CN113538725B

CN113538725B - Method for testing hardware products and related equipment

Info

Publication number: CN113538725B
Application number: CN202110777547.2A
Authority: CN
Inventors: 刘香平; 周凡; 王芳勤; 莫顺达
Original assignee: Shenzhen Xfanic Technology Co Ltd
Current assignee: Shenzhen Xfanic Technology Co Ltd
Priority date: 2021-07-09
Filing date: 2021-07-09
Publication date: 2023-06-06
Anticipated expiration: 2041-07-09
Also published as: CN113538725A

Abstract

The invention discloses a method for testing hardware products and related equipment, wherein the method comprises the steps of monitoring a host interface; when the connection between the host interface and the device to be tested is monitored, acquiring the identification information of the device to be tested; determining testing parameters corresponding to the device to be tested according to the identification information and a pre-connected database; testing the device to be tested according to the test parameters to obtain test information; and generating a test report corresponding to the device to be tested according to the test information. The invention can effectively improve the detection efficiency of hardware products.

Description

Method for testing hardware products and related equipment

Technical Field

The present invention relates to the field of hardware detection technologies, and in particular, to a method and related apparatus for testing a hardware product.

Background

With the development of electronic information technology, products of data communication type have been put into daily life of people, such as mobile phones and mobile hard disks. The data of the communication types can be charged and transmitted through the interface of the wired connection besides being transmitted through the wireless network. These products all require pre-factory inspection at the point of shipment to ensure that as few reverse factory occurrences as possible occur during the sales process.

With the development of pipeline technology, the efficiency of detecting these hardware products has been higher and higher, but in the existing scheme, the detection personnel need to select different detection parameters according to the stage where the hardware products are located, such as finished products or semi-finished products, and the types of the products, and in addition, for the same type of interface, the detection standards are different or the transmission protocols are different due to the different hardware products carried by the interface. Therefore, for hardware products requiring different detection, detection personnel also need to manually modify detection parameters, and a certain improvement space still exists for the detection rate.

Disclosure of Invention

The invention aims to solve the technical problem that the testing efficiency of a hardware product is low, and provides a testing method of the hardware product aiming at the defects of the prior art.

In order to solve the technical problems, the technical scheme adopted by the invention is as follows:

a method of testing a hardware product, the method comprising:

monitoring a host interface;

when the connection between the host interface and the device to be tested is monitored, acquiring the identification information of the device to be tested;

determining testing parameters corresponding to the device to be tested according to the identification information and a pre-connected database;

testing the device to be tested according to the test parameters to obtain test information;

and generating a test report corresponding to the device to be tested according to the test information.

The method for testing the hardware product comprises the steps that the identification information comprises a chip type, and the test parameters comprise comparison identifications; the determining, according to the identification information and the pre-connected database, the test parameters corresponding to the device to be tested includes:

acquiring the chip type of the device to be tested;

and determining a comparison identifier corresponding to the device to be tested in the database according to the chip type and the database.

The hardware product testing method comprises the steps that the identification information comprises FW information, and the testing parameters comprise conventional parameters; the determining, according to the identification information and the pre-connected database, the test parameters corresponding to the device to be tested includes:

when the device to be tested comprises a HUB, acquiring chip information and FW information of the HUB;

according to the chip information, the FW information and the database, interface information and jig information corresponding to each transmission interface of the HUB are determined;

and determining conventional parameters corresponding to the HUB according to the interface information and the jig information.

The test method of the hardware product comprises the steps that the test information comprises pressure test information, and the test parameters comprise pressure test parameters; and testing the device to be tested according to the test parameters, wherein the obtaining test information comprises the following steps:

and performing pressure test on a transmission interface corresponding to the pressure test parameter according to the pressure test parameter to obtain pressure test information.

The test method of the hardware product comprises the steps that the test information comprises burning information, and the burning information comprises an unfired mark and a burnt mark; and testing the device to be tested according to the test parameters, wherein the obtaining test information comprises the following steps:

acquiring a test identifier of the device to be tested;

comparing the test mark with the comparison mark;

when the comparison identifier equal to the test identifier exists, determining that the device to be tested is a burnt device;

and when the comparison identifier equal to the test identifier does not exist, determining that the device to be tested is an unfired device.

