CN113311232B - Pin type electronic device attribute value rapid tester - Google Patents
Pin type electronic device attribute value rapid tester Download PDFInfo
- Publication number
- CN113311232B CN113311232B CN202110411578.6A CN202110411578A CN113311232B CN 113311232 B CN113311232 B CN 113311232B CN 202110411578 A CN202110411578 A CN 202110411578A CN 113311232 B CN113311232 B CN 113311232B
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- cooling
- detection
- shell
- heat exchange
- close
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- 238000001816 cooling Methods 0.000 claims abstract description 68
- 238000001514 detection method Methods 0.000 claims abstract description 62
- 230000007246 mechanism Effects 0.000 claims abstract description 24
- 239000004065 semiconductor Substances 0.000 claims abstract description 21
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 21
- 239000000110 cooling liquid Substances 0.000 claims abstract description 10
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 13
- 229910052802 copper Inorganic materials 0.000 claims description 13
- 239000010949 copper Substances 0.000 claims description 13
- 238000005192 partition Methods 0.000 claims description 13
- 238000012545 processing Methods 0.000 claims description 12
- 210000000078 claw Anatomy 0.000 claims description 11
- 125000006850 spacer group Chemical group 0.000 claims description 6
- 230000001681 protective effect Effects 0.000 claims description 4
- 230000002093 peripheral effect Effects 0.000 claims description 3
- 230000000694 effects Effects 0.000 abstract description 8
- 238000004377 microelectronic Methods 0.000 abstract description 7
- 238000013021 overheating Methods 0.000 abstract description 3
- 238000012360 testing method Methods 0.000 description 11
- 239000000523 sample Substances 0.000 description 8
- 238000010586 diagram Methods 0.000 description 7
- 238000005516 engineering process Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 238000012546 transfer Methods 0.000 description 5
- 239000003381 stabilizer Substances 0.000 description 4
- 238000009434 installation Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2611—Measuring inductance
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/20—Modifications to facilitate cooling, ventilating, or heating
- H05K7/20218—Modifications to facilitate cooling, ventilating, or heating using a liquid coolant without phase change in electronic enclosures
- H05K7/20272—Accessories for moving fluid, for expanding fluid, for connecting fluid conduits, for distributing fluid, for removing gas or for preventing leakage, e.g. pumps, tanks or manifolds
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Thermal Sciences (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention belongs to the technical field of microelectronics, in particular to a pin type electronic device attribute value rapid tester, which comprises a shell, wherein a top block is arranged at the top end of the shell, inclined surfaces are arranged on the periphery of the top block, a placement end is arranged at the top end of the top block and comprises a detection strip groove which is formed in the top block, two ends of the detection strip groove are fixedly provided with detection point blocks, the top ends of the detection point blocks are provided with detection point grooves, lifting mechanisms are arranged on two sides of the top block, a detection assembly is fixedly arranged in the shell, the detection assembly consists of a capacitance detection module, an inductance detection module and a resistance detection module, and a central processor is fixedly arranged on one side, close to the detection assembly, of the shell. The semiconductor refrigerator can be used for carrying out effective cooling treatment on the central processor and the detection assembly by utilizing the water cooling effect of the semiconductor refrigerator matched with the cooling liquid and the water cooling pipe through the water cooling mechanism, so that the overheating phenomenon of the central processor and the detection assembly is avoided.
Description
Technical Field
The invention relates to the technical field of microelectronics, in particular to a pin type electronic device attribute value rapid tester.
Background
Microelectronic technology is a new technology developed with integrated circuits, especially very large scale integrated circuits. Microelectronics includes a series of specialized techniques including system circuit design, device physics, process technology, material preparation, automated testing, packaging, assembly, etc., which are the sum of the various process technologies in microelectronics. The key to microelectronics is to study the manner in which integrated circuits operate and how they are actually manufactured for application. The development of integrated circuits depends on the continued evolution of semiconductor devices. The microelectronic technology can realize the processing and the transmission of information through microscopic electronic motion in a solid in a nanoscale ultra-small area, and has good integration. At present, no corresponding pin electronic device quick test device is needed, the value of the color ring of the memory resistor body and the value of the capacitor body of the reactor are required to be distinguished, or the color ring is unclear or a great deal of inconvenience is brought when the device is used in a large amount.
