CN1563962A - High precision testing method for batch products thermodynamic parameter under condition of non-eveness environmental temp - Google Patents
High precision testing method for batch products thermodynamic parameter under condition of non-eveness environmental temp Download PDFInfo
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- CN1563962A CN1563962A CN 200410017623 CN200410017623A CN1563962A CN 1563962 A CN1563962 A CN 1563962A CN 200410017623 CN200410017623 CN 200410017623 CN 200410017623 A CN200410017623 A CN 200410017623A CN 1563962 A CN1563962 A CN 1563962A
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Abstract
The method includes following steps: (a) under standard testing environment temperature Tb, taking at least three same type products to measure their standard heat engineering parameters Kb; (b) under nonstandard testing environment temperature Tf, taking the said at least three same type products to measure their nonstandard heat engineering parameters Kf; (c) drawing out 'Tb-Tf' graph of relation under rectangular coordinates; (d) based on data relation built on 'Tb-Tf' graph of relation, illustrating out standard heat engineering parameters Kb under standard testing environment temperature Tb from nonstandard heat engineering parameters Kf measured under nonstandard testing environment temperature Tf. The invention brings convenient for operation of measuring relevant heat engineering parameters.
Description
Technical field:
The present invention relates to the testing thermal parameters technology.
Background technology:
Product carries out relevant thermal parameter (example: temperature, liter or cooling rate etc.) when testing, test environment is had strict requirement, mainly is that the test environment temperature is had strict requirement, and related standards has stipulated that the fluctuation range up and down that the test environment temperature allows is in 0.5 ℃.
Yet it is thermoregulator that the temperature of test cabinet is that the cold wind of producing by boasting by air-conditioner device or hot blast carry out test environment, must make that like this temperature in each test zone of whole indoor test environment is unequal, and differ greatly.
Conventional solution is: the area that dwindles test cabinet by as much as possible is to improve the degree of uniformity of its temperature.Obviously, do like this, the test to the thermal technology who produces the product that comes out in enormous quantities must examine parameter will cause sizable trouble.Otherwise whether data are differentiated in qualified reference as product just to be merely able to measure in the unequal overall situation of temperature the very poor thermal parameter of its precision.
Can, equally also can test out under non-standard test environment conditions: the method for testing of the relevant thermal parameter that can count when only testing under the standard environment condition be the problem that people are seeking solution always for this reason.
Summary of the invention:
The present invention's purpose is just in order to solve the problem that above-mentioned people are seeking solution always.
In order to realize goal of the invention, intend adopting following technology, promptly following method step:
A. the product that is taken to few three same models under the test environment temperature T b of standard (temperature value and degree of uniformity thereof are up to standard) condition, measures certain standard thermal parameter Kb respectively;
B. with at least three above-mentioned products again under off-gauge test environment temperature T f (temperature value and degree of uniformity thereof are not up to standard) condition, measure identical non-standard thermal parameter Kf;
C. in rectangular plots, draw " Tb----Tf " graph of relation of " standard test condition is to non-standard test condition ";
D. the data relationship of being set up with " Tb----Tf " graph of relation is a foundation, just can be under off-gauge test environment temperature T f condition, by measuring non-standard thermal parameter Kf data, be converted to the standard thermal parameter Kf data that only under the test environment temperature T b of standard condition, can measure easily.
Characteristics of the present invention:
Obviously, owing to pass through the successful foundation of " Tb----Tf " graph of relation, this has just created extremely beneficial condition for the purpose that realizes the present invention.
Description of drawings:
Figure has illustrated " Tb-S----Tf-S " graph of relation embodiment of product programming rate S thermal parameter.
Tb-S: the product programming rate coordinate under the standard testing ambient temperature conditions; Tf-S: the product programming rate coordinate under the non-standard test environment temperature conditions.
Embodiment:
Get five same models but the different product of its programming rate S at first, is tested its programming rate S respectively under the standard testing ambient temperature conditions
1～S
5Then, under non-standard test environment temperature conditions, test its programming rate S again
1～S
5At last, according to two groups of above-mentioned " S
1～S
5" data, draw " Tb-S----Tf-S " graph of relation.
Be not difficult to find out " Tb----Tf
*" graph of relation is key of the present invention: it has been arranged; just can be in the uneven thermal testing of a large-scale environment temperature place;, always can from " Tb----Tf " graph of relation, find the standard thermal parameter Tb corresponding at last with it as long as divide good different test warm area (nonstandard certainly); just can be in each off-gauge test warm area; by bulk article being measured various off-gauge thermal parameter Tf.
Claims (1)
1. under the inhomogeneous state of environment temperature the thermal parameter of bulk article is implemented the method for high precision measurement, be it is characterized in that its method step is as follows:
A. the product that is taken to few three same models under the test environment temperature T b of standard condition, measures standard thermal parameter Kb respectively;
B. with at least three above-mentioned products again under off-gauge test environment temperature T f condition, measure identical non-standard thermal parameter Kf;
C. draw " Tb----Tf " rectangular coordinate graph of relation;
D. the data relationship of being set up with " Tb----Tf " graph of relation is a foundation, by the non-standard thermal parameter Kf data that product is measured under off-gauge test environment temperature T f condition, the standard thermal parameter Kf data that can measure under the test environment temperature T b condition that figure solves in standard.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200410017623 CN1563962A (en) | 2004-04-12 | 2004-04-12 | High precision testing method for batch products thermodynamic parameter under condition of non-eveness environmental temp |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200410017623 CN1563962A (en) | 2004-04-12 | 2004-04-12 | High precision testing method for batch products thermodynamic parameter under condition of non-eveness environmental temp |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1563962A true CN1563962A (en) | 2005-01-12 |
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ID=34479064
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200410017623 Pending CN1563962A (en) | 2004-04-12 | 2004-04-12 | High precision testing method for batch products thermodynamic parameter under condition of non-eveness environmental temp |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1563962A (en) |
-
2004
- 2004-04-12 CN CN 200410017623 patent/CN1563962A/en active Pending
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| PB01 | Publication | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |