CN113720466B

CN113720466B - Infrared detector based on CMOS (complementary Metal oxide semiconductor) process

Info

Publication number: CN113720466B
Application number: CN202110324025.7A
Authority: CN
Inventors: 翟光杰; 武佩; 潘辉; 翟光强
Original assignee: Beijing North Gaoye Technology Co ltd
Current assignee: Beijing North Gaoye Technology Co ltd
Priority date: 2021-03-26
Filing date: 2021-03-26
Publication date: 2022-10-11
Anticipated expiration: 2041-03-26
Also published as: CN113720466A

Abstract

The utility model relates to an infrared detector based on CMOS technology, in which, both the CMOS measuring circuit system and the CMOS infrared sensing structure are prepared by CMOS technology, and the CMOS infrared sensing structure is directly prepared above the CMOS measuring circuit system; the CMOS manufacturing process of the CMOS infrared sensing structure comprises a metal interconnection process, a through hole process and an RDL (remote data link) process, wherein the CMOS infrared sensing structure comprises at least two metal interconnection layers, at least two dielectric layers and a plurality of interconnection through holes, the dielectric layers at least comprise a sacrificial layer and a heat-sensitive dielectric layer, and the heat-sensitive dielectric layer comprises a thermosensitive material with the resistance temperature coefficient larger than a set value; the CMOS infrared sensing structure comprises a resonant cavity formed by a reflecting layer and a heat sensitive medium layer, a suspended microbridge structure for controlling heat transfer and a columnar structure with electric connection and support functions. Through the technical scheme, the problems of low performance, low pixel scale, low yield and the like of the traditional MEMS process infrared detector are solved, and the performance of the infrared detector is optimized.

Description

Infrared detector based on CMOS (complementary Metal oxide semiconductor) process

Technical Field

The present disclosure relates to the field of infrared detection technologies, and in particular, to an infrared detector based on a CMOS process.

Background

The fields of monitoring markets, vehicle and auxiliary markets, home markets, intelligent manufacturing markets, mobile phone applications and the like have strong demands on uncooled high-performance chips, certain requirements are provided for the performance of the chips, the performance consistency and the product price, the potential demands of more than one hundred million chips are expected every year, and the current process scheme and architecture cannot meet the market demands.

At present, an infrared detector adopts a mode of combining a measuring circuit and an infrared sensing structure, the measuring circuit is prepared by adopting a Complementary Metal-Oxide-Semiconductor (CMOS) process, and the infrared sensing structure is prepared by adopting a Micro-Electro-Mechanical System (MEMS) process, so that the following problems are caused:

(1) The infrared sensing structure is prepared by adopting an MEMS (micro-electromechanical systems) process, polyimide is used as a sacrificial layer, and the infrared sensing structure is incompatible with a CMOS (complementary metal oxide semiconductor) process.

(2) Polyimide is used as a sacrificial layer, so that the problem that the vacuum degree of a detector chip is influenced due to incomplete release exists, the growth temperature of a subsequent film is limited, and the selection of materials is not facilitated.

(3) Polyimide can cause the height of the resonant cavity to be inconsistent, and the working dominant wavelength is difficult to guarantee.

(4) The control of the MEMS process is far worse than that of the CMOS process, and the performance consistency and the detection performance of the chip are restricted.

(5) MEMS has low productivity, low yield and high cost, and can not realize large-scale batch production.

(6) The existing process capability of the MEMS is not enough to support the preparation of a detector with higher performance, and the MEMS has smaller line width and thinner film thickness, thereby being not beneficial to realizing the miniaturization of a chip.

Disclosure of Invention

In order to solve the above technical problem or at least partially solve the above technical problem, the present disclosure provides an infrared detector based on a CMOS process, which optimizes the performance of the infrared detector due to the problems of low performance, low pixel scale, low yield, etc. of the conventional MEMS process infrared detector.

The present disclosure provides an infrared detector based on a CMOS process, including:

the CMOS infrared sensing structure comprises a CMOS measuring circuit system and a CMOS infrared sensing structure, wherein the CMOS measuring circuit system and the CMOS infrared sensing structure are both prepared by using a CMOS process, and the CMOS infrared sensing structure is directly prepared on the CMOS measuring circuit system;

the CMOS measurement circuit system comprises at least one layer of closed release isolation layer above the CMOS measurement circuit system, wherein the closed release isolation layer is used for protecting the CMOS measurement circuit system from being influenced by a process in the etching process of manufacturing the CMOS infrared sensing structure;

the CMOS manufacturing process of the CMOS infrared sensing structure comprises a metal interconnection process, a through hole process and an RDL process, wherein the CMOS infrared sensing structure comprises at least two metal interconnection layers, at least two dielectric layers and a plurality of interconnection through holes, the two dielectric layers at least comprise a sacrificial layer and a heat-sensitive dielectric layer, and the two metal interconnection layers at least comprise a reflecting layer and an electrode layer; the thermal sensitive medium layer is used for converting temperature change corresponding to infrared radiation absorbed by the thermal sensitive medium layer into resistance change, and further converting an infrared target signal into a signal capable of realizing electric reading through the CMOS measuring circuit system;

the CMOS infrared sensing structure comprises a resonant cavity formed by the reflecting layer and the heat sensitive medium layer, a suspended microbridge structure for controlling heat transfer and a columnar structure with electric connection and support functions, and the CMOS measuring circuit system is used for measuring and processing array resistance values formed by one or more CMOS infrared sensing structures and converting infrared signals into image electric signals;

the reflecting layer comprises at least one metal layer, the reflecting layer comprises a reflecting plate and a supporting base, the CMOS infrared sensing structure comprises an absorption plate, the reflecting plate is used for reflecting the infrared signals transmitted by the absorption plate back to the absorption plate, and the supporting base is used for connecting the columnar structure and the CMOS measuring circuit system so as to transmit the infrared signals to the CMOS measuring circuit system;

the CMOS measuring circuit system comprises a bias voltage generating circuit, a column-level analog front-end circuit and a row-level circuit, wherein the input end of the bias voltage generating circuit is connected with the output end of the row-level circuit, the input end of the column-level analog front-end circuit is connected with the output end of the bias voltage generating circuit, the row-level circuit comprises row-level mirror image pixels and row selection switches, and the column-level analog front-end circuit comprises blind pixels; the row-level circuit is distributed in each pixel, selects a signal to be processed according to a row strobe signal of the time sequence generating circuit, and outputs a current signal to the column-level analog front-end circuit under the action of the bias voltage generating circuit so as to perform current-voltage conversion and output;

the column-level analog front-end circuit obtains two paths of currents according to the first bias voltage and the second bias voltage, performs transimpedance amplification on the difference between the two paths of generated currents and outputs the amplified current as an output voltage.

Optionally, the reflector is any one metal interconnection layer of the CMOS measurement circuitry or the reflector is a metal interconnection layer above a top metal layer of the CMOS measurement circuitry;

the CMOS measuring circuit system comprises a plurality of metal interconnection layers, and a dielectric layer is arranged between every two adjacent metal interconnection layers.

Optionally, the reflection plate is completely electrically insulated from the CMOS measurement circuitry and the support base, or the reflection plate is electrically connected to a corresponding ground terminal of the CMOS measurement circuitry or the support base.

Optionally, the supporting base is a top metal of the CMOS measurement circuit system, or the supporting base is a metal interconnection layer that is prepared by preparing a dielectric layer on the top metal by using the RDL process and is prepared on the dielectric layer, and the metal interconnection layer corresponding to the supporting base and the top metal are electrically connected by using a tungsten plug process.