Through searching, the patent with the Chinese patent application number of CN2018111537028 discloses a power electronic device testing device which comprises a power module, a system control unit, an impedance testing unit, a low-voltage testing unit, a trigger reporting unit, an output control unit, a sampling unit and peripherals. The power module is connected with external alternating current to provide power for the device, and the system control unit is connected with the impedance test unit, the voltage test unit, the trigger reporting unit, the output control unit and the sampling unit to control the output of other units. The patent can solve the above problems, but the test unit and the control processing unit are easy to generate overheat phenomenon during long-time operation, thereby affecting the operation of the detection operation, so that the patent has certain limitation.
Disclosure of Invention
The invention aims to solve the problems in the prior art and provides a pin type electronic device attribute value rapid tester.
In order to achieve the above object, the present invention adopts the following technical scheme.
The utility model provides a stitch formula electronic device attribute value quick tester, includes the casing, the top of casing is provided with the kicking block, and is the inclined plane all around the kicking block, the end of placing that the top of kicking block set up, and place the end including the detection strip groove of seting up in the kicking block, the equal fixed mounting in both ends in detection strip groove has the probe piece, and the probe piece top has all been seted up the probe piece groove, lifting mechanism is installed to the both sides of kicking block, the inside fixed mounting of casing has detection component, and detection component comprises electric capacity detection module, inductance detection module and resistance detection module, one side fixed mounting that is close to detection component in the casing has central processing unit, one side outer wall fixed mounting of casing has cooling body, one side that the casing is close to cooling body installs and is provided with the display screen.
Preferably, the cooling mechanism comprises a cooling side box fixedly installed on one side of the shell, one side of the cooling side box is provided with an installation notch, the inner wall of the installation notch is fixedly provided with a semiconductor refrigerator, and the refrigerating end of the semiconductor refrigerator is close to the inside of the cooling side box.
Preferably, a baffle is fixedly installed on one side, close to the semiconductor refrigerator, of the cooling side box, the section of the baffle is of a C-shaped structure, the two sides, close to the end portions, of the cooling side box are fixedly provided with the baffle respectively, the baffle and the cooling side box form a cooling cavity, and cooling liquid is filled in the cooling cavity.
Preferably, the micro pump is fixedly arranged on one side of the spacer at the top end, the input end of the micro pump is fixedly connected with the spiral pipe, the outer wall of the spiral pipe is provided with through holes distributed at equal intervals, and the spacer at the bottom end is fixedly connected with the water cooling pipe.
Preferably, the other end of the water-cooled tube is fixedly connected with the output end of the micropump, the whole water-cooled tube is of a U-shaped structure, a heat exchange copper sheet is fixedly arranged in the shell, and the heat exchange copper sheet is contacted with the central processing unit and the detection assembly.
Preferably, the outer wall all around of heat transfer copper sheet is all fixedly connected with heat transfer stabilizer blade, and the middle-end of heat transfer stabilizer blade is semicircle form, the middle-end parcel of heat transfer stabilizer blade is at the bottom outer wall of water-cooling tube.
Preferably, the lifting mechanism comprises a lifting belt fixedly connected to the outer wall of one side of the shell, and a fixed connecting block is fixedly arranged on one side of the shell away from the cooling mechanism.
Preferably, the slot is offered to fixed connecting block, and the draw-in groove that is linked together has all been offered to the both sides of slot, the tip of carrying the area all fixedly connected with draw-in groove looks adaptation insert claw, and insert the tip both sides of claw and all be provided with oblique protruding end.
Preferably, one side of the shell, which is close to the display screen, is connected with a transparent protective cover through a movable connecting shaft, and one side of the shell is provided with a switch button for controlling a power switch.
Preferably, a power supply bin is arranged on one side, close to the fixed connecting block, of the shell, a rubber seat is adhered to the outer wall of the bottom of the shell, and strip grooves distributed at equal distances are formed in the outer wall of the bottom of the rubber seat.
The beneficial effects of the invention are as follows:
1. This quick tester of stitch formula electronic device attribute value through placing end, the detection component that sets up, after operating personnel contacted two probe point grooves on electronic components and top, can obtain resistance, electric capacity, inductance numerical value and clearly demonstrate numerical value in the below display screen, and it is more convenient to use.
2. The pin type electronic device attribute value rapid tester can utilize the water cooling effect of the semiconductor refrigerator matched with cooling liquid and a water cooling pipe to perform effective cooling treatment on the central processor and the detection component through the set water cooling mechanism so as to avoid overheating phenomenon.
3. According to the pin type electronic device attribute value rapid tester, through the arranged partition plate, the water-cooling liquid after heat exchange can be ensured to be in contact with the semiconductor refrigerator rapidly, so that rapid cooling is performed; the spiral pipe with the through hole can ensure that the micro pump uniformly pumps water cooling liquid and ensure the cooling effect; through the heat exchange copper sheet that sets up and with the heat transfer stabilizer blade of water-cooled tube bottom parcel mutually, can effectively improve the heat exchange efficiency to the heat, guarantee the cooling effect to central processing unit, detection subassembly.
4. This quick tester of stitch formula electronic device attribute value through the pulling mechanism that sets up, can be when carrying, will insert the claw and insert in the fixed connection piece to utilize its oblique protruding end card income draw-in groove, realize carrying the fixed of taking the other end, thereby conveniently carry fast to this tester.
Drawings
FIG. 1 is a schematic diagram of a pin type electronic device attribute value rapid tester according to the present invention;
FIG. 2 is a schematic diagram of a schematic side view of a pin type electronic device attribute value rapid tester according to the present invention;
FIG. 3 is a schematic diagram illustrating a cross-sectional structure of a pin electronics attribute value rapid tester according to the present invention;
FIG. 4 is a schematic diagram of a spiral tube structure of a pin electronics attribute value rapid tester according to the present invention;
FIG. 5 is a schematic diagram of a test flow of a pin type electronic device attribute value rapid tester according to the present invention;
FIG. 6 is a schematic diagram illustrating the operation of a cooling mechanism of a pin type electronic device attribute value rapid tester according to the present invention;
Fig. 7 is a block diagram of a test assembly of the pin type electronic device attribute value rapid tester according to the present invention.
In the figure: 1. a housing; 2. a rubber seat; 3. a switch key; 4. a display screen; 5. a transparent protective cover; 6. a cooling mechanism; 7. lifting the belt; 8. a test strip slot; 9. a probe point block; 10. a claw; 11. a top block; 12. fixing the connecting block; 13. a power supply bin; 14. a strip groove; 15. a probe point groove; 16. a semiconductor refrigerator; 17. a central processing unit; 18. cooling the side box; 19. a micropump; 20. a partition plate; 21. a spiral tube; 22. a partition plate; 23. a heat exchange copper sheet; 24. heat exchange support legs; 25. a water-cooled tube; 26. a detection assembly; 27. a capacitance detection module; 28. an inductance detection module; 29. a resistance detection module; 30. and a through hole.
Detailed Description
Embodiments of the present patent are described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the drawings are exemplary only for explaining the present patent and are not to be construed as limiting the present patent.
In the description of this patent, it should be understood that the terms "center," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like indicate orientations or positional relationships based on the orientation or positional relationships shown in the drawings, merely to facilitate describing the patent and simplify the description, and do not indicate or imply that the devices or elements being referred to must have a particular orientation, be configured and operated in a particular orientation, and are therefore not to be construed as limiting the patent.
