CN106199255B - High-low temperature test equipment and test method thereof - Google Patents
High-low temperature test equipment and test method thereof Download PDFInfo
- Publication number
- CN106199255B CN106199255B CN201610502504.2A CN201610502504A CN106199255B CN 106199255 B CN106199255 B CN 106199255B CN 201610502504 A CN201610502504 A CN 201610502504A CN 106199255 B CN106199255 B CN 106199255B
- Authority
- CN
- China
- Prior art keywords
- test
- temperature
- heating system
- refrigerating system
- temperature sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/19—Control of temperature characterised by the use of electric means
- G05D23/20—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature
Abstract
The invention discloses high and low temperature test equipment which comprises a test area (2) for placing a tested article, an embedded controller (1), a heating system (5), a refrigerating system (6), a fixed temperature sensor (4) arranged at an air outlet of the test area and a plurality of movable temperature sensors (3) arranged in the test area, wherein the embedded controller is arranged on the test area; the embedded controller (1) receives temperature data input by the fixed temperature sensor (4) or any movable temperature sensor (3) according to the selected control mode, compares the temperature data with a test specified value, sends a control instruction to the refrigerating system or the heating system according to the comparison result, and controls the refrigerating system or the heating system to cool or heat the test area so that the temperature of the test area reaches the test specified value. The invention adopts a single or a plurality of temperature sensors to actually measure the temperature value of the tested object, accurately control the temperature stabilization time, accurately control the test, improve the test efficiency and ensure the test quality.
Description
Technical Field
The invention belongs to the field of high and low temperature test equipment manufacturing and the field of electronic and electrical product environment tests, and the invention determines whether the temperature of a tested product reaches stable or not by measuring the temperature response value of the tested product subjected to the high and low temperature tests in real time, and then performs the test on the tested product by electrifying the tested product or adjusting the temperature of the test equipment to be another required value. By the actual measurement method, the adverse effect caused by uncertain factors influencing the test quality can be reduced, and the test precision and quality are ensured.
Background
The high-low temperature test equipment is environment test equipment widely used in modern electronic equipment manufacturing, communication manufacturing, automobile manufacturing and other industries. The high-low temperature test equipment generally comprises an equipment box body, an air circulation system, a heating system, a refrigerating system, an embedded controller and a temperature sensor. The working principle of the high-low temperature test equipment is as follows: the temperature sensor is responsible for sampling the temperature value in the test area and inputting the sampled temperature data into the embedded controller of the test equipment, the embedded controller compares the temperature data with the test specified value required by the test and carries out corresponding processing to form a control instruction, the working states of the heating system and the refrigerating system are controlled, the high-low temperature test equipment is enabled to continue to heat and continue to refrigerate, and the temperature sensor continues to sample the temperature data and inputs the temperature data into the control system to complete the test closed-loop control.
The high-low temperature test equipment can accelerate the excitation of defects in a tested product to form faults by applying specified high-temperature stress, low-temperature stress or high-low temperature circulating alternating stress to the tested product, and adopts corrective measures to improve the design and manufacturing process of products and improve the quality and reliability of the products aiming at the faults.
Routine temperature test procedure: (1) the method comprises the steps of placing a tested article in a test area of high-low temperature test equipment, connecting the tested article and the test equipment, (2) adjusting the temperature of the test equipment to a test specified value, keeping the temperature for a certain time to enable the tested article to reach stable temperature, (3) starting power-on work of the tested article and testing the working state of the tested article (keeping the specified time according to the power-on work required by the tested article), (4) adjusting the temperature of the test equipment to another temperature value, or restoring to a normal temperature condition, and ending the test.
In order to ensure the test quality, the national and international test standards require that a tested product is kept for a certain time under a specified temperature condition after being placed in test equipment, so that the temperature of the product is stable, namely the temperature of the surface of the product reaches a specified test value, and the temperature field inside the product reaches thermal equilibrium. The product is then power-on tested or adjusted to another test temperature value. Whether the product reaches the temperature stability is a key factor influencing the test quality.
The time for the test article to reach the temperature stability is dynamic, has a certain randomness, and is generally influenced by the following factors: (1) the size, weight and structure of the tested product, (2) the test conditions, (3) the number and placement mode of the tested products are carried out simultaneously, (4) the performance of high-low temperature test equipment, and (5) the electric and cooling water circulation system and the environmental conditions of a test room which ensure the normal operation of the high-low temperature test equipment.
