CN217305425U - Testing device for temperature-resistant aging test of integrated circuit - Google Patents
Testing device for temperature-resistant aging test of integrated circuit Download PDFInfo
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- CN217305425U CN217305425U CN202220332668.6U CN202220332668U CN217305425U CN 217305425 U CN217305425 U CN 217305425U CN 202220332668 U CN202220332668 U CN 202220332668U CN 217305425 U CN217305425 U CN 217305425U
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- resistant aging
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- 238000012360 testing method Methods 0.000 title claims abstract description 38
- 230000032683 aging Effects 0.000 title claims abstract description 15
- 239000000523 sample Substances 0.000 claims abstract description 21
- 238000010438 heat treatment Methods 0.000 claims abstract description 20
- 238000005192 partition Methods 0.000 claims description 6
- 230000000694 effects Effects 0.000 abstract description 12
- 238000009529 body temperature measurement Methods 0.000 abstract description 3
- 230000009471 action Effects 0.000 description 15
- 238000009413 insulation Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000011152 fibreglass Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
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Abstract
The utility model discloses a testing arrangement for integrated circuit temperature resistant aging testing relates to integrated circuit technical field. The utility model discloses a bottom plate, the upside of bottom plate are equipped with box, sliding fit have two hot plates, and two relative inboards of box all are equipped with the guide rail, are equipped with two second electric slide rails between, and one side of guide rail is equipped with two electric putter, and two electric putter's output all is equipped with the heat-insulating shield, and one side of heat-insulating shield is equipped with the layer board, and the upside of layer board is equipped with the fixed column. The utility model discloses an operation of insulating against heat is conveniently carried out in the effect of heat-insulating shield, reduces the possibility of electric putter heat conduction, and the effect through temperature controller makes things convenient for the control heating board to the heating temperature of box, and each chip after convenient damaging integrated circuit board of effect through the detecting head carries out temperature measurement, and the effect through probe and universal meter makes things convenient for the universal meter to detect the chip that the detecting head measured.
Description
Technical Field
The utility model belongs to the technical field of integrated circuit, especially, relate to a testing arrangement for integrated circuit temperature resistant aging testing.
Background
The temperature aging test of the integrated circuit is an important test item in the test of the integrated circuit, and is used for testing the service life of the integrated circuit. The specific principle of the temperature-resistant aging test of the integrated circuit is as follows: the integrated circuit is enabled to work in a high-temperature state higher than the standard working temperature until the integrated circuit is damaged, so that the service life of the integrated circuit in the high-temperature state higher than the standard working temperature is known, and then the service life of the integrated circuit in the standard working temperature can be determined.
The lack of a process for testing the integrated circuit board in the existing test apparatus results in an inconvenience of determining which chip the integrated circuit board is due to.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a testing arrangement for integrated circuit temperature resistant aging testing has solved the inconvenient technical problem who confirms chip damage among the integrated circuit board of current testing arrangement.
In order to solve the technical problem, the utility model discloses a realize through following technical scheme:
the utility model provides a testing arrangement for integrated circuit temperature resistant aging testing, comprising a base plate, the upside of bottom plate is equipped with the box, sliding fit has two hot plates, two relative inboards of box all are equipped with the guide rail, be equipped with two second electric slide rail between, one side of guide rail is equipped with two electric putter, two electric putter's output all is equipped with the heat-insulating shield, one side of heat-insulating shield is equipped with the layer board, the upside of layer board is equipped with the fixed column, slip hydraulic push rod between two second electric slide rail, hydraulic push rod's output normal running fit has the fixed plate, the downside of fixed plate is equipped with the detecting head and sliding fit has two probes.
Optionally, the lower sides of the two electric push rods are respectively fixed with a supporting plate, a threaded rod is in running fit between the two supporting plates, a partition plate is arranged in the middle of the threaded rod, and the threaded rod on the two sides of the partition plate is opposite in thread direction.
Optionally, a temperature controller is arranged on the upper side of the bottom plate, and the temperature controller is electrically connected with the two heating plates.
Optionally, an integrated circuit board is arranged between the four fixing columns, the input end and the output end of the integrated circuit board are electrically connected with wires, and one end of each wire is connected with a power supply.
