CN112781748B - Testing device for surface temperature of PTC thermistor - Google Patents
Testing device for surface temperature of PTC thermistor Download PDFInfo
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- CN112781748B CN112781748B CN202011533718.9A CN202011533718A CN112781748B CN 112781748 B CN112781748 B CN 112781748B CN 202011533718 A CN202011533718 A CN 202011533718A CN 112781748 B CN112781748 B CN 112781748B
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- 238000012360 testing method Methods 0.000 title claims abstract description 104
- 239000000523 sample Substances 0.000 claims abstract description 65
- 238000009529 body temperature measurement Methods 0.000 claims abstract description 18
- 238000001514 detection method Methods 0.000 claims description 3
- 239000011810 insulating material Substances 0.000 claims description 2
- 230000009286 beneficial effect Effects 0.000 description 22
- 238000010438 heat treatment Methods 0.000 description 6
- 239000012774 insulation material Substances 0.000 description 5
- 238000005259 measurement Methods 0.000 description 4
- 230000000903 blocking effect Effects 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 2
- 238000005485 electric heating Methods 0.000 description 2
- 230000017525 heat dissipation Effects 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000009466 transformation Effects 0.000 description 2
- 239000002390 adhesive tape Substances 0.000 description 1
- 238000004378 air conditioning Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000000295 fuel oil Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000010257 thawing Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
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Abstract
The invention discloses a testing device for the surface temperature of a PTC thermistor, which comprises: the device comprises a test platform, a support frame, a fixture clamp and an infrared temperature measuring probe; the test platform is used for bearing the fixed support frame, the tool clamp and the infrared temperature measuring probe; the support frame can rotate along the circumferential direction of the support center of the support frame and is used for supporting the infrared temperature measuring probe; the tool clamp is arranged on the upper surface of the test platform and used for clamping the PTC thermistor and driving the PTC thermistor to move; the infrared temperature measuring probe is used for testing the surface temperature of the PTC thermistor. On one hand, the invention uses the infrared temperature measurement principle to carry out non-contact temperature measurement on the surface of the PTC thermistor, thereby avoiding heat conduction loss caused by traditional contact test, and avoiding potential danger caused by electrification of a test probe and damage to a temperature display instrument.
Description
Technical Field
The invention relates to the technical field of thermistor temperature testing, in particular to a testing device for PTC thermistor surface temperature.
Background
PTC heater products have been widely used for heating in home appliances because of their special positive temperature coefficient characteristics, such as air conditioning auxiliary heating, warm air blower, bathroom heater, etc.; the traditional fuel oil automobile has the advantages of defrosting, heating in the automobile, battery heat management and the like, and the application range of the PTC heater is continuously expanded in the field of high-power heating.
The PTC heater adopts PTC thermistor ceramic as a core heating element, and has the advantages of automatic temperature control, wide application voltage range, no open fire, safety, reliability, long service life and the like compared with the traditional electric heating wire, an electric heating tube and a far infrared quartz heater. The temperature value of the surface temperature of the PTC thermistor in the energized state is one of important performance indexes of the PTC heater, which directly relates to the heating rate and the service life of the PTC heater, and thus the reliability of the result of the temperature test of the surface of the PTC thermistor is widely paid attention to.
At present, the production or use unit of the PTC thermistor ceramic generally adopts the following modes for testing the surface temperature of the PTC thermistor: ① A K-type thermocouple probe; ② A thermocouple wire; ③ And (5) infrared testing. All of the above methods have the unavoidable disadvantage of causing inaccurate temperature testing.
For example, the surface of the PTC thermistor is directly contacted with the test of a K-type thermocouple probe, so that on one hand, the electrified operation has obvious danger; on the other hand, the probe is made of metal, the heat transfer is quite good, the heat after the PTC thermistor is electrified is easily conducted out, the temperature test deviation is large, and the data repeatability is poor; for small-sized samples, this approach is not tested.
For another example, a thermocouple wire is used. The method is to paste a thin thermocouple wire on the surface of the PTC by using a high-temperature adhesive tape for testing, and the risk of electrified operation exists; in addition, the thermocouple wire has raised head and may not contact with PTC closely, so that the test has great error and poor repeatability.
The infrared thermometer is a non-contact test method, but whether the infrared thermometer is focused or not has great influence on temperature display.
Therefore, a testing device with simple structure, convenient adjustment, safety, high efficiency and stable and reliable testing result is needed in the technical field.
Disclosure of Invention
In order to solve the technical problems, the invention provides the testing device which is simple in structure, convenient to operate, safe, efficient and stable and reliable in testing result.
In order to achieve the above object, the technical scheme of the present invention is as follows:
A test device for PTC thermistor surface temperature, comprising: the device comprises a test platform, a support frame, a fixture clamp and an infrared temperature measuring probe; the testing platform is arranged at the bottom and used for bearing and fixing the supporting frame, the fixture and the infrared temperature measuring probe, and provides a platform for testing the operating temperature for the PTC thermistor; the support frame is arranged on the upper surface of the test platform, can rotate along the circumferential direction of the support center of the support frame and is used for supporting the infrared temperature measurement probe; the fixture is arranged on the upper surface of the test platform and used for clamping the PTC thermistor, and comprises a clamping part and a moving part, wherein the clamping part moves along the direction parallel to the test platform or along the direction perpendicular to the test platform or along the direction parallel to the test platform and the direction perpendicular to the test platform through the moving part; the infrared temperature measuring probe is connected to the supporting frame and used for testing the surface temperature of the PTC thermistor.
The beneficial effects of adopting above-mentioned technical scheme are: the problems of high danger coefficient of electrified operation and inaccurate measurement result of accelerated heat conduction in contact measurement of the surface temperature measurement of the PTC thermistor in the prior art are fully considered, on one hand, the non-contact temperature measurement is carried out on the surface of the PTC thermistor by utilizing the infrared temperature measurement principle, so that heat conduction loss caused by the traditional contact test can be avoided, and potential danger caused by electrification of a test probe and damage to a temperature display instrument can be avoided; on the other hand, in order to strengthen the convenience that infrared temperature measurement focused, but introduce circumferential direction rotatory support frame and movable frock clamp in testing arrangement, through support frame and frock clamp's cooperation transformation position in order to adjust focusing, and be convenient for measure PTC thermistor's different positions to reach accurate infrared focusing, and realize the multiple spot test.
As a further improvement of the technical scheme of the invention, the moving part comprises an X-axis platform, a Y-axis platform, a support column and a Z-axis platform; the X-axis platform is in sliding connection with the test platform, the Y-axis platform is arranged on the upper surface of the X-axis platform and is in sliding connection with the X-axis platform, and the sliding direction of the Y-axis platform is perpendicular to the sliding direction of the X-axis platform; the support column is a rotary support column, and the Z-axis platform is in rotary connection with the Y-axis platform through the rotary support column.
The beneficial effects of adopting above-mentioned technical scheme are: the cooperation setting of X axle platform, Y axle platform and Z axle platform for the removal portion can realize two-dimensional plane and remove, satisfies the position adjustment demand of clamping part on the horizontal direction, and the rotatable setting of Z axle platform satisfies the adjustment demand of waiting to detect PTC thermistor in the clamping part for infrared temperature measurement probe's relative angle. In addition, a multi-point test may also be performed.
As a still further improvement of the technical scheme of the invention, the clamping part comprises an inclined support plate, a clamping plate, an elastic connecting piece, an upper measuring needle and a lower measuring needle, wherein the inclined support plate is fixedly connected with the Z-axis platform, and the clamping plate is rotatably connected with the inclined support plate through the elastic connecting piece and forms a clamping space with the inclined support plate; the upper measuring needle is arranged on the clamping plate and is communicated with the negative electrode of the power supply; the lower measuring pin and the upper measuring pin are correspondingly arranged on the inclined supporting plate and are communicated with the positive electrode of the power supply.
The beneficial effects of adopting above-mentioned technical scheme are: the setting of the diagonal brace plate in the clamping part can carry out temperature test on the upper surface of the PTC thermistor, and the PTC thermistor is driven to rotate along the horizontal direction by rotating the Z-axis platform, so that the relative angle between the PTC thermistor and the infrared temperature measuring probe is adjusted, and the temperature test on the side surface of the PTC thermistor is realized. In addition, the arrangement of the inclined supporting plate is convenient for taking and placing the PTC thermistor.
