CN100573170C - The testing apparatus of automatized measurement for luminous diode and method - Google Patents
The testing apparatus of automatized measurement for luminous diode and method Download PDFInfo
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- CN100573170C CN100573170C CNB2007100857753A CN200710085775A CN100573170C CN 100573170 C CN100573170 C CN 100573170C CN B2007100857753 A CNB2007100857753 A CN B2007100857753A CN 200710085775 A CN200710085775 A CN 200710085775A CN 100573170 C CN100573170 C CN 100573170C
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- light emitting
- emitting diode
- photosensory assembly
- test device
- automated test
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Abstract
The present invention is a kind of testing apparatus and method of automatic measurement one light emitting diode.Automated test device of the present invention comprises a measurement jig, a determinand placement, a measurement mechanism and a power supply device.Measurement jig comprises photosensory assembly.The determinand placement is used for the light emitting diode that will survey is set, and determinand placement and the electric connection of this power supply device, so that this light emitting diode one fixed voltage to be provided.Measurement mechanism is measured the characteristic variations of trying photosensory assembly in the tool in order to automatic survey, and whether use the function of judging this light emitting diode normal.
Description
Technical field
The present invention relates to a kind of automated test device, particularly a kind of automated test device with automatic test light emitting diode quality.
Background technology
In the middle of present life, the use of light emitting diode is more and more universal.Under the big situation of light emitting diode output, produce online will be really and whether test the effect of light emitting diode apace normally just extremely important.In the middle of the prior art, the production of making online to test light emitting diode whether normal all be usually give the fixing voltage of light emitting diode after, whether luminous or luminous bright degree judges whether the function of light emitting diode normal to utilize people's eyes to go to observe it again.But thus, have careless mistake unavoidably in the artificial judgement by the tester.And the tester can't quantize the luminous degree of light emitting diode, and the normal brightness scope that also is difficult for defining a good light emitting diode why.On the other hand, this method of testing also can be increased in the time of the online assembling of production and the consume of tool, and then increases production cost.
Therefore, need a kind of new automated test device and the method for test to solve the problem that prior art takes place.
Summary of the invention
Fundamental purpose of the present invention provides a kind of automated test device, and it has the function of automatic test light emitting diode.
Another fundamental purpose of the present invention provides the method that a kind of automated test device is tested light emitting diode automatically.
For reaching above-mentioned purpose, automation equipment of the present invention comprises measurement jig, determinand placement, power supply device and measurement mechanism.Measurement jig has photosensory assembly, and photosensory assembly can be meetings such as photoresistance, optical diode or photovoltaic cell change its characteristic according to the illumination degree assembly.The determinand placement is in order to place a light emitting diode.And determinand placement and power supply device electrically connect, and power supply device can provide a fixed voltage to use to light emitting diode.Measurement mechanism is used for measuring the characteristic variations of photosensory assembly after accepting illumination, and can decide according to the difference of photosensory assembly and will measure resistance value, magnitude of voltage or current value.
The method of automatic test light emitting diode in the present invention is: automated test device begins an automatic test flow process.Power supply device can provide fixing voltage of light emitting diode to be measured.The measurement mechanism of automated test device can be measured the characteristic variations of photosensory assembly.Then automated test device judges voluntarily whether this characteristic value surpasses certain value.If this characteristic value surpasses certain value, then export first signal.In one embodiment of this invention, be with photoresistance as photosensory assembly, and measure the impedance variation of photoresistance.Present embodiment is judged to be first signal and promptly represents light emitting diode to be measured undesired according to the characteristic of photoresistance.The abnormal situation of light emitting diode may be can't the luminous or luminance brightness deficiency of sending.If do not surpass certain value, then export secondary signal.The normal signal of light emitting diode that the secondary signal representative is to be measured.
By above-mentioned steps flow chart, whether automated test device can detect light emitting diode automatically normal.
Description of drawings
Fig. 1 is the synoptic diagram of automated test device of the present invention.
Fig. 2 is the circuit diagram of first embodiment of automated test device of the present invention.
Fig. 3 is the circuit diagram of second embodiment of automated test device of the present invention.
Fig. 4 is the flow chart of steps that the present invention carries out automatic test.
The reference numeral explanation
Photosensory assembly 21
Resistance in series 213
Determinand placement 30
Embodiment
For further understanding technology contents of the present invention, be described as follows especially exemplified by a preferred embodiment.
