CN106199255A - A kind of low-and high-temp test facility and test method thereof - Google Patents
A kind of low-and high-temp test facility and test method thereof Download PDFInfo
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- CN106199255A CN106199255A CN201610502504.2A CN201610502504A CN106199255A CN 106199255 A CN106199255 A CN 106199255A CN 201610502504 A CN201610502504 A CN 201610502504A CN 106199255 A CN106199255 A CN 106199255A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/19—Control of temperature characterised by the use of electric means
- G05D23/20—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature
Abstract
The invention discloses a kind of low-and high-temp test facility, comprise and place pilot region (2), embedded controller (1), heating system (5), refrigeration system (6), the fixed temperature sensor (4) being arranged in pilot region air outlet and the multiple removable temperature sensor (3) being arranged in pilot region by test product；Described embedded controller (1) receives fixed temperature sensor (4) or any the temperature data that removable temperature sensor (4) inputs according to the control model selected, temperature data is compared with test determination value, control instruction is sent to refrigeration system or heating system according to comparative result, control refrigeration system or heating system to trial zone cooling or to heat, make the temperature of pilot region reach test determination value.The present invention take single or multiple temperature sensor actual measurement by by the temperature value of test product, precise control of temperature stabilization time, accurate Control experiment, improve test efficiency guarantee test quality.
Description
Technical field
The invention belongs to low-and high-temp test facility and manufacture field and electron and electrician Product environment test field, by surveying in real time
Amount carries out the temperature-responsive value by test product of thermocycling, determines and has been reached temperature stabilization by test product, then to being subject to
The required value that the temperature of test product energising test or regulation testing equipment is other is tested.Pass through measurement method, it is possible to reduce
Affect the adverse effect that the uncertain factor of test mass is brought, it is ensured that test accuracy and quality.
Background technology
Low-and high-temp test facility is the industries widely used such as modern electronic equipment manufacture, communication manufacture, automobile making
Plant environmental test equipment.Low-and high-temp test facility typically has equipment box, air circulating system, heating system and refrigeration system, embedding
Entering formula controller, temperature sensor forms.The operation principle of low-and high-temp test facility: pilot region of sampling is responsible in temperature sensor
Interior temperature value, and the embedded controller of the temperature data input testing equipment of sampling, embedded controller is temperature number
Compare according to the test determination value with test requirements document and process accordingly, formed control instruction, control heating and
The duty of refrigeration system, makes low-and high-temp test facility continue heating and continue refrigeration, and temperature sensor continues sample temperature
Data are also input to control system, complete to test closed loop control.
This low-and high-temp test facility is by circulating the high temperature stress, low temperature stress or the high/low temperature that are applied to specify by test product
Alternate stress, can accelerate to excite the defect formation fault by within test product, for fault, take corrective action and improve product
Design and manufacturing process, improve product quality and reliability.
Ordinary temperature experiment process: 1. in the trial zone being put into low-and high-temp test facility by test product, by test product and survey
Examination equipment connects, and 2. regulates the temperature of testing equipment to test determination value, keeps this temperature certain time to make by test product and reach
Temperature stabilization, 3. starts by test product energising work and tests duty (the energising job demand holding as required by test product
The time of regulation), 4. the temperature of Adjustment Tests equipment is to other temperature value, or returns to normal temperature condition, terminates test.
For guarantee test quality, China, international test standard are desirable that after being placed on testing equipment by test product, it is necessary to
Keeping certain time under the temperature conditions of regulation, so that product reaches temperature stabilization, i.e. the temperature of product surface has reached test
Setting, the temperature field of interiors of products has reached thermal balance.The most again product energising is tested or is adjusted to other test
Temperature value.Whether product has reached temperature stabilization is the key factor affecting test mass.