The method for testing the hardware product, wherein before generating the test report corresponding to the device to be tested according to the test information and reporting the test report, further comprises:

and obtaining the geographic position corresponding to the host computer, and generating geographic information according to the geographic position.

The method for testing the hardware product, wherein the generating the test report corresponding to the device to be tested according to the test information comprises the following steps:

determining production information corresponding to the device to be tested according to the identification information;

and generating a test report corresponding to the device to be tested according to the production information, the geographic information and the test information.

A testing device for hardware products specifically comprises:

the monitoring module is used for monitoring the host interface;

the acquisition module is used for acquiring the identification information of the device to be tested when the host interface is monitored to be connected with the device to be tested;

the determining module is used for determining the testing parameters corresponding to the device to be tested according to the identification information and the pre-connected database;

the test module is used for testing the device to be tested according to the test parameters to obtain test information;

and the reporting module is used for generating a test report corresponding to the device to be tested according to the test information and sending the test report to a pre-connected management platform.

A computer readable storage medium storing one or more programs executable by one or more processors to implement steps in a method of testing a hardware product as described in any of the above.

A terminal device, comprising: a processor, a memory, and a communication bus; the memory has stored thereon a computer readable program executable by the processor;

the communication bus realizes connection communication between the processor and the memory;

the processor, when executing the computer readable program, implements the steps in the method of testing a hardware product as described in any of the above.

The beneficial effects are that: compared with the prior art, the invention provides a method for testing hardware products and related equipment, wherein the method monitors an interface of a host first and waits for the access of a device to be tested. When the access of the device to be tested is detected, the identification information of the device to be tested is obtained, wherein the identification information is information for identifying the identification of interfaces, chips and the like in the device to be tested. And according to the identification information, automatically acquiring test parameters corresponding to the identification information in a database. And then testing the device to be tested according to the test parameters to obtain test information. In the process, the user is not required to manually add the test content, the parameters to be tested are automatically determined according to the identification information, the automatic operation is realized, and the detection efficiency is effectively improved. And finally, generating a test report corresponding to the test information according to the test information.

Drawings

Fig. 1 is a first flowchart of a method for testing a hardware product according to the present invention.

Fig. 2 is a schematic diagram of a first interface of a method for testing a hardware product according to the present invention.

Fig. 3 is a second flowchart of a method for testing a hardware product according to the present invention.

Fig. 4 is a second interface schematic diagram of a method for testing a hardware product according to the present invention.

Fig. 5 is a schematic structural diagram of a terminal device provided by the present invention.

Detailed Description

The invention provides a method for testing hardware products and related equipment, which are used for making the purposes, technical schemes and effects of the invention clearer and more definite, and the invention is further described in detail below by referring to the drawings and the embodiments. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.

As used herein, the singular forms "a", "an", "the" and "the" are intended to include the plural forms as well, unless expressly stated otherwise, as understood by those skilled in the art. It will be further understood that the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. It will be understood that when an element is referred to as being "connected" or "coupled" to another element, it can be directly connected or coupled to the other element or intervening elements may also be present. Further, "connected" or "coupled" as used herein may include wirelessly connected or wirelessly coupled. The term "and/or" as used herein includes all or any element and all combination of one or more of the associated listed items.

It will be understood by those skilled in the art that all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs unless defined otherwise. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the prior art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.

The inventor finds that, for hardware products requiring different detection schemes, detection personnel also need to manually modify detection parameters, so the detection rate is still low.

In order to solve the above problem, in the embodiment of the present invention, a host interface is monitored; when the connection between the host interface and the device to be tested is monitored, acquiring the identification information of the device to be tested; determining testing parameters corresponding to the device to be tested according to the identification information and a pre-connected database; testing the device to be tested according to the test parameters to obtain test information; and generating a test report corresponding to the device to be tested according to the test information.

The invention will be further described by the description of embodiments with reference to the accompanying drawings.

As shown in fig. 1, the present embodiment provides a method for testing a hardware product, which uses a certain hardware testing software as an execution body, and the method for testing the hardware product includes the following steps:

s10, monitoring the host interface.