Below please refer to the synoptic diagram about automated test device of the present invention shown in Figure 1.Automation equipment 10 of the present invention comprises measurement jig 20, determinand placement 30, power supply device 40 and measurement mechanism 50.Measurement jig 20 has photosensory assembly 21, photosensory assembly 21 can be photoresistance, optical diode (Photodiode) or photovoltaic cell meetings such as (Photovoltaic) and changes the assembly of its characteristic according to the degree of accepting illumination, but the present invention is not as limit.Determinand placement 30 is a light emitting diode 31 in order to place a determinand in the present invention.And determinand placement 30 electrically connects with power supply device 40, and power supply device 40 can provide a fixed voltage to use to light emitting diode 31.Measurement mechanism 50 is used for measuring the characteristic variations of photosensory assembly 21 after accepting illumination, and can decide the variation that will measure resistance value, magnitude of voltage or current value according to the difference of photosensory assembly 21.
Next please refer to the circuit diagram of Fig. 2 about first embodiment of automated test device of the present invention.
In the present embodiment, photosensory assembly 21 is photoresistance 211.Photoresistance 211 can utilize cadmium sulfide to make.The characteristic of photoresistance 211 is for after receiving illumination, and its resistance value can reduce.What therefore measurement mechanism 50 will be measured is exactly the impedance variation of photoresistance 211.Power supply device 40 provides a fixed voltage to come to light emitting diode 31, makes light emitting diode 31 can send light.Thus, photoresistance 211 will receive illumination, and then produces impedance variation according to the difference of its illumination degree.
Then please refer to the circuit diagram of Fig. 3 about second embodiment of automated test device of the present invention.
In the present embodiment, photosensory assembly 21 is optical diodes 212.Optical diode 212 will utilize power supply device 40 to drive, and is connected in series a series connection resistance 213.Power supply device 40 provides a fixed voltage to come to light emitting diode 31 equally, makes light emitting diode 31 can send light.Thus, after optical diode 212 will receive illumination, can allow voltage change.Measurement mechanism 50 is just measured the change in voltage of the resistance in series 213 of connecting with optical diode 212.
The present invention also has the 3rd embodiment, and photosensory assembly 21 can be photovoltaic cell.If photosensory assembly 21 is photovoltaic cell (figure does not show), then directly with the photoresistance 211 among photovoltaic cell replacement Fig. 2.After photovoltaic cell received illumination, measurement mechanism 50 is the change in voltage of measuring light voltaic cell again.
Be noted that only be the circuit diagram of signal among above-mentioned Fig. 2 and Fig. 3, the present invention is not exceeded with above-mentioned circuit diagram.
Next please refer to Fig. 4 carries out automatic test about the present invention flow chart of steps.
At first be step 401: begin to carry out an automatic test flow process.
Step 402: give this light emitting diode 31 1 fixed voltages.
Step 403 a: characteristic value of measuring a photosensory assembly 21.
After power supply device 40 driven for emitting lights diodes 31 were luminous, photosensory assembly 21 will receive the luminous energy that light emitting diode 31 is sent, and produced the variation of characteristic.If with first embodiment, be that photoresistance 211 is an example promptly with photosensory assembly 21, its characteristic variations is exactly the variation of the resistance value of photoresistance 211.The measurement mechanism 50 of automated test device 10 can be measured the impedance variation of photoresistance 211.Because in the present embodiment, photosensory assembly 21 is photoresistance 211, so measurement mechanism 50 will be measured resistance value.But the present invention is not as limit, if photosensory assembly 21 is the optical diode 212 of second embodiment or the photovoltaic cell of the 3rd embodiment, measurement mechanism 50 will be measured its characteristic variations.
Then carry out step 404: judge whether this characteristic value surpasses certain value.
If this resistance value surpasses certain value, just carry out step 405: export one first signal.
When this resistance value surpasses certain value, automated test device 10 can output first signal.Be characteristic in the present embodiment, after receiving illumination, can allow the impedance of photoresistance 211 diminish according to photoresistance 211.Therefore, if the resistance value of photoresistance 211 surpasses certain value, can judge that promptly first signal is to represent the luminous degree of light emitting diode 31 to be measured undesired.Its reason may be that light emitting diode 31 can't the luminous or luminance brightness deficiency of sending.Therefore in the present embodiment, first signal is represented an abnormal signal.Under this situation, automated test device 10 just can eliminate abnormal light emitting diode 31 automatically.
If resistance value does not surpass certain value, then carry out step 406: export a secondary signal.
If do not surpass certain value, automated test device 10 is just exported secondary signal.In the present embodiment, secondary signal is promptly represented light emitting diode to be measured 31 normal signals.
Then, automated test device 10 can continue to test new light emitting diode 31 again, just gets back to step 402.
By above-mentioned steps flow chart, whether automated test device 10 can detect light emitting diode 31 automatically normal, and do not need to judge with artificial mode.
To sum up institute is old, no matter the present invention is with regard to purpose, means and effect, showing that all it is totally different in the feature of prior art, and, above-mentioned many embodiment only be convenient to the explanation and give an example, the interest field that the present invention advocated should be as the criterion so that claim is described certainly, but not only limits to the foregoing description.
Claims (13)
1. an automated test device is used to measure a light emitting diode, and this automated test device comprises:
One determinand placement is in order to be provided with this light emitting diode;
One measurement jig comprises a photosensory assembly;
One power supply device is connected electrically with this determinand placement, so that this light emitting diode one fixed voltage to be provided; And
One measurement mechanism is used to measure a characteristic value of this photosensory assembly,
This measurement jig utilizes this photosensory assembly to measure the brightness of this light emitting diode,
This measurement mechanism judges whether this characteristic value surpasses certain value, then exports one first signal if surpass this definite value, does not then export a secondary signal if surpass this definite value.
2. automated test device as claimed in claim 1, wherein, this photosensory assembly is a photoresistance.
3. automated test device as claimed in claim 1, wherein, this photosensory assembly is an optical diode.
4. automated test device as claimed in claim 1, wherein, this photosensory assembly is a photovoltaic cell.
5. automated test device as claimed in claim 1, wherein, this characteristic value is a resistance value, a magnitude of voltage or a current value of this photosensory assembly.
6. automated test device as claimed in claim 1, wherein, this first signal is represented an abnormal signal; This secondary signal is represented a normal signal.
7. automated test device as claimed in claim 1, wherein, this photosensory assembly is in order to measure the color of this light emitting diode.
8. the method for an automatic test is used for an automated test device to test the brightness of a light emitting diode, and this method comprises:
Begin to carry out an automatic test flow process;
Give this light emitting diode one fixed voltage;
Measure a characteristic value of a photosensory assembly;
Judge whether this characteristic value surpasses certain value;
If surpass this definite value, then export one first signal; And
If do not have this definite value of surpassing, then export a secondary signal.
9. method as claimed in claim 8, wherein, the step of measuring this characteristic value of this photosensory assembly comprises a resistance value of measuring a photoresistance.
10. method as claimed in claim 8, wherein, the step of measuring this characteristic value of this photosensory assembly comprises a magnitude of voltage of the resistance in series of measuring an optical diode.
11. method as claimed in claim 8, wherein, the step of measuring this characteristic value of this photosensory assembly comprises a magnitude of voltage of measuring a photovoltaic cell.
12. method as claimed in claim 8 more may further comprise the steps:
Judge that this first signal represents an abnormal signal; And
Judge that this secondary signal represents a normal signal.
13. method as claimed in claim 8 more comprises the step of the color of testing this light emitting diode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2007100857753A CN100573170C (en) | 2007-03-14 | 2007-03-14 | The testing apparatus of automatized measurement for luminous diode and method |
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| Application Number | Priority Date | Filing Date | Title |
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| CNB2007100857753A CN100573170C (en) | 2007-03-14 | 2007-03-14 | The testing apparatus of automatized measurement for luminous diode and method |
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| Publication Number | Publication Date |
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| CN101266276A CN101266276A (en) | 2008-09-17 |
| CN100573170C true CN100573170C (en) | 2009-12-23 |
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| Application Number | Title | Priority Date | Filing Date |
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| CNB2007100857753A Expired - Fee Related CN100573170C (en) | 2007-03-14 | 2007-03-14 | The testing apparatus of automatized measurement for luminous diode and method |
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Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102159957B (en) * | 2008-09-27 | 2013-04-10 | 中茂电子(深圳)有限公司 | Test table with solar cells for light-emitting components and test method thereof |
| CN101769984B (en) * | 2009-01-05 | 2012-09-05 | 英业达股份有限公司 | Test method of light emitting diode of storage device and test tool thereof |
| CN102740113A (en) * | 2012-07-06 | 2012-10-17 | 科瑞自动化技术（苏州）有限公司 | Sensitization measurement device of miniature camera |
| CN102768317A (en) * | 2012-08-01 | 2012-11-07 | 上海交通大学 | System for testing service life of organic electroluminescent device |
| CN102818627B (en) * | 2012-08-01 | 2015-03-25 | 上海交通大学 | Module for measuring brightness and chrominance of organic light-emitting device |
| CN109884554A (en) * | 2019-04-01 | 2019-06-14 | 上海移为通信技术股份有限公司 | A kind of LED light automatic recognition system and method applied to production line |
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| CN101266276A (en) | 2008-09-17 |
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