The time being reached temperature stabilization by test product is dynamic, has certain randomness, typically by following factor
Impact: 1. by dimensional weight and the structure of test product self, 2. experimental condition, carry out the quantity by test product and placement side the most simultaneously
Formula, the 4. performance of low-and high-temp test facility, 5. ensure the properly functioning electricity of low-and high-temp test facility, cooling water recirculation system, examination
Test room environmental condition.
In order to make to be reached temperature stabilization by test product, current method is that unification arranges a regular time, so can make
Become undertesting, the precision of impact test and quality；Will also result in overtesting, caused damage by test product.
Summary of the invention
For the deficiencies in the prior art, the goal of the invention of the present invention is to provide a kind of low-and high-temp test facility and test thereof
Method, takes single or multiple removable temperature sensor actual measurement by the temperature value of test product, automatically determines whether product reaches in real time
Arrived temperature stabilization times, determined whether product reaches temperature stabilization state in real time, it is to avoid impact test stable unfavorable because of
The impact of element, improves test efficiency guarantee test quality.
The goal of the invention of the present invention is achieved through the following technical solutions:
A kind of low-and high-temp test facility, comprise place by test product pilot region 2, embedded controller 1, heating system 5,
Refrigeration system 6, be arranged in the fixed temperature sensor 4 of pilot region air outlet and be arranged in pilot region multiple removable
Temperature sensor 3；
Described embedded controller 1 can move according to the control model reception fixed temperature sensor 4 selected or any
The temperature data of dynamic temperature sensor 3 input, compares the temperature data measured in real time with test determination value, according to comparing
Result is formed and sends control instruction to refrigeration system or heating system, controls refrigeration system or heating system and drops to pilot region
Temperature or heat, make the temperature of pilot region reach test determination value.
Preferably, described control model includes following several:
1) multichannel average control: the temperature data that each removable temperature sensor 3 gathers first is entered by embedded controller 1
Row is average, obtains meansigma methods, then meansigma methods is compared with test determination value, if meansigma methods allows tolerance in test determination value
In the range of, then it is assumed that the temperature value of trial zone has reached test determination value, and embedded controller 1 is to refrigeration system or heating system
System sends control instruction, allows heating system or refrigeration system quit work or reduces the work of heating system or refrigeration system
Power, otherwise sends control instruction to refrigeration system or heating system, allows heating system or refrigeration system startup work or propose
High heating system or the operating power of refrigeration system；
2) single-point controls: the temperature that any one appointed removable temperature sensor 3 is gathered by embedded controller 1
Data compare with test determination value, if this value allows in the range of tolerance in test determination value, then it is assumed that the temperature of trial zone
Angle value has reached test determination value, and embedded controller 1 sends control instruction to refrigeration system or heating system, allows heating system
Or refrigeration system quits work or reduces the operating power of heating system or refrigeration system, otherwise to refrigeration system or heating
System sends control instruction, allows heating system or refrigeration system startup work or improve heating system or the work of refrigeration system
Power；
3) multiple spot is with control: sets the test determination value that each collection point should reach the most respectively, then each temperature is passed
The temperature data of sensor collection compares with the test determination value of corresponding collection point, when the temperature number that all collection points gather
According to all allowing in the range of tolerance in test determination value, then it is assumed that the temperature value of trial zone has reached test determination value, embedded
Controller 1 sends control instruction to refrigeration system or heating system, allows heating system or refrigeration system quit work or to drop
Low-power operation, otherwise sends control instruction to refrigeration system or heating system, allows heating system or refrigeration system startup work
Or improve heating system or the operating power of refrigeration system.
Preferably, described embedded controller 1 comprises several temperature sensor signal input interfaces, at least two signals
Output interface, microprocessor, memorizer, interface chip, power input interface and software；
Described temperature sensor signal input interface is used for connecting fixed temperature sensor, removable temperature sensor, will
Fixed temperature sensor, the temperature data of removable temperature sensor collection are transferred to microprocessor；
Described microprocessor is for transferring resident software according to determining control model from memorizer, and by process of the test
The Temperature numerical of each temperature sensor stores on memorizer；
Described two signal output interfaces connect heating system and refrigeration system respectively, the control that microprocessor exports are referred to
Order is sent to heating system and refrigeration system.