Optionally, the CMOS infrared sensing structure is fabricated on an upper layer or a same layer of a metal interconnection layer of the CMOS measurement circuitry.

Optionally, the sacrificial layer is used for enabling the CMOS infrared sensing structure to form a hollow structure, the material forming the sacrificial layer is silicon oxide, and the sacrificial layer is etched by using a post-CMOS process.

Optionally, the post-CMOS process etches the sacrificial layer using at least one of gas phase hydrogen fluoride, carbon tetrafluoride, and trifluoromethane.

Optionally, the hermetic release isolation layer is located at an interface between the CMOS measurement circuitry and the CMOS infrared sensing structure and/or in the CMOS infrared sensing structure, and the hermetic release isolation layer is used to protect the CMOS measurement circuitry from corrosion when a sacrificial layer is released by a corrosion process;

the CMOS technology corrosion-resistant material adopted by the closed release isolation layer comprises at least one of silicon, germanium, silicon-germanium alloy, amorphous silicon, amorphous germanium, amorphous silicon-germanium, amorphous carbon, silicon carbide, aluminum oxide, silicon nitride or silicon carbonitride.

Optionally, the CMOS infrared sensing structure includes a beam structure, the reflective layer, and the pillar structure;

the absorption plate is used for absorbing the infrared target signal and converting the infrared target signal into an electric signal, the absorption plate comprises a metal interconnection layer and at least one layer of the thermal sensitive medium layer, and the material forming the thermal sensitive medium layer comprises at least one of amorphous silicon, amorphous germanium-silicon, titanium oxide, vanadium oxide or titanium vanadium oxide;

the beam structure and the columnar structure are used for transmitting the electric signals and supporting and connecting the absorption plate, the beam structure comprises a metal interconnection layer and at least one dielectric layer, and the columnar structure is connected with the beam structure and the CMOS measurement circuit system by adopting the metal interconnection process and the through hole process;

the reflecting plate is used for reflecting infrared signals and forms the resonant cavity with the heat sensitive medium layer.

Optionally, at least two ends of the beam structure and the absorption plate are electrically connected, the CMOS infrared sensing structure includes at least two of the pillar structures and at least two of the supporting bases, and the electrode layer includes at least two electrode terminals.

Optionally, the infrared detector is based on a 3nm, 7nm, 10nm, 14nm, 22nm, 28nm, 32nm, 45nm, 65nm, 90nm, 130nm, 150nm, 180nm, 250nm, or 350nm CMOS process.

Optionally, the metal wire material constituting the metal interconnection layer includes at least one of aluminum, copper, tungsten, titanium, nickel, chromium, platinum, silver, ruthenium, or cobalt.

Compared with the prior art, the technical scheme provided by the embodiment of the disclosure has the following advantages:

the CMOS measurement circuit system and the CMOS infrared sensing structure are integrally prepared on the CMOS production line by utilizing the CMOS process, compared with the MEMS process, the CMOS does not have the process compatibility problem, the technical difficulty of the MEMS process is solved, the transportation cost can be reduced by adopting the CMOS process production line process to prepare the infrared detector, and the risk caused by the transportation problem and the like is reduced; the infrared detector takes silicon oxide as a sacrificial layer, the silicon oxide is completely compatible with a CMOS (complementary metal oxide semiconductor) process, the preparation process is simple and easy to control, the CMOS process does not have the problem that the vacuum degree of a detector chip is influenced due to incomplete release of polyimide of the sacrificial layer, the subsequent film growth temperature is not limited by a sacrificial layer material, the multilayer process design of the sacrificial layer can be realized, the process is not limited by the process, the planarization can be easily realized by using the sacrificial layer, and the process difficulty and possible risks are reduced; the infrared detector prepared by the integrated CMOS process can realize the aims of high yield, low cost, high yield and large-scale integrated production of chips, and provides a wider application market for the infrared detector; the infrared detector based on the CMOS process can realize smaller size and thinner film thickness of a characteristic structure, so that the infrared detector has larger duty ratio, lower thermal conductivity and smaller thermal capacity, and the infrared detector has higher detection sensitivity, longer detection distance and better detection performance; the infrared detector based on the CMOS process can make the pixel size of the detector smaller, realize smaller chip area under the same array pixel, and is more beneficial to realizing the miniaturization of a chip; the infrared detector based on the CMOS process has the advantages of mature process production line, higher process control precision, better meeting design requirements, better product consistency, more contribution to circuit chip adjustment performance and more contribution to industrialized mass production.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and together with the description, serve to explain the principles of the disclosure.

In order to more clearly illustrate the embodiments or technical solutions in the prior art of the present disclosure, the drawings used in the description of the embodiments or prior art will be briefly described below, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without inventive exercise.

Fig. 1 is a schematic perspective view of an infrared detector according to an embodiment of the present disclosure;

fig. 2 is a schematic cross-sectional structural view of an infrared detector provided in an embodiment of the present disclosure;

fig. 3 is a schematic cross-sectional view of another infrared detector provided in the embodiments of the present disclosure;

fig. 4 is a schematic cross-sectional view of another infrared detector provided in the embodiments of the present disclosure;

fig. 5 is a schematic structural diagram of a CMOS measurement circuitry provided in an embodiment of the present disclosure;

fig. 6 is a schematic cross-sectional structural view of another infrared detector provided in the embodiment of the present disclosure;

fig. 7 is a schematic perspective view of another infrared detector provided in the embodiment of the present disclosure;

fig. 8 is a schematic perspective view of another infrared detector provided in an embodiment of the present disclosure.

Detailed Description

In order that the above objects, features and advantages of the present disclosure may be more clearly understood, aspects of the present disclosure will be further described below. It should be noted that the embodiments and features of the embodiments of the present disclosure may be combined with each other without conflict.

In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present disclosure, but the present disclosure may be practiced in other ways than those described herein; it is to be understood that the embodiments disclosed in the specification are only a few embodiments of the present disclosure, and not all embodiments.

Fig. 1 is a schematic perspective structure diagram of an infrared detector provided in an embodiment of the present disclosure, and fig. 2 is a schematic cross-sectional structure diagram of an infrared detector provided in an embodiment of the present disclosure. With reference to fig. 1 and 2, the CMOS process-based infrared detector includes a CMOS measurement circuit system 1 and a CMOS infrared sensing structure 2, both the CMOS measurement circuit system 1 and the CMOS infrared sensing structure 2 are fabricated using a CMOS process, and the CMOS infrared sensing structure 2 is directly fabricated on the CMOS measurement circuit system 1.

Specifically, the CMOS infrared sensing structure 2 is used for converting an external infrared signal into an electric signal and transmitting the electric signal to the CMOS measuring circuit system 1, and the CMOS measuring circuit system 1 reflects temperature information of a corresponding infrared signal according to the received electric signal, so that the temperature detection function of the infrared detector is realized. The CMOS measuring circuit system 1 and the CMOS infrared sensing structure 2 are both prepared by using a CMOS process, and the CMOS infrared sensing structure 2 is directly prepared on the CMOS measuring circuit system 1, namely, the CMOS measuring circuit system 1 is prepared by using the CMOS process, and then the CMOS infrared sensing structure 2 is continuously prepared by using the CMOS process by using the CMOS production line and parameters of various processes compatible with the production line.

