CN113787024A - Novel LED lamp bead bulk sorting method - Google Patents
Novel LED lamp bead bulk sorting method Download PDFInfo
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- CN113787024A CN113787024A CN202111018852.XA CN202111018852A CN113787024A CN 113787024 A CN113787024 A CN 113787024A CN 202111018852 A CN202111018852 A CN 202111018852A CN 113787024 A CN113787024 A CN 113787024A
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- led lamp
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/342—Sorting according to other particular properties according to optical properties, e.g. colour
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/361—Processing or control devices therefor, e.g. escort memory
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Abstract
The application provides a novel LED lamp bead massive sorting method, and relates to the technical field of LED lamp bead sorting. The novel LED lamp bead mass sorting method is characterized in that the whole plate LED with a plurality of lines and rows of LED lamp beads is detected at one time, then the LED lamp beads which do not meet the requirements are marked according to the set grading requirements to be removed, and the rest LED lamp beads are cut, classified and graded. Compared with the prior art, the method is simple to operate, the whole LED with the plurality of lines and rows of LED lamp beads is tested at one time, abnormal points are eliminated after photoelectric parameter testing is finished, the remaining good LED lamp beads are cut into single pieces, classification and filing are carried out according to test results, time for mechanical grabbing, rail running and testing is greatly saved, sorting speed can be increased to 300K/h, and BIN returning rate is over 99%.
Description
[ technical field ] A method for producing a semiconductor device
The application relates to the technical field of LED lamp bead sorting, in particular to a novel LED lamp bead massive sorting method.
[ background of the invention ]
Along with the higher and higher requirements of people on the high definition of the display screen, the small-space products of the display screen are rapidly developed. LED displays are increasingly being miniaturized, light-weighted, intelligent, high-quality and low-power, and are commonly pursued in the industry, and Mini LEDs are thus being produced.
Although the Mini LED has become a star product in the industry, the problems of cost, process and the like still exist. For example, in the current LED package production, classification and grading of LED lamp beads generally includes dividing the packaged whole board (or sheet) LED product into individual pieces, performing photoelectric detection one by one, and grading. The process has the problems of low separation speed, large equipment investment, high man-machine ratio, high failure rate and the like, and the improvement of the productivity of the LED industry is seriously restricted.
[ summary of the invention ]
In order to solve the problems of low sorting speed, large equipment investment, high man-machine ratio, high failure rate and the like in the prior art, the application provides a novel LED lamp bead massive sorting method, and the LED lamp beads can be sorted rapidly and finely in batches.
The application is realized by the following technical scheme:
a novel LED lamp bead mass sorting method comprises the steps of carrying out one-time detection on a whole plate LED with a plurality of lines and rows of LED lamp beads, marking the LED lamp beads which do not meet requirements according to set grading requirements, removing the LED lamp beads, and cutting, classifying and grading the rest LED lamp beads.
Further, the sorting method comprises the following steps:
s1, mounting, namely placing the whole plate of LEDs with a plurality of lines and columns of LED lamp beads to be tested on a test fixture;
s2, testing and recording, namely, carrying out lighting test on the whole plate of LED with a plurality of lines and columns of LED lamp beads, storing test data generated in the lighting test, and uploading the test data to an information processing system;
s3, data operation processing, namely comparing the test data through the information processing system, comparing the test data with standard data, and marking LED lamp beads which do not meet the requirements in the whole plate of LED with a plurality of lines and columns of LED lamp beads;
s4, removing, namely cutting and removing the LED lamp beads which do not meet the requirements according to the marking information;
and S5, classifying and filing, then cutting the rest LED lamp beads, and classifying and filing according to the set grading requirements.
Further, in step S1, the test fixture is provided with a plurality of high-precision probes capable of simultaneously lighting the entire board LED having the plurality of rows and columns of LED beads, so that the test fixture can input an externally received test signal to the entire board LED.
