CN113238163A - Testing device and testing method for multi-channel LED lamp beads - Google Patents
Testing device and testing method for multi-channel LED lamp beads Download PDFInfo
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Abstract
The invention discloses a testing device of a multi-channel LED lamp bead, which is formed by assembling and connecting an MCU, an analog switch module, a detection module and more than three sets of testing components, wherein each set of testing component is matched and arranged corresponding to any single LED lamp bead in a testing object, the detection module is connected between the MCU and the analog switch module and comprises an analog switch control signal, an LED lamp bead working current sampling signal and a photoresistor feedback signal in an interactive mode, and the MCU is a programmable processor and is preset with a threshold value for judging whether the brightness of the lamp bead is qualified or not according to the working current and the corresponding photoresistor feedback signal. The MCU controls the analog switch module to switch the connected lamp beads to be detected and receives the feedback current signals and resistance signals to intelligently judge the quality of the lamp beads. By applying the test solution, the test device has the advantages of low cost, process automation, improved flexibility, visual and healthy test results and the like, and breaks through the limit of test space; and the testing method embodies the universality because the MCU is easy to adjust the threshold value to meet the testing requirement.
Description
Technical Field
The invention relates to a technical solution for testing photoelectric performance, in particular to a device and a method for easily testing electrical performance and brightness of any or all LED lamp beads in an LED lamp strip.
Background
The LED lamp strip and the LED lamp strip (hereinafter, collectively referred to as LED lamp strip) are formed by welding a plurality of LED lamp beads on a flexible circuit board or a PCB (printed circuit board), and are widely used in various energy-saving and environment-friendly industries and various decoration industries, such as furniture, automobiles, advertisements, lighting, ships, bars, and the like. The LED lamp beads are packaged similarly, so that various parameters are different, for example, the brightness of the LED lamp beads is different; the antistatic capacity is inconsistent, and the service life is inconsistent; the wavelength of the lamp beads is inconsistent, so that the color is inconsistent and the like. When the factory produces LED lamp area, the condition that the lamp pearl parameter that often takes place the compounding or purchase is not conform to the design requirement, after the welding is accomplished, can not obtain comprehensive test, leads to the consequence that influences the product quality. For example, the leakage current of the LED lamp bead is too large, so that the service life of the lamp bead is reduced, and the light is not uniform; or LED lamp beads in different batches are used in a mixed mode, and if the parameters are different, the luminous color has color difference; or in the welding process of the LED lamp beads, the conditions of insufficient soldering and missing soldering exist, so that part of the lamp beads are not bright, and the like.
The LED lamp strip is formed by welding a plurality of LED lamp beads, and generally adopts a mode of welding the lamp beads in series or in parallel and series; the finished product test generally adopts the following two ways: firstly, a constant voltage source is used for supplying power to the LED lamp strip, then a current meter and a high-power resistor are connected in series into a circuit to obtain the output current value of the whole LED lamp strip or the LED lamp strip, and then the brightness of each lamp bead is comprehensively and visually checked to obtain the result of whether the finished product of the LED lamp strip is qualified. However, the whole LED lamp strip needs to be electrified, and because the LED lamp strips are mostly non-standard products, when the LED lamp strips or the LED lamp strips are longer, the test can be carried out only by unfolding the LED lamp strips or the LED lamp strips in a certain space length; and need use ammeter and high-power resistance to be in the series circuit, because the product volume is big, the use frequency of ammeter and high-power resistance is many, and ammeter life can be discounted greatly, and high-power resistance lasts the use, and the loss of generating heat a large amount of electric energy to and high-power resistance generate heat and lead to self internal resistance to change, also can lead to the test to produce the error, use visual inspection every lamp pearl luminance in addition, although there is the eye protection filter, the long-time observation lamp pearl luminance still can produce the adverse reaction to people's eyes.
Secondly, a constant voltage source is used as the LED lamp strip, and then the spectrum analyzer is used for testing the luminous intensity and the spectrum of the LED, so that the testing cost is too high.
Disclosure of Invention
In view of the defects of the prior art, the invention aims to provide a testing device and a testing method of a multi-channel LED lamp bead, so as to solve the problems of operability and cost of detecting the electrical performance and the brightness of any LED lamp bead or lamp group in an LED lamp strip in a limited space scene.
