CN113538725A

CN113538725A - Hardware product testing method and related equipment

Info

Publication number: CN113538725A
Application number: CN202110777547.2A
Authority: CN
Inventors: 刘香平; 周凡; 王芳勤; 莫顺达
Original assignee: Shenzhen Xfanic Technology Co Ltd
Current assignee: Shenzhen Xfanic Technology Co Ltd
Priority date: 2021-07-09
Filing date: 2021-07-09
Publication date: 2021-10-22
Anticipated expiration: 2041-07-09
Also published as: CN113538725B

Abstract

The invention discloses a test method of a hardware product and related equipment, wherein the method comprises the steps of monitoring a host interface; when the connection between a host interface and a device to be tested is monitored, acquiring identification information of the device to be tested; determining test parameters corresponding to the device to be tested according to the identification information and a pre-connected database; testing the device to be tested according to the test parameters to obtain test information; and generating a test report corresponding to the device to be tested according to the test information. The invention can effectively improve the detection efficiency of hardware products.

Description

Hardware product testing method and related equipment

Technical Field

The present invention relates to the field of hardware testing technologies, and in particular, to a method and a related device for testing a hardware product.

Background

With the development of electronic information technology, data communication products, such as mobile phones and mobile hard disks, have been deeply developed into people's daily life. The communication data can be transmitted through a wireless network, and can also be charged and transmitted through a wired interface. The products need to be inspected before being delivered from the factory when being delivered from the factory so as to ensure that the occurrence of factory reversion is as little as possible in the sales process.

With the development of the pipeline process, the efficiency of detecting these hardware products has been increased more and more, but in the existing scheme, for different types of hardware products, a detector needs to select different detection parameters according to the stage where the hardware product is located, such as a finished product or a semi-finished product, and the type of the product, and in addition, for the same type of interface, because the hardware products carried by the same type of interface are different, the detection standards are also different, or the transmission protocols are also different. Therefore, for hardware products requiring different detections, detection personnel also need to modify detection parameters manually, and a certain improvement space still exists in the detection rate.

Disclosure of Invention

The invention aims to solve the technical problems that the testing efficiency of a hardware product is not high, and provides a testing method of the hardware product aiming at the defects of the prior art.

In order to solve the technical problems, the technical scheme adopted by the invention is as follows:

a method of testing a hardware product, the method comprising:

monitoring a host interface;

when the connection between a host interface and a device to be tested is monitored, acquiring identification information of the device to be tested;

determining test parameters corresponding to the device to be tested according to the identification information and a pre-connected database;

testing the device to be tested according to the test parameters to obtain test information;

and generating a test report corresponding to the device to be tested according to the test information.

The test method of the hardware product comprises the steps that the identification information comprises a chip type, and the test parameters comprise comparison identifications; determining test parameters corresponding to the device to be tested according to the identification information and a pre-connected database comprises:

acquiring the chip type of the device to be tested;

and determining a comparison identifier corresponding to the device to be tested in the database according to the chip type and the database.

The testing method of the hardware product, wherein the identification information comprises FW information, and the testing parameters comprise conventional parameters; determining test parameters corresponding to the device to be tested according to the identification information and a pre-connected database comprises:

when the device to be tested comprises a HUB, acquiring chip information and FW information of the HUB;

determining interface information and jig information corresponding to each transmission interface of the HUB according to the chip information, the FW information and the database;

and determining conventional parameters corresponding to the HUB according to the interface information and the jig information.

The test method of the hardware product comprises the steps that the test information comprises pressure test information, and the test parameters comprise pressure test parameters; the testing the device to be tested according to the test parameters, and obtaining test information comprises:

and according to the pressure test parameters, carrying out pressure test on the transmission interface corresponding to the pressure test parameters to obtain pressure test information.

The test method of the hardware product comprises the steps that the test information comprises burning information, and the burning information comprises an un-burnt mark and a burnt mark; the testing the device to be tested according to the test parameters, and obtaining test information comprises:

acquiring a test identifier of the device to be tested;

comparing the test mark with the comparison mark;

when a comparison identifier equal to the test identifier exists, determining that the device to be tested is a burnt device;

and when the comparison identifier equal to the test identifier does not exist, determining that the device to be tested is the non-burning device.

The method for testing the hardware product, wherein before generating a test report corresponding to the device under test according to the test information and reporting the test report, the method further comprises:

and acquiring the geographic position corresponding to the host, and generating geographic information according to the geographic position.

The method for testing the hardware product, wherein the generating a test report corresponding to the device under test according to the test information includes:

determining production information corresponding to the device to be tested according to the identification information;

and generating a test report corresponding to the device to be tested according to the production information, the geographic information and the test information.