Specifically, hardware test software is installed on the test device in advance, the hardware test software is started, and the hardware test software monitors an interface of the test device.

In a first implementation manner of this embodiment, the hardware test software directly performs the subsequent test after monitoring.

The production and inspection of a product involves multiple stages, not the entire product being inspected after completion, and in some important semi-finished stages. However, the function of the semi-finished product is not as complete as that of the finished product, so that when the product is detected by adopting the detection mode of the finished product, invalid errors are more. Therefore, in the second implementation of the present embodiment, the detection is divided into two functional modes, i.e., a semi-finished product and a finished product. Before detection, a detector sends a functional instruction to interface detection software according to a detection stage, and the interface detection software determines whether a functional mode to be executed is finished product detection or semi-finished product detection according to the functional instruction. Compared with finished product detection, the main key detection items in the semi-finished product detection process can be qualified, and the device to be detected is qualified in detection. For example, a HUB of a certain finished product includes a PD interface, and a HUB including only a USB interface is a semi-finished product. Therefore, the detection items related to the PD can still be assembled in the next step even if detection errors exist in the detection process, and the number of false alarms is reduced.

S20, when the host interface is monitored to be connected with the device to be tested, the identification information of the device to be tested is obtained.

Specifically, when the inspector connects the device under test with the host, the hardware testing software monitors the connection between the host interface and the device under test. And the hardware testing software scans information of the device to be tested, so that identification information of the device to be tested is obtained.

Since the identification information refers to information for identifying an interface, a chip, etc. in the device under test, the identification information includes a MAC address, a network card model, a chip identification code, etc. Referring to fig. 2, the embodiment is described taking a device under test as a HUB with multiple interfaces including a network card and a card reader as an example. In addition to HUB, devices under test may also include video devices such as displays, hard disk devices such as headphones, and other hardware products.

The first type of identification information includes the type of module that can be detected in the device under test, as shown in fig. 2, and the test module includes a HUB, a network card, a card reader, audio, and the like. And determining a test module corresponding to the device to be tested in a plurality of preset test modules according to the acquired module type. According to the iterative updating of the hardware product, the test module can be increased or decreased.

The second type of identification information includes identification information in units of elements such as chip information, FW information, and the like in the device under test.

S30, determining the test parameters corresponding to the device to be tested according to the identification information and a pre-connected database.

Specifically, a database is preset, and the database is used for storing information of each produced or put-in component, product and the like, such as a chip, including a chip model, a chip manufacturer and the like. The type of the database includes a SaaS (Software-as-a-Service) system and the like. The stored information is classified and normalized in the database according to the type of the element, the number of the element, and the like. In addition, parameter data corresponding to each piece of information is set, and the parameter data can be used for testing parameters.

When the identification information of the module type is obtained, according to the module type, the parameter data corresponding to the module type is determined and used as the test parameter.

The acquired identification information includes Firmware (FW) information for subsequent FW verification and chip information for determining other test parameters.

According to FW information, chip information and database, parameter data corresponding to the device to be tested can be determined and used as test parameters.

When the connected device to be tested is a USB HUB, the USB HUB is firstly subjected to firmware verification. Since multiple data transmission interfaces, such as a USB interface and a Type-C interface, are connected to the HUB. The protocols of the interfaces are not the same, but the detection schemes are different based on the different protocols. And taking information related to the attribute of the interface, such as the interface type corresponding to each interface on the HUB, the number of interfaces of each interface type and the like, as interface information. For example, the protocol types of the data transmission interfaces are read, the interface types are divided by the protocol types, and the number of interfaces of each type is counted. When testing data transmission interface, still need the cooperation of tool, if there is not the tool can't carry out effectual detection to it. Therefore, the number of the jigs is also counted when detecting the type of the data transmission interfaces and the number of each data transmission interface. Therefore, after the interface types, the number of interfaces corresponding to each interface type and the jig data are obtained, the parameter data corresponding to the interface types are obtained according to the information, and are used as the test parameters.

