CN112781748A - Testing device for surface temperature of PTC thermistor - Google Patents
Testing device for surface temperature of PTC thermistor Download PDFInfo
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- CN112781748A CN112781748A CN202011533718.9A CN202011533718A CN112781748A CN 112781748 A CN112781748 A CN 112781748A CN 202011533718 A CN202011533718 A CN 202011533718A CN 112781748 A CN112781748 A CN 112781748A
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- 238000012360 testing method Methods 0.000 title claims abstract description 110
- 239000000523 sample Substances 0.000 claims abstract description 70
- 238000009529 body temperature measurement Methods 0.000 claims abstract description 22
- 238000001514 detection method Methods 0.000 claims description 3
- 239000011810 insulating material Substances 0.000 claims description 3
- 230000009286 beneficial effect Effects 0.000 description 22
- 230000006872 improvement Effects 0.000 description 9
- 238000010438 heat treatment Methods 0.000 description 7
- 230000004888 barrier function Effects 0.000 description 4
- 239000012774 insulation material Substances 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 239000000919 ceramic Substances 0.000 description 2
- 230000017525 heat dissipation Effects 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 239000002390 adhesive tape Substances 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000005485 electric heating Methods 0.000 description 1
- 239000000295 fuel oil Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
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- 238000010257 thawing Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
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Abstract
The invention discloses a testing device for the surface temperature of a PTC thermistor, which comprises: the device comprises a test platform, a support frame, a tool clamp and an infrared temperature measuring probe; the test platform is used for bearing the fixed support frame, the tool fixture and the infrared temperature measuring probe; the support frame can rotate along the circumferential direction of the support center of the support frame and is used for supporting the infrared temperature measurement probe; the tooling clamp is arranged on the upper surface of the test platform and used for clamping the PTC thermistor and driving the PTC thermistor to move; and the infrared temperature measuring probe is used for testing the surface temperature of the PTC thermistor. On one hand, the invention carries out non-contact temperature measurement on the surface of the PTC thermistor by utilizing the infrared temperature measurement principle, thereby not only avoiding heat conduction loss caused by the traditional contact test, but also avoiding potential danger existing in the electrification of a test probe and damage to a temperature display instrument.
Description
Technical Field
The invention relates to the technical field of thermistor temperature testing, in particular to a testing device for the surface temperature of a PTC thermistor.
Background
Due to the special positive temperature coefficient characteristic, the PTC heater product is widely applied to heating in the field of household appliances, such as air conditioner auxiliary heating, a fan heater, a bath heater and the like; the defrosting of the traditional fuel oil automobile, the heating in the new energy automobile, the battery heat management and the like, and the application range of the PTC heater is continuously expanded in the field of high-power heating.
The PTC heater adopts PTC thermistor ceramic as a core heating element, and has the advantages of automatic temperature control, wide application voltage range, no open fire, safety, reliability, long service life and the like compared with the traditional heating wire, electric heating tube and far infrared quartz heater. The temperature value of the surface temperature of the PTC thermistor in the energized state is one of important performance indexes of the PTC heater, and is directly related to the heating rate and the service life of the PTC heater, and therefore, the reliability of the result of the temperature test of the surface of the PTC thermistor is receiving wide attention.
The surface temperature test of the PTC thermistors by the production or use units of the PTC thermistor ceramics at present generally adopts the following modes: a K-type thermocouple probe; ② thermocouple wires; and thirdly, infrared testing. All of the above methods have inevitable disadvantages that result in inaccurate temperature testing.
For example, a K-type thermocouple probe is used for testing and is in direct contact with the surface of the PTC thermistor, so that on one hand, the operation is electrified, and obvious danger is caused; on the other hand, the probe is made of metal materials, so that the heat transfer is quite good, and the heat of the PTC thermistor after being electrified is easily conducted out, so that the temperature test deviation is large, and the data repeatability is poor; for small size samples, this approach cannot be tested.
For another example, the test is performed with a thermocouple wire. The method is to stick a thin thermocouple wire on the surface of the PTC by using a high-temperature adhesive tape for testing, and the hot-line operation danger also exists; in addition, because the thermocouple wire is provided with a raised head which can not be tightly contacted with the PTC, the test result has large error and poor repeatability.