Further, in step S2, the high-precision probes contact with the LED lamp bead pins to light the entire LED board having the plurality of rows and columns of LED lamp beads, and the test circuit is used to collect and detect the electrical data to be tested.
Further, in step S2, after the whole panel LED having the plurality of rows and columns of LED beads is lit, the hyperspectral camera is used to photograph the whole lighting effect, and the whole panel LED optical data having the plurality of rows and columns of LED beads and the coordinate information of each LED bead are collected.
Further, in step S3, the information processing system performs comparison operation on the recorded photoelectric parameters to obtain parameter information of all LED lamp beads in the entire LED panel having a plurality of rows and columns of LED lamp beads.
Preferably, in step S3, the standard data includes standard template optical property data when the standard template is entirely lit during the test, and standard template electrical property data.
Further, in step S3, the information processing system finds out max and min points according to the parameter information, compares the points with standard data, and then performs grading on the whole LED lamp beads according to the set requirements.
Preferably, the electrical data includes a forward conduction voltage VF, a low current voltage VFL, a reverse leakage current IR, and a pin-to-pin short circuit current (or leakage current) RIR.
Preferably, the optical data includes a dominant wavelength λ d, a luminance IV.
Compared with the prior art, the method has the following advantages:
1. the whole LED board with the multiple lines and rows of LED lamp beads is tested at one time, after photoelectric parameter testing is completed, abnormal points are removed, the remaining good LED lamp beads are cut into single LED lamp beads, classification and filing are conducted according to testing results, time for mechanical grabbing, rail operation and testing is greatly saved, sorting speed can be increased to 300K/h, and BIN returning rate is over 99%.
[ description of the drawings ]
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings used in the description of the embodiments will be briefly introduced below.
Fig. 1 is a flowchart illustrating steps of the novel method for sorting large quantities of LED lamp beads according to the present application.
[ detailed description ] embodiments
In order to make the technical problems, technical solutions and advantageous effects solved by the present application more clear and obvious, the present application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
As shown in fig. 1, a novel method for sorting LED lamp beads in large quantities includes detecting a whole LED panel having a plurality of rows and columns of LED lamp beads at one time, marking off the LED lamp beads which do not meet the requirements according to the set grading requirements, and cutting, classifying and grading the remaining LED lamp beads.
The sorting method comprises the following steps:
s1, mounting, namely placing the whole plate of LEDs with a plurality of lines and columns of LED lamp beads to be tested on a test fixture;
s2, testing and recording, namely, carrying out lighting test on the whole plate of LED with a plurality of lines and columns of LED lamp beads, storing test data generated in the lighting test, and uploading the test data to an information processing system;
s3, data operation processing, namely comparing the test data through the information processing system, comparing the test data with standard data, and marking LED lamp beads which do not meet the requirements in the whole plate of LED with a plurality of lines and columns of LED lamp beads;
s4, removing, namely cutting and removing the LED lamp beads which do not meet the requirements according to the marking information;
and S5, classifying and filing, then cutting the rest LED lamp beads, and classifying and filing according to the set grading requirements.
The application provides a novel LED lamp pearl huge amount sorting method, tests the LED lamp pearl through above step and selects separately, compares in lighting LED lamp pearl one by one or many tests simultaneously, and the time of mechanical grabbing, orbital motion and test has been saved greatly to the method of this application, selects separately speed and can promote 300K/h, returns BIN rate more than 99%, promotes production efficiency. According to the specific LED lamp bead sorting process, the whole plate LED with the multiple lines and rows of LED lamp beads is detected at one time, after the photoelectric parameter test is finished, the whole plate LED with the multiple lines and rows of LED lamp beads is cut, and then the test results are classified and filed.
