CN102298090A - Signal integrity test system and method - Google Patents
Signal integrity test system and method Download PDFInfo
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- CN102298090A CN102298090A CN2010102104280A CN201010210428A CN102298090A CN 102298090 A CN102298090 A CN 102298090A CN 2010102104280 A CN2010102104280 A CN 2010102104280A CN 201010210428 A CN201010210428 A CN 201010210428A CN 102298090 A CN102298090 A CN 102298090A
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Abstract
The invention provides a signal integrity test system, which comprises a series of functional modules. According to the system, by utilizing the functional modules, a wire to be tested and coordinates of test points on the circuit to be tested on an electronic element are acquired by analyzing a test file; and a mechanical arm is controlled by the system according to the coordinates of the test points to locate a probe of an oscilloscope or a time-domain reflectometer to a corresponding position on the electronic element. The system is also used for receiving the parameter value of a test parameter of a signal to be tested, obtained by the oscilloscope through testing, on each test point and comparing each parameter value with a preset reference value range. When some parameter value exceeds the set reference value range, the system receives the impedance value of the test point, obtained by the time-domain reflectometer through testing, and judges whether the impedance value of the test point is within the standard range of the impedance value of the circuit to be tested so as to judge whether the test point passes the test or not. The invention also provides a signal integrity test method. According to the invention, the test process can be simplified, and the test efficiency is improved.
Description
Technical field
The present invention relates to a kind of test macro and method, especially about a kind of measuring signal integrality system and method.
Background technology
Along with the raising of digital circuit operating rate, (Printed CircuitBoard, PCB) upward the transfer rate of signal is also more and more higher for printed circuit board (PCB).For PCB, the impedance of transmission line is a key factor that influences signal integrity.Correspondingly, the situation of change that for the PCB test, also needs impedance on the test signal transmission line.At present, the integrity test of PCB being gone up transmission signals is by the tester each transmission lines on the PCB to be carried out testing impedance, and upward circuit is various owing to PCB, manual testing's labour intensity is big, inefficiency, and be easy to generate mistake, the data of detection be manageability not also.
Summary of the invention
In view of above content, be necessary to propose a kind of measuring signal integrality system, can test the integrality that PCB goes up transmission signals automatically, simplify testing process, improve testing efficiency.
In addition, also be necessary to propose a kind of measuring signal integrality method, can test the integrality that PCB goes up transmission signals automatically, simplify testing process, improve testing efficiency.
A kind of measuring signal integrality system runs in the controlling computer, and this controlling computer links to each other with time-domain reflectomer with oscillograph by switch.This system comprises module, analysis module, control module and judge module is set.Module is set the test parameter of measured signal and the reference range of each test parameter are set.The test file of storing in the storer of analysis module analysis and Control computer obtains the coordinate of test point on circuit to be measured on the electronic component and each circuit to be measured.Control module navigates to oscillographic probe according to the probe grabbing device of the coordinate information control mechanical arm of test point the position of this test point place circuit to be measured on the electronic component.Judge module receives oscillograph and tests the parameter value of each test parameter of the measured signal that obtains in this test point, each test parameter is compared at the parameter value of this test point and the reference range of setting, judge whether each parameter value falls into corresponding reference range, when each parameter value all falls into corresponding reference range, judge that this test point is by test.Described control module also is used for as test parameter utilizing time-domain reflectomer to test the resistance value of this test point when the parameter value of this test point exceeds the reference range of setting.Described judge module is used to also judge whether the resistance value of this test point falls into the critical field of the resistance value of this circuit to be measured, to judge that whether this test point is by test.