In order to stabilize the temperature of a tested product, the conventional method uniformly sets a fixed time, so that an undertest is caused, and the precision and the quality of the test are influenced; can also cause over-test and damage to the tested product.
Disclosure of Invention
Aiming at the defects of the prior art, the invention aims to provide high-low temperature test equipment and a test method thereof.
The invention aims to be realized by the following technical scheme:
a high-low temperature test device comprises a test area 2 for placing a tested article, an embedded controller 1, a heating system 5, a refrigerating system 6, a fixed temperature sensor 4 arranged at an air outlet of the test area and a plurality of movable temperature sensors 3 arranged in the test area;
the embedded controller 1 receives temperature data input by the fixed temperature sensor 4 or any movable temperature sensor 3 according to a selected control mode, compares the real-time measured temperature data with a test specified value, forms and sends a control instruction to the refrigerating system or the heating system according to a comparison result, and controls the refrigerating system or the heating system to cool or heat the test area so that the temperature of the test area reaches the test specified value.
Preferably, the control modes include the following:
1) Multipath average control: the embedded controller 1 firstly averages the temperature data acquired by each movable temperature sensor 3 to obtain an average value, then compares the average value with a test specified value, if the average value is within the range of allowable tolerance of the test specified value, the temperature value of the test area is considered to reach the test specified value, the embedded controller 1 sends a control instruction to the refrigerating system or the heating system to stop working of the heating system or the refrigerating system or reduce the working power of the heating system or the refrigerating system, otherwise sends a control instruction to the refrigerating system or the heating system to start working of the heating system or the refrigerating system or improve the working power of the heating system or the refrigerating system;
2) Single-point control: the embedded controller 1 compares the temperature data acquired by any one appointed movable temperature sensor 3 with a test specified value, if the value is within the tolerance range allowed by the test specified value, the temperature value of the test area is considered to reach the test specified value, the embedded controller 1 sends a control instruction to the refrigerating system or the heating system to stop working of the heating system or the refrigerating system or reduce the working power of the heating system or the refrigerating system, otherwise, the embedded controller sends a control instruction to the refrigerating system or the heating system to start working of the heating system or the refrigerating system or improve the working power of the heating system or the refrigerating system;
3) Multipoint and control: the method comprises the steps of firstly respectively setting test specified values which are required to be reached by each collection point, then comparing the temperature data collected by each temperature sensor with the test specified values of the corresponding collection points, when the temperature data collected by all the collection points are within the range of allowable tolerance of the test specified values, determining that the temperature value of a test area reaches the test specified values, sending a control instruction to a refrigerating system or a heating system by an embedded controller 1, stopping the heating system or the refrigerating system or reducing power to work, otherwise sending a control instruction to the refrigerating system or the heating system, and starting the heating system or the refrigerating system to work or improving the working power of the heating system or the refrigerating system.
Preferably, the embedded controller 1 comprises a plurality of temperature sensor signal input interfaces, at least two signal output interfaces, a microprocessor, a memory, an interface chip, a power input interface and software;
the temperature sensor signal input interface is used for connecting the fixed temperature sensor and the movable temperature sensor and transmitting temperature data acquired by the fixed temperature sensor and the movable temperature sensor to the microprocessor;
the microprocessor is used for calling resident software from the memory to determine a control mode according to the resident software and storing temperature values of all temperature sensors in the test process into the memory;
the two signal output interfaces are respectively connected with the heating system and the refrigerating system and send the control instruction output by the microprocessor to the heating system and the refrigerating system.
Preferably, the embedded controller 1 further comprises a temperature indicating device for displaying the actual temperature data of each collection point, the test specified value of each collection point, and the difference between the temperature data and the test specified value in real time.
Preferably, the temperature indicating device adopts a graphic display mode or a text display method.
Preferably, the embedded controller further comprises a start instruction output interface, the start instruction output interface is connected with the tested object, and when the microprocessor determines that the temperature value of the test area reaches the test specified value, the start instruction is sent to the tested object through the start instruction output interface.
