CN113125885A - Electrical performance testing method for annular filter assembly - Google Patents
Electrical performance testing method for annular filter assembly Download PDFInfo
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- CN113125885A CN113125885A CN202110411306.6A CN202110411306A CN113125885A CN 113125885 A CN113125885 A CN 113125885A CN 202110411306 A CN202110411306 A CN 202110411306A CN 113125885 A CN113125885 A CN 113125885A
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- 238000012360 testing method Methods 0.000 title claims abstract description 39
- 238000010998 test method Methods 0.000 claims abstract description 35
- 238000003780 insertion Methods 0.000 claims abstract description 24
- 230000037431 insertion Effects 0.000 claims abstract description 24
- 238000002955 isolation Methods 0.000 claims abstract description 21
- 238000000034 method Methods 0.000 claims description 14
- 239000003550 marker Substances 0.000 claims description 13
- 230000009286 beneficial effect Effects 0.000 abstract 1
- 238000001914 filtration Methods 0.000 description 3
- 238000011056 performance test Methods 0.000 description 3
- 238000012827 research and development Methods 0.000 description 3
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- 238000010586 diagram Methods 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The invention discloses an electrical performance testing method for an annular filter assembly, which comprises the following steps: s1, a normal temperature electrical property test method, which comprises a passband insertion loss test method, an isolation test method, a voltage standing wave ratio test method and an out-of-band rejection test method; s2, the low-temperature electrical property test method comprises the following steps: s21, taking a low-temperature box, and setting the temperature in the low-temperature box to be-54 to-55 ℃; s22, placing the tested piece (2) in a low-temperature box, preserving heat for 0.4-0.5 h, and taking out the tested piece (2); and S23, repeating the operation of the step S1, namely testing the passband insertion loss, the isolation, the voltage standing wave ratio and the out-of-band rejection performance of the tested piece (2) under the low-temperature condition. The invention has the beneficial effects that: the normal-temperature electrical property, the low-temperature electrical property and the high-temperature electrical property of the annular filter can be obtained, and the test method is simple.
Description
Technical Field
The invention relates to the technical field of performance test of an annular filter assembly, in particular to an electrical performance test method of the annular filter assembly.
Background
The ring filter assembly is composed of a filter and a circulator, and the structure of the ring filter assembly is shown in figure 1, wherein the filter in the ring filter assembly realizes the function of suppressing 2-order harmonic while realizing the near-end suppression, the bandwidth of the ring filter assembly is 2-4 GHz, the relative bandwidth reaches 67%, and therefore the filter selects the near-end to realize the filtering function by interdigital filtering. The circulator in the circulator filtering component can be divided into a high field design and a low field design according to the working field, and the circulator designed by the low field has wide frequency band, thereby achieving octave working bandwidth. After the ring filter assembly is assembled and molded, equipment is needed to test the passband insertion loss, the isolation, the voltage standing wave ratio and the out-of-band rejection performance of the ring filter assembly, but the test is carried out under the normal temperature condition, so that the obtained data is only the normal temperature electrical performance, but the low temperature electrical performance and the high temperature electrical performance cannot be obtained, the ring filter cannot be thoroughly tested, the test limitation exists, and the research and development of the ring filter are not facilitated.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides a method for testing the electrical property of an annular filter assembly, which can obtain the normal-temperature electrical property, the low-temperature electrical property and the high-temperature electrical property of the annular filter and has a simple test method.
The purpose of the invention is realized by the following technical scheme: a method for testing the electrical performance of a ring filter assembly comprises the following steps:
s1, a normal temperature electrical property test method, which comprises a passband insertion loss test method, an isolation test method, a voltage standing wave ratio test method and an out-of-band rejection test method;
the passband insertion loss test method comprises the following steps:
the Sa1 is used for calibrating the vector network analyzer, two ports of the vector network analyzer are respectively connected to a P1 port and a P2 port of the tested piece, and a matched load is connected to the P3 port of the tested piece;
sa2, marker Maker1 on vector network analyzer: x700, marker 2: x500;
sa3, measuring an absolute value between a Marker1 and a Marker2 on a vector network analyzer, wherein the measured maximum value is the passband insertion loss, so that the passband insertion loss is measured;
the isolation testing method comprises the following steps:
sb1, calibrating the vector network analyzer, respectively connecting two ports of the vector network analyzer to a P1 port and a P2 port of a tested piece, and connecting a matched load at the P3 port of the tested piece;
sb2, marker1 on vector network analyzer: x700MHz, Marker 2: x500 MHz;
sb3, measuring an absolute value between a Marker1 and a Marker2 on a vector network analyzer, wherein the measured minimum value is the passband isolation, so that the isolation test is realized;
the voltage standing wave ratio testing method comprises the following steps:
the Sc1 is used for calibrating the vector network analyzer, two ports of the vector network analyzer are respectively connected to a P1 port and a P2 port of the tested piece, and a matched load is connected to the P3 port of the tested piece;
sc2, marker1 on a vector network analyzer: x700MHz, Marker 2: x500 MHz;
the Sc3 is used for measuring an absolute value between a Marker1 and a Marker2 on a vector network analyzer, wherein the measured maximum value is the voltage standing wave ratio, so that the voltage standing wave ratio is measured;
the out-of-band rejection test method comprises the following steps:
sd1, calibrating the vector network analyzer, respectively connecting two ports of the vector network analyzer to a P1 port and a P2 port of a tested piece, and connecting a matched load at the P3 port of the tested piece;
sd2, searching the maximum value of the frequency point range of 5.4G-10.5G on a vector network analyzer;
sd3, subtracting the passband insertion loss by the absolute value of the maximum value to obtain out-of-band rejection, thereby realizing the test of the out-of-band rejection;
s2, the low-temperature electrical property test method comprises the following steps:
s21, taking a low-temperature box, and setting the temperature in the low-temperature box to be-54 to-55 ℃;
s22, placing the tested piece in a low-temperature box, preserving heat for 0.4-0.5 h, and taking out the tested piece;
s23, repeating the operation of the step S1, namely testing the passband insertion loss, the isolation, the voltage standing wave ratio and the out-of-band rejection performance of the tested piece under the low temperature condition;
s3, the high-temperature electrical property test method comprises the following steps:
s31, taking a high-temperature box, and setting the temperature in the high-temperature box to be 84-85 ℃;
s32, placing the tested piece in a high-temperature box, preserving heat for 0.4-0.5 h, and taking out the tested piece;
and S33, repeating the operation of the step S1, and testing the passband insertion loss, the isolation, the voltage standing wave ratio and the out-of-band rejection performance of the tested piece under the high-temperature condition.
The frequency of the vector network analyzer is greater than or equal to 12 GHz.
The resistance of the matched load is 50 omega.
In the steps Sa1, Sb1, Sc1 and Sd1, the test cable is ensured to be connected with the vector network analyzer tightly without looseness and shaking, and the test connection cable is ensured to be connected with the tested piece sufficiently.
In the steps Sa1, Sb1, Sc1 and Sd1, when Power =0dBm and Span =1GHz are displayed on the vector network analyzer, it indicates that the calibration of the vector network analyzer is completed
The invention has the following advantages: the invention can obtain the normal temperature electrical property of the annular filter, and also can obtain the low temperature electrical property and the high temperature electrical property of the annular filter, thereby realizing the complete and thorough test of the performance of the test piece and playing an important role in the research and development or the production of the annular filter.
Drawings
FIG. 1 is a schematic diagram of a ring filter assembly;
FIG. 2 is a schematic diagram of an electrical performance test of the present invention;
in the figure, 1-vector network analyzer, 2-tested piece, and 3-matched load.