A kind of measuring signal integrality method runs in the controlling computer, and this controlling computer links to each other with time-domain reflectomer with oscillograph by switch.This method comprises: the test parameter of measured signal and the reference range of each test parameter (A) are set; (B) test file of storing in the storer of analysis and Control computer obtains the coordinate of test point on circuit to be measured on the electronic component and each circuit to be measured; (C) oscillographic probe is navigated to the relevant position of this test point place circuit to be measured on the electronic component according to the probe grabbing device of the coordinate information of test point control mechanical arm; (D) receive oscillograph and test the parameter value of each test parameter of the measured signal that obtains, each test parameter is compared at the parameter value of this test point and the reference range of setting, judge whether each parameter value falls into corresponding reference range in this test point; (E) when each parameter value all falls into corresponding reference range, judge that this test point by test, directly changes step (G) over to, otherwise, when the parameter value of this test point exceeds the reference range of setting, utilize time-domain reflectomer to test the resistance value of this test point as test parameter; (F) judge whether the resistance value of this test point falls into the critical field of the resistance value of this circuit to be measured, to judge that whether this test point is by test; Reach and (G) judged whether other test point, if there is not the then flow process end of other test point, if other test point is arranged, the probe grabbing device of then controlling mechanical arm shifts out this electronic component with the probe of time-domain reflectomer, and returns step (C) other test point is tested.
Compared to prior art, measuring signal integrality system and method provided by the present invention utilizes oscillograph to test at each test point every test parameter to measured signal of circuit to be measured earlier, when test parameter exceeds preset range, utilize time-domain reflectomer that the impedance of corresponding test point is tested again, to judge that whether each test point has simplified test process by measuring signal integrality on this circuit to be measured.In addition, because whole test process utilizes mechanical arm that the probe of oscillograph and time domain reflectometer is positioned, improved testing efficiency.
Description of drawings
Fig. 1 is the hardware structure figure of measuring signal integrality of the present invention system preferred embodiment.
Fig. 2 is the functional block diagram of measuring signal integrality of the present invention system preferred embodiment.
Fig. 3 and Fig. 4 are the process flow diagrams of measuring signal integrality method of the present invention preferred embodiment.
The main element symbol description
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| Switch | 2 |
| Oscillograph | 3 |
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| PCB | 7 |
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| Module is set | 11 |
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Embodiment
As shown in Figure 1, be the hardware structure figure of measuring signal integrality of the present invention system 10 preferred embodiments.This measuring signal integrality system 10 runs in the controlling computer 1.This controlling computer 1 links to each other with time-domain reflectomer 4 with oscillograph 3 by switch 2.This controlling computer 1 also links to each other with mechanical arm 5.On this mechanical arm 5 probe grabbing device 6 is installed.
This measuring signal integrality system 10 control mechanical arms 5 utilize probe grabbing device 6 to grasp the probe of oscillographs 3 or time-domain reflectomer 4, and probe is navigated to printed circuit board (PCB) (PrintedCircuit Board, PCB) position to be measured on 7.The signal of 3 pairs of these location transmission to be measured of oscillograph is tested, and passes test result back controlling computer 1 by switch 2.The impedance of 4 pairs of these positions to be measured of time-domain reflectomer is tested, and passes test result back controlling computer 1 by switch 2.1 pair of above-mentioned test result of controlling computer is analyzed, and judges whether the signal of this location transmission to be measured is complete.
Described PCB 7 is placed horizontally on the test platform 8.In other embodiments, described PCB7 also can be other electronic component.
As shown in Figure 2, be the functional block diagram of measuring signal integrality of the present invention system 10 preferred embodiments.This measuring signal integrality system 10 comprises module 11, analysis module 12, control module 13, judge module 14 and memory module 15 is set.
3 pairs of these test points of oscillograph are tested, and obtain the parameter value of each test parameter of measured signal in this test point, and pass the parameter value that obtains back controlling computer 1 by switch 2.
The reference range that exceeds setting when certain test parameter at the parameter value of this test point, the probe grabbing device 6 of control module 13 control mechanical arms 5 is the probe playback of oscillograph 3, according to the probe grabbing device 6 of the coordinate information control mechanical arm 5 of this test point the probe of time-domain reflectomer 4 navigated to this test point position on the PCB 7 then.
4 pairs of these test points of time-domain reflectomer are tested, and obtain the resistance value of this test point, and pass the resistance value that obtains back controlling computer 1 by switch 2.
As shown in Figures 3 and 4, be the process flow diagram of measuring signal integrality method of the present invention preferred embodiment.It is pointed out that this process flow diagram is the example explanation so that a circuit to be measured on the PCB 7 is tested only.In addition, before enabling signal integrity testing system 10, to use preceding inspection, adjustment and calibration to oscillograph 3 and time domain reflectometer 4 earlier, to guarantee that oscillograph 3 and time domain reflectometer 4 can operate as normal.