The invention also provides a test method using the high-low temperature test equipment, which comprises the following steps:
1. placing a tested article into a test area, determining a control mode, arranging a movable temperature sensor in the test area according to the control mode, and acquiring temperature data by the movable temperature sensor and/or a fixed temperature sensor;
2. the embedded controller compares the acquired temperature data with a test specified value, sends a control instruction to the refrigerating system or the heating system according to a comparison result, controls the refrigerating system or the heating system to start or stop working, or increases or decreases the working power of the refrigerating system or the heating system to enable the temperature of a test area to reach the test specified value;
3. and when the temperature of the test area is stable, carrying out power-on test on the tested product.
Preferably, the control mode includes:
1) Multipath average control: the embedded controller 1 averages the temperature data acquired by each movable temperature sensor 3 to obtain an average value, compares the average value with a test specified value, if the average value is within the range of allowable tolerance of the test specified value, determines that the temperature value of the test area reaches the test specified value, and sends a control instruction to the refrigerating system or the heating system to stop the heating system or the refrigerating system or reduce the working power of the heating system or the refrigerating system, otherwise, the embedded controller 1 sends a control instruction to the refrigerating system or the heating system to start the heating system or the refrigerating system to work or improve the working power of the heating system or the refrigerating system;
2) Single-point control: the embedded controller 1 compares the temperature data acquired by any one appointed movable temperature sensor 3 with a specified value, if the temperature data is within the tolerance range allowed by the specified value, the temperature value of the test area is considered to reach the specified value, the embedded controller 1 sends a control instruction to the refrigerating system or the heating system to stop working of the heating system or the refrigerating system or reduce the working power of the heating system or the refrigerating system, otherwise, the embedded controller sends a control instruction to the refrigerating system or the heating system to start working of the heating system or the refrigerating system or improve the working power of the heating system or the refrigerating system;
3) Multipoint control: the method comprises the steps of firstly, respectively setting test specified values which are required to be reached by each collection point, then comparing the temperature data collected by each temperature sensor with the test specified values of the corresponding collection points, when the temperature data collected by all the collection points are within the range of allowable tolerance of the test specified values, determining that the temperature value of a test area reaches the test specified values, sending a control instruction to a refrigerating system or a heating system by an embedded controller, stopping the heating system or the refrigerating system or reducing power to work, otherwise, sending a control instruction to the refrigerating system or the heating system, and starting the heating system or the refrigerating system to work or improving the working power of the heating system or the refrigerating system.
Compared with the prior art, the invention changes the test method of the high-low temperature test equipment and changes the configuration quantity of the temperature sensors, the high-low temperature test equipment has the capabilities of single-path and multi-path temperature measurement and sampling, and the temperature value of the tested product is taken as the control reference according to the actual measurement to determine whether the temperature of the tested product is stable or not, so that the test equipment can automatically adapt to different tested products, accurately control the temperature stabilization time and accurately control the test.
Drawings
FIG. 1 is a schematic structural diagram of a high and low temperature test apparatus according to the present invention.
FIG. 2 is a schematic view of the working principle of a high and low temperature test apparatus according to the present invention.
Description of the marks
1-embedded controller 2-test area 3-movable temperature sensor 4-fixed temperature sensor 5-heating system 6-refrigeration system 7-air outlet 8-test box door.
Detailed Description
As shown in fig. 1, the high and low temperature test equipment comprises a test area 2 for placing a tested object, an embedded controller 1, a heating system 5, a refrigerating system 6, a fixed temperature sensor 4 arranged at an air outlet of the test area, and a plurality of movable temperature sensors 3 arranged in the test area. The respective components will be described below.
The temperature in the test area is controlled, and the general extreme values of high temperature and low temperature are as follows: 70 ℃ below zero to 180 ℃, and the indexes of temperature precision, temperature uniformity, temperature fluctuation degree and the like all meet the relevant national standards.
The embedded controller comprises:
1) The multi-channel temperature sensor input interface has the signal input capacity of the multi-channel temperature sensor by increasing the number of the temperature sensor input interfaces. The number of temperature sensor input interfaces is mainly determined by the test volume of the high-low temperature test equipment.