Preferably, described embedded controller 1 also comprises temperature indicating device, for the reality of each collection point of display in real time
Temperature data, each collection point test determination value, temperature data and the difference of test determination value.
Preferably, described temperature indicating device uses graphic display mode or text display method.
Preferably, described embedded controller also comprises enabled instruction output interface, described enabled instruction output interface with
Connected by test product, when microprocessor thinks that the temperature value of pilot region is then exported by enabled instruction when having reached test determination value
Interface sends enabled instruction to by test product.
Present invention also offers the test method using low-and high-temp test facility, comprise the steps of
One, being put in trial zone by test product, control model is determined, according to control model by removable temperature sensor cloth
Put inside pilot region, removable temperature sensor and/or fixed temperature sensor collecting temperature data；
Two, embedded controller gather temperature data compares with test determination value, according to comparative result to system
Cooling system or heating send control instruction, control refrigeration system or heating system starts or stops work, or improve or
Reduce refrigeration system or the operating power of heating system, make the temperature of trial zone reach test determination value；
Three, when, after the temperature stabilization of trial zone, testing being carried out energising by test product.
Preferably, described control model comprises:
1) multichannel average control: the temperature data that each removable temperature sensor 3 gathers first is entered by embedded controller 1
Row is average, obtains meansigma methods, then meansigma methods is compared with test determination value, if meansigma methods allows tolerance in test determination value
In the range of, then it is assumed that the temperature value of trial zone has reached test determination value, sends control to refrigeration system or heating system and refers to
Order, allows heating system or refrigeration system quit work or reduces the operating power of heating system or refrigeration system, the most embedding
Enter formula controller 1 and send control instruction to refrigeration system or heating system, allow heating system or refrigeration system startup work or
Improve heating system or the operating power of refrigeration system；
2) single-point controls: the temperature that any one appointed removable temperature sensor 3 is gathered by embedded controller 1
Data compare with setting, if this temperature data allows in the range of tolerance in test determination value, then it is assumed that trial zone
Temperature value has reached test determination value, and embedded controller 1 sends control instruction to refrigeration system or heating system, allows heating
System or refrigeration system quit work or reduce the operating power of heating system or refrigeration system, otherwise to refrigeration system or
Heating system sends control instruction, allows heating system or refrigeration system startup work or improve heating system or refrigeration system
Operating power；
3) multiple spot is with control: sets the test determination value that each collection point should reach the most respectively, then each temperature is passed
The temperature data of sensor collection compares with the test determination value of corresponding collection point, when the temperature number that all collection points gather
According to all allowing in the range of tolerance in test determination value, then it is assumed that the temperature value of trial zone has reached test determination value, embedded
Controller sends control instruction to refrigeration system or heating system, allows heating system or refrigeration system quit work or to reduce
Power works, and otherwise sends control instruction to refrigeration system or heating system, allow heating system or refrigeration system startup work or
Person improves the operating power of heating system or refrigeration system.
Compared with prior art, the present invention changes the test method of low-and high-temp test facility, changes temperature sensor
Configuration quantity, low-and high-temp test facility possesses the ability of single channel, multichannel temperature measurement and sampling, according to the temperature by test product of actual measurement
Angle value, as controlling benchmark, determines and has been reached temperature stabilization by test product, makes testing equipment automatically adapt to different by tested
Product, precise control of temperature stabilization time, accurate Control experiment.
Accompanying drawing explanation
Fig. 1 is the structural representation of a kind of low-and high-temp test facility of the present invention.
Fig. 2 is the operation principle schematic diagram of a kind of low-and high-temp test facility of the present invention.
