CN113534016B - Self-learning test system and method suitable for tester - Google Patents
Self-learning test system and method suitable for tester Download PDFInfo
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- CN113534016B CN113534016B CN202110603209.7A CN202110603209A CN113534016B CN 113534016 B CN113534016 B CN 113534016B CN 202110603209 A CN202110603209 A CN 202110603209A CN 113534016 B CN113534016 B CN 113534016B
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- 238000012360 testing method Methods 0.000 title claims abstract description 91
- 238000000034 method Methods 0.000 title claims description 10
- 238000010998 test method Methods 0.000 claims abstract description 3
- 239000011159 matrix material Substances 0.000 claims description 17
- 238000009413 insulation Methods 0.000 claims description 16
- 238000013461 design Methods 0.000 description 2
- 238000009960 carding Methods 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/67—Testing the correctness of wire connections in electric apparatus or circuits
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- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention relates to a self-learning test system and a self-learning test method suitable for a tester, wherein the system comprises: the device comprises a setting module, a rapid scanning test module and a self-learning analysis module; the setting module is used for setting the starting range or the number n of the measured points of the measured object connected with the tester and the judging standard of the connection relation of the measured object; the rapid scanning test module rapidly realizes the test among all the tested points according to the principle of reducing repeated test, and records the resistance value during the test among the tested points in a temporary loop table by taking the serial number of the tested points as a mark; the self-learning analysis module determines the complete connection state of the tested object according to the resistance value recorded in the temporary loop table and the judgment standard of the connection relation of the tested object set in the setting module.
Description
Technical Field
The invention relates to the field of automatic testing, in particular to a self-learning testing module which utilizes a tester to perform automatic testing and self-learning to obtain the complete connection relation of a tested object.
Background
The tester is widely applied to the fields of aerospace, aviation, ships, automobiles and the like, and generally needs to be tested after the processing of a cable network or a product is finished so as to verify the welding correctness of the cable network or the product, and the existing cable network and the product testing modes mainly have two types: firstly, conducting, insulating and testing components of a tested object manually point by utilizing a universal meter and comparing design drawings; and secondly, obtaining the connection relation of the tested object by using the tester according to the design drawing, and inputting the connection relation into the tester to conduct and insulate automatic test.
The two modes can verify the correctness of the connection relation of the tested object when the cable or the tested product is small in scale and the number of points is small. With the continuous expansion of the use scale of the tested object, particularly the cable network, under the condition that the connection relation is very complex, the manual point-by-point test and the manual cable carding relation are time-consuming and easy to make mistakes. The existing two modes have the limitations of low efficiency, long time consumption, poor reliability and the like. Most of the existing cable testers have a conducting and insulating test function, but do not distinguish components.
Disclosure of Invention
The invention mainly aims to provide a self-learning system and a self-learning method for a tester, which are responsible for automatically testing and self-learning analysis of unknown connection relations to obtain standard connection relations (including conduction, insulation, resistance and diodes) of a tested object with the unknown connection relations, so that a plurality of configuration files of a conduction table, an insulation table and a component table required by the tester for testing can be obtained, and whether the electrical connection state of the tested object is correct or not can be rapidly and accurately judged.
The technical scheme of the invention is as follows: a self-learning test system suitable for use with a tester, comprising: the device comprises a setting module, a rapid scanning test module and a self-learning analysis module;
the setting module is used for setting the starting range or the number n of the measured points of the measured object connected with the tester and the judging standard of the connection relation of the measured object;
The rapid scanning test module rapidly realizes the test among all the tested points according to the principle of reducing repeated test, and records the resistance value during the test among the tested points in a temporary loop table by taking the serial number of the tested points as a mark;
The self-learning analysis module determines the complete connection state of the tested object according to the resistance value recorded in the temporary loop table and the judgment standard of the connection relation of the tested object set in the setting module.
Preferably, the connection relation of the measured object comprises conduction, insulation, resistance and a diode.
Preferably, the judgment standard is upper and lower limits of the resistor, the condition that the judgment standard is lower than the lower limit indicates conduction, the condition that the judgment standard is higher than the upper limit indicates insulation, and the condition that the judgment standard is lower than the lower limit indicates resistance.
