CN116295824A - Automatic test equipment for multi-channel butterfly laser - Google Patents
Automatic test equipment for multi-channel butterfly laser Download PDFInfo
- Publication number
- CN116295824A CN116295824A CN202310267777.3A CN202310267777A CN116295824A CN 116295824 A CN116295824 A CN 116295824A CN 202310267777 A CN202310267777 A CN 202310267777A CN 116295824 A CN116295824 A CN 116295824A
- Authority
- CN
- China
- Prior art keywords
- semiconductor refrigerator
- laser
- test
- automatic test
- control unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 54
- 239000004065 semiconductor Substances 0.000 claims abstract description 51
- 230000003287 optical effect Effects 0.000 claims description 16
- 230000008054 signal transmission Effects 0.000 claims description 5
- 238000005516 engineering process Methods 0.000 abstract description 3
- 230000010354 integration Effects 0.000 abstract description 2
- 238000004886 process control Methods 0.000 abstract description 2
- 230000008859 change Effects 0.000 description 4
- 238000004891 communication Methods 0.000 description 4
- 238000013461 design Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012946 outsourcing Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000012812 general test Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000002045 lasting effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000013522 software testing Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Semiconductor Lasers (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses automatic testing equipment for a multichannel butterfly laser, which comprises a PC, wherein a micro control unit is arranged on one side of the PC, a PD array unit is arranged on one side of the micro control unit, a current source table is arranged on one side of the PD array unit, a semiconductor refrigerator driver is arranged on one side of the current source table, a semiconductor refrigerator is arranged on one side of the semiconductor refrigerator driver, and a laser is arranged on one side surface of the semiconductor refrigerator. This multichannel butterfly laser automatic test equipment through control multichannel automatic test, test data acquisition and test process control, can realize 2 times efficiency promotion, can reduce the purchase cost of equipment through integrated technology, conveniently inserts automatic test line, realizes multichannel simultaneous test through the integration, increases the test quantity in the unit time, through the PID control semiconductor refrigerator function of taking certainly, realizes automatic control constant temperature.
Description
Technical Field
The invention relates to the technical field of communication, in particular to automatic testing equipment for a multi-channel butterfly laser.
Background
With the development of science and technology, more and more high-power lasers have wide application in the fields of military, medical treatment and scientific research, but with the wide application of lasers, the detection of laser performance becomes particularly important, when the working performance of butterfly lasers is tested, the current general test of butterfly lasers adopts outsourcing equipment, a single-channel test system is composed of a laser, a current source meter, an optical power meter and a PC, and the operation process is mostly manually operated.
The optical power and line width are tested in the patent of the invention with publication number CN201910396201.1, the laser current control function is not proposed, and the current control and the laser driving current change speed control, and the parameters of the luminous intensity under the fixed current and the current magnitude under the fixed luminous intensity are all single-channel tests and are tested in an incubator.
Disclosure of Invention
The invention aims to provide a multichannel butterfly laser automatic test device, which aims to solve the problems that the prior art provided in the background art lacks current control and laser driving current change speed control, and parameters of luminous intensity under fixed current and current magnitude under fixed luminous intensity are all single-channel tests and are tested in an incubator.
In order to achieve the above purpose, the present invention provides the following technical solutions: the utility model provides a multichannel butterfly laser automatic test equipment, includes the PC, one side of PC is provided with micro-control unit, one side of micro-control unit is provided with PD array unit, one side of PD array unit is provided with the current source table, one side of current source table is provided with semiconductor refrigerator driver, one side of semiconductor refrigerator driver is provided with the semiconductor refrigerator, one side surface of semiconductor refrigerator is provided with the laser instrument.
Preferably, the number of the semiconductor refrigerators and the lasers is 5, and the semiconductor refrigerators and the lasers are electrically connected with the PD array unit through signal transmission lines.
Preferably, a power supply is arranged at one side of the semiconductor refrigerator driver, and the output end of the power supply is electrically connected with the input ends of the micro control unit, the PC, the PD array unit, the semiconductor refrigerator driver, the laser and the semiconductor refrigerator through wires.