2) And the microprocessor compares the acquired temperature data with the test specified value according to the control mode, sends a control instruction to the refrigerating system or the heating system according to the comparison result, and controls the refrigerating system or the heating system to cool or heat the test area so as to enable the temperature of the test area to reach the test specified value.
3) And the two signal output interfaces are respectively connected with the heating system and the refrigerating system and send the control instruction output by the microprocessor to the heating system and the refrigerating system.
4) And the temperature indicating device displays the actual temperature data of each acquisition point in real time, the test specified value of each point and the difference value between the temperature data and the test specified value during the experiment control. The display mode can be a graphic display mode or a text display mode).
5) And the memory is used for recording and storing the temperature sampled by the multiple temperature sensors in real time and is resident with control software.
6) Starting an instruction output interface: the embedded controller can send a starting instruction to the experimental product through the signal output interface after the temperature of the test area is stable, and the test product can be started. The starting instruction type can be a digital signal, a discrete quantity model and an analog model.
The embedded controller also comprises an interface chip, a power input interface and an interface for connecting with remote equipment.
The movable temperature sensor can be placed near a tested object or inside the tested object when in test, and a device for placing the movable temperature sensor is additionally arranged inside the test area. The original fixed temperature sensor installed at the air outlet 7 of the high-temperature low-test equipment still remains.
The refrigerating system consists of a refrigerating compressor, a condenser, a valve, a cooling water pipeline and the like.
The heating system mainly comprises a heater.
Temperature control reference point selection: the collection point of the temperature control of the high and low temperature test equipment is not only a fixed temperature sensor at the air outlet of the high and low temperature test equipment, but also can be any appointed temperature sensor near a test product in a test area, or any appointed multiple temperature sensors. Therefore, the temperature field near the test product can be measured, and the external temperature of the test product and the temperature field inside the test product can be measured at the same time.
The test flow is as follows:
1. after the test is started, the test box door 8 is opened, the tested object is placed in the test area, the control mode is confirmed, the control is carried out by adopting a fixed sensor or a mobile sensor, if the control is carried out by adopting the mobile sensor, the mobile sensor needs to be arranged in the test area, and the fixed temperature sensor and/or the mobile temperature sensor transmit the temperature data acquired in real time to the embedded controller.
2. The embedded controller is controlled according to a preset control mode: if the temperature of the temperature field near the product reaches a set value area and the change rate is not greater than a test specified value, or the temperature field inside the product reaches a set value area and the temperature change rate reaches a test specified value, the temperature of the tested product is stable.
3. When the temperature is stable, the test equipment sends a signal to an experiment operator to carry out power-on test on the tested product. The test equipment can also directly send out a signal, start the test equipment and start the power-on test of the tested object; the temperature of the test apparatus can also be controlled to the next test specification.
And (3) control mode: the control mode of the test equipment has various modes, including a single-point control method, a multipoint average value control method and a multipoint and control method.
1) And (4) multipath average control. Suppose there are 4 motion sensors, numbered P respectively 1 ，P 2 ，P 3 ，P 4 The collected temperature values are respectively T 1 ，T 2 ，T 3 ，T 4 The test specification is T set Allowable tolerance of T t . If T 1 ，T 2 ，T 3 ，T 4 Average value of (D) is at T set ±T t And if the temperature value of the test area is within the range, the temperature value of the test area is considered to reach a test specified value, a control instruction is sent to the refrigerating system or the heating system, the heating system or the refrigerating system stops working or the working power of the heating system or the refrigerating system is reduced, otherwise, the control instruction is sent to the refrigerating system or the heating system, and the heating system or the refrigerating system starts working or the working power of the heating system or the refrigerating system is improved. The multi-path average control is suitable for the test articles with larger volumes.
2) And (4) single-point control. When P is present 1 ，P 2 ，P 3 ，P 4 When the temperature of any one appointed sensor reaches the allowable tolerance of the test specified value, the temperature value of the test area is considered to reach the test specified value, a control instruction is sent to the refrigerating system or the heating system to stop the heating system or the refrigerating system or reduce the working power of the heating system or the refrigerating system, otherwise, a control instruction is sent to the refrigerating system or the heating system to start the heating system or the refrigerating system or improve the working power of the heating system or the refrigerating system.
3) And (4) multipoint control. The multipoint control comprises two types, wherein the first type is that all temperature points must reach the same required temperature value, the second type is that the temperature value of each point is different, and the temperature of each point must reach the respective testing specified value.