As a further improvement of the technical scheme of the invention, the inclined supporting plate and the Z-axis platform form an included angle of 45 degrees, and the irradiation direction of the infrared temperature measurement probe and the included angle of the Z-axis platform are 45 degrees.
The beneficial effects of adopting above-mentioned technical scheme are: the included angle between the inclined supporting plate and the Z-axis platform is set to be 45 degrees, and meanwhile, the irradiation direction of the infrared temperature measuring probe is also 45 degrees obliquely downwards, so that the temperature of the surface or the side surface of the PTC can be tested after the same fixture rotates 180 degrees, the infrared rays can be vertical to the sample testing surface no matter the side edge or the sample surface is tested, and the accuracy of temperature testing is improved; in addition, the test fixture and the infrared probe are placed in a 45-degree angle mode, and the temperature measuring probe is arranged above the side of the test sample, so that the damage of high-temperature conduction to the probe can be avoided.
As a still further improvement of the technical scheme of the invention, the clamping part further comprises a limiting stop bar, and the limiting stop bar is positioned between the clamping plate and the inclined strut plate and used for limiting the clamping position of the PTC thermistor.
The beneficial effects of adopting above-mentioned technical scheme are: the arrangement of the limiting stop bars is beneficial to keeping the uniformity of the clamping positions of the PTC thermistors, the operation is convenient and quick, the time for positioning the positions is greatly reduced, and the clamping and replacing efficiency is remarkably improved.
As a further improvement of the technical scheme of the invention, the clamping part further comprises a height limiting column which is arranged on the surface of the clamping plate facing the limiting blocking strip or on the surface of the limiting blocking strip facing the clamping plate, and when the height limiting column is propped against the limiting blocking strip or the clamping plate, the nearest distance between the upper measuring pin and the lower measuring pin is not smaller than a preset positive and negative electrode safety distance.
The beneficial effects of adopting above-mentioned technical scheme are: the height limiting column is arranged, so that the safety distance between the upper measuring needle and the lower measuring needle can be kept under the condition that the PTC thermistor to be detected is not arranged, and the safety distance can prevent short circuit from occurring when a sample is empty.
As a further improvement of the technical scheme of the invention, the clamping plate and the inclined strut plate are respectively provided with a plurality of bulges on the surface contacted with the PTC thermistor, and the bulges are made of heat insulation materials.
The beneficial effects of adopting above-mentioned technical scheme are: firstly, the arrangement of a plurality of bulges changes the surface contact between the PTC thermistor and the clamping plate and between the PTC thermistor and the inclined strut plate into point contact, so that the contact area between the surface of the PTC thermistor and the clamping part is greatly reduced, the influence of PTC heat dissipation on the testing accuracy of the surface temperature can be effectively avoided, and the repeatability of the testing data is good; on the other hand, the bulge adopts the heat insulation material, and the heat insulation performance of the heat insulation material is fully utilized, so that the heat on the surface of the PTC thermistor is further prevented from being dissipated through the conduction of the bulge, and the testing precision of the surface temperature is further improved.
As a further improvement of the technical scheme of the invention, the clamping part further comprises an insulating sleeve, and the insulating sleeve is sleeved on the outer surfaces of the upper measuring needle and the lower measuring needle.
The beneficial effects of adopting above-mentioned technical scheme are: the arrangement of the insulating sleeve can effectively prevent potential safety hazards caused by electric leakage.
As a further improvement of the technical scheme of the invention, the infrared temperature measurement probe is provided with a probe motor, a focusing detector and a control module, wherein the probe motor and the focusing detector are respectively communicated with the control module, and the control module sends a driving instruction to the probe motor according to a detection signal received from the focusing detector.
The beneficial effects of adopting above-mentioned technical scheme are: the probe motor, the focusing detector and the control module are introduced, so that the surface to be tested of the PTC thermistor can be automatically controlled to focus, on one hand, the workload of manual focusing is reduced, the stability and reliability of focusing are improved, and the test requirements of samples and special-shaped samples with test sizes more than 1.5mm can be met.
As a further improvement of the technical scheme of the invention, the moving part further comprises an X-axis adjusting knob, a Y-axis adjusting knob and a Z-axis adjusting knob, wherein the X-axis adjusting knob adjusts the relative position of the X-axis platform and the testing platform through clockwise and anticlockwise rotation, the Y-axis adjusting knob adjusts the relative position of the Y-axis platform and the X-axis platform through clockwise and anticlockwise rotation, and the Z-axis adjusting knob adjusts the rotation angle of the Z-axis platform through clockwise and anticlockwise rotation.
The beneficial effects of adopting above-mentioned technical scheme are: through introducing X axle adjust knob, Y axle adjust knob and Z axle adjust knob pair, convenient operation, and effectively improved position adjustment precision.
Drawings
In order to more clearly illustrate the embodiments of the invention or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, it being obvious that the drawings in the following description are only some embodiments of the invention, and that other drawings may be obtained from these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic perspective view of a testing device of the present invention;
FIG. 2 is an enlarged schematic view of a portion of the portion I in FIG. 1;
FIG. 3 is a schematic cross-sectional view of a clamping portion of the testing device of the present invention;
FIG. 4 is a schematic diagram of an infrared temperature probe of the testing device of the present invention;
the corresponding component names indicated by the numerals in the figures are as follows:
PTC thermistor 01; a test platform 1; a support frame 2; a tool clamp 3; a clamping portion 31; the inclined support plate 311; a clamping plate 312; an elastic connection member 313; an upper stylus 314; a lower stylus 315; a limit stop bar 316; height limiting posts 317; a protrusion 318; an insulating sleeve 319; a moving part 32; an X-axis stage 321; a Y-axis platform 322; a support column 323; z-axis stage 324; an X-axis adjustment knob 325; a Y-axis adjustment knob 326; a Z-axis adjustment knob 327; an infrared temperature measurement probe 4; a probe motor 41; a focus detector 42; a control module 43.
Detailed Description
The present invention will be described more fully hereinafter with reference to the accompanying drawings, in which preferred embodiments are shown, for the purpose of illustrating the invention, but the scope of the invention is not limited to the specific embodiments shown. It should be noted that, without conflict, the embodiments of the present invention and features of the embodiments may be combined with each other.
In order to achieve the purpose of the invention, the technical scheme provided by the invention is as follows:
In some embodiments of the present invention, as shown in fig. 1, a test device for PTC thermistor surface temperature is disclosed, comprising: the device comprises a test platform 1, a support frame 2, a fixture clamp 3 and an infrared temperature measuring probe 4; the testing platform 1 is arranged at the bottom and used for bearing the fixed support frame 2, the fixture clamp 3 and the infrared temperature measuring probe 4, and provides a platform for testing the operating temperature for the PTC thermistor 01; the support frame 2 is arranged on the upper surface of the test platform 1, can rotate along the circumferential direction of the support center of the support frame 2 and is used for supporting the infrared temperature measuring probe 4; the fixture 3 is arranged on the upper surface of the test platform 1 and used for clamping the PTC thermistor 01, and the fixture 3 comprises a clamping part 31 and a moving part 32, wherein the clamping part 31 moves along the direction parallel to the test platform 1 or along the direction vertical to the test platform 1 or along the direction parallel to the test platform 1 and the direction vertical to the test platform 1 through the moving part 32; the infrared temperature measuring probe 4 is connected to the supporting frame 2 and used for testing the surface temperature of the PTC thermistor 01.
The beneficial effects of adopting above-mentioned technical scheme are: the problems of high danger coefficient of electrified operation and inaccurate measurement result of accelerated heat conduction in contact measurement of the surface temperature measurement of the PTC thermistor in the prior art are fully considered, on one hand, the non-contact temperature measurement is carried out on the surface of the PTC thermistor by utilizing the infrared temperature measurement principle, so that heat conduction loss caused by the traditional contact test can be avoided, and potential danger caused by electrification of a test probe and damage to a temperature display instrument can be avoided; on the other hand, in order to strengthen the convenience that infrared temperature measurement focused, but introduce circumferential direction rotatory support frame and movable frock clamp in testing arrangement, through support frame and frock clamp's cooperation transformation position in order to adjust focusing, and be convenient for measure PTC thermistor's different positions to reach accurate infrared focusing, and realize the multiple spot test.