Therefore, the CMOS measurement circuit system 1 and the CMOS infrared sensing structure 2 are integrally prepared on the CMOS production line by utilizing the CMOS process, compared with the MEMS process, the CMOS process does not have the process compatibility problem, the technical difficulty of the MEMS process is solved, the transportation cost can be reduced by adopting the CMOS production line process to prepare the infrared detector, and the risk caused by the transportation problem and the like is reduced; the infrared detector takes silicon oxide as a sacrificial layer, the silicon oxide is completely compatible with a CMOS (complementary metal oxide semiconductor) process, the preparation process is simple and easy to control, the CMOS process does not have the problem that the vacuum degree of a detector chip is influenced due to incomplete release of polyimide of the sacrificial layer, the subsequent film growth temperature is not limited by a sacrificial layer material, the multilayer process design of the sacrificial layer can be realized, the process is not limited by the process, the planarization can be easily realized by using the sacrificial layer, and the process difficulty and possible risks are reduced; the infrared detector prepared by the integrated CMOS process can realize the aims of high yield, low cost, high yield and large-scale integrated production of chips, and provides a wider application market for the infrared detector; the infrared detector based on the CMOS process can realize smaller size and thinner film thickness of a characteristic structure, so that the infrared detector has larger duty ratio, lower thermal conductivity and smaller thermal capacity, and the infrared detector has higher detection sensitivity, longer detection distance and better detection performance; the infrared detector based on the CMOS process can make the pixel size of the detector smaller, realize smaller chip area under the same array pixel, and is more beneficial to realizing the miniaturization of a chip; the infrared detector based on the CMOS process has the advantages of mature process production line, higher process control precision, better design requirement achievement, better product consistency, better circuit piece adjustment performance and better industrial batch production.

Referring to fig. 1 and 2, the CMOS infrared sensing structure 2 includes a reflective layer 4, an infrared conversion structure 40, and a plurality of pillar structures 6 on the CMOS measurement circuitry 1, the pillar structures 6 are located between the reflective layer 4 and the infrared conversion structure 40, the reflective layer 4 includes a reflective plate 41 and a supporting base 42, and the infrared conversion structure 40 is electrically connected to the CMOS measurement circuitry 1 through the pillar structures 6 and the supporting base 42.

Specifically, the columnar structure 6 is located between the reflective layer 4 and the infrared conversion structure 40 and used for supporting the infrared conversion structure 40 after a sacrificial layer on the CMOS measurement circuit system 1 is released, the sacrificial layer is located between the reflective layer and the infrared conversion structure 40, the columnar structure 6 is a metal structure, an electrical signal converted by the infrared conversion structure 40 through an infrared signal is transmitted to the CMOS measurement circuit system 1 through the corresponding columnar structure 6 and the corresponding supporting base 42, the CMOS measurement circuit system 1 processes the electrical signal to reflect temperature information, and non-contact infrared temperature detection of the infrared detector is achieved. The CMOS infrared sensing structure 2 outputs positive electrical signals and ground electrical signals through different electrode structures, and the positive electrical signals and the ground electrical signals are transmitted to a supporting base 32 electrically connected with the columnar structures 6 through different columnar structures 6, and fig. 1 and 2 schematically show that the direction is parallel to the CMOS measuring circuit system 1, and the CMOS infrared sensing structure 2 includes two columnar structures 6, one of the columnar structures 6 may be configured to transmit positive electrical signals, and the other columnar structure 6 may be configured to transmit ground electrical signals, and the CMOS infrared sensing structure 2 may also include four columnar structures 6, and two of the columnar structures 6 are configured to transmit positive electrical signals and ground electrical signals as a group.

In addition, the reflective layer 4 includes at least one metal layer, the reflective layer 4 exemplarily shown in fig. 1 and 2 includes one metal layer, the reflective layer 4 includes a reflective plate 41 and a supporting base 42, the CMOS infrared sensing structure 2 includes an absorption plate 10, a portion of the reflective layer 4 serves as a dielectric for electrically connecting the pillar structure 6 with the CMOS measurement circuitry 1, i.e., the supporting base 42 serves to connect the pillar structure 6 and the CMOS measurement circuitry 1 to transmit an electrical signal to the CMOS measurement circuitry 1, the reflective plate 41 serves to reflect an infrared signal transmitted by the absorption plate 10 back to the absorption plate 10, i.e., the reflective plate 41 serves to reflect infrared rays to the infrared conversion structure 40, and a resonant cavity formed between the reflective layer 4 and the infrared conversion structure 40 is matched to achieve secondary absorption of infrared rays, so as to improve an infrared absorption rate of the infrared detector and optimize an infrared detection performance of the infrared detector.

Illustratively, with reference to fig. 1 and fig. 2, the reflective plate 41 is any one metal interconnection layer of the CMOS measurement circuit system 1, for example, the reflective plate 41 may be a top metal interconnection layer of the CMOS measurement circuit system 1, and the reflective plate 41 may also be disposed as a metal interconnection layer on a top metal in the CMOS measurement circuit system 1, that is, the reflective plate 41 and the supporting base 42 are formed above the top metal in the CMOS measurement circuit system 1 by using the metal interconnection layer above the top metal, so that a separate preparation process of the reflective layer 4 may be omitted, which is beneficial to simplifying a preparation process of the infrared detector. Illustratively, the thickness of the reflective layer 4 may be set to 1000A or more. In addition, the CMOS measurement circuit system 1 may be configured to include multiple metal interconnection layers, a dielectric layer is disposed between adjacent metal interconnection layers to be compatible with a CMOS process, and the multiple metal interconnection layers in the CMOS measurement circuit system 1 and the dielectric layer between adjacent metal interconnection layers may form, for example, a transistor, a connection line, and other structures in the CMOS measurement circuit system 1, so as to implement a circuit connection structure in the CMOS measurement circuit system 1.

Referring to fig. 1 and 2, the infrared conversion structure includes an absorption plate 10 and a plurality of beam structures 11, the absorption plate 10 is used for converting an infrared signal into an electrical signal and is electrically connected to the corresponding pillar structures 6 through the corresponding beam structures 11, and illustratively, the absorption plate 10 and the beam structures 11 may each include a thermosensitive layer 12, and a material constituting the thermosensitive layer 12 includes at least one of amorphous silicon, amorphous carbon, amorphous germanium, amorphous silicon germanium, titanium oxide, vanadium oxide, or titanium vanadium oxide. Specifically, the absorption plate 10 is used for converting an infrared signal into an electrical signal and electrically connecting the electrical signal with the corresponding columnar structure 6 through the corresponding beam structure 11, the absorption plate 10 includes a support layer 13, an electrode layer 14, a thermal sensitive layer 12 and a passivation layer 15, the beam structure 11 may also include the support layer 13, the electrode layer 14 and the passivation layer 15, the beam structure 11 may further include the thermal sensitive layer 12, the support layer 13 is located on one side of the passivation layer 15 close to the CMOS measurement circuit system 1, the electrode layer 14 and the thermal sensitive layer 12 are located between the support layer 13 and the passivation layer 15, the passivation layer 15 covers the passivation layer 15 of the electrode layer 14, the beam structure 11 may further include the thermal sensitive layer 12, the thermal sensitive layer 12 covers the beam structure 11, and the thermal conductivity of the beam structure 11 is reduced by using the characteristic of small thermal conductivity of a thermal sensitive material such as amorphous silicon, amorphous germanium or amorphous silicon germanium, and the thermal sensitive layer 12 may serve as a support material of the beam structure 11 instead of the support layer 13 or as an electrode protection material of the beam structure 11 instead of the passivation layer 15.

