CN113238115A - Transformer test equipment - Google Patents
Transformer test equipment Download PDFInfo
- Publication number
- CN113238115A CN113238115A CN202110505713.3A CN202110505713A CN113238115A CN 113238115 A CN113238115 A CN 113238115A CN 202110505713 A CN202110505713 A CN 202110505713A CN 113238115 A CN113238115 A CN 113238115A
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- testing
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- 238000012360 testing method Methods 0.000 title claims abstract description 179
- 239000011229 interlayer Substances 0.000 claims abstract description 48
- 239000000463 material Substances 0.000 claims description 68
- 238000007599 discharging Methods 0.000 claims description 20
- 238000006073 displacement reaction Methods 0.000 claims description 17
- 230000002950 deficient Effects 0.000 claims description 13
- 238000012546 transfer Methods 0.000 claims description 10
- 210000001503 joint Anatomy 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 8
- 238000012937 correction Methods 0.000 description 5
- 239000010410 layer Substances 0.000 description 5
- 238000000034 method Methods 0.000 description 3
- 208000012260 Accidental injury Diseases 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 208000014674 injury Diseases 0.000 description 2
- 238000013522 software testing Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
- G01R31/013—Testing passive components
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/18—Subjecting similar articles in turn to test, e.g. go/no-go tests in mass production
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/62—Testing of transformers
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention relates to the field of mechanical test equipment, in particular to transformer test equipment, which comprises an equipment rack and a rack outer cover arranged on the equipment rack, and further comprises a feeding station, a high-voltage test station, an interlayer test station, a pin correcting station, a scanning test station and a swinging plate station; the feeding station, the high-voltage testing station, the interlayer testing station, the pin correcting station, the scanning testing station and the balance placing station are sequentially arranged on the equipment frame; the equipment rack is provided with a controller, and the controller is electrically connected to the feeding station, the high-voltage testing station, the interlayer testing station, the pin correcting station, the scanning testing station and the balance placing station respectively. The invention provides a transformer testing device which is efficient, time-saving and labor-saving.
Description
Technical Field
The invention relates to the field of mechanical test equipment, in particular to transformer test equipment.
Background
The high-frequency transformer is required to be detected in the production process and after the production is completed, so that the quality of the high-frequency transformer is effectively monitored in time, unqualified products are screened out in time, and the unqualified products and the qualified products are prevented from being mixed together.
At present, manual operation testing or transformer loading is needed in transformer production testing, so that the testing efficiency of the transformer is low, defective products of the transformer are mixed in a production line, and the testing quality of the transformer cannot be guaranteed.
Disclosure of Invention
In order to solve the technical problems, the invention provides the transformer testing equipment which is efficient, time-saving and labor-saving.
The invention adopts the following technical scheme:
the transformer testing equipment comprises an equipment rack and a rack outer cover arranged on the equipment rack, and further comprises a feeding station, a high-voltage testing station, an interlayer testing station, a pin correcting station, a scanning testing station and a balance placing station; the feeding station, the high-voltage testing station, the interlayer testing station, the pin correcting station, the scanning testing station and the balance placing station are sequentially arranged on the equipment frame; the equipment rack is provided with a controller, and the controller is electrically connected to the feeding station, the high-voltage testing station, the interlayer testing station, the pin correcting station, the scanning testing station and the balance placing station respectively.
The technical scheme is further improved in that the feeding station is a direct vibration feeding mechanism, and the direct vibration feeding mechanism is connected to one side of the high-voltage testing station.
The technical scheme is further improved in that the high-pressure testing station comprises a material moving clamping manipulator, a material preparing mechanism connected to one side of the material loading station, a high-pressure testing mechanism arranged on one side of the material preparing mechanism and a defective product discharging mechanism arranged on one side of the high-pressure testing mechanism; the material preparing mechanism comprises a material preparing table, a displacement support connected below the material preparing table, a displacement air cylinder connected to one side of the displacement support, and a limiting assembly which is connected to the inner side of the displacement support in a sliding mode and penetrates through the material preparing table; the high-pressure testing mechanism comprises a testing platform, testing pin groups and a pushing cylinder, wherein the testing pin groups are respectively arranged on two sides of the testing platform and are in plug-in connection with products, and the pushing cylinder is connected to one side, away from the testing platform, of each testing pin group; the defective product discharging mechanism comprises a discharging air cylinder, a connecting platform connected with the discharging air cylinder, and a first discharging chute arranged below the connecting platform and in butt joint with the testing platform.