In other embodiments of the present invention, as shown in fig. 1, the moving part 32 includes an X-axis stage 321, a Y-axis stage 322, a strut 323, and a Z-axis stage 324; the X-axis platform 321 is in sliding connection with the test platform 1, the Y-axis platform 322 is arranged on the upper surface of the X-axis platform 321 and is in sliding connection with the X-axis platform 321, and the sliding direction of the Y-axis platform 322 is perpendicular to the sliding direction of the X-axis platform 321; the support 323 is a rotating support, and the Z-axis stage 324 is rotatably connected to the Y-axis stage 322 via the rotating support.
The beneficial effects of adopting above-mentioned technical scheme are: the cooperation setting of X axle platform, Y axle platform and Z axle platform for the removal portion can realize two-dimensional plane and remove, satisfies the position adjustment demand of clamping part on the horizontal direction, and the rotatable setting of Z axle platform satisfies the adjustment demand of waiting to detect PTC thermistor in the clamping part for infrared temperature measurement probe's relative angle. In addition, a multi-point test may also be performed.
In other embodiments of the present invention, as shown in fig. 2 and 3, the clamping portion 31 includes a diagonal plate 311, a clamping plate 312, an elastic connection member 313, an upper probe 314 and a lower probe 315, where the diagonal plate 311 is fixedly connected to the Z-axis platform 324, and the clamping plate 312 is rotatably connected to the diagonal plate 311 through the elastic connection member 313 and forms a clamping space with the diagonal plate 311; the upper probe 314 is arranged on the clamping plate 312 and is communicated with the negative electrode of the power supply; the lower pin 315 is provided on the inclined stay plate 311 in correspondence with the upper pin 314, and is connected to the positive electrode of the power supply.
The beneficial effects of adopting above-mentioned technical scheme are: the setting of the diagonal brace plate in the clamping part can carry out temperature test on the upper surface of the PTC thermistor, and the PTC thermistor is driven to rotate along the horizontal direction by rotating the Z-axis platform, so that the relative angle between the PTC thermistor and the infrared temperature measuring probe is adjusted, and the temperature test on the side surface of the PTC thermistor is realized. In addition, the arrangement of the inclined supporting plate is convenient for taking and placing the PTC thermistor.
In other embodiments of the present invention, as shown in fig. 1, the inclined support plate 311 forms an angle of 45 ° with the Z-axis platform 324, and the irradiation direction of the infrared temperature probe 4 forms an angle of 45 ° with the Z-axis platform 324.
The beneficial effects of adopting above-mentioned technical scheme are: the included angle between the inclined supporting plate and the Z-axis platform is set to be 45 degrees, and meanwhile, the irradiation direction of the infrared temperature measuring probe is also 45 degrees obliquely downwards, so that the temperature of the surface or the side surface of the PTC can be tested after the same fixture rotates 180 degrees, the infrared rays can be vertical to the sample testing surface no matter the side edge or the sample surface is tested, and the accuracy of temperature testing is improved; in addition, the test fixture and the infrared probe are placed in a 45-degree angle mode, and the temperature measuring probe is arranged above the side of the test sample, so that the damage of high-temperature conduction to the probe can be avoided.
In other embodiments of the present invention, as shown in fig. 2 and 3, the clamping portion 31 further includes a limiting stop 316, where the limiting stop 316 is located between the clamping plate 312 and the diagonal strut 311, so as to limit the clamping position of the PTC thermistor 01.
The beneficial effects of adopting above-mentioned technical scheme are: the arrangement of the limiting stop bars is beneficial to keeping the uniformity of the clamping positions of the PTC thermistors, the operation is convenient and quick, the time for positioning the positions is greatly reduced, and the clamping and replacing efficiency is remarkably improved.
In other embodiments of the present invention, as shown in fig. 2 and 3, the clamping portion 31 further includes a height-limiting post 317, where the height-limiting post 317 is disposed on a surface of the clamping plate 312 facing the spacing bar 316 or on a surface of the spacing bar 316 facing the clamping plate 312, and when the height-limiting post 317 abuts against the spacing bar 316 or the clamping plate 312, the closest distance between the upper stylus 314 and the lower stylus 315 is not less than a predetermined positive-negative safety distance.