Specifically, the supporting layer 13 is configured to support an upper film layer in the infrared conversion structure 40 after the sacrificial layer is released, the thermosensitive layer 12 is configured to convert an infrared temperature detection signal into an infrared detection electrical signal, the electrode layer 14 is configured to transmit the infrared detection electrical signal converted by the thermosensitive layer 12 to the CMOS measurement circuit system 1 through the beam structures 11 on the left and right sides, the two beam structures 11 transmit positive and negative signals of the infrared detection electrical signal respectively, a readout circuit in the CMOS measurement circuit system 1 implements non-contact infrared temperature detection through analysis of the acquired infrared detection electrical signal, and the passivation layer 15 is configured to protect the electrode layer 14 from oxidation or corrosion. The thermosensitive layer 12 may be located above the electrode layer 14, or may be located below the electrode layer 14. The absorption plate 10 can be arranged correspondingly, the thermosensitive layer 12 and the electrode layer 14 are located in a closed space formed by the supporting layer 13 and the passivation layer 15, so that the thermosensitive layer 12 and the electrode layer 14 in the absorption plate 10 can be protected, and the electrode layer 14 is located in a closed space formed by the supporting layer 13 and the passivation layer 15 correspondingly to the beam structure 11, so that the electrode layer 14 in the beam structure 11 can be protected.

For example, the material constituting the thermosensitive layer 12 may include at least one of amorphous silicon, amorphous germanium, amorphous silicon germanium, titanium oxide, vanadium oxide, or titanium vanadium oxide, the material constituting the supporting layer 13 may include one or more of amorphous carbon, aluminum oxide, amorphous silicon, amorphous germanium, or amorphous silicon germanium, the material constituting the electrode layer 14 may include one or more of titanium, titanium nitride, tantalum nitride, titanium tungsten alloy, nickel-chromium alloy, nickel-silicon alloy, nickel, or chromium, and the material constituting the passivation layer 15 may include one or more of amorphous carbon, aluminum oxide, amorphous silicon, amorphous germanium, or amorphous silicon germanium. In addition, when the absorption plate 10 is provided with the thermosensitive layer 12, and the material of the thermosensitive layer 12 is amorphous silicon, amorphous carbon, amorphous germanium or amorphous silicon germanium, the supporting layer 13 and/or the passivation layer 15 on the beam structure 11 can be replaced by the thermosensitive layer 12, because the thermal conductivity of the amorphous silicon, the amorphous germanium or the amorphous silicon germanium is small, which is beneficial to reducing the thermal conductivity of the beam structure 11 and further improving the infrared responsivity of the infrared detector.

With reference to fig. 1 and fig. 2, at least one layer of hermetic release isolation layer 3 may be included above the CMOS measurement circuitry 1, and the hermetic release isolation layer 3 is used to protect the CMOS measurement circuitry 1 from process influence during an etching process for manufacturing the CMOS infrared sensing structure 2. Optionally, a hermetic release barrier 3 is located at an interface between the CMOS measurement circuitry 1 and the CMOS infrared sensing structure 2 and/or in the CMOS infrared sensing structure 2, the hermetic release barrier 3 is used to protect the CMOS measurement circuitry 1 from erosion when performing a corrosion process to release the sacrificial layer, and the hermetic release barrier 3 is made of a CMOS process corrosion resistant material including at least one of silicon, germanium, silicon germanium alloy, amorphous silicon, amorphous germanium, amorphous silicon germanium, amorphous carbon, silicon carbide, aluminum oxide, silicon nitride, or silicon carbonitride.

Fig. 2 exemplarily sets the hermetic release isolation layer 3 in the CMOS infrared sensing structure 2, the hermetic release isolation layer 3 may be, for example, located above the metal interconnection layer of the reflection layer 4, the hermetic release isolation layer 3 covers the columnar structure 6, and by setting the hermetic release isolation layer 3 to cover the columnar structure 6, on one hand, the hermetic release isolation layer 3 may be utilized as a support for the columnar structure 6, so as to improve the stability of the columnar structure 6, and ensure the electrical connection between the columnar structure 6 and the infrared conversion structure 40 as well as the support base 42. On the other hand, the airtight release insulating layer 3 coating the columnar structure 6 can reduce the contact between the columnar structure 6 and the external environment, reduce the contact resistance between the columnar structure 6 and the external environment, further reduce the noise of the infrared detector pixel, and improve the detection sensitivity of the infrared detection sensor. In addition, the resonant cavity of the infrared detector is realized by releasing the vacuum cavity after the silicon oxide sacrifice layer is released, the reflecting plate 41 is used as the reflecting layer of the resonant cavity, the sacrifice layer is positioned between the reflecting layer 4 and the infrared conversion structure 40, and when at least one layer of closed release isolating layer 3 positioned on the reflecting layer 4 selects silicon, germanium, silicon-germanium alloy, amorphous silicon, amorphous germanium or amorphous silicon-germanium as one part of the resonant cavity, the reflecting effect of the reflecting plate 41 is not influenced, the height of the resonant cavity can be reduced, the thickness of the sacrifice layer is further reduced, and the release difficulty of the sacrifice layer formed by silicon oxide is reduced. In addition, a closed release isolation layer 3 and the columnar structure 6 are arranged to form a closed structure, so that the CMOS measurement circuit system 1 is completely separated from the sacrificial layer, and the CMOS measurement circuit system 1 is protected.

Fig. 3 is a schematic cross-sectional structure diagram of another infrared detector provided in the embodiment of the present disclosure. Unlike the infrared detector having the structure shown in fig. 2, in the infrared detector having the structure shown in fig. 3, the close release isolation layer 3 is located at the interface between the CMOS measurement circuitry 1 and the CMOS infrared sensing structure 2, for example, the close release isolation layer 3 is located between the reflective layer 4 and the CMOS measurement circuitry 1, that is, the close release isolation layer 3 is located below the metal interconnection layer of the reflective layer 4, and the support base 42 is electrically connected to the CMOS measurement circuitry 1 through a through hole penetrating through the close release isolation layer 3. Specifically, because the CMOS measurement circuit system 1 and the CMOS infrared sensing structure 2 are both formed by using a CMOS process, after the CMOS measurement circuit system 1 is formed, a wafer including the CMOS measurement circuit system 1 is transferred to a next process to form the CMOS infrared sensing structure 2, and since silicon oxide is the most commonly used dielectric material in the CMOS process and silicon oxide is mostly used as an insulating layer between metal layers on the CMOS circuit, if no insulating layer is used as a barrier when silicon oxide with a thickness of about 2um is corroded, the circuit will be seriously affected, so in order to release the silicon oxide of the sacrificial layer, the silicon oxide medium on the CMOS measurement circuit system is not corroded, and the hermetic release insulating layer 3 is provided. After the CMOS measuring circuit system 1 is prepared and formed, a closed release isolation layer 3 is prepared and formed on the CMOS measuring circuit system 1, the CMOS measuring circuit system 1 is protected by the closed release isolation layer 3, in order to ensure the electric connection between the support base 42 and the CMOS measuring circuit system 1, after the closed release isolation layer 3 is prepared and formed, a through hole is formed in the area of the closed release isolation layer 3 corresponding to the support base 42 by adopting an etching process, and the support base 42 is electrically connected with the CMOS measuring circuit system 1 through the through hole. In addition, the sealing release isolation layer 3 and the supporting base 42 are arranged to form a sealing structure, so that the CMOS measurement circuit system 1 is completely separated from the sacrificial layer, and the CMOS measurement circuit system 1 is protected.