In the description of this patent, it should be noted that, unless explicitly stated and limited otherwise, the terms "mounted," "connected," and "disposed" are to be construed broadly, and may be fixedly connected, disposed, detachably connected, disposed, or integrally connected, disposed, for example. The specific meaning of the terms in this patent will be understood by those of ordinary skill in the art as the case may be.
Referring to fig. 1-7, the quick tester for the attribute value of the stitch type electronic device comprises a shell 1, wherein a top block 11 is arranged at the top end of the shell 1, inclined surfaces are arranged around the top block 11, a placement end is arranged at the top end of the top block 11 and comprises a detection strip groove 8 formed in the top block 11, two detection point blocks 9 are fixedly arranged at two ends of the detection strip groove 8, detection point grooves 15 are formed in the top ends of the detection point blocks 9, lifting mechanisms are arranged at two sides of the top block 11, a detection assembly 26 is fixedly arranged in the shell 1, the detection assembly 26 consists of a capacitance detection module 27, an inductance detection module 28 and a resistance detection module 29, a central processor 17 is fixedly arranged at one side, close to the detection assembly 26, of the shell 1, a cooling mechanism 6 is fixedly arranged at the outer wall of one side, close to the cooling mechanism 6, of the shell 1, and a display screen 4 is arranged at one side, close to the cooling mechanism 6, of the shell 1.
Further, the cooling mechanism 6 includes a cooling side case 18 fixedly mounted on one side of the housing 1, and a mounting notch is provided on one side of the cooling side case 18, the semiconductor refrigerator 16 is fixedly mounted on an inner wall of the mounting notch, and a refrigerating end of the semiconductor refrigerator 16 is close to an inside of the cooling side case 18.
Further, a partition plate 20 is fixedly installed on one side of the cooling side box 18, which is close to the semiconductor refrigerator 16, and the cross section of the partition plate 20 is of a C-shaped structure, a partition plate 22 is fixedly installed on two sides of the cooling side box 18, which are close to the end parts, respectively, and the partition plate 22 and the cooling side box 18 form a cooling cavity, and cooling liquid is filled in the cooling cavity.
Further, a micro pump 19 is fixedly installed on one side of the top spacer 22, the input end of the micro pump 19 is fixedly connected with a spiral pipe 21, through holes 30 distributed at equal distances are formed in the outer wall of the spiral pipe 21, and the bottom spacer 22 is fixedly connected with a water cooling pipe 25.
Further, the other end of the water cooling pipe 25 is fixedly connected with the output end of the micropump 19, the whole water cooling pipe 25 is of a U-shaped structure, a heat exchange copper sheet 23 is fixedly arranged in the shell 1, and the heat exchange copper sheet 23 is contacted with the central processing unit 17 and the detection assembly 26; by means of the structure, in the long-time detection operation process, an operator controls the starting of the semiconductor refrigerator 16 and the micropump 19, and the semiconductor refrigerator 16 is matched with the water cooling effect of the cooling liquid and the water cooling pipe 25 to effectively cool the central processor 17 and the detection component 26 so as to avoid overheating; by means of the partition plate 22, the water-cooled liquid after heat exchange is guaranteed to be in contact with the semiconductor refrigerator 16 quickly, and accordingly the temperature is reduced quickly.
Further, the heat exchange supporting legs 24 are fixedly connected to the peripheral outer walls of the heat exchange copper sheets 23, the middle ends of the heat exchange supporting legs 24 are semicircular, and the middle ends of the heat exchange supporting legs 24 are wrapped on the bottom end outer walls of the water cooling pipes 25.
Further, the lifting mechanism comprises a lifting belt 7 fixedly connected to the outer wall of one side of the shell 1, and a fixed connecting block 12 is fixedly arranged on one side of the shell 1 away from the cooling mechanism 6.
Further, the fixed connecting block 12 is provided with a slot, both sides of the slot are provided with clamping grooves which are communicated, the end parts of the lifting belts 7 are fixedly connected with inserting claws 10 which are matched with the clamping grooves, and both sides of the end parts of the inserting claws 10 are provided with oblique convex ends; by means of the structure, the claw 10 can be inserted into the fixed connecting block 12 when the tester needs to be carried, and the inclined convex end of the claw is used for being clamped into the clamping groove, so that the other end of the lifting belt 7 is fixed, and the tester is convenient to carry quickly.
Further, a transparent protective cover 5 is connected to one side of the casing 1 close to the display screen 4 through a movable connecting shaft, and a switch key 3 for controlling a power switch is arranged on one side of the casing 1.
Further, a power supply bin 13 is arranged on one side of the shell 1, which is close to the fixed connecting block 12, the outer wall of the bottom of the shell 1 is adhered with the rubber seat 2, and strip grooves 14 distributed at equal distance are formed in the outer wall of the bottom of the rubber seat 2; by providing the strip groove 14 and the rubber seat 2, the stability of the tester can be improved.
The invention is used when: the tester is placed in a detection operation area by an operator, stable placement is realized by using the rubber seat 2 with the strip groove 14, the operator contacts an electronic component to be tested with the probe point grooves 15 in the two probe point blocks 9 at the top end, the resistance, the capacitance and the inductance of the electronic component are detected by using the capacitance detection module 27, the inductance detection module 28 and the resistance detection module 29 respectively, detection signals passing through the signal amplifier are transmitted to the central processing unit 17, the detection signals are converted into data signals by the signal converter after being processed, and the resistance, the capacitance and the inductance values are clearly displayed on the display screen 4 at the lower part; in the long-time detection operation process, an operator controls and starts the semiconductor refrigerator 16 and the micropump 19, and the semiconductor refrigerator 16 is matched with cooling liquid and water cooling effect of the water cooling pipe 25 to effectively cool the central processing unit 17 and the detection assembly 26 so as to avoid overheat; the arranged partition plate 22 ensures that the water-cooled liquid after heat exchange is in contact with the semiconductor refrigerator 16 quickly, so that the temperature is reduced quickly; the spiral tube 21 with the through holes 30 is utilized to ensure that the micro pump 19 uniformly pumps water cooling liquid, thereby ensuring the cooling effect; the heat exchange copper sheet 23 and the heat exchange support 24 wrapping the bottom end of the water cooling pipe 25 are utilized, the contact area is increased, the heat exchange efficiency of heat is improved, and the cooling effect of the central processing unit 17 and the detection assembly 26 is ensured.
This quick tester of stitch formula electronic device attribute value through the pulling mechanism that sets up, can be when carrying, will insert the claw and insert in the fixed connection piece to utilize its oblique protruding end card income draw-in groove, realize carrying the fixed of taking the other end, thereby conveniently carry fast to this tester.
The foregoing is only a preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art, who is within the scope of the present invention, should make equivalent substitutions or modifications according to the technical scheme of the present invention and the inventive concept thereof, and should be covered by the scope of the present invention.
Claims (5)
1. The utility model provides a stitch type electronic device attribute value rapid tester, includes casing (1), the top of casing (1) is provided with kicking block (11), and kicking block (11) are the inclined plane all around, a serial communication port, the tip of kicking block (11) sets up places the end, and places the end including opening in detection strip groove (8) of kicking block (11), the both ends of detection strip groove (8) are all fixed mounting have visit point piece (9), and visit point piece (9) top all has offered visit point groove (15), lifting mechanism is installed to the both sides of kicking block (11), the inside fixed mounting of casing (1) has detection subassembly (26), and detection subassembly (26) are by electric capacity detection module (27), inductance detection module (28) and resistance detection module (29) are constituteed, one side that is close to detection subassembly (26) inside of casing (1) is fixed mounting has central processing unit (17), one side outer wall fixed mounting of casing (1) has cooling mechanism (6), one side that casing (1) is close to cooling mechanism (6) is provided with display screen (4).
The cooling mechanism (6) comprises a cooling side box (18) fixedly arranged on one side of the shell (1), one side of the cooling side box (18) is provided with a mounting notch, the inner wall of the mounting notch is fixedly provided with a semiconductor refrigerator (16), and the refrigerating end of the semiconductor refrigerator (16) is close to the inside of the cooling side box (18);
A partition plate (20) is fixedly arranged on one side, close to the semiconductor refrigerator (16), of the cooling side box (18), the cross section of the partition plate (20) is of a C-shaped structure, partition plates (22) are fixedly arranged on two sides, close to the end parts, of the cooling side box (18), the partition plates (22) and the cooling side box (18) form a cooling cavity, and cooling liquid is filled in the cooling cavity;
The micro pump (19) is fixedly arranged at one side of the spacer (22) at the top end, the input end of the micro pump (19) is fixedly connected with the spiral pipe (21), the outer wall of the spiral pipe (21) is provided with through holes (30) distributed at equal intervals, and the spacer (22) at the bottom end is fixedly connected with the water cooling pipe (25);
The other end of the water cooling pipe (25) is fixedly connected with the output end of the micro pump (19), the whole water cooling pipe (25) is of a U-shaped structure, a heat exchange copper sheet (23) is fixedly arranged in the shell (1), and the heat exchange copper sheet (23) is contacted with the central processing unit (17) and the detection assembly (26);
The heat exchange copper sheet (23) is characterized in that heat exchange supporting legs (24) are fixedly connected to the peripheral outer walls of the heat exchange copper sheet (23), the middle ends of the heat exchange supporting legs (24) are semicircular, and the middle ends of the heat exchange supporting legs (24) are wrapped on the outer walls of the bottom ends of the water cooling pipes (25).
2. The pin electronics attribute value rapid tester according to claim 1, wherein the lifting mechanism comprises a lifting belt (7) fixedly connected to an outer wall of one side of the housing (1), and a fixed connection block (12) is fixedly installed on one side of the housing (1) away from the cooling mechanism (6).
3. The quick tester for the attribute values of the pin-type electronic devices according to claim 2, wherein the fixed connecting block (12) is provided with a slot, two sides of the slot are provided with clamping grooves which are communicated, the end parts of the lifting belts (7) are fixedly connected with inserting claws (10) which are matched with the clamping grooves, and two sides of the end parts of the inserting claws (10) are provided with oblique convex ends.
4. The pin type electronic device attribute value rapid tester according to claim 2, wherein a transparent protective cover (5) is connected to one side of the housing (1) close to the display screen (4) through a movable connecting shaft, and a switch key (3) for controlling a power switch is arranged on one side of the housing (1).
5. The pin type electronic device attribute value rapid tester according to claim 4, wherein a power supply bin (13) is arranged on one side, close to the fixed connection block (12), of the shell (1), a rubber seat (2) is adhered to the outer wall of the bottom of the shell (1), and strip grooves (14) distributed at equal distances are formed in the outer wall of the bottom of the rubber seat (2).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110411578.6A CN113311232B (en) | 2021-04-16 | 2021-04-16 | Pin type electronic device attribute value rapid tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110411578.6A CN113311232B (en) | 2021-04-16 | 2021-04-16 | Pin type electronic device attribute value rapid tester |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113311232A CN113311232A (en) | 2021-08-27 |
| CN113311232B true CN113311232B (en) | 2024-05-14 |
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|---|---|---|---|
| CN202110411578.6A Active CN113311232B (en) | 2021-04-16 | 2021-04-16 | Pin type electronic device attribute value rapid tester |
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| CN (1) | CN113311232B (en) |
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