CN114895130A - System and method for testing backlight crosstalk rate among multiple channels of optical device - Google Patents
System and method for testing backlight crosstalk rate among multiple channels of optical device Download PDFInfo
- Publication number
- CN114895130A CN114895130A CN202210568714.7A CN202210568714A CN114895130A CN 114895130 A CN114895130 A CN 114895130A CN 202210568714 A CN202210568714 A CN 202210568714A CN 114895130 A CN114895130 A CN 114895130A
- Authority
- CN
- China
- Prior art keywords
- power
- electric switch
- optical device
- backlight
- instrument
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
The invention provides a system and a method for testing the backlight crosstalk rate among multiple channels of an optical device, wherein the test system comprises a tested optical device, a first electric switch, a second electric switch, an electric temperature control instrument and a PC (personal computer); the input end of the first electric switch is connected with the power-on end of the power-on temperature control instrument, and the output channels are respectively connected with the power-on pins of the tested optical device; a plurality of input channels of the second electric switch are respectively connected with a plurality of backlight current monitoring pins of a tested optical device, and the output end of the second electric switch is connected with a current monitoring pin of an electric temperature control instrument; the control ends of the first electric switch and the second electric switch and the data communication port of the power-on temperature control instrument are connected with the PC. The PC controls the switching control of a plurality of electric switches to respectively collect the backlight current of the tested optical device; and calculating the backlight crosstalk rate, judging whether the optical device fails or not, realizing automatic test of the backlight crosstalk rate among multiple channels of the optical device, and reducing the difficulty of manual operation and analysis.
Description
Technical Field
The invention relates to the technical field of semiconductor lasers, in particular to a system and a method for testing the backlight crosstalk rate among multiple channels of an optical device.
Background
At present, in the laser field, due to the technical difficulty limitation of a high-speed chip, most of the high-speed emitting devices are integrated in a package by a plurality of emitting chips, a single light outlet is formed, and the devices are internally composed of the plurality of emitting chips.
The crosstalk of backlight among multiple channels of the optical device can affect the use of the device, and the manual test operation and analysis are complicated, so that an apparatus and a method are needed to solve the problem.
Disclosure of Invention
In order to solve the technical problems in the background art, the invention provides a system and a method for testing the backlight crosstalk rate among multiple channels of an optical device, which realize the automatic test of the backlight crosstalk rate among the multiple channels of the optical device and solve the problems of complicated manual test operation and analysis.
In order to achieve the purpose, the invention adopts the following technical scheme:
a test system for the backlight crosstalk rate among multiple channels of an optical device comprises a tested optical device, a first electric switch, a second electric switch, an electrifying temperature control instrument and a PC (personal computer); the tested optical device is an optical device with a single light outlet, and the interior of the tested optical device is composed of a plurality of emission chips.
The input end of the first electric switch is connected with the power-on end of the power-on temperature control instrument, and the output channels are respectively connected with the power-on pins of the tested optical device; a plurality of input channels of the second electric switch are respectively connected with a plurality of backlight current monitoring pins of a tested optical device, and the output end of the second electric switch is connected with a current monitoring pin of an electric temperature control instrument; the temperature control pin of the tested optical device is correspondingly connected with the temperature control pin of the power-on temperature control instrument; the control ends of the first electric switch and the second electric switch and the data communication port of the power-on temperature control instrument are connected with the PC.
Furthermore, the device also comprises an FPC connector, wherein pins of the tested optical device are clamped on the FPC connector and are correspondingly connected with the first electric switch, the second electric switch and the power-on temperature control instrument through the pins of the FPC connector.
The testing method of the testing system for the backlight crosstalk rate among the multiple channels of the optical device comprises the following steps:
1) the PC controls a first electric switch to close a channel of a first power-up pin LD1+ of the tested device, other channels are disconnected, a temperature-control power-up instrument is powered on, the PC controls a second electric switch to sequentially select the channels of backlight current monitoring pins PD1+, PD2+,......... and PDn + pins to close, the temperature-control power-up instrument collects backlight currents Ipd11, Ipd12, and Ipd1n of the tested device through currents flowing from the second electric switch, and the temperature-control power-up instrument is powered off; the backlight crosstalk ratio is: ip 12/ip 11, ip 13/ip 11, and ip 1n/ip 11;
2) the PC controls the first electric switch to close a channel of a second power-on pin LD2+ of the tested device, other channels are disconnected, the temperature-control power-on instrument is powered on, the PC controls the second electric switch to sequentially select the channels of the backlight current monitoring pins PD1+, PD2+,......... and PDn + pins to be closed, the temperature-control power-on instrument collects backlight currents Ipd21, Ipd22, and Ipd2n of the tested device through currents flowing from the second electric switch, and the temperature-control power-on instrument is powered off; the backlight crosstalk ratio is: ip 21/ip 22, ip 23/ip 22, and ip 2n/ip 22;
3) and so on;
4) the PC controls a first electric switch to close a channel of a last power-on pin LDn + of the tested device, other channels are disconnected, a temperature-control power-on instrument is switched on for power-on, the PC controls a second electric switch to close the channels of PD1+, PD2+, the. The backlight crosstalk ratio is: ipdn1/Ipdnn, Ipdn2/Ipdnn,. and.. multidot.Ipd (n-1) n/Ipdnn;
n is the channel number of the tested optical device, the first number in the number sequence numbers after the Ipd represents the sequence number of the power-on pin, and the second number represents the sequence number of the backlight current monitoring pin;
5) and uploading the backlight current to a PC, selecting the maximum value of all the backlight crosstalk rates to be compared with a preset standard, judging that the current passes when the maximum value is smaller than the preset standard, and judging that the current fails when the maximum value is larger than or equal to the preset standard.
Further, in the whole testing process, the temperature is controlled to 50 ℃ by the temperature-control and power-up instrument, and the upper and lower allowable fluctuation ranges are within +/-0.2 ℃ according to the setting of the instrument.
Further, the energization current was set to 40-60 mA.
Compared with the prior art, the invention has the beneficial effects that:
the invention relates to a test system and a test method capable of automatically monitoring the backlight crosstalk rate among multiple channels of an optical device, wherein the backlight current of a tested optical device is respectively collected by controlling the switching control of a plurality of electric switches through a PC; and calculating the backlight crosstalk rate, judging whether the optical device fails or not, realizing automatic test of the backlight crosstalk rate among multiple channels of the optical device, and reducing the difficulty of manual operation and analysis.
Drawings
FIG. 1 is a structural diagram of a system for testing the crosstalk rate of backlight among multiple channels of an optical device according to the present invention;
figure 2 is a schematic view of the interior of a prior art electrical switch;
FIG. 3 is a flow chart of a testing method of a testing system for testing the crosstalk rate of backlight among multiple channels of an optical device according to the present invention.
Wherein, 1-PC 2-measured optical device 3-FPC connector 4-first electric switch, 5-second electric switch 6-power-on temperature control instrument.
Detailed Description
The following detailed description of the present invention will be made with reference to the accompanying drawings.
As shown in fig. 1, a test system capable of automatically monitoring the crosstalk rate of backlight among multiple channels of an optical device includes an optical device 2 to be tested, a first electric switch 4, a second electric switch 5, an energization temperature control instrument 6 and a PC 1; the measured optical device 2 is an optical device with a single light outlet, and the inside of the measured optical device is composed of a multipath emission chip.
The input end (LD +, LD-) of the first electric switch 4 is connected with the power-on end (LD +, LD-) of the power-on temperature control instrument 6, and a plurality of output channels are respectively connected with a plurality of power-on pins (LD1+, LD2+, LD3+, LD4+, LD-is a public end) of the tested light device 2; a plurality of input channels of the second electric switch 5 are respectively connected with a plurality of backlight current monitoring pins (PD1+, PD2+, PD3+, PD4+, PD-are public terminals) of the tested optical device 2, and the output end of the second electric switch is connected with the current monitoring pins (PD +, PD-) of the power-on temperature control instrument 6; temperature control pins (TH + and TH-are temperature control sampling ends of the sampling thermistors, and TEC + and TEC-are temperature control heating ends) of the tested optical device 2 are correspondingly connected with the temperature control pin of the power-on temperature control instrument 6; the control ends of the first electric switch 4 and the second electric switch 5 (through USB ports) and the data communication port of the power-on temperature control instrument 6 (through USB ports) are all connected with the PC 1.