The infrared thermometer is a non-contact test method, but whether the infrared thermometer is focused or not has great influence on temperature display.
Therefore, there is a need in the art for a testing device that is simple in structure, convenient to adjust, safe, efficient, and stable and reliable in testing result.
Disclosure of Invention
In order to solve the technical problems, the invention provides a testing device which is simple in structure, convenient to operate, safe, efficient, stable and reliable in testing result.
In order to achieve the purpose, the technical scheme of the invention is as follows:
a device for testing surface temperature of a PTC thermistor, comprising: the device comprises a test platform, a support frame, a tool clamp and an infrared temperature measuring probe; the test platform is arranged at the bottom and used for bearing and fixing the support frame, the tool fixture and the infrared temperature measurement probe and providing a platform for testing the operating temperature for the PTC thermistor; the supporting frame is arranged on the upper surface of the test platform, can rotate along the circumferential direction of the supporting center of the supporting frame and is used for supporting the infrared temperature measurement probe; the fixture is arranged on the upper surface of the test platform and used for clamping the PTC thermistor, and comprises a clamping part and a moving part, wherein the clamping part moves along the direction parallel to the test platform or along the direction perpendicular to the test platform or along the direction parallel to the test platform and the direction perpendicular to the test platform through the moving part; the infrared temperature measuring probe is connected to the support frame and used for testing the surface temperature of the PTC thermistor.
The beneficial effect of adopting above-mentioned technical scheme is: the problems of high hot-line operation danger coefficient and inaccurate contact measurement accelerated heat conduction measurement result in the surface temperature measurement of the PTC thermistor in the prior art are fully considered, on one hand, the surface of the PTC thermistor is subjected to non-contact temperature measurement by using an infrared temperature measurement principle, so that heat conduction loss caused by the traditional contact test can be avoided, and potential danger and damage to a temperature display instrument in the process of testing the electrification of a probe can be avoided; on the other hand, in order to enhance the convenience of infrared temperature measurement focusing, a support frame capable of rotating circumferentially and a movable tool clamp are introduced into the testing device, the position is changed through the matching of the support frame and the tool clamp so as to adjust focusing, and different positions of the PTC thermistor can be conveniently measured, so that accurate infrared focusing is achieved, and multi-point testing is realized.
As a further improvement of the technical scheme of the invention, the moving part comprises an X-axis platform, a Y-axis platform, a support and a Z-axis platform; the X-axis platform is connected with the test platform in a sliding mode, the Y-axis platform is arranged on the upper surface of the X-axis platform and is connected with the X-axis platform in a sliding mode, and the sliding direction of the Y-axis platform is perpendicular to that of the X-axis platform; the pillar is rotatory pillar, the Z axle platform pass through rotatory pillar with Y axle platform swivelling joint.
The beneficial effect of adopting above-mentioned technical scheme is: the cooperation setting of X axle platform, Y axle platform and Z axle platform for the removal portion can realize two-dimensional plane and remove, satisfies the position adjustment demand of clamping part on the horizontal direction, and the rotatable setting of Z axle platform satisfies the PTC thermistor that waits to detect in the clamping part for the adjustment demand of infrared temperature probe's relative angle. In addition, multi-point testing may also be performed.
As a further improvement of the technical scheme of the invention, the clamping part comprises an inclined supporting plate, a clamping plate, an elastic connecting piece, an upper measuring pin and a lower measuring pin, the inclined supporting plate is fixedly connected with the Z-axis platform, the clamping plate is rotatably connected with the inclined supporting plate through the elastic connecting piece and forms a clamping space with the inclined supporting plate; the upper measuring pin is arranged on the clamping plate and is communicated with the negative electrode of the power supply; the lower measuring pin and the upper measuring pin are correspondingly arranged on the inclined supporting plate and are communicated with the anode of the power supply.
