CN113426683B - MiniLED's detection sorting system - Google Patents

MiniLED's detection sorting system Download PDF

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Publication number
CN113426683B
CN113426683B CN202110623863.4A CN202110623863A CN113426683B CN 113426683 B CN113426683 B CN 113426683B CN 202110623863 A CN202110623863 A CN 202110623863A CN 113426683 B CN113426683 B CN 113426683B
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chip
blue film
tester
chips
sorting
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CN113426683A (en
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魏伟
黄飞
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Jiangsu Wenyang Semiconductor Technology Co ltd
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Jiangsu Wenyang Semiconductor Technology Co ltd
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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/342—Sorting according to other particular properties according to optical properties, e.g. colour
    • B07C5/3422—Sorting according to other particular properties according to optical properties, e.g. colour using video scanning devices, e.g. TV-cameras
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36—Sorting apparatus characterised by the means used for distribution
    • B07C5/361—Processing or control devices therefor, e.g. escort memory
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36—Sorting apparatus characterised by the means used for distribution
    • B07C5/361—Processing or control devices therefor, e.g. escort memory
    • B07C5/362—Separating or distributor mechanisms
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36—Sorting apparatus characterised by the means used for distribution
    • B07C5/38—Collecting or arranging articles in groups
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C2501/00—Sorting according to a characteristic or feature of the articles or material to be sorted
    • B07C2501/0063—Using robots

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The invention provides a detection and sorting system of MiniLED, which comprises a linkage instrument, a chip tester, a chip sorter, a data transmission system and a time-saving computing system. According to the invention, the chip tester and the chip sorter are linked through the linkage instrument, and the optimal test and sorting distribution scheme can be obtained, so that the manual feeding and discharging are replaced, the manpower is saved, the speed is improved, the efficiency is improved, the cost is reduced, the operation time is shortened, the automation is realized, the profit of a test sorting manufacturer is increased, and the method has a great market space and is worthy of popularization and use in the whole industry.

Description

MiniLED's detection sorting system
Technical Field
The invention belongs to the technical field of LED detection, and particularly relates to a detection and sorting system for MiniLED.
Background
The point separation device of the LEDs is used for separating the LED arrays on the blue film according to the LEDs with the same optical parameters and electrical parameters. In general, the point separation equipment of the LED is divided into two types, namely a chip tester and a chip sorter, which are respectively two independent machines, and after the blue film with the chip is tested by the chip tester, the blue film with the chip needs to be manually taken down, and the blue film with the chip is placed on an upper area of the chip sorter for secondary sorting. Therefore, the manual operation needs to be performed twice, the chip sorter and the chip tester are not linked, the degree of automation is not high, and accordingly the labor waste is serious, and the overall efficiency is low.
Disclosure of Invention
In order to solve the problems, the invention provides a detection and separation system of a MiniLED, which can link a chip sorter with a chip tester, thereby greatly improving the overall automation degree of the system.
In order to achieve the above purpose, the present invention provides the following technical solutions:
the detecting and sorting system of the MiniLED comprises a linkage instrument, a chip tester, a chip sorter, a data transmission system and a time-saving computing system; the chip tester is used for testing a plurality of array chips on a single blue film, the chip sorter is used for sorting the tested array chips on the single blue film according to the data of the chip tester, and the linkage instrument is used for transmitting the blue film with the chips to be sorted to the chip tester and transmitting the blue film with the chips to be sorted to the chip sorter after the test is completed; the data transmission system is used for mutually transmitting test data on the blue film with the chip, which is operated on the linkage instrument, the chip tester and the chip sorter; the time-saving computing system is used for computing and combining system parameters according to the mutual position relation of the linkage instrument, the chip tester and the chip sorter to distribute the blue film with the chip to an optimal chip tester or the chip sorter, the linkage instrument transmits the blue film with the chip to be sorted to the optimal chip tester for testing, and transmits the blue film with the tested chip to be sorted to the optimal chip sorter after the testing is finished, so that the total time for testing and sorting the whole chip is minimum.