Preferably, one side of the current source meter, the semiconductor refrigerator driver, the semiconductor refrigerator and the laser is provided with a connecting wire, and the outer ends of the connecting wires are provided with connecting terminals.
Preferably, a thermistor feedback line is electrically connected between the input end of the micro-control unit and the output end of the semiconductor refrigerator, and the micro-control unit, the current source meter and the optical power meter are all integrally designed on the control board.
Compared with the prior art, the invention has the beneficial effects that:
this multichannel butterfly laser automatic test equipment through control multichannel automatic test, test data acquisition and test process control, can realize 2 times efficiency promotion, can reduce the purchase cost of equipment through integrated technology, conveniently inserts automatic test line, realizes multichannel simultaneous test through the integration, increases the test quantity in the unit time, through the PID control semiconductor refrigerator function of taking certainly, realizes automatic control constant temperature, cancels incubator equipment, also can further reduce cost.
According to the multi-channel butterfly laser automatic test equipment, the output light power of the butterfly laser is tested while the current output and the change of the IDAC are automatically controlled by the control board, the output light power of the butterfly laser and the butterfly laser driving current value of the butterfly laser under the fixed output light power of the butterfly laser can be tested under the fixed current, and the output light power curve of the butterfly laser and the driving current curve of the butterfly laser can be tested through current scanning.
This multichannel butterfly laser automatic test equipment replaces manual operation through automatic control, realizes a plurality of products simultaneous test and improves efficiency of software testing through multichannel simultaneous control, through with little control unit, IDAC current source table and optical power meter integrated design on the control panel, can significantly reduce outsourcing optical power meter and current source table or controllable current source table equipment, and inside all software and the hardware module of equipment are independent design, can make things convenient for later stage to maintain equipment in real time.
Drawings
Fig. 1 is a system block diagram of the present invention.
In the figure: 1. a thermistor feedback line; 2. a semiconductor refrigerator driver; 3. a power supply; 4. a laser; 5. a signal transmission line; 6. a connection terminal; 7. a current source table; 8. a PD array unit; 9. a micro control unit; 10. a PC; 11. connecting wires; 12. a semiconductor refrigerator.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Embodiment one:
referring to fig. 1, the present invention provides a technical solution: the utility model provides a multichannel butterfly laser automatic test equipment, including PC 10, in the micro-control unit 9 on the control panel of test system is write the parameter standard of butterfly laser into through the interface interaction software of PC 10, start semiconductor refrigerator 12 control function, one side of PC 10 is provided with micro-control unit 9, can realize the drive current autonomous control and the automatic control of every way butterfly laser, one side of micro-control unit 9 is provided with PD array unit 8, one side of PD array unit 8 is provided with current source table 7, one side of current source table 7 is provided with semiconductor refrigerator driver 2, one side of semiconductor refrigerator driver 2 is provided with semiconductor refrigerator 12, one side surface of semiconductor refrigerator 12 is provided with laser 4, can realize comprehensive coordinated control to the drive current and the optical power scanning test function of butterfly laser, the quantity of semiconductor refrigerator 12 and laser 4 is provided with 5 respectively, have the characteristic of multichannel simultaneous test, can realize the increase test quantity in the unit time, and semiconductor refrigerator 12 and laser 4 are respectively through signal transmission line 5 and PD array unit 8 electrical connection, can carry out mutual coordinated operation between the mutual control device of mutual convenience.