The beneficial effect of adopting above-mentioned technical scheme is: the arrangement of the inclined supporting plate in the clamping part can be used for testing the temperature of the upper surface of the PTC thermistor, and the PTC thermistor is driven to rotate along the horizontal direction by rotating the Z-axis platform, so that the relative angle between the PTC thermistor and the infrared temperature measuring probe is adjusted, and the temperature test of the side surface of the PTC thermistor is realized. In addition, the arrangement of the inclined supporting plate is convenient for taking and placing the PTC thermistor.
As a further improvement of the technical scheme of the invention, the inclined supporting plate and the Z-axis platform form an included angle of 45 degrees, and the irradiation direction of the infrared temperature measurement probe and the Z-axis platform form an included angle of 45 degrees.
The beneficial effect of adopting above-mentioned technical scheme is: the included angle between the inclined supporting plate and the Z-axis platform is set to be 45 degrees, and meanwhile, the irradiation direction of the infrared temperature measurement probe is inclined downwards 45 degrees, so that the same clamp can test the temperature of the surface or the side surface of the PTC after rotating for 180 degrees, and the infrared ray can be ensured to be vertical to the test surface of the sample no matter the side edge of the sample or the surface of the sample is tested, and the accuracy of temperature test is improved; in addition, the test fixture and the infrared probe are placed at an angle of 45 degrees, and the temperature measuring probe is positioned above the side of the test sample, so that the damage of high-temperature conduction to the probe can be avoided.
As a further improvement of the technical scheme of the invention, the clamping part further comprises a limiting barrier strip, and the limiting barrier strip is positioned between the clamping plate and the inclined supporting plate and used for limiting the clamping position of the PTC thermistor.
The beneficial effect of adopting above-mentioned technical scheme is: the arrangement of the limiting barrier strips is beneficial to keeping the uniformity of the clamping position of the PTC thermistor, the operation is convenient and fast, the time for positioning the position is greatly reduced, and the clamping and replacing efficiency is obviously improved.
As a further improvement of the technical scheme of the invention, the clamping part further comprises a height limiting column, the height limiting column is arranged on the surface of the clamping plate facing the limiting rail, or on the surface of the limiting rail facing the clamping plate, and when the height limiting column is abutted against the limiting rail or the clamping plate, the closest distance between the upper measuring pin and the lower measuring pin is not less than a preset positive and negative safety distance.
The beneficial effect of adopting above-mentioned technical scheme is: the height limiting column can keep a safe distance between the upper measuring pin and the lower measuring pin under the condition of no PTC thermistor to be measured, and the safe distance can prevent a sample from being short-circuited in no-load.
As a further improvement of the technical scheme of the invention, a plurality of bulges are respectively arranged on the surfaces of the clamping plate and the inclined supporting plate, which are in contact with the PTC thermistor, and the bulges are made of heat-insulating materials.
The beneficial effect of adopting above-mentioned technical scheme is: firstly, the arrangement of the plurality of bulges changes the surface contact among the PTC thermistor, the clamping plate and the inclined supporting plate into point contact on one hand, so that the contact area between the surface of the PTC thermistor and the clamping part is greatly reduced, the influence of the heat dissipation of the PTC on the test precision of the surface temperature can be effectively avoided, and the repeatability of test data is good; on the other hand, the protrusion is made of a heat insulation material, so that the heat insulation performance of the heat insulation material is fully utilized, the heat on the surface of the PTC thermistor is further prevented from being dissipated through the conduction of the protrusion, and the testing precision of the surface temperature is further improved.
As a further improvement of the technical scheme of the invention, the clamping part also comprises an insulating sleeve which is sleeved on the outer surfaces of the upper measuring pin and the lower measuring pin.
The beneficial effect of adopting above-mentioned technical scheme is: the arrangement of the insulating sleeve can effectively prevent potential safety hazards caused by electric leakage.
As a further improvement of the technical scheme of the invention, the infrared temperature measurement probe is provided with a probe motor, a focusing detector and a control module, the probe motor and the focusing detector are respectively communicated with the control module, and the control module issues a driving instruction to the probe motor according to a detection signal received from the focusing detector.