Each temperature point in the test area is regular, the temperature change of the temperature point close to the test box door lags behind other temperature points (because the points are farther away from the cold and heat source), and the temperature points in the test area are deviated due to the placement of the tested object, and all the points reach the same value and are difficult to realize practically. When the plurality of points are controlled, a control mode is determined first. 1) The temperature point near the test chamber door was set lower. Such as (T) 1 ，T 2 ，T 3 ，T 4 And the first two points are close to the door of the test chamber, and the second two points are close to the cold and hot air outlets. Assuming that the test zone temperature is 55 degrees, it is set to (53 degrees, 55 degrees). The latter two points will typically reach the test specification earlier than the first two points due to the temperature gradient. If the last two points are still lower than the test specified value, the embedded controller controls the heating system to continue heating, and if the last two points are close to the test specified value, the heating power is reduced, and temperature overshoot in the test area is avoided. The low temperature state is similar, if the test specified value is not reached, the embedded controller controls the refrigerating system to continue refrigerating or reduces the power of the refrigerating unit to avoid overshoot (the actual temperature exceeds the test specified value within a certain time)
The multipoint and control is suitable for large complex test articles and a large number of test articles.
It should be understood that equivalents and modifications of the technical solution and inventive concept thereof may occur to those skilled in the art, and all such modifications and alterations should fall within the scope of the appended claims.
Claims (6)
1. The utility model provides a high low temperature test equipment, contains test area (2), embedded controller (1), heating system (5), refrigerating system (6) of placing the test article and arranges at the fixed temperature sensor (4) of test area air outlet, its characterized in that:
further comprising a plurality of movable temperature sensors (3) arranged in the test area;
the embedded controller (1) receives temperature data input by the fixed temperature sensor (4) or any movable temperature sensor (3) according to the selected control mode, compares the temperature data with a test specified value, sends a control instruction to the refrigerating system or the heating system according to the comparison result, and controls the refrigerating system or the heating system to cool or heat the test area so that the temperature of the test area reaches the test specified value;
wherein, the control mode comprises the following steps:
1) Multipath average control: the method comprises the steps that firstly, movable temperature sensors (3) are placed near or in a tested object, a test control mode is determined, high-low temperature test equipment is started, an embedded controller (1) firstly carries out average calculation on temperature data collected by the movable temperature sensors (3) to obtain an average value, then the average value is compared with a test specified value, if the average value is within the range of allowable tolerance of the test specified value, the temperature value of a test area is considered to reach the test specified value, the embedded controller (1) sends a control instruction to a refrigerating system or a heating system to stop working of the heating system or the refrigerating system or reduce the working power of the heating system or the refrigerating system, and otherwise, the control instruction is sent to the refrigerating system or the heating system to start working of the heating system or the refrigerating system to improve the working power of the heating system or the refrigerating system;
2) Single-point control: the method comprises the steps that firstly, a movable temperature sensor (3) is placed near or inside a tested object, a test control mode is determined, one movable temperature sensor (3) is appointed to be a control point, high-low temperature test equipment is started, temperature data collected by the appointed movable temperature sensor (3) are compared with a test specified value by an embedded controller (1), if the temperature data are within the tolerance range allowed by the test specified value, the temperature value of a test area is considered to reach the test specified value, the embedded controller (1) sends a control instruction to a refrigerating system or a heating system to stop working of the heating system or the refrigerating system or reduce the working power of the heating system or the refrigerating system, and otherwise, the control instruction is sent to the refrigerating system or the heating system to start working of the heating system or the refrigerating system or to improve the working power of the heating system or the refrigerating system;
3) Multipoint and control: the method comprises the steps that firstly, a movable temperature sensor (3) is placed near or inside a tested article, a test mode is determined, test specified values which are required to be reached by each collection point are respectively set, high-temperature and low-temperature test equipment is started, temperature data collected by each temperature sensor are compared with the test specified values of the corresponding collection points by an embedded controller (1), when the temperature data collected by all the collection points are within the range of allowable tolerance of the test specified values, the temperature value of a test area is considered to reach the test specified values, the embedded controller (1) sends a control instruction to a refrigerating system or a heating system, the heating system or the refrigerating system stops working or reduces power to work, otherwise, the control instruction is sent to the refrigerating system or the heating system, and the heating system or the refrigerating system starts working or improves the working power of the heating system or the refrigerating system.
