CN208224391U - A kind of photoelectrical coupler test device - Google Patents
A kind of photoelectrical coupler test device Download PDFInfo
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- CN208224391U CN208224391U CN201820813858.3U CN201820813858U CN208224391U CN 208224391 U CN208224391 U CN 208224391U CN 201820813858 U CN201820813858 U CN 201820813858U CN 208224391 U CN208224391 U CN 208224391U
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Abstract
The utility model discloses a kind of photoelectrical coupler test devices, including source table, control module, voltage source and optocoupler to install module；The optocoupler installation module has input anode tap, input cathode terminal, output collector terminal and output emitter terminal, the input cathode terminal and the output emitter terminal grounding connection；The output end of the source table is connected to the input anode tap, and is provided with switch module on the connection circuit of the two；The output end of the source table is additionally coupled to the output collector terminal, and is provided with switch module on the connection circuit of the two；The voltage source is connected to the input anode tap.The photoelectrical coupler test device of the utility model, is able to achieve multiple technologies parameter testing, and structure is simple, and testing efficiency is high.
Description
Technical field
The utility model belongs to optocoupler detection technique field, and in particular to a kind of photoelectrical coupler test device.
Background technique
Photoelectrical coupler is a kind of electric one power conversion device of a light using light as media transmission electric signal.It by light emitting source and
Light-receiving device two parts composition.Light emitting source and light-receiving device are assembled in same closed shell, to each other with transparent insulator every
From.The pin of light emitting source is input terminal, and the pin of light-receiving device is output end, and common light emitting source is light emitting diode, light-receiving device
For photodiode, phototriode etc..
Photoelectrical coupler requires to test by some technical parameters during the manufacturing, such as light emitting diode
Insulation resistance, collector-transmitting between forward voltage drop VF, forward current IF, current transfer ratio CTR, input stage and output stage
Pole breakdown reverse voltage V (BR) CEO, collector-emitter saturation voltage drop VCE (sat) etc..
But the test of existing photoelectrical coupler needs different test device completions pair according to test item difference
The test answered, apparatus is more, and testing efficiency is low, inconvenient.
Utility model content
The purpose of this utility model is that: aiming at the problems existing in the prior art, provide a kind of photoelectrical coupler test
Device realizes the multiple technologies parameter testing function to photoelectrical coupler in one, and circuit structure is simple, easy to operate, test
It is high-efficient.
To achieve the goals above, the technical solution adopted in the utility model are as follows:
A kind of photoelectrical coupler test device, including source table, control module, voltage source and optocoupler install module；
The optocoupler installation module has input anode tap, input cathode terminal, output collector terminal and output emitter
End, the input cathode terminal and the output emitter terminal grounding connection；
The output end of the source table is connected to the input anode tap, and is provided with out on the connection circuit of the two
Close module；
The output end of the source table is additionally coupled to the output collector terminal, and is arranged on the connection circuit of the two
There is switch module；
The voltage source is connected to the input anode tap.
It further, further include control module, the opening and closing of the control module control switch module.
Further, the switch module uses relay.
Further, optocoupler installation module is provided with multiple, and in the defeated of multiple optocouplers installation module
Enter anode tap and be provided with switch module, to switch and open and close input power, in the output of multiple optocouplers installation module
Collector terminal is provided with switch module, to switch and open and close input power.
Further, the input anode tap and output collector terminal are connected separately with protective resistance.
Further, the voltage source includes first voltage source and the second voltage source, the output end of first voltage source and
The output end of the second voltage source is provided with switch module, to switch and open and close input voltage source.
By adopting the above-described technical solution, the beneficial effects of the utility model are:
The photoelectrical coupler test device of the utility model can be realized and survey on the same device to the IR of photoelectrical coupler
Examination, VF test, ICEO test, VBR (CEO) test, CTR test and VCESAT test, circuit structure is simple, test process operation
Convenient, testing efficiency is high.
Detailed description of the invention
Fig. 1 is the schematic block circuit diagram of the photoelectrical coupler test device of the utility model.
Fig. 2 is the structure principle chart of photoelectrical coupler.
Appended drawing reference: the source 1- table, 2- voltage source, 3- optocoupler install module.
