CN113092968A - Automatic testing system for AC/DC breakdown field intensity of film sample - Google Patents
Automatic testing system for AC/DC breakdown field intensity of film sample Download PDFInfo
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- CN113092968A CN113092968A CN202110398411.0A CN202110398411A CN113092968A CN 113092968 A CN113092968 A CN 113092968A CN 202110398411 A CN202110398411 A CN 202110398411A CN 113092968 A CN113092968 A CN 113092968A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/92—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating breakdown voltage
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- Chemical Kinetics & Catalysis (AREA)
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- Length Measuring Devices By Optical Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
The invention relates to an automatic testing system for alternating current and direct current breakdown field strength of a film sample, belonging to the field of insulating material performance testing. The invention provides an automatic testing system for alternating current and direct current breakdown field intensity of a film sample. The operation of the whole system is divided into the processes of measurement, automatic sample changing and analysis display, wherein the measurement process comprises the following steps: obtaining the thickness of a sample through a thickness measuring sensor, recording the breakdown voltage by a digital voltmeter, transmitting data to an upper computer by a singlechip, and finally presenting the data in a chart form and storing the data by the upper computer; automatic sample changing process: when the single chip microcomputer detects that the breakdown is finished, the upper electrode is pulled through controlling the relay, and the sample to be tested is moved to a test position through controlling the stepping motor; analyzing and displaying the process: and the upper computer visually reflects the breakdown characteristics of the material through the test data in combination with a field intensity formula and the selected data processing mode. The breakdown testing system designed by the invention reduces the sample changing times, avoids artificial thickness measurement errors, and effectively improves the measuring efficiency and the safety.
Description
Technical Field
The invention relates to a field intensity test of film sample AC/DC breakdown, belonging to the field of insulating material performance test.
Background
At present, the ac/dc breakdown field strength of the insulating material is one of the main bases for the insulation characteristics of the reactive material.
The breakdown characteristic of the insulating material is mainly that a film sample is subjected to alternating current and direct current tests.
However, the amount of human involvement in the testing process is excessive, increasing the possibility of error and operational risks.
The invention is based on the traditional AC/DC breakdown test, adds the non-contact thickness measuring sensor and the automatic sample changing device, and reduces the influence of human participation on the main parameters of the breakdown test.
Disclosure of Invention
The invention provides an automatic testing system for AC/DC breakdown field strength of a film sample, which can test the breakdown characteristic of an insulating material.
The technical scheme is as follows:
an automatic test system for AC/DC breakdown field intensity of a film sample comprises an AC/DC high voltage generation module, a voltage measurement module, a central control module, an automatic sample changing device and a laser thickness measuring device; the alternating current and direct current high voltage generation module comprises an alternating current and direct current control box and an alternating current and direct current booster, wherein the alternating current and direct current control box is responsible for controlling the magnitude of output voltage, and the booster is responsible for boosting alternating current transmitted by the control box according to a certain transformation ratio and outputting the alternating current as high-voltage alternating current or direct current; the voltage measurement module is completed by a digital voltmeter and transmits the voltage in the experimental process to the PC terminal, and the PC terminal obtains the breakdown voltage through the analysis of the voltage waveform; the central control module consists of a C51 singlechip and related circuits and is mainly responsible for controlling the automatic sample changing device and the laser thickness measuring device and preprocessing and outputting data; the automatic sample changing device comprises an electromagnetic relay, a rotary sample table and a stepping motor; the laser thickness measuring device is arranged at the lower end of the upper electrode fixing device and used for measuring the thickness of a sample to be measured.
Furthermore, the automatic sample changing device comprises an electromagnetic relay, a rotary sample table and a stepping motor, wherein the electromagnetic relay is arranged at the upper end of the upper electrode fixing device, and downward repelling power is provided by compression springs at two sides and the self gravity of the upper electrode; the rotary sample table bears a plurality of samples to be tested, and a metal roller below the rotary sample table provides a rotary condition; the stepping motor is controlled by a pulse signal sent by a C51 singlechip according to parameters set by a PC end, provides power support for the rotating sample table, rotates by a fixed angle in the sample changing process every time, and moves a new sample to be tested to a testing position.
Further, the laser thickness measuring device is arranged at the lower end of the upper electrode fixing device, and the thickness of the film sample to be measured is obtained by measuring the distance between the laser thickness measuring device and the lower electrode under the condition that the sample exists or does not exist.
Furthermore, before sample changing, the electromagnetic relay is controlled by the C51 single chip microcomputer to move away from the sample, so that the obstruction of the subsequent sample changing process is reduced, and the electromagnetic relay is put down after a new sample arrives to prepare for a breakdown experiment.
An automatic testing system for AC/DC breakdown field strength of a thin film sample, according to the testing device in claims 1-4, comprising the following steps:
1) clinging a lower electrode to the lower electrode (rotating a sample table), and acquiring an initial value by a laser thickness measuring sensor;
2) uniformly fixing a sample on a circular rotating sample table to ensure that a contact surface has no bubbles;
3) setting relevant parameters at a PC end, clicking to submit, and starting testing;
4) the microprocessor controls the electromagnetic relay to enable the upper electrode to move upwards;
5) the microprocessor controls the stepping motor to rotate, and the sample to be tested moves to a test position;
6) the microprocessor controls the electromagnetic relay to ensure that the lower electrode is tightly attached to the sample under the action of the power failure;
7) the laser thickness measuring sensor measures the distance from the lower electrode, and the difference value between the distance and the initial value is the thickness of the sample;
8) the high-voltage control box is controlled to carry out a breakdown experiment, and the digital voltmeter transmits the measured voltage to the PC terminal;
9) repeating steps 4-8 until all pattern measurements are completed;
10) and finishing the checking and measuring on the PC terminal interface, and performing data analysis.
Compared with the prior art, the invention has the following beneficial effects: .
1. The invention is based on the traditional AC/DC breakdown test, adds the non-contact thickness measuring sensor and the automatic sample changing device, and reduces the influence of human participation on the main parameters of the breakdown test.
2. Compared with the traditional alternating current and direct current breakdown experiment, the method provided by the invention can be used for measuring a plurality of samples at one time.
3. The frequency of direct contact of the experimenter with the high voltage test platform is reduced.
Drawings
Fig. 1 is a schematic view of the working process of the present invention.
FIG. 2 is a schematic diagram of the system of the present invention.
Fig. 3 is a design drawing of a sample test stand according to the present invention.
Detailed Description
Referring to fig. 1, fig. 1 is a schematic view of a working process of an automatic testing system for ac/dc breakdown field strength of a thin film sample according to the present invention: .
The automatic testing system for the alternating current-direct current breakdown field strength of the film sample comprises the following steps: .
The lower electrode was brought into close contact with the lower electrode (rotating sample stage), and the laser thickness measuring sensor acquired an initial value.
And the sample is uniformly fixed on a circular rotating sample table, so that no bubbles exist on the contact surface.
And setting related parameters at the PC end, clicking to submit, and starting the test.
The microprocessor controls the electromagnetic relay to move the upper electrode upwards.
The microprocessor controls the stepping motor to rotate, and the sample to be tested moves to the test position.
The microprocessor controls the electromagnetic relay to make the lower electrode tightly attached to the sample under the action of the power failure.
The laser thickness measuring sensor measures the distance between the laser thickness measuring sensor and the lower electrode, and the difference value between the measured distance and the initial value is the thickness of the sample.
Through controlling the high-voltage control box, carry out the breakdown experiment, the digital voltmeter transmits the voltage of measuring for the PC end.
Steps 4-8 are repeated until all pattern measurements are completed.
And checking the measurement quantity by the PC terminal interface, and analyzing the data.
Referring to fig. 2, fig. 2 is a schematic structural diagram of an automatic testing system for ac/dc breakdown field strength of a thin film sample according to the present invention.
The digital voltmeter adopts an alternating current-direct current digital voltmeter with the model of HG1943A, the alternating current-direct current booster adopts an YD series light alternating current-direct current high-voltage test transformer, the high-voltage control box is an alternating current-direct current high-voltage control box with the model of XCSB, and the AT89C51 single chip microcomputer is used as a main control chip to be responsible for data transmission and terminal module control.
Please refer to fig. 3 for a system execution module with main innovations, fig. 3 is a design diagram of a sample test bench of an automatic test system for ac/dc breakdown field strength of a thin film sample according to the present invention: .
A test specimen test bed of an automatic test system for AC/DC breakdown field strength of a film test specimen comprises a rotary test specimen table 6 with automatic sample changing, a laser thickness measuring sensor 4 for measuring the thickness of a sample, an external circuit and the like.
The rotary sample table 6 comprises a stepping motor 9 for providing power, a transmission rod 14, a metal transmission wheel 15, a metal ring type sample table 11, a base 6 and a metal roller 10, wherein the base 6 is connected with a ground wire 8, which is equivalent to the fact that the ring type sample table 11 is connected through the roller 10, so that the ring type sample table 11 has the function of a lower electrode.
The laser thickness measuring sensor 4 is fixed below an organic glass wafer 3 of the upper electrode fixing frame, and the fixing frame comprises two fixing screw rods 5 fixed on a base 6, an organic glass wafer 1 fixedly connected with the screw rods 5 and provided with a central round hole, an organic glass wafer 3 movably connected with the screw rods 5 and provided with a central round hole, a compression spring 2 sleeved on the screw rods 5 and positioned between the two organic glass wafers, and an electromagnetic relay 17 fixed below the glass wafer 1.
Wherein the insulating tube 18, the organic glass wafer 3, the laser thickness measuring sensor 4 and the lower electrode 16 are fixed together to form a movable element, and the iron lower electrode 16 can move upwards under the action of the electromagnetic relay 17.
The organic glass wafer 1, the fixed rod 5 and the compression spring 2 provide a power rejection force for the movable element, and the lower electrode 16 is ensured to be tightly attached to the sample 7 to be detected when the electromagnetic relay 17 does not act.
The external lines include a control line 21 of the sensor 4, a control line 20 of the electromagnetic relay, a high voltage input line 19 of the upper electrode, a control line 13 of the stepping motor and a ground line 8 of the lower electrode base 6.
Claims (4)
1. The utility model provides a film sample alternating current-direct current breakdown field intensity automatic test system, includes that the alternating current-direct current high voltage takes place module, voltage measurement module and central control module, its characterized in that: the automatic sample changing device comprises an electromagnetic relay, a rotary sample table and a stepping motor; the laser thickness measuring device is arranged at the lower end of the upper electrode fixing device; the alternating current-direct current high-voltage generation module comprises an alternating current-direct current control box and an alternating current-direct current booster, wherein the alternating current-direct current control box is responsible for controlling the magnitude of output voltage, and the booster is responsible for boosting alternating current transmitted by the control box according to a certain transformation ratio and outputting the alternating current as high-voltage alternating current or direct current; the voltage measurement module is completed by a digital voltmeter and transmits the voltage in the experimental process to the PC terminal, and the PC terminal obtains the breakdown voltage through the analysis of the voltage waveform; the central control module is composed of a C51 single chip microcomputer and related circuits and is mainly responsible for control of the automatic sample changing device and the laser thickness measuring device and data preprocessing and output, the central control module controls the alternating current and direct current high voltage generating module to generate high voltage, and when the alternating current and direct current high voltage generating module continuously outputs voltage to cause sample breakdown, the voltage measuring module records the highest voltage output by the alternating current and direct current high voltage generating module.