A hardware product testing device specifically comprises:

the monitoring module is used for monitoring the host interface;

the device comprises an acquisition module, a storage module and a processing module, wherein the acquisition module is used for acquiring the identification information of a device to be tested when monitoring that a host interface is connected with the device to be tested;

the determining module is used for determining the test parameters corresponding to the device to be tested according to the identification information and a pre-connected database;

the test module is used for testing the device to be tested according to the test parameters to obtain test information;

and the reporting module is used for generating a test report corresponding to the device to be tested according to the test information and sending the test report to a pre-connected management platform.

A computer readable storage medium storing one or more programs, the one or more programs being executable by one or more processors to implement steps in a method of testing a hardware product as recited in any of the above.

A terminal device, comprising: a processor, a memory, and a communication bus; the memory has stored thereon a computer readable program executable by the processor;

the communication bus realizes connection communication between the processor and the memory;

the processor, when executing the computer readable program, implements the steps in the method of testing a hardware product as described in any one of the above.

Has the advantages that: compared with the prior art, the invention provides a test method of a hardware product and related equipment. When detecting that the device to be tested is accessed, acquiring identification information of the device to be tested, wherein the identification information is information for identifying an interface, a chip and other identifications in the device to be tested. And automatically acquiring the test parameters corresponding to the identification information in a database according to the identification information. And then testing the device to be tested according to the test parameters to obtain test information. In the process, the user is not required to manually add the test content, the parameters to be tested are automatically determined according to the identification information, the operation is automated, and the detection efficiency is effectively improved. And finally, generating a corresponding test report according to the test information.

Drawings

Fig. 1 is a first flowchart of a method for testing a hardware product according to the present invention.

Fig. 2 is a schematic diagram of a first interface of the testing method of the hardware product provided by the present invention.

Fig. 3 is a second flowchart of the method for testing a hardware product according to the present invention.

Fig. 4 is a schematic diagram of a second interface of the testing method of the hardware product according to the present invention.

Fig. 5 is a schematic structural diagram of a terminal device provided in the present invention.

Detailed Description

The present invention provides a method for testing a hardware product and related devices, and in order to make the objects, technical solutions and effects of the present invention clearer and clearer, the present invention is further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

As used herein, the singular forms "a", "an", "the" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. It will be understood that when an element is referred to as being "connected" or "coupled" to another element, it can be directly connected or coupled to the other element or intervening elements may also be present. Further, "connected" or "coupled" as used herein may include wirelessly connected or wirelessly coupled. As used herein, the term "and/or" includes all or any element and all combinations of one or more of the associated listed items.

It will be understood by those skilled in the art that, unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the prior art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.

The inventor finds that, aiming at hardware products requiring different detection schemes, detection personnel also need to modify detection parameters manually, so that the detection rate is still low.

In order to solve the above problem, in the embodiment of the present invention, monitoring is performed on a host interface; when the connection between a host interface and a device to be tested is monitored, acquiring identification information of the device to be tested; determining test parameters corresponding to the device to be tested according to the identification information and a pre-connected database; testing the device to be tested according to the test parameters to obtain test information; and generating a test report corresponding to the device to be tested according to the test information.

The invention will be further explained by the description of the embodiments with reference to the drawings.

As shown in fig. 1, the present embodiment provides a method for testing a hardware product, where a certain hardware testing software is used as an execution subject, and the method for testing the hardware product may include the following steps:

and S10, monitoring the host interface.

Specifically, hardware test software is installed on the test device in advance, the hardware test software is started, and the hardware test software monitors an interface of the test device.

In a first implementation manner of this embodiment, subsequent tests are directly performed after the hardware test software snoops.

The production and inspection of a product comprises a plurality of stages, the inspection is not carried out after the whole product is finished, and the inspection is also required at some important semi-finished product stage. However, the function of the semi-finished product is not as complete as that of the finished product, so that in the detection, if the detection mode of the finished product is adopted to detect the product, more invalid errors are reported. Therefore, in the second implementation manner of the present embodiment, the detection is divided into two functional modes, namely a semi-finished product and a finished product. Before detection, a detector sends a functional instruction to interface detection software according to a detection stage, and the interface detection software determines whether a functional mode to be executed is finished product detection or semi-finished product detection according to the functional instruction. Compared with the finished product detection, in the semi-finished product detection process, the main key detection items can be qualified, and the device to be detected is qualified. For example, a finished HUB includes a PD interface, and a HUB including only a USB interface is a semi-finished HUB. Therefore, the detection items related to the PD can still be assembled in the next step even if detection errors exist in the detection process, and the number of times of false alarm is reduced.