The technical solution for achieving the above object is that the testing device for the multi-channel LED lamp bead is characterized in that: the LED lamp bead testing device is formed by connecting an MCU (microprogrammed control Unit), an analog switch module, a detection module and more than three sets of testing components, wherein each set of testing component is matched with any single LED lamp bead in a testing object and comprises a photoresistor, a light shield and a pair of probes abutted against positive and negative electrode bonding pads of the LED lamp beads, the photoresistor is attached to the top of the inner wall of the light shield, and the light shield completely covers the LED lamp beads; all the probes are connected to the output end of the analog switch module and are controlled to be switched on and off to supply power to the LED lamp beads connected with the probes, the detection module is connected between the MCU and the analog switch module and comprises analog switch control signals, LED lamp bead working current sampling signals and photoresistor feedback signals in an interactive mode, and the MCU is a programmable processor and is preset with a threshold value for judging whether the brightness of the lamp beads is qualified or not according to the working current and the corresponding photoresistor feedback signals.
The technical solution of the invention for achieving the other object is that a method for testing a multichannel LED lamp bead is implemented based on the operation of the testing device of any one of claims 1 to 6, and is characterized by comprising the steps of:
s1, the LED lamp beads in the test object segment are butted one by utilizing a preset number of test assemblies in the test device, and the LED lamp beads are fully covered by a light shield provided with a photoresistor and including probes abutted against positive and negative electrode pads;
s2, the MCU outputs an analog switch control signal to connect the constant current/constant voltage circuit, the current sampling circuit and a single LED lamp bead or a lamp group, and drives each LED lamp bead in the connection range to be lighted, and the current sampling circuit receives a first feedback signal of the current property of each LED lamp bead, converts and transmits the first feedback signal to the MCU;
s3, the resistance measuring circuit is driven by the MCU to measure the resistance value change of the photoresistor in the light shield covered by each LED lamp bead, and a second feedback signal is transmitted back to the MCU;
and S4, presetting a threshold value for judging whether the brightness of the lamp beads is qualified or not through the MCU and the corresponding photoresistor feedback signals, carrying out numerical comparison on the two parts of feedback signals, and obtaining a performance evaluation result for each LED lamp bead.
The technical solution of the multi-channel LED lamp bead test has the prominent substantive characteristics and remarkable progress: the testing device does not need other finished instruments, eye protection filters and the like, so that the testing cost is reduced; the test process is quantified and compared through the MCU, visual judgment by a tester is not needed, the result is more visual and healthy, and the vision protection and the test standard unification are facilitated; the quantity of the LED lamp bead tests can be freely selected through the switch point position switching of the analog switch module controlled by the MCU, and the limit of a test space is broken through; when the LED lamp bead item and the performance parameters are changed, the testing requirements are met through the control setting of the MCU adjusting threshold and the switch point position, and the universality of related testing solutions is reflected.
Drawings
FIG. 1 is a schematic diagram of the circuit topology and signal flow of the preferred embodiment of the testing device of the present invention.
FIG. 2 is a schematic diagram of a physical structure of a preferred embodiment of the testing apparatus of the present invention.
Fig. 3 is a schematic diagram of the relative front and back wiring of the analog switch module in the testing device of the present invention.
Detailed Description
The following detailed description of the embodiments of the present invention is provided in connection with the accompanying drawings for the purpose of understanding and controlling the technical solutions of the present invention, so as to define the protection scope of the present invention more clearly.
The designer of the invention deeply analyzes a plurality of defects exposed in the actual operation of the existing various test schemes for the LED lamp strip, and carries out principle exploration and equipment research and development on the target requirements required to be achieved by the test, and innovatively provides a test device and a test method for a multi-channel LED lamp bead so as to obtain experience of stronger practicability, no human eyesight injury and more cost saving.
In order to understand the innovative nature of the technical solution of the present invention, the following structural features of the testing device and implementation details of different testing methods for the LED strip are described below.