Fig. 4 is a schematic cross-sectional structure view of another infrared detector provided in the embodiment of the present disclosure. Different from the infrared detector with the structure shown in fig. 2 and fig. 3, in the infrared detector with the structure shown in fig. 4, at least one layer of airtight release isolation layer 3 is arranged on the interface between the CMOS measurement circuit system 1 and the CMOS infrared sensing structure 2, and at least one layer of airtight release isolation layer 3 is arranged in the CMOS infrared sensing structure 2, that is, at least one layer of airtight release isolation layer 3 is arranged between the reflection layer 4 and the CMOS measurement circuit system 1, and at least one layer of airtight release isolation layer 3 is arranged on the reflection layer 4.

Illustratively, the material constituting the hermetic release barrier layer 3 may include at least one of silicon, germanium, a silicon-germanium alloy, amorphous silicon, amorphous germanium, amorphous silicon-germanium, amorphous carbon, silicon carbide, aluminum oxide, silicon nitride, or silicon carbonitride, and the thickness of the hermetic release barrier layer 3 is equal to or greater than 100A and equal to or less than 2000A. Specifically, silicon, germanium, a silicon-germanium alloy, amorphous silicon, amorphous germanium, amorphous silicon-germanium, amorphous carbon, silicon carbide, aluminum oxide, silicon nitride, and silicon carbonitride are all CMOS process corrosion-resistant materials, i.e., these materials are not corroded by the sacrificial layer release agent, so the hermetic release barrier layer 3 can be used to protect the CMOS measurement circuitry 1 from corrosion when a corrosion process is performed to release the sacrificial layer. In addition, the closed release isolation layer 3 covers the CMOS measurement circuit system 1, and the closed release isolation layer 3 can also be used for protecting the CMOS measurement circuit system 1 from being influenced by the process in the etching process of manufacturing the CMOS infrared sensing structure 2. In addition, when at least one layer of airtight release isolation layer 3 is arranged on the reflection layer 4, the material for forming the airtight release isolation layer 3 is arranged to include at least one of silicon, germanium, silicon-germanium alloy, amorphous silicon, amorphous germanium, amorphous silicon-germanium, amorphous carbon, silicon carbide, aluminum oxide, silicon nitride or silicon carbonitride, the thickness of the first dielectric layer is greater than 100A and less than or equal to 2000A, when the airtight release isolation layer 3 is arranged to improve the stability of the columnar structure 6, the airtight release isolation layer 3 hardly influences the reflection process in the resonant cavity, the influence of the airtight release isolation layer 3 on the reflection process of the resonant cavity can be avoided, and further the influence of the airtight release isolation layer 3 on the detection sensitivity of the infrared detector is avoided.

With reference to fig. 1 to 4, a CMOS fabrication process of the CMOS infrared sensing structure 2 includes a metal interconnection process, a via process and an RDL process, the CMOS infrared sensing structure 2 includes at least two metal interconnection layers, at least two dielectric layers and a plurality of interconnection vias, the dielectric layers include at least one sacrificial layer and one heat-sensitive dielectric layer, the heat-sensitive dielectric layer includes at least a thermal-sensitive layer 12, and may further include a supporting layer 13 and/or a passivation layer 15, and the metal interconnection layers include at least a reflective layer 4 and an electrode layer 14; the thermal sensitive medium layer comprises a thermal sensitive material with a resistance temperature coefficient larger than a set value, the resistance temperature coefficient can be larger than or equal to 0.015/K, for example, the thermal sensitive material with the resistance temperature coefficient larger than the set value forms a thermal sensitive layer 12 in the thermal sensitive medium layer, the thermal sensitive medium layer is used for converting temperature change corresponding to infrared radiation absorbed by the thermal sensitive medium layer into resistance change, and further converting an infrared target signal into a signal capable of realizing electric reading through the CMOS measuring circuit system 1.

Specifically, the metal interconnection process is used for realizing the electrical connection of an upper metal interconnection layer and a lower metal interconnection layer, the through hole process is used for forming an interconnection through hole for connecting the upper metal interconnection layer and the lower metal interconnection layer, the RDL process is a rewiring layer process, specifically, a layer of metal is re-distributed above the top metal of the circuit and is electrically connected with the top metal of the circuit through a tungsten column, the reflection layer 4 in the infrared detector can be prepared on the top metal of the CMOS measurement circuit system 1 through the RDL process, and the support base 42 on the reflection layer 4 is electrically connected with the top metal of the CMOS measurement circuit system 1. In addition, the heat sensitive medium layer comprises a heat sensitive material with a resistance temperature coefficient larger than a set value, and the resistance temperature coefficient can be larger than or equal to 0.015/K, so that the detection sensitivity of the infrared detector can be improved.

In addition, as shown in fig. 2, the CMOS manufacturing process of the CMOS measurement circuit system 1 may also include a metal interconnection process and a through hole process, the CMOS measurement circuit system 1 includes metal interconnection layers 101, dielectric layers 102 and a silicon substrate 103 at the bottom, which are arranged at intervals, and the upper and lower metal interconnection layers 101 are electrically connected through a through hole 104.

Referring to fig. 1 to 4, the CMOS infrared sensing structure 2 includes a resonant cavity formed by a reflective layer 4 and a heat sensitive dielectric layer, a suspended microbridge structure for controlling heat transfer, and a pillar structure 6 having electrical connection and support functions, and the CMOS measurement circuitry 1 is used for measuring and processing an array resistance value formed by one or more CMOS infrared sensing structures 2 and converting an infrared signal into an image electrical signal.

Specifically, the resonant cavity may be formed by a cavity between the reflective layer 4 and the absorbing plate 10, for example, infrared light is reflected back and forth in the resonant cavity through the absorbing plate 10 to improve the detection sensitivity of the infrared detector, and due to the arrangement of the columnar structure 6, the beam structure 11 and the absorbing plate 10 form a suspended micro-bridge structure for controlling heat transfer, and the columnar structure 6 is electrically connected to the supporting base 42 and the corresponding beam structure 11 and is used for supporting the infrared conversion structure 40 on the columnar structure 6.

Fig. 5 is a schematic structural diagram of a CMOS measurement circuit system according to an embodiment of the present disclosure. With reference to fig. 1 to 5, the cmos measurement circuit system 1 includes a bias voltage generation circuit 7, a column-level analog front-end circuit 8 and a row-level circuit 9, an input end of the bias voltage generation circuit 7 is connected to an output end of the row-level circuit 9, an input end of the column-level analog front-end circuit 8 is connected to an output end of the bias voltage generation circuit 7, the row-level circuit 9 includes a row-level mirror image element Rsm and a row selection switch K1, and the column-level analog front-end circuit 8 includes a blind image element RD; the row-level circuit 9 is distributed in each pixel, selects a signal to be processed according to a row strobe signal of the time sequence generating circuit, and outputs a current signal to the column-level analog front-end circuit 8 under the action of the bias generating circuit 7 to perform current-voltage conversion and output; the row-level circuit 9 outputs a third bias voltage VRsm to the bias generation circuit 7 when being controlled by the row selection switch K1 to be gated, the bias generation circuit 7 outputs a first bias voltage V1 and a second bias voltage V2 according to the input constant voltage and the third bias voltage VRsm, and the column-level analog front-end circuit 8 obtains two currents according to the first bias voltage V1 and the second bias voltage V2, performs transimpedance amplification on the difference between the two generated currents, and outputs the amplified currents as an output voltage.

