CN113720702B - Equivalent method for material outfield low-temperature test response based on equivalence theory - Google Patents
Equivalent method for material outfield low-temperature test response based on equivalence theory Download PDFInfo
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- CN113720702B CN113720702B CN202110905192.0A CN202110905192A CN113720702B CN 113720702 B CN113720702 B CN 113720702B CN 202110905192 A CN202110905192 A CN 202110905192A CN 113720702 B CN113720702 B CN 113720702B
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- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
- G01N3/18—Performing tests at high or low temperatures
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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Abstract
The application belongs to the technical field of low-temperature environment tests, and particularly relates to a material outfield low-temperature test response equivalent method based on an equivalence theory. Comprising the following steps: step one, performing a material internal field low-temperature test to obtain material internal field low-temperature test data; fitting a curve of the length variation of the test piece along with the temperature according to the low-temperature test data of the material internal field; step three, obtaining an equivalent transformation relation from an inner field to an outer field of the material; and step four, acquiring temperature data of a material external field low-temperature test, calculating the length variation of the test piece corresponding to each temperature point according to the equivalent transformation relation from the material internal field to the external field, and fitting the equivalent curve of the material external field low-temperature test. The method can obtain the low-temperature steady-state response of the external field better through the transformation of the internal field test data, and has the advantages of simple form and convenient calculation; the device solves the problems of short low-temperature test window period and uncontrollable test temperature in the outfield test, can be used for performance tests of key materials and structures, reduces test cost and reduces test time.
Description
Technical Field
The application belongs to the technical field of low-temperature environment tests, and particularly relates to a material outfield low-temperature test response equivalent method based on an equivalence theory.
Background
The low-temperature environment of the aircraft in the process of ground parking, maintenance and servicing becomes a typical factor causing various accident symptoms and flight accidents, and under the low-temperature environment, the aircraft is easy to have various problems such as icing and icing, poor sealing, lubricating oil hydraulic system faults, electronic equipment faults and the like.
At present, a low-temperature environment test box is used for simulating an actual external field low-temperature test environment to be a common test method of a low-temperature test, but because the external field environment is complex, the internal field environment of the environment test box has a certain difference with the external field environment of the low-temperature environment test, and the external field low-temperature test is required to be obtained by equivalent of the internal field low-temperature test of the environment test box.
It is therefore desirable to have a solution that overcomes or at least alleviates at least one of the above-mentioned drawbacks of the prior art.
Disclosure of Invention
The application aims to provide a material outfield low-temperature test response equivalent method based on an equivalence theory so as to solve at least one problem existing in the prior art.
The technical scheme of the application is as follows:
a material outfield low-temperature test response equivalent method based on an equivalence theory comprises the following steps:
step one, performing a material internal field low-temperature test to obtain material internal field low-temperature test data;
fitting a curve of the length variation of the test piece along with the temperature according to the low-temperature test data of the material internal field;
step three, obtaining an equivalent transformation relation from an inner field to an outer field of the material:
wherein L is 0 For the initial length of the test piece, L 1 For the length variation of the test piece in the outfield test, L 2 For the length change of the test piece in the internal field test, f (T 1 ) At a temperature of T 1 The temperature coefficient of the field rigidity in the material;
and step four, acquiring temperature data of a material external field low-temperature test, calculating the length variation of the test piece corresponding to each temperature point according to the equivalent transformation relation from the material internal field to the external field, and fitting the equivalent curve of the material external field low-temperature test.
In at least one embodiment of the present application, in step one, performing the in-field cryogenic test on the material, obtaining in-field cryogenic test data on the material includes:
carrying out a low-temperature stretching rebound test on the material internal field to obtain stretching rebound test data of the material internal field; and/or
And (5) carrying out a tensile test of the material internal field low Wen Dengchong to obtain the equivalent weight tensile test data of the material internal field.
In at least one embodiment of the present application, the performing a low temperature stretch-rebound test of the internal field of the material, the obtaining stretch-rebound test data of the internal field of the material includes:
setting a low-temperature environment temperature condition of a material internal field;
after the test piece is elongated to a preset length, the test piece is placed in a material internal field low-temperature environment to be exposed for a preset time until the temperature of the test piece is the same as the ambient temperature;
and loosening the test piece to enable the test piece to rebound automatically, and measuring the natural retraction amount of the test piece under different low-temperature environments.