The beneficial effect of adopting above-mentioned technical scheme is: the probe motor, the focusing detector and the control module are introduced, so that the surface to be tested of the PTC thermistor can be automatically controlled and focused, the workload of manual focusing is reduced, the focusing stability and reliability are improved, and the test requirements of testing samples with the size larger than 1.5mm and special-shaped samples can be met.
As a further improvement of the technical solution of the present invention, the moving part further includes an X-axis adjusting knob, a Y-axis adjusting knob, and a Z-axis adjusting knob, the X-axis adjusting knob adjusts the relative position between the X-axis platform and the testing platform by clockwise and counterclockwise rotation, the Y-axis adjusting knob adjusts the relative position between the Y-axis platform and the X-axis platform by clockwise and counterclockwise rotation, and the Z-axis adjusting knob adjusts the rotation angle of the Z-axis platform by clockwise and counterclockwise rotation.
The beneficial effect of adopting above-mentioned technical scheme is: through introducing X axle adjust knob, Y axle adjust knob and Z axle adjust knob to, convenient operation has just effectively improved the position adjustment precision.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained based on these drawings without creative efforts.
FIG. 1 is a perspective view of a testing device according to the present invention;
FIG. 2 is an enlarged view of a portion of FIG. 1 at I;
FIG. 3 is a cross-sectional view of a clamping portion of the testing device of the present invention;
FIG. 4 is a schematic view of an infrared temperature probe of the testing device of the present invention;
the corresponding part names indicated by the numbers in the figures are as follows:
a PTC thermistor 01; a test platform 1; a support frame 2; a tooling fixture 3; a clamping portion 31; a diagonal stay plate 311; a clamping plate 312; an elastic connection member 313; an upper stylus 314; a lower stylus 315; a limiting rail 316; height limiting posts 317; a protrusion 318; an insulating sleeve 319; a moving section 32; an X-axis stage 321; a Y-axis stage 322; a support column 323; a Z-axis platform 324; an X-axis adjustment knob 325; a Y-axis adjustment knob 326; a Z-axis adjustment knob 327; an infrared temperature measuring probe 4; a probe motor 41; a focus detector 42; and a control module 43.
Detailed Description
In order to facilitate an understanding of the invention, the invention will be described more fully and in detail below with reference to the accompanying drawings and preferred embodiments, but the scope of the invention is not limited to the specific embodiments below. It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict.
In order to realize the purpose of the invention, the technical scheme provided by the invention is as follows:
in some embodiments of the present invention, as shown in fig. 1, there is disclosed a testing apparatus for a surface temperature of a PTC thermistor, comprising: the device comprises a test platform 1, a support frame 2, a tool clamp 3 and an infrared temperature measuring probe 4; the testing platform 1 is arranged at the bottom, is used for bearing and fixing the supporting frame 2, the tool clamp 3 and the infrared temperature measuring probe 4, and provides a platform for testing the operating temperature for the PTC thermistor 01; the supporting frame 2 is arranged on the upper surface of the test platform 1, can rotate along the circumferential direction of the supporting center of the supporting frame 2 and is used for supporting the infrared temperature measurement probe 4; the fixture 3 is arranged on the upper surface of the test platform 1 and used for clamping the PTC thermistor 01, the fixture 3 comprises a clamping part 31 and a moving part 32, and the clamping part 31 moves along the direction parallel to the test platform 1 or along the direction perpendicular to the test platform 1 or along the direction parallel to the test platform 1 and the direction perpendicular to the test platform 1 through the moving part 32; and the infrared temperature measuring probe 4 is connected to the support frame 2 and is used for testing the surface temperature of the PTC thermistor 01.
The beneficial effect of adopting above-mentioned technical scheme is: the problems of high hot-line operation danger coefficient and inaccurate contact measurement accelerated heat conduction measurement result in the surface temperature measurement of the PTC thermistor in the prior art are fully considered, on one hand, the surface of the PTC thermistor is subjected to non-contact temperature measurement by using an infrared temperature measurement principle, so that heat conduction loss caused by the traditional contact test can be avoided, and potential danger and damage to a temperature display instrument in the process of testing the electrification of a probe can be avoided; on the other hand, in order to enhance the convenience of infrared temperature measurement focusing, a support frame capable of rotating circumferentially and a movable tool clamp are introduced into the testing device, the position is changed through the matching of the support frame and the tool clamp so as to adjust focusing, and different positions of the PTC thermistor can be conveniently measured, so that accurate infrared focusing is achieved, and multi-point testing is realized.