And S20, when the connection between the host interface and the device to be tested is monitored, acquiring the identification information of the device to be tested.

Specifically, when the tester connects the device under test to the host, the hardware testing software monitors the connection between the host interface and the device under test. And the hardware testing software scans the information of the device to be tested so as to acquire the identification information of the device to be tested.

Since the identification information is information for identifying the interface, chip, and other identifiers in the device under test, the identification information includes an MAC address, a network card model, a chip identification code, and the like. Referring to fig. 2, the embodiment is described by taking the device under test as an example of a HUB including various interfaces such as a network card and a card reader. In addition to the HUB, the device under test may include video devices, such as a display, hard disk devices, such as headphones, and other hardware products.

The first identification information includes a module type that can be detected in the device under test, and as shown in fig. 2, the test module includes a HUB, a network card, a card reader, an audio, and the like. And determining a test module corresponding to the device to be tested in a plurality of preset test modules according to the acquired module type. The test modules can be increased or decreased according to the iterative update of the hardware product.

The second type of identification information includes identification information in units of elements such as chip information, FW information, and the like in the device under test.

And S30, determining the test parameters corresponding to the device to be tested according to the identification information and a pre-connected database.

Specifically, a database is preset, and the database is used for storing information of each produced or warehoused component, product and the like, such as a chip, including a chip model, a chip manufacturer and the like. The type of the database includes a SaaS (Software-as-a-Service) system and the like. The stored information is sorted in the database according to the type of the element, the number of the element and the like. In addition, parameter data corresponding to each piece of information is set, and the parameter data can be used for testing parameters.

When the identification information of the module type is obtained, according to the module type, determining the parameter data corresponding to the module type and taking the parameter data as the test parameter.

The obtained identification information includes Firmware (FW) information and chip information, the firmware information is used for subsequent FW verification, and the chip information is used for determining other test parameters.

Based on the FW information and the chip information, and the database, parameter data corresponding to the device under test can be determined and used as test parameters.

When the connected device to be tested is a USB HUB, firmware verification is firstly carried out on the USB HUB. Because a plurality of data transmission interfaces, such as USB interfaces and Type-C interfaces, are connected to the HUB. The protocols of these interfaces are different, and the detection schemes are different based on the different protocols. Information related to the attributes of the interfaces, such as the interface type corresponding to each interface on the HUB, the number of interfaces of each interface type, and the like, is used as the interface information. For example, the protocol types of the data transmission interfaces are read, the interface types are divided by the protocol types, and the number of the interfaces of each type is counted. When testing the data transmission interface, still need the cooperation of tool, if do not have the tool and can't carry out effectual detection to it. Therefore, when detecting the type of the data transmission interface and the number of each type of data transmission interface, the number of the jigs needs to be counted. Therefore, after the interface types, the number of interfaces corresponding to each interface type and the jig data are obtained, the parameter data corresponding to the interface types are obtained and used as the test parameters according to the information.

And if the device to be tested comprises an audio interface, the audio interface comprises PID codes and VID codes, and different products of different models are distinguished. After the device to be tested is connected, the PID code and the VID code of the audio interface are detected and compared with the supplier code and the product identification code in the database. If the supplier code identical with the PID code and the product identification code identical with the VID code exist in the database, the recording process before the device to be tested is correct, the standard parameters of the device to be tested are determined according to the PID and the VID, and the parameters are used as test parameters, including the maximum value and the minimum value of Total Harmonic Distortion (THD), PowerLimit and the like.

For example, the interface type is 2.0, the number of interfaces corresponding to the interface type is 2, the jig data includes an FX jig, the test parameters corresponding to each interface are determined in the database according to the interface information and the jig information, that is, the test corresponding to each interface is a protocol test of a protocol 2.0, the test number is 2, the test protocol corresponds to the position of the interface, and the specific parameter form of the protocol test corresponds to the FX jig, and the test parameters for testing the FX jig are also included. This test parameter is named conventional in this example. Specifically, the test parameters include a test parameter for a transmission rate, a test parameter for a read/write rate, a test parameter for a differential pair detection of a jig, PowerLimit for audio, and the like.

As shown in fig. 3, different test schemes may be preset for different devices to be tested, where parameters of each test scheme are associated with the type of the detected device to be tested, that is, a corresponding item to be tested is already set for each type of device to be tested in the database.