As shown in fig. 1 and 2, the testing device for the multi-channel LED lamp bead has the following characteristics in structural composition: the test device is formed by assembling a microprocessor 1 (namely an MCU for short English), an analog switch module 2, a detection module 3 and more than three sets of test components. Here, the detection module 3 is a generic name of a plurality of functional circuits, is connected between the MCU and the analog switch module, and is mainly used for control signal transmission and feedback signal return between the front-end detection component and the rear-end MCU of the test apparatus, and the interaction includes an analog switch control signal, an LED lamp bead working current sampling signal, and a photoresistor feedback signal. Each set of test assembly is configured to correspond to any single LED lamp bead 52 in the test object, and each set of test assembly includes a photo resistor 42, a light shield 41, and a pair of probes 43 abutting against positive and negative electrode pads of the LED lamp bead. The photoresistor is attached to the top of the inner wall of the light shield and is connected to the detection module 3 through a cable 8 in a wired mode, and therefore brightness measurement of a single LED lamp bead which is lighted in the light shield is achieved; the lens hood covers the LED lamp beads completely, and all the probes are connected to the output end of the analog switch module and are controlled to be switched on and off to supply power to the LED lamp beads connected with each other. The number of sets of test elements is set up freely according to the test scale. In the embodiment shown in the figure, the test components are six sets, and the segmented batch test of the LED strip in a set of six can be carried out. The MCU is a programmable processor and is preset with a working current and a threshold value corresponding to a photoresistor feedback signal for judging whether the brightness of the lamp beads is qualified or not, which is a digital signal basis for realizing automatic test of the device and can be manually edited and set.
In the above summary scheme, the test object is the lamp strip 5 containing N LED beads, and is a finished product in which a certain number of LED beads 52 are soldered to the flexible baseband 51 in a linear or matrix manner, where each LED bead 52 has a pair of positive and negative electrode pads 53. The testing device is provided with M sets of testing components, and N = (k-1) M + j is satisfied, wherein M, N is a natural number larger than 3, k is the number of times of the lamp strip segmentation test by using the testing device, and j is the number of the LED lamp beads which are remained in the k-1 segmentation test by using the testing device in the lamp strip and is less than M. As can be seen from the assumption and the embodiment illustration, if the light strip is provided with 100 LED light beads and the test component is 6 sets, a total of k =17 segment tests are required, and the last segment test only needs to dock the test component with j =4 LED light beads.
The detection module is shown as a dashed line frame in the middle of fig. 1, wherein a constant current/constant voltage circuit, a current sampling circuit, an operational amplifier circuit and a resistance measurement circuit are arranged, and the detection module directly transmits an analog switch control signal output by the MCU to the analog switch module. The constant current/constant voltage circuit is controlled by the MCU to unidirectionally send signals to the analog switch module and supply power to the LED lamp beads through the probe, and the current sampling circuit receives a first feedback signal from the probe and is connected to the MCU through the operational amplifier circuit. The mode of combining the constant current/constant voltage circuit and the circuit sampling circuit is used for replacing the traditional ammeter, so that the system integration of the testing device is facilitated on one hand, and the testing cost can be reduced on the other hand. And resistance measurement circuit connects between MCU and analog switch module and establishes the return circuit for transmitting the signal and receiving the second feedback signal, aims at gathering towards the change of photosensitive resistor behind the illumination, and the signal analysis LED lamp pearl brightness degree of being convenient for is quantized, is favorable to replacing artifical visual observation and spectral analysis appearance, has both protected the tester and has optimized the test cost again.
From a further detail of the connection relationship, as shown in fig. 3, the detection module outputs a voltage signal to each probe through the constant current/constant voltage circuit, and receives a first feedback signal to each probe through the current sampling circuit, and each branch is provided with a switch point K1-K8 controlled by the on/off of the MCU, that is, each branch of the two circuits corresponding to each probe is independently controlled to be on/off. In addition, the detection module respectively outputs voltage signals or receives second feedback signals to each probe through the resistance measurement circuit, and each branch is respectively provided with a switch point K9-K16 controlled by the on-off state of the MCU. As can be seen from the figure, the switch point position set 21 shown by the dashed line frame on the right side is mainly used for switching the measurement of the working current and the leakage current of the LED lamp bead, and the switch point position set 22 shown by the dashed line frame on the left side is mainly used for switching the measurement of the resistance value of the photoresistor corresponding to the LED lamp bead, and the switch point position set and the photoresistor form the analog switch module of the testing device.
On the basis of the fact that the MCU is a programmable processor, in order to realize the testing function expected by the invention, certain programming and parameter setting are required to be carried out on the MCU through an external input device. The method specifically comprises a judgment program for numerical comparison, and related threshold setting for judging whether the brightness of the lamp bead is qualified or not according to the working current and the corresponding photoresistor feedback signal. The logic algorithm core of the decision program is well known and commonly used, and is not the technical content claimed in the present application, so that the detailed description of the example is omitted. And judging that the LED lamp beads are qualified only when the test signals fed back by the detection module are all within the threshold range, and judging that the LED lamp beads are unqualified otherwise. In order to better interact with a tester by a human-computer, the MCU can be externally connected with an LCD display screen 6, a test button 7 or a keyboard for programming on one hand, and then the test result of the LED lamp beads is interactively displayed on the LCD display screen; on the other hand, the LED lamp bead testing system can also be connected with a tablet personal computer (not shown) through a wireless communication network, the MCU is programmed and the threshold value is set through the tablet personal computer, and the testing result of the LED lamp bead is interactively displayed on the tablet personal computer.