Preferably, the rapid scan test module is implemented by:
Step one: sequentially numbering measured points and setting a temporary loop table, wherein the table records the resistance values among the measured points in an n-by-n matrix form, when the test current is forward, the resistance value of the i point to the j point is recorded at the position of a matrix a ij, and when the test current is backward, the resistance value of the i point to the j point is recorded at the position of a matrix a ji;
Step two: starting point-by-point scanning test on other points from the 1 st measured point marked as 1 point, obtaining the resistance relation between the 1 point and all other points, recording the resistance relation in a temporary loop table, and obtaining a point set V 1 conducted with the 1 point according to the judging standard of the connection relation of the measured object;
Step three: selecting any point from the set of all points which are not conducted with the point 1 as a point U 1＝U-V1,U1, selecting any point as a point, carrying out a point-by-point scanning test on other points in the U 1, obtaining the resistance relation between the point a and all other points, and recording the resistance relation in a temporary loop table to obtain a set V 2 of the points conducted with the point a;
Step four: the point set which is recorded as the point of any point except the point a in the U 2＝U1-V2,U2 and is not conducted with the point 1 is recorded as the point-by-point scanning test of the point b on other points in the U 2, the resistance relation between the point b and all other points is obtained and recorded in a temporary loop table, and the point set V 3 conducted with the point b is obtained;
step five: the point set which is recorded as the point of any point except the point a and the point b in the U 3＝U2-V3,U2 is recorded as the point-by-point scanning test of the point c to other points in the U 3, the resistance relation between the point c and all other points is obtained and recorded in a temporary loop table, and the point set V 4 which is recorded as the point which is communicated with the point c is obtained;
Step six: and so on, until the set U m of points that are non-conductive to point 1 is an empty set;
step seven: and reversing the test current, and repeating the second step to the sixth step.
Preferably, in the third step to the sixth step, the sequence is selected from the collection according to the sequence number from small to large or from large to small.
Preferably, the self-learning analysis module is implemented by the following means:
If a ij≠aji and one of the values is judged to be conductive and the other is judged to be insulating according to the judging standard, judging that the diode is arranged between the points i and j, and writing the diode and the positions of the points i and j into a component table;
If a ij＝aji, recording the set V 1、V2、V3、V4……Vm into a group according to each set in a conduction table; taking each group of first points to record in an insulating table;
Recording the remaining points except the points recorded in the conduction table as a set W, traversing the points in the W, judging the size of a ij in the W according to the judging standard, if the points are insulated, writing the points into the insulation table; if the resistor is the resistor, the resistance value and the positions of the points i and j are written into the component table.
A self-learning test method suitable for a tester comprises the following steps:
S1, accessing a tested object into a tester, and setting a tested point starting range or a tested point number n of the tested object and a judging standard of a tested object connection relation;
s2, sequentially numbering measured points and setting a temporary loop table, wherein the table records the resistance values among the measured points in an n-by-n matrix form, when the test current is forward, the resistance value of the i point to the j point in the test is recorded at the position of a matrix a ij, and when the test current is backward, the resistance value of the i point to the j point in the test is recorded at the position of a matrix a ji;
S3, starting point-by-point scanning test on other points from the 1 st measured point recorded as 1 point, obtaining the resistance relation between the 1 point and all other points, recording the resistance relation in a temporary loop table, and obtaining a set V 1 of points conducted with the 1 point according to the judging standard of the connection relation of the measured object;
s4, recording a set of all points which are not conducted with the point 1 as a point a in the point U 1＝U-V1,U1, carrying out point-by-point scanning test on other points in the point U 1 to obtain the resistance relation between the point a and all other points, and recording the resistance relation in a temporary loop table to obtain a set V 2 of the points conducted with the point a;
S5, recording a point set which is not conducted with the point 1 as a point of any point except the point a in the U 2＝U1-V2,U2, recording the point set as a point b for carrying out point-by-point scanning test on other points in the U 2, obtaining the resistance relation between the point b and all other points, and recording the resistance relation in a temporary loop table to obtain a point set V 3 conducted with the point b;
S6, recording a point set which is not conducted with the point 1 as a point of any point except the point a and the point b in the U 3＝U2-V3,U2, recording the point set as a point-by-point scanning test of the point c on other points in the U 3, obtaining the resistance relation between the point c and all other points, and recording the resistance relation in a temporary loop table to obtain a point set V 4 conducted with the point c;
S7, and the like, until a set U m of points which are not conducted with the 1 point is an empty set;
s8, inverting the test current, and repeating the steps S3 to S7; obtaining a final temporary loop table;
S9, determining the complete connection state of the tested object according to the resistance value recorded in the temporary loop table and the set judgment standard of the connection relation of the tested object.