Specific embodiment
Referring to Fig.1, Fig. 2, the photoelectrical coupler test device of the utility model, including source table 1, control module, voltage source
2, optocoupler installation module 3 and switch module.
It is dummy status, no current and voltage output when source table 1 is initially accessed, journey is carried out according to corresponding time sequence when follow-up test
The test of sequence control.
Optocoupler, which installs module 3, has input anode tap, input cathode terminal, output collector terminal and output emitter terminal, this
The optocoupler installation module 3 of utility model is to be suitable for NPN transistor type and PNP transistor type, and according to different types, setting is not
Same pin, the present embodiment select the optocoupler of one of transistor types to carry out detection explanation.
Input cathode terminal and output emitter terminal grounding connection.In the present embodiment, optocoupler installation module 3 is provided with 4, to
The photoelectrical coupler of test can be monomer structure, be also possible to couple structure, for the photoelectrical coupler of monomer structure, once
Performance enough assembles 4, for the photoelectrical coupler of couple structure, can disposably assemble 2, and so on, also it can be set
The optocoupler of other quantity installs module 3, to test the photoelectrical coupler of different structure.By disposably assembling multiple optocoupler installations
Module 3 effectively improves testing efficiency, reduces the clamping time.The input cathode terminal and output emitter of 4 optocoupler installation modules 3
Equal grounding connection is held to handle.
Voltage source 2 includes first voltage source and the second voltage source, and service voltage when first voltage source provides CTR test is
2.5V；The second voltage source provides saturation voltage drop voltage, is 3.8V.
Switch module includes first switch component, second switch component, third switch block and the 4th switch block, and first
Switch block includes the switch SS1 and switch SS2 being connected in parallel, and second switch component includes the switch SD1 being connected in parallel and opens
SD2 is closed, third switch block includes the switch SI1 being connected in parallel, switch SI2, switch SI3 and switch SI4, the 4th switch block
Including switch SO1, switch SO2, switch SO3 and the switch SO4 being connected in parallel.
First voltage source connects second switch component with the second voltage source, wherein first voltage source connection switch SD1, and second
Voltage source connection switch SD2 connects third switch block after the switch SD1 and switch SD2 of second switch component are in parallel, and third is opened
Switch SI1, switch SI2, switch SI3 and the switch SI4 for closing component are separately connected the input anode of four optocoupler installation modules 3
End.
The output end of source table 1 connects first switch component, and output is divided into two-way by switch SS1 and switch SS2, is connected
Switch SS1's is connected to all the way between second switch component and third switch block.Connection switch SS2's is connected to the 4th all the way
Switch block is subdivided into four tunnels by the switch SO1 of the 4th switch block, switch SO2, switch SO3 and switch SO4 again,
Each way switch is connected to output collector terminal.
In the present embodiment, protective resistance R is provided between each group of switch and input anode tap of third switch block1,
Protective resistance R is provided between output collector terminal and each group of switch of the 4th switch block0, resistance R1=133 Ω, protection
Resistance R0=56 Ω, due to being related to subsequent calculating, to guarantee computational accuracy, therefore it is required that higher using resistance precision, it is desirable that electricity
Resistance under normal circumstances error ± 0.5 Ω or less (resistance will not require it steady in a long-term into high and low temperature environment).
Switch in the switch module of the present embodiment is all made of relay to realize, control module includes the first control module
With the second control module, the first control module connects second switch component and third switch block, can control second respectively and open
The closure of each group of switch of component and third switch block is closed, the second control module connects first switch component and the 4th switch
Component can control the closure of each group of switch of first switch component and the 4th switch block.
First control module and the second control module are respectively connected with PC machine, and writing for control program can be carried out by PC machine
Enter, while power supply being also provided.
