CN113720702A - Material external field low-temperature test response equivalence method based on equivalence theory - Google Patents
Material external field low-temperature test response equivalence method based on equivalence theory Download PDFInfo
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- CN113720702A CN113720702A CN202110905192.0A CN202110905192A CN113720702A CN 113720702 A CN113720702 A CN 113720702A CN 202110905192 A CN202110905192 A CN 202110905192A CN 113720702 A CN113720702 A CN 113720702A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
- G01N3/18—Performing tests at high or low temperatures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0014—Type of force applied
- G01N2203/0016—Tensile or compressive
- G01N2203/0017—Tensile
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/022—Environment of the test
- G01N2203/0222—Temperature
- G01N2203/0228—Low temperature; Cooling means
Abstract
The application belongs to the technical field of low-temperature environment tests, and particularly relates to a material external field low-temperature test response equivalence method based on an equivalence theory. The method comprises the following steps: the method comprises the following steps of firstly, carrying out a material internal field low-temperature test to obtain material internal field low-temperature test data; fitting a curve of the length variation of the test piece along with the temperature variation according to the material internal field low-temperature test data; acquiring an equivalent transformation relation from an internal field to an external field of the material; and step four, acquiring temperature data of the material external field low-temperature test, calculating the length variation of the test piece corresponding to each temperature point according to the equivalent transformation relation from the material internal field to the external field, and fitting to obtain a material external field low-temperature test equivalent curve. The method and the device can obtain the low-temperature steady-state response of the external field through the transformation of the internal field test data, and have a simple form and are convenient to calculate; the problems of short window period and uncontrollable test temperature of the low-temperature test in the external field test are solved, the method can be used for performance tests of key materials and structures, the test cost is reduced, and the test time is shortened.
Description
Technical Field
The application belongs to the technical field of low-temperature environment tests, and particularly relates to a material external field low-temperature test response equivalence method based on an equivalence theory.
Background
The low-temperature environment of the aircraft in the process of parking, maintenance and maintenance on the ground becomes a typical factor of various accident signs and flight accidents, and the aircraft is easy to have various problems of icing and ice accumulation, poor sealing, oil hydraulic system faults, electronic equipment faults and the like in the low-temperature environment.
At present, the simulation of an actual external field low-temperature experiment environment by using a low-temperature environment test box becomes a common experiment method of a low-temperature experiment, but because the external field environment is relatively complex, the internal field environment of the environment test box has a certain difference with the low-temperature environment test of the external field environment, and the internal field low-temperature test in the environment test box needs to be equivalent to obtain the external field low-temperature test.
Accordingly, a technical solution is desired to overcome or at least alleviate at least one of the above-mentioned drawbacks of the prior art.
Disclosure of Invention
The application aims to provide a material external field low-temperature test response equivalence method based on equivalence theory so as to solve at least one problem in the prior art.
The technical scheme of the application is as follows:
a material external field low-temperature test response equivalence method based on equivalence theory comprises the following steps:
the method comprises the following steps of firstly, carrying out a material internal field low-temperature test to obtain material internal field low-temperature test data;
fitting a test piece length variation curve along with temperature variation according to the material internal field low-temperature test data;
step three, obtaining an equivalent transformation relation from an internal field to an external field of the material:
wherein L is0Is the initial length of the specimen, L1Is the length variation of the test piece in the outfield test, L2Is the length variation of the test piece in the infield test,f(T1) At a temperature of T1The temperature coefficient of the internal field stiffness of the material;
and step four, acquiring temperature data of the material external field low-temperature test, calculating the length variation of the test piece corresponding to each temperature point according to the equivalent transformation relation from the material internal field to the external field, and fitting to obtain a material external field low-temperature test equivalent curve.
In at least one embodiment of the present application, in the step one, the performing the material internal field low temperature test, and acquiring the material internal field low temperature test data includes:
performing a material internal field low-temperature tensile resilience test to obtain tensile resilience test data of the material internal field; and/or
And performing a material internal field low-temperature equal-weight tensile test to obtain the equal-weight tensile test data of the material internal field.