Preferably, the specific implementation manner of S9 is as follows:
If a ij≠aji and one of the values is judged to be conductive and the other is judged to be insulating according to the judging standard, judging that the diode is arranged between the points i and j, and writing the diode and the positions of the points i and j into a component table;
If a ij＝aji, recording the set V 1、V2、V3、V4……Vm into a group according to each set in a conduction table; taking each group of first points to record in an insulating table;
Recording the remaining points except the points recorded in the conduction table as a set W, traversing the points in the W, judging the size of a ij in the W according to the judging standard, if the points are insulated, writing the points into the insulation table; if the resistor is the resistor, the resistance value and the positions of the points i and j are written into the component table.
The method of the invention is operated in an upper computer of the tester.
Compared with the prior art, the invention has the advantages that:
(1) The invention can distinguish the relation of conduction, insulation, resistance and diode in the tested object by the tester, and can reflect the complete connection state of the tested object without omission.
(2) The method for rapid scanning test greatly improves the test efficiency. Because the time of the test performed by the tester is positively correlated with the test times, compared with one-to-one measurement of the full traversal of all tested points, the method reduces the near half test times, avoids a great deal of repeated test work and saves a great deal of time. The larger the scale of the tested object is, the more obvious the test efficiency is improved.
(3) The invention adopts the current forward and backward two tests, can judge whether the diode exists in the circuit, and simultaneously ensures the accuracy and reliability of the test result by the two test results.
(4) According to the method, the tester automatically tests and replaces the work of manually writing a plurality of test configuration files of the conduction meter, the insulation meter and the component meter required by the test, so that a great deal of labor cost and time cost are saved.
Drawings
FIG. 1 is a temporary loop table obtained from a fast scan test.
Detailed Description
The present invention will be described in detail with reference to the accompanying drawings.
The system/method of the invention is operated in an upper computer of the tester, and the specific implementation modes are as follows:
1) Tester arrangement
And accessing the tested object into the tester, and inputting the starting point range of the tested point accessed into the tester program. The view point is 1 point, the last point is n points, and the set of all points is U.
Parameters, namely conduction, insulation and resistance judgment standards are set in the tester, and the upper limit and the lower limit of the resistance are embodied.
2) Quick scan test
Step one: sequentially numbering measured points and setting a temporary loop table, wherein the table records the resistance values among the measured points in an n-by-n matrix form, when the test current is forward, the resistance value of the i point to the j point is recorded at the position of a matrix a ij, and when the test current is backward, the resistance value of the i point to the j point is recorded at the position of a matrix a ji;
Step two: starting point-by-point scanning test on other points from the 1 st measured point marked as 1 point, obtaining the resistance relation between the 1 point and all other points, recording the resistance relation in a temporary loop table, and obtaining a point set V 1 conducted with the 1 point according to the judging standard of the connection relation of the measured object;
Step three: the point with the smallest serial number in the U 1＝U-V1,U1 is marked as a point to other points in the U 1, the resistance relation between the point a and all other points is obtained and recorded in a temporary loop table, and the point set V 2 conducted with the point a is obtained;
Step four: the point set of points which are not conducted with the point 1 is marked as the point with the smallest serial number except the point a in the U 2＝U1-V2,U2, and the point with the smallest serial number is marked as the point b to be subjected to the point-by-point scanning test on other points in the U 2, so that the resistance relation between the point b and all other points is obtained and recorded in a temporary loop table, and the point set V 3 conducted with the point b is obtained;
step five: the point set which is recorded as the point with the smallest serial number except the point a and the point b in the U 3＝U2-V3,U2 is recorded as the point-by-point scanning test of the point c to other points in the U 3, the resistance relation between the point c and all other points is obtained and recorded in a temporary loop table, and the point set V 4 which is recorded as the point which is communicated with the point c is obtained;
Step six: and so on, until the set U m of points that are non-conductive to point 1 is an empty set;
step seven: and reversing the test current, and repeating the second step to the sixth step.