The beneficial effects of adopting above-mentioned technical scheme are: the height limiting column is arranged, so that the safety distance between the upper measuring needle and the lower measuring needle can be kept under the condition that the PTC thermistor to be detected is not arranged, and the safety distance can prevent short circuit from occurring when a sample is empty.
In other embodiments of the present invention, as shown in fig. 3, the clamping plate 312 and the diagonal plate 311 are respectively provided with a plurality of protrusions 318 on the surface contacting the PTC thermistor 01, and the protrusions 318 are made of heat-insulating material.
The beneficial effects of adopting above-mentioned technical scheme are: firstly, the arrangement of a plurality of bulges changes the surface contact between the PTC thermistor and the clamping plate and between the PTC thermistor and the inclined strut plate into point contact, so that the contact area between the surface of the PTC thermistor and the clamping part is greatly reduced, the influence of PTC heat dissipation on the testing accuracy of the surface temperature can be effectively avoided, and the repeatability of the testing data is good; on the other hand, the bulge adopts the heat insulation material, and the heat insulation performance of the heat insulation material is fully utilized, so that the heat on the surface of the PTC thermistor is further prevented from being dissipated through the conduction of the bulge, and the testing precision of the surface temperature is further improved.
In other embodiments of the present invention, as shown in fig. 3, the clamping portion 31 further includes an insulating sleeve 319, and the insulating sleeve 319 is sleeved on the outer surfaces of the upper stylus 314 and the lower stylus 315.
The beneficial effects of adopting above-mentioned technical scheme are: the arrangement of the insulating sleeve can effectively prevent potential safety hazards caused by electric leakage.
In other embodiments of the present invention, as shown in fig. 4, the infrared temperature probe 4 is provided with a probe motor 41, a focus detector 42 and a control module 43, wherein the probe motor 41 and the focus detector 42 are respectively communicated with the control module 43, and the control module 43 sends a driving command to the probe motor 41 according to a detection signal received from the focus detector 42.
The beneficial effects of adopting above-mentioned technical scheme are: the probe motor, the focusing detector and the control module are introduced, so that the surface to be tested of the PTC thermistor can be automatically controlled to focus, on one hand, the workload of manual focusing is reduced, the stability and reliability of focusing are improved, and the test requirements of samples and special-shaped samples with test sizes more than 1.5mm can be met.
In other embodiments of the present invention, as shown in fig. 1, the moving part 32 further includes an X-axis adjusting knob 325, a Y-axis adjusting knob 326 and a Z-axis adjusting knob 327, wherein the X-axis adjusting knob 325 adjusts the relative position of the X-axis platform 321 and the test platform 1 by rotating clockwise and counterclockwise, the Y-axis adjusting knob 326 adjusts the relative position of the Y-axis platform 322 and the X-axis platform 321 by rotating clockwise and counterclockwise, and the Z-axis adjusting knob 327 adjusts the rotation angle of the Z-axis platform 324 by rotating clockwise and counterclockwise.
The beneficial effects of adopting above-mentioned technical scheme are: through introducing X axle adjust knob, Y axle adjust knob and Z axle adjust knob pair, convenient operation, and effectively improved position adjustment precision.
The above embodiments are only for illustrating the technical concept and features of the present invention, and are intended to enable those skilled in the art to understand the content of the present invention and implement the same, but not limit the scope of the present invention, and all equivalent changes or modifications made according to the spirit of the present invention should be included in the scope of the present invention.