In at least one embodiment of the present application, the performing the material internal field low-temperature tensile rebound test, and acquiring the tensile rebound test data of the material internal field includes:
setting the temperature condition of the material internal field low-temperature environment;
after the test piece is stretched to a preset length, the test piece is placed in a material internal field low-temperature environment and exposed for a preset time until the temperature of the test piece is the same as the environmental temperature;
and loosening the test piece to enable the test piece to rebound automatically, and measuring the natural retraction amount of the test piece in different low-temperature environments.
In at least one embodiment of the present application, the performing the material internal field low-temperature equal-weight tensile test, and acquiring the equal-weight tensile test data of the material internal field includes:
setting the temperature condition of the material internal field low-temperature environment;
placing the test piece in a material internal field low-temperature environment and exposing for a preset time until the temperature of the test piece is the same as the environmental temperature;
and (4) loading weights with the same mass on the test piece, and measuring the loading elongation of the test piece in different low-temperature environments.
In at least one embodiment of the present application, the material internal field low ambient temperature condition comprises a plurality of temperature points in the range of-40 ℃ to 0 ℃.
In at least one embodiment of the present application, in the second step, fitting a curve of the length variation of the test piece along with the temperature variation according to the material internal field low temperature test data includes:
fitting a test piece resilience length variation curve along with the temperature according to the tensile resilience test data; and/or
And fitting a curve of the tensile length of the test piece changing along with the temperature according to the equal-weight tensile test data.
In at least one embodiment of the present application, in step four, the obtaining of the temperature data of the material external field low temperature test, calculating the length variation of the test piece corresponding to each temperature point according to the equivalent transformation relationship from the material internal field to the external field, and fitting the material external field low temperature test equivalent curve includes:
the method comprises the steps of obtaining temperature data of a tension rebound test of a material external field, calculating the length variation of a test piece corresponding to each temperature point according to the equivalent transformation relation from the material internal field to the external field, and fitting an equivalent curve of the tension rebound test of the material external field; and/or
The method comprises the steps of obtaining temperature data of the constant-weight tensile test of the material external field, calculating the length variation of a test piece corresponding to each temperature point according to the equivalent transformation relation from the material internal field to the external field, and fitting an equivalent curve of the constant-weight tensile test of the material external field.
In at least one embodiment of the present application, further comprising the steps of,
Performing a material external field low-temperature test to obtain material external field low-temperature test data;
fitting a material external field low-temperature test curve according to the material external field low-temperature test data;
and carrying out goodness-of-fit evaluation on the material external field low-temperature test equivalent curve according to the material external field low-temperature test curve.
In at least one embodiment of the present application, in performing an external field cryogenic test on a material, the temperature is measured three times each time and the average is taken as the test temperature when the temperature does not float more than 1 ℃.
In at least one embodiment of the present application, the evaluating the goodness-of-fit of the material external field low temperature test equivalent curve according to the material external field low temperature test curve comprises:
R2＝1-SSerr/SStot
wherein SSerrAs residual error, SStotIs a deviation, PiIs a test value corresponding to the length variation of the temperature point,
is PiIs determined by the average value of (a) of (b),
is the equivalent transformation value of the length variation of the corresponding temperature point, and N is the number of the test data points participating in the fitting.
The invention has at least the following beneficial technical effects:
the material external field low-temperature test response equivalent method based on the equivalence theory can well obtain external field low-temperature steady-state response through internal field test data transformation, and is simple in form and convenient to calculate; the problems of short window period and uncontrollable test temperature of the low-temperature test in the external field test are solved, the method can be used for performance tests of key materials and structures, the test cost is reduced, and the test time is shortened.
Drawings
FIG. 1 is a field rebound test fit curve in a material according to one embodiment of the present application;
FIG. 2 is a curve fitted to a field-outside tensile spring back test for a material according to one embodiment of the present application;
FIG. 3 is a schematic diagram of the transition between the internal and external fields of a material in a tensile spring back test according to one embodiment of the present application.
