CN112162192A - Automatic electronic circuit parameter detection and analysis recording system - Google Patents
Automatic electronic circuit parameter detection and analysis recording system Download PDFInfo
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- CN112162192A CN112162192A CN202011134571.6A CN202011134571A CN112162192A CN 112162192 A CN112162192 A CN 112162192A CN 202011134571 A CN202011134571 A CN 202011134571A CN 112162192 A CN112162192 A CN 112162192A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
- G06F21/71—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information
- G06F21/73—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information by creating or determining hardware identification, e.g. serial numbers
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
- G06K7/10—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
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Abstract
The invention relates to an automatic electronic circuit parameter detection and analysis recording system, which comprises an electronic circuit detection mechanism, a programmable processor connected with the electronic circuit detection mechanism, a computer connected with the programmable processor, a cloud server connected with the computer and a local database, wherein the electronic circuit detection mechanism is connected with a lifting driving piece (air cylinder), the lifting driving piece controls the electronic circuit detection mechanism to lift to detect an electronic circuit product, and the electronic circuit product is arranged on a test board; the system meets the detection requirements of most of domestic electronic circuit production enterprises, is low in overall cost and convenient to operate, and realizes the automation of electronic circuit parameter detection and analysis recording.
Description
Technical Field
The invention relates to the field of electronic circuit product detection, in particular to an automatic electronic circuit parameter detection and analysis recording system.
Background
After a plurality of electronic components and integrated circuits are welded on a printed electronic circuit board, defects exist, common appearance visual inspection is difficult to find, manual circuit detection difficulty is large (such as dynamic reaction of the circuit and difficult measurement and recording of transient response), cost is high, and most users are not enough in detection power of electronic circuit products and are accustomed to being natural. The common inspection is visual inspection, and if defective products exist, the defective products can be replaced, which brings extra burden and hidden danger to customers and reduces the quality credit and bargaining capability of suppliers. Therefore, an automated electronic circuit parameter detection and analysis recording system is urgently needed to solve the problem of difficult manual circuit detection.
Disclosure of Invention
The invention aims to solve the defects in the prior art and provides an automatic electronic circuit parameter detection, analysis and recording system.
In order to achieve the purpose, the technical scheme adopted by the invention is as follows:
an automatic electronic circuit parameter detection and analysis recording system comprises an electronic circuit detection mechanism, a programmable processor connected with the electronic circuit detection mechanism, a computer connected with the programmable processor, a cloud server and a local database connected with the computer, wherein the electronic circuit detection mechanism is connected with a lifting driving piece (air cylinder), the lifting driving piece controls the electronic circuit detection mechanism to lift to detect an electronic circuit product, the electronic circuit product is arranged on a test board, the electronic circuit detection mechanism comprises a substrate, a probe array arranged on the substrate, test command and signal input and output interfaces arranged on the substrate, an electronic signal preprocessing system arranged on the substrate, a test progress display system and a power supply conversion system;
the probe array is arranged on the side face of one side of the substrate and is in electrical contact with the electronic circuit product to be tested, the probe array comprises a main probe and an auxiliary probe, the probe array formed by the main probe and the auxiliary probe is a rectangular array, the main probe is used for measuring the electronic circuit product, and the auxiliary probe is used for checking whether the corresponding main probe is in good electrical contact with the electronic circuit product to be tested.
Furthermore, the main probe is directly connected with the test command and the signal input and output interface, or is connected with the test command and the signal input and output interface through a low-impedance relay, or is connected with the signal input and output interface after the electric signal is amplified or reduced through an electronic signal preprocessing system; the auxiliary probe is connected with the test command, the signal input/output and the interface through the multiplexing circuit.
Furthermore, the test command and signal input and output interface is a pin array and is used for communicating with the upper and lower data of the test programming processor.
Further, the test progress display system is an LED array or a liquid crystal display screen.
Furthermore, the test progress display system is a display interface, and the display interface is connected with external display equipment.
Furthermore, a test program of the electronic circuit product is installed in the computer, the code scanning gun is connected to the computer, the code scanning gun scans the electronic circuit product and records the serial number of the product, the computer is connected with the code scanning gun and the programmable processor through USB data lines, and the programmable processor is connected with the signal input interface and the signal output interface through the data lines.
Further, the programmable processor is of the model STM 32.
The invention has the beneficial effects that: when the system is used, a product (array) to be measured is scanned by the code scanning gun to input a product serial number, the product (array) is placed at a specified position of the test board, the lifting driving piece lowers the base plate, the probes on the base plate are in contact with corresponding contact points on the product, and an automatic measurement program is started. After the good contact is confirmed, the programmable processor injects voltage and current to the product to be detected sequentially through the probe according to the program, various operation conditions of the product are simulated, meanwhile, the probe collects the electrical reaction of the product to be detected, the electrical reaction is recorded and analyzed and uploaded to a local computer, the local computer uploads the detected data and parameters to the cloud server and the local database for storage, the system meets the detection requirements of most of electronic circuit production enterprises in China, the overall cost is low, the operation is convenient, and the automation of electronic circuit parameter detection and analysis recording is realized.
Drawings
FIG. 1 is a schematic diagram of the system of the present invention;
fig. 2 is a schematic top view of the electronic circuit testing mechanism of the present invention.
Detailed Description
As shown in fig. 1 and fig. 2, an automatic electronic circuit parameter detection and analysis recording system comprises an electronic circuit detection mechanism 1, a programmable processor 2 connected with the electronic circuit detection mechanism 1, a computer 3 connected with the programmable processor 2, a cloud server 4 and a local database 5 connected with the computer 3, a test program 6 of an electronic circuit product is installed in the computer 3, a code scanning gun 7 is connected with the computer 3, the code scanning gun 7 scans and records a product serial number of the electronic circuit product 8, the computer 3 is connected with the code scanning gun 7 and the programmable processor 2 through a USB data line, and the model of the programmable processor 2 is preferably STM 32.
The electronic circuit detection mechanism 1 is connected with a lifting driving piece (air cylinder), the lifting driving piece controls the electronic circuit detection mechanism 1 to lift to detect an electronic circuit product 8, and the electronic circuit product 8 is arranged on the test board 9.
The electronic circuit detection mechanism 1 comprises a substrate 11, a probe array 12 arranged on the substrate 11, a test command and signal input and output interface 13 arranged on the substrate 11, an electronic signal preprocessing system 14 arranged on the substrate 11, a test progress display system 15 and a power conversion system 16, wherein the substrate 11 is a printed circuit board.
The probe array 12 is arranged on the side surface of one side of the substrate 11, the probe array is electrically contacted with an electronic product to be tested, the spring probe array 12 is generally divided into two types, one type is a main probe and is directly used for measurement; the other type is an auxiliary probe for measuring contact continuity, which is only used for verifying whether the corresponding main probe has good electrical contact with the tested electronic product. If X probes are required for an electronic product under test, and Y rows and Z columns of the electronic product under test are provided on a plate, XYZ primary probes and XYZ secondary probes are required.
Further, the main probe is generally directly connected to the test command and the signal input/output interface 13, or connected to the test command and the signal input/output interface 13 through a low-impedance relay, or connected to the signal input/output interface 13 after the electrical signal is amplified or reduced by the electronic signal preprocessing system 14. The auxiliary probes can be connected to the signal input/output interface 13 via a multiplexing circuit, and the extra impedance of the multiplexing circuit is taken into account by the program when the multiplexing circuit is used to detect whether the probes have good electrical contact, and does not affect the parameter measurement of the electronic product.
Further, the test command and signal input/output interface 13 is generally a general pin array for communicating with the upper and lower data of the test programming processor; an electronic signal preprocessing system 14 serves between the probe array and the test command and signal input and output interfaces. Since the number of probes 2XYZ is generally much greater than the number of pins in the input/output array, it is generally necessary to select the test channels by multiplexing using an electronic signal preprocessing system. In addition, a portion of the electrical signals being tested may be too low or too high and may require a corresponding scaling up or down by the electronic signal preprocessing system 14 to be properly utilized by a standard test programming processor, wherein the electronic signal preprocessing system 14 is an existing electronic system and will not be described in detail.
Further, external access is not suitable as various power supplies may be required. Typically, only one external power source is introduced and the test card is provided with a power conversion system 16 to generate various power supplies for the electronic signal preprocessing system 14.
The optional test progress display system 15 is mainly used for facilitating an operator to visually understand the test progress during the use process. The LED array can be multi-color LED array, liquid crystal display, etc., or the display interface can be connected with an external display device.
The structure is used between the tested electronic circuit board and the testing programming processor, correctly injects and acquires the electric signal, and processes the electric signal according to requirements, so that the tested electronic circuit board and the testing programming processor can be conveniently and properly used.
When the system is used, an electronic circuit product 8 (array) to be measured is scanned and recorded with a product serial number through the code scanning gun 7, the electronic circuit product is placed at a specified position of the test board 9, the lifting driving piece lowers the substrate 11, the probes on the substrate 11 are in contact with corresponding contact points on the product, and an automatic measurement program is started. After confirming that the contact is good, the programmable processor 2 injects voltage and current into the product to be detected sequentially through the probe according to the program, various operation conditions of the product are simulated, meanwhile, the probe collects the electrical reaction of the product to be detected, the electrical reaction is recorded and analyzed and is uploaded to the local computer 3, the local computer 3 uploads the detected data and parameters to the cloud server 4 and the local database 5 for storage, the detection requirement of most of electronic circuit production enterprises in China is met, the overall cost is low, the operation is convenient, and the automation of electronic circuit parameter detection and analysis recording is realized.
The foregoing shows and describes the general principles, essential features, and advantages of the invention. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are merely illustrative of the principles of the invention, but that various changes and modifications may be made without departing from the spirit and scope of the invention, which fall within the scope of the invention as claimed. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (7)
1. An automatic electronic circuit parameter detection and analysis recording system comprises an electronic circuit detection mechanism, a programmable processor connected with the electronic circuit detection mechanism, a computer connected with the programmable processor, a cloud server and a local database connected with the computer, and is characterized in that the electronic circuit detection mechanism is connected with a lifting driving piece, the lifting driving piece controls the electronic circuit detection mechanism to lift to detect an electronic circuit product, the electronic circuit product is arranged on a test board, the electronic circuit detection mechanism comprises a substrate, a probe array arranged on the substrate, test commands and signal input and output interfaces arranged on the substrate, an electronic signal preprocessing system arranged on the substrate, a test progress display system and a power supply conversion system;
the probe array is arranged on the side face of one side of the substrate and is in electrical contact with the electronic circuit product to be tested, the probe array comprises a main probe and an auxiliary probe, the probe array formed by the main probe and the auxiliary probe is a rectangular array, the main probe is used for measuring the electronic circuit product, and the auxiliary probe is used for checking whether the corresponding main probe is in good electrical contact with the electronic circuit product to be tested.
2. The automated electronic circuit parameter detecting, analyzing and recording system of claim 1, wherein the primary probe is directly connected to the test command and the signal input/output interface, or connected to the test command and the signal input/output interface through a low impedance relay, or connected to the signal input/output interface after the electrical signal is amplified or reduced by the electronic signal preprocessing system; the auxiliary probe is connected with the test command, the signal input/output and the interface through the multiplexing circuit.
3. The automated electronic circuit parameter detecting, analyzing and recording system of claim 2, wherein the test command and signal input and output interface is a pin array for communicating data up and down with the test programming processor.
4. The automated electronic circuit parameter detecting, analyzing and recording system of claim 2, wherein the testing progress display system is an LED array or a liquid crystal display.
5. The automated electronic circuit parameter detecting, analyzing and recording system of claim 2, wherein the test progress display system is a display interface, and the display interface is connected to an external display device.
6. The system as claimed in claim 2, wherein the computer is installed with a test program for electronic circuit products, the computer is connected with a code scanning gun, the code scanning gun scans the electronic circuit products and records the serial numbers of the products, the computer is connected with the code scanning gun and the programmable processor through USB data lines, and the programmable processor is connected with the signal input and output interfaces through the data lines.
7. An automated electronic circuit parameter sensing and analysis recording system according to claim 6, wherein said programmable processor is of the type STM 32.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011134571.6A CN112162192A (en) | 2020-10-21 | 2020-10-21 | Automatic electronic circuit parameter detection and analysis recording system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011134571.6A CN112162192A (en) | 2020-10-21 | 2020-10-21 | Automatic electronic circuit parameter detection and analysis recording system |
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| Publication Number | Publication Date |
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| CN112162192A true CN112162192A (en) | 2021-01-01 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202011134571.6A Pending CN112162192A (en) | 2020-10-21 | 2020-10-21 | Automatic electronic circuit parameter detection and analysis recording system |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114594917A (en) * | 2022-02-25 | 2022-06-07 | 珠海艾派克微电子有限公司 | Interface module, chip reading and writing method and device |
| CN116298863A (en) * | 2023-02-01 | 2023-06-23 | 深圳市致诚达科技有限公司 | Quick inspection system and control method for BLDC motor production line |
-
2020
- 2020-10-21 CN CN202011134571.6A patent/CN112162192A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114594917A (en) * | 2022-02-25 | 2022-06-07 | 珠海艾派克微电子有限公司 | Interface module, chip reading and writing method and device |
| CN116298863A (en) * | 2023-02-01 | 2023-06-23 | 深圳市致诚达科技有限公司 | Quick inspection system and control method for BLDC motor production line |
| CN116298863B (en) * | 2023-02-01 | 2024-05-10 | 深圳市致诚达科技有限公司 | Quick inspection system and control method for BLDC motor production line |
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