In other embodiments of the present invention, as shown in fig. 1, the moving part 32 includes an X-axis stage 321, a Y-axis stage 322, a support 323, and a Z-axis stage 324; the X-axis platform 321 is connected with the test platform 1 in a sliding manner, the Y-axis platform 322 is arranged on the upper surface of the X-axis platform 321 and is connected with the X-axis platform 321 in a sliding manner, and the sliding direction of the Y-axis platform 322 is perpendicular to that of the X-axis platform 321; the support 323 is a rotary support, and the Z-axis table 324 is rotatably connected to the Y-axis table 322 via the rotary support.
The beneficial effect of adopting above-mentioned technical scheme is: the cooperation setting of X axle platform, Y axle platform and Z axle platform for the removal portion can realize two-dimensional plane and remove, satisfies the position adjustment demand of clamping part on the horizontal direction, and the rotatable setting of Z axle platform satisfies the PTC thermistor that waits to detect in the clamping part for the adjustment demand of infrared temperature probe's relative angle. In addition, multi-point testing may also be performed.
In other embodiments of the present invention, as shown in fig. 2 and 3, the clamping portion 31 includes an inclined supporting plate 311, a clamping plate 312, an elastic connector 313, an upper probe 314 and a lower probe 315, the inclined supporting plate 311 is fixedly connected to the Z-axis platform 324, the clamping plate 312 is rotatably connected to the inclined supporting plate 311 through the elastic connector 313, and forms a clamping space with the inclined supporting plate 311; the upper measuring pin 314 is arranged on the clamping plate 312 and is communicated with the negative pole of the power supply; the lower probe 315 is disposed on the inclined supporting plate 311 corresponding to the upper probe 314, and is connected to the positive electrode of the power supply.
The beneficial effect of adopting above-mentioned technical scheme is: the arrangement of the inclined supporting plate in the clamping part can be used for testing the temperature of the upper surface of the PTC thermistor, and the PTC thermistor is driven to rotate along the horizontal direction by rotating the Z-axis platform, so that the relative angle between the PTC thermistor and the infrared temperature measuring probe is adjusted, and the temperature test of the side surface of the PTC thermistor is realized. In addition, the arrangement of the inclined supporting plate is convenient for taking and placing the PTC thermistor.
In other embodiments of the present invention, as shown in fig. 1, the inclined supporting plate 311 forms an angle of 45 ° with the Z-axis platform 324, and the irradiation direction of the infrared temperature measurement probe 4 forms an angle of 45 ° with the Z-axis platform 324.
The beneficial effect of adopting above-mentioned technical scheme is: the included angle between the inclined supporting plate and the Z-axis platform is set to be 45 degrees, and meanwhile, the irradiation direction of the infrared temperature measurement probe is inclined downwards 45 degrees, so that the same clamp can test the temperature of the surface or the side surface of the PTC after rotating for 180 degrees, and the infrared ray can be ensured to be vertical to the test surface of the sample no matter the side edge of the sample or the surface of the sample is tested, and the accuracy of temperature test is improved; in addition, the test fixture and the infrared probe are placed at an angle of 45 degrees, and the temperature measuring probe is positioned above the side of the test sample, so that the damage of high-temperature conduction to the probe can be avoided.
In other embodiments of the present invention, as shown in fig. 2 and 3, the clamping portion 31 further includes a position-limiting bar 316, and the position-limiting bar 316 is located between the clamping plate 312 and the inclined supporting plate 311 to limit the clamping position of the PTC thermistor 01.
The beneficial effect of adopting above-mentioned technical scheme is: the arrangement of the limiting barrier strips is beneficial to keeping the uniformity of the clamping position of the PTC thermistor, the operation is convenient and fast, the time for positioning the position is greatly reduced, and the clamping and replacing efficiency is obviously improved.