Specifically, the row-level circuit 9 includes a row-level mirror image element Rsm and a row selection switch K1, and the row-level circuit 9 is configured to generate a third bias voltage VRsm according to a gating state of the row selection switch K1. Illustratively, the row-level mirror image elements Rsm may be subjected to a shading process, so that the row-level mirror image elements Rsm are subjected to a fixed radiation of a shading sheet with a temperature that is constantly equal to the substrate temperature, the row selection switch K1 may be implemented by a transistor, the row selection switch K1 is closed, and the row-level mirror image elements Rsm are connected to the bias voltage generating circuit 7, that is, when the row-level circuit 9 is controlled by the row selection switch K1 to be gated, the third bias voltage VRsm is output to the bias voltage generating circuit 7. The bias generating circuit 7 may include a first bias generating circuit 71 and a second bias generating circuit 72, the first bias generating circuit 71 being configured to generate a first bias voltage V1 according to an input constant voltage, which may be, for example, a positive power supply signal with a constant voltage. The second bias generating circuit 72 may include a bias control sub-circuit 721 and a plurality of gate-driving sub-circuits 722, the bias control sub-circuit 721 controlling the gate-driving sub-circuits 722 to generate the corresponding second bias voltages V, respectively, according to the third bias voltage VRsm.

The column-level analog front-end circuit 8 includes a plurality of column control sub-circuits 81, the column control sub-circuits 81 are disposed in correspondence with the gate driving sub-circuits 722, and exemplarily, the column control sub-circuits 81 may be disposed in one-to-one correspondence with the gate driving sub-circuits 722, and the gate driving sub-circuits 722 are configured to provide the second bias voltage V2 to the corresponding column control sub-circuits 81 according to their own gate states. Illustratively, it may be set that when the gate driving sub-circuit 722 is gated, the gate driving sub-circuit 722 supplies the second bias voltage V2 to the corresponding column control sub-circuit 81; when the gate driving sub-circuit 722 is not gated, the gate driving sub-circuit 722 stops supplying the second bias voltage V2 to the corresponding column control sub-circuit 81.

The column-level analog front-end circuit 8 comprises an effective pixel RS and a blind pixel RD, the column control sub-circuit is used for generating a first current I1 according to a first bias voltage V1 and the blind pixel RD, generating a second current I2 according to a second bias voltage V2 and the effective pixel RS, performing transimpedance amplification on a difference value of the first current I1 and the second current I2 and outputting the difference value, and the row-level image pixel Rsm and the effective pixel RS have the same temperature drift amount under the same environment temperature.

Illustratively, the row-level image elements Rsm are thermally insulated from the CMOS measurement circuitry 1 and are shaded, and the row-level image elements Rsm are subjected to a fixed radiation from a shade sheet having a temperature constantly equal to the substrate temperature. The absorption plate 10 of the active pixel RS is thermally insulated from the CMOS measurement circuitry 1 and the active pixel RS receives external radiation. The absorbing plates 10 of the row-level mirror image elements Rsm and the effective elements RS are thermally insulated from the CMOS measuring circuit system 1, so that the row-level mirror image elements Rsm and the effective elements RS have a self-heating effect.

When the row selection switch K1 is used for gating the corresponding row-level mirror image element Rsm, the resistance value of the row-level mirror image element Rsm and the resistance value of the effective pixel RS are changed due to joule heat, but when the row-level mirror image element Rsm and the effective pixel RS are subjected to the same fixed radiation, the resistance value of the row-level mirror image element Rsm and the resistance value of the effective pixel RS are the same, the temperature coefficients of the row-level mirror image element Rsm and the temperature coefficient of the effective pixel RS are the same, the temperature drift amounts of the row-level mirror image element Rsm and the effective pixel RS are the same under the same environmental temperature, the change of the row-level mirror image element Rsm and the effective pixel RS are synchronous, the resistance value change of the row-level mirror image element Rsm and the effective pixel RS under the same environmental temperature is favorably compensated, and the stable output of the reading circuit is realized.

In addition, by arranging the second bias generating circuit 7 to include a bias control sub-circuit 721 and a plurality of gate driving sub-circuits 722, the bias control sub-circuit 721 is configured to control the gate driving sub-circuits 722 to generate corresponding second bias voltages V2 respectively according to the row control signal, so that each row of pixels has one path to drive the entire columns of pixels in the row separately, the requirement for the second bias voltages V2 is reduced, that is, the driving capability of the bias generating circuit 7 is improved, and the readout circuit is advantageously used to drive a larger-scale infrared detector pixel array. In addition, the specific detailed operation principle of the CMOS measurement circuit system 1 is well known to those skilled in the art, and will not be described herein.

Alternatively, the CMOS infrared sensing structure 2 may be disposed on an upper layer of a metal interconnection layer of the CMOS measurement circuitry 1 or fabricated on the same layer. Specifically, the metal interconnection layer of the CMOS measurement circuit system 1 may be a top metal layer in the CMOS measurement circuit system 1, and in conjunction with fig. 1 to 4, the CMOS infrared sensing structure 2 may be prepared on the upper layer of the metal interconnection layer of the CMOS measurement circuit system 1, and the CMOS infrared sensing structure 2 is electrically connected to the CMOS measurement circuit system 1 through the supporting pedestal 42 on the upper layer of the metal interconnection layer of the CMOS measurement circuit system 1, so as to transmit the electrical signal converted by the infrared signal to the CMOS measurement circuit system 1.

Fig. 6 is a schematic cross-sectional structure view of another infrared detector provided in the embodiment of the present disclosure, and as shown in fig. 6, a CMOS infrared sensing structure 2 is prepared on the same layer of a metal interconnection layer of a CMOS measurement circuit system 1, that is, the CMOS measurement circuit system 1 and the CMOS infrared sensing structure 2 are arranged on the same layer, as shown in fig. 6, the CMOS infrared sensing structure 2 is arranged on one side of the CMOS measurement circuit system 1, and a hermetic release isolation layer 3 may also be arranged on the top of the CMOS measurement circuit system 1 to protect the CMOS measurement circuit system 1.

Alternatively, in conjunction with fig. 1 to 6, the reflection plate 41 may be provided to be completely electrically insulated from the CMOS measurement circuitry 1 and the support base 42. Fig. 7 is a schematic perspective view of another infrared detector provided in the embodiment of the disclosure, and as shown in fig. 7, a reflection plate 41 may be disposed to be electrically connected to a corresponding ground terminal of the CMOS measurement circuit system 1 or the supporting base 42. Specifically, the reflection plate 41 is disposed to be in electrical contact with the grounded support base 42, and when the support base 42 is prepared and formed, one of the grounded support bases 42 may be disposed to be in electrical contact with the reflection plate 41, so that the coverage area of the reflection plate 41 can be increased, the reflection effect of the resonant cavity between the reflection plate 41 and the infrared conversion structure 40 is optimized, and the detection sensitivity of the infrared detector is improved. In addition, when one of the supporting bases 42 is grounded and electrically contacted with the reflection plate 41, the charges accumulated in the supporting base 42 can be effectively discharged, and the electrical performance of the CMOS measurement circuit system 1 is ensured. Fig. 8 illustrates only one way of electrically connecting the reflection plate 41 and the grounded support base 42 by way of example, and the reflection plate 41 and the grounded support base 42 may be electrically connected by other arrangements, and the electrically connecting way of the reflection plate 41 and the support base 42 is not particularly limited in the embodiment of the present disclosure.