Test process is as follows:
1, four road IR are tested:
Test condition: the electric current of diode is flowed through in diode both ends making alive -5V, test；
Failure criteria: 10 μ A of absolute value IR >, fail data mark that (or other are eye-catching with The Scarlet Letter in ultimately generating report
Mode mark can also)；
Source table 1 is arranged: setting 1 output voltage -5V of source table, and 1mA is arranged in clamp current, and feedback information is output electric current, reads
Current unit should be μ A out；
IR1 corresponds to switch state: SS1, SI1 are closed the switch, and corresponding circuits conducting, rest switch is all off, and switch closes
Be delayed 0.5s after conjunction, and source table 1 acquires feedback current information and table is written, and disconnects all switches, carries out fail-ure criterion；
IR2 corresponds to switch state: SS1, SI2 are closed the switch, and corresponding circuits conducting, rest switch is all off, and switch closes
Be delayed 0.5s after conjunction, and source table 1 acquires feedback current information and table is written, and disconnects all switches, carries out fail-ure criterion；
IR3 corresponds to switch state: SS1, SI3 are closed the switch, and corresponding circuits conducting, rest switch is all off, and switch closes
Be delayed 0.5s after conjunction, and source table 1 acquires feedback current information and table is written, and disconnects all switches, carries out fail-ure criterion；
IR4 corresponds to switch state: SS1, SI4 are closed the switch, and corresponding circuits conducting, rest switch is all off, and switch closes
Be delayed 0.5s after conjunction, and source table 1 acquires feedback current information and table is written, and disconnects all switches, carries out fail-ure criterion；
2, four road VF are tested:
Test condition: 10mA forward current, test diode both end voltage value are provided to diode；
Failure criteria: VF > 1.4V, fail data marked in ultimately generating report by The Scarlet Letter (or other it is eye-catching in a manner of mark
Out can also)；
Calculation formula: 1 output voltage values -1.33 (V) of the source VF=table
Source table 1 is arranged: setting output electric current 10mA, clamp voltage 5V, feedback information is output voltage, and voltage unit should be
V；
VF1 corresponds to switch state: SS1, SI1 are closed the switch, and corresponding circuits conducting, rest switch is all off, and switch closes
Be delayed 0.5s after conjunction, and source table 1 acquires feedback voltage information and calculated and be written table, disconnects all switches, carries out failure and sentences
It is fixed；
VF2 corresponds to switch state: SS1, SI2 are closed the switch, and corresponding circuits conducting, rest switch is all off, and switch closes
Be delayed 0.5s after conjunction, and source table 1 acquires feedback voltage information and calculated and be written table, disconnects all switches, carries out failure and sentences
It is fixed；
VF3 corresponds to switch state: SS1, SI3 are closed the switch, and corresponding circuits conducting, rest switch is all off, and switch closes
Be delayed 0.5s after conjunction, and source table 1 acquires feedback voltage information and calculated and be written table, disconnects all switches, carries out failure and sentences
It is fixed；
VF4 corresponds to switch state: SS1, SI4 are closed the switch, and corresponding circuits conducting, rest switch is all off, and switch closes
Be delayed 0.5s after conjunction, and source table 1 acquires feedback voltage information and calculated and be written table, disconnects all switches, carries out failure and sentences
It is fixed；
3, four road ICEO are tested:
Test condition: the electric current of collector is flowed through in given voltage 30V, test；
Failure criteria: 0.1 μ A of absolute value ICEO >, fail data marked in ultimately generating report with The Scarlet Letter (or other
Eye-catching mode mark can also), should also increase high temperature failure criterion: 60 μ A of absolute value ICEO > herein；
Source table 1 is arranged: setting output voltage 30V, and 1mA is arranged in clamp current, and feedback information is output electric current, read current
Unit is μ A；
ICEO1 corresponds to switch state: SS2, SO1 are closed the switch, and corresponding circuits conducting, rest switch is all off, switch
Be delayed 0.5s after closure, and source table 1 acquires feedback current information and table is written, and disconnects all switches, carries out fail-ure criterion；
ICEO2 corresponds to switch state: SS2, SO2 are closed the switch, and corresponding circuits conducting, rest switch is all off, switch
Be delayed 0.5s after closure, and source table 1 acquires feedback current information and table is written, and disconnects all switches, carries out fail-ure criterion；
ICEO3 corresponds to switch state: SS2, SO3 are closed the switch, and corresponding circuits conducting, rest switch is all off, switch
Be delayed 0.5s after closure, and source table 1 acquires feedback current information and table is written, and disconnects all switches, carries out fail-ure criterion；
ICEO4 corresponds to switch state: SS2, SO4 are closed the switch, and corresponding circuits conducting, rest switch is all off, switch
Be delayed 0.5s after closure, and source table 1 acquires feedback current information and table is written, and disconnects all switches, carries out fail-ure criterion；
4, four road VBR (CEO) are tested:
Test condition: constant current 0.1mA, test set electrode-transmitter pole both end voltage are given；
Failure criteria: absolute value VBR (CEO) < 40V, fail data marked in ultimately generating report with The Scarlet Letter (or its
His eye-catching mode mark can also)；
Source table 1 is arranged: 120V is arranged in setting output electric current 0.1mA, clamp voltage, and feedback information is output end voltage, single
Position is V；
VBRCEO1 corresponds to switch state: SS2, SO1 are closed the switch, and corresponding circuits conducting, rest switch is all off, opens
The 0.5s that is delayed is closed after closing, and source table 1 acquires feedback voltage information and table is written, and disconnects all switches, carries out fail-ure criterion；
VBRCEO2 corresponds to switch state: SS2, SO2 are closed the switch, and corresponding circuits conducting, rest switch is all off, opens
The 0.5s that is delayed is closed after closing, and source table 1 acquires feedback voltage information and table is written, and disconnects all switches, carries out fail-ure criterion；
VBRCEO3 corresponds to switch state: SS2, SO3 are closed the switch, and corresponding circuits conducting, rest switch is all off, opens
The 0.5s that is delayed is closed after closing, and source table 1 acquires feedback voltage information and table is written, and disconnects all switches, carries out fail-ure criterion；
VBRCEO4 corresponds to switch state: SS2, SO4 are closed the switch, and corresponding circuits conducting, rest switch is all off, opens
The 0.5s that is delayed is closed after closing, and source table 1 acquires feedback voltage information and table is written, and disconnects all switches, carries out fail-ure criterion；
5, four road CTR are tested:
Test condition: given VCE=10V, IF=10mA (calculate equivalent voltage with voltage source to provide), and current collection is flowed through in test
The electric current of pole；
Failure criteria: CTR < 60% (i.e. source table 1 measures electric current IC < 6mA), fail data in ultimately generating report with
The Scarlet Letter marks (or other eye-catching modes mark can also)；
Source table 1 is arranged: being set as output voltage 10V, clamp current 30mA, feedback information is electric current, unit mA；
Calculation formula: CTR=collector current IC ÷ 10 × 100%；
CTR1 corresponds to switch state: SD1, SI1, SS2, SO1 closure, corresponding circuits conducting, rest switch is all off, opens
The 0.5s that is delayed is closed after closing, source table 1 is calculated after acquiring feedback current information according to formula, and table is written in calculated value,
All switches are disconnected, fail-ure criterion is carried out；
CTR2 corresponds to switch state: SD1, SI2, SS2, SO2 closure, corresponding circuits conducting, rest switch is all off, opens
The 0.5s that is delayed is closed after closing, source table 1 is calculated after acquiring feedback current information according to formula, and table is written in calculated value,
All switches are disconnected, fail-ure criterion is carried out；
CTR3 corresponds to switch state: SD1, SI3, SS2, SO3 closure, corresponding circuits conducting, rest switch is all off, opens
The 0.5s that is delayed is closed after closing, source table 1 is calculated after acquiring feedback current information according to formula, and table is written in calculated value,
All switches are disconnected, fail-ure criterion is carried out；
CTR4 corresponds to switch state: SD1, SI4, SS2, SO4 closure, corresponding circuits conducting, rest switch is all off, opens
The 0.5s that is delayed is closed after closing, source table 1 is calculated after acquiring feedback current information according to formula, and table is written in calculated value,
All switches are disconnected, fail-ure criterion is carried out；
6, four road VCESAT are tested
Test condition: given input current IF=20mA (providing so that voltage source is equivalent), collector current IC=1mA are surveyed
Try collector emitter voltage drop；
Failure criteria: VCESAT > 250mV, fail data mark that (or other are eye-catching with The Scarlet Letter in ultimately generating report
Mode mark can also)；
Source table 1 is arranged: setting output electric current is 1mA, and clamp voltage 5V, feedback information is voltage, voltage unit mV；
Calculation formula: the source VCESAT=table 1 measures voltage -56 (mV)；
VCESAT1 corresponds to switch state: SD2, SI1, SS2, SO1 closure, corresponding circuits conducting, and rest switch is all disconnected
It opens, be delayed 0.5s after closing the switch, and source table 1 is calculated after acquiring feedback voltage information according to formula, and calculated value is written
Table disconnects all switches, carries out fail-ure criterion；
VCESAT2 corresponds to switch state: SD2, SI2, SS2, SO2 closure, corresponding circuits conducting, and rest switch is all disconnected
It opens, be delayed 0.5s after closing the switch, and source table 1 is calculated after acquiring feedback voltage information according to formula, and calculated value is written
Table disconnects all switches, carries out fail-ure criterion；
VCESAT3 corresponds to switch state: SD2, SI3, SS2, SO3 closure, corresponding circuits conducting, and rest switch is all disconnected
It opens, be delayed 0.5s after closing the switch, and source table 1 is calculated after acquiring feedback voltage information according to formula, and calculated value is written
Table disconnects all switches, carries out fail-ure criterion；
VCESAT4 corresponds to switch state: SD2, SI4, SS2, SO4 closure, corresponding circuits conducting, and rest switch is all disconnected
It opens, be delayed 0.5s after closing the switch, and source table 1 is calculated after acquiring feedback voltage information according to formula, and calculated value is written
Table disconnects all switches, carries out fail-ure criterion.
Claims (6)
1. a kind of photoelectrical coupler test device, which is characterized in that install mould including source table, control module, voltage source and optocoupler
Block；
The optocoupler installation module has input anode tap, input cathode terminal, output collector terminal and output emitter terminal, institute
The input cathode terminal stated and the output emitter terminal grounding connection；
The output end of the source table is connected to the input anode tap, and is provided with switching molding on the connection circuit of the two
Block；
The output end of the source table is additionally coupled to the output collector terminal, and is provided with out on the connection circuit of the two
Close module；
The voltage source is connected to the input anode tap.
2. photoelectrical coupler test device according to claim 1, which is characterized in that it further include control module, it is described
The opening and closing of the control module control switch module.
3. photoelectrical coupler test device according to claim 1, which is characterized in that the switch module uses relay
Device.
4. photoelectrical coupler test device according to claim 1, which is characterized in that the optocoupler installation module setting
Have multiple, and the input anode tap of described multiple optocouplers installation module is provided with switch module, defeated to switch and open and close
Enter power supply, the output collector terminal of described multiple optocouplers installation module is provided with switch module, defeated to switch and open and close
Enter power supply.
5. photoelectrical coupler test device according to claim 1, which is characterized in that the input anode tap and output
Collector terminal is connected separately with protective resistance.
6. photoelectrical coupler test device according to claim 1, which is characterized in that the voltage source includes the first electricity
Potential source and the second voltage source, the output end of first voltage source and the output end of the second voltage source are provided with switch module, to cut
Change and open and close input voltage source.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201820813858.3U CN208224391U (en) | 2018-05-29 | 2018-05-29 | A kind of photoelectrical coupler test device |
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| CN201820813858.3U CN208224391U (en) | 2018-05-29 | 2018-05-29 | A kind of photoelectrical coupler test device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113064043A (en) * | 2021-03-26 | 2021-07-02 | 深圳群芯微电子有限责任公司 | Optical coupler testing method and system |
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2018
- 2018-05-29 CN CN201820813858.3U patent/CN208224391U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113064043A (en) * | 2021-03-26 | 2021-07-02 | 深圳群芯微电子有限责任公司 | Optical coupler testing method and system |
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Address after: No. 101.102, Building 12, No. 88 Keyuan South Road, High tech Zone, Chengdu, Sichuan, 610041 Patentee after: Chengdu Hantong Integrated Technology Co.,Ltd. Address before: No. 1 high tech Zone Gaopeng road in Chengdu city of Sichuan Province in 610000 Patentee before: CHENGDU CHINAR INTEGRATED TECHNOLOGY CO.,LTD. |
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