Detailed Description
In order to make the implementation objects, technical solutions and advantages of the present application clearer, the technical solutions in the embodiments of the present application will be described in more detail below with reference to the drawings in the embodiments of the present application. In the drawings, the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The described embodiments are a subset of the embodiments in the present application and not all embodiments in the present application. The embodiments described below with reference to the drawings are exemplary and intended to be used for explaining the present application and should not be construed as limiting the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application. Embodiments of the present application will be described in detail below with reference to the accompanying drawings.
In the description of the present application, it is to be understood that the terms "center", "longitudinal", "lateral", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are used merely for convenience in describing the present application and for simplifying the description, and do not indicate or imply that the referenced device or element must have a particular orientation, be constructed in a particular orientation, and be operated, and therefore should not be construed as limiting the scope of the present application.
The present application is described in further detail below with reference to fig. 1 to 3.
The application provides a material external field low-temperature test response equivalence method based on equivalence theory, which comprises the following steps:
the method comprises the following steps of firstly, carrying out a material internal field low-temperature test to obtain material internal field low-temperature test data;
fitting a curve of the length variation of the test piece along with the temperature variation according to the material internal field low-temperature test data;
step three, obtaining an equivalent transformation relation from an internal field to an external field of the material:
wherein L is0Is the initial length of the specimen, L1Is the length variation of the test piece in the outfield test, L2Is the length variation of the test piece in the infield test, f (T)1) At a temperature of T1The temperature coefficient of the internal field stiffness of the material;
and step four, acquiring temperature data of the material external field low-temperature test, calculating the length variation of the test piece corresponding to each temperature point according to the equivalent transformation relation from the material internal field to the external field, and fitting to obtain a material external field low-temperature test equivalent curve.
The material external field low-temperature test response equivalent method based on the equivalence theory performs material internal field low-temperature tests, including performing material internal field low-temperature tensile resilience tests and performing material internal field low-temperature equal-weight tensile tests.
In one embodiment of the present application, performing a material internal field low temperature tensile spring back test, and acquiring tensile spring back test data of a material internal field comprises:
setting the temperature condition of the material internal field low-temperature environment;
after the test piece is stretched to a preset length, the test piece is placed in a material internal field low-temperature environment and exposed for a preset time until the temperature of the test piece is the same as the environmental temperature;
and loosening the test piece to enable the test piece to rebound automatically, and measuring the natural retraction amount of the test piece in different low-temperature environments.
In another embodiment of the present application, performing an internal field low temperature equal weight tensile test on a material, and acquiring data of the equal weight tensile test on the internal field of the material comprises:
setting the temperature condition of the material internal field low-temperature environment;
placing the test piece in a material internal field low-temperature environment and exposing for a preset time until the temperature of the test piece is the same as the environmental temperature;
and (4) loading weights with the same mass on the test piece, and measuring the loading elongation of the test piece in different low-temperature environments.
In a preferred embodiment of the present application, wherein the material internal field low ambient temperature conditions comprise essentially a plurality of temperature points in the range of-40 ℃ to 0 ℃.
According to the material external field low-temperature test response equivalence method based on the equivalence theory, a proper fitting method and a fitting curve are selected according to different test data, scattered point data obtained through an experiment are subjected to relevant fitting, and a test piece resilience length curve along with temperature change and a test piece tensile length curve along with temperature change can be fitted respectively.
The material external field low-temperature test response equivalent method based on the equivalence theory assumes that the normal temperature T is used in the equal-weight tensile test0The original length of the lower test piece is L0At a temperature of T1The tensile length of the external field test is L1When the external field equivalent stiffness of the material is Kout(T1) Tensile length of inner field test is L2And L is1≠L2The internal field equivalent stiffness of the material is Kin(T1) And has Kout(T1)＝Kin(T1)+ΔK(T1)，Kin(T1)＝f(T1)Kin(T0)，f(T1) At a temperature of T1The temperature coefficient of internal field rigidity of the material is T2＝T1At + Δ T, the tensile length of the internal field test is L1As derived from theory, the temperature T is then1The following external field test lengths were:
the fit curve of the internal field test data can be transformed through an internal and external field length equivalent transformation formula.