Alternatively, in conjunction with fig. 1 to fig. 7, the supporting base 42 may be set as the top metal of the CMOS measuring circuit system 1, that is, the reflective layer 4 is formed by using the top metal of the CMOS measuring circuit system 1, and then the reflective plate 41 and the supporting base 42 are formed by etching. Or, the support base 42 may also be configured to be a metal interconnection layer prepared on the top metal of the CMOS measurement circuit system 1 by using an RDL process, where the metal interconnection layer corresponding to the support base is electrically connected to the top metal by using a tungsten plug process, and the RDL process is a redistribution layer process, specifically, a layer of metal is re-distributed above the top metal of the circuit and electrically connected to the top metal of the circuit by a tungsten pillar, and the RDL process is used to prepare the dielectric layer on the top metal of the CMOS measurement circuit system 1 first, then prepare the metal interconnection layer with a dielectric layer brushing function, etch the metal interconnection layer to form the reflection plate 41 and the support base 42, where the support base 42 is electrically connected to the top metal of the CMOS measurement circuit system 1 by using the tungsten plug process, so as to transmit the electrical signal converted from the infrared signal to the CMOS measurement circuit system 1, and the tungsten plug process is used to electrically connect the support base to the top metal of the CMOS measurement circuit system 1 by using the tungsten pillar.

Alternatively, in conjunction with fig. 1 to 7, the sacrificial layer is used to form the CMOS infrared sensing structure 2 into a hollow structure, the material of the sacrificial layer is silicon oxide, and the sacrificial layer is etched by a post-CMOS process, which may, for example, etch the sacrificial layer by using at least one of gaseous hydrogen fluoride, carbon tetrafluoride and trifluoromethane. Specifically, a sacrificial layer (not shown in fig. 1 to 4) is provided between the reflective layer 4 and the beam structure 11, and when the close-release isolation layer 3 is disposed on the reflective layer 4, the sacrificial layer is provided between the close-release isolation layer 3 and the beam structure 11, and the material constituting the sacrificial layer is silicon oxide, so as to be compatible with a CMOS process, and a post-CMOS process may be adopted, in which the post-CMOS process corrodes the sacrificial layer to release the sacrificial layer in the final infrared detection chip product.

Optionally, in conjunction with fig. 1 to 4, the cmos infrared sensing structure 2 further includes a beam structure 11, a reflective layer 4 and a pillar structure 6, the absorption plate 10 includes a metal interconnection layer and at least one thermal sensitive medium layer, the material constituting the thermal sensitive medium layer includes at least one of amorphous silicon, amorphous germanium, amorphous silicon germanium, titanium oxide, vanadium oxide or vanadium titanium oxide, the metal interconnection layer in the absorption plate 10 is an electrode layer 14 in the absorption plate 10 for transmitting an electrical signal converted from the infrared signal, the thermal sensitive medium layer includes at least a thermal sensitive layer 12 and may further include a supporting layer 13 and a passivation layer 15, the material constituting the thermal sensitive medium layer includes at least one of amorphous silicon, amorphous germanium, amorphous silicon germanium, titanium oxide, vanadium oxide or vanadium titanium oxide, that is, the material constituting the thermal sensitive layer 12 includes at least one of amorphous silicon, amorphous germanium, amorphous silicon germanium, titanium oxide, vanadium oxide or vanadium titanium oxide.

The beam structure 11 and the columnar structure 6 are used for transmitting electrical signals and for supporting and connecting the absorption plate 10, the electrode layer 14 in the absorption plate 10 includes two patterned electrode structures, the two patterned electrode structures output positive electrical signals and ground electrical signals respectively, the positive electrical signals and the ground electrical signals are transmitted to the supporting base electrically connected with the columnar structure 6 through different beam structures 11 and different columnar structures 6 and then transmitted to the CMOS measurement circuit system 1, the beam structure 11 includes a metal interconnection layer and at least one dielectric layer, the metal interconnection layer in the beam structure 11 is the electrode layer 14 in the beam structure 11, the electrode layer 14 in the beam structure 11 is electrically connected with the electrode layer 14 in the absorption plate 10, and the dielectric layer in the beam structure 11 may include a supporting layer 13 and a passivation layer 15.

The columnar structure 6 is connected with the beam structure 11 and the CMOS measuring circuit system 1 by adopting a metal interconnection process and a through hole process, the upper part of the columnar structure 6 needs to be electrically connected with an electrode layer 14 in the beam structure 11 through a through hole penetrating through a supporting layer 13 in the beam structure 11, and the lower part of the columnar structure 6 needs to be electrically connected with a corresponding supporting base 42 through a through hole penetrating through a dielectric layer on the supporting base 42. The reflecting plate 41 is used for reflecting infrared signals and forms a resonant cavity with the heat-sensitive medium layer, that is, the reflecting plate 41 is used for reflecting infrared signals and forms a resonant cavity with the heat-sensitive medium layer, and the reflecting layer 4 comprises at least one metal interconnection layer which is used for forming the supporting base 42 and also used for forming the reflecting plate 41. In addition, the pillar structure 6 may include one layer of independent pillar structures as shown in fig. 1, or may include multiple layers of independent pillar structures as shown in fig. 2, which is beneficial to optimizing the straightness of the pillar structure 6.

Alternatively, it is possible to provide that at least two ends of the beam structure 11 and the absorber plate 10 are electrically connected, the CMOS infrared sensing structure 2 includes at least two columnar structures 6 and at least two support bases 42, and the electrode layer 14 includes at least two electrode terminals. Specifically, as shown in fig. 1, the beam structures 11 are electrically connected to two ends of the absorption plate 10, each beam structure 11 is electrically connected to one end of the absorption plate 10, the CMOS infrared sensing structure 2 includes two column structures 6, the electrode layer 14 includes at least two electrode terminals, at least a portion of the electrode terminals transmit positive electrical signals, at least a portion of the electrode terminals transmit negative electrical signals, and the signals are transmitted to the supporting base 42 through the corresponding beam structures 11 and column structures 6.

Fig. 8 is a schematic perspective view of another infrared detector provided in the embodiments of the present disclosure. As shown in fig. 8, it is also possible to provide that the beam structures 11 are electrically connected to four ends of the absorption plate 10, each beam structure 11 is electrically connected to two ends of the absorption plate 10, and the CMOS infrared sensing structure 2 includes four columnar structures 6, and one beam structure 11 connects two columnar structures 6. It should be noted that, in the embodiment of the present disclosure, the number of the connection ends between the beam structure 11 and the absorption plate 10 is not specifically limited, and it is sufficient to ensure that the beam structure 11 and the electrode end correspond to each other, and the beam structure 11 is used for transmitting the electrical signal output by the corresponding electrode end.

Alternatively, the infrared detector may be configured based on a 3nm, 7nm, 10nm, 14nm, 22nm, 28nm, 32nm, 45nm, 65nm, 90nm, 130nm, 150nm, 180nm, 250nm or 350nm CMOS process, which characterizes process nodes of the integrated circuit, i.e., features during the processing of the integrated circuit.

Alternatively, the metal wiring material constituting the metal interconnection layer in the infrared detector may be configured to include at least one of aluminum, copper, tungsten, titanium, nickel, chromium, platinum, silver, ruthenium, or cobalt, and for example, the material constituting the reflective layer may be configured to include at least one of aluminum, copper, tungsten, titanium, nickel, chromium, platinum, silver, ruthenium, or cobalt. In addition, the CMOS measuring circuit system 1 and the CMOS infrared sensing structure 2 are both prepared by using a CMOS process, the CMOS infrared sensing structure 2 is directly prepared on the CMOS measuring circuit system 1, the radial side length of the columnar structure 6 is more than or equal to 0.5um and less than or equal to 3um, the width of the beam structure 11, namely the width of a single line in the beam structure 11 is less than or equal to 0.3um, the height of a resonant cavity is more than or equal to 1.5um and less than or equal to 2.5um, and the side length of a single pixel of the CMOS infrared sensing structure 2 is more than or equal to 6um and less than or equal to 17um.