Thus, after all test points are scanned, a temporary loop table is obtained as shown in fig. 1.
3) Self-learning analysis
The parameter configuration is carried out in the tester before the test, the upper limit and the lower limit of the set resistance value are used as limiting conditions, the conduction is indicated below the lower limit, the insulation is indicated above the upper limit, and the resistance is indicated between the upper limit and the lower limit.
The element in row i and column j of the matrix is a ij, and whether the two points i and j are diodes and resistors can be judged by judging whether a ij、aji in the matrix is equal or not and judging the range of the values of the elements. The specific judgment is as follows:
If a ij≠aji and one of the values is judged to be conductive and the other is judged to be insulating according to the judging standard, judging that the diode is arranged between the points i and j, and writing the diode and the positions of the points i and j into a component table;
If a ij＝aji, recording the set V 1、V2、V3、V4……Vm into a group according to each set in a conduction table; taking each group of first points to record in an insulating table;
Recording the remaining points except the points recorded in the conduction table as a set W, traversing the points in the W, judging the size of a ij in the W according to the judging standard, if the points are insulated, writing the points into the insulation table; if the resistor is the resistor, the resistance value and the positions of the points i and j are written into the component table.
As shown in the test chart of FIG. 1, the temporary loop table is a diode between the 4 th point and the n-1 th point, and a 10 ohm resistor is between the 3 rd point and the 6 th point. The obtained component table, the conduction table and the insulation table can represent the complete connection state of the tested object.
The invention is not described in detail in the field of technical personnel common knowledge.
Claims (7)
1. A self-learning test system adapted for use with a tester, comprising: the device comprises a setting module, a rapid scanning test module and a self-learning analysis module;
the setting module is used for setting the starting range or the number n of the measured points of the measured object connected with the tester and the judging standard of the connection relation of the measured object;
The rapid scanning test module rapidly realizes the test among all the tested points according to the principle of reducing repeated test, and records the resistance value during the test among the tested points in a temporary loop table by taking the serial number of the tested points as a mark;
The self-learning analysis module determines the complete connection state of the tested object according to the resistance value recorded in the temporary loop table and the judgment standard of the connection relation of the tested object set in the setting module;
The rapid scan test module is realized by the following steps:
Step one: sequentially numbering measured points and setting a temporary loop table, wherein the temporary loop table records the resistance values among the measured points in an n-by-n matrix form, the resistance values of the i point to the j point during the test are recorded at a matrix a ij position when the test current is forward, and the resistance values of the i point to the j point during the test are recorded at a matrix a ji position when the test current is reverse;
Step two: starting point-by-point scanning test on other points from the 1 st measured point marked as 1 point, obtaining the resistance relation between the 1 point and all other points, recording the resistance relation in a temporary loop table, and obtaining a point set V 1 conducted with the 1 point according to the judging standard of the connection relation of the measured object;
Step three: selecting any point from the set of all points which are not conducted with the point 1 as a point U 1＝U-V1,U1, selecting any point as a point, carrying out a point-by-point scanning test on other points in the U 1, obtaining the resistance relation between the point a and all other points, and recording the resistance relation in a temporary loop table to obtain a set V 2 of the points conducted with the point a;
Step four: the point set which is recorded as the point of any point except the point a in the U 2＝U1-V2,U2 and is not conducted with the point 1 is recorded as the point-by-point scanning test of the point b on other points in the U 2, the resistance relation between the point b and all other points is obtained and recorded in a temporary loop table, and the point set V 3 conducted with the point b is obtained;
step five: the point set which is recorded as the point of any point except the point a and the point b in the U 3＝U2-V3,U2 is recorded as the point-by-point scanning test of the point c to other points in the U 3, the resistance relation between the point c and all other points is obtained and recorded in a temporary loop table, and the point set V 4 which is recorded as the point which is communicated with the point c is obtained;
Step six: and so on, until the set U m of points that are non-conductive to point 1 is an empty set;
step seven: and reversing the test current, and repeating the second step to the sixth step.
2. The system according to claim 1, wherein: the connection relation of the measured object comprises conduction, insulation, resistance and a diode.
3. The system according to claim 1, wherein: the judgment standard is upper and lower limits of the resistor, the condition that the resistor is lower than the lower limit indicates conduction, the condition that the resistor is higher than the upper limit indicates insulation, and the condition that the resistor is between the upper and lower limits indicates resistance.
4. The system according to claim 1, wherein: in the third to sixth steps, the sequence numbers are preferably selected from the collection from small to large or from large to small.
5. The system according to claim 1, wherein: the self-learning analysis module is realized by the following steps:
If a ij≠aji and one of the values is judged to be conductive and the other is judged to be insulating according to the judging standard, judging that the diode is arranged between the points i and j, and writing the diode and the positions of the points i and j into a component table;
If a ij＝aji, recording the set V 1、V2、V3、V4……Vm into a group according to each set in a conduction table; taking each group of first points to record in an insulating table;
Recording the remaining points except the points recorded in the conduction table as a set W, traversing the points in the W, judging the size of a ij in the W according to the judging standard, if the points are insulated, writing the points into the insulation table; if the resistor is the resistor, the resistance value and the positions of the points i and j are written into the component table.
6. A self-learning test method suitable for a tester based on the self-learning test system suitable for a tester according to claim 1, characterized by comprising the following steps:
S1, accessing a tested object into a tester, and setting a tested point starting range or a tested point number n of the tested object and a judging standard of a tested object connection relation;
S2, sequentially numbering measured points and setting a temporary loop table, wherein the temporary loop table records the resistance values among the measured points in an n-by-n matrix form, when the test current is forward, the resistance value of the i point to the j point in the test is recorded at the position of a matrix a ij, and when the test current is backward, the resistance value of the i point to the j point in the test is recorded at the position of a matrix a ji;
S3, starting point-by-point scanning test on other points from the 1 st measured point recorded as 1 point, obtaining the resistance relation between the 1 point and all other points, recording the resistance relation in a temporary loop table, and obtaining a set V 1 of points conducted with the 1 point according to the judging standard of the connection relation of the measured object;
s4, recording a set of all points which are not conducted with the point 1 as a point a in the point U 1＝U-V1,U1, carrying out point-by-point scanning test on other points in the point U 1 to obtain the resistance relation between the point a and all other points, and recording the resistance relation in a temporary loop table to obtain a set V 2 of the points conducted with the point a;
S5, recording a point set which is not conducted with the point 1 as a point of any point except the point a in the U 2＝U1-V2,U2, recording the point set as a point b for carrying out point-by-point scanning test on other points in the U 2, obtaining the resistance relation between the point b and all other points, and recording the resistance relation in a temporary loop table to obtain a point set V 3 conducted with the point b;
S6, recording a point set which is not conducted with the point 1 as a point of any point except the point a and the point b in the U 3＝U2-V3,U2, recording the point set as a point-by-point scanning test of the point c on other points in the U 3, obtaining the resistance relation between the point c and all other points, and recording the resistance relation in a temporary loop table to obtain a point set V 4 conducted with the point c;
S7, and the like, until a set U m of points which are not conducted with the 1 point is an empty set;
s8, inverting the test current, and repeating the steps S3 to S7; obtaining a final temporary loop table;
S9, determining the complete connection state of the tested object according to the resistance value recorded in the temporary loop table and the set judgment standard of the connection relation of the tested object;
The specific implementation mode of S9 is as follows:
If a ij≠aji and one of the values is judged to be conductive and the other is judged to be insulating according to the judging standard, judging that the diode is arranged between the points i and j, and writing the diode and the positions of the points i and j into a component table;
If a ij＝aji, recording the set V 1、V2、V3、V4……Vm into a group according to each set in a conduction table; taking each group of first points to record in an insulating table;
Recording the remaining points except the points recorded in the conduction table as a set W, traversing the points in the W, judging the size of a ij in the W according to the judging standard, if the points are insulated, writing the points into the insulation table; if the resistor is the resistor, the resistance value and the positions of the points i and j are written into the component table.
7. The method according to claim 6, wherein: the method is operated in an upper computer of the tester.
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| 基于图像处理的自动布线机路线校正方法;任建新等;中国航天电子技术研究院科学技术委员会2020年学术年会优秀论文集;210-216 * |
| 基于嵌入式计算机的某型导弹地面电缆网自动测试仪;刘博等;自动化与仪表(第05期);26-28 * |
| 高效线束测试仪的设计;付宝军等;工业控制计算机;第22卷(第11期);100-102 * |
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