2. The high and low temperature test equipment according to claim 1, wherein the embedded controller (1) comprises a plurality of temperature sensor signal input interfaces, two signal output interfaces, a microprocessor and a memory;
the temperature sensor signal input interface is used for connecting the fixed temperature sensor and the movable temperature sensor and transmitting temperature data acquired by the fixed temperature sensor and the movable temperature sensor to the microprocessor;
the microprocessor is used for calling the resident program from the memory to execute a control mode according to the temperature data and storing the temperature value of each temperature sensor in the test process to the memory;
the two signal output interfaces are respectively connected with the heating system and the refrigerating system and send the control instruction output by the microprocessor to the heating system and the refrigerating system.
3. A high and low temperature test apparatus according to claim 2, wherein the embedded controller (1) further comprises a temperature indicating device for displaying the actual temperature data of each collection point, the test set value of each collection point, and the difference between the temperature data and the test set value in real time.
4. A high and low temperature test device as claimed in claim 3, wherein the temperature indicating means is a graphic display or a text display.
5. The high and low temperature test equipment according to claim 4, wherein the embedded controller further comprises a start instruction output interface, the start instruction output interface is connected with the tested object, and when the microprocessor determines that the temperature value in the test area reaches the test specified value, the microprocessor sends a start work instruction to the tested object through the start instruction output interface.
6. The testing method of the high and low temperature testing apparatus according to any one of claims 1 to 5, comprising the steps of:
1. placing a tested article into a test area, determining a control mode, arranging a movable temperature sensor in the test area according to the control mode, and acquiring temperature data by the movable temperature sensor and/or a fixed temperature sensor;
2. the embedded controller compares the acquired temperature data with a test specified value, sends a control instruction to the refrigerating system or the heating system according to a comparison result, controls the refrigerating system or the heating system to start or stop working, or increases or decreases the working power of the refrigerating system or the heating system to enable the temperature of a test area to reach the test specified value;
3. and when the temperature of the test area is stable, carrying out power-on test on the tested product.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610502504.2A CN106199255B (en) | 2016-06-30 | 2016-06-30 | High-low temperature test equipment and test method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610502504.2A CN106199255B (en) | 2016-06-30 | 2016-06-30 | High-low temperature test equipment and test method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106199255A CN106199255A (en) | 2016-12-07 |
| CN106199255B true CN106199255B (en) | 2022-12-27 |
Family
ID=57463763
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610502504.2A Active CN106199255B (en) | 2016-06-30 | 2016-06-30 | High-low temperature test equipment and test method thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106199255B (en) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107271821A (en) * | 2017-07-14 | 2017-10-20 | 中国质量认证中心宁波（慈溪）检测中心 | The intelligent checking system and method for a kind of LED control devices |
| CN107589371A (en) * | 2017-07-24 | 2018-01-16 | 芜湖赛宝信息产业技术研究院有限公司 | A kind of New energy automobile motor and controller thermocycling method |
| CN107560758A (en) * | 2017-09-22 | 2018-01-09 | 海南医学院 | A kind of inside communication equipment thermometry |
| CN107941379A (en) * | 2017-10-27 | 2018-04-20 | 南京晨光集团有限责任公司 | Multichannel thermal field tests system and test method |
| CN108120936A (en) * | 2017-11-09 | 2018-06-05 | 广德宝达精密电路有限公司 | A kind of thermocycling stage apparatus for solid accumulator |
| CN108829149B (en) * | 2018-06-06 | 2020-11-06 | 中国人民解放军国防科技大学 | Autonomous temperature control system of unattended land-based ADS-B receiving station |
| CN110849646A (en) * | 2019-10-17 | 2020-02-28 | 中国航空工业集团公司洛阳电光设备研究所 | Method for testing temperature stabilization time of product |