On the basis of the material internal field low-temperature test, the temperature point of the material external field low-temperature test is collected and is brought into mathematical derivation, and the material external field low-temperature test equivalent curve can be obtained.
In the preferred embodiment of the application, the length variation of the test piece corresponding to each temperature point is calculated according to the equivalent transformation relation from the material internal field to the external field by acquiring the temperature data of the tensile rebound test of the material external field, and an equivalent curve of the tensile rebound test of the material external field is fitted; the method comprises the steps of obtaining temperature data of the constant-weight tensile test of the material external field, calculating the length variation of a test piece corresponding to each temperature point according to the equivalent transformation relation from the material internal field to the external field, and fitting an equivalent curve of the constant-weight tensile test of the material external field.
Advantageously, in a preferred embodiment of the present application, the method further comprises a fifth step of performing an external field low temperature test on the material to obtain external field low temperature test data of the material;
fitting a material external field low-temperature test curve according to the material external field low-temperature test data;
and (4) carrying out goodness-of-fit evaluation on the material external field low-temperature test equivalent curve according to the material external field low-temperature test curve.
In one embodiment of the present application, a low temperature environment test chamber is used when performing an internal field low temperature test of a material. And fitting the obtained material internal field low-temperature test curve, as shown in figure 1. A test piece made of a certain material is tested in an external field environment of-40 ℃ to 0 ℃, and the test piece needs to be uniformly pretreated before the test begins. Considering that the external temperature is unstable in the external field test, in the material external field low-temperature test, the temperature is measured three times each time, when the temperature is not more than 1 ℃, the average value is taken as the test temperature, and a material external field low-temperature test curve is fitted and shown in fig. 2.
To show the accuracy of the fitting results and experimental data, R was chosen2And (5) checking and evaluating the fitting error of the fitting model. The expression is as follows:
R2＝1-SSerr/SStot
wherein SSerrAs residual error, SStotIs a deviation, PiIs a test value corresponding to the length variation of the temperature point,
is PiIs determined by the average value of (a) of (b),
is the equivalent transformation value of the length variation of the corresponding temperature point, and N is the number of the test data points participating in the fitting.
Carrying out goodness-of-fit evaluation on the transformed internal field fitting curve and the corresponding external field curve, R2The larger the goodness of fit, the smaller the error. In this embodiment, as shown in fig. 3, the goodness is 0.999 or more.
The material external field low-temperature test response equivalent method based on the equivalence theory can well obtain external field low-temperature steady-state response through internal field test data transformation, and is simple in form and convenient to calculate; the problems of short window period and uncontrollable test temperature of the low-temperature test in the external field test are solved, the method can be used for performance tests of key materials and structures, the test cost is reduced, and the test time is shortened.
The above description is only for the specific embodiments of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present application should be covered within the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. A material external field low-temperature test response equivalence method based on equivalence theory is characterized by comprising the following steps:
the method comprises the following steps of firstly, carrying out a material internal field low-temperature test to obtain material internal field low-temperature test data;
fitting a test piece length variation curve along with temperature variation according to the material internal field low-temperature test data;
step three, obtaining an equivalent transformation relation from an internal field to an external field of the material:
wherein L is0Is the initial length of the specimen, L1Is the length variation of the test piece in the outfield test, L2Is the length variation of the test piece in the infield test, f (T)1) At a temperature of T1The temperature coefficient of the internal field stiffness of the material;
and step four, acquiring temperature data of the material external field low-temperature test, calculating the length variation of the test piece corresponding to each temperature point according to the equivalent transformation relation from the material internal field to the external field, and fitting to obtain a material external field low-temperature test equivalent curve.
2. The equivalence theory-based material external field low-temperature test response equivalence method according to claim 1, wherein in the first step, the performing material internal field low-temperature test, and the obtaining material internal field low-temperature test data comprises:
performing a material internal field low-temperature tensile resilience test to obtain tensile resilience test data of the material internal field; and/or
And performing a material internal field low-temperature equal-weight tensile test to obtain the equal-weight tensile test data of the material internal field.