Further, as a specific implementation manner, but not limited thereto, in step S1, in step S1, the test fixture is provided with a plurality of high-precision probes capable of simultaneously lighting the entire board LED having a plurality of rows and columns of LED beads, so that the test fixture can input an externally received test signal to the entire board LED. During testing, the high-precision probes are only required to be in contact with the pins of the LED lamp beads. Like this, light through the whole board LED who will have a plurality of ranks LED lamp pearl and test, save test time greatly.
Further, as a specific implementation manner but not limited thereto, in step S2, the high-precision probes are in contact with the LED lamp bead pins, so as to light the entire LED board having a plurality of rows and columns of LED lamp beads, and the high-sensitivity circuit is used to collect and detect the electrical data of the test. The electrical information includes a forward conduction voltage VF, a low current voltage VFL, a reverse leakage current IR, and a short-circuit current (or leakage current) RIR between the pins.
Further, as a specific implementation manner but not limited thereto, in step S2, after the whole panel LED having the plurality of rows and columns of LED beads is turned on, the hyperspectral camera is used to photograph the whole lighting effect, and the whole panel LED optical property data having the plurality of rows and columns of LED beads and the coordinate information of each LED bead are collected. And then recording information such as photoelectric test results of the whole plate LED with a plurality of lines and columns of LED lamp beads, coordinates of each lamp bead and the like by an image recognition processing technology, and uploading the information to an information processing system. The optical data includes dominant wavelength lambdad and brightness IV.
Further, as a specific implementation manner but not limited thereto, in step S3, the information processing system compares the recorded photoelectric parameters to obtain parameter information of all LED beads in the entire LED panel having a plurality of rows and columns of LED beads. Usually, one LED lamp bead needs to obtain the following parameter information: forward conducting voltage VF, main wavelength λ d, brightness IV, small current voltage VFL, reverse leakage current IR, and short-circuit current (or leakage current) RIR between pins.
Further, as a specific implementation manner and not by way of limitation, in step S3, the standard data includes standard template optical property data when the standard template is entirely lighted in the test, and standard template electrical property data. Before testing, the standard sample plate is firstly adopted to be integrally lightened, and then the optical data of the standard sample plate and the electrical data of the standard sample plate are stored in modes of photographing and the like. When the test, the whole board LED that has a plurality of ranks LED lamp pearl is whole to be lighted the back, keeps for light nature data through modes such as shooing to and electrical data, through will light data and standard data contrast, will have the colour difference, not shine the LED lamp pearl mark of scheduling problem, the screening condition can set up according to the demand. The information processing system comprises a computer, a camera and the like.
Further, as a specific implementation manner but not limited thereto, in step S3, the information processing system finds out max and min points according to the parameter information, compares the max and min points with standard data, and then performs grading on all the LED lamp beads according to the set requirements.
To better understand the technical solution of the present embodiment, the working principle is as follows:
the embodiment of the application provides a novel LED lamp bead bulk sorting method, through a specific LED lamp bead sorting process, a whole plate LED with a plurality of ranks LED lamp beads is placed on a corresponding test fixture, the test fixture is connected with an external test signal through a port on one hand, and the test fixture passes through a high-precision probe to be in contact with pins of each LED lamp bead on the other hand, and then the test signal is input. After the whole-plate LED with a plurality of ranks LED lamp beads is integrally lighted and tested, the high-sensitivity circuit is matched simultaneously, the tested electrical data is collected and detected, a hyperspectral camera is adopted, the whole lighting effect is photographed, and the optical data of the whole-plate LED is collected. The method comprises the steps of obtaining various parameter information of all LED lamp beads through powerful image recognition processing and algorithm research technologies, wherein the parameter information comprises forward conducting voltage VF, main wavelength lambda d, brightness IV, small current voltage VFL, reverse leakage current IR, short-circuit current (or leakage current) RIR and other values among pins, finding out max and min points, comparing and calculating with standard data, marking the LED lamp beads with the problems of color difference, no lightening and the like according to set requirements, cutting and rejecting the lamp beads which do not meet the requirements, and cutting, grading and grading the rest LED lamp beads. Compared with the traditional test method, the test method has the advantages that the time for testing one lamp bead is about 50-100 ms, the mechanical grabbing and orbital operation feeding time is added, the test efficiency is 25K/h, the BIN returning rate is 95%, the method is used for testing and sorting the LED lamp beads, the time for mechanical grabbing, orbital operation and test is greatly saved, the sorting speed can be increased to 300K/h, and the BIN returning rate is over 99%.
The foregoing is illustrative of one or more embodiments provided in connection with the detailed description and is not intended to limit the disclosure to the particular forms disclosed. Similar or identical methods, structures, etc. as used herein, or several technical inferences or substitutions made on the concept of the present application should be considered as the scope of the present application.
Claims (10)
1. A novel LED lamp bead mass sorting method is characterized in that a whole plate LED with a plurality of lines and rows of LED lamp beads is detected at one time, then the LED lamp beads which do not meet the requirements are marked according to the set grading requirements to be removed, and the rest LED lamp beads are cut, classified and graded.
2. The novel LED lamp bead bulk sorting method according to claim 1, wherein the sorting method comprises the following steps:
s1, mounting, namely placing the whole plate of LEDs with a plurality of lines and columns of LED lamp beads to be tested on a test fixture;
s2, testing and recording, namely, carrying out lighting test on the whole plate of LED with a plurality of lines and columns of LED lamp beads, storing test data generated in the lighting test, and uploading the test data to an information processing system;
s3, data operation processing, namely comparing the test data through the information processing system, comparing the test data with standard data, and marking LED lamp beads which do not meet the requirements in the whole plate of LED with a plurality of lines and columns of LED lamp beads;
s4, removing, namely cutting and removing the LED lamp beads which do not meet the requirements according to the marking information;
and S5, classifying and filing, then cutting the rest LED lamp beads, and classifying and filing according to the set grading requirements.
3. The method as claimed in claim 2, wherein in step S1, the testing fixture is provided with a plurality of high-precision probes capable of simultaneously lighting a whole board LED having a plurality of rows and columns of LED beads, so that the testing fixture can input externally received testing signals into the whole board LED.
4. The method of claim 3, wherein in step S2, the high-precision probe contacts with each LED bead pin to turn on the entire LED board with multiple rows and columns of LED beads, and the test circuit is used to collect and detect the electrical data.
5. The method of claim 2, wherein in step S2, after the entire LED panel having a plurality of rows and columns of LED beads is lit, the hyperspectral camera is used to photograph the entire lighting effect, and the entire LED panel optical data and the coordinate information of each LED bead are collected.
6. The method as claimed in claim 2, wherein in step S3, the information processing system compares the recorded photoelectric parameters to obtain parameter information of all LED beads in the entire LED panel having a plurality of rows and columns of LED beads.
7. The method as claimed in claim 2, wherein in step S3, the standard data includes standard template optical data when the standard template is entirely lit during the test, and standard template electrical data.
8. The method as claimed in claim 6, wherein in step S3, the information processing system finds out max and min points according to the parameter information, compares the max and min points with standard data, and then grades all the LED lamp beads according to the set requirement.
9. The novel LED lamp bead mass sorting method according to claim 4, wherein the electrical data includes a forward conduction voltage VF, a low current voltage VFL, a reverse leakage current IR, and a short-circuit current (or leakage current) RIR between pins.
10. The method as claimed in claim 5, wherein the optical data includes dominant wavelength λ d and brightness IV.
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Cited By (2)
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CN114833032A (en) * | 2022-04-11 | 2022-08-02 | 深圳市华笙光电子有限公司 | LED lamp pearl automated inspection, automatic glue of arranging and automatic separation device |
CN114833031A (en) * | 2022-04-11 | 2022-08-02 | 深圳市华笙光电子有限公司 | LED lamp pearl automated inspection, automatic glue of arranging and automatic separation device |
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