2. The system for automatically testing the alternating current-direct current breakdown field strength of the thin film sample according to claim 1, wherein: the automatic sample changing device comprises an electromagnetic relay, a rotary sample table and a stepping motor, wherein the electromagnetic relay is arranged at the upper end of the upper electrode fixing device, and downward power rejection force is provided by compression springs at two sides and the self gravity of the upper electrode; the rotary sample table bears a plurality of samples to be tested, and a metal roller below the rotary sample table provides a rotary condition; the stepping motor is controlled by a pulse signal sent by a C51 singlechip according to parameters set by a PC end, provides power support for the rotating sample table, rotates by a fixed angle in the sample changing process every time, and moves a new sample to be tested to a testing position.
3. The system for automatically testing the alternating current-direct current breakdown field strength of the thin film sample according to claim 1, wherein: the laser thickness measuring device is arranged at the lower end of the upper electrode fixing device, and the thickness of the thin film sample to be measured is obtained by measuring the distance between the laser thickness measuring device and the lower electrode under the condition that the sample exists or not; before the sample changing, the electromagnetic relay is controlled by a C51 singlechip to move away from the sample so as to reduce the obstruction of the subsequent sample changing process, and the electromagnetic relay is put down after a new sample arrives to prepare a breakdown experiment.
4. An automatic testing system for AC/DC breakdown field strength of a thin film sample, according to the testing device in claims 1-4, comprising the following steps:
1) clinging a lower electrode to the lower electrode (rotating a sample table), and acquiring an initial value by a laser thickness measuring sensor;
2) uniformly fixing a sample on a circular rotating sample table to ensure that a contact surface has no bubbles;
3) setting relevant parameters at a PC end, clicking to submit, and starting testing;
4) the microprocessor controls the electromagnetic relay to enable the upper electrode to move upwards;
5) the microprocessor controls the stepping motor to rotate, and the sample to be tested moves to a test position;
6) the microprocessor controls the electromagnetic relay to ensure that the lower electrode is tightly attached to the sample under the action of the power failure;
7) the laser thickness measuring sensor measures the distance from the lower electrode, and the difference value between the distance and the initial value is the thickness of the sample;
8) the high-voltage control box is controlled to carry out a breakdown experiment, and the digital voltmeter transmits the measured voltage to the PC terminal;
9) repeating steps 4-8 until all pattern measurements are completed;
10) and finishing the checking and measuring on the PC terminal interface, and performing data analysis.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110398411.0A CN113092968A (en) | 2021-04-14 | 2021-04-14 | Automatic testing system for AC/DC breakdown field intensity of film sample |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110398411.0A CN113092968A (en) | 2021-04-14 | 2021-04-14 | Automatic testing system for AC/DC breakdown field intensity of film sample |
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| CN113092968A true CN113092968A (en) | 2021-07-09 |
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| CN202110398411.0A Pending CN113092968A (en) | 2021-04-14 | 2021-04-14 | Automatic testing system for AC/DC breakdown field intensity of film sample |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114184917A (en) * | 2021-12-10 | 2022-03-15 | 国网安徽省电力有限公司超高压分公司 | Device and method for testing electrical characteristics of insulating paperboard |
| CN114578196A (en) * | 2022-03-03 | 2022-06-03 | 华北电力大学 | High-frequency high-voltage film material body breakdown insulation performance testing device under electric-thermal coupling stress |
| CN116223993A (en) * | 2023-02-24 | 2023-06-06 | 中国测试技术研究院电子研究所 | Insulation voltage-withstanding testing device for electric component |
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Cited By (3)
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| CN114184917A (en) * | 2021-12-10 | 2022-03-15 | 国网安徽省电力有限公司超高压分公司 | Device and method for testing electrical characteristics of insulating paperboard |
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| CN116223993A (en) * | 2023-02-24 | 2023-06-06 | 中国测试技术研究院电子研究所 | Insulation voltage-withstanding testing device for electric component |
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Application publication date: 20210709 |