Description of symbols
1 embedded controller 2 pilot region 3 may move temperature sensor 4 fixed temperature and passes
Sensor 5 heating system 6 refrigeration system 7 air outlet 8 tests chamber door.
Detailed description of the invention
As it is shown in figure 1, a kind of low-and high-temp test facility, comprise place by test product pilot region 2, embedded controller 1,
Heating system 5, refrigeration system 6, it is arranged in the fixed temperature sensor 4 of pilot region air outlet and is arranged in pilot region
Multiple removable temperature sensors 3.Below all parts is illustrated one by one.
Pilot region, in this region, temperature is in check, and general high/low temperature extreme value is :-70 degree～180 degree, temperature essence
The indexs such as degree, temperature homogeneity, temperature fluctuation are satisfied by relevant national standard.
Embedded controller comprises:
1) multi way temperature sensor input, by increasing temperature sensor input interface quantity so that it is possess multichannel
Temperature sensor signal input capability.The quantity of temperature sensor input interface depends primarily on the test of low-and high-temp test facility
Volume.
2) microprocessor, compares the temperature data collected with test determination value according to control model, according to than
Relatively result sends control instruction to refrigeration system or heating, controls refrigeration system or heating and to trial zone cooling or adds
Temperature, makes the temperature of pilot region reach test determination value.
3) two signal output interfaces, connect heating system and refrigeration system respectively, the control that microprocessor exports are referred to
Order is sent to heating system and refrigeration system.
4) temperature indicating device, when carrying out experiment control, shows the actual temperature data of each collection point, each experimental tests in real time
The difference of setting, temperature data and test determination value.Display mode can be to be graphically displayed mode, it is also possible to by text shape
Formula shows).
5) memorizer, real time record also preserves the temperature of multi way temperature sensor sample several times, and resident control software.
6) enabled instruction output interface: embedded controller can be connect by signal output after the temperature stabilization of trial zone
Mouth sends enabled instruction to experimental products, can start test product.Enabled instruction kind can be digital signal, can be from
Dissipate amount model, it is also possible to be simulation model.
Embedded controller also comprises interface chip, power input interface and the interface being attached with remote equipment.
Removable temperature sensor, can be placed on by test product attached removable temperature sensor when testing
Closely, it is also possible to be placed into the inside by test product, the inside of trial zone increases the device placing removable temperature sensor.Original
The fixed temperature sensor being arranged on high temperature low testing equipment air outlet 7 still retains.
Refrigeration system, by compositions such as refrigeration compressor, condenser, valve, cooling water pipelines.
Heating system, is mainly made up of heater.
Temperature controls datum mark and selects: low-and high-temp test facility is not only in the temperature controlled collection point of low-and high-temp test facility
Air outlet at fixed temperature sensor, it is also possible to be trial zone test product near be arbitrarily designated temperature sensing
Device, or the multiple temperature sensors being arbitrarily designated.So, be possible not only to measures the temperature field near test product,
The most also the temperature field of test product external temperature, test interiors of products is measured.
Testing process is as follows:
One, after test starts, open test chamber door 8, being put in pilot region by test product, confirm control model, use
Fixing sensor controls, or selects movable sensor to be controlled, if the latter, needs movable sensor is arranged in examination
Test inside region, fixed temperature sensor and/or removable temperature sensor by Real-time Collection to temperature data be transferred to embedding
Enter formula controller.
Two, embedded controller is according to control model set in advance: as the temperature field temperature near product entirely reaches
In certain setting value region, and rate of change is not more than certain test determination value, or the temperature field of interiors of products reaches
In certain setting value region, and rate of temperature change has reached test determination value, then should have been reached temperature stabilization by test product.
Three, after having reached temperature stabilization, testing equipment sends signal to experiment operator, surveys by test product energising
Examination.Testing equipment can also directly send signal, firing test test equipment, starts to test being carried out energising by test product；Also may be used
With the temperature of Control experiment equipment to next test determination value.
Control model: the control model of testing equipment has various ways, including single-point control methods, multi-point average value control methods
With multiple spot and control.
1) multichannel average control.Assuming there are 4 movable sensors, numbering is respectively P1, P2, P3, P4, the temperature value of collection
It is respectively T1, T2, T3, T4, test determination value is Tset, it is allowed to tolerance is Tt.If T1, T2, T3, T4Meansigma methods at Tset±TtModel
In enclosing, then it is assumed that the temperature value of trial zone has reached test determination value, sends control instruction to refrigeration system or heating system, allows
Heating system or refrigeration system quit work or reduce the operating power of heating system or refrigeration system, otherwise to refrigeration system
System or heating system send control instruction, allow heating system or refrigeration system startup work or improve heating system or refrigeration system
The operating power of system.Multichannel average control is suitable for the trial target that volume ratio is bigger.
2) single-point controls.Work as P1, P2, P3, P4In the temperature of any one appointed sensor reach test determination value
Time in permission tolerance, it is believed that the temperature value of trial zone has reached test determination value, sends control to refrigeration system or heating system
Instruction, allows heating system or refrigeration system quit work or reduces the operating power of heating system or refrigeration system, otherwise
Send control instruction to refrigeration system or heating system, allow heating system or refrigeration system startup work or improve heating system
Or the operating power of refrigeration system.
3) multiple spot and control.Multiple spot and control include two types, and the first type is that all of temperature spot all must
Same requirement temperature value must be reached, the second be temperature value of each point be different, each temperature must reach respectively
Test determination value.
In pilot region, each temperature spot is regular, and the change near the temperature spot temperature of test chamber door can lag behind
Other temperature spots (because these points are farther from Cooling and Heat Source), and owing to placed by test product, the temperature spot in pilot region is
There is deviation, institute the most all reaches same value and is actually difficulty with.Time multiple points are carried out at control, first have to determine
Control mode.1) temperature spot near test chamber door sets lower.Such as (T1, T2, T3, T4), wherein the first two point is near examination
Tryoff door, rear two points are near cold and hot air outlet.Hypothesis test district temperature is 55 degree, then set (53 degree, 53 degree 55 degree, 55 degree).
Owing to there is thermograde, rear two points typically can reach test determination value early than the first two point.If rear two points are also less than
Test determination value, then embedded controller controls heating system continues heating, if already close to test determination value, then lowers and adds
Thermal power, it is to avoid temperature overshot in pilot region.Low temperature state situation is similar to, if being also not reaching to test determination value, the most embedding
Enter formula controller and control refrigeration system continuation refrigeration, or reduce the power of refrigeration unit, it is to avoid (actual temperature is necessarily to cross punching
Beyond test determination value in time)
Multiple spot is suitable for large complicated by test product with controlling control, is suitable for a fairly large number of by test product.
It is understood that for those of ordinary skills, can be according to technical scheme and send out
Bright design in addition equivalent or change, and all these change or replace the guarantor that all should belong to appended claims of the invention
Protect scope.
Claims (8)
1. a low-and high-temp test facility, comprises and places by the pilot region (2) of test product, embedded controller (1), heating system
(5), refrigeration system (6) and be arranged in the fixed temperature sensor (4) of pilot region air outlet, it is characterised in that:
Also comprise the multiple removable temperature sensor (3) being arranged in pilot region；
Described embedded controller (1) can move according to control model reception fixed temperature sensor (4) selected or any
The temperature data that dynamic temperature sensor (4) inputs, compares temperature data with test determination value, according to comparative result to system
Cooling system or heating system send control instruction, control refrigeration system or heating system and to pilot region cooling or heat, make examination
The temperature testing region reaches test determination value.