The semiconductor refrigerator driver 2 is provided with the power supply 3 on one side, and the output of power supply 3 is through wire and micro-control unit 9, PC 10, PD array unit 8, semiconductor refrigerator driver 2, laser instrument 4 and semiconductor refrigerator 12's input electric connection, can conveniently provide sufficient electric power source for micro-control unit 9, PC 10, PD array unit 8, semiconductor refrigerator driver 2, laser instrument 4 and semiconductor refrigerator 12 in real time, make it can carry out lasting normal operation, current source table 7, semiconductor refrigerator driver 2, semiconductor refrigerator 12 and one side of laser instrument 4 all are provided with connecting wire 11, and the outer end of connecting wire 11 all is provided with connecting terminal 6, can carry out real-time connection switch on the circuit, conveniently carry out the real-time transmission of signal and electric current, electric connection is provided with thermistor feedback line 1 between the input of micro-control unit 9 and the output of semiconductor refrigerator 12, and micro-control unit 9, current source table 7 and optical power meter all integrate the design on the control panel, through the realization multichannel test simultaneously, the test quantity in the time of test unit is increased, can purchase the light source table or the outside of controllable light source table.
Working principle: when the automatic test of the butterfly laser is required, firstly, standard parameters for the test can be set through a PC 10, the standard parameters are transmitted to a micro control unit 9 through serial port communication, after the test is successful, the micro control unit 9 enters a waiting test state, the butterfly laser for the test is installed on a clamp, the semiconductor refrigerator 12, a light emitting diode and lines of the light emitting diode, which are connected to a PD array unit 8, are all connected, after the PC 10 sends a starting instruction, the micro control unit 9 controls 5 semiconductor refrigerators 12 to drive output currents to control the working temperature of the 5 butterfly lasers, 5 IDACs slowly increase the output currents to pass through the 5 butterfly lasers, the current increasing speed can be modified through the parameters until the set target current value is reached, after the working temperature of the butterfly laser is detected to be stable through a thermistor feedback line 1, the corresponding light emitting optical power of the 5 butterfly laser is read through the PD array unit 8, after the completion of the read operation is finished, the current of the 5 butterfly laser is automatically reduced, the output optical power of the 5 butterfly laser is read, the IDAC output currents are adjusted, after the target values of the output of the laser is read, the butterfly laser is read, the current reaches the target values of all the butterfly laser is read, and the test result is closed after the test is finished, the test result is achieved, and the test result is achieved after the test of the current is completed, and the test of all the test of the butterfly laser is finished, and the test is tested.
Embodiment two:
the automatic test equipment for the multi-channel butterfly laser of the embodiment is basically the same as that of embodiment 1 in that: taking 5 paths of tests as an example, the device can expand multiple paths, can adopt an optical power meter with a communication function and a controllable current source to replace an integrated optical power meter and a current source table 7 to realize functions, the micro control unit 9 can use programmable PLC, DSP and the like to replace the integrated optical power meter and the current source table 7, the semiconductor refrigerator 12 can use independent semiconductor refrigerator control equipment to replace to realize functions, the communication mode can use a connection mode capable of transmitting data such as IIC, SPI, RS485, WIFI and the like, the optical output power of the butterfly laser can be read in real time in the current change process, and the acquisition process parameters are used for analyzing the relation between the optical output power of the butterfly laser and driving current and the relation between the optical output power and the temperature of the butterfly laser and IDAC is a current output type DAC.
Finally, it should be noted that: the foregoing description is only a preferred embodiment of the present invention, and the present invention is not limited thereto, but it is to be understood that modifications and equivalents of some of the technical features described in the foregoing embodiments may be made by those skilled in the art, although the present invention has been described in detail with reference to the foregoing embodiments. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (5)
1. The utility model provides a multichannel butterfly laser automatic test equipment, includes PC (10), its characterized in that: one side of PC (10) is provided with micro-control unit (9), one side of micro-control unit (9) is provided with PD array unit (8), one side of PD array unit (8) is provided with current source table (7), one side of current source table (7) is provided with semiconductor refrigerator driver (2), one side of semiconductor refrigerator driver (2) is provided with semiconductor refrigerator (12), one side surface of semiconductor refrigerator (12) is provided with laser instrument (4).
2. The automatic test equipment for multi-channel butterfly laser of claim 1, wherein: the number of the semiconductor refrigerators (12) and the number of the lasers (4) are respectively provided with 5 paths, and the semiconductor refrigerators (12) and the lasers (4) are respectively electrically connected with the PD array unit (8) through the signal transmission lines (5).