In at least one embodiment of the present application, the performing the in-material field low Wen Dengchong tensile test, obtaining the equivalent weight tensile test data of the in-material field comprises:
setting a low-temperature environment temperature condition of a material internal field;
placing the test piece in a low-temperature environment of a material internal field and exposing for a preset time until the temperature of the test piece is the same as the ambient temperature;
and loading weights with the same mass on the test piece, and measuring the loading elongation of the test piece under different low-temperature environments.
In at least one embodiment of the present application, the in-field low temperature ambient temperature condition of the material comprises a plurality of temperature points in the range of-40 ℃ to 0 ℃.
In at least one embodiment of the present application, in the second step, the fitting a curve of the length variation of the test piece with the temperature variation according to the low-temperature test data of the internal field of the material includes:
fitting a curve of the rebound length of the test piece along with the temperature according to the tensile rebound test data; and/or
And fitting a curve of the tensile length of the test piece along with the temperature according to the equal weight tensile test data.
In at least one embodiment of the present application, in step four, the obtaining temperature data of the low-temperature test of the external field of the material, calculating the length variation of the test piece corresponding to each temperature point according to the equivalent transformation relationship from the internal field to the external field of the material, and fitting the equivalent curve of the low-temperature test of the external field of the material includes:
the temperature data of the stretching rebound test of the material external field is obtained, the length variation of the test piece corresponding to each temperature point is calculated according to the equivalent transformation relation from the material internal field to the external field, and the equivalent curve of the stretching rebound test of the material external field is fitted; and/or
And acquiring temperature data of the equal-weight tensile test of the material external field, calculating the length variation of the test piece corresponding to each temperature point according to the equivalent transformation relation from the material internal field to the external field, and fitting an equal-weight tensile test equivalent curve of the material external field.
In at least one embodiment of the present application, further comprising a step five,
Carrying out a material outfield low-temperature test to obtain material outfield low-temperature test data;
fitting a material outfield low-temperature test curve according to the material outfield low-temperature test data;
and carrying out fitting goodness evaluation on the material outfield low-temperature test equivalent curve according to the material outfield low-temperature test curve.
In at least one embodiment of the present application, in conducting a material outfield low temperature test, the temperature is measured three times at a time, and when the temperature does not float more than 1 ℃, the average value is taken as the test temperature.
In at least one embodiment of the present application, the performing the goodness-of-fit evaluation on the material outfield cryogenic test equivalent curve according to the material outfield cryogenic test curve includes:
R 2 ＝1-SS err /SS tot
wherein the SS err As residual, SS tot For deviation, P i For the test value of the length variation corresponding to the temperature point,is P i Average value of>And N is the number of test data points participating in fitting, wherein N is an equivalent transformation value of the length variation of the corresponding temperature point.
The invention has at least the following beneficial technical effects:
the equivalent method for the material outfield low-temperature test response based on the equivalence theory can better obtain outfield low-temperature steady-state response through the transformation of the infield test data, and has the advantages of simple form and convenient calculation; the device solves the problems of short low-temperature test window period and uncontrollable test temperature in the outfield test, can be used for performance tests of key materials and structures, reduces test cost and reduces test time.
Drawings
FIG. 1 is a fitted curve of a field stretch rebound test in a material according to one embodiment of the present application;
FIG. 2 is a fitted curve of a material external field tensile rebound test according to one embodiment of the present application;
fig. 3 is a schematic diagram of the internal and external field transitions of a tensile rebound test of a material according to one embodiment of the present application.
Detailed Description
In order to make the purposes, technical solutions and advantages of the implementation of the present application more clear, the technical solutions in the embodiments of the present application will be described in more detail below with reference to the accompanying drawings in the embodiments of the present application. In the drawings, the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The described embodiments are some, but not all, of the embodiments of the present application. The embodiments described below by referring to the drawings are exemplary and intended for the purpose of explaining the present application and are not to be construed as limiting the present application. All other embodiments, which can be made by one of ordinary skill in the art based on the embodiments herein without making any inventive effort, are intended to be within the scope of the present application. Embodiments of the present application are described in detail below with reference to the accompanying drawings.