A kind of low-and high-temp test facility the most according to claim 1, it is characterised in that described control model includes following
Several:
1) multichannel average control: first removable temperature sensor (3) is placed on by near test product or inside, determines controlling test
Pattern, starts low-and high-temp test facility, the temperature that each removable temperature sensor (3) is first gathered by embedded controller (1)
Data are averaged calculating, obtain meansigma methods, then this meansigma methods are compared with test determination value, if meansigma methods is in test
Setting allows in the range of tolerance, then it is assumed that the temperature value of trial zone has reached test determination value, embedded controller (1) to
Refrigeration system or heating system send control instruction, allow heating system or refrigeration system quit work or to reduce heating system
Or the operating power of refrigeration system, otherwise send control instruction to refrigeration system or heating system, allow heating system or refrigeration system
System starts work or improves heating system or the operating power of refrigeration system；
2) single-point controls: first removable temperature sensor (3) is placed on by near test product or inside, determines controlling test mould
Formula, it is intended that a removable temperature sensor (3) is control point, starts low-and high-temp test facility, and embedded controller (1) will refer to
The temperature data that fixed removable temperature sensor (3) gathers compares with test determination value, if this temperature data is in test
Setting allows in the range of tolerance, then it is assumed that the temperature value of trial zone has reached test determination value, embedded controller (1) to
Refrigeration system or heating system send control instruction, allow heating system or refrigeration system quit work or to reduce heating system
Or the operating power of refrigeration system, otherwise send control instruction to refrigeration system or heating system, allow heating system or refrigeration system
System starts work or improves heating system or the operating power of refrigeration system；
3) multiple spot and control: first removable temperature sensor (3) is placed on by near test product or inside, determines test mould
Formula, sets the test determination value that each collection point should reach respectively, starts low-and high-temp test facility, and embedded controller (1) will be each
The temperature data of individual temperature sensor collection compares with the test determination value of corresponding collection point, when all collection points gather
Temperature data all allow in the range of tolerance in test determination value, then it is assumed that the temperature value of trial zone has reached test determination
Value, embedded controller (1) sends control instruction to refrigeration system or heating system, allows heating system or refrigeration system stop
Work or fall low-power operation, otherwise send control instruction to refrigeration system or heating system, allow heating system or refrigeration system
System starts work or improves heating system or the operating power of refrigeration system.
A kind of low-and high-temp test facility the most according to claim 1, it is characterised in that described embedded controller (1) comprises
Several temperature sensor signal input interfaces, two signal output interfaces, microprocessor, memorizeies；
Described temperature sensor signal input interface is used for connecting fixed temperature sensor, removable temperature sensor, will be fixing
Temperature sensor, the temperature data of removable temperature sensor collection are transferred to microprocessor；
Described microprocessor performs control model for transferring TSR from memorizer according to temperature data, and will test
In journey, the Temperature numerical of each temperature sensor stores on memorizer；
Described two signal output interfaces connect heating system and refrigeration system respectively, the control instruction that microprocessor exports are sent out
Give heating system and refrigeration system.
A kind of low-and high-temp test facility the most according to claim 3, it is characterised in that described embedded controller (1) also wraps
Containing temperature indicating device, for the display actual temperature data of each collection point, each collection point test determination value, temperature data in real time
Difference with test determination value.
A kind of low-and high-temp test facility the most according to claim 4, it is characterised in that described temperature indicating device uses figure
Shape display mode or text display method.
A kind of low-and high-temp test facility the most according to claim 3, it is characterised in that described embedded controller also comprises
Enabled instruction output interface, described enabled instruction output interface is connected with by test product, when the temperature of pilot region thought by microprocessor
Then startup work order is sent by enabled instruction output interface to by test product when angle value has reached test determination value.
The test method of a kind of low-and high-temp test facility the most according to claim 1, comprises the steps of
One, being put in trial zone by test product, determine control model, according to control model, removable temperature sensor is arranged in
Inside pilot region, removable temperature sensor and/or fixed temperature sensor collecting temperature data；
Two, embedded controller compares the temperature data collected with test determination value, according to comparative result to refrigeration
System or heating send control instruction, control refrigeration system or heating system starts or stops work, or improve or fall
Low refrigeration system or the operating power of heating system, make the temperature of trial zone reach test determination value；
Three, when, after the temperature stabilization of trial zone, testing being carried out energising by test product.