In other embodiments of the present invention, as shown in fig. 2 and 3, the clamping portion 31 further includes a height-limiting pillar 317, the height-limiting pillar 317 is disposed on a surface of the clamping plate 312 facing the position-limiting rail 316, or on a surface of the position-limiting rail 316 facing the clamping plate 312, and when the height-limiting pillar 317 abuts against the position-limiting rail 316 or the clamping plate 312, a closest distance between the upper pin 314 and the lower pin 315 is not less than a predetermined positive-negative safety distance.
The beneficial effect of adopting above-mentioned technical scheme is: the height limiting column can keep a safe distance between the upper measuring pin and the lower measuring pin under the condition of no PTC thermistor to be measured, and the safe distance can prevent a sample from being short-circuited in no-load.
In another embodiment of the present invention, as shown in fig. 3, the holding plate 312 and the inclined plate 311 are respectively provided with a plurality of protrusions 318 on the surface contacting with the PTC thermistor 01, and the protrusions 318 are made of a heat insulating material.
The beneficial effect of adopting above-mentioned technical scheme is: firstly, the arrangement of the plurality of bulges changes the surface contact among the PTC thermistor, the clamping plate and the inclined supporting plate into point contact on one hand, so that the contact area between the surface of the PTC thermistor and the clamping part is greatly reduced, the influence of the heat dissipation of the PTC on the test precision of the surface temperature can be effectively avoided, and the repeatability of test data is good; on the other hand, the protrusion is made of a heat insulation material, so that the heat insulation performance of the heat insulation material is fully utilized, the heat on the surface of the PTC thermistor is further prevented from being dissipated through the conduction of the protrusion, and the testing precision of the surface temperature is further improved.
In other embodiments of the present invention, as shown in fig. 3, the clamping portion 31 further includes an insulating sleeve 319, and the insulating sleeve 319 is sleeved on the outer surfaces of the upper pin 314 and the lower pin 315.
The beneficial effect of adopting above-mentioned technical scheme is: the arrangement of the insulating sleeve can effectively prevent potential safety hazards caused by electric leakage.
In other embodiments of the present invention, as shown in fig. 4, the infrared temperature measuring probe 4 is provided with a probe motor 41, a focus detector 42 and a control module 43, the probe motor 41 and the focus detector 42 are respectively communicated with the control module 43, and the control module 43 issues a driving command to the probe motor 41 according to a detection signal received from the focus detector 42.
The beneficial effect of adopting above-mentioned technical scheme is: the probe motor, the focusing detector and the control module are introduced, so that the surface to be tested of the PTC thermistor can be automatically controlled and focused, the workload of manual focusing is reduced, the focusing stability and reliability are improved, and the test requirements of testing samples with the size larger than 1.5mm and special-shaped samples can be met.
In other embodiments of the present invention, as shown in fig. 1, the moving part 32 further includes an X-axis adjusting knob 325, a Y-axis adjusting knob 326 and a Z-axis adjusting knob 327, the X-axis adjusting knob 325 adjusts the relative position of the X-axis platform 321 and the testing platform 1 by clockwise and counterclockwise rotation, the Y-axis adjusting knob 326 adjusts the relative position of the Y-axis platform 322 and the X-axis platform 321 by clockwise and counterclockwise rotation, and the Z-axis adjusting knob 327 adjusts the rotation angle of the Z-axis platform 324 by clockwise and counterclockwise rotation.
The beneficial effect of adopting above-mentioned technical scheme is: through introducing X axle adjust knob, Y axle adjust knob and Z axle adjust knob to, convenient operation has just effectively improved the position adjustment precision.
The above embodiments are merely illustrative of the technical concept and features of the present invention, and the purpose thereof is to enable those skilled in the art to understand the content of the present invention and implement the present invention, and not to limit the scope of the present invention, and all equivalent changes or modifications made according to the spirit of the present invention should be covered in the scope of the present invention.