In the description of the present application, it should be understood that the terms "center," "longitudinal," "lateral," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like indicate orientations or positional relationships based on the orientations or positional relationships illustrated in the drawings, merely to facilitate description of the present application and simplify the description, and do not indicate or imply that the device or element being referred to must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the scope of protection of the present application.
The present application is described in further detail below in conjunction with fig. 1-3.
The application provides a material outfield low-temperature test response equivalent method based on an equivalence theory, which comprises the following steps:
step one, performing a material internal field low-temperature test to obtain material internal field low-temperature test data;
fitting a curve of the length variation of the test piece along with the temperature according to the low-temperature test data of the material internal field;
step three, obtaining an equivalent transformation relation from an inner field to an outer field of the material:
wherein L is 0 For the initial length of the test piece, L 1 For the length variation of the test piece in the outfield test, L 2 For the length change of the test piece in the internal field test, f (T 1 ) At a temperature of T 1 The temperature coefficient of the field rigidity in the material;
and step four, acquiring temperature data of a material external field low-temperature test, calculating the length variation of the test piece corresponding to each temperature point according to the equivalent transformation relation from the material internal field to the external field, and fitting the equivalent curve of the material external field low-temperature test.
According to the equivalent method for response of the material external field low-temperature test based on the equivalence theory, the material internal field low-temperature test comprises the steps of carrying out a material internal field low-temperature tensile rebound test and carrying out a material internal field low Wen Dengchong tensile test.
In one embodiment of the present application, performing a material internal field low temperature tensile spring-back test, obtaining tensile spring-back test data for the material internal field includes:
setting a low-temperature environment temperature condition of a material internal field;
after the test piece is elongated to a preset length, the test piece is placed in a material internal field low-temperature environment to be exposed for a preset time until the temperature of the test piece is the same as the ambient temperature;
and loosening the test piece to enable the test piece to rebound automatically, and measuring the natural retraction amount of the test piece under different low-temperature environments.
In another embodiment of the present application, performing a material in-field low Wen Dengchong tensile test, obtaining equivalent weight tensile test data for the material in-field comprises:
setting a low-temperature environment temperature condition of a material internal field;
placing the test piece in a low-temperature environment of a material internal field and exposing for a preset time until the temperature of the test piece is the same as the ambient temperature;
and loading weights with the same mass on the test piece, and measuring the loading elongation of the test piece under different low-temperature environments.
In a preferred embodiment of the present application, wherein the in-material field low temperature ambient temperature conditions comprise mainly a plurality of temperature points in the range of-40 ℃ to 0 ℃.
According to the material outfield low-temperature test response equivalent method based on the equivalence theory, a proper fitting method and a fitting curve are selected according to different test data, and relevant fitting is carried out on scattered point data obtained through experiments, so that a curve of rebound length of a test piece along with temperature change and a curve of tensile length of the test piece along with temperature change can be respectively fitted.
The equivalent method of the material outfield low-temperature test response based on the equivalence theory of the application assumes that the material is subjected to normal temperature T in an equal weight tensile test 0 The original length of the lower test piece is L 0 At a temperature T 1 At the time of the external field test, the tensile length is L 1 At this time, the external field equivalent rigidity of the material is K out (T 1 ) A tensile length of L in the internal field test 2 And L is 1 ≠L 2 The internal field equivalent rigidity of the material is K in (T 1 ) And has K out (T 1 )＝K in (T 1 )+ΔK(T 1 )，K in (T 1 )＝f(T 1 )K in (T 0 )，f(T 1 ) At a temperature of T 1 The temperature coefficient of the internal field rigidity of the material is T 2 ＝T 1 At +DeltaT, the internal field test elongation is L 1 Is obtained by theoretical derivation, then the temperature T 1 The following outfield test lengths are:
the fitting curve of the internal field test data can be transformed by an internal and external field length equivalent transformation formula.
Based on the material internal field low temperature test, the temperature point of the material external field low temperature test is collected and brought into mathematical derivation, so that the material external field low temperature test equivalent curve can be obtained.