The CMOS measurement circuit system 1 and the CMOS infrared sensing structure 2 are integrally prepared on the CMOS production line by utilizing the CMOS process, compared with the MEMS process, the CMOS process does not have the process compatibility problem, the technical difficulty of the MEMS process is solved, the transportation cost can be reduced by adopting the CMOS production line process to prepare the infrared detector, and the risk caused by the transportation problem and the like is reduced; the infrared detector takes silicon oxide as a sacrificial layer, the silicon oxide is completely compatible with a CMOS (complementary metal oxide semiconductor) process, the preparation process is simple and easy to control, the CMOS process does not have the problem that the polyimide of the sacrificial layer is not released cleanly to influence the vacuum degree of a detector chip, the subsequent film growth temperature is not limited by the material of the sacrificial layer, the multilayer process design of the sacrificial layer can be realized, the process is not limited, the planarization can be easily realized by using the sacrificial layer, and the process difficulty and the possible risks are reduced; the infrared detector prepared by the integrated CMOS process can realize the aims of high yield, low cost, high yield and large-scale integrated production of chips, and provides a wider application market for the infrared detector; the infrared detector based on the CMOS process can realize smaller size and thinner film thickness of a characteristic structure, so that the infrared detector has larger duty ratio, lower thermal conductivity and smaller thermal capacity, and the infrared detector has higher detection sensitivity, longer detection distance and better detection performance; the infrared detector based on the CMOS process can make the pixel size of the detector smaller, realize smaller chip area under the same array pixel, and is more beneficial to realizing the miniaturization of a chip; the infrared detector based on the CMOS process has the advantages of mature process production line, higher process control precision, better meeting design requirements, better product consistency, more contribution to circuit chip adjustment performance and more contribution to industrialized mass production.

It is noted that, in this document, relational terms such as "first" and "second," and the like, are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrases "comprising a component of' 8230; \8230;" does not exclude the presence of additional identical elements in the process, method, article, or apparatus that comprises the element.

The foregoing are merely exemplary embodiments of the present disclosure, which enable those skilled in the art to understand or practice the present disclosure. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the disclosure. Thus, the present disclosure is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. An infrared detector based on a CMOS process, comprising:

the CMOS measuring circuit system comprises at least one layer of closed release isolation layer above the CMOS measuring circuit system, and the closed release isolation layer is used for protecting the CMOS measuring circuit system from being influenced by a process in the etching process of manufacturing the CMOS infrared sensing structure;

the CMOS manufacturing process of the CMOS infrared sensing structure comprises a metal interconnection process, a through hole process and an RDL (remote data link) process, wherein the CMOS infrared sensing structure comprises at least two metal interconnection layers, at least two dielectric layers and a plurality of interconnection through holes, the two dielectric layers at least comprise a sacrificial layer and a heat-sensitive dielectric layer, and the two metal interconnection layers at least comprise a reflecting layer and an electrode layer; the thermal sensitive medium layer is used for converting temperature change corresponding to infrared radiation absorbed by the thermal sensitive medium layer into resistance change, and further converting an infrared target signal into a signal capable of realizing electric reading through the CMOS measuring circuit system;

the closed release isolation layer is positioned above the metal interconnection layer of the reflection layer, covers the columnar structure, and is used for protecting the CMOS measurement circuit system from being corroded when a sacrificial layer is released by a corrosion process, supporting the columnar structure, reducing the contact resistance between the columnar structure and the external environment and reducing the thickness of the sacrificial layer; the CMOS technology corrosion-resistant material adopted by the closed release isolation layer comprises at least one of silicon, germanium, silicon-germanium alloy, amorphous silicon, amorphous germanium, amorphous silicon-germanium, amorphous carbon, silicon carbide, aluminum oxide, silicon nitride or silicon carbonitride;

the reflecting layer comprises at least one metal layer, the reflecting layer comprises a reflecting plate and a supporting base, the CMOS infrared sensing structure comprises an absorption plate, the reflecting plate is used for reflecting the infrared signals transmitted by the absorption plate back to the absorption plate, and the supporting base is used for connecting the columnar structure and the CMOS measuring circuit system so as to transmit the infrared signals to the CMOS measuring circuit system; wherein the reflecting plate is electrically contacted with the grounded supporting base and is integrally formed;

2. The CMOS process-based infrared detector according to claim 1, wherein the reflective plate is any one of a metal interconnection layer of the CMOS measurement circuitry or a metal interconnection layer above a top metal layer of the CMOS measurement circuitry;

3. The CMOS process-based infrared detector according to claim 2, wherein the supporting base is a top metal of the CMOS measurement circuitry, or the supporting base is a metal interconnection layer formed by forming a dielectric layer on the top metal by the RDL process and forming the dielectric layer thereon, and the metal interconnection layer corresponding to the supporting base and the top metal are electrically connected by a tungsten plug process.

4. The CMOS process-based infrared detector of claim 1, wherein the CMOS infrared sensing structure is fabricated on top of or at the same level as a metal interconnect layer of the CMOS measurement circuitry.

5. The CMOS process-based infrared detector according to claim 1, wherein the sacrificial layer is used to form a hollowed-out structure in the CMOS infrared sensing structure, a material constituting the sacrificial layer is silicon oxide, and the sacrificial layer is etched by a post-CMOS process.

6. The CMOS process-based infrared detector of claim 5, wherein the post-CMOS process etches the sacrificial layer with at least one of gas phase hydrogen fluoride, carbon tetrafluoride, and trifluoromethane.

7. The CMOS process-based infrared detector according to claim 1, wherein the CMOS infrared sensing structure comprises a beam structure, the reflective layer, and the pillar structure;

the absorption plate is used for absorbing the infrared target signal and converting the infrared target signal into an electric signal, the absorption plate comprises a metal interconnection layer and at least one layer of the heat sensitive dielectric layer, and the material forming the heat sensitive dielectric layer comprises at least one of amorphous silicon, amorphous germanium-silicon, titanium oxide, vanadium oxide or titanium vanadium oxide;

the beam structure and the columnar structure are used for transmitting the electric signals and supporting and connecting the absorption plates, the beam structure comprises a metal interconnection layer and at least one dielectric layer, and the columnar structure is connected with the beam structure and the CMOS measuring circuit system by adopting the metal interconnection process and the through hole process;

8. The CMOS process-based infrared detector according to claim 7, wherein at least two ends of the beam structure and the absorption plate are electrically connected, the CMOS infrared sensing structure comprises at least two of the pillar structures and at least two supporting bases, and the electrode layer comprises at least two electrode terminals.

9. The CMOS process based infrared detector according to claim 1, wherein the infrared detector is based on a 3nm, 7nm, 10nm, 14nm, 22nm, 28nm, 32nm, 45nm, 65nm, 90nm, 130nm, 150nm, 180nm, 250nm or 350nm CMOS process.

10. The CMOS process-based infrared detector of claim 1, wherein a metal wiring material constituting the metal interconnection layer comprises at least one of aluminum, copper, tungsten, titanium, nickel, chromium, platinum, silver, ruthenium, or cobalt.