Test method the most according to claim 7, it is characterised in that described control model comprises:
1) multichannel average control: after on-test, each removable temperature sensor (3) is first gathered by embedded controller (1)
Temperature data be averaged, obtain meansigma methods, then meansigma methods compared with test determination value, if meansigma methods test rule
Definite value allows in the range of tolerance, then it is assumed that the temperature value of trial zone has reached test determination value, and embedded controller is to refrigeration
System or heating system send control instruction, allow heating system or refrigeration system quit work or reduce heating system or system
The operating power of cooling system, otherwise embedded controller sends control instruction to refrigeration system or heating system, allows heating system
Or refrigeration system startup work or improve heating system or the operating power of refrigeration system；
2) single-point controls: after on-test, embedded controller (1) is by any one appointed removable temperature sensor
(3) temperature data gathered compares with test determination value, if this value allows in the range of tolerance, then to recognize in test determination value
Temperature value for trial zone has reached test determination value, and embedded controller sends control to refrigeration system or heating system and refers to
Order, allows heating system or refrigeration system quit work or reduces the operating power of heating system or refrigeration system, the most embedding
Enter formula controller and send control instruction to refrigeration system or heating system, allow heating system or refrigeration system startup work or propose
High heating system or the operating power of refrigeration system；
3) multiple spot is with control: set the test determination value that each collection point should reach, after on-test, embedded control the most respectively
The temperature data that each temperature sensor is gathered by device processed compares with the test determination value of corresponding collection point, adopts when all
The temperature data that collection point gathers all allows in the range of tolerance in test determination value, then it is assumed that the temperature value of trial zone has reached examination
Testing setting, embedded controller sends control instruction to refrigeration system or heating system, allows heating system or refrigeration system
Quit work or drop low-power operation, otherwise sending control instruction to refrigeration system or heating system, allowing heating system or system
Cooling system startup work or improve heating system or the operating power of refrigeration system.
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| CN107941379A (en) * | 2017-10-27 | 2018-04-20 | 南京晨光集团有限责任公司 | Multichannel thermal field tests system and test method |
| CN108120936A (en) * | 2017-11-09 | 2018-06-05 | 广德宝达精密电路有限公司 | A kind of thermocycling stage apparatus for solid accumulator |
| CN108829149B (en) * | 2018-06-06 | 2020-11-06 | 中国人民解放军国防科技大学 | Autonomous temperature control system of unattended land-based ADS-B receiving station |
| CN108829149A (en) * | 2018-06-06 | 2018-11-16 | 中国人民解放军国防科技大学 | Autonomous temperature control system of unattended land-based ADS-B receiving station |
| CN110849646A (en) * | 2019-10-17 | 2020-02-28 | 中国航空工业集团公司洛阳电光设备研究所 | Method for testing temperature stabilization time of product |
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| CN111693803A (en) * | 2020-05-26 | 2020-09-22 | 日立楼宇技术（广州）有限公司 | High-low temperature damp-heat test system, test control method and fault protection method |
| CN114578877A (en) * | 2022-03-04 | 2022-06-03 | 苏州信科检测技术有限公司 | Intelligent test device and method |
| CN115228511A (en) * | 2022-06-13 | 2022-10-25 | 广东众志检测仪器有限公司 | Rapid temperature change method of ultralow temperature test box |
| CN116661522A (en) * | 2023-07-27 | 2023-08-29 | 广东科明环境仪器工业有限公司 | Intelligent temperature regulation and control method for temperature change test box based on data processing |
| CN116661522B (en) * | 2023-07-27 | 2023-09-29 | 广东科明环境仪器工业有限公司 | Intelligent temperature regulation and control method for temperature change test box based on data processing |
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