Claims (7)
1. A test device for PTC thermistor surface temperature, comprising: the device comprises a test platform, a support frame, a fixture clamp and an infrared temperature measuring probe;
the testing platform is arranged at the bottom and used for bearing and fixing the supporting frame, the fixture and the infrared temperature measuring probe, and provides a platform for testing the operating temperature for the PTC thermistor;
the support frame is arranged on the upper surface of the test platform, can rotate along the circumferential direction of the support center of the support frame and is used for supporting the infrared temperature measurement probe;
the fixture is arranged on the upper surface of the test platform and used for clamping the PTC thermistor, and comprises a clamping part and a moving part, wherein the clamping part moves along the direction parallel to the test platform or along the direction perpendicular to the test platform or along the direction parallel to the test platform and the direction perpendicular to the test platform through the moving part;
The infrared temperature measuring probe is connected to the supporting frame and used for testing the surface temperature of the PTC thermistor;
the moving part comprises an X-axis platform, a Y-axis platform, a support column and a Z-axis platform; the X-axis platform is in sliding connection with the test platform, the Y-axis platform is arranged on the upper surface of the X-axis platform and is in sliding connection with the X-axis platform, and the sliding direction of the Y-axis platform is perpendicular to the sliding direction of the X-axis platform; the support column is a rotary support column, and the Z-axis platform is rotationally connected with the Y-axis platform through the rotary support column;
The clamping part comprises an inclined supporting plate, a clamping plate, an elastic connecting piece, an upper measuring needle and a lower measuring needle, wherein the inclined supporting plate is fixedly connected with the Z-axis platform, and the clamping plate is rotatably connected with the inclined supporting plate through the elastic connecting piece and forms a clamping space with the inclined supporting plate; the upper measuring needle is arranged on the clamping plate and is communicated with the negative electrode of the power supply; the lower measuring pin and the upper measuring pin are correspondingly arranged on the inclined supporting plate and are communicated with the positive electrode of the power supply;
The inclined support plate and the Z-axis platform form an included angle of 45 degrees, and the irradiation direction of the infrared temperature measurement probe and the included angle of the Z-axis platform are 45 degrees.
2. A testing device for the surface temperature of a PTC thermistor according to claim 1, wherein the clamping portion further comprises a limiting rail located between the clamping plate and the diagonal strut plate for limiting the clamping position of the PTC thermistor.
3. A testing device for PTC thermistor according to claim 2, wherein the clamping portion further comprises a height-limiting column provided on a surface of the clamping plate facing the limit stop or on a surface of the limit stop facing the clamping plate, and when the height-limiting column abuts against the limit stop or the clamping plate, a closest distance between the upper pin and the lower pin is not less than a predetermined positive-negative safety distance.
4. A testing device for the surface temperature of a PTC thermistor according to claim 3, wherein the clamping plate and the diagonal strut plate are respectively provided with a plurality of protrusions on the surface contacting the PTC thermistor, and the protrusions are made of heat-insulating material.
5. A testing device for PTC thermistor according to claim 1, wherein the clamping portion further comprises an insulating sleeve, which is sleeved on the outer surfaces of the upper pin and the lower pin.
6. The device for testing the surface temperature of the PTC thermistor according to claim 1, wherein the infrared temperature measuring probe is provided with a probe motor, a focusing detector and a control module, the probe motor and the focusing detector are respectively communicated with the control module, and the control module sends a driving instruction to the probe motor according to a detection signal received from the focusing detector.
7. The testing device for PTC thermistor according to claim 1, wherein the moving portion further comprises an X-axis adjusting knob, a Y-axis adjusting knob, and a Z-axis adjusting knob, the X-axis adjusting knob adjusting the relative position of the X-axis stage and the testing stage by clockwise and counterclockwise rotation, the Y-axis adjusting knob adjusting the relative position of the Y-axis stage and the X-axis stage by clockwise and counterclockwise rotation, and the Z-axis adjusting knob adjusting the rotation angle of the Z-axis stage by clockwise and counterclockwise rotation.
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| CN202011533718.9A CN112781748B (en) | 2020-12-22 | 2020-12-22 | Testing device for surface temperature of PTC thermistor |
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| CN202011533718.9A CN112781748B (en) | 2020-12-22 | 2020-12-22 | Testing device for surface temperature of PTC thermistor |
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Citations (9)
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| JPH11125566A (en) * | 1997-10-22 | 1999-05-11 | Sumitomo Electric Ind Ltd | Surface temperature measurement sensor and temperature measurement probe |
| JP2007218591A (en) * | 2006-02-14 | 2007-08-30 | Toyo Univ | Hybrid-type surface thermometer, apparatus, and method for measuring temperature distribution |
| CN205562044U (en) * | 2016-04-09 | 2016-09-07 | 西安科技大学 | Super high temperature test platform system |
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