CN100570345C - A kind of method of under non-standard ambient temperature conditions, carrying out the standard testing thermal parameters - Google Patents
A kind of method of under non-standard ambient temperature conditions, carrying out the standard testing thermal parameters Download PDFInfo
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- CN100570345C CN100570345C CNB2004100176217A CN200410017621A CN100570345C CN 100570345 C CN100570345 C CN 100570345C CN B2004100176217 A CNB2004100176217 A CN B2004100176217A CN 200410017621 A CN200410017621 A CN 200410017621A CN 100570345 C CN100570345 C CN 100570345C
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Abstract
A kind of method of carrying out the standard testing thermal parameters under non-standard environment temperature, it is to realize by following method step: at first in a standard temperature environment product is measured thermal parameter T
1This product is put into to measure identical thermal parameter in the non-standard temperature environment again be T
2Get said two devices T
1And T
2Ratio as correction factor P, can in above-mentioned each non-standard temperature environment, measure and extrapolate this product and only be placed on the standard thermal parameter T that can measure in the standard temperature environment
1, the T of this moment
1=T
2P.This method will bring convenience the high-precision test job of relevant thermal parameter of typical products in mass production on producing.
Description
Technical field:
The present invention relates to the testing thermal parameters technology.
Background technology:
Product carries out relevant thermal parameter (example: temperature, liter or cooling rate etc.) when testing, test environment is had strict requirement, mainly is that the test environment temperature is had strict requirement, and related standards has stipulated that the fluctuation range up and down that the test environment temperature allows is in 0.5 ℃.
Yet it is thermoregulator that the temperature of test cabinet is that the cold wind of producing by boasting by air-conditioner device or hot blast carry out test environment, must make that like this temperature in each test zone of whole indoor test environment is unequal, and differ greatly.
Conventional solution is: the area that dwindles test cabinet by as much as possible is to improve its degree of uniformity.Obviously, do like this, the test to the thermal technology who produces the product that comes out in enormous quantities must examine parameter will cause sizable trouble.Otherwise whether data are differentiated in qualified reference as product just to be merely able to measure in the unequal overall situation of temperature the very poor thermal parameter of its precision.
Can, equally also can test out under non-standard test environment conditions: the method for testing of the relevant thermal parameter that can count when only testing under the standard environment condition be the problem that people are seeking solution always for this reason.
Summary of the invention:
The present invention's purpose proposes a kind of method that also can carry out the high precision testing thermal parameters under the unequal more situation of chamber temperatures just in order to address the above problem.
In order to realize goal of the invention, intend adopting following technical step method:
1. at first in a standard temperature environment, product is measured thermal parameter T
1
2. this product being put into and measuring identical thermal parameter in the non-standard temperature environment again is T
2
3. get said two devices T
1And T
2Ratio as correction factor P, can in above-mentioned non-standard temperature environment, measure and extrapolate the standard thermal parameter T of this product
1
Obviously: the T of this moment
1=T
2P, its ratio P=T
1/ T
2
Characteristics of the present invention:
Because the present invention can be in the hope of above-mentioned P, this has just created condition for achieving the above object.
Embodiment:
At first (example: programming rate) measuring its numerical value is T to certain thermal parameter of product model machine in a standard temperature environment (usually its space is very little in order to reach the standard temperature environment)
1
To measure identical thermal parameter value in some non-standard temperature environment again be T in that this product model machine is put into
2
Get said two devices T
1And T
2Ratio P as correction factor, after, every in above-mentioned this non-standard temperature environment during test products and the T that obtains
2As long as, being multiplied by P, can extrapolate: if this product is placed on standard value T when measuring same thermal parameter in the standard temperature environment
1
Generally, when in a large-scale place, typical products in mass production being carried out same testing thermal parameters, can look concrete condition this place is divided into the test environment zone of N different temperatures, ask for different P more according to the method described above
NAlthough temperature in N test environment zone is criteria of right and wrongs all probably, yet, not hard to imagine:
Owing to there is relational expression: T
1=P
NT
2, and can obtain above-mentioned different P easily
N, therefore, always can measure and extrapolate the standard thermal parameter value T that each is placed on different test warm area products accurately
1.
Claims (1)
1. a method of carrying out the standard testing thermal parameters under non-standard environment temperature is characterized in that, it is to carry out with following method step:
A. earlier in a standard temperature environment, product is measured thermal parameter T
1
B. this product being put into again and measuring identical thermal parameter in the non-standard temperature environment again is T2;
C. get said two devices T
1And T
2Ratio as correction factor P, can under above-mentioned non-standard temperature environment, measure and extrapolate the thermal parameter T that under the standard temperature environmental baseline, can measure
1, the correction factor P that tries to achieve according to above-mentioned ratio can list following to asking for standard thermal parameter T
1The correction formula:
T
1=T
2P, its ratio P=T
1/ T
2
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2004100176217A CN100570345C (en) | 2004-04-12 | 2004-04-12 | A kind of method of under non-standard ambient temperature conditions, carrying out the standard testing thermal parameters |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2004100176217A CN100570345C (en) | 2004-04-12 | 2004-04-12 | A kind of method of under non-standard ambient temperature conditions, carrying out the standard testing thermal parameters |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1563961A CN1563961A (en) | 2005-01-12 |
| CN100570345C true CN100570345C (en) | 2009-12-16 |
Family
ID=34479063
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2004100176217A Expired - Fee Related CN100570345C (en) | 2004-04-12 | 2004-04-12 | A kind of method of under non-standard ambient temperature conditions, carrying out the standard testing thermal parameters |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN100570345C (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102168960B (en) * | 2011-01-10 | 2012-07-25 | 沈阳黎明航空发动机(集团)有限责任公司 | A temperature compensation method for machining aluminium alloy components |
| CN104777183B (en) * | 2014-10-31 | 2017-08-15 | 北京卫星环境工程研究所 | Satellite electric propulsion system xenon fills thermodynamic behaviour method for numerical simulation |
| CN113742153B (en) * | 2021-09-15 | 2023-12-26 | 北京字节跳动网络技术有限公司 | Equipment testing method and device, readable medium and electronic equipment |
-
2004
- 2004-04-12 CN CNB2004100176217A patent/CN100570345C/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| CN1563961A (en) | 2005-01-12 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| ASS | Succession or assignment of patent right |
Owner name: CHINA METROLOGY COLLEGE Free format text: FORMER OWNER: LIANG JIALIN Effective date: 20090717 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20090717 Address after: China Jiliang University, Xiasha Higher Education Zone, Zhejiang, Hangzhou Province, China Code: 310018 Applicant after: China Jiliang University Address before: Branch of electrical and mechanical engineering, China Jiliang University, Xiasha Higher Education Zone, Hangzhou, Zhejiang Province, China: 310018 Applicant before: Liang Jialin |
|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20091216 Termination date: 20100412 |