The obtained identification information includes the chip type in the device under test, for example, RTL 8153B. And then, according to the chip type, determining a comparison identifier corresponding to the chip type in the parameter data. After the device to be detected is detected each time, the device to be detected is burned after the detection is successful, and the burned data is stored in the database so as to be checked with the burned data in the subsequent process, thereby avoiding repeated burning. Therefore, the burning database is preset in the database in advance, and in the implementation, the test parameters include burning marks. As shown in fig. 2, in this embodiment, the MAC address is used as a burning identifier. In addition, the burning marks are classified according to different chip types. And after the chip type is determined, determining a burning identifier corresponding to the network card as a comparison identifier in the burning database according to the chip type. And using the comparison identification as a test parameter.

And S40, testing the device to be tested according to the test parameters to obtain test information.

Specifically, the test parameters include two types, one is a comparison parameter, and the other is a conventional parameter, i.e., a test parameter determined according to the chip information and the FW information.

In this embodiment, the tests corresponding to the two test parameters may be performed in a distributed manner or in a sequential manner, that is, the device under test is tested according to the conventional parameters to obtain the first test result. And if the first test result is passed and failed, testing the device to be tested according to the comparison parameters to obtain a second test result. And summarizing the test result of each stage to obtain test information.

Taking the stress test as an example, as shown in fig. 2, when the stress test is performed on the card reader, according to the chip type of the card reader, a read-write threshold and a test file corresponding to the chip type are determined, where the read-write threshold includes a read-write minimum value and a read-write maximum value. And reading and writing the card reader according to the test file, and recording the reading and writing rate of the card reader. Comparing the read-write speed with the read-write threshold, and if the read-write speed is within the range of the read-write threshold, determining that the test result corresponding to the pressure test is successful; and if the read-write speed is out of the read-write threshold range, the test result corresponding to the pressure test is test failure.

Take protocol testing as an example. The protocol test is to test the protocol of the transmission interface, and after determining the conventional parameters corresponding to each transmission interface, the transmission interface corresponding to the conventional parameters is tested according to the conventional parameters to obtain the transmission parameters. Taking USB protocols 2.0 and 3.0 as examples, the USB 2.0 rate is 480Mbps, and the USB 3.0 rate is 4.8Gbps, so the speed test can be selected for testing the USB 2.0 and the USB 3.0, and whether the corresponding protocol label is met or not is judged according to the transmission speed of the transmission interface. For example, according to the chip and FW information, it is determined that one transmission interface is USB 3.0, but the speed of the transmission interface is far less than the standard speed, and it is determined that the test result corresponding to the protocol test is a test failure. In addition, the supported current values and the like can be used as test parameters, which are not described in detail herein.

In addition, for the device to be tested that needs to burn the identification code, for example, the network card in fig. 2 is used as the device to be tested, the test information includes burning information, and the burning information includes an unrecorded identifier and a burnt identifier. A test identification of the test device, i.e. an identification of the device under test itself, e.g. a MAC address, is obtained. And then comparing the MAC address with a comparison identifier determined according to the chip type of the device to be tested. If the burning mark identical to the detection mark exists, the device to be tested is shown to be burnt in the previous stage, so that burning is not carried out any more; if the burning mark identical to the detection mark does not exist, the device to be tested is not burned before, so that the burning work is carried out subsequently.

In the programming setting, a corresponding programming mode is determined according to the determined chip. The detector can also manually adjust the parameters of the burning setting.

FW check, differential pair detection, etc. can also be performed according to the test parameters, and can be performed by using the scheme of the type described above, which is not described one by one here.

And S50, generating a test report corresponding to the device to be tested according to the test information.

Specifically, as shown in fig. 4, the test parameters and the test results of each device under test during the test process are stored as test information, and finally a test report corresponding to the device under test is generated.

In addition, the existing detection process is not concentrated in one area, and may be performed on different floors, different detection lines, and the source of the product may come from different products, stations, and the like. When a problem of a certain device to be detected is detected, the detection personnel need to report and inform the management personnel of the details of the device to be detected, the management personnel then check the details, and if necessary, the detection personnel also need to transfer the product for further detection. This method is cumbersome and not conducive to subsequent backtracking of the product. Therefore, in this embodiment, the database further includes a plurality of production data, and the production information of each product, such as a production site, a production line, and an ongoing process, is recorded in the production data. The hardware testing software also records the current geographic position, such as address, floor and detection line, so as to generate geographic information. Therefore, after the test is finished, a test report is generated according to the detection information, the production information and the geographic information. And if the test information is unqualified, sending a prompt message when the test report is reported to the administrator system. According to the received test report, the manager can quickly determine which link of production the fault may exist in and the location of the device to be tested where the fault is detected.