Step S301 is provided with module 11 test parameter of measured signal and the reference range of each test parameter is set.In the present embodiment, this measured signal is a voltage signal.Described test parameter comprises overshoot (Overshoot), following (Undershoot), slope (Slew Rate), rise time (Rise Time), fall time (Fall Time), high voltage, the low-voltage etc. of dashing.
Step S303, analysis module 12 read the test file of storing in the storer 30 of controlling computer 1 20, analyze title, length and test point coordinate that this test file 20 obtains the circuit to be measured on the PCB 7.
Step S305, analysis module 12 read a circuit to be measured.
Step S307, analysis module 12 read the coordinate information of a test point of this circuit to be measured, for example (10 millimeters, 12 millimeters).
Step S309, control module 13 navigates to this test point position on the PCB 7 according to the probe grabbing device 6 of the coordinate information of this test point control mechanical arm 5 with the probe of oscillograph 3.For example, the probe grabbing device 6 of mechanical arm 5 navigates to the probe of oscillograph 3 that abscissa value is 10 millimeters on the PCB 7, and ordinate value is the test point of 12 millimeters correspondences.
Step S311,3 pairs of these test points of oscillograph are tested, and obtain the parameter value of each test parameter of measured signal in this test point, and pass the parameter value that obtains back controlling computer 1 by switch 2.
Step S313, judge module 14 compares each test parameter at the parameter value of this test point and the corresponding reference range of setting, judge whether each parameter value falls into corresponding reference range.If each test parameter all falls into corresponding reference range at the parameter value of this test point, then judge module 14 judges that this test point is by test.Each test parameter of memory module 15 storage in the parameter value of this test point and this test point by information such as tests to storer 30.Afterwards, flow process enters step S315.Otherwise, if a certain test parameter exceeds the reference range of setting at the parameter value of this test point, then memory module 15 each test parameter of storage in the information such as parameter value of this test point to storer 30.Afterwards, flow process enters step S317.For example, suppose that the high-tension reference range of voltage signal is [5,30], unit is a volt.If it is 4.5 volts that oscillograph 3 collects the high voltage of this test point, then flow process enters step S317.
Step S315, judge module 14 judges according to the information of test file 20 records whether this circuit to be measured also has other test point.If other test point is arranged, then flow process is returned step S307, continues other test point is tested.If there is not other test point, then flow process finishes.
Step S317, the probe grabbing device 6 of control module 13 control mechanical arms 5 is with the probe playback of oscillograph 3.The probe that the playback here refers to oscillograph 3 shifts out PCB 7, is placed into suitable position, for example not crawled preceding position of placing.
Step S319, control module 13 navigates to this test point position on the PCB 7 according to the probe grabbing device 6 of the coordinate information of this test point control mechanical arm 5 with the probe of time-domain reflectomer 4.For example, the probe grabbing device 6 of mechanical arm 5 navigates to the probe of time-domain reflectomer 4 that abscissa value is 10 millimeters on the PCB 7, and ordinate value is the test point of 12 millimeters correspondences.
Step S321,4 pairs of these test points of time-domain reflectomer are tested, and obtain the resistance value of this test point, and pass the resistance value that obtains back controlling computer 1 by switch 2.Judge module 14 judges whether this resistance value falls into the critical field of the resistance value of this circuit to be measured, to judge that whether this test point is by test.The resistance value of memory module 15 these test points of storage reaches information such as whether passing through test to storer 30.For example, suppose that the standard value range of this line impedance to be measured is [4,10], unit is ohm.If the impedance of this test point that time-domain reflectomer 4 collects is 3.5 ohm, then judge module 14 judges that the impedance of this test point is defective, not by test.
Step S323, judge module 14 judges according to the information of test file 20 records whether this circuit to be measured also has other test point.If there is not other test point, then flow process finishes.If other test point is arranged, then flow process enters step S325, and the probe grabbing device 6 of control module 13 control mechanical arms 5 is with the probe playback of time-domain reflectomer 4.The probe that the playback here refers to time-domain reflectomer 4 shifts out PCB 7, is placed into suitable position, for example not crawled preceding position of placing.Afterwards, flow process is returned step S307, continues other test point is tested.
Claims (9)
1. a measuring signal integrality system runs in the controlling computer, and this controlling computer links to each other with time-domain reflectomer with oscillograph by switch, it is characterized in that, this system comprises:
Module is set, is used to be provided with the test parameter of measured signal and the reference range of each test parameter;
Analysis module is used for the test file that the storer of analysis and Control computer is stored, and obtains the coordinate of test point on circuit to be measured on the electronic component and each circuit to be measured;
Control module is used for according to the probe grabbing device of the coordinate information of test point control mechanical arm oscillographic probe being navigated to the position of this test point place circuit to be measured on the electronic component;
Judge module, be used to receive oscillograph and test the parameter value of each test parameter of the measured signal that obtains in this test point, each test parameter is compared at the parameter value of this test point and the reference range of setting, judge whether each parameter value falls into corresponding reference range, when each parameter value all falls into corresponding reference range, judge that this test point is by test;
Described control module also is used for as test parameter utilizing time-domain reflectomer to test the resistance value of this test point when the parameter value of this test point exceeds the reference range of setting; And
Described judge module is used to also judge whether the resistance value of this test point falls into the critical field of the resistance value of this circuit to be measured, to judge that whether this test point is by test.
2. measuring signal integrality as claimed in claim 1 system is characterized in that the resistance value that described control module utilizes time-domain reflectomer to test this test point comprises:
The probe grabbing device of control mechanical arm shifts out this electronic component with oscillographic probe;
According to the probe grabbing device of the coordinate information of test point control mechanical arm the probe of time-domain reflectomer is navigated to this test point position on the electronic component; And
Receive time-domain reflectomer and test the resistance value of this test point that obtains.
3. measuring signal integrality as claimed in claim 1 system, it is characterized in that, this system also comprises memory module, is used to store each test parameter and whether passes through the information of test to described storer in the parameter value of this test point, resistance value and this test point of this test point.
4. measuring signal integrality as claimed in claim 1 system, it is characterized in that, when the resistance value of this test point falls into the critical field of resistance value of this circuit to be measured, judge module judges that this test point is by test, perhaps when the resistance value of this test point exceeded the critical field of resistance value of this circuit to be measured, judge module judged that this test point is by test.
5. a measuring signal integrality method runs in the controlling computer, and this controlling computer links to each other with time-domain reflectomer with oscillograph by switch, it is characterized in that, this method comprises:
(A) test parameter of measured signal and the reference range of each test parameter are set;
(B) test file of storing in the storer of analysis and Control computer obtains the coordinate of test point on circuit to be measured on the electronic component and each circuit to be measured;
(C) oscillographic probe is navigated to the relevant position of this test point place circuit to be measured on the electronic component according to the probe grabbing device of the coordinate information of test point control mechanical arm;
(D) receive oscillograph and test the parameter value of each test parameter of the measured signal that obtains, each test parameter is compared at the parameter value of this test point and the reference range of setting, judge whether each parameter value falls into corresponding reference range in this test point;
(E) when each parameter value all falls into corresponding reference range, judge that this test point by test, directly changes step (G) over to, otherwise, when the parameter value of this test point exceeds the reference range of setting, utilize time-domain reflectomer to test the resistance value of this test point as test parameter;
(F) judge whether the resistance value of this test point falls into the critical field of the resistance value of this circuit to be measured, to judge that whether this test point is by test; And
(G) judged whether other test point, if there is not the then flow process end of other test point, if other test point is arranged, the probe grabbing device of then controlling mechanical arm shifts out this electronic component with the probe of time-domain reflectomer, and returns step (C) other test point is tested.
6. measuring signal integrality method as claimed in claim 5 is characterized in that, the resistance value that utilizes time-domain reflectomer to test this test point in the step (E) may further comprise the steps:
(E1) the probe grabbing device of control mechanical arm shifts out this electronic component with oscillographic probe;
(E2) according to the probe grabbing device of the coordinate information of test point control mechanical arm the probe of time-domain reflectomer is navigated to this test point position on the electronic component; And
(E3) receive the resistance value that time-domain reflectomer is tested this test point that obtains.
7. measuring signal integrality method as claimed in claim 5 is characterized in that, this method also comprises step:
Store each test parameter and whether pass through the information of test to described storer in the parameter value of this test point, resistance value and this test point of this test point.
8. measuring signal integrality method as claimed in claim 5, it is characterized in that, when step (F) judges that the resistance value of this test point falls into the critical field of resistance value of this circuit to be measured, then this test point is by test, perhaps when step (F) judged that the resistance value of this test point exceeds the critical field of resistance value of this circuit to be measured, then this test point was by test.
9. measuring signal integrality method as claimed in claim 5 is characterized in that the test parameter of described measured signal comprises overshoot, Xia Chong, slope, rise time, fall time, high voltage and low-voltage.
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| CN2010102104280A CN102298090A (en) | 2010-06-28 | 2010-06-28 | Signal integrity test system and method |
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Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104251966A (en) * | 2013-06-25 | 2014-12-31 | 鸿富锦精密工业（深圳）有限公司 | Automation measurement system and method |
| CN104345260A (en) * | 2013-08-01 | 2015-02-11 | 鸿富锦精密工业（深圳）有限公司 | Signal completeness automatic testing system and method |
| CN106501620A (en) * | 2016-10-21 | 2017-03-15 | 郑州云海信息技术有限公司 | A kind of serial signal method of testing, oscillograph and system |
| CN106932643A (en) * | 2017-03-30 | 2017-07-07 | 深圳市立德通讯器材有限公司 | A kind of binding effect detection device and detection method for AMOLED products |
| CN107527577A (en) * | 2017-06-26 | 2017-12-29 | 武汉华星光电技术有限公司 | The signal testing servicing unit and signal testing method of display panel |
| CN109613355A (en) * | 2018-11-30 | 2019-04-12 | 苏州市运泰利自动化设备有限公司 | The Auto-Test System and method of antenna product |
| CN110850269A (en) * | 2019-10-11 | 2020-02-28 | 深圳市元征科技股份有限公司 | Test system, test method, control device, and storage medium |
| CN111460754A (en) * | 2019-01-03 | 2020-07-28 | 和硕联合科技股份有限公司 | Impedance checking method |
| CN112946364A (en) * | 2021-02-03 | 2021-06-11 | 神威超算(北京)科技有限公司 | Resistance test pen and resistance test method |
| CN113985255A (en) * | 2021-10-29 | 2022-01-28 | 北京航星科技有限公司 | Circuit board static test system and test method |
| CN116203396A (en) * | 2023-03-09 | 2023-06-02 | 深圳市燕麦科技股份有限公司 | Missing part test method and device and related equipment |
| WO2023216397A1 (en) * | 2022-05-12 | 2023-11-16 | 苏州泰思特电子科技有限公司 | Electrostatic automatic test system based on vision hybrid positioning |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104251966A (en) * | 2013-06-25 | 2014-12-31 | 鸿富锦精密工业（深圳）有限公司 | Automation measurement system and method |
| CN104345260A (en) * | 2013-08-01 | 2015-02-11 | 鸿富锦精密工业（深圳）有限公司 | Signal completeness automatic testing system and method |
| CN106501620A (en) * | 2016-10-21 | 2017-03-15 | 郑州云海信息技术有限公司 | A kind of serial signal method of testing, oscillograph and system |
| CN106932643A (en) * | 2017-03-30 | 2017-07-07 | 深圳市立德通讯器材有限公司 | A kind of binding effect detection device and detection method for AMOLED products |
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| CN110850269A (en) * | 2019-10-11 | 2020-02-28 | 深圳市元征科技股份有限公司 | Test system, test method, control device, and storage medium |
| CN112946364A (en) * | 2021-02-03 | 2021-06-11 | 神威超算(北京)科技有限公司 | Resistance test pen and resistance test method |
| CN113985255A (en) * | 2021-10-29 | 2022-01-28 | 北京航星科技有限公司 | Circuit board static test system and test method |
| WO2023216397A1 (en) * | 2022-05-12 | 2023-11-16 | 苏州泰思特电子科技有限公司 | Electrostatic automatic test system based on vision hybrid positioning |
| CN116203396A (en) * | 2023-03-09 | 2023-06-02 | 深圳市燕麦科技股份有限公司 | Missing part test method and device and related equipment |
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