CN113661476A - 显示基板及其制备方法、显示装置 - Google Patents

显示基板及其制备方法、显示装置 Download PDF

Info

Publication number
CN113661476A
CN113661476A CN202080000262.1A CN202080000262A CN113661476A CN 113661476 A CN113661476 A CN 113661476A CN 202080000262 A CN202080000262 A CN 202080000262A CN 113661476 A CN113661476 A CN 113661476A
Authority
CN
China
Prior art keywords
layer
test
substrate
test contact
contact pad
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN202080000262.1A
Other languages
English (en)
Other versions
CN113661476B (zh
Inventor
张波
王蓉
魏玉龙
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BOE Technology Group Co Ltd
Chengdu BOE Optoelectronics Technology Co Ltd
Original Assignee
BOE Technology Group Co Ltd
Chengdu BOE Optoelectronics Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BOE Technology Group Co Ltd, Chengdu BOE Optoelectronics Technology Co Ltd filed Critical BOE Technology Group Co Ltd
Priority to CN202410221837.2A priority Critical patent/CN118102778A/zh
Publication of CN113661476A publication Critical patent/CN113661476A/zh
Application granted granted Critical
Publication of CN113661476B publication Critical patent/CN113661476B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10OLED displays
    • H10K59/12Active-matrix OLED [AMOLED] displays
    • H10K59/131Interconnections, e.g. wiring lines or terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2884Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/544Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/06Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • H01L2224/061Disposition
    • H01L2224/0612Layout
    • H01L2224/0615Mirror array, i.e. array having only a reflection symmetry, i.e. bilateral symmetry
    • H01L2224/06154Mirror array, i.e. array having only a reflection symmetry, i.e. bilateral symmetry covering only portions of the surface to be connected
    • H01L2224/06155Covering only the peripheral area of the surface to be connected, i.e. peripheral arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/02Bonding areas ; Manufacturing methods related thereto
    • H01L24/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L24/06Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10OLED displays
    • H10K59/12Active-matrix OLED [AMOLED] displays
    • H10K59/1201Manufacture or treatment
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10OLED displays
    • H10K59/12Active-matrix OLED [AMOLED] displays
    • H10K59/123Connection of the pixel electrodes to the thin film transistors [TFT]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/70Testing, e.g. accelerated lifetime tests

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Theoretical Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electroluminescent Light Sources (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

一种显示基板及其制备方法、显示装置。该显示基板(1)包括衬底基板(100)、子像素单元(20)、数据线(103)、扫描线(105)、多个测试接触垫(1071)周边区第一绝缘层(1074)以及辅助电极层。衬底基板(100)包括显示区(101)以及周边区(102),周边区(102)包括测试邦定区(107)。多个测试接触垫每个(1071)包括第一测试接触垫金属层(1072)以及第二测试接触垫金属层(1073),第二测试接触垫金属层(1073)覆盖所述第一测试接触垫金属层(1072)且至少在第一测试接触垫金属层(1072)的至少部分周边与第一测试接触垫金属层(1072)接触,辅助电极层包括位于测试邦定区(107)中的多个第一转接电极图案(1076)以及位于显示区(101)中的多个辅助电极(219)。

Description

PCT国内申请,说明书已公开。

Claims (25)

  1. PCT国内申请,权利要求书已公开。
CN202080000262.1A 2020-03-12 2020-03-12 显示基板及其制备方法、显示装置 Active CN113661476B (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202410221837.2A CN118102778A (zh) 2020-03-12 2020-03-12 显示基板及其制备方法、显示装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2020/079005 WO2021179251A1 (zh) 2020-03-12 2020-03-12 显示基板及其制备方法、显示装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
CN202410221837.2A Division CN118102778A (zh) 2020-03-12 2020-03-12 显示基板及其制备方法、显示装置

Publications (2)

Publication Number Publication Date
CN113661476A true CN113661476A (zh) 2021-11-16
CN113661476B CN113661476B (zh) 2024-04-02

Family

ID=77671153

Family Applications (2)

Application Number Title Priority Date Filing Date
CN202410221837.2A Pending CN118102778A (zh) 2020-03-12 2020-03-12 显示基板及其制备方法、显示装置
CN202080000262.1A Active CN113661476B (zh) 2020-03-12 2020-03-12 显示基板及其制备方法、显示装置

Family Applications Before (1)