Further, the linkage instrument includes: the system comprises a mechanical arm, a camera, a moving system, a positioning system, a mechanical control system, a linkage instrument supporting structure, a mechanical moving system and a linkage instrument storage area; the mechanical moving system is arranged at the bottom of the linkage instrument to drive the linkage instrument to integrally move, and the support structure of the linkage instrument is arranged above the mechanical moving system; the positioning system is connected to the linkage instrument supporting structure and used for positioning the linkage instrument; the moving system is connected with the mechanical arm and controls the mechanical arm to move in the horizontal direction; the linkage instrument storage area is arranged on the linkage instrument supporting structure.
Further, the time-saving computing system comprehensively judges comprehensive test time according to chip demand signals sent by the chip testers, the test speed of each chip tester, the moving speed of the linkage instrument, the loading and unloading time of the linkage instrument for each tester and the relative distance between the linkage instrument and different chip testers; the time-saving computing system comprehensively judges comprehensive sorting time according to chip demand signals sent by the chip sorters, sorting speed of the chip sorters, the number of chips on a blue film, moving speed of the linkage instrument, feeding and discharging time of the linkage instrument for the sorters and relative distances between the linkage instrument and different chip sorters; and calculating the total time for testing and sorting the whole chip based on the comprehensive testing time and the comprehensive sorting time, so that the total time is minimum.
Further, the total time t=tc+tf used for testing and sorting the whole chip, tc is the comprehensive testing time, tf is the comprehensive sorting time; the comprehensive test time is calculated by the following formula:
tc＝nc/vcn+lcn/vcl+tcn
vcn is the test speed of the nth tester for testing one chip, nc is the number of chips on the blue film, lcn is the relative distance between the linkage instrument and the nth chip tester, vcl is the moving speed of the linkage instrument, and tcn is the loading and unloading time of the linkage instrument for the nth tester;
the comprehensive sorting time is calculated by the following formula:
tf＝nf/vfn+lfn/vfl+tfn
vfn the sorting speed of the nth sorter for sorting one chip, nf the number of chips on the blue film, lfn the relative distance between the linkage instrument and the nth chip sorter, vfl the moving speed of the linkage instrument, and tfn the loading and unloading time of the linkage instrument for the nth sorter.
Further, the chip tester includes: the optical detector comprises an optical detector head, a probe, a blue film moving device, a positioning component, a tester supporting structure, a moving motor and an optical isolator element, wherein the tester supporting structure is arranged at the bottom of a chip tester, the optical isolator element is arranged at the periphery of the chip tester, the moving motor is connected with the blue film moving device and used for driving the blue film moving device to move, the positioning component is arranged on the blue film moving device, and the optical detector head and the probe are used for testing the chip.
Further, the chip tester is used for testing optical or/and structural or/and electrical parameters of the chip.
Further, the chip sorter includes: the device comprises a camera, a sucker, a rotary swing arm, a fixing device, a motor, a flying needle, a blue film storage area with chips to be sorted, a blue film storage area with the chips to be sorted, a blue film working area with the chips to be sorted, a sorter supporting structure, an air channel and a flying needle control system, wherein the sorter supporting structure is arranged at the bottom of the sorter, the motor is connected with the rotary swing arm and used for driving the rotary swing arm to swing back and forth, the tail end of the rotary swing arm is connected with the sucker, the sucker is connected with the air channel, the fixing device is two and is respectively used for fixing the blue film working area with the chips to be sorted and the blue film working area with the chips to be sorted, the blue film storage area with the chips to be sorted is arranged at the top of the blue film working area with the chips to be sorted, and the blue film storage area with the chips to be sorted is arranged at the top of the blue film working area with the chips to be sorted.
Further, the chip sorter selects the chips according to the data about the chips sent by the chip tester and the linkage instrument and the optical or/and structure or/and electrical parameters of the same specification according to the level requirements of the products.
Further, the optical or/and structure or/and electrical parameters comprise peak wavelength or/and dominant wavelength or/and voltage or/and current or/and optical power or/and lumen or/and spectrum curve or/and half-wave width or/and chromaticity coordinates or/and size of the chip.
Compared with the prior art, the invention has the following advantages and beneficial effects:
according to the invention, the chip tester and the chip sorter are linked through the linkage instrument, and the optimal test and sorting distribution scheme can be obtained, so that the manual feeding and discharging are replaced, the manpower is saved, the speed is improved, the efficiency is improved, the cost is reduced, the operation time is shortened, the automation is realized, the profit of a test sorting manufacturer is increased, and the method has a great market space and is worthy of popularization and use in the whole industry.
Drawings
Fig. 1 is a schematic diagram of the overall structure of a detection and sorting system for minileds provided by the invention.
Fig. 2 is a side view of a chip tester.
Fig. 3 is a side view of a chip sorter.
Fig. 4 is a side view of the linkage.
Reference numerals illustrate:
1. the system comprises a linkage meter, 11, a mechanical arm, 12, a camera, 13, a moving system, 14, a positioning system, 15, a mechanical control system, 16, a linkage meter supporting structure, 17, a mechanical moving system, 18, a linkage meter storage area, 2, a chip, 3, a blue film, 4, a chip tester, 41, a light detection head, 42, a probe, 43, a blue film moving device, 44, a positioning component, 45, a tester supporting structure, 46, a moving motor, 47, an optical isolator device, 5, a chip sorter, 51, a camera, 52, a sucker, 53, a rotary swing arm, 54, a fixing device, 55, a motor, 56, a flying needle, 57, a blue film storage area with a chip to be sorted, 58, a blue film working area with a chip to be sorted, 59, a blue film working area with a chip to be sorted, 511, a sorter supporting structure, 512, a gas path, 6, a product warehouse outlet area, a data transmission system 7 and a time-saving computing system 8.
Detailed Description
The technical scheme provided by the present invention will be described in detail with reference to the following specific examples, and it should be understood that the following specific examples are only for illustrating the present invention and are not intended to limit the scope of the present invention.
The invention provides a detection and sorting system of MiniLED, which at least comprises a linkage instrument 1, a plurality of chip testers 4, a plurality of chip sorters 5, a data transmission system 7 and a time-saving computing system 8 as shown in figure 1. In the figure, a column of chip testers 4 is arranged on the left side, a column of chip sorters 5 is arranged on the right side, a linkage instrument 1 is arranged in the middle, and a warehouse-out area 6 is arranged at one end of the system. It should be noted that, the number and arrangement of the chip testers and the chip sorters in the figure are only examples, and in practical application, the number and distribution of the chip testers and the chip sorters can be adjusted according to the actual needs and the environment where the system is located. The data transmission system can mutually transmit test data on the blue film with the chip, which are operated on the linkage instrument, the chip tester and the chip sorter. The data transmission system 7 is only drawn on the chip sorter 5, not shown on the rest of the devices, but can also be provided on the linkage, chip tester 4, using suitable transmission chips, combined with conventional transmission functions. In the figure, the time-saving computing system 8 is used for computing and distributing the blue film 3 with the chip 2 to the optimal chip tester 4 or chip sorter 5 according to the mutual position relation of the linkage instrument 1, the chip tester 4 and the chip sorter 5, so that the total time for testing and sorting the whole chip is minimum. In the figure, the time-saving computing system 8 is arranged on the linkage instrument 1, but can be independently arranged or arranged in a remote data center according to the requirement. The positioning system 7 is a wireless positioning system 71 or a transmission gear positioning system 72, the wireless positioning system is a visible light positioning system 711 or an infrared positioning system 712 or a Bluetooth positioning system 713, the positioning system is used for positioning the relative position relationship of the linkage instrument, the tester and the sorter, and the positioning system needs to respectively set a corresponding visible light positioning system 711 or an infrared positioning system 712 or a Bluetooth positioning system 713 on the linkage instrument, the tester and the sorter.
As shown in fig. 2, the chip tester 4 includes at least an optical probe 41, a probe 42, a blue film moving device 43, a positioning member 44, a tester support structure 45, a moving motor 46, and an optical isolator element 47. The tester support structure 45 is arranged at the bottom of the chip tester 4 for supporting the blue film with the chips to be sorted. In this example, the tester support mechanism employs a support table. An optical isolator element 47 is provided at the periphery of the chip tester 4 for isolating ambient light from the glare and spectrum of light to be tested. The moving motor 46 is connected to the blue film moving device 43 for driving the blue film moving device 43 to move. The blue film moving device 43 is provided with a positioning component 44 for realizing the positioning of the blue film moving device 43, the optical probe 41 is positioned in the optical isolator device 47, the optical probe 41 is positioned on the upper parts of the probe 42, the blue film moving device 43 and the positioning component 44, the optical probe 41 is used for testing the photoelectric parameters of the LED, the probe 42 is positioned on the upper parts of the blue film moving device 43 and the positioning component 44, and the probe 42 is used for connecting the electrode of the chip to be tested to supply power to the LED. The probes 42 are used to test the LED chips 48. The chip tester 4 is used to test a plurality of array chips 2 of a single blue film 3. The chip tester 4 tests the optical or/and structural or/and electrical parameters of the chip 2, which parameters include at least the peak wavelength or/and dominant wavelength or/and voltage or/and current or/and optical power or/and lumen or/and spectral curve or/and half-bandwidth or/and chromaticity coordinates or/and dimensions of the chip.
As shown in fig. 3, the linkage apparatus 1 at least includes a robot arm 11, a camera 12, a moving system 13, a positioning system 14, a mechanical control system 15, a linkage apparatus support structure 16, a mechanical moving system 17, and a linkage apparatus storage area 18. The mechanical moving system 17 is arranged at the bottom of the linkage instrument 1 and is used for driving the linkage instrument 1 to integrally move. The linkage support structure 16 is disposed above the mechanical moving system 17 and is used for supporting the main body of the linkage 1, and preferably adopts a structure with a simple structure and a proper supporting force, and in this example, the mechanism is a supporting table. The positioning system 14 is coupled to the linkage support structure 16 for positioning the linkage, using conventional positioning modules. The moving system 13 is used for providing moving power for the mechanical arm, controlling the mechanical arm to move horizontally, and can adopt a cylinder structure which is easy to rotate, such as a rotating shaft and the like. The robotic arm may employ a robotic arm of the prior art that is convenient for gripping a blue film on which the chip to be sorted is disposed. The camera 12 is arranged at the top of the linkage instrument 1, is used for shooting and collecting the positions of the chip sorter 5 and the chip tester 4, and is sent to the time-saving computing system. A gang tool storage area 18 is provided on the gang tool support structure 16 for placing a blue film with chips to be sorted or a blue film with sorted chips. The linkage instrument 1 transmits the blue film 3 with the to-be-tested MiniLED chips 2 to the chip tester 4, and after the testing is completed, the linkage instrument 1 transmits the blue film 3 with the tested to-be-sorted MiniLED chips 2 to the chip sorter 5.
The time-saving computing system in the linkage instrument 1 comprehensively judges the chip tester 4 corresponding to the comprehensive test minimum time according to the chip demand signal sent by the chip tester 4, the test speed vcn of the nth chip tester 4, the chip number nc on the blue film, the moving speed vcl of the linkage instrument 1, the loading and unloading time tcn of the linkage instrument 1 aiming at the nth chip tester 4 and the relative distance lcn of the linkage instrument 1 and different chip testers 4, wherein the comprehensive test time is tc=nc/vcn+ lcn/vcl + tcn, vcn represents the test speed of the nth chip tester 4 for testing one chip, lcn represents the relative distance between the linkage instrument 1 and the nth chip tester 4, vcn, lcn and tcn of the different chip testers 4 are led into a formula tc, the linkage instrument 1 transmits the blue film of the MiniLED chip to be sorted to the chip tester 4 corresponding to the comprehensive test minimum time for testing; the linkage instrument 1 comprehensively judges the chip sorter 5 corresponding to the minimum comprehensive sorting time according to the chip demand signal sent by the chip sorter 5, the sorting speed vfn of the nth chip sorter 5, the chip number nf on the blue film, the moving speed vfl of the linkage instrument 1, the loading and unloading time tfn of the linkage instrument 1 aiming at the nth sorter and the relative distance lfn between the linkage instrument 1 and different chip sorters 5, wherein the comprehensive sorting time is tf=nf/vfn + lfn/vfl + tfn, vfn represents the sorting speed of the nth sorter 5 for sorting one chip, lfn represents the relative distance between the linkage instrument and the nth chip sorter 5, and the vfn, lfn and tfn of the different chip sorters 5 are brought into a formula tf to comprehensively compare to obtain the sorter 5 corresponding to the minimum; and calculating total time t=tc+tf used for testing and sorting the whole chip, and changing different parameters differently so as to minimize t time and obtain an optimal allocation scheme of the tester and the sorter based on the minimum value of the total time. Of course, instead of calculating the total time, the current minimum test time tc and the sorting time tf may be calculated separately, and the optimum tester and sorter may be selected only based on the minimum test time or the minimum sorting time.
As shown in fig. 4, the chip sorter at least comprises a camera 51, a suction cup 52, a rotary swing arm 53, a fixing device 54, a motor 55, a flying needle 56, a blue film storage area 57 with chips to be sorted, a blue film storage area 58 with chips to be sorted, a blue film working area 59 with chips to be sorted, a blue film working area 510 with chips to be sorted, a sorter support structure 511, an air channel 512 and a flying needle control system 513. Wherein a sorter support structure 511 is provided at the bottom of the sorter for supporting the various components thereon. A motor 55 is connected to the rotary swing arm 53 for driving the rotary swing arm 53 to swing back and forth. The end of the driving rotary swing arm 53 is connected with a sucker 52 which is connected with an air path 512. The two fixing devices 54 are used for fixing the blue film working area 59 with the chips to be sorted and the blue film working area 510 with the sorted chips respectively. A blue film storage area 57 with chips to be sorted is provided on top of the blue film working area 59 with chips to be sorted, and a blue film storage area 58 with chips to be sorted is provided on top of the blue film working area 510 with chips to be sorted. The camera 51 is arranged at the top of the chip sorter and is used for positioning the chip and detecting the appearance of the chip, the flying needle 56 is connected with the flying needle control system 513, and the flying needle 56 is positioned at the back of the blue film working area 59 with the chip to be sorted. The flying needle control system is used for controlling the flying needle to work. The chip sorter 5 sorts the plurality of array chips 2 whose single blue film 3 has been tested, based on the data of the chip tester 4. Specifically, the chip sorter 5 selects the chip 2 according to the data about the chip 2 sent by the chip tester 4 and the linkage instrument 1, and according to the level requirement of the product, according to the optical or/and structure or/and electrical parameters (the parameters at least include peak wavelength or/and dominant wavelength or/and voltage or/and current or/and optical power or/and lumens or/and spectral curve or/and half-wave width or/and chromaticity coordinates or/and size of the chip). The ganger 1 transfers the blue film 3 with the tested sorted MiniLED chips 2 to the product out-stock area 6.
The technical means disclosed by the scheme of the invention is not limited to the technical means disclosed by the embodiment, and also comprises the technical scheme formed by any combination of the technical features. It should be noted that modifications and adaptations to the invention may occur to one skilled in the art without departing from the principles of the present invention and are intended to be within the scope of the present invention.

Claims (7)

1. The detecting and sorting system of the MiniLED is characterized in that: the system comprises a linkage instrument, a chip tester, a chip sorter, a data transmission system and a time-saving computing system; the chip tester is used for testing a plurality of array chips on a single blue film, the chip sorter is used for sorting the tested array chips on the single blue film according to the data of the chip tester, and the linkage instrument is used for transmitting the blue film with the chips to be sorted to the chip tester and transmitting the blue film with the chips to be sorted to the chip sorter after the test is completed; the data transmission system is used for mutually transmitting test data on the blue film with the chip, which is operated on the linkage instrument, the chip tester and the chip sorter; the time-saving computing system is used for computing and combining system parameters according to the mutual position relation of the linkage instrument, the chip tester and the chip sorter to distribute the blue film with the chip to an optimal chip tester or the chip sorter, the linkage instrument transmits the blue film with the chip to be sorted to the optimal chip tester for testing, and transmits the blue film with the tested chip to be sorted to the optimal chip sorter after the testing is finished, so that the total time for testing and sorting the whole chip is minimum;
the time-saving computing system comprehensively judges comprehensive test time according to chip demand signals sent by the chip testers, the test speed of each chip tester, the moving speed of the linkage instrument, the feeding and discharging time of the linkage instrument for each tester and the relative distance between the linkage instrument and different chip testers; the time-saving computing system comprehensively judges comprehensive sorting time according to chip demand signals sent by the chip sorters, sorting speed of the chip sorters, the number of chips on a blue film, moving speed of the linkage instrument, feeding and discharging time of the linkage instrument for the sorters and relative distances between the linkage instrument and different chip sorters; calculating the total time for testing and sorting the whole chip based on the comprehensive testing time and the comprehensive sorting time, so that the total time is minimum;
total time t=t for whole chip test sorting c +t f ，t c For the comprehensive test time, t f The comprehensive sorting time is obtained; the comprehensive test time is calculated by the following formula:
t c =n c /v cn +l cn /v cl +t cn
v cn for the test speed of the test chip of the nth tester, n c For the number of chips on blue film, l cn V is the relative distance between the linkage instrument and the nth chip tester cl Is the moving speed of the linkage instrument, t cn The feeding and discharging time of the linkage instrument for the nth tester is set;
the comprehensive sorting time is calculated by the following formula:
t f =n f /v fn +l fn /v fl +t fn
v fn sorting speed of sorting chips for n-th sorter, n f For the number of chips on blue film, l fn V is the relative distance between the linkage instrument and the nth chip sorter fl Is the moving speed of the linkage instrument, t fn Is a linkage needleAnd feeding and discharging time of the nth sorter.
2. The MiniLED detection and sorting system of claim 1, wherein: the linkage instrument comprises: the system comprises a mechanical arm, a camera, a moving system, a positioning system, a mechanical control system, a linkage instrument supporting structure, a mechanical moving system and a linkage instrument storage area; the mechanical moving system is arranged at the bottom of the linkage instrument to drive the linkage instrument to integrally move, and the support structure of the linkage instrument is arranged above the mechanical moving system; the positioning system is connected to the linkage instrument supporting structure and used for positioning the linkage instrument; the moving system is connected with the mechanical arm and controls the mechanical arm to move in the horizontal direction; the linkage instrument storage area is arranged on the linkage instrument supporting structure.
3. The MiniLED detection and sorting system of claim 1, wherein: the chip tester includes: the optical detector comprises an optical detector head, a probe, a blue film moving device, a positioning component, a tester supporting structure, a moving motor and an optical isolator element, wherein the tester supporting structure is arranged at the bottom of a chip tester, the optical isolator element is arranged at the periphery of the chip tester, the moving motor is connected with the blue film moving device and used for driving the blue film moving device to move, the positioning component is arranged on the blue film moving device, and the optical detector head and the probe are used for testing the chip.
4. The MiniLED detection and sorting system of claim 3, wherein: the chip tester is used for testing at least one of optical parameters, structural parameters and electrical parameters of the chip.
5. The MiniLED detection and sorting system of claim 1, wherein: the chip sorter includes: the device comprises a camera, a sucker, a rotary swing arm, a fixing device, a motor, a flying needle, a blue film storage area with chips to be sorted, a blue film storage area with the chips to be sorted, a blue film working area with the chips to be sorted, a sorter supporting structure, an air channel and a flying needle control system, wherein the sorter supporting structure is arranged at the bottom of the sorter, the motor is connected with the rotary swing arm and used for driving the rotary swing arm to swing back and forth, the tail end of the rotary swing arm is connected with the sucker, the sucker is connected with the air channel, the fixing device is two and is respectively used for fixing the blue film working area with the chips to be sorted and the blue film working area with the chips to be sorted, the blue film storage area with the chips to be sorted is arranged at the top of the blue film working area with the chips to be sorted, and the blue film storage area with the chips to be sorted is arranged at the top of the blue film working area with the chips to be sorted.
6. The MiniLED detection and sorting system of claim 5, wherein: the chip sorter selects the chips according to the data about the chips sent by the chip tester and the linkage tester and the parameters of the same specification according to the level requirements of the products, wherein the parameters of the same specification comprise at least one of optical parameters, structural parameters and electrical parameters.
7. The MiniLED detection and sorting system of claim 4 or 6, wherein: the parameters include: peak wavelength, dominant wavelength, voltage, current, optical power, lumens, spectral curve, half-bandwidth, chromaticity coordinates, size of the chip.
CN202110623863.4A 2021-06-04 2021-06-04 MiniLED's detection sorting system Active CN113426683B (en)

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