Further, the device comprises an FPC connector 3, pins of the device to be tested 2 are clamped on the FPC connector 3, and the pins of the FPC connector 3 are correspondingly connected with a first electric switch 4, a second electric switch 5 and an electrifying temperature control instrument 6. Since the pins of the optical device are led out in an FPC manner, the FPC connector 3 is an FPC (flexible connection cable) connector of the prior art. The FPC connector 3 is used for fixing and clamping pins of the tested optical device 2, and after the test is completed, the pins can be conveniently taken out, and the next optical device to be tested is clamped again.
The PC machine 1 is connected and communicated with the first electric switch 4 and the second electric switch 5 through a USB, and the PC machine 1 can control the first electric switch 4 and the second electric switch 5 to select channels; the PC 1 is connected with the power-on temperature control instrument 6 through a USB, so that the temperature control and power-on functions of the power-on temperature control instrument 6 controlled by the PC 1 can be realized, and the power-on temperature control instrument 6 can also transmit data back to the PC 1.
Fig. 2 is a schematic diagram of internal wiring of an electric switch in the prior art, in this case, each of the LD + and PD + of the tested optical device 2 is connected to the electric switch, the electric switch can control the opening or closing of each channel, and the current of the selected channel finally flows out from the other end. The first electric switch 4 and the second electric switch 5 have the same structure, except that the first electric switch 4 takes the multichannel direction as the output direction, and the second electric switch 5 takes the multichannel direction as the input direction.
A test method of a test system for the backlight crosstalk rate among multiple channels of an optical device comprises the following steps:
1) the PC 1 controls the first electric switch 4 to be selected as a channel of a first power-on pin LD1+ of the tested device 2 to be closed, other channels are opened, the temperature-controlled power-on instrument 6 is powered on, the PC 1 controls the second electric switch 5 to sequentially select a channel of a backlight current monitoring pin PD1+, PD2+,. the.. PDn + pins to be closed, the temperature-controlled power-on instrument 6 collects backlight currents Ipd11, Ipd12,.. the.. Ipd1n of the tested device 2 through the current flowing from the second electric switch 5, and the temperature-controlled power-on instrument 6 is powered off; the backlight crosstalk ratio is: ip 12/ip 11, ip 13/ip 11, and ip 1n/ip 11;
2) the PC 1 controls the first electric switch 4 to be selected as a channel of a second power-on pin LD2+ of the tested device 2 to be closed, other channels are opened, the temperature-controlled power-on instrument 6 is powered on, the PC 1 controls the second electric switch 5 to sequentially select a channel of a backlight current monitoring pin PD1+, PD2+,. the.. PDn + pins to be closed, the temperature-controlled power-on instrument 6 collects backlight currents Ipd21, Ipd22,.. the.. Ipd2n of the tested device 2 through the current flowing from the second electric switch 5, and the temperature-controlled power-on instrument 6 is powered off; the backlight crosstalk ratio is: ipd21/Ipd22, Ipd23/Ipd22, Ipd2n/Ipd 22;
3) and so on;
4) the PC 1 controls the first electric switch 4 to be selected as the channel of the last power-on pin LDn + of the tested device 2 to be closed, the other channels are opened, the temperature-control power-on instrument 6 is powered on, the PC 1 controls the second electric switch 5 to be sequentially selected as the channel of the pins PD1+, PD2+, PDn + to be closed, the temperature-control power-on instrument 6 collects the backlight current Ipdn1, Ipdn2, the. The backlight crosstalk ratio is: ipdn1/Ipdnn, Ipdn2/Ipdnn,. and.. multidot.Ipd (n-1) n/Ipdnn;
n is the channel number of the tested optical device 2, the first number in the numerical sequence numbers after the Ipd represents the sequence number of the power-up pin, and the second number represents the sequence number of the backlight current monitoring pin;
6) and the backlight current is uploaded to the PC 1, the maximum value of all the backlight crosstalk rates is selected to be compared with a preset standard, the backlight crosstalk rate is judged to be passed if the maximum value is smaller than the preset standard, and the backlight crosstalk rate is judged to be invalid if the maximum value is larger than or equal to the preset standard.