On the basis of the complete display of the structure of the testing device, the innovative functions of the device are further understood from the following specific method and process for testing operation by using the device. The method comprises the following four steps: s1, the LED lamp beads in the test object segment are butted one by utilizing a preset number of test assemblies in the test device, and the LED lamp beads are fully covered by a light shield provided with a photoresistor and including probes abutted against positive and negative electrode pads; s2, the MCU outputs an analog switch control signal to connect the constant current/constant voltage circuit, the current sampling circuit and a single LED lamp bead or a lamp group, and drives each LED lamp bead in the connection range to be lighted, and the current sampling circuit receives a first feedback signal of the current property of each LED lamp bead, converts and transmits the first feedback signal to the MCU; s3, the resistance measuring circuit is driven by the MCU to measure the resistance value change of the photoresistor in the light shield covered by each LED lamp bead, and a second feedback signal is transmitted back to the MCU; and S4, presetting a threshold value for judging whether the brightness of the lamp beads is qualified or not through the MCU and the corresponding photoresistor feedback signals, carrying out numerical comparison on the two parts of feedback signals, and obtaining a performance evaluation result for each LED lamp bead.
According to the working principle of the detection module, when the probe contacts the positive and negative electrode bonding pads and then presses down the test button, the MCU outputs an analog switch control signal to close a related test channel of the analog switch, then controls the constant current/constant voltage circuit to output rated voltage matched with a single LED lamp bead or a lamp group to be tested at present, and lights the LED lamp bead to be tested; meanwhile, the analog switch module guides the current first feedback signal into the current sampling circuit, the current feedback signal is further converted into a corresponding voltage signal, the voltage signal passes through the operational amplifier circuit to obtain a group of filtered and amplified signals, and the final test current value is obtained after the signals are processed by the ADC of the MCU. On the other hand, the photoresistor in the lamp shade is because the light that receives LED lamp pearl shines, takes place the resistance change, MCU obtains current photoresistor's resistance through resistance measurement circuit, the comprehensive test work current value and photoresistor's resistance, whether current single LED lamp pearl or banks are qualified according to setting for threshold value intelligence judgement, and show the test result feedback on the LCD display screen, if there is bad lamp pearl, still can show the position of bad lamp pearl, make things convenient for maintenance or record on next step.
From the working principle of the analog switch module, the circuit layout considers the flexibility and the universality of the test point positions, and combines and shares the outputs of all the function point positions, namely, the desired test effect can be obtained through different switch combinations of the analog switch. For example, when the luminous current of the LED lamp bead is tested, the anode testing point is located at the probe PIN1, the cathode testing point is located at the probe PIN2, and the switch point K1 and the switch point K4 can be closed, so that the functions that the probe PIN1 outputs a voltage signal and the probe PIN2 returns a first feedback signal can be realized; if probes PIN3 and PIN4 are used as the photoresistor measuring circuits, points 13 and 16 can be closed, and the resistance values of the relevant photoresistors can be tested. Similarly, if the leakage current of the LED lamp bead butted with the test probe PIN1 and the probe PIN2 is opposite to the positive and negative polarities described above, the switch point K2 and the switch point K3 can be closed at this time, and the positive and negative output interchange of the test point probe PIN1 and the PIN2 can be completed without moving the light bar or the light strip to be tested; in a similar way, the photoresistor measuring point positions can be loaded on the probes PIN1 and PIN2, and the use flexibility of the circuit is greatly improved. Moreover, the LED lamp beads connected in series can form a lamp group to select the closed point positions, so that a plurality of LED lamp beads can be measured simultaneously, and the test efficiency is improved. Because the output point position combination of the analog switch module can be randomly selected in a certain range, the universality of the whole testing device is greatly improved.
Compared with the existing test scheme of the LED lamp strip, the technical solution of the invention has various design advantages. The summary is as follows:
1. the testing device uses the analog switch module, can randomly select a single lamp bead or a lamp group to test, greatly improves the utilization rate of non-calibrated products, and breaks through the limitation of space to test operation.
