CN112888952A - 半导体装置、半导体晶片以及电子设备 - Google Patents

半导体装置、半导体晶片以及电子设备 Download PDF

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Publication number
CN112888952A
CN112888952A CN201980067176.XA CN201980067176A CN112888952A CN 112888952 A CN112888952 A CN 112888952A CN 201980067176 A CN201980067176 A CN 201980067176A CN 112888952 A CN112888952 A CN 112888952A
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China
Prior art keywords
transistor
oxide
insulator
conductor
circuit
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Pending
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CN201980067176.XA
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English (en)
Chinese (zh)
Inventor
佐藤绘莉
大贯达也
八洼裕人
国武宽司
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Semiconductor Energy Laboratory Co Ltd
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Semiconductor Energy Laboratory Co Ltd
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Publication of CN112888952A publication Critical patent/CN112888952A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03G—CONTROL OF AMPLIFICATION
    • H03G11/00—Limiting amplitude; Limiting rate of change of amplitude
    • H03G11/02—Limiting amplitude; Limiting rate of change of amplitude by means of diodes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/674—Thin-film transistors [TFT] characterised by the active materials
    • H10D30/6755—Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01—Manufacture or treatment
    • H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
    • H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01—Manufacture or treatment
    • H10D84/02—Manufacture or treatment characterised by using material-based technologies
    • H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
    • H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
    • H10D30/673—Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
    • H10D30/6732—Bottom-gate only TFTs
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
    • H10D30/673—Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
    • H10D30/6733—Multi-gate TFTs
    • H10D30/6734—Multi-gate TFTs having gate electrodes arranged on both top and bottom sides of the channel, e.g. dual-gate TFTs
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/674—Thin-film transistors [TFT] characterised by the active materials
    • H10D30/6741—Group IV materials, e.g. germanium or silicon carbide
    • H10D30/6743—Silicon
    • H10D30/6745—Polycrystalline or microcrystalline silicon
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/674—Thin-film transistors [TFT] characterised by the active materials
    • H10D30/6741—Group IV materials, e.g. germanium or silicon carbide
    • H10D30/6743—Silicon
    • H10D30/6746—Amorphous silicon
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/6757—Thin-film transistors [TFT] characterised by the structure of the channel, e.g. transverse or longitudinal shape or doping profile
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/421—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs having a particular composition, shape or crystalline structure of the active layer
    • H10D86/423—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs having a particular composition, shape or crystalline structure of the active layer comprising semiconductor materials not belonging to the Group IV, e.g. InGaZnO
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Thin Film Transistor (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Amplifiers (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Semiconductor Memories (AREA)
CN201980067176.XA 2018-10-18 2019-10-15 半导体装置、半导体晶片以及电子设备 Pending CN112888952A (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2018196390 2018-10-18
JP2018-196390 2018-10-18
JP2019-011578 2019-01-25
JP2019011578 2019-01-25
PCT/IB2019/058754 WO2020079572A1 (ja) 2018-10-18 2019-10-15 半導体装置、半導体ウェハ、及び電子機器

Publications (1)

Publication Number Publication Date
CN112888952A true CN112888952A (zh) 2021-06-01

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201980067176.XA Pending CN112888952A (zh) 2018-10-18 2019-10-15 半导体装置、半导体晶片以及电子设备

Country Status (6)

Country Link
US (2) US11935961B2 (https=)
JP (3) JP7508370B2 (https=)
KR (1) KR102898778B1 (https=)
CN (1) CN112888952A (https=)
TW (1) TWI835890B (https=)
WO (1) WO2020079572A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113939223A (zh) 2019-06-07 2022-01-14 株式会社半导体能源研究所 复合装置
EP4079469A4 (en) * 2019-12-16 2023-09-13 FingerVision Co., Ltd. GRIPPER, CONTROL METHOD AND PROGRAM
JP2025007857A (ja) * 2023-07-03 2025-01-17 株式会社アドバンテスト 微細流路デバイスおよび微粒子測定システム
US20250386566A1 (en) * 2024-06-17 2025-12-18 Taiwan Semiconductor Manufacturing Company, Ltd. Oxygen scavenging source/drain for integrated device

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CN106508091B (zh) * 2006-08-11 2011-06-01 中国科学院电子学研究所 一种互补金属氧化物半导体可控增益前置放大方法及电路
JP2013040921A (ja) * 2011-07-15 2013-02-28 Semiconductor Energy Lab Co Ltd 光検出装置
CN105659369A (zh) * 2013-10-22 2016-06-08 株式会社半导体能源研究所 半导体装置及半导体装置的制造方法
CN106888006A (zh) * 2017-03-17 2017-06-23 华自科技股份有限公司 信号峰值检测装置

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US4876534A (en) * 1988-02-05 1989-10-24 Synaptics Incorporated Scanning method and apparatus for current signals having large dynamic range
JPH05347515A (ja) * 1992-06-15 1993-12-27 Mitsubishi Electric Corp 光電変換回路および光電変換信号の伸張変換回路
US5442282A (en) * 1992-07-02 1995-08-15 Lsi Logic Corporation Testing and exercising individual, unsingulated dies on a wafer
CN106508091B (zh) * 2006-08-11 2011-06-01 中国科学院电子学研究所 一种互补金属氧化物半导体可控增益前置放大方法及电路
CN101276428A (zh) * 2007-03-30 2008-10-01 株式会社瑞萨科技 半导体集成电路器件
CN101847971A (zh) * 2009-03-25 2010-09-29 恩益禧电子股份有限公司 运算放大器
CN102064692A (zh) * 2009-11-13 2011-05-18 三美电机株式会社 输出电流检测电路以及发送电路
JP2013040921A (ja) * 2011-07-15 2013-02-28 Semiconductor Energy Lab Co Ltd 光検出装置
CN105659369A (zh) * 2013-10-22 2016-06-08 株式会社半导体能源研究所 半导体装置及半导体装置的制造方法
CN106888006A (zh) * 2017-03-17 2017-06-23 华自科技股份有限公司 信号峰值检测装置

Also Published As

Publication number Publication date
US12408383B2 (en) 2025-09-02
KR102898778B1 (ko) 2025-12-10
US11935961B2 (en) 2024-03-19
JP7753458B2 (ja) 2025-10-14
TWI835890B (zh) 2024-03-21
US20240154040A1 (en) 2024-05-09
JP7508370B2 (ja) 2024-07-01
JP2025185023A (ja) 2025-12-18
JP2024125340A (ja) 2024-09-18
US20210384355A1 (en) 2021-12-09
WO2020079572A1 (ja) 2020-04-23
KR20210076105A (ko) 2021-06-23
TW202029456A (zh) 2020-08-01
JPWO2020079572A1 (ja) 2021-12-23

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