Further, in the whole test process, the temperature is controlled to 50 ℃ by the temperature-controlled electric instrument 6, and the upper and lower allowable fluctuation ranges float within +/-0.2 ℃ according to the set of the instrument.
Further, the energization current was set to 40-60 mA.
Taking the four-channel laser device in fig. 1 as an example, the flow of the embodiment of the method is shown in fig. 3, which specifically includes the following steps:
1) opening the temperature control and power-up instrument 6, clamping the tested device 2 on the FPC connector 3 of the device to be tested, and preparing before testing;
2) inputting PN of DUT (tested optical device 2) and unique SN in PC 1, starting test;
3) the power-on temperature control instrument 6 displays different resistance values of the thermistors corresponding to different temperatures through the resistance values of the TH + and TH-sampling thermistors directly connected with the power-on temperature control instrument 6, and meanwhile, the resistance values can be refreshed to be displayed on a program;
4) the preset test temperature of the power-on temperature control instrument 6 is 50 ℃, the power-on current is 50mA, and the crosstalk passing standard N% is preset in the PC 1; the PC 1 controls a 1.6 temperature control power-on instrument, the temperature of the DUT is controlled to 50 ℃ by 1.6, and the upper and lower allowable fluctuation ranges float within +/-0.2 ℃ according to the setting of the instrument;
5) the PC 1 controls the first electric switch 4 to select the channel with the LD1+ pin to be closed, other channels are opened, the temperature-controlled power-up instrument 6 is powered on, the PC 1 controls the second electric switch 5 to sequentially select the channels with the PD1+, the PD2+, the PD3+ and the PD4+ pin to be closed, the temperature-controlled power-up instrument 6 adopts the backlight currents Ipd11, Ipd12, Ipd13 and Ipd14 of the tested light device 2 through the current flowing from the second electric switch 5, and the temperature-controlled power-up instrument 6 is powered off; the backlight crosstalk ratio is: ipd12/Ipd11, Ipd13/Ipd11, Ipd14/Ipd 11;
6) the PC 1 controls the first electric switch 4 to select the channel with the LD2+ pin to be closed, other channels are opened, the temperature-controlled power-up instrument 6 is powered on, the PC 1 controls the second electric switch 5 to sequentially select the channels with the PD1+, the PD2+, the PD3+ and the PD4+ pin to be closed, the temperature-controlled power-up instrument 6 adopts the backlight currents Ipd21, Ipd22, Ipd23 and Ipd24 of the tested light device 2 through the current flowing from the second electric switch 5, and the temperature-controlled power-up instrument 6 is powered off; the backlight crosstalk ratio is: ipd21/Ipd22, Ipd23/Ipd22, Ipd24/Ipd 22;
7) the PC 1 controls the first electric switch 4 to select the channel with the LD3+ pin to be closed, other channels are opened, the temperature-controlled power-up instrument 6 is powered on, the PC 1 controls the second electric switch 5 to sequentially select the channels with the PD1+, the PD2+, the PD3+ and the PD4+ pin to be closed, the temperature-controlled power-up instrument 6 adopts the backlight currents Ipd31, Ipd32, Ipd33 and Ipd34 of the tested light device 2 through the current flowing from the second electric switch 5, and the temperature-controlled power-up instrument 6 is powered off; the backlight crosstalk ratio is: ipd31/Ipd33, Ipd32/Ipd33, Ipd34/Ipd 33;
8) the PC 1 controls the first electric switch 4 to select the channel with the LD4+ pin to be closed, other channels are opened, the temperature-controlled power-up instrument 6 is powered on, the PC 1 controls the second electric switch 5 to sequentially select the channels with the PD1+, the PD2+, the PD3+ and the PD4+ pin to be closed, the temperature-controlled power-up instrument 6 adopts the backlight currents Ipd41, Ipd42, Ipd43 and Ipd44 of the tested light device 2 through the current flowing from the second electric switch 5, and the temperature-controlled power-up instrument 6 is powered off; the backlight crosstalk ratio is: ipd41/Ipd44, Ipd42/Ipd44, Ipd43/Ipd 44.