Detailed Description
The invention will be further described with reference to the accompanying drawings, without limiting the scope of the invention to the following:
a method for testing the electrical performance of a ring filter assembly comprises the following steps:
s1, a normal temperature electrical property test method, which comprises a passband insertion loss test method, an isolation test method, a voltage standing wave ratio test method and an out-of-band rejection test method;
the passband insertion loss test method comprises the following steps:
sa1, calibrating the vector network analyzer 1, respectively connecting two ports of the vector network analyzer 1 to a P1 port and a P2 port of a tested piece 2, and connecting a matched load 3 to the P3 port of the tested piece 2, wherein the frequency of the vector network analyzer 1 is greater than or equal to 12GHz, and the resistance of the matched load is 50 Ω as shown in FIG. 2;
sa2, marker Maker1 on vector network analyzer 1: x700, marker 2: x500;
sa3, measuring an absolute value between a Marker1 and a Marker2 on the vector network analyzer 1, wherein the measured maximum value is the passband insertion loss, so that the passband insertion loss is measured;
the isolation testing method comprises the following steps:
sb1, calibrating a vector network analyzer 1, respectively connecting two ports of the vector network analyzer 1 to a P1 port and a P2 port of a tested piece 2, and connecting a matched load 3 to the P3 port of the tested piece 2, wherein the frequency of the vector network analyzer 1 is greater than or equal to 12GHz, and the resistance of the matched load is 50 Ω as shown in FIG. 2;
sb2, marker1 on vector network analyzer 1: x700MHz, Marker 2: x500 MHz;
sb3, measuring an absolute value between a Marker1 and a Marker2 on a vector network analyzer 1, wherein the measured minimum value is the passband isolation, so that the isolation test is realized;
the voltage standing wave ratio testing method comprises the following steps:
the Sc1 is used for calibrating the vector network analyzer 1, two ports of the vector network analyzer 1 are respectively connected to a P1 port and a P2 port of a tested piece 2, a matched load 3 is connected to the P3 port of the tested piece 2, as shown in FIG. 2, the frequency of the vector network analyzer 1 is greater than or equal to 12GHz, and the resistance of the matched load is 50 Ω;
sc2, marker Maker1 on vector network analyzer 1: x700MHz, Marker 2: x500 MHz;
the Sc3 is used for measuring an absolute value between a Marker1 and a Marker2 on the vector network analyzer 1, wherein the measured maximum value is the voltage standing wave ratio, so that the voltage standing wave ratio is tested;
the out-of-band rejection test method comprises the following steps:
sd1, calibrating a vector network analyzer 1, respectively connecting two ports of the vector network analyzer 1 to a P1 port and a P2 port of a tested piece 2, and connecting a matched load 3 to the P3 port of the tested piece 2, wherein the frequency of the vector network analyzer 1 is greater than or equal to 12GHz, and the resistance of the matched load is 50 Ω as shown in FIG. 2;
sd2, searching the maximum value of the frequency point range of 5.4G-10.5G on the vector network analyzer 1;
sd3, subtracting the passband insertion loss by the absolute value of the maximum value to obtain out-of-band rejection, thereby realizing the test of the out-of-band rejection;
s2, the low-temperature electrical property test method comprises the following steps:
s21, taking a low-temperature box, and setting the temperature in the low-temperature box to be-54 to-55 ℃;
s22, placing the tested piece 2 in a low-temperature box, preserving heat for 0.4-0.5 h, and taking out the tested piece 2;
s23, repeating the operation of the step S1, namely testing the passband insertion loss, the isolation, the voltage standing wave ratio and the out-of-band rejection performance of the tested piece 2 under the low temperature condition;
s3, the high-temperature electrical property test method comprises the following steps:
s31, taking a high-temperature box, and setting the temperature in the high-temperature box to be 84-85 ℃;
s32, placing the tested piece 2 in a high-temperature box, preserving heat for 0.4-0.5 h, and taking out the tested piece 2;
and S33, repeating the operation of the step S1, namely testing the passband insertion loss, the isolation, the voltage standing wave ratio and the out-of-band rejection performance of the tested piece 2 under the high-temperature condition.
In the steps Sa1, Sb1, Sc1 and Sd1, the test cables are ensured to be connected with the vector network analyzer 1 tightly without looseness and shaking, and at the same time, the test connection cables are ensured to be connected with the tested object 2 sufficiently.
In the steps Sa1, Sb1, Sc1, and Sd1, when Power =0dBm and Span =1GHz are displayed on the vector network analyzer 1, it is indicated that the calibration of the vector network analyzer 1 is completed.
It can be known from steps S2 and S3 that the method can obtain not only the normal temperature electrical property of the ring filter, but also the low temperature electrical property and the high temperature electrical property of the ring filter, thereby realizing a complete and thorough test of the performance of the test piece and playing an important role in the research and development or production of the ring filter.
Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that changes may be made in the embodiments and/or equivalents thereof without departing from the spirit and scope of the invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (5)
1. A method for testing the electrical performance of an annular filter assembly is characterized by comprising the following steps: it comprises the following steps:
s1, a normal temperature electrical property test method, which comprises a passband insertion loss test method, an isolation test method, a voltage standing wave ratio test method and an out-of-band rejection test method;
the passband insertion loss test method comprises the following steps:
the Sa1 is used for calibrating the vector network analyzer, two ports of the vector network analyzer are respectively connected to a P1 port and a P2 port of the tested piece, and a matched load is connected to the P3 port of the tested piece;
sa2, marker Maker1 on vector network analyzer: x700, marker 2: x500;
sa3, measuring an absolute value between a Marker1 and a Marker2 on a vector network analyzer, wherein the measured maximum value is the passband insertion loss, so that the passband insertion loss is measured;
the isolation testing method comprises the following steps:
sb1, calibrating the vector network analyzer, respectively connecting two ports of the vector network analyzer to a P1 port and a P2 port of a tested piece, and connecting a matched load at the P3 port of the tested piece;
sb2, marker1 on vector network analyzer: x700MHz, Marker 2: x500 MHz;
sb3, measuring an absolute value between a Marker1 and a Marker2 on a vector network analyzer, wherein the measured minimum value is the passband isolation, so that the isolation test is realized;
the voltage standing wave ratio testing method comprises the following steps:
the Sc1 is used for calibrating the vector network analyzer, two ports of the vector network analyzer are respectively connected to a P1 port and a P2 port of the tested piece, and a matched load is connected to the P3 port of the tested piece;
sc2, marker1 on a vector network analyzer: x700MHz, Marker 2: x500 MHz;
the Sc3 is used for measuring an absolute value between a Marker1 and a Marker2 on a vector network analyzer, wherein the measured maximum value is the voltage standing wave ratio, so that the voltage standing wave ratio is measured;
the out-of-band rejection test method comprises the following steps:
sd1, calibrating the vector network analyzer, respectively connecting two ports of the vector network analyzer to a P1 port and a P2 port of a tested piece, and connecting a matched load at the P3 port of the tested piece;
sd2, searching the maximum value of the frequency point range of 5.4G-10.5G on a vector network analyzer;
sd3, subtracting the passband insertion loss by the absolute value of the maximum value to obtain out-of-band rejection, thereby realizing the test of the out-of-band rejection;
s2, the low-temperature electrical property test method comprises the following steps:
s21, taking a low-temperature box, and setting the temperature in the low-temperature box to be-54 to-55 ℃;
s22, placing the tested piece in a low-temperature box, preserving heat for 0.4-0.5 h, and taking out the tested piece;
s23, repeating the operation of the step S1, namely testing the passband insertion loss, the isolation, the voltage standing wave ratio and the out-of-band rejection performance of the tested piece under the low temperature condition;
s3, the high-temperature electrical property test method comprises the following steps:
s31, taking a high-temperature box, and setting the temperature in the high-temperature box to be 84-85 ℃;
s32, placing the tested piece in a high-temperature box, preserving heat for 0.4-0.5 h, and taking out the tested piece;
and S33, repeating the operation of the step S1, and testing the passband insertion loss, the isolation, the voltage standing wave ratio and the out-of-band rejection performance of the tested piece under the high-temperature condition.
2. The method of claim 1, wherein the method further comprises: the frequency of the vector network analyzer is greater than or equal to 12 GHz.
3. The method of claim 1, wherein the method further comprises: the resistance of the matched load is 50 omega.
4. The method of claim 1, wherein the method further comprises: in the steps Sa1, Sb1, Sc1 and Sd1, the test cable is ensured to be connected with the vector network analyzer tightly without looseness and shaking, and the test connection cable is ensured to be connected with the tested piece sufficiently.
5. The method of claim 1, wherein the method further comprises: in the steps Sa1, Sb1, Sc1 and Sd1, when Power =0dBm and Span =1GHz are displayed on the vector network analyzer, it is indicated that the calibration of the vector network analyzer is completed.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117890715A (en) * | 2024-03-14 | 2024-04-16 | 大连海事大学 | Filter electrical performance test system based on big data information analysis |
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| CN106597106A (en) * | 2016-11-21 | 2017-04-26 | 电子科技大学 | Standing wave coefficient testing device and method of output port in working state of travelling wave tube |
| CN109336597A (en) * | 2018-12-13 | 2019-02-15 | 张家港保税区灿勤科技有限公司 | The preparation method and test method of the base station 5G ceramic dielectric waveguide filter |
| WO2020192453A1 (en) * | 2019-03-28 | 2020-10-01 | 中国科学院上海硅酸盐研究所 | Material high-temperature dielectric performance test system |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106597106A (en) * | 2016-11-21 | 2017-04-26 | 电子科技大学 | Standing wave coefficient testing device and method of output port in working state of travelling wave tube |
| CN109336597A (en) * | 2018-12-13 | 2019-02-15 | 张家港保税区灿勤科技有限公司 | The preparation method and test method of the base station 5G ceramic dielectric waveguide filter |
| WO2020192453A1 (en) * | 2019-03-28 | 2020-10-01 | 中国科学院上海硅酸盐研究所 | Material high-temperature dielectric performance test system |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN117890715A (en) * | 2024-03-14 | 2024-04-16 | 大连海事大学 | Filter electrical performance test system based on big data information analysis |
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