If the device to be tested comprises an audio interface, the audio interface comprises PID codes and VID codes, and different products with different models are distinguished. After the device to be tested is connected, the PID code and the VID code of the audio interface are detected and compared with the supplier code and the product identification code in the database. If the provider code same as the PID code and the product identification code same as the VID code exist in the database, the record flow before the device to be tested is correct, standard parameters are determined according to the PID and the VID, and the parameters are used as test parameters, including the maximum value and the minimum value of total harmonic distortion (Total Harmonic Distortion, THD) and PowerLimit.

For example, the interface type is 2.0, the number of interfaces corresponding to the interface type is 2, the jig data comprises an FX jig, and according to the interface information and the jig information, test parameters corresponding to each interface are determined in a database, namely, the test corresponding to each interface is a protocol test of protocol 2.0, the test number is 2, the test protocol corresponds to the position of the interface, the specific parameter form of the protocol test corresponds to the FX jig, and the method also comprises test parameters for testing the FX jig. Such test parameters are named conventional parameters in this embodiment. Specifically, the test parameters include a test parameter for a transmission rate, a test parameter for a read-write rate, a test parameter for differential pair detection of a jig, powerLimit for audio, and the like.

As shown in fig. 3, for different devices under test, different test schemes may be preset for the USB network card, the USB HUB and the card reader, and parameters of each test scheme are associated with the type of the detected device under test, i.e. in the database, corresponding items to be tested are set for each type of device under test.

The acquired identification information includes the chip type in the device under test, such as RTL8153B. And then determining the comparison identification corresponding to the chip type in the parameter data according to the chip type. After each detection of the device to be detected, the device to be detected is successfully burnt, and the burnt data is stored in a database so as to prevent repeated burning by checking with the burnt data. Therefore, a burning database is preset in the database in advance, and in this implementation, the test parameters include a burning identifier. As shown in fig. 2, in this embodiment, the MAC address is used as the burning identifier. In addition, the burning marks are classified according to different chip types. When the chip type is determined, determining a burning identifier corresponding to the network card as a comparison identifier in the burning database according to the chip type. And the comparison mark is used as a test parameter.

And S40, testing the device to be tested according to the test parameters to obtain test information.

Specifically, the test parameters include two types, one is a comparison parameter and the other is a conventional parameter, i.e., the test parameters determined according to the chip information and the FW information.

In this embodiment, the tests corresponding to the two test parameters may be performed in a distributed manner or may be performed sequentially, that is, the device to be tested is tested according to the conventional parameters, so as to obtain the first test result. And if the first test result is the test passing, then testing the device to be tested according to the comparison parameters to obtain a second test result. Summarizing the test results of each stage to obtain the test information.

Taking pressure test as an example, as shown in fig. 2, when the card reader is subjected to pressure test, a read-write threshold value and a test file corresponding to the chip type are determined according to the chip type of the card reader, wherein the read-write threshold value comprises a read-write minimum value and a read-write maximum value. And according to the test file, reading and writing the card reader, and recording the reading and writing speed of the card reader. Comparing the read-write speed with a read-write threshold, and if the read-write speed is within the read-write threshold, determining that the test result corresponding to the pressure test is successful; if the read-write speed is out of the read-write threshold range, the test result corresponding to the pressure test is a test failure.

Taking protocol test as an example. The protocol test is to test the protocol of the transmission interfaces, and after determining the conventional parameters corresponding to each transmission interface, test the corresponding transmission interface according to the conventional parameters to obtain the transmission parameters. Taking protocols 2.0 and 3.0 of USB as examples, the speed of USB 2.0 is 480Mbps, and the speed of USB 3.0 is 4.8Gbps, so that the test of USB 2.0 and USB 3.0 can be selected by speed test, and according to the transmission speed of the transmission interface, whether the corresponding protocol label is met is judged. For example, according to the chip and FW information, it is determined that a certain transmission interface is USB 3.0, but the speed of the transmission interface is far from the standard speed, and then it is determined that the test result corresponding to the protocol test is a test failure. In addition, the supported current value and the like can be used as test parameters, and are not described herein.

In addition, for the device to be tested that needs to record the identification code, for example, the network card in fig. 2 is used as the device to be tested, the test information includes recording information, and the recording information includes an unburnt identifier and a recorded identifier. The test identifier of the test device, i.e. the identifier of the device under test itself, such as the MAC address, is obtained. And then comparing the MAC address with a comparison identifier which is determined according to the chip type of the device to be tested. If the burning mark which is the same as the detection mark exists, the device to be tested is recorded in the previous stage, so that the burning is not performed any more; if the burning mark which is the same as the detection mark does not exist, the device to be tested is not burned before, and therefore the burning work is carried out subsequently.

In the programming setting, firstly, a corresponding programming mode is determined according to the determined chip. The inspector can also manually adjust parameters of the burning setting.

FW verification, differential pair detection, etc. can also be performed according to the test parameters, and schemes of the above type can be adopted, which will not be described here.

S50, generating a test report corresponding to the device to be tested according to the test information.

Specifically, as shown in fig. 4, the test parameters and test results of each device under test during the test are stored as test information, and finally a test report corresponding to the device under test is generated.

In addition, existing inspection processes are not focused on one area, may be performed on different floors, on different inspection lines, and may be derived from different products, sites, etc. When detecting that a problem exists in a certain device to be detected, a detector needs to report and inform a manager of details of the device to be detected, and the manager checks the device again, and if necessary, the detector needs to transfer the product for further detection. This approach is cumbersome and is not conducive to subsequent backtracking of the product. In this embodiment, the database further includes a plurality of production data, in which production information of each product, such as a production site, a production line, and an ongoing process, is recorded. The hardware testing software also records the current own geographic location, e.g., address, floor, and inspection lines, thereby generating geographic information. Therefore, after the test is finished, a test report is generated according to the detection information, the production information and the geographic information. If the test information is unqualified, a prompt message is sent out when the test report is reported to the manager system. The manager can quickly determine which link of the production may have a fault and the location of the device to be tested that detected the fault according to the received test report.

In this embodiment, the hardware test software further includes a timeout limit, and if a device under test fails to perform effective functional test for a long period of time, the test is terminated and data obtained during this period is used as test information.

Based on the above-mentioned method for testing a hardware product, the present embodiment provides a device for testing a hardware product, where the device for testing a hardware product includes:

the monitoring module is used for monitoring the host interface;

The identification information comprises a chip type, and the test parameters comprise comparison identifications; the determining module is specifically configured to:

acquiring the chip type of the device to be tested;

Wherein the identification information comprises FW information, and the test parameters comprise conventional parameters; the determining module is specifically configured to:

Wherein the test information comprises pressure test information, and the test parameters comprise pressure test parameters; the test module is specifically used for:

The test information comprises burning information, wherein the burning information comprises an unfired mark and a burnt mark; the test module is specifically used for:

acquiring a test identifier of the device to be tested;

comparing the test mark with the comparison mark;

The device to be tested further comprises a positioning module, wherein the positioning module is specifically used for:

The generating module is specifically configured to:

Based on the above-described method for testing a hardware product, the present embodiment provides a computer-readable storage medium storing one or more programs executable by one or more processors to implement the steps in the method for testing a hardware product as described in the above-described embodiment.

Based on the above-mentioned method for testing hardware products, the present invention also provides a terminal device, as shown in fig. 5, which includes at least one processor (processor) 20; a display screen 21; and a memory (memory) 22, which may also include a communication interface (Communications Interface) 23 and a bus 24. Wherein the processor 20, the display 21, the memory 22 and the communication interface 23 may communicate with each other via a bus 24. The display screen 21 is configured to display a user guidance interface preset in the initial setting mode. The communication interface 23 may transmit information. The processor 20 may invoke logic instructions in the memory 22 to perform the methods of the embodiments described above.

Furthermore, the logic instructions in the memory 22 described above may be implemented in the form of software functional units and may be stored in a computer-readable storage medium when sold or used as a stand-alone product.

The memory 22, as a computer readable storage medium, may be configured to store a software program, a computer executable program, such as program instructions or modules corresponding to the methods in the embodiments of the present disclosure. The processor 20 performs functional applications and data processing, i.e. implements the methods of the embodiments described above, by running software programs, instructions or modules stored in the memory 22.

The memory 22 may include a storage program area that may store an operating system, at least one application program required for functions, and a storage data area; the storage data area may store data created according to the use of the terminal device, etc. In addition, the memory 22 may include high-speed random access memory, and may also include nonvolatile memory. For example, a plurality of media capable of storing program codes such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (Random Access Memory, RAM), a magnetic disk or an optical disk, or a transitory computer readable storage medium may be used.