Optionally, the upper side of the box body is provided with a transparent cover plate, a cabinet door is rotatably matched with one side of the box body, and the upper side of the transparent cover plate is provided with an infrared thermometer and a universal meter.
Optionally, sliding fit has third electronic slide rail between two electronic slide rails of second, and hydraulic push rod sliding fit has two electronic slide rails of fifth at the downside of third electronic slide rail, and servo motor has been installed to hydraulic push rod's output, and the fixed plate is installed at servo motor's downside, and the downside sliding fit of fixed plate has two electronic slide rails of fifth, and two probes sliding fit respectively are at the downside of electronic slide rail of fifth, infrared thermometer and detecting head electric connection, probe and universal meter electric connection.
The embodiment of the utility model has the following beneficial effect:
one embodiment of the utility model is convenient to draw the electric push rod out of the box body through the action of the guide rail, the positions of the fixed columns are convenient to adjust through the action of the threaded rod and the electric push rod, and further the electric push rod is convenient to correspond to the fixed holes of the integrated circuit board, the integrated circuit board is convenient to be fixed among the four fixed columns, the heat insulation operation is convenient to be carried out through the action of the heat insulation plate, the possibility of heat conduction of the electric push rod is reduced, the temperature of the heating plate is convenient to control through the action of the temperature controller, the distance between the heating plate and the box body is convenient to adjust through the sliding action of the heating plate, and further the heating temperature of the heating plate to the box body is convenient to control, the positions of the detecting head and the probe above the integrated circuit board are convenient to adjust through the sliding action of the hydraulic push rod, and the distance between the detecting head and the probe and the integrated circuit board is convenient to adjust through the action of the hydraulic push rod, the effect through the detecting head conveniently carries out temperature measurement to each chip after integrated circuit board damages to show on infrared radiation thermoscope, make things convenient for the universal meter to detect the chip that the detecting head measured through the effect of probe and universal meter, and then conveniently test the vulnerable chip in the integrated circuit board.
Of course, it is not necessary for any particular product to achieve all of the above-described advantages simultaneously.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments are briefly introduced below, it is obvious that the drawings in the description below are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic rear perspective view of an embodiment of the present invention;
fig. 2 is a schematic perspective view of an embodiment of the present invention;
fig. 3 is a schematic cross-sectional view of an embodiment of the present invention;
fig. 4 is a schematic structural diagram of a portion a in fig. 3.
Wherein the figures include the following reference numerals:
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses.
To maintain the following description of the embodiments of the present invention clear and concise, detailed descriptions of well-known functions and components may be omitted.
Referring to fig. 1-4, in the present embodiment, a testing apparatus for temperature-resistant aging testing of an integrated circuit is provided, which includes a bottom plate 1, a box body 2 is disposed on an upper side of the bottom plate 1, two heating plates 3 are slidably fitted, specifically, four first electric slide rails are disposed on the upper side of the bottom plate 1, the heating plates 3 are slidably fitted on upper sides of two adjacent first electric slide rails, two opposite inner sides of the box body 2 are both provided with a guide rail 6, be equipped with two electronic slide rails 14 of second between, one side of guide rail 6 is equipped with two electric putter 7, and the output of two electric putter 7 all is equipped with heat-insulating board 8, and one side of heat-insulating board 8 is equipped with layer board 9, and the upside of layer board 9 is equipped with fixed column 10, and slip hydraulic push rod 16 between two electronic slide rails 14 of second, hydraulic push rod 16's output normal running fit has fixed plate 18, and the downside of fixed plate 18 is equipped with detecting head 19 and sliding fit has two probes 21.
The application of one aspect of the embodiment is as follows: when the device is used, the positions of the fixing columns 10 are adjusted according to the fixing holes in the integrated circuit board 11, in the process of adjusting the positions of the fixing columns 10, the threaded rod 13 can adjust the distance between the two electric push rods 7, the electric push rods 7 can adjust the distance between the two opposite fixing columns 10, the integrated circuit board 11 is clamped between the four fixing columns 10 through the fixing holes, then the cabinet door 22 is rotated to shield the opening of the cabinet body 2, then the temperature controller 4 controls the temperature of the heating plate 3 and heats the cabinet body 2, then the integrated circuit board 11 is electrified to carry out test