The technical scheme is further improved in that the limiting assembly comprises a limiting block and a lifting cylinder connected to the limiting block and connected with the displacement support in a sliding manner.
The technical scheme is further improved in that the test pin group consists of a plurality of pin pieces.
The technical scheme is further improved in that the interlayer testing station comprises an interlayer direct vibration feeding mechanism and an interlayer testing mechanism connected with the interlayer direct vibration feeding mechanism, and the interlayer testing mechanism comprises a clamping cylinder, a mounting bracket connected with the clamping cylinder and an interlayer tester used for interlayer short circuit testing.
The technical scheme is further improved in that the pin correcting station comprises a transformer pin correcting machine and a pin correcting machine mounting base arranged below the transformer pin correcting machine; the scanning test station comprises a transformer scanning box and a scanning box mounting base arranged below the transformer scanning box.
The technical proposal is further improved that two sides of the scanning box mounting base are respectively provided with an adjusting mechanism; the adjusting mechanism comprises an abutting block, a rotating handle connected to one side of the abutting block, and a fixing block connected with the rotating handle and fixed to the scanning box mounting base.
The technical scheme is further improved in that the swing disc station comprises a swing disc blanking direct vibration mechanism, a placing disc arranged on one side of the swing disc blanking direct vibration mechanism and a swing disc material taking manipulator used for taking materials from the swing disc blanking direct vibration mechanism to the placing disc; the bottom of the placing tray is provided with a sliding mechanism; the sliding mechanism comprises a sliding rail and sliding rods, the sliding rail is in sliding connection with the placing plate, and the sliding rods are respectively arranged on two sides of the placing plate and are in sliding connection with the placing plate.
The technical scheme is further improved in that the transformer testing equipment further comprises a material transfer mechanism, and the material transfer mechanism is arranged in parallel with the interlayer testing station, the pin correcting station and the scanning testing station; the material transfer mechanism comprises three material taking mechanical hands which are used for sequentially transferring materials of the interlayer testing station, the pin correcting station and the scanning testing station.
The invention has the beneficial effects that:
the invention realizes the automatic test of high-voltage detection, interlayer short circuit, voltage resistance, scanning and other items of the high-frequency transformer, reduces the error of manual operation and accidental injury to operators in the process, and simultaneously improves the production efficiency of the whole production line.
Drawings
FIG. 1 is a schematic structural diagram of a transformer testing apparatus according to the present invention;
FIG. 2 is a schematic structural diagram of the transformer testing apparatus of FIG. 1, wherein the housing and the controller are omitted;
FIG. 3 is a schematic structural diagram of a high voltage testing station of the transformer testing apparatus of FIG. 2;
FIG. 4 is a schematic diagram of another angle of the high voltage testing station of the transformer testing apparatus of FIG. 3;
FIG. 5 is a schematic structural diagram of a material preparation mechanism of a high voltage testing station of the transformer testing apparatus of FIG. 3;
FIG. 6 is a schematic structural diagram of an interlayer testing station of the transformer testing apparatus of FIG. 2;
FIG. 7 is a schematic structural diagram of a pin calibration station of the transformer testing apparatus of FIG. 2;
FIG. 8 is a schematic structural diagram of a scan test station of the transformer test apparatus of FIG. 2;
FIG. 9 is a schematic structural diagram of a wobble plate station of the transformer testing apparatus of FIG. 2;
fig. 10 is a schematic structural diagram of a material transfer mechanism of the transformer testing apparatus of fig. 2.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it should be understood that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
As shown in fig. 1 and 2, a transformer testing apparatus includes an apparatus rack 70, a rack housing 71 disposed on the apparatus rack 70; the transformer testing equipment further comprises a feeding station 10, a high-voltage testing station 20, an interlayer testing station 30, a pin correcting station 40, a scanning testing station 50 and a balance placing station 60; the feeding station 10, the high-voltage testing station 20, the interlayer testing station 30, the pin correcting station 40, the scanning testing station 50 and the balance placing station 60 are sequentially arranged on the equipment rack 70; the equipment rack 70 is provided with a controller 80, and the controller 80 is electrically connected to the feeding station 10, the high-voltage testing station 20, the interlayer testing station 30, the pin correcting station 40, the scanning testing station 50 and the balance placing station 60 respectively.
As shown in fig. 2, the feeding station 10 is a direct vibration feeding mechanism, and the direct vibration feeding mechanism is connected to one side of the high voltage testing station 20. The material is conveyed by the direct-vibration feeding mechanism and is matched with the frequency modulation controller 80, so that the stability is high, the feeding efficiency is effectively improved, the manual operation is reduced, and the time and the labor are saved.
As shown in fig. 3 to 5, the high-pressure testing station 20 includes a material moving clamping manipulator 21, a material preparing mechanism 22 connected to one side of the loading station 10, a high-pressure testing mechanism 23 disposed at one side of the material preparing mechanism 22, and a defective product discharging mechanism 24 disposed at one side of the high-pressure testing mechanism 23; so set up, effectively improve the high-pressure efficiency of software testing of material, further save manual operation, labour saving and time saving.
As shown in fig. 5, the material preparing mechanism 22 includes a material preparing platform 221, a displacement bracket 222 connected below the material preparing platform 221, a displacement cylinder 223 connected to one side of the displacement bracket 222, and a limiting component 224 slidably connected to the inner side of the displacement bracket 222 and disposed through the material preparing platform 221; the material preparing table 221 is used for placing materials conveyed through the feeding station 10, the displacement support 222 is pushed through the displacement air cylinder 223, meanwhile, the material moving clamping manipulator 21 is matched, the materials are sequentially sent to the high-voltage testing mechanism 23 to be subjected to high-voltage testing, and testing efficiency is improved.
As shown in fig. 5, the limiting assembly 224 includes a limiting block 2241, and a lifting cylinder 2242 connected to the limiting block 2241 and slidably connected to the displacement support 222. When last batch material tested, stopper 2241 was fixed the material that awaits measuring through the rise of lift cylinder 2242, avoided influencing the test of material, degree of automation is high, and the practicality is strong.
Referring to fig. 3 again, the high voltage testing mechanism 23 includes a testing platform 231, testing pin groups 232 respectively disposed at two sides of the testing platform 231 and inserted into the product, and a pushing cylinder 233 connected to one side of the testing pin group 232 away from the testing platform 231; the test pin group 232 is connected with the material so as to carry out high-pressure test, and meanwhile, the push cylinder 233 is pushed to further firmly connect the test pin group 232 with the material, so that the stability of the high-pressure test of the invention is effectively improved.
The test pin set 232 is composed of a plurality of pin elements. Be connected through contact pin and material to carry out high-voltage testing, effectively improve efficiency of software testing.
The defective product blanking mechanism 24 includes a blanking cylinder 241, a connecting table 242 connected to the blanking cylinder 241, and a first blanking chute 243 disposed below the connecting table 242 and in butt joint with the test table 231. When the defective products generated after the test is completed are drawn out of the connection table 242 by the discharging cylinder 241, the defective products enter the first discharging chute 243 so as to be collected and processed by workers.
As shown in fig. 6, the interlayer testing station 30 includes an interlayer direct vibration feeding mechanism 31 and an interlayer testing mechanism 32 connected to the interlayer direct vibration feeding mechanism 31, and the interlayer testing mechanism 32 includes a clamping cylinder 321, a mounting bracket 322 connected to the clamping cylinder 321, and an interlayer tester for interlayer short circuit testing. Between-layer direct vibration feeding mechanism 31 will pass through high-pressure test's material and send to before the testing mechanism 32 between-layer, degree of automation is high, and through the testing mechanism 32 between-layer, centre gripping cylinder 321 wherein carries out the centre gripping to the material, cooperates the tester between-layer, is connected with the material, realizes the short circuit test between-layer to the material, and is whole high-efficient convenient.
As shown in fig. 7, the pin calibration station 40 includes a transformer pin calibration machine 41, and a pin calibration machine mounting base 42 disposed below the transformer pin calibration machine 41; the scanning test station 50 comprises a transformer scanning box 51 and a scanning box mounting base 52 arranged below the transformer scanning box 51. Due to the arrangement, the materials subjected to interlayer testing can be conveniently moved to the pin correcting station 40 for pin correction, and the pin correction efficiency is effectively improved; after the stitch correction is completed, the material is placed on the transformer scanning box 51 for scanning test, so that the turn ratio, the turn number, the inductance, the capacitance, the leakage inductance and other items of the material can be detected, the testing efficiency of the invention is effectively improved, and the time and the labor are further saved.
As shown in fig. 8, two sides of the scanning cartridge mounting base 52 are respectively provided with an adjusting mechanism 53; the adjusting mechanism 53 includes an abutting block 531, a rotating handle 532 connected to one side of the abutting block 531, and a fixing block 533 connected to the rotating handle 532 and fixed to the scan case mounting base 52. The transformer scanning box 51 is effectively and stably arranged on the scanning box mounting base 52 through the adjusting mechanism 53, the taking and the placing are convenient, and the testing efficiency of the invention is further improved.
As shown in fig. 9, the swing plate station 60 includes a swing plate discharging vertical vibration mechanism 61, a placing plate 62 disposed on one side of the swing plate discharging vertical vibration mechanism 61, and a swing plate material taking manipulator 63 for taking materials from the swing plate discharging vertical vibration mechanism 61 to the placing plate 62; the bottom of the placing tray 62 is provided with a sliding mechanism 64; the sliding mechanism 64 includes a sliding rail 641 slidably connected to the placing tray 62, and sliding rods 642 respectively disposed on two sides of the placing tray 62 and slidably connected to the placing tray 62. The materials which are used for completing high-pressure testing, interlayer testing, pin correcting and scanning testing in sequence are subjected to balance blanking, the testing efficiency is further improved, and the practicability is high.
As shown in fig. 10, the transformer testing apparatus further includes a material transfer mechanism 90, and the material transfer mechanism 90 is arranged in parallel with the interlayer testing station 30, the pin correcting station 40, and the scanning testing station 50; the material transfer mechanism 90 comprises three material taking manipulators 91, and is used for sequentially transferring materials of the interlayer testing station 30, the pin correcting station 40 and the scanning testing station 50. The materials passing through the interlayer testing station 30, the pin correcting station 40 and the scanning testing station 50 are sequentially transferred through the three material taking manipulators 91, so that the next testing is performed, meanwhile, the defective products can be sequentially placed in the second discharging chute 92 and the third discharging chute 93 through the three material taking manipulators 91, and the automation degree is high.
The invention realizes the automatic test of high-voltage detection, interlayer short circuit, voltage resistance, scanning and other items of the high-frequency transformer, reduces the error of manual operation and accidental injury to operators in the process, and simultaneously improves the production efficiency of the whole production line.
The working process of the invention is as follows:
the transformer to be tested is conveyed to a high-voltage testing station 20 for high-voltage testing through feeding, and the generated defective products are collected through a first discharging chute 243; after the high-voltage test is finished, the transformer to be tested is conveyed to an interlayer testing station 30 to carry out interlayer testing on the transformer to be tested, and the generated defective products are collected through a second discharging chute 92; after the interlayer test is finished, the workpiece is sequentially conveyed to a pin correcting station 40 for pin correction and a scanning test station 50 for scanning test, and the generated defective products are collected through a third blanking chute 93; after the stitch correction and the scanning test are completed, the tray placing and blanking are carried out through the tray placing station 60.
The above examples only show some embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. The transformer testing equipment comprises an equipment rack and a rack outer cover arranged on the equipment rack, and is characterized by further comprising a feeding station, a high-voltage testing station, an interlayer testing station, a pin correcting station, a scanning testing station and a swinging plate station; the feeding station, the high-voltage testing station, the interlayer testing station, the pin correcting station, the scanning testing station and the balance placing station are sequentially arranged on the equipment frame; the equipment rack is provided with a controller, and the controller is electrically connected to the feeding station, the high-voltage testing station, the interlayer testing station, the pin correcting station, the scanning testing station and the balance placing station respectively.
2. The transformer testing equipment of claim 1, wherein the loading station is a direct vibration loading mechanism connected to one side of the high voltage testing station.
3. The transformer testing equipment of claim 1, wherein the high-voltage testing station comprises a material moving clamping manipulator, a material preparing mechanism connected to one side of the loading station, a high-voltage testing mechanism arranged on one side of the material preparing mechanism, and a defective product discharging mechanism arranged on one side of the high-voltage testing mechanism; the material preparing mechanism comprises a material preparing table, a displacement support connected below the material preparing table, a displacement air cylinder connected to one side of the displacement support, and a limiting assembly which is connected to the inner side of the displacement support in a sliding mode and penetrates through the material preparing table; the high-pressure testing mechanism comprises a testing platform, testing pin groups and a pushing cylinder, wherein the testing pin groups are respectively arranged on two sides of the testing platform and are in plug-in connection with products, and the pushing cylinder is connected to one side, away from the testing platform, of each testing pin group; the defective product discharging mechanism comprises a discharging air cylinder, a connecting platform connected with the discharging air cylinder, and a first discharging chute arranged below the connecting platform and in butt joint with the testing platform.
4. The transformer test equipment of claim 3, wherein the limiting assembly comprises a limiting block and a lifting cylinder connected to the limiting block and slidably connected to the displacement support.
5. The transformer test apparatus of claim 3, wherein the test pin set is comprised of a number of pin pieces.
6. The transformer testing equipment of claim 1, wherein the interlayer testing station comprises an interlayer direct vibration feeding mechanism and an interlayer testing mechanism connected to the interlayer direct vibration feeding mechanism, and the interlayer testing mechanism comprises a clamping cylinder, a mounting bracket connected to the clamping cylinder and an interlayer tester for interlayer short circuit testing.
7. The transformer test equipment of claim 1, wherein the pin calibration station comprises a transformer pin calibration machine, a pin calibration machine mounting base arranged below the transformer pin calibration machine; the scanning test station comprises a transformer scanning box and a scanning box mounting base arranged below the transformer scanning box.
8. The transformer test equipment of claim 1, wherein two sides of the scanning box mounting base are respectively provided with an adjusting mechanism; the adjusting mechanism comprises an abutting block, a rotating handle connected to one side of the abutting block, and a fixing block connected with the rotating handle and fixed to the scanning box mounting base.
9. The transformer testing equipment of claim 1, wherein the swing disc station comprises a swing disc blanking direct vibration mechanism, a placing disc arranged on one side of the swing disc blanking direct vibration mechanism, and a swing disc material taking manipulator used for taking materials from the swing disc blanking direct vibration mechanism to the placing disc; the bottom of the placing tray is provided with a sliding mechanism; the sliding mechanism comprises a sliding rail and sliding rods, the sliding rail is in sliding connection with the placing plate, and the sliding rods are respectively arranged on two sides of the placing plate and are in sliding connection with the placing plate.
10. The transformer test equipment of claim 1, further comprising a material transfer mechanism, wherein the material transfer mechanism is arranged in parallel with the interlayer test station, the pin calibration station and the scanning test station; the material transfer mechanism comprises three material taking mechanical hands which are used for sequentially transferring materials of the interlayer testing station, the pin correcting station and the scanning testing station.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110505713.3A CN113238115A (en) | 2021-05-10 | 2021-05-10 | Transformer test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110505713.3A CN113238115A (en) | 2021-05-10 | 2021-05-10 | Transformer test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN113238115A true CN113238115A (en) | 2021-08-10 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110505713.3A Pending CN113238115A (en) | 2021-05-10 | 2021-05-10 | Transformer test equipment |
Country Status (1)
| Country | Link |
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| CN (1) | CN113238115A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113447674A (en) * | 2021-08-30 | 2021-09-28 | 广东电网有限责任公司东莞供电局 | Transformer test fixture device |
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| US20130297245A1 (en) * | 2011-06-01 | 2013-11-07 | Zhejiang Electric Power Corporation | Full-automatic detecting system and method for transformer |
| CN203444053U (en) * | 2013-07-30 | 2014-02-19 | 常州市致新精密电子有限公司 | Integrated network transformer scan test device |
| CN105823952A (en) * | 2016-05-09 | 2016-08-03 | 东莞市博展机械科技有限公司 | Transformer test machine |
| CN205496096U (en) * | 2016-03-23 | 2016-08-24 | 厦门赛特勒磁电有限公司 | High -frequency transformer comprehensive test machine |
| CN206527068U (en) * | 2017-02-16 | 2017-09-29 | 江西省高新超越精密电子有限公司 | A kind of transformer back segment automatic test all-in-one machine equipment |
| CN109613382A (en) * | 2018-12-11 | 2019-04-12 | 刘清伟 | A kind of transformer detects finished product production equipment automatically |
| CN111085452A (en) * | 2019-12-31 | 2020-05-01 | 东莞市博展机械科技有限公司 | High-efficiency transformer test system |
| CN210465656U (en) * | 2019-06-28 | 2020-05-05 | 常州市国峰电子科技有限公司 | High efficiency transformer comprehensive tester |
| CN111289834A (en) * | 2020-04-03 | 2020-06-16 | 东莞市嘉龙海杰电子科技有限公司 | Transformer flexibility test system |
| CN216013557U (en) * | 2021-05-10 | 2022-03-11 | 东莞市博展机械科技有限公司 | Transformer test equipment |
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2021
- 2021-05-10 CN CN202110505713.3A patent/CN113238115A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20130297245A1 (en) * | 2011-06-01 | 2013-11-07 | Zhejiang Electric Power Corporation | Full-automatic detecting system and method for transformer |
| CN203444053U (en) * | 2013-07-30 | 2014-02-19 | 常州市致新精密电子有限公司 | Integrated network transformer scan test device |
| CN205496096U (en) * | 2016-03-23 | 2016-08-24 | 厦门赛特勒磁电有限公司 | High -frequency transformer comprehensive test machine |
| CN105823952A (en) * | 2016-05-09 | 2016-08-03 | 东莞市博展机械科技有限公司 | Transformer test machine |
| CN206527068U (en) * | 2017-02-16 | 2017-09-29 | 江西省高新超越精密电子有限公司 | A kind of transformer back segment automatic test all-in-one machine equipment |
| CN109613382A (en) * | 2018-12-11 | 2019-04-12 | 刘清伟 | A kind of transformer detects finished product production equipment automatically |
| CN210465656U (en) * | 2019-06-28 | 2020-05-05 | 常州市国峰电子科技有限公司 | High efficiency transformer comprehensive tester |
| CN111085452A (en) * | 2019-12-31 | 2020-05-01 | 东莞市博展机械科技有限公司 | High-efficiency transformer test system |
| CN111289834A (en) * | 2020-04-03 | 2020-06-16 | 东莞市嘉龙海杰电子科技有限公司 | Transformer flexibility test system |
| CN216013557U (en) * | 2021-05-10 | 2022-03-11 | 东莞市博展机械科技有限公司 | Transformer test equipment |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113447674A (en) * | 2021-08-30 | 2021-09-28 | 广东电网有限责任公司东莞供电局 | Transformer test fixture device |
| CN113447674B (en) * | 2021-08-30 | 2021-11-16 | 广东电网有限责任公司东莞供电局 | Transformer test fixture device |
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Application publication date: 20210810 |