2. Similarly, the analog switch module is adopted, so that reverse leakage current testing can be performed on a single lamp bead or a lamp bank, the butt joint direction of the probe does not need to be switched through manual operation, and particularly for relatively small positive and negative electrode bonding pads.
3. Because the current sampling circuit is used for testing the current of a single lamp bead or a lamp bank, the current is much smaller than the current for lighting the whole LED lamp strip, and the influence on the current testing precision caused by the change of the internal resistance of the resistor due to the heating of the resistor can be avoided.
4. The testing device uses the combination of the constant current/constant voltage circuit and the current sampling circuit to replace an ammeter, and the testing cost can be reduced. And when the LED lamp bead item and the performance parameters are changed, the testing requirements are met through the control setting of the MCU adjusting threshold and the switch point position, and the universality of the testing scheme is reflected.
5. The testing device uses a mode of combining the light shield and the photoresistor to replace manual visual observation or use a spectrum analyzer, can set the threshold value of the brightness of the lamp bead, and intelligently judges whether the welding of the lamp bead is qualified; not only protects the eyesight of testers, but also is beneficial to unifying the test standard and reducing the test cost.
In addition to the above embodiments, the present invention may have other embodiments, and any technical solutions formed by equivalent substitutions or equivalent transformations are within the scope of the present invention as claimed.
Claims (10)
1. The utility model provides a testing arrangement of multichannel LED lamp pearl which characterized in that: the LED lamp bead testing device is formed by connecting an MCU (microprogrammed control Unit), an analog switch module, a detection module and more than three sets of testing components, wherein each set of testing component is matched with any single LED lamp bead in a testing object and comprises a photoresistor, a light shield and a pair of probes abutted against positive and negative electrode bonding pads of the LED lamp beads, the photoresistor is attached to the top of the inner wall of the light shield, and the light shield completely covers the LED lamp beads; all the probes are connected to the output end of the analog switch module and are controlled to be switched on and off to supply power to the LED lamp beads connected with the probes, the detection module is connected between the MCU and the analog switch module and comprises analog switch control signals, LED lamp bead working current sampling signals and photoresistor feedback signals in an interactive mode, and the MCU is a programmable processor and is preset with a threshold value for judging whether the brightness of the lamp beads is qualified or not according to the working current and the corresponding photoresistor feedback signals.
2. The testing device for the multi-channel LED lamp beads of claim 1, is characterized in that: the test object is a lamp strip containing N LED lamp beads, the test device is provided with M sets of test components, and N = (k-1) M + j is satisfied, wherein M, N is a natural number larger than 3, k is the number of times of the lamp strip using the test device for segmented testing, and j is the number of the LED lamp beads which are left after the lamp strip using the test device for k-1 segmented testing and is less than M.
3. The testing device for the multi-channel LED lamp beads of claim 1, is characterized in that: the detection module is provided with a constant current/constant voltage circuit, a current sampling circuit, an operational amplifier circuit and a resistance measurement circuit, and directly transmits an analog switch control signal output by the MCU to the analog switch module, wherein the constant current/constant voltage circuit is controlled by the MCU to unidirectionally transmit a signal to the analog switch module and supplies power to the LED lamp bead through the probe, the current sampling circuit receives a first feedback signal obtained from the probe and is connected to the MCU through the operational amplifier circuit, and the resistance measurement circuit is connected between the MCU and the analog switch module to form a loop for transmitting the transmission signal and receiving a second feedback signal.
4. The testing device of the multi-channel LED lamp bead of claim 3, characterized in that: the detection module outputs voltage signals to each probe through a constant current/constant voltage circuit, receives first feedback signals to each probe through a current sampling circuit, and each branch is provided with a switch point position controlled by the on-off of the MCU; the detection module respectively outputs voltage signals or receives second feedback signals to each probe through the resistance measurement circuit, and each branch is respectively provided with a switch point position controlled by the on-off of the MCU.
5. The testing device for the multi-channel LED lamp beads of claim 1, is characterized in that: the MCU is externally connected with an LCD display screen, a test button or a keyboard for programming, and the test result of the LED lamp beads is interactively displayed on the LCD display screen.
6. The testing device for the multi-channel LED lamp beads of claim 1, is characterized in that: the MCU is connected with the tablet personal computer through a wireless communication network, programs the MCU and sets a threshold value through the tablet personal computer, and test results of the LED lamp beads are interactively displayed on the tablet personal computer.
