CN1563961A - Method of standard testing thermodynamic parameter under condition of non-starndard environmental temp - Google Patents

Method of standard testing thermodynamic parameter under condition of non-starndard environmental temp Download PDF

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Publication number
CN1563961A
CN1563961A CN 200410017621 CN200410017621A CN1563961A CN 1563961 A CN1563961 A CN 1563961A CN 200410017621 CN200410017621 CN 200410017621 CN 200410017621 A CN200410017621 A CN 200410017621A CN 1563961 A CN1563961 A CN 1563961A
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China
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standard
product
temperature environment
environment
starndard
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CN 200410017621
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CN100570345C (en
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梁嘉麟
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China Jiliang University
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Abstract

The method includes following steps: under a standard temperature environment, measuring heat engineering parameters T1 of a product; under nonstandard temperature environment, measuring heat engineering parameters T2 of the said product; taking ratio between T2 and T1 or difference value P as coefficient of correction; thus, the standard heat engineering parameters T1 of the said product can be measured and calculated from nonstandard temperature environment. The invention brings convenient for operation of measuring relevant heat engineering parameters.

Description

A kind of method of under non-standard ambient temperature conditions, carrying out the standard testing thermal parameters
Technical field:
The present invention relates to the testing thermal parameters technology.
Background technology:
Product carries out relevant thermal parameter (example: temperature, liter or cooling rate etc.) when testing, test environment is had strict requirement, mainly is that the test environment temperature is had strict requirement, and related standards has stipulated that the fluctuation range up and down that the test environment temperature allows is in 0.5 ℃.
Yet it is thermoregulator that the temperature of test cabinet is that the cold wind of producing by boasting by air-conditioner device or hot blast carry out test environment, must make that like this temperature in each test zone of whole indoor test environment is unequal, and differ greatly.
Conventional solution is: the area that dwindles test cabinet by as much as possible is to have improved degree of uniformity.Obviously, do like this, the test to the thermal technology who produces the product that comes out in enormous quantities must examine parameter will cause sizable trouble.Otherwise whether data are differentiated in qualified reference as product just to be merely able to measure in the unequal overall situation of temperature the very poor thermal parameter of its precision.
Can, equally also can test out under non-standard test environment conditions: the method for testing of the relevant thermal parameter that can count when only testing under the standard environment condition be the problem that people are seeking solution always for this reason.
Summary of the invention:
The present invention's purpose proposes a kind of method that also can carry out the high precision testing thermal parameters under the unequal more situation of chamber temperatures just in order to address the above problem.
In order to realize goal of the invention, intend adopting following technical step method:
1. at first in a normal temperature environment, product is measured thermal parameter T 1
2. this product being put into and measuring identical thermal parameter in the non-standard temperature environment again is T 2
3. get said two devices T 2And T 1Ratio or difference P as correction factor, can in above-mentioned non-standard temperature environment, measure and extrapolate the standard thermal parameter T of this product 1
Characteristics of the present invention:
Because the present invention can be in the hope of above-mentioned P, this has just created condition for realization above-mentioned purpose of the present invention.
Embodiment:
At first (example: lifting speed temperature S) measuring its value is T to certain thermal parameter of product model machine in a normal temperature environment (usually its space is very little in order to reach the normal temperature environment) 1
To measure identical thermal parameter value in some non-standard temperature environment be T again in that this product model machine is put into 2
Get said two devices T 2And T 1Ratio P as correction factor, after, every in above-mentioned this non-standard temperature environment during test products and the T that obtains 2As long as, being multiplied by P, can extrapolate: if this product is placed on standard figures T when measuring same thermal parameter in the normal temperature environment 1
Generally, when in a large-scale place, typical products in mass production being carried out same testing thermal parameters, can look concrete condition this place is divided into the test environment zone of N different temperatures, ask for different P more according to the method described above NAlthough temperature in above-mentioned N test environment zone is criteria of right and wrongs all probably, yet, not hard to imagine:
Owing to there is relational expression: T 1=P NT 2, and can obtain easily above-mentioned different P N, therefore, always can measure accurately and extrapolate the standard thermal parameter value T that each is placed on different test warm area products 1

Claims (1)

1. a method of carrying out the standard testing thermal parameters under non-standard environment temperature is characterized in that, it is to carry out with following method step:
A. earlier in a normal temperature environment, product is measured thermal parameter T 1
B. this product being put into again and measuring identical thermal parameter in the non-standard temperature environment again is T 2
C. get said two devices T 2And T 1Ratio or difference P as correction factor, can under above-mentioned non-standard temperature environment, measure and extrapolate the thermal parameter T that under the standard test environment temperature conditions, can measure 1
CNB2004100176217A 2004-04-12 2004-04-12 A kind of method of under non-standard ambient temperature conditions, carrying out the standard testing thermal parameters Expired - Fee Related CN100570345C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNB2004100176217A CN100570345C (en) 2004-04-12 2004-04-12 A kind of method of under non-standard ambient temperature conditions, carrying out the standard testing thermal parameters

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNB2004100176217A CN100570345C (en) 2004-04-12 2004-04-12 A kind of method of under non-standard ambient temperature conditions, carrying out the standard testing thermal parameters

Publications (2)

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CN1563961A true CN1563961A (en) 2005-01-12
CN100570345C CN100570345C (en) 2009-12-16

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102168960A (en) * 2011-01-10 2011-08-31 沈阳黎明航空发动机(集团)有限责任公司 A temperature compensation method for machining aluminium alloy components
CN104777183A (en) * 2014-10-31 2015-07-15 北京卫星环境工程研究所 Satellite electric propulsion system xenon filling thermodynamic characteristic numerical simulation method
WO2023040976A1 (en) * 2021-09-15 2023-03-23 北京字节跳动网络技术有限公司 Device testing method and apparatus, and readable medium and electronic device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102168960A (en) * 2011-01-10 2011-08-31 沈阳黎明航空发动机(集团)有限责任公司 A temperature compensation method for machining aluminium alloy components
CN102168960B (en) * 2011-01-10 2012-07-25 沈阳黎明航空发动机(集团)有限责任公司 A temperature compensation method for machining aluminium alloy components
CN104777183A (en) * 2014-10-31 2015-07-15 北京卫星环境工程研究所 Satellite electric propulsion system xenon filling thermodynamic characteristic numerical simulation method
CN104777183B (en) * 2014-10-31 2017-08-15 北京卫星环境工程研究所 Satellite electric propulsion system xenon fills thermodynamic behaviour method for numerical simulation
WO2023040976A1 (en) * 2021-09-15 2023-03-23 北京字节跳动网络技术有限公司 Device testing method and apparatus, and readable medium and electronic device

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Effective date: 20090717

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Address after: China Jiliang University, Xiasha Higher Education Zone, Zhejiang, Hangzhou Province, China Code: 310018

Applicant after: China Jiliang University

Address before: Branch of electrical and mechanical engineering, China Jiliang University, Xiasha Higher Education Zone, Hangzhou, Zhejiang Province, China: 310018

Applicant before: Liang Jialin

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