Application Number Title Priority Date Filing Date
CN202410221837.2A Pending CN118102778A (zh) 2020-03-12 2020-03-12 显示基板及其制备方法、显示装置

Country Status (3)

Country Link
US (1) US20220328599A1 (zh)
CN (2) CN118102778A (zh)
WO (1) WO2021179251A1 (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20220007830A (ko) * 2020-07-10 2022-01-19 삼성디스플레이 주식회사 회로 기판 및 이를 포함하는 표시 장치
CN114286510B (zh) * 2021-12-28 2024-01-19 武汉天马微电子有限公司 线路板、显示模组及显示装置
CN117158126A (zh) * 2022-02-18 2023-12-01 京东方科技集团股份有限公司 显示面板及显示装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN204463778U (zh) * 2015-01-08 2015-07-08 昆山龙腾光电有限公司 显示面板及显示面板测试治具
CN107544720A (zh) * 2016-06-23 2018-01-05 株式会社日本显示器 阵列基板、显示装置以及传感器电极的检查方法
US20190116662A1 (en) * 2016-05-24 2019-04-18 Boe Technology Group Co., Ltd. Circuit board structure, binding test method and display device
CN110867139A (zh) * 2019-11-28 2020-03-06 上海中航光电子有限公司 一种阵列基板、显示面板及显示装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11600234B2 (en) * 2015-10-15 2023-03-07 Ordos Yuansheng Optoelectronics Co., Ltd. Display substrate and driving method thereof
KR102652572B1 (ko) * 2018-12-03 2024-03-28 엘지디스플레이 주식회사 플렉서블 전계 발광 표시장치
CN109725447B (zh) * 2019-02-22 2023-11-28 武汉华星光电技术有限公司 阵列基板、显示面板及显示装置
CN110289225B (zh) * 2019-06-28 2022-04-15 京东方科技集团股份有限公司 测试装置及方法、显示装置
CN116916700A (zh) * 2020-06-18 2023-10-20 京东方科技集团股份有限公司 显示基板和显示装置
CN112562586B (zh) * 2020-08-28 2022-10-25 京东方科技集团股份有限公司 显示面板及显示装置
CN113451385B (zh) * 2021-08-30 2021-11-12 北京京东方技术开发有限公司 显示基板和显示装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN204463778U (zh) * 2015-01-08 2015-07-08 昆山龙腾光电有限公司 显示面板及显示面板测试治具
US20190116662A1 (en) * 2016-05-24 2019-04-18 Boe Technology Group Co., Ltd. Circuit board structure, binding test method and display device
CN107544720A (zh) * 2016-06-23 2018-01-05 株式会社日本显示器 阵列基板、显示装置以及传感器电极的检查方法
CN110867139A (zh) * 2019-11-28 2020-03-06 上海中航光电子有限公司 一种阵列基板、显示面板及显示装置

Also Published As

Publication number Publication date
CN118102778A (zh) 2024-05-28
US20220328599A1 (en) 2022-10-13
CN113661476B (zh) 2024-04-02
WO2021179251A1 (zh) 2021-09-16

Similar Documents

Publication Publication Date Title
CN109285870B (zh) 显示基板及其制备方法、显示面板
CN109087922B (zh) 阵列基板及其制作方法、显示面板
US8039841B2 (en) Organic light emitting diode display
US12004387B2 (en) Display substrate and manufacturing method thereof, and display device
US11980074B2 (en) Display substrate including configuration of insulation layers covering contact pads in bonding region, and manufacturing method thereof
CN113661476B (zh) 显示基板及其制备方法、显示装置
KR20160059003A (ko) 유기 발광 표시 장치 및 그 제조 방법
JP7448564B2 (ja) 表示基板及びその製造方法、表示装置
US20220005891A1 (en) Display substrate and method of manufacturing the same, display device
CN113557470A (zh) 显示基板及显示装置
US20230045292A1 (en) Display substrate, method of manufacturing the display substrate, and display device
CN112103398A (zh) 一种显示面板
CN115552615A (zh) 显示基板及其制备方法、显示装置
CN113056827B (zh) 显示基板及其制备方法、显示装置
US20240213425A1 (en) Display substrate and display device
US20230209925A1 (en) Display substrate and display device
CN113099732B (zh) 显示基板及其制备方法、显示装置
US20220199713A1 (en) Display device
CN114899336A (zh) 一种显示面板及显示装置
CN116113258A (zh) 显示面板和显示装置

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant