CN113311232A - Pin type electronic device attribute value quick tester - Google Patents
Pin type electronic device attribute value quick tester Download PDFInfo
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- CN113311232A CN113311232A CN202110411578.6A CN202110411578A CN113311232A CN 113311232 A CN113311232 A CN 113311232A CN 202110411578 A CN202110411578 A CN 202110411578A CN 113311232 A CN113311232 A CN 113311232A
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- cooling
- type electronic
- detection
- shell
- block
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- 238000001816 cooling Methods 0.000 claims abstract description 65
- 238000001514 detection method Methods 0.000 claims abstract description 58
- 230000007246 mechanism Effects 0.000 claims abstract description 23
- 239000004065 semiconductor Substances 0.000 claims abstract description 20
- 238000012545 processing Methods 0.000 claims abstract description 18
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 15
- 239000000110 cooling liquid Substances 0.000 claims abstract description 11
- 238000005192 partition Methods 0.000 claims description 13
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 12
- 229910052802 copper Inorganic materials 0.000 claims description 12
- 239000010949 copper Substances 0.000 claims description 12
- 210000000078 claw Anatomy 0.000 claims description 10
- 125000006850 spacer group Chemical group 0.000 claims description 10
- 230000001681 protective effect Effects 0.000 claims description 4
- 238000009434 installation Methods 0.000 claims description 3
- 230000002093 peripheral effect Effects 0.000 claims 1
- 239000000523 sample Substances 0.000 abstract description 10
- 230000000694 effects Effects 0.000 abstract description 8
- 238000004377 microelectronic Methods 0.000 abstract description 8
- 238000013021 overheating Methods 0.000 abstract description 3
- 238000012360 testing method Methods 0.000 description 9
- 238000012546 transfer Methods 0.000 description 9
- 238000000034 method Methods 0.000 description 7
- 239000003381 stabilizer Substances 0.000 description 7
- 238000005516 engineering process Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 238000005070 sampling Methods 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000002826 coolant Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000005057 refrigeration Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2611—Measuring inductance
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/20—Modifications to facilitate cooling, ventilating, or heating
- H05K7/20218—Modifications to facilitate cooling, ventilating, or heating using a liquid coolant without phase change in electronic enclosures
- H05K7/20272—Accessories for moving fluid, for expanding fluid, for connecting fluid conduits, for distributing fluid, for removing gas or for preventing leakage, e.g. pumps, tanks or manifolds
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Thermal Sciences (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention belongs to the technical field of microelectronics, and particularly relates to a pin type electronic device attribute value rapid tester which comprises a shell, wherein a top block is arranged at the top end of the shell, the periphery of the top block is an inclined plane, a placing end is arranged at the top end of the top block and comprises a detection strip groove formed in the top block, two ends of the detection strip groove are fixedly provided with a probe block, the top end of the probe block is provided with a probe groove, two sides of the top block are provided with lifting mechanisms, a detection assembly is fixedly arranged in the shell and consists of a capacitance detection module, an inductance detection module and a resistance detection module, and a central processing unit is fixedly arranged on one side, close to the detection assembly, in the shell. Through the arranged water cooling mechanism, the semiconductor refrigerator can be used for effectively cooling the central processing unit and the detection assembly by matching with the water cooling effect of the cooling liquid and the water cooling pipe, so that the overheating phenomenon is avoided.
Description
Technical Field
The invention relates to the technical field of microelectronics, in particular to a pin type electronic device attribute value rapid tester.
Background
Microelectronics is a new technology developed with integrated circuits, especially very large scale integrated circuits. The microelectronic technology includes a series of special technologies such as system circuit design, device physics, process technology, material preparation, automatic test, packaging and assembly, and is the sum of all process technologies in microelectronics. The key to microelectronics is the study of how integrated circuits operate and how they are actually fabricated. The development of integrated circuits relies on the constant evolution of semiconductor devices. The micro-electronic technology can realize the processing and the transmission of information through the micro-electronic motion in a solid in a nano-scale ultra-small area and has good integration. At present, a quick testing device for electronic devices without corresponding pins needs to distinguish the values by memorizing the numerical values of a resistor body color ring and a reactor capacitor body or to obtain the values by looking up related technical data, and the color ring is unclear or causes inconvenience when being used in large quantities.
Through retrieval, a chinese patent application No. CN2018111537028 discloses a power electronic device testing apparatus, which includes a power module, a system control unit, an impedance testing unit, a low voltage testing unit, a trigger reporting unit, an output control unit, a sampling unit, and an external device. The power module is electrically connected with an external alternating current to provide power for the device, and the system control unit is connected with the impedance test unit, the voltage test unit, the trigger return unit, the output control unit and the sampling unit to control the output of other units. The problem can be solved to this patent, but this patent is at long-time operation in-process, and test unit and control processing unit all produce overheated phenomenon easily to the operation that influences the detection operation, so have certain limitation.
Disclosure of Invention
The invention aims to solve the problems in the prior art and provides a fast tester for the attribute values of pin-type electronic devices.
In order to achieve the above object, the present invention adopts the following technical solutions.
The fast tester for the attribute values of the pin-type electronic devices comprises a shell, wherein a top block is arranged on the top end of the shell, the periphery of the top block is an inclined plane, a placing end arranged on the top end of the top block comprises a detection strip groove formed in the top block, two ends of the detection strip groove are fixedly provided with a detection point block, the top end of the detection point block is provided with a detection point groove, two sides of the top block are provided with a lifting mechanism, a detection assembly is fixedly arranged in the shell and comprises a capacitance detection module, an inductance detection module and a resistance detection module, a central processing unit is fixedly arranged on one side of the shell close to the detection assembly, a cooling mechanism is fixedly arranged on the outer wall of one side of the shell, and a display screen is arranged on one side of the shell close to the cooling mechanism.
Preferably, the cooling mechanism comprises a cooling side box fixedly installed on one side of the housing, an installation notch is formed in one side of the cooling side box, a semiconductor refrigerator is fixedly installed on the inner wall of the installation notch, and the refrigerating end of the semiconductor refrigerator is close to the inside of the cooling side box.
Preferably, a partition plate is fixedly mounted on one side, close to the semiconductor refrigerator, of the cooling side box, the cross section of the partition plate is of a C-shaped structure, spacers are fixedly mounted on two sides, close to the end portion, of the cooling side box respectively, the spacers and the cooling side box form a cooling cavity, and cooling liquid is filled in the cooling cavity.
Preferably, a micropump is fixedly mounted on one side of the spacer at the top end, a spiral pipe is fixedly connected to the input end of the micropump, through holes distributed equidistantly are formed in the outer wall of the spiral pipe, and the spacer is fixedly connected to the bottom end of the spiral pipe.
Preferably, the other end of the water-cooled tube is fixedly connected with the output end of the micro pump, the water-cooled tube is integrally of a U-shaped structure, a heat exchange copper sheet is fixedly arranged inside the shell, and the heat exchange copper sheet is in contact with the central processing unit and the detection assembly.
Preferably, the outer wall all around of heat transfer copper sheet all fixedly connected with heat transfer stabilizer blade, and the middle-end of heat transfer stabilizer blade is semicircle form, the middle-end parcel of heat transfer stabilizer blade is at the bottom outer wall of water-cooled tube.
Preferably, the lifting mechanism comprises a lifting belt fixedly connected to the outer wall of one side of the shell, and a fixed connecting block is fixedly mounted on one side, far away from the cooling mechanism, of the shell.
Preferably, the slot has been seted up to the fixed connection piece, and the draw-in groove that is linked together has all been seted up to the both sides of slot, the equal fixedly connected with of tip of carrying the area inserts the claw with draw-in groove looks adaptation, and the tip both sides of inserting the claw all are provided with oblique protruding end.
Preferably, one side of the shell, which is close to the display screen, is connected with a transparent protective cover through a movable connecting shaft, and one side of the shell is provided with a switch key for controlling a power switch.
Preferably, one side of the casing close to the fixed connection block is provided with a power supply bin, the outer wall of the bottom of the casing is bonded with a rubber seat, and the outer wall of the bottom of the rubber seat is provided with strip grooves distributed at equal intervals.
The beneficial effects of the invention are as follows:
1. this quick tester of stitch formula electron device attribute value, through the end of placing, the determine module that set up, operating personnel can obtain resistance, electric capacity, inductance numerical value and carry out clear show numerical value at the below display screen with two probe groove contact back on electronic components and parts and top, and it is more convenient to use.
2. This fast tester of stitch formula electron device attribute value through the water-cooling mechanism that sets up, can utilize the water-cooling effect of semiconductor cooler cooperation coolant liquid, water-cooled tube, carries out effectual cooling to central processing unit and determine module and handles to avoid it to take place overheated phenomenon.
3. According to the rapid tester for the pin type electronic device attribute values, the water cooling liquid after heat exchange can be ensured to be rapidly contacted with the semiconductor refrigerator through the arranged partition plate, so that rapid cooling is realized; the spiral pipe with the through holes can ensure that the micro pump can uniformly pump water cooling liquid and ensure the cooling effect; through the heat exchange copper sheet that sets up and with the heat transfer stabilizer blade of water-cooling pipe bottom end parcel, can effectively improve the cooling effect to thermal heat exchange efficiency, assurance central processing unit, determine module.
4. This fast tester of stitch formula electron device attribute value through the mechanism that draws that carries that sets up, can insert the claw in the fixed connection piece when needs carry to utilize its oblique protruding end card to go into the draw-in groove, realize carrying the fixed of taking the other end, thereby conveniently carry this tester fast.
Drawings
FIG. 1 is a schematic perspective view of a fast tester for pin-type electronic device attribute values according to the present invention;
FIG. 2 is a schematic diagram of a side view of a fast tester for pin-type electronic device attribute values according to the present invention;
FIG. 3 is a schematic cross-sectional view of a fast tester for pin-type electronic device attribute values according to the present invention;
FIG. 4 is a schematic diagram of a spiral tube structure of a fast tester for the attribute values of a pin-type electronic device according to the present invention;
FIG. 5 is a schematic diagram of a detection process of the fast tester for pin-type electronic device attribute values according to the present invention;
FIG. 6 is a schematic diagram of the operation of the cooling mechanism of the fast tester for the attribute values of the pin-type electronic devices according to the present invention;
FIG. 7 is a block diagram of a testing component of the fast tester for pin-type electronic device attribute values according to the present invention.
In the figure: 1. a housing; 2. a rubber seat; 3. switching a key; 4. a display screen; 5. a transparent protective cover; 6. a cooling mechanism; 7. lifting the belt; 8. detecting a strip groove; 9. detecting a point block; 10. inserting claws; 11. a top block; 12. fixing a connecting block; 13. a power supply bin; 14. a strip groove; 15. a probe slot; 16. a semiconductor refrigerator; 17. a central processing unit; 18. cooling the side box; 19. a micro-pump; 20. a partition plate; 21. a spiral tube; 22. a partition plate; 23. a heat exchange copper sheet; 24. a heat exchange support leg; 25. a water-cooled tube; 26. a detection component; 27. a capacitance detection module; 28. an inductance detection module; 29. a resistance detection module; 30. and a through hole.
Detailed Description
Reference will now be made in detail to embodiments of the present patent, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary only for the purpose of explaining the present patent and are not to be construed as limiting the present patent.
In the description of this patent, it is to be understood that the terms "center," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are used in the orientations and positional relationships indicated in the drawings for the convenience of describing the patent and for the simplicity of description, and are not intended to indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and are not to be considered limiting of the patent.
In the description of this patent, it is noted that unless otherwise specifically stated or limited, the terms "mounted," "connected," and "disposed" are to be construed broadly and can include, for example, fixedly connected, disposed, detachably connected, disposed, or integrally connected and disposed. The specific meaning of the above terms in this patent may be understood by those of ordinary skill in the art as appropriate.
Referring to fig. 1-7, a fast tester for pin-type electronic device attribute values includes a housing 1, a top block 11 disposed at the top end of the housing 1, the periphery of the top block 11 is an inclined plane, the top end of the top block 11 is provided with a placing end, the placing end comprises a detection strip groove 8 arranged on the top block 11, both ends of the detection strip groove 8 are fixedly provided with probe blocks 9, the top end of the probe point block 9 is provided with a probe point groove 15, the two sides of the top block 11 are provided with a lifting mechanism, the inside of the shell 1 is fixedly provided with a detection component 26, and the detection component 26 consists of a capacitance detection module 27, an inductance detection module 28 and a resistance detection module 29, a central processing unit 17 is fixedly mounted on one side of the interior of the shell 1 close to the detection component 26, a cooling mechanism 6 is fixedly mounted on the outer wall of one side of the shell 1, and a display screen 4 is mounted on one side of the shell 1 close to the cooling mechanism 6.
Further, the cooling mechanism 6 includes a cooling side box 18 fixedly installed on one side of the housing 1, and a mounting notch is opened on one side of the cooling side box 18, the semiconductor cooler 16 is fixedly installed on the inner wall of the mounting notch, and the refrigeration end of the semiconductor cooler 16 is close to the inside of the cooling side box 18.
Furthermore, a partition plate 20 is fixedly mounted on one side of the cooling side box 18 close to the semiconductor cooler 16, the cross section of the partition plate 20 is a C-shaped structure, two sides of the cooling side box 18 close to the end portion are respectively fixedly mounted with a partition plate 22, the partition plates 22 and the cooling side box 18 form a cooling cavity, and the cooling cavity is filled with cooling liquid.
Further, one side fixed mounting that is located top spacer 22 has micropump 19, and micropump 19's input fixedly connected with spiral pipe 21, and the through-hole 30 that the equidistance distributes is seted up to the outer wall of spiral pipe 21, and bottom spacer 22 fixedly connected with water-cooled tube 25.
Furthermore, the other end of the water-cooling tube 25 is fixedly connected with the output end of the micro pump 19, the water-cooling tube 25 is integrally of a U-shaped structure, a heat exchange copper sheet 23 is fixedly arranged inside the shell 1, and the heat exchange copper sheet 23 is in contact with the central processing unit 17 and the detection assembly 26; by means of the structure, in the long-time detection operation process, an operator controls and starts the semiconductor refrigerator 16 and the micro pump 19, and the semiconductor refrigerator 16 is matched with cooling liquid and the water cooling effect of the water cooling pipe 25 to effectively cool the central processing unit 17 and the detection assembly 26 so as to avoid overheating; by the aid of the arranged partition plate 22, the water cooling liquid after heat exchange is enabled to be in contact with the semiconductor refrigerator 16 quickly, and accordingly rapid cooling is achieved.
Further, the outer wall all around of heat transfer copper sheet 23 all is fixedly connected with heat transfer stabilizer blade 24, and the middle-end of heat transfer stabilizer blade 24 is semicircle form, and the middle-end parcel of heat transfer stabilizer blade 24 is at the bottom outer wall of water-cooled tube 25.
Further, the lifting mechanism comprises a lifting belt 7 fixedly connected to the outer wall of one side of the shell 1, and a fixed connecting block 12 is fixedly installed on one side, far away from the cooling mechanism 6, of the shell 1.
Furthermore, the fixed connecting block 12 is provided with an inserting slot, the two sides of the inserting slot are provided with communicated clamping slots, the end part of the lifting belt 7 is fixedly connected with an inserting claw 10 matched with the clamping slots, and the two sides of the end part of the inserting claw 10 are provided with inclined convex ends; borrow by above-mentioned structure, can carry when needs, will insert claw 10 and insert in fixed connection piece 12 to utilize its oblique protruding end card to go into the draw-in groove, realize carrying the fixed of taking 7 the other end, thereby conveniently carry this tester fast.
Further, one side of the shell 1 close to the display screen 4 is connected with a transparent protective cover 5 through a movable connecting shaft, and one side of the shell 1 is provided with a switch key 3 for controlling a power switch.
Further, a power supply bin 13 is arranged on one side, close to the fixed connecting block 12, of the shell 1, the rubber seat 2 is bonded to the outer wall of the bottom of the shell 1, and the outer wall of the bottom of the rubber seat 2 is provided with strip grooves 14 distributed at equal intervals; the strip groove 14 and the rubber seat 2 are arranged, so that the placing stability of the tester can be improved.
When the invention is used: an operator places the tester in a detection operation area, stable placement is realized by using the rubber seat 2 with the strip groove 14, the operator contacts an electronic component to be tested with the probe point grooves 15 in the two probe point blocks 9 at the top end, the resistance, the capacitance and the inductance of the electronic component are detected by using the capacitance detection module 27, the inductance detection module 28 and the resistance detection module 29 respectively, a detection signal passing through a signal amplifier is transmitted to the central processing unit 17, the central processing unit 17 processes the detection signal, converts the detection signal into a data signal through the signal converter, and clearly displays the values of the resistance, the capacitance and the inductance on the display screen 4 below; in the long-time detection process, an operator controls and starts the semiconductor refrigerator 16 and the micro pump 19, and the semiconductor refrigerator 16 is matched with cooling liquid and the water cooling effect of the water cooling pipe 25 to effectively cool the central processing unit 17 and the detection assembly 26 so as to avoid overheating; the arranged partition plate 22 is used for ensuring that the water cooling liquid after heat exchange is in quick contact with the semiconductor refrigerator 16, so that the temperature is quickly reduced; the spiral pipe 21 with the through hole 30 is arranged, so that the micro pump 19 is ensured to uniformly pump water cooling liquid, and the cooling effect is ensured; the heat exchange copper sheets 23 and the heat exchange support legs 24 wrapped with the bottom end phase of the water cooling pipe 25 are utilized to increase the contact area, improve the heat exchange efficiency and ensure the cooling effect on the central processing unit 17 and the detection assembly 26.
This fast tester of stitch formula electron device attribute value through the mechanism that draws that carries that sets up, can insert the claw in the fixed connection piece when needs carry to utilize its oblique protruding end card to go into the draw-in groove, realize carrying the fixed of taking the other end, thereby conveniently carry this tester fast.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art should be considered to be within the technical scope of the present invention, and the technical solutions and the inventive concepts thereof according to the present invention should be equivalent or changed within the scope of the present invention.
Claims (10)
1. The pin type electronic device attribute value rapid tester comprises a shell (1), wherein a top block (11) is arranged at the top end of the shell (1), the periphery of the top block (11) is an inclined plane, and the pin type electronic device attribute value rapid tester is characterized in that a placing end is arranged at the top end of the top block (11) and comprises a detection strip groove (8) formed in the top block (11), two ends of the detection strip groove (8) are fixedly provided with a detection point block (9), the top end of the detection point block (9) is provided with a detection point groove (15), two sides of the top block (11) are provided with a lifting mechanism, a detection assembly (26) is fixedly arranged in the shell (1), the detection assembly (26) consists of a capacitance detection module (27), an inductance detection module (28) and a resistance detection module (29), a central processing unit (17) is fixedly arranged at one side, close to the detection assembly (26), in the shell (1), the outer wall of one side of casing (1) fixed mounting has cooling body (6), one side installation that casing (1) is close to cooling body (6) is provided with display screen (4).
2. The fast tester for the attribute values of the stitch-type electronic devices according to claim 1, wherein the cooling mechanism (6) comprises a cooling side box (18) fixedly mounted on one side of the housing (1), and a mounting notch is opened on one side of the cooling side box (18), a semiconductor cooler (16) is fixedly mounted on the inner wall of the mounting notch, and the cooling end of the semiconductor cooler (16) is close to the inside of the cooling side box (18).
3. The fast tester for the attribute values of the stitch-type electronic devices according to claim 2, wherein a partition plate (20) is fixedly installed on one side of the cooling side box (18) close to the semiconductor cooler (16), the cross section of the partition plate (20) is a C-shaped structure, two sides of the cooling side box (18) close to the end are respectively fixedly installed with a spacer (22), and the spacer (22) and the cooling side box (18) form a cooling cavity, and the inside of the cooling cavity is filled with cooling liquid.
4. The fast tester for the attribute values of the stitch type electronic devices according to claim 3, wherein a micro pump (19) is fixedly installed on one side of the spacer (22) on the top end, a spiral pipe (21) is fixedly connected to the input end of the micro pump (19), through holes (30) are formed in the outer wall of the spiral pipe (21) and distributed equidistantly, and a water cooling pipe (25) is fixedly connected to the spacer (22) on the bottom end.
5. The fast tester for the pin-type electronic device attribute values according to claim 4, wherein the other end of the water-cooling tube (25) is fixedly connected with the output end of the micro pump (19), the water-cooling tube (25) is integrally of a U-shaped structure, a heat exchange copper sheet (23) is fixedly arranged inside the shell (1), and the heat exchange copper sheet (23) is in contact with the central processing unit (17) and the detection assembly (26).
6. The fast tester for the property values of the stitch type electronic devices according to claim 5, wherein the heat exchange supporting legs (24) are fixedly connected to the peripheral outer walls of the heat exchange copper sheets (23), the middle ends of the heat exchange supporting legs (24) are semicircular, and the middle ends of the heat exchange supporting legs (24) are wrapped on the outer walls of the bottom ends of the water cooling tubes (25).
7. The fast tester for the attribute values of the stitch-type electronic devices according to claim 1, wherein the lifting mechanism comprises a lifting belt (7) fixedly connected to the outer wall of one side of the casing (1), and a fixed connecting block (12) is fixedly installed on one side of the casing (1) far away from the cooling mechanism (6).
8. The fast tester for the attribute values of the stitch type electronic devices according to claim 7, wherein the fixed connecting block (12) is provided with slots, and two sides of each slot are provided with communicated slots, the end of the lifting belt (7) is fixedly connected with inserting claws (10) matched with the slots, and two sides of the end of each inserting claw (10) are provided with oblique convex ends.
9. The fast tester for the attribute values of the stitch type electronic devices according to claim 7, characterized in that one side of the casing (1) close to the display screen (4) is connected with a transparent protective cover (5) through a movable connecting shaft, and one side of the casing (1) is provided with a switch key (3) for controlling a power switch.
10. The fast tester for the attribute values of the stitch-type electronic devices according to claim 9, wherein a power supply bin (13) is disposed on one side of the casing (1) close to the fixed connection block (12), a rubber seat (2) is bonded to the outer wall of the bottom of the casing (1), and the outer wall of the bottom of the rubber seat (2) is provided with equally spaced grooves (14).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110411578.6A CN113311232B (en) | 2021-04-16 | 2021-04-16 | Pin type electronic device attribute value rapid tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110411578.6A CN113311232B (en) | 2021-04-16 | 2021-04-16 | Pin type electronic device attribute value rapid tester |
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| Publication Number | Publication Date |
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| CN113311232A true CN113311232A (en) | 2021-08-27 |
| CN113311232B CN113311232B (en) | 2024-05-14 |
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| CN202110411578.6A Active CN113311232B (en) | 2021-04-16 | 2021-04-16 | Pin type electronic device attribute value rapid tester |
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