In the preferred embodiment of the application, the length variation of a test piece corresponding to each temperature point is calculated according to the equivalent transformation relation from the material internal field to the external field by acquiring the temperature data of the stretching rebound test of the material external field, and the stretching rebound test equivalent curve of the material external field is fitted; and calculating the length variation of the test piece corresponding to each temperature point according to the equivalent transformation relation from the material internal field to the external field by acquiring temperature data of the equal-weight tensile test of the material external field, and fitting an equal-weight tensile test equivalent curve of the material external field.
Advantageously, in a preferred embodiment of the present application, the method further comprises a step five of performing a material outfield low temperature test to obtain material outfield low temperature test data;
fitting a material external field low-temperature test curve according to the material external field low-temperature test data;
and carrying out fitting goodness evaluation on the equivalent curve of the material outfield low-temperature test according to the material outfield low-temperature test curve.
In one embodiment of the present application, a low temperature environmental test chamber is used in performing in-field low temperature tests on materials. The resulting material internal field low temperature test curve was fitted as shown in figure 1. And (3) testing a test piece of a certain material in an external field environment of-40 ℃ to 0 ℃, and uniformly preprocessing the test piece before starting the test. In consideration of the unstable external temperature in the external field test, in the material external field low temperature test, the temperature is measured three times each time, when the temperature is not more than 1 ℃, the average value is taken as the test temperature, and the material external field low temperature test curve is fitted as shown in figure 2.
To represent the accuracy of the fitting results and experimental data, R is selected 2 And (5) checking and evaluating the fitting error of the fitting model. The expression is as follows:
R 2 ＝1-SS err /SS tot
wherein the SS err As residual, SS tot For deviation, P i For the test value of the length variation corresponding to the temperature point,is P i Average value of>And N is the number of test data points participating in fitting, wherein N is an equivalent transformation value of the length variation of the corresponding temperature point.
Performing goodness-of-fit evaluation on the transformed internal field fitting curve and the corresponding external field curve, and R 2 The larger the fitting goodness is, the higher the error isThe smaller. In this embodiment, as shown in FIG. 3, the goodness is 0.999 or more.
The equivalent method for the material outfield low-temperature test response based on the equivalence theory can better obtain outfield low-temperature steady-state response through the transformation of the infield test data, and has the advantages of simple form and convenient calculation; the device solves the problems of short low-temperature test window period and uncontrollable test temperature in the outfield test, can be used for performance tests of key materials and structures, reduces test cost and reduces test time.
The foregoing is merely specific embodiments of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions easily conceivable by those skilled in the art within the technical scope of the present application should be covered in the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. The equivalence method of the material outfield low-temperature test response based on the equivalence theory is characterized by comprising the following steps:
step one, performing a material internal field low-temperature test to obtain material internal field low-temperature test data;
fitting a curve of the length variation of the test piece along with the temperature according to the low-temperature test data of the material internal field;
step three, obtaining an equivalent transformation relation from an inner field to an outer field of the material:
wherein L is 0 For the initial length of the test piece, L 1 For the length variation of the test piece in the outfield test, L 2 For the length change of the test piece in the internal field test, f (T 1 ) At a temperature of T 1 The temperature coefficient of the field rigidity in the material;
and step four, acquiring temperature data of a material external field low-temperature test, calculating the length variation of the test piece corresponding to each temperature point according to the equivalent transformation relation from the material internal field to the external field, and fitting the equivalent curve of the material external field low-temperature test.
2. The equivalence theory-based material external field low temperature test response equivalence method according to claim 1, wherein in the first step, performing the material internal field low temperature test to obtain material internal field low temperature test data comprises:
carrying out a low-temperature stretching rebound test on the material internal field to obtain stretching rebound test data of the material internal field; and/or
And (5) carrying out a tensile test of the material internal field low Wen Dengchong to obtain the equivalent weight tensile test data of the material internal field.
3. The equivalence theory-based material external field low-temperature test response equivalence method according to claim 2, wherein the performing the material internal field low-temperature tensile rebound test to obtain tensile rebound test data of the material internal field comprises:
setting a low-temperature environment temperature condition of a material internal field;
after the test piece is elongated to a preset length, the test piece is placed in a material internal field low-temperature environment to be exposed for a preset time until the temperature of the test piece is the same as the ambient temperature;
and loosening the test piece to enable the test piece to rebound automatically, and measuring the natural retraction amount of the test piece under different low-temperature environments.