In this embodiment, the hardware testing software further includes a timeout limit, and if a device under test cannot perform effective function detection for a long time, the test is terminated, and data obtained during this period is used as detection information.

Based on the above method for testing a hardware product, this embodiment provides a device for testing a hardware product, where the device for testing a hardware product includes:

the monitoring module is used for monitoring the host interface;

The identification information comprises a chip type, and the test parameters comprise comparison identifications; the determining module is specifically configured to:

acquiring the chip type of the device to be tested;

Wherein the identification information comprises FW information and the test parameters comprise conventional parameters; the determining module is specifically configured to:

The test information comprises pressure test information, and the test parameters comprise pressure test parameters; the test module is specifically configured to:

The test information comprises burning information, and the burning information comprises an un-burnt mark and a burnt mark; the test module is specifically configured to:

acquiring a test identifier of the device to be tested;

comparing the test mark with the comparison mark;

Wherein, the device to be tested still includes the orientation module, the orientation module specifically is used for:

Wherein the generation module is specifically configured to:

Based on the above testing method of the hardware product, the present embodiment provides a computer-readable storage medium, which stores one or more programs that can be executed by one or more processors to implement the steps in the testing method of the hardware product according to the above embodiment.

Based on the above testing method of the hardware product, the present invention further provides a terminal device, as shown in fig. 5, which includes at least one processor (processor) 20; a display screen 21; and a memory (memory)22, and may further include a communication Interface (Communications Interface)23 and a bus 24. The processor 20, the display 21, the memory 22 and the communication interface 23 can communicate with each other through the bus 24. The display screen 21 is configured to display a user guidance interface preset in the initial setting mode. The communication interface 23 may transmit information. The processor 20 may call logic instructions in the memory 22 to perform the methods in the embodiments described above.

Furthermore, the logic instructions in the memory 22 may be implemented in software functional units and stored in a computer readable storage medium when sold or used as a stand-alone product.

The memory 22, which is a computer-readable storage medium, may be configured to store a software program, a computer-executable program, such as program instructions or modules corresponding to the methods in the embodiments of the present disclosure. The processor 20 executes the functional application and data processing, i.e. implements the method in the above-described embodiments, by executing the software program, instructions or modules stored in the memory 22.

The memory 22 may include a storage program area and a storage data area, wherein the storage program area may store an operating system, an application program required for at least one function; the storage data area may store data created according to the use of the terminal device, and the like. Further, the memory 22 may include a high speed random access memory and may also include a non-volatile memory. For example, a variety of media that can store program codes, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk, may also be used as the transient computer readable storage medium.

In addition, the specific processes loaded and executed by the instruction processors in the computer-readable storage medium and the terminal device are described in detail in the method, and are not stated herein.

Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.

Claims

1. A method of testing a hardware product, the method comprising:

monitoring a host interface;

2. The method for testing hardware products according to claim 1, wherein the identification information includes a chip type, and the test parameters include a comparison identification; determining test parameters corresponding to the device to be tested according to the identification information and a pre-connected database comprises:

acquiring the chip type of the device to be tested;

3. The method for testing a hardware product according to claim 1, wherein the identification information includes FW information, and the test parameters include normal parameters; determining test parameters corresponding to the device to be tested according to the identification information and a pre-connected database comprises:

4. The method of testing a hardware product according to claim 1, wherein the test information includes stress test information, and the test parameters include stress test parameters; the testing the device to be tested according to the test parameters, and obtaining test information comprises:

5. The method for testing the hardware product according to claim 2, wherein the test information comprises burning information, and the burning information comprises an un-burned mark and a burned mark; the testing the device to be tested according to the test parameters, and obtaining test information comprises:

acquiring a test identifier of the device to be tested;

comparing the test mark with the comparison mark;

6. The method for testing a hardware product according to any one of claims 1 to 5, wherein before generating a test report corresponding to the device under test according to the test information and reporting the test report, the method further comprises:

7. The method of claim 6, wherein the generating a test report corresponding to the device under test according to the test information comprises:

8. A test device for hardware products is characterized by specifically comprising:

the monitoring module is used for monitoring the host interface;

9. A computer readable storage medium storing one or more programs, the one or more programs being executable by one or more processors to perform the steps in the method for testing a hardware product according to any one of claims 1 to 7.

10. A terminal device, comprising: a processor, a memory, and a communication bus; the memory has stored thereon a computer readable program executable by the processor;

the processor, when executing the computer readable program, implements the steps in the method of testing a hardware product of any of claims 1-7.