Claims (10)
1. A device for testing the surface temperature of a PTC thermistor, comprising: the device comprises a test platform, a support frame, a tool clamp and an infrared temperature measuring probe;
the test platform is arranged at the bottom and used for bearing and fixing the support frame, the tool fixture and the infrared temperature measurement probe and providing a platform for testing the operating temperature for the PTC thermistor;
the supporting frame is arranged on the upper surface of the test platform, can rotate along the circumferential direction of the supporting center of the supporting frame and is used for supporting the infrared temperature measurement probe;
the fixture is arranged on the upper surface of the test platform and used for clamping the PTC thermistor, and comprises a clamping part and a moving part, wherein the clamping part moves along the direction parallel to the test platform or along the direction perpendicular to the test platform or along the direction parallel to the test platform and the direction perpendicular to the test platform through the moving part;
the infrared temperature measuring probe is connected to the support frame and used for testing the surface temperature of the PTC thermistor.
2. The device for testing surface temperature of a PTC thermistor according to claim 1, wherein the moving part comprises an X-axis stage, a Y-axis stage, a support column and a Z-axis stage; the X-axis platform is connected with the test platform in a sliding mode, the Y-axis platform is arranged on the upper surface of the X-axis platform and is connected with the X-axis platform in a sliding mode, and the sliding direction of the Y-axis platform is perpendicular to that of the X-axis platform; the pillar is rotatory pillar, the Z axle platform pass through rotatory pillar with Y axle platform swivelling joint.
3. The device for testing the surface temperature of a PTC thermistor according to claim 2, wherein the clamping portion comprises a slanted plate, a clamping plate, an elastic connector, an upper pin and a lower pin, the slanted plate is fixedly connected to the Z-axis platform, the clamping plate is rotatably connected to the slanted plate through the elastic connector, and forms a clamping space with the slanted plate; the upper measuring pin is arranged on the clamping plate and is communicated with the negative electrode of the power supply; the lower measuring pin and the upper measuring pin are correspondingly arranged on the inclined supporting plate and are communicated with the anode of the power supply.
4. A device for testing the surface temperature of a PTC thermistor according to claim 3, wherein the inclined supporting plate forms an angle of 45 ° with the Z-axis platform, and the irradiation direction of the infrared temperature measurement probe forms an angle of 45 ° with the Z-axis platform.
5. A device for testing the surface temperature of a PTC thermistor according to claim 4, wherein the clamping portion further comprises a limit bar located between the clamping plate and the inclined support plate to limit the clamping position of the PTC thermistor.
6. The device for testing the surface temperature of the PTC thermistor according to claim 5, wherein the clamping portion further comprises a height limiting column, the height limiting column is arranged on the surface of the clamping plate facing the limiting rail or on the surface of the limiting rail facing the clamping plate, and the nearest distance between the upper probe and the lower probe is not less than a predetermined positive-negative electrode safety distance when the height limiting column abuts against the limiting rail or the clamping plate.
7. A device for testing the surface temperature of a PTC thermistor according to claim 6, wherein the holding plate and the inclined plate are provided with a plurality of protrusions on the surface contacting with the PTC thermistor, respectively, and the protrusions are made of a heat insulating material.
8. The device for testing the surface temperature of a PTC thermistor according to claim 2, wherein the clamping portion further comprises an insulating sleeve provided on the outer surface of the upper and lower pins.
9. A PTC thermistor surface temperature testing device according to claim 1, wherein the infrared temperature measuring probe is provided with a probe motor, a focusing detector and a control module, the probe motor and the focusing detector are respectively communicated with the control module, and the control module issues a driving command to the probe motor according to a detection signal received from the focusing detector.
10. The device for testing the surface temperature of a PTC thermistor according to claim 3, wherein the moving part further comprises an X-axis adjusting knob, a Y-axis adjusting knob and a Z-axis adjusting knob, the X-axis adjusting knob adjusts the relative position of the X-axis stage and the test stage by clockwise and counterclockwise rotation, the Y-axis adjusting knob adjusts the relative position of the Y-axis stage and the X-axis stage by clockwise and counterclockwise rotation, and the Z-axis adjusting knob adjusts the rotation angle of the Z-axis stage by clockwise and counterclockwise rotation.
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