4. The equivalence theory-based material external field low temperature test response equivalence method according to claim 2, wherein the performing the material internal field low Wen Dengchong tensile test, obtaining the equivalent weight tensile test data of the material internal field comprises:
setting a low-temperature environment temperature condition of a material internal field;
placing the test piece in a low-temperature environment of a material internal field and exposing for a preset time until the temperature of the test piece is the same as the ambient temperature;
and loading weights with the same mass on the test piece, and measuring the loading elongation of the test piece under different low-temperature environments.
5. The equivalence theory-based material outfield low temperature test response equivalence method according to claim 3 or 4, wherein the material infield low temperature ambient temperature condition comprises a plurality of temperature points in a range of-40 ℃ to 0 ℃.
6. The equivalence theory-based material external field low-temperature test response equivalence method according to claim 2, wherein in the second step, the fitting the test piece length variation amount along with the temperature variation curve according to the material internal field low-temperature test data comprises:
fitting a curve of the rebound length of the test piece along with the temperature according to the tensile rebound test data; and/or
And fitting a curve of the tensile length of the test piece along with the temperature according to the equal weight tensile test data.
7. The method for equivalent response of a material external field low temperature test based on the equivalence theory according to claim 6, wherein in the fourth step, the obtaining of the temperature data of the material external field low temperature test, calculating the length variation of the test piece corresponding to each temperature point according to the equivalent transformation relation from the material internal field to the external field, and fitting the material external field low temperature test equivalent curve comprises:
the temperature data of the stretching rebound test of the material external field is obtained, the length variation of the test piece corresponding to each temperature point is calculated according to the equivalent transformation relation from the material internal field to the external field, and the equivalent curve of the stretching rebound test of the material external field is fitted; and/or
And acquiring temperature data of the equal-weight tensile test of the material external field, calculating the length variation of the test piece corresponding to each temperature point according to the equivalent transformation relation from the material internal field to the external field, and fitting an equal-weight tensile test equivalent curve of the material external field.
8. The equivalence theory-based material outfield low-temperature test response equivalence method according to claim 1, further comprising the steps of,
Carrying out a material outfield low-temperature test to obtain material outfield low-temperature test data;
fitting a material outfield low-temperature test curve according to the material outfield low-temperature test data;
and carrying out fitting goodness evaluation on the material outfield low-temperature test equivalent curve according to the material outfield low-temperature test curve.
9. The equivalence theory-based material outfield low temperature test response equivalence method according to claim 8, wherein in the material outfield low temperature test, the temperature is measured three times each time, and when the temperature does not float more than 1 ℃, the average value is taken as the test temperature.
10. The equivalence theory-based material outfield low temperature test response equivalence method according to claim 8, wherein the fitting goodness-of-fit evaluation of the material outfield low temperature test equivalence curve according to the material outfield low temperature test curve comprises:
R 2 ＝1-SS err /SS tot
wherein the SS err As residual, SS tot For deviation, P i For the test value of the length variation corresponding to the temperature point,is P i Average value of>For equivalent transformation value of length variation of corresponding temperature point, N is test data point participating in fittingNumber of parts.
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| CN113928595B (en) * | 2021-12-17 | 2022-03-08 | 中国飞机强度研究所 | Method for tailoring low-temperature test conditions of complete aircraft in laboratory |
| CN113933086B (en) * | 2021-12-17 | 2022-02-22 | 中国飞机强度研究所 | Method for optimizing cutting condition of low-temperature environment test of complete airplane in laboratory |
| CN114815935B (en) * | 2022-04-11 | 2023-10-13 | 中国兵器装备集团西南技术工程研究所 | Environment test condition cutting method and environment test control system |
| CN114486321B (en) * | 2022-04-18 | 2022-06-24 | 中国飞机强度研究所 | Similarity characterization method for high-temperature environment test of inner field and outer field of airplane test |
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| CN113720702A (en) | 2021-11-30 |
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