with one or more embodiments of the present disclosure, an electronic device comprising: a storage device having a computer program stored thereon; processing means for executing the computer program in the storage means to implement the steps of the methods of examples 1-7.
The foregoing description is only exemplary of the preferred embodiments of the disclosure and is illustrative of the principles of the technology employed. It will be appreciated by those skilled in the art that the scope of the disclosure herein is not limited to the particular combination of features described above, but also encompasses other embodiments in which any combination of the features described above or their equivalents does not depart from the spirit of the disclosure. For example, the above features and (but not limited to) the features disclosed in this disclosure having similar functions are replaced with each other to form the technical solution.
Further, while operations are depicted in a particular order, this should not be understood as requiring that such operations be performed in the particular order shown or in sequential order. Under certain circumstances, multitasking and parallel processing may be advantageous. Likewise, while several specific implementation details are included in the above discussion, these should not be construed as limitations on the scope of the disclosure. Certain features that are described in the context of separate embodiments can also be implemented in combination in a single embodiment. Conversely, various features that are described in the context of a single embodiment can also be implemented in multiple embodiments separately or in any suitable subcombination.
Although the subject matter has been described in language specific to structural features and/or methodological acts, it is to be understood that the subject matter defined in the appended claims is not necessarily limited to the specific features or acts described above. Rather, the specific features and acts described above are disclosed as example forms of implementing the claims. With regard to the apparatus in the above-described embodiment, the specific manner in which each module performs the operation has been described in detail in the embodiment related to the method, and will not be elaborated here.
Claims (10)
1. A method for testing a device, the method comprising:
acquiring equipment test parameters corresponding to target equipment;
acquiring a target parameter value corresponding to the equipment test parameter in a to-be-tested environment;
and testing the target equipment in the current environment according to the target parameter value to obtain a test result of the target equipment in the environment to be tested, wherein the current environment and the environment to be tested are different environments.
2. The method of claim 1, wherein the environment to be tested comprises a high temperature and high humidity environment, the high temperature and high humidity environment being a test environment with an ambient temperature greater than or equal to a preset temperature threshold and an ambient humidity greater than or equal to a preset humidity threshold; the obtaining of the target parameter value corresponding to the device test parameter in the environment to be tested includes:
under the condition that the environment to be tested is the high-temperature high-humidity environment, acquiring a first target parameter value corresponding to the high-temperature high-humidity environment according to a preset parameter environment corresponding relation; the preset parameter environment corresponding relation comprises target parameter values of equipment test parameters corresponding to different environments to be tested.
3. The method of claim 1, wherein the testing the target device in the current environment in accordance with the target parameter value comprises:
setting a value of a device test parameter of the target device as the target parameter value;
and testing the target equipment in the current environment.
4. The method of claim 3, wherein the testing the target device in the current environment comprises:
in the current environment, running a target load program through the target equipment so as to test the target equipment; the target load program is a program comprising an operating system and a target business system.
5. The method of any one of claims 1 to 4, wherein the target device is a target server; before the obtaining of the target parameter value corresponding to the device test parameter in the environment to be tested, the method further includes:
and determining the environment to be tested according to the starting parameters of the target server.
6. The method of claim 5, wherein the boot parameters of the target server comprise preset parameters of a motherboard-based input output system of the target server.
7. The method of claim 5, wherein the boot parameters of the target server comprise a pin voltage of a preset pin of a motherboard boot chip of the target server.
8. An apparatus for testing a device, the apparatus comprising:
the test parameter acquisition module is used for acquiring device test parameters corresponding to the target device;
the parameter value acquisition module is used for acquiring a target parameter value corresponding to the equipment test parameter in a to-be-tested environment;
and the device testing module is used for testing the target device in the current environment according to the target parameter value so as to obtain a testing result of the target device in the environment to be tested, wherein the current environment and the environment to be tested are different environments.
9. A computer-readable medium, on which a computer program is stored, characterized in that the program, when being executed by processing means, carries out the steps of the method of any one of claims 1 to 7.
10. An electronic device, comprising:
a storage device having a computer program stored thereon;
processing means for executing the computer program in the storage means to carry out the steps of the method according to any one of claims 1 to 7.
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| CN202111082941.0A CN113742153B (en) | 2021-09-15 | 2021-09-15 | Equipment testing method and device, readable medium and electronic equipment |
| PCT/CN2022/119077 WO2023040976A1 (en) | 2021-09-15 | 2022-09-15 | Device testing method and apparatus, and readable medium and electronic device |
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| CN202111082941.0A CN113742153B (en) | 2021-09-15 | 2021-09-15 | Equipment testing method and device, readable medium and electronic equipment |
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| CN113742153B (en) | 2023-12-26 |
| WO2023040976A1 (en) | 2023-03-23 |
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