In addition, the specific processes that the computer readable storage medium and the plurality of instruction processors in the terminal device load and execute are described in detail in the above method, and are not stated here.

Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and are not limiting; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for testing a hardware product, the method comprising:

monitoring the host interface, wherein the monitoring the host interface comprises:

receiving a function instruction;

determining a functional mode according to the functional instruction, wherein the functional mode comprises finished product detection and semi-finished product detection;

when the connection between the host interface and the device to be tested is monitored, acquiring identification information of the device to be tested, wherein the identification information comprises chip type and FW information;

determining test parameters corresponding to the device to be tested according to the identification information and the pre-connected database, wherein when the device to be tested is an audio interface, the audio interface comprises a PID code and a VID code, the test parameters comprise a comparison identification, and determining the test parameters corresponding to the device to be tested according to the identification information and the pre-connected database comprises the following steps:

comparing the PID code and the VID code with preset provider codes and product identification codes;

if the PID codes are the same, corresponding test parameters are determined according to the PID codes and the VID codes; the method comprises the steps of,

acquiring the chip type of the device to be tested;

determining a comparison identifier corresponding to the device to be tested in the database according to the chip type and the database; the method comprises the steps of,

determining conventional parameters corresponding to the HUB according to the interface information and the jig information;

testing the device to be tested according to the test parameters to obtain test information, wherein the test parameters comprise conventional parameters and comparison parameters, and generating a test report corresponding to the device to be tested according to the test information comprises:

testing the device to be tested according to conventional parameters to obtain a first test result, wherein the first test result comprises pass and fail;

if the first test result is that the test passes, testing the device to be tested according to the comparison parameters to obtain a second test result;

obtaining test information according to the first test result and the second test result;

generating a test report corresponding to the device to be tested according to the test information;

and generating a test report corresponding to the device to be tested according to the test information, wherein the test report comprises the following steps:

obtaining a geographic position corresponding to a host, and generating geographic information according to the geographic position;

the generating a test report corresponding to the device under test according to the test information further includes:

2. The method of testing a hardware product of claim 1, wherein the test information comprises stress test information and the test parameters comprise stress test parameters; and testing the device to be tested according to the test parameters, wherein the obtaining test information comprises the following steps:

3. The method for testing a hardware product according to claim 2, wherein the test information includes burning information, the burning information including an unfired identifier and a burned identifier; and testing the device to be tested according to the test parameters, wherein the obtaining test information comprises the following steps:

acquiring a test identifier of the device to be tested;

comparing the test mark with the comparison mark;

4. The utility model provides a testing arrangement of hardware product which characterized in that, testing arrangement of hardware product specifically includes:

the monitoring module is used for monitoring the host interface, and the monitoring module is specifically used for:

receiving a function instruction;

the device comprises an acquisition module, a detection module and a control module, wherein the acquisition module is used for acquiring identification information of a device to be detected when monitoring that a host interface is connected with the device to be detected, and the identification information comprises chip type and FW information;

the determining module is configured to determine, according to the identification information and a pre-connected database, a test parameter corresponding to the device to be tested, where when the device to be tested is an audio interface, the audio interface includes a PID code and a VID code, the test parameter includes a comparison identifier, and the determining module is specifically configured to:

acquiring the chip type of the device to be tested;

the test module is used for testing the device to be tested according to the test parameters to obtain test information, wherein the test parameters comprise conventional parameters and comparison parameters, and the test module is specifically used for:

the positioning module is used for acquiring the geographic position corresponding to the host computer and generating geographic information according to the geographic position;

the reporting module is used for generating a test report corresponding to the device to be tested according to the test information, and the reporting module is specifically used for:

5. A computer-readable storage medium storing one or more programs executable by one or more processors to implement the steps in the method of testing a hardware product as claimed in any one of claims 1 to 3.

6. A terminal device, comprising: a processor, a memory, and a communication bus, the memory having stored thereon a computer readable program executable by the processor;

the processor, when executing the computer readable program, implements the steps of the method for testing a hardware product according to any one of claims 1-3.