7. A testing method of a multi-channel LED lamp bead, which is implemented based on the operation of the testing device of any one of claims 1 to 6, is characterized by comprising the following steps:
s1, the LED lamp beads in the test object segment are butted one by utilizing a preset number of test assemblies in the test device, and the LED lamp beads are fully covered by a light shield provided with a photoresistor and including probes abutted against positive and negative electrode pads;
s2, the MCU outputs an analog switch control signal to connect the constant current/constant voltage circuit, the current sampling circuit and a single LED lamp bead or a lamp group, and drives each LED lamp bead in the connection range to be lighted, and the current sampling circuit receives a first feedback signal of the current property of each LED lamp bead, converts and transmits the first feedback signal to the MCU;
s3, the resistance measuring circuit is driven by the MCU to measure the resistance value change of the photoresistor in the light shield covered by each LED lamp bead, and a second feedback signal is transmitted back to the MCU;
and S4, presetting a threshold value for judging whether the brightness of the lamp beads is qualified or not through the MCU and the corresponding photoresistor feedback signals, carrying out numerical comparison on the two parts of feedback signals, and obtaining a performance evaluation result for each LED lamp bead.
8. The method for testing the multi-channel LED lamp bead according to claim 7, is characterized in that: in step S2, an operational amplifier circuit is connected between the current sampling circuit and the MCU to convert the sampled current signal into a voltage signal, and the voltage signal is filtered and amplified and then input to the ADC of the MCU for processing, so as to obtain a test current value for comparing with a threshold value.
9. The method for testing the multi-channel LED lamp bead according to claim 7, is characterized in that: in step S2, the MCU outputs an analog switch control signal, and the constant current/constant voltage circuit and the current sampling circuit are reversed with respect to the positive and negative electrodes of a single LED lamp bead or lamp group while the probes are held in contact with the positive and negative electrode pads, and the current sampling circuit receives the signal to obtain the leakage current of the lamp bead.
10. The method for testing the multi-channel LED lamp bead according to claim 7, is characterized in that: the MUC is externally connected with the LCD display screen, and the test result of the LED lamp beads is interactively displayed on the LCD display screen.
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| CN202110597983.1A CN113238163A (en) | 2021-05-31 | 2021-05-31 | Testing device and testing method for multi-channel LED lamp beads |
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| CN202110597983.1A CN113238163A (en) | 2021-05-31 | 2021-05-31 | Testing device and testing method for multi-channel LED lamp beads |
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| CN113654655A (en) * | 2021-08-24 | 2021-11-16 | 宁波工程学院 | Solar sun-tracking visible light photoresistor detection method |
| CN113787024A (en) * | 2021-09-01 | 2021-12-14 | 吉安市木林森显示器件有限公司 | Novel LED lamp bead bulk sorting method |
| CN113866665A (en) * | 2021-08-30 | 2021-12-31 | 苏州浪潮智能科技有限公司 | Automatic testing device and method for LED lamp in storage equipment |
| CN115460316A (en) * | 2022-08-04 | 2022-12-09 | 江门市征极光兆科技有限公司 | Method and system for determining positions of LED lamp string beads, storage medium and equipment |
| CN117269826A (en) * | 2023-09-13 | 2023-12-22 | 深圳市柯瑞光电科技有限公司 | Automatic detection method and system for LED backlight source lamp bead production |
| CN117949718A (en) * | 2024-03-25 | 2024-04-30 | 杭州海康威视数字技术股份有限公司 | Voltage detection system, method and device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113654655A (en) * | 2021-08-24 | 2021-11-16 | 宁波工程学院 | Solar sun-tracking visible light photoresistor detection method |
| CN113866665A (en) * | 2021-08-30 | 2021-12-31 | 苏州浪潮智能科技有限公司 | Automatic testing device and method for LED lamp in storage equipment |
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| CN113787024A (en) * | 2021-09-01 | 2021-12-14 | 吉安市木林森显示器件有限公司 | Novel LED lamp bead bulk sorting method |
| CN115460316A (en) * | 2022-08-04 | 2022-12-09 | 江门市征极光兆科技有限公司 | Method and system for determining positions of LED lamp string beads, storage medium and equipment |
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| CN117269826A (en) * | 2023-09-13 | 2023-12-22 | 深圳市柯瑞光电科技有限公司 | Automatic detection method and system for LED backlight source lamp bead production |
| CN117949718A (en) * | 2024-03-25 | 2024-04-30 | 杭州海康威视数字技术股份有限公司 | Voltage detection system, method and device |
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