| CN110937262A (en) * | 2019-12-19 | 2020-03-31 | 吉林大学 | Cold chain transportation container based on solar energy |
| CN111693803A (en) * | 2020-05-26 | 2020-09-22 | 日立楼宇技术（广州）有限公司 | High-low temperature damp-heat test system, test control method and fault protection method |
| CN114578877A (en) * | 2022-03-04 | 2022-06-03 | 苏州信科检测技术有限公司 | Intelligent test device and method |
| CN115228511A (en) * | 2022-06-13 | 2022-10-25 | 广东众志检测仪器有限公司 | Rapid temperature change method of ultralow temperature test box |
| CN116661522B (en) * | 2023-07-27 | 2023-09-29 | 广东科明环境仪器工业有限公司 | Intelligent temperature regulation and control method for temperature change test box based on data processing |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11160217A (en) * | 1997-11-27 | 1999-06-18 | Tabai Espec Corp | Thermal shock test device with function of neutralization control |
| JP2006329701A (en) * | 2005-05-24 | 2006-12-07 | Espec Corp | Thermal shock testing device, and testing method for thermal shock test |
| CN202630984U (en) * | 2012-05-14 | 2012-12-26 | 上海晟泰试验设备有限公司 | Rapid temperature variation testing equipment |
| CN103454958A (en) * | 2013-09-02 | 2013-12-18 | 重庆哈丁科技有限公司 | Multifunctional high and low temperature impulse testing box |
-
2016
- 2016-06-30 CN CN201610502504.2A patent/CN106199255B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11160217A (en) * | 1997-11-27 | 1999-06-18 | Tabai Espec Corp | Thermal shock test device with function of neutralization control |
| JP2006329701A (en) * | 2005-05-24 | 2006-12-07 | Espec Corp | Thermal shock testing device, and testing method for thermal shock test |
| CN202630984U (en) * | 2012-05-14 | 2012-12-26 | 上海晟泰试验设备有限公司 | Rapid temperature variation testing equipment |
| CN103454958A (en) * | 2013-09-02 | 2013-12-18 | 重庆哈丁科技有限公司 | Multifunctional high and low temperature impulse testing box |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106199255A (en) | 2016-12-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106199255B (en) | High-low temperature test equipment and test method thereof | |
| CN102297735B (en) | Standard constant temperature bath touch screen intelligent measurement control and automatic metering detection system | |
| CN104913589B (en) | A kind of the accurate temperature controlling method and refrigerator of the compensation of refrigerator compartment temperature dynamic | |
| CN102338075A (en) | Performance test device and test method for refrigeration compressor | |
| CN106568174A (en) | Control system and method for temperatures of computer room | |
| CN102628818A (en) | Thermal conduction coefficient tester for single-plate guarded thermal plate method with automatic pressure regulator and thickness measuring device | |
| CN106325063A (en) | Method and device for quickly decreasing temperature | |
| CN109387536A (en) | A kind of automation dry and wet roadbed freezing and thawing circulating test device and test method | |
| CN104198527B (en) | Temperature control system in compartment heat transfer coefficient test macro and compartment | |
| CN204746338U (en) | Quick temperature change test case | |
| CN114324992A (en) | Chip testing method, chip testing equipment and system | |
| CN102096426B (en) | A kind of method finding constant-temperature crystal oscillator quick start heating controlling curve | |
| CN109374287A (en) | A kind of Retarder control valve detection system and method | |
| CN113933675B (en) | Semiconductor refrigeration product detection method and system | |
| CN114296493B (en) | Chip temperature adjusting method | |
| CN1325888C (en) | Refrigerator refrigerating performance item on-line testing facilities and determination of equivalent testing method | |
| CN202119565U (en) | Standard constant temperature groove touch screen intelligent measurement and control and automatic metering detection system | |
| CN109443447B (en) | Explosive force and heat composite loading control system | |
| CN204380715U (en) | A kind of low-temperature refrigeration device for low frequency mechanoscopy test experiments | |
| CN103605010A (en) | Automatic detecting device for energy efficiency of microwave cooker | |
| CN102636362B (en) | A kind of temperature compensation for Performance Detection | |
| CN203274961U (en) | Calibrating device with independent vacuum chamber | |
| CN104865288A (en) | Instrument and method for testing thermal resistance of building component | |
| CN106610355A (en) | Heat engine fatigue test method and device | |
| CN106940065B (en) | The detection method and air-conditioning of temperature in space during air-conditioner defrosting |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |