CN112880976A - Incident beam angle adjusting device and method for manufacturing reflecting device - Google Patents
Incident beam angle adjusting device and method for manufacturing reflecting device Download PDFInfo
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- CN112880976A CN112880976A CN202110051640.5A CN202110051640A CN112880976A CN 112880976 A CN112880976 A CN 112880976A CN 202110051640 A CN202110051640 A CN 202110051640A CN 112880976 A CN112880976 A CN 112880976A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
Abstract
The invention discloses an incident beam angle adjusting device and a manufacturing method of a reflecting device. According to the technical scheme, the driving assembly drives the reflecting device or the light source to move linearly, so that the incident light beams irradiate on different reflecting surface elements to obtain the reflected light beams with different reflecting angles, the reflected light beams are reflected to the optical system to be tested to detect the field angle of the optical system to be tested, the reflecting device or the light source does not need to be rotated to obtain different reflected light beams, the testing method of the field angle of the optical system to be tested is simplified, and the testing efficiency of the optical system to be tested is improved.
Description
Technical Field
The invention relates to the technical field of optical testing, in particular to an incident beam angle adjusting device and a manufacturing method of a reflecting device.
Background
The field angle can be expressed by FOV, and the size of the field angle determines the field range of the optical instrument, so that the field angle test has significance for the optical instrument.
At present, when an optical system to be tested is subjected to optical testing by using a field angle testing device, the angle of incident light is often required to be adjusted, and under the condition that the optical system to be tested is kept motionless, a light source is required to be rotated to obtain the incident light with different angles.
Disclosure of Invention
The invention mainly aims to provide an incident beam angle adjusting device and a manufacturing method of a reflecting device, and aims to solve the technical problem that the adjusting process of the incident beam angle adjusting device is complex.
In order to achieve the above object, the present invention provides an incident beam angle adjusting device comprising:
a light source for emitting an incident light beam;
the reflecting device is provided with a plurality of normals with different directions on a reflecting surface and is positioned on an illuminating light path of the light source;
the driving component can drive the reflecting device or/and the light source to move linearly in at least one direction.
Optionally, the reflection device includes a plurality of reflection units spliced to each other, and normal directions of the plurality of reflection units are not parallel to each other.
Optionally, an irradiation area of the incident light beam is smaller than a reflection area of the reflection unit.
Optionally, the reflection unit is a metal reflection unit or a multilayer film reflection unit.
Optionally, the light source emits the incident light beam along a first direction, and different normals of a reflecting surface of the reflecting device form a normal array, and the normal array corresponds to the first direction.
Optionally, the drive assembly comprises:
the first driver can drive the reflecting device or the light source to move in a second direction;
and the second driver can drive the reflecting device or the light source to move in a third direction, and the third direction is perpendicular to the second direction.
Optionally, the light source emits the incident light beam in a fourth direction, the fourth direction being perpendicular to the second and third directions, respectively.
Optionally, the incident light beam angle adjusting device further includes:
the graduated scale is arranged along the moving direction of the reflecting device or/and the light source, and a digital mark is arranged on the graduated scale and corresponds to the reflecting angle of the incident beam on the reflecting device.
The invention also provides a manufacturing method of the reflecting device, which comprises the following steps:
acquiring a linear equation of an incident beam;
acquiring a linear equation of a reflected light beam formed after the incident light beam is reflected on the reflecting unit;
determining a normal equation of the reflection unit according to the linear equation of the incident light beam and the linear equation of the reflected light beam;
determining the normal direction of the reflection unit according to the normal equation;
and splicing the plurality of reflection units with different normal directions into a reflection device.
Optionally, the step of obtaining a linear equation of a reflected light beam formed after the incident light beam is reflected on the reflection unit includes:
acquiring reflection position information of the incident beam on the reflection unit;
acquiring the distance between the reflection position of the reflection unit and the optical system to be measured;
determining the projection position information of the reflected light beam on the optical system to be measured according to the distance;
and determining a linear equation of the reflected light beam according to the projection position information and the reflection position information.
The light source is used for emitting incident beams, and the field angle of the optical system to be detected is determined through the reflected beams of the incident beams in the optical system to be detected; the reflecting surface of the reflecting device is provided with a plurality of normals with different directions, the reflecting device is positioned on the illuminating light path of the light source, for the reflecting surface of the reflecting device, the area corresponding to each normal line with different directions can be regarded as one reflecting surface element, so that the reflecting surface of the reflecting device can be regarded as a combination of several reflecting surface elements, under the condition that the incident direction of the incident beam is not changed, the reflecting device or the light source is driven by the driving component to move linearly, so that the incident beam irradiates on different reflecting surface elements, thereby obtaining reflected beams with different reflection angles, reflecting the reflected beams to the optical system to be detected so as to detect the field angle of the optical system to be detected, the reflecting device or the light source does not need to be rotated to obtain different reflected light beams, so that the method for testing the field angle of the optical system to be tested is simplified, and the testing efficiency of the optical system to be tested is improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.
Fig. 1 is a schematic structural diagram of an incident beam angle adjusting apparatus according to an embodiment of the present invention.
The reference numbers illustrate:
| reference numerals | Name (R) | Reference numerals | Name (R) |
| 1 | |
2 | |
| 3 | |
31 | |
| 32 | |
4 | Optical system to be tested |
The implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that, if directional indications (such as up, down, left, right, front, and back … …) are involved in the embodiment of the present invention, the directional indications are only used to explain the relative positional relationship between the components, the movement situation, and the like in a specific posture (as shown in the drawing), and if the specific posture is changed, the directional indications are changed accordingly.
In addition, if there is a description of "first", "second", etc. in an embodiment of the present invention, the description of "first", "second", etc. is for descriptive purposes only and is not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present invention.
The invention provides an incident beam angle adjusting device, which is used for testing the field angle of an optical system to be tested by adjusting the angle of an incident beam.
In the embodiment of the present invention, as shown in fig. 1, the incident light beam angle adjusting apparatus includes a light source 1, a reflective device 2 and a driving component 3, the light source 1 is configured to emit an incident light beam, a reflective surface of the reflective device 2 has a plurality of normal lines with different directions, the reflective device 2 is located on an illumination light path of the light source 1, and the driving component 3 can drive the reflective device 2 or/and the light source 1 to move linearly in at least one direction;
the scheme that the driving component 3 drives the reflecting device 2 or/and the light source 1 to move comprises the following steps:
the driving component 3 drives the reflecting device 2 to move linearly in at least one direction; or
The driving component 3 drives the light source 1 to move linearly in at least one direction; or
The driving assembly 3 drives the reflecting device 2 and the light source 1 to move linearly in at least one direction.
The light source 1 of the technical scheme of the invention is used for emitting an incident beam, and determining the field angle of the optical system 4 to be detected through the reflected beam of the incident beam on the optical system 4 to be detected; the reflection surface of the reflection device 2 has a plurality of normals with different directions, the reflection device 2 is located on the light path irradiated by the light source 1, for the reflection surface of the reflection device 2, the area corresponding to the normal with different directions can be regarded as a reflection surface element, therefore, the reflection surface of the reflection device 2 can be regarded as a combination of a plurality of reflection surface elements, under the condition that the incident direction of the incident light beam is not changed, the reflection device 2 or the light source 1 is driven by the driving component 3 to move linearly, so that the incident light beam is irradiated on different reflection surface elements, thereby obtaining reflected light beams with different reflection angles, and the reflected light beams are reflected to the optical system to be tested 4 to detect the angle of view of the optical system to be tested 4, and the reflection device 2 or the light source 1 does not need to be rotated to obtain different reflected beams, thereby simplifying the method for testing the angle of view of, the test efficiency of the optical system 4 to be tested is improved.
In an embodiment, the reflection device 2 includes a plurality of reflection units spliced with each other, normal directions of the plurality of reflection units are not parallel to each other, so that an angle of a reflected beam obtained after each reflection unit reflects an incident beam is obtained by calculating the normal direction of each reflection unit, then the reflection device 2 and the light source 1 move linearly relative to each other, so that different reflection units reflect the incident beam, the size of the angle of the reflected beam is adjusted, the test of the optical system 4 to be tested is simplified, and each reflection unit is equivalent to a plane mirror, so as to improve the precision of testing the angle of view of the optical system 4 to be tested; because each reflection unit only has one normal direction, the normal direction of the whole reflection device 2 is conveniently obtained by calculating the normal direction of the reflection unit, so that the angle of a reflected beam obtained by each reflection unit after the incident beam is reflected is obtained, the corresponding reflection unit reflects the incident beam, and the test efficiency is improved.
In an alternative embodiment, the reflective surface of the reflective device 2 is a smooth surface, the normal direction of which varies continuously.
In an embodiment, the irradiation area of the incident beam is smaller than the reflection area of the reflection unit, so that the incident beam can be irradiated on the same reflection unit, and the incident beam is reflected by the reflection unit, thereby preventing the incident beam from irradiating on two or more reflection units and affecting the test of the field angle of the optical system 4 to be tested.
In an alternative embodiment, the shape of the reflecting unit is a regular hexagon, a diamond or a triangle.
In an embodiment, the reflection unit is a metal reflection unit or a multilayer film reflection unit, and the reflection unit with a corresponding structure can be selected according to actual requirements, so as to reduce the manufacturing cost of the reflection device 2 or improve the test effect of the optical system 4 to be tested.
In an embodiment, the light source 1 emits an incident light beam along a first direction, different normals of the reflection surfaces of the reflection device 2 form a normal array, the normal array corresponds to the first direction, because the incident light beams in different directions have different incident angles in the reflection areas corresponding to the same normal of the reflection device 2, and the reflection angles of the obtained reflected light beams are different, therefore, in each change of the first direction, the normal direction of each reflection part of the reflection device 2 needs to be recalculated once to obtain the angle of the reflected light beam corresponding to each reflection part, relative to the optical system 4 to be measured, the reflected light beam is the coupled light beam of the optical system 4 to be measured, and the normal array corresponds to the first direction, that is, the reflection device 2 corresponds to the first direction, it is not necessary to calculate the angle of the reflected light beam obtained after the incident light beam of the reflection device 2 before the test, the testing process of the field angle of the optical system 4 to be tested can be simplified, and the testing efficiency is improved.
In an embodiment, the driving assembly 3 includes a first driver 31 and a second driver 32, the first driver 31 can drive the reflection device 2 or the light source 1 to move in the second direction, the second driver 32 can drive the reflection device 2 or the light source 1 to move in the third direction, and the third direction is perpendicular to the second direction, so that only by relatively moving the reflection device 2 and the light source 1 in the second direction and the third direction, the reflection area corresponding to the normal of the reflection device 2 can be moved to the light path of the incident beam, so as to reflect the incident beam through the reflection area corresponding to the normal of the reflection device 2, and obtain a reflected beam with a known angle, for the optical system 4 to be measured, the reflected beam is the coupled beam thereof, which facilitates adjusting the coupled-in angle of the coupled-in beam, and simplifies the test process of the optical system 4 to be measured; meanwhile, the third direction is perpendicular to the second direction, so that the arrangement of the first driver 31 and the second driver 32 is convenient, and the structure of the driving assembly 3 is simplified.
In an alternative embodiment, the driving assembly 3 may drive the reflection device 2 or the light source 1 to move linearly only along one direction, and the reflection surface of the reflection device 2 is disposed along the direction, i.e., the reflection device can be used as a reflector through different regions corresponding to different normals of the reflection device 2.
It will be appreciated that the reflector 2 and the light source 1 are linearly movable relative to each other in two directions, which reduces the requirements on the reflector 2 and optimizes the shape of the reflector 2.
In an embodiment, the light source 1 emits the incident light beam along a fourth direction, and the fourth direction is perpendicular to the second direction and the third direction, respectively, so that the distribution positions of the light source 1, the first driver 31, the second driver 32 and the reflective device 2 are more reasonable, and the volume of the angle adjusting device of the incident light beam is reduced.
In an alternative embodiment, as shown in FIG. 1, the second direction is parallel to the direction of the X-axis, the third direction is parallel to the direction of the Z-axis, and the fourth direction is parallel to the direction of the Y-axis.
In an embodiment, the incident light beam angle adjusting device further includes a scale, the scale is arranged along the moving direction of the reflection device 2 or/and the light source 1, a digital mark is arranged on the scale, the digital mark corresponds to the reflection angle of the incident light beam on the reflection device 2, so that a user can drive the reflection device 2 or/and the light source 1 to move to a corresponding numerical mark position by controlling the driving component 3, and a corresponding reflection angle is obtained according to the digital mark, thereby simplifying a test method for testing the field angle of the optical system 4 to be tested, and improving the test efficiency.
In one embodiment, the scale is further provided with a scale, the number mark corresponds to the scale, the scale corresponds to the reflection angle of the incident light beam on the reflection device 2, wherein, the number marks are numerical values, such as 30 degrees, 45 degrees, 3mm, 5mm and the like, so that a tester can visually obtain corresponding angles or displacement amounts and the like, the scales are grooves, bulges, color marks and the like arranged on the graduated scale so as to divide the graduated scale into a plurality of parts through the scales, and the numerical identification corresponds to a scale, which corresponds to a reflection angle of the incident light beam on the reflection device 2, the digital mark corresponds to the reflection angle of the incident beam on the reflection device 2, the reflection device 2 or the light source 1 can be directly moved by a corresponding number of scales, the field angle of the optical device to be measured can be directly measured, the field angle of the optical system 4 to be measured can be obtained more intuitively, and the test of the field angle of the optical system 4 to be measured is simplified.
In an alternative embodiment, as shown in fig. 1, a scale is provided along the X-axis and Z-axis directions to clarify the displacement amounts of the light source 1 and the reflective device 2.
In an embodiment, the reflective device 2 is a spatial light modulator, and the reflective beams with different reflection angles are obtained by the spatial light modulator and are used as the coupled light beams to irradiate on the optical system 4 to be tested, so as to simplify the test of the field angle of the optical system 4 to be tested.
In an embodiment, the light source 1 is an ultra-wideband light source 1 or a broadband light source 1, and the selection of the light source 1 is determined by the operating band of the optical system 4 to be tested.
The invention also provides a manufacturing method of the reflecting device, which comprises the following steps:
s1: acquiring a linear equation of an incident beam;
s2: acquiring a linear equation of a reflected light beam formed after the incident light beam is reflected on the reflecting unit;
s3: determining a normal equation of the reflection unit according to a linear equation of the incident beam and a linear equation of the reflected beam;
s4: determining the normal direction of the reflecting unit according to a normal equation;
s5: a plurality of reflection units different in normal direction are spliced into the reflection device 2.
As shown in fig. 1, a rectangular coordinate system is established first, two coordinate points are selected on the path of an incident beam, and a linear equation of the incident beam can be directly obtained through coordinates of the two coordinate points; for convenience of calculation, a rectangular coordinate system is established by taking the plane of the incident light beam as an XOY plane and taking the straight line of the incident light beam as a Y axis, so that a straight line equation of the incident light beam is obtained.
Similarly, a linear equation of the reflected light beam is obtained by using two coordinate points, so that a normal equation of the reflection unit can be obtained according to the linear equation of the incident light beam and the linear equation of the reflected light beam, the normal direction of the reflection unit can be determined according to the normal equation of the reflection unit, so that the inclination angle of the reflection unit in the XOY plane is obtained, and a plurality of reflection units with different normal directions are spliced together to form the reflection device 2, so that the reflection device 2 is applied to the angle adjusting device of the incident light beam and used for testing the field angle of the optical system 4 to be tested.
In one embodiment, step S2 includes the following steps:
s21: acquiring reflection position information of an incident beam on a reflection unit;
s22: acquiring the distance between the reflection position of the reflection unit and the optical system 4 to be measured;
s23: determining the projection position information of the reflected light beam on the optical system 4 to be measured according to the distance;
s24: and determining a linear equation of the reflected light beam according to the projection position information and the reflection position information.
After the incident beam irradiates the reflection unit, a reflected beam is obtained through reflection of the reflection unit, the reflected beam is finally projected on the system to be tested 4, a projection position of the reflected beam is obtained, the height of the projection position on an XOY plane is the distance between the reflection position of the reflection unit and the optical system to be tested 4, the projection position and the reflection position are equal in value, the projection position can be selected on a Z axis for convenient calculation, therefore, a coordinate of the projection position can be obtained, the coordinate corresponds to projection position information, similarly, the coordinate of the reflection position can also be obtained, the coordinate of the reflection position corresponds to the reflection position information, and a linear equation of the reflected beam can be obtained through the coordinate of the reflection position and the coordinate of the projection position.
It will be appreciated that the reflection positions described above lie in the XOY plane, and for reflection units that are not in the XOY plane, they may be projected in the XOY plane to determine the reflection positions.
As shown in fig. 1, the calculation of the normal to the reflecting device 2 will now be explained in detail:
an incident beam is emitted to the reflecting device 2 in the XOY plane along the YO direction, is reflected by the reflecting device 2 and is irradiated on the optical system 4 to be measured, wherein the linear equation of the incident beam is that x is equal to x1(z is 0), for convenience of calculation, the direction vector thereof is (0, 1, 0), the reflection point of the reflection device 2 (i.e., the point on the reflection device 2 irradiated with the incident beam) is the point O ', and the coordinate of O' is (x)1，y10), the distance between the optical system 4 to be measured and the XOY plane is H, the coupling point of the reflected beam on the optical system 4 to be measured (i.e. the irradiation point of the reflected beam on the optical system 4 to be measured) is H, the coordinates of H are set to (0, 0, H), and then the equation of the line of the coupled-in beam (i.e. the equation of the line O' H) is H
The direction vector is (-x)1，-y1H) from which the normal equation of the reflecting device 2 at point O' can be calculated from the equation of the line of the incident light beam, the equation of the line of the coupled-in light beam and the corresponding direction vector
x1y1E (0, r), wherein r is the radius of the projection range of the angle of view of the optical system 4 to be measured in the XOY plane. When calculating the normal of the reflection unit, the reflection point of the reflection unit may be projected in the XOY plane to obtain the O' point, and then the calculation is performed.
The projection of the O' point on the X axis and the Y axis forms an included angle theta with the vertical directionxAnd thetayThe relationship between the scale on the scale and the angle transformation is x ═ h · tan θx，z＝h·tanθyWhere X is the displacement of the light source 1 on the X axis, and Z is the displacement of the reflective device 2 on the Z axis.
The above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention, and all modifications and equivalents of the present invention, which are made by the contents of the present specification and the accompanying drawings, or directly/indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (10)
1. An angle adjustment device for an incident light beam, comprising:
a light source for emitting an incident light beam;
the reflecting device is provided with a plurality of normals with different directions on a reflecting surface and is positioned on an illuminating light path of the light source;
the driving component can drive the reflecting device or/and the light source to move linearly in at least one direction.
2. The apparatus for angle adjustment of an incident light beam according to claim 1, wherein the reflecting device comprises a plurality of reflecting units spliced to each other, and normal directions of the plurality of reflecting units are not parallel to each other.
3. The incident light beam angle adjusting device of claim 2, wherein the incident light beam has an irradiation area smaller than a reflection area of the reflection unit.
4. The apparatus for adjusting an angle of an incident light beam according to claim 2, wherein the reflecting unit is a metal reflecting unit or a multilayer film reflecting unit.
5. The apparatus for angle adjustment of an incident light beam according to claim 1, wherein the light source emits the incident light beam in a first direction, and different normals of the reflecting surface of the reflecting device form a normal array, the normal array corresponding to the first direction.
6. The apparatus for angularly adjusting an incident light beam of claim 1, wherein the driving assembly comprises:
the first driver can drive the reflecting device or the light source to move in a second direction;
and the second driver can drive the reflecting device or the light source to move in a third direction, and the third direction is perpendicular to the second direction.
7. The apparatus for angularly adjusting an incident light beam of claim 6, wherein said light source emits said incident light beam in a fourth direction, said fourth direction being perpendicular to said second direction and said third direction, respectively.
8. The incident light beam angle adjustment apparatus of claim 1, wherein the incident light beam angle adjustment apparatus further comprises:
the graduated scale is arranged along the moving direction of the reflecting device or/and the light source, and a digital mark is arranged on the graduated scale and corresponds to the reflecting angle of the incident beam on the reflecting device.
9. A method of manufacturing a reflective device, comprising the steps of:
acquiring a linear equation of an incident beam;
acquiring a linear equation of a reflected light beam formed after the incident light beam is reflected on the reflecting unit;
determining a normal equation of the reflection unit according to the linear equation of the incident light beam and the linear equation of the reflected light beam;
determining the normal direction of the reflection unit according to the normal equation;
and splicing the plurality of reflection units with different normal directions into a reflection device.
10. The method of manufacturing a reflective device according to claim 9, wherein the step of obtaining a linear equation of a reflected beam formed after the incident light beam is reflected on the reflecting unit includes:
acquiring reflection position information of the incident beam on the reflection unit;
acquiring the distance between the reflection position of the reflection unit and the optical system to be measured;
determining the projection position information of the reflected light beam on the optical system to be measured according to the distance;
and determining a linear equation of the reflected light beam according to the projection position information and the reflection position information.
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