3. The equivalence theory-based material outfield low-temperature test response equivalence method according to claim 2, wherein the performing material outfield low-temperature tensile rebound test, and the obtaining of tensile rebound test data of the material outfield comprises:
setting the temperature condition of the material internal field low-temperature environment;
after the test piece is stretched to a preset length, the test piece is placed in a material internal field low-temperature environment and exposed for a preset time until the temperature of the test piece is the same as the environmental temperature;
and loosening the test piece to enable the test piece to rebound automatically, and measuring the natural retraction amount of the test piece in different low-temperature environments.
4. The equivalence theory-based material outfield low-temperature test response equivalence method according to claim 2, wherein the performing material infield low-temperature equal-weight tensile test, and the obtaining of the equal-weight tensile test data of the material infield comprises:
setting the temperature condition of the material internal field low-temperature environment;
placing the test piece in a material internal field low-temperature environment and exposing for a preset time until the temperature of the test piece is the same as the environmental temperature;
and (4) loading weights with the same mass on the test piece, and measuring the loading elongation of the test piece in different low-temperature environments.
5. The equivalence theory-based material outfield low temperature test response equivalence method according to claim 3 or 4, wherein the material outfield low temperature ambient temperature conditions comprise a plurality of temperature points in the range of-40 ℃ to 0 ℃.
6. The equivalence theory-based material external field low-temperature test response equivalence method based on the equivalence theory as claimed in claim 2, wherein in the second step, fitting a test piece length variation curve with temperature according to the material internal field low-temperature test data comprises:
fitting a test piece resilience length variation curve along with the temperature according to the tensile resilience test data; and/or
And fitting a curve of the tensile length of the test piece changing along with the temperature according to the equal-weight tensile test data.
7. The equivalence theory-based material external field low-temperature test response equivalence method according to claim 6, wherein in the fourth step, the obtaining of the temperature data of the material external field low-temperature test, the calculating of the length variation of the test piece corresponding to each temperature point according to the equivalent transformation relation from the material internal field to the external field, and the fitting of the material external field low-temperature test equivalent curve comprises:
the method comprises the steps of obtaining temperature data of a tension rebound test of a material external field, calculating the length variation of a test piece corresponding to each temperature point according to the equivalent transformation relation from the material internal field to the external field, and fitting an equivalent curve of the tension rebound test of the material external field; and/or
The method comprises the steps of obtaining temperature data of the constant-weight tensile test of the material external field, calculating the length variation of a test piece corresponding to each temperature point according to the equivalent transformation relation from the material internal field to the external field, and fitting an equivalent curve of the constant-weight tensile test of the material external field.
8. The equivalence theory-based material outfield low temperature test response equivalence method according to claim 1, characterized by further comprising the steps of,
Performing a material external field low-temperature test to obtain material external field low-temperature test data;
fitting a material external field low-temperature test curve according to the material external field low-temperature test data;
and carrying out goodness-of-fit evaluation on the material external field low-temperature test equivalent curve according to the material external field low-temperature test curve.
9. The equivalence theory-based material field low temperature test response equivalence method according to claim 8, wherein in performing the material field low temperature test, the temperature is measured three times each time, and when the temperature does not fluctuate more than 1 ℃, the average value is taken as the test temperature.
10. The equivalence theory-based material outfield low temperature test response equivalence method according to claim 8, wherein the evaluation of goodness-of-fit of the material outfield low temperature test equivalent curve according to the material outfield low temperature test curve comprises:
R2＝1-SSerr/SStot
wherein SSerrAs residual error, SStotIs a deviation, PiIs a test value corresponding to the length variation of the temperature point,
is PiIs determined by the average value of (a) of (b),
is the equivalent transformation value of the length variation of the corresponding temperature point, and N is the number of the test data points participating in the fitting.
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| CN113928595A (en) * | 2021-12-17 | 2022-01-14 | 中国飞机强度研究所 | Method for tailoring low-temperature test conditions of complete aircraft in laboratory |
| CN114486321A (en) * | 2022-04-18 | 2022-05-13 | 中国飞机强度研究所 | Method for representing similarity of high-temperature environment tests of internal field and external field of airplane test |
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