3. The automatic test equipment for multi-channel butterfly laser of claim 1, wherein: one side of the semiconductor refrigerator driver (2) is provided with a power supply (3), and the output end of the power supply (3) is electrically connected with the input ends of the micro control unit (9), the PC (10), the PD array unit (8), the semiconductor refrigerator driver (2), the laser (4) and the semiconductor refrigerator (12) through wires.
4. The automatic test equipment for multi-channel butterfly laser of claim 1, wherein: one side of the current source table (7), one side of the semiconductor refrigerator driver (2), one side of the semiconductor refrigerator (12) and one side of the laser (4) are respectively provided with a connecting wire (11), and the outer ends of the connecting wires (11) are respectively provided with a connecting terminal (6).
5. The automatic test equipment for multi-channel butterfly laser of claim 1, wherein: the input end of the micro control unit (9) is electrically connected with the output end of the semiconductor refrigerator (12) and is provided with a thermistor feedback line (1), and the micro control unit (9), the current source meter (7) and the optical power meter are integrated on the control board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310267777.3A CN116295824A (en) | 2023-03-20 | 2023-03-20 | Automatic test equipment for multi-channel butterfly laser |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310267777.3A CN116295824A (en) | 2023-03-20 | 2023-03-20 | Automatic test equipment for multi-channel butterfly laser |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN116295824A true CN116295824A (en) | 2023-06-23 |
Family
ID=86830206
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310267777.3A Pending CN116295824A (en) | 2023-03-20 | 2023-03-20 | Automatic test equipment for multi-channel butterfly laser |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116295824A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117233516A (en) * | 2023-11-13 | 2023-12-15 | 朗思传感科技(深圳)有限公司 | Pin detection method and pin detection device |
-
2023
- 2023-03-20 CN CN202310267777.3A patent/CN116295824A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117233516A (en) * | 2023-11-13 | 2023-12-15 | 朗思传感科技(深圳)有限公司 | Pin detection method and pin detection device |
| CN117233516B (en) * | 2023-11-13 | 2024-03-01 | 朗思传感科技(深圳)有限公司 | Pin detection method and pin detection device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN116295824A (en) | Automatic test equipment for multi-channel butterfly laser | |
| CN111487952A (en) | Multichannel signal switching and coupling device and signal testing system | |
| CN106911419A (en) | The wavelength configuration method and apparatus of optical module | |
| CN110113835A (en) | LED light source control device, method, light source assembly and photoelectric sphyg detection device | |
| CN115372777A (en) | High-temperature test equipment and method for coaxial packaged semiconductor laser | |
| CN103715604B (en) | The drive system of Distributed Feedback Laser and driving method | |
| CN219960590U (en) | Automatic test system | |
| CN104596738A (en) | Digital type ageing equipment of laser device | |
| CN209356652U (en) | A kind of light intensity signal collection device | |
| CN215115100U (en) | Photoelectric characteristic test platform | |
| CN109765473A (en) | A kind of high power laser test macro and method | |
| CN211181602U (en) | Dynamically-adjusted night vision compatible backlight power supply system | |
| CN209545960U (en) | A kind of chip testing light-source control system | |
| CN114895130A (en) | System and method for testing backlight crosstalk rate among multiple channels of optical device | |
| CN213152432U (en) | Drive circuit of multichannel load | |
| CN209471198U (en) | A kind of static parameter test device for automobile dynamo governor | |
| CN205120875U (en) | EML laser instrument can repeat automatic testing arrangement of plug | |
| CN111624456A (en) | Test system of laser | |
| CN220820293U (en) | Optical attenuator with monitoring function | |
| CN113189903B (en) | Laser control device and method | |
| CN211528964U (en) | Probe fixture controller | |
| CN206114862U (en) | Limit switch aging testing instrument | |
| CN218276711U (en) | Optical module test system | |
| CN220141673U (en) | Electrocardiogram recorder testing device | |
| CN113630289B (en) | Test system and test method for improving production efficiency of gateway equipment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |