CN113054050B - 一种V2O5-Ga2O3异质结自供电日盲光电探测器及制备方法 - Google Patents
一种V2O5-Ga2O3异质结自供电日盲光电探测器及制备方法 Download PDFInfo
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- 229910005191 Ga 2 O 3 Inorganic materials 0.000 title claims abstract description 84
- 238000002360 preparation method Methods 0.000 title claims abstract description 21
- 239000000463 material Substances 0.000 claims abstract description 36
- 230000015572 biosynthetic process Effects 0.000 claims abstract description 6
- 238000004519 manufacturing process Methods 0.000 claims abstract description 4
- 239000010408 film Substances 0.000 claims description 43
- 238000000137 annealing Methods 0.000 claims description 19
- 239000010409 thin film Substances 0.000 claims description 14
- XHCLAFWTIXFWPH-UHFFFAOYSA-N [O-2].[O-2].[O-2].[O-2].[O-2].[V+5].[V+5] Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[V+5].[V+5] XHCLAFWTIXFWPH-UHFFFAOYSA-N 0.000 claims description 13
- 229910001935 vanadium oxide Inorganic materials 0.000 claims description 13
- 239000002904 solvent Substances 0.000 claims description 11
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 claims description 10
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 claims description 9
- 239000000758 substrate Substances 0.000 claims description 8
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 6
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 6
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 6
- 229910052719 titanium Inorganic materials 0.000 claims description 6
- 239000010936 titanium Substances 0.000 claims description 6
- 229910052738 indium Inorganic materials 0.000 claims description 5
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 5
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 4
- 229910052782 aluminium Inorganic materials 0.000 claims description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 4
- 238000001704 evaporation Methods 0.000 claims description 4
- 229910052733 gallium Inorganic materials 0.000 claims description 4
- 238000010438 heat treatment Methods 0.000 claims description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 239000010949 copper Substances 0.000 claims description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 239000010931 gold Substances 0.000 claims description 3
- 229910052697 platinum Inorganic materials 0.000 claims description 3
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 claims description 3
- 229910052709 silver Inorganic materials 0.000 claims description 3
- 239000004332 silver Substances 0.000 claims description 3
- 238000009987 spinning Methods 0.000 claims description 2
- 230000004044 response Effects 0.000 abstract description 12
- 238000001514 detection method Methods 0.000 abstract description 9
- 230000005684 electric field Effects 0.000 abstract description 4
- 230000035945 sensitivity Effects 0.000 abstract description 4
- 238000006243 chemical reaction Methods 0.000 abstract description 3
- 238000011160 research Methods 0.000 abstract description 3
- 238000000034 method Methods 0.000 description 7
- 238000005286 illumination Methods 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 238000011161 development Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 239000001301 oxygen Substances 0.000 description 3
- 229910052760 oxygen Inorganic materials 0.000 description 3
- 239000002243 precursor Substances 0.000 description 3
- 229910052594 sapphire Inorganic materials 0.000 description 3
- 239000010980 sapphire Substances 0.000 description 3
- 230000003595 spectral effect Effects 0.000 description 3
- 229910052720 vanadium Inorganic materials 0.000 description 3
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 238000002441 X-ray diffraction Methods 0.000 description 2
- 239000003570 air Substances 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 238000001755 magnetron sputter deposition Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 1
- 229910003363 ZnMgO Inorganic materials 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- ZNKMCMOJCDFGFT-UHFFFAOYSA-N gold titanium Chemical compound [Ti].[Au] ZNKMCMOJCDFGFT-UHFFFAOYSA-N 0.000 description 1
- 230000005283 ground state Effects 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 230000004298 light response Effects 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000001451 molecular beam epitaxy Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 238000004549 pulsed laser deposition Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910001258 titanium gold Inorganic materials 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- RGGPNXQUMRMPRA-UHFFFAOYSA-N triethylgallium Chemical group CC[Ga](CC)CC RGGPNXQUMRMPRA-UHFFFAOYSA-N 0.000 description 1
- 238000000825 ultraviolet detection Methods 0.000 description 1
- 238000002211 ultraviolet spectrum Methods 0.000 description 1
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Abstract
本发明提供了一种V2O5‑Ga2O3异质结自供电日盲光电探测器及制备方法。所述探测器包括作为n型导电的Ga2O3材料和作为p型导电的V2O5材料形成的V2O5‑Ga2O3异质结,以及与上述材料欧姆接触的电极。本发明的制备方法通过对V2O5‑Ga2O3异质结进行二次退火,促进了平面异质结的形成和内建电场的产生,使异质界面可以有效分离激发态的电子‑空穴对,实现自供电工作模式。本发明提供的V2O5‑Ga2O3异质结自供电日盲光电探测器探测灵敏度高,响应速度快,其制备方法易于实现及有效,生产成本低,有利于生产和研究推广。
Description
技术领域
本发明涉及一种自供电日盲光电探测器及其制备方法,尤其涉及V2O5-Ga2O3异质结的自供电日盲光电探测器和其制备方法,属于半导体光电子器件领域。
背景技术
光电探测器可以实现光信号到电信号的转变,其本质是电子吸收光子后,从半导体材料的价带跃迁到导带进入电流循环。故光电探测器的信号识别能力由半导体材料的禁带宽度决定。比如,Si的带隙宽度为1.1eV,对应的响应光波段为1120nm左右。当光子能量大于Si的带隙宽度值,即时,该光子可以激励Si材料的基态电子产生跃迁行为。基于半导体材料禁带宽度的不同,近年来不同紫外波段的探测器都逐渐被开发研究。AlN(6.2eV)用于真空紫外光谱(10~200nm)的感应;Ga2O3(4.9eV)用于UVC(200~280nm)波段的响应探测;ZnMgO(3.9eV)用于UVB(280~320nm)波段的响应探测;GaN(3.4eV)用于UVA(320~400nm)波段的响应探测。其中,由于Ga2O3所响应的波段正好覆盖太阳光的日盲波段,故基于Ga2O3制备的光电探测器也称为日盲紫外光电探测器。日盲探测器在紫外光检测、臭氧层空洞监测、火险预警等方面具有广阔的应用前景,近年来成为研究热点。
随着研究的深入和工艺技术的提高,光电探测器已具备高灵敏度、超快响应速度等优点,但需要额外供电工作的缺点依然制约着其进一步的发展。开发自供电模式的光电探测器,是未来节约型社会导向的必然趋势。通过构建异质结界面,产生内建电场,可以在无外部能量供应的情况下,实现电子-空穴对的自动分离,实现自供电工作模式。因此,发展基于Ga2O3异质结的自供电光电探测器,是开拓绿色无能耗日盲探测器的重要一步。
发明内容
针对传统日盲紫外探测器需要额外供电工作的问题,本发明旨在提供一种基于V2O5-Ga2O3异质结的自供电日盲光电探测器及其制备方法。通过Ga2O3和V2O5薄膜的平面异质结构建,实现了日盲紫外探测的自供电工作模式。
为了实现V2O5-Ga2O3异质结探测器的自供电日盲探测效果,本发明一方面提供一种V2O5-Ga2O3异质结自供电日盲光电探测器,包括:V2O5-Ga2O3异质结,该V2O5-Ga2O3异质结由作为n型导电的Ga2O3材料和作为p型导电的V2O5材料形成;与所述Ga2O3材料欧姆接触的第一电极;与所述V2O5材料欧姆接触的第二电极。
根据本发明的优选实施方式,所述Ga2O3材料为薄膜,薄膜厚度为10nm~5μm。
根据本发明的优选实施方式,所述V2O5材料为薄膜,薄膜的厚度为5nm~500nm。
根据本发明的优选实施方式,所述第一电极和第二电极的材料为铝、铜、银、铂、钛、镓、铟和金中的一种或多种组合。
本发明的另一方面还提供一种V2O5-Ga2O3异质结自供电日盲光电探测器的制备方法,包括如下步骤:
在衬底上制备Ga2O3薄膜;
在所述Ga2O3薄膜的部分区域覆盖形成V2O5薄膜,以形成V2O5-Ga2O3平面异质结;
在未覆盖V2O5薄膜的Ga2O3薄膜上,以及V2O5薄膜上,分别形成第一电极和第二电极。
根据本发明的优选实施方式,所述形成V2O5薄膜的步骤包括:
在Ga2O3薄膜的部分区域旋涂三异丙氧基氧化钒溶液;
加热蒸干所述溶液的溶剂,使所述三异丙氧基氧化钒分解获得钒的氧化物;
对所述钒的氧化物进行退火。
根据本发明的优选实施方式,其特征在于,所述三异丙氧基氧化钒溶液的溶剂为甲醇、乙醇、丙醇和异丙醇中的一种或多种组合。
根据本发明的优选实施方式,所述三异丙氧基氧化钒溶液中的溶质与溶剂的体积比为1:2~1:1000。
根据本发明的优选实施方式,所述退火温度为300~700℃。
根据本发明的优选实施方式,所述退火的退火时间为5~200min。
本发明的有益效果在于,通过构建V2O5-Ga2O3平面异质结,提供了一种V2O5-Ga2O3异质结自供电日盲光电探测器及制备方法。所构建的V2O5-Ga2O3异质结具备自供电工作模式。并且本发明提供的V2O5-Ga2O3异质结自供电日盲光电探测器,探测灵敏度高,响应速度快。
附图说明
图1是本发明的V2O5-Ga2O3平面异质结自供电日盲光电探测器结构示意图。
图2是本发明的实施例所制备的在Al2O3衬底上的V2O5-Ga2O3异质结的XRD图谱。
图3显示了本发明的实施例所制备的V2O5-Ga2O3异质结自供电日盲光电探测器在无光和254nm光照下的暗电流和光电流。
图4显示了本发明的实施例所制备的V2O5-Ga2O3异质结自供电日盲光电探测器在0V偏压和1mW/cm2光强的254nm光照下随光开关循环的光响应电流。
图5是本发明的实施例所制备的V2O5-Ga2O3异质结自供电日盲光电探测器在0V偏压下的光谱响应曲线。
具体实施方式
以下实施例用于说明本发明,但不用来限制本发明的范围。
本发明提出的V2O5-Ga2O3异质结自供电日盲光电探测器包括V2O5-Ga2O3异质结,该V2O5-Ga2O3异质结由作为n型导电的Ga2O3材料和作为p型导电的V2O5材料形成。通常,该V2O5-Ga2O3异质结形成于衬底上。本发明所构建的V2O5-Ga2O3异质结,在平面界面处形成内建电场,无需外部电场也可以分离电子-空穴对。电子通过n型导电材料Ga2O3导出,空穴通过p型材料V2O5导出,实现日盲光信号到电信号的转变,从而使基于V2O5-Ga2O3异质结光电探测器具备自供电工作模式。
例如,可以在诸如蓝宝石(Al2O3)的衬底上形成Ga2O3薄膜,在所述Ga2O3薄膜的部分区域上,覆盖形成V2O5薄膜,由此形成V2O5-Ga2O3平面异质结。经发明人理论推算和实验测定,Ga2O3薄膜的厚度在10nm~5μm之间较为合适,更优选为200nm~500nm,而V2O5薄膜的厚度在5nm~500nm之间较为合适,更优选为10nm~50nm。
此外,该自供电日盲光电探测器还包括与所述Ga2O3材料欧姆接触的第一电极;与所述V2O5材料欧姆接触的第二电极。例如,可以在未覆盖V2O5薄膜的Ga2O3薄膜上形成第一电极,以及在V2O5薄膜上形成第二电极。铝、铜、银、铂、钛、镓、铟和金均以为作为单独电极材料,但也不排除其中多种材料的组合,或者上述材料的合金。
在制备上述V2O5-Ga2O3异质结自供电日盲光电探测器时,可以采用合适的方法在Ga2O3材料上形成V2O5材料,使之构成异质结。Ga2O3材料和V2O5材料都优选为形成薄膜,由此可形成平面异质结。Ga2O3薄膜可以通过金属有机物化学气象沉积(MOCVD)、脉冲激光沉积、分子束外延或磁控溅射中的一种或多种组合技术制备,如前所述,可以在诸如蓝宝石(Al2O3)的衬底上形成Ga2O3薄膜。
在形成了Ga2O3薄膜之后,可以在所述Ga2O3薄膜的部分区域覆盖形成V2O5薄膜,这样就形成了V2O5-Ga2O3平面异质结。作为具体实施方式的一种,形成V2O5薄膜的步骤如下:在Ga2O3薄膜的部分区域旋涂三异丙氧基氧化钒溶液,三异丙氧基氧化钒溶液的溶剂为甲醇、乙醇、丙醇和异丙醇中的一种或多种组合,溶液中的溶质与溶剂的体积比优选为1:2~1:1000,更优选为1:20~1:200;所选用的旋涂速度为1000~6000转/分钟,优选为2500~4000转/分钟。
接着,加热蒸干所述溶液的溶剂,使所述三异丙氧基氧化钒分解获得钒的氧化物(VOx);最一对所述钒的氧化物进行退火,形成V2O5-Ga2O3平面异质结。退火气氛为空气、氧气、氩气、氮气中的一种或多种组合,退火温度为300℃~700℃,优选为400℃~600℃,退火时间为5min~200min,优选为30min~90min。
在上述步骤之后,为完成日盲光电探测器的制备,在未覆盖V2O5薄膜的Ga2O3薄膜上和V2O5薄膜上分别形成第一电极和第二电极。电极例如可通过电镀的方式形成。优选的,与Ga2O3材料欧姆接触的第一电极含有铟或钛,与V2O5材料欧姆接触的第二电极含有铟、铝或钛。以下通过一个具体实施例来更加清楚的解释本发明的结构和步骤。需要注意的是,下面的实施例仅仅是举例,本发明可以在上述方法和结构的基础上进行各种可能的实施。
具体实施例
在该实施中,通过金属有机物化学气象沉积(MOCVD)方法,在(0001)取向的蓝宝石(Al2O3)衬底上制备Ga2O3薄膜。镓源为三乙基镓,氧源为氧气,载气为氩气,制备温度为700~900℃,沉积速率为1~3μm/h。所制备的Ga2O3薄膜为β相,薄膜厚度为400nm。为了制备V2O5薄膜,将三异丙氧基氧化钒与异丙醇按照溶剂与溶质体积比为1:50的比率配置前驱体溶液。通过掩膜技术,将Ga2O3薄膜覆盖一半的面积,在未覆盖区域,以3000转/分钟的转速,旋涂三异丙氧基氧化钒与异丙醇的前驱体溶液。将覆盖均匀前驱体的Ga2O3薄膜放置于100℃的热平台,加热10min,蒸干溶剂并使三异丙氧基氧化钒分解,获得钒的氧化物(VOx)。去掉掩膜板,将初步获得的VOx-Ga2O3异质结进行二次退火,退火温度为500℃,退火气氛为空气,升温速度为5℃/min,高温保持时间为60min。退火后,形成V2O5-Ga2O3平面异质结,其XRD图谱如图2所示,Ga2O3为取向的β相薄膜,V2O5为(001)取向。
为了构建V2O5-Ga2O3平面异质结光电探测器,通过掩膜板和磁控溅射技术,在V2O5薄膜和Ga2O3薄膜镀上钛金电极,其中与薄膜接触的金属为钛。所制备的V2O5-Ga2O3光电探测器的结构示意图如图1所示。图1中,01为Al2O3衬底,02为n型Ga2O3薄膜,03为p型V2O5薄膜,04为与Ga2O3材料欧姆接触的第一电极,05为与V2O5材料欧姆接触的第二电极
通过光电探测设备,测试的V2O5-Ga2O3光电探测器的暗电流如图3虚线所示,在-5V的偏压下,暗电流只有0.77pA。在254nm波段的光照下,光照强度1mW/cm2测得的光电流如图3实线所示。在-5V偏压下,光电流高达504nA,其光暗比高达6.55×105,显示了超高的光响应能力。同时,从电流-电压曲线还可以看出,所制备的异质结光电探测器具备自供电工作的能力,其光电流拥有0.3V的开路电压。
为了验证本发明提供的V2O5-Ga2O3光电探测器具备自供电工作能力,在1mW/cm2光强的254nm光照下,使器件在0偏压下工作,测得时间-电流曲线如图4所示。在无外部供电的情况下,所制备的V2O5-Ga2O3光电探测器依然可以对254nm光产生响应,电流高达27nA,说明V2O5-Ga2O3异质结光电探测器是一个自供电器件。
为了说明本发明制备的V2O5-Ga2O3异质结光电探测器是日盲紫外探测器,对器件进行了200~700nm波段的光谱响应测试,得到的光谱响应曲线如图5所示。本发明提供的V2O5-Ga2O3异质结光电探测器的主要响应波段在200~270nm,为日盲紫外区域,说明该探测器为日盲探测器。
根据实施例的实验结果,说明根据本发明制备的V2O5-Ga2O3异质结光电探测器探测灵敏度高,响应速度快,是一种性能优异的自供电日盲光电探测器。
以上所述的具体实施例,对本发明的目的、技术方案和有益效果进行了进一步详细说明,应理解的是,以上所述仅为本发明的具体实施例而已,并不用于限制本发明,凡在本发明的精神和原则之内,所做的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。
Claims (10)
1.一种V2O5-Ga2O3异质结自供电日盲光电探测器,其特征在于,包括:
V2O5-Ga2O3异质结,该V2O5-Ga2O3异质结由作为n型导电的Ga2O3材料和作为p型导电的V2O5材料形成,且该V2O5-Ga2O3异质结是通过VOx-Ga2O3异质结退火形成;
与所述Ga2O3材料欧姆接触的第一电极;
与所述V2O5材料欧姆接触的第二电极。
2.根据权利要求1所述的V2O5-Ga2O3异质结自供电日盲光电探测器,其特征在于,所述Ga2O3材料为薄膜,薄膜厚度为10 nm~5 μm。
3.根据权利要求1所述的V2O5-Ga2O3异质结自供电日盲光电探测器,其特征在于,所述V2O5材料为薄膜,薄膜的厚度为5nm~500 nm。
4.根据权利要求1所述的V2O5-Ga2O3异质结自供电日盲光电探测器,其特征在于,所述第一电极和第二电极的材料为铝、铜、银、铂、钛、镓、铟和金中的一种或多种组合。
5.一种V2O5-Ga2O3异质结自供电日盲光电探测器的制备方法,其特征在于,包括如下步骤:
在衬底上制备Ga2O3薄膜;
在所述Ga2O3薄膜的部分区域覆盖形成VOx薄膜,再退火形成V2O5薄膜,以从VOx-Ga2O3异质结形成V2O5-Ga2O3平面异质结;
在未覆盖V2O5薄膜的Ga2O3薄膜上,以及V2O5薄膜上,分别形成第一电极和第二电极。
6.如权利要求5所述的V2O5-Ga2O3异质结自供电日盲光电探测器的制备方法,其特征在于,所述形成V2O5薄膜的步骤包括:
在Ga2O3薄膜的部分区域旋涂三异丙氧基氧化钒溶液;
加热蒸干所述溶液的溶剂,使所述三异丙氧基氧化钒分解获得钒的氧化物;
对所述钒的氧化物进行退火。
7.如权利要求6所述的V2O5-Ga2O3异质结自供电日盲光电探测器的制备方法,其特征在于,所述三异丙氧基氧化钒溶液的溶剂为甲醇、乙醇、丙醇和异丙醇中的一种或多种组合。
8.如权利要求7所述的V2O5-Ga2O3异质结自供电日盲光电探测器的制备方法,其特征在于,所述三异丙氧基氧化钒溶液中的溶质与溶剂的体积比为1:2~1:1000。
9.根据权利要求6所述的V2O5-Ga2O3异质结自供电日盲光电探测器的制备方法,其特征在于,所述退火的退火温度为300~700 ℃。
10.根据权利要求9所述的V2O5-Ga2O3异质结自供电日盲光电探测器的制备方法,其特征在于,所述退火的退火时间为5~200 min。
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