9) And the backlight current is uploaded to the PC 1, the maximum value of the 12 backlight crosstalk rates is selected to be compared with a preset standard, the backlight crosstalk rate is judged to be passed if the maximum value is smaller than the preset standard, and the backlight crosstalk rate is judged to be invalid if the maximum value is larger than or equal to the preset standard.
The above embodiments are implemented on the premise of the technical solution of the present invention, and detailed embodiments and specific operation procedures are given, but the scope of the present invention is not limited to the above embodiments. The methods used in the above examples are conventional methods unless otherwise specified.
Claims (5)
1. A test system for the backlight crosstalk rate among multiple channels of an optical device is characterized by comprising a tested optical device, a first electric switch, a second electric switch, a power-on temperature control instrument and a PC (personal computer); the tested optical device is an optical device with a single light outlet, and the interior of the tested optical device consists of a plurality of emission chips;
the input end of the first electric switch is connected with the power-on end of the power-on temperature control instrument, and the output channels are respectively connected with the power-on pins of the tested optical device; a plurality of input channels of the second electric switch are respectively connected with a plurality of backlight current monitoring pins of a tested optical device, and the output end of the second electric switch is connected with a current monitoring pin of an electric temperature control instrument; the temperature control pin of the tested optical device is correspondingly connected with the temperature control pin of the power-on temperature control instrument; the control ends of the first electric switch and the second electric switch and the data communication port of the power-on temperature control instrument are connected with the PC.
2. The system for testing the backlight crosstalk rate among multiple channels of an optical device according to claim 1, further comprising an FPC connector, wherein pins of the optical device to be tested are clamped on the FPC connector and are correspondingly connected with the first electric switch, the second electric switch and the power-on temperature control instrument through the pins of the FPC connector.
3. The method for testing the system for testing the crosstalk rate of the backlight among the multiple channels of the optical device as recited in claim 1, comprising the steps of:
1) the PC controls a first electric switch to close a channel of a first power-up pin LD1+ of the tested device, other channels are disconnected, a temperature-control power-up instrument is powered on, the PC controls a second electric switch to sequentially select the channels of backlight current monitoring pins PD1+, PD2+,......... and PDn + pins to close, the temperature-control power-up instrument collects backlight currents Ipd11, Ipd12, and Ipd1n of the tested device through currents flowing from the second electric switch, and the temperature-control power-up instrument is powered off; the backlight crosstalk ratio is: ip 12/ip 11, ip 13/ip 11, and ip 1n/ip 11;
2) the PC controls the first electric switch to close a channel of a second power-on pin LD2+ of the tested device, other channels are disconnected, the temperature-control power-on instrument is powered on, the PC controls the second electric switch to sequentially select the channels of the backlight current monitoring pins PD1+, PD2+,......... and PDn + pins to be closed, the temperature-control power-on instrument collects backlight currents Ipd21, Ipd22, and Ipd2n of the tested device through currents flowing from the second electric switch, and the temperature-control power-on instrument is powered off; the backlight crosstalk ratio is: ip 21/ip 22, ip 23/ip 22, and ip 2n/ip 22;
3) and so on;
4) the PC controls a first electric switch to close a channel of a last power-on pin LDn + of the tested device, other channels are disconnected, a temperature-control power-on instrument is switched on for power-on, the PC controls a second electric switch to close the channels of PD1+, PD2+, the. The backlight crosstalk ratio is: ipdn1/Ipdnn, Ipdn2/Ipdnn,. and.. multidot.Ipd (n-1) n/Ipdnn;
n is the channel number of the tested optical device, the first number in the number sequence numbers after the Ipd represents the sequence number of the power-on pin, and the second number represents the sequence number of the backlight current monitoring pin;
5) and uploading the backlight current to a PC, selecting the maximum value of all the backlight crosstalk rates to be compared with a preset standard, judging that the current passes when the maximum value is smaller than the preset standard, and judging that the current fails when the maximum value is larger than or equal to the preset standard.
4. The method according to claim 3, wherein the temperature control and power-up meter controls the temperature to 50 ℃ during the whole testing process, and the upper and lower allowable fluctuation ranges are within ± 0.2 ℃ according to the setting of the meter.
5. The method as claimed in claim 3, wherein the power-on current is set to 40-60 mA.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210568714.7A CN114895130A (en) | 2022-05-24 | 2022-05-24 | System and method for testing backlight crosstalk rate among multiple channels of optical device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210568714.7A CN114895130A (en) | 2022-05-24 | 2022-05-24 | System and method for testing backlight crosstalk rate among multiple channels of optical device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114895130A true CN114895130A (en) | 2022-08-12 |
Family
ID=82724294
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210568714.7A Pending CN114895130A (en) | 2022-05-24 | 2022-05-24 | System and method for testing backlight crosstalk rate among multiple channels of optical device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114895130A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117452059A (en) * | 2023-12-25 | 2024-01-26 | 成都光创联科技有限公司 | Testing circuit and method for multichannel backlight detector of optical device |
-
2022
- 2022-05-24 CN CN202210568714.7A patent/CN114895130A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117452059A (en) * | 2023-12-25 | 2024-01-26 | 成都光创联科技有限公司 | Testing circuit and method for multichannel backlight detector of optical device |
| CN117452059B (en) * | 2023-12-25 | 2024-02-27 | 成都光创联科技有限公司 | Testing circuit and method for multichannel backlight detector of optical device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN112422182B (en) | Multifunctional adjusting and measuring device and method for WDM (wavelength division multiplexing) optical module | |
| CN114895130A (en) | System and method for testing backlight crosstalk rate among multiple channels of optical device | |
| CN111487952A (en) | Multichannel signal switching and coupling device and signal testing system | |
| CN113759239B (en) | Chip testing device and chip testing method | |
| TW201111802A (en) | Wafer level contactor | |
| CN205693674U (en) | The multichannel debugging system of integrating device on a kind of bi-directional light device board | |
| CN206818799U (en) | A kind of multichannel precision micro resistance test system | |
| CN107766187A (en) | It is a kind of to support the reliability of multi-USB interface equipment is same to survey device and method | |
| CN218099396U (en) | Test system capable of automatically monitoring backlight crosstalk rate among multiple channels of optical device | |
| CN115561527A (en) | Multi-path small-size small-resistance power-on aging and resistance monitoring system and method | |
| CN114675168A (en) | Calibration interface board and system of universal card slot of automatic integrated circuit test equipment | |
| CN114487691A (en) | Portable cable conduction insulation detection device | |
| CN218445837U (en) | Aging board and chip aging test system | |
| CN212567879U (en) | Laser chip aging test system | |
| CN113484711B (en) | Multi-device parallel high-temperature grid bias test platform and test method thereof | |
| CN101311740A (en) | Electronic assembly test system | |
| CN210429811U (en) | Multi-core test circuit structure | |
| CN112327114B (en) | Heater resistance insulation measuring device suitable for spacecraft thermal test | |
| CN214473651U (en) | Automatic testing and calibrating system for RMS power supply switching module | |
| CN208224391U (en) | A kind of photoelectrical coupler test device | |
| CN211063575U (en) | Multichannel solar cell module screening test device | |
| CN109596892A (en) | A kind of combined electric switches conductive loop resistance method for fast measuring and device | |
| CN211785977U (en) | Circuit board capable of automatically switching battery module test circuit | |
| CN115616290B (en) | Kelvin-mode multi-path spring pin resistance testing device and method | |
| CN220629336U (en) | Optical module test board |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information | ||
| CB02 | Change of applicant information |
Address after: No. 262, Yueling Road, high tech Zone, Anshan City, Liaoning Province 114000 Applicant after: Liaoning Youxinguang Technology Co.,Ltd. Address before: No. 262, Yueling Road, high tech Zone, Anshan City, Liaoning Province 114000 Applicant before: LIAONING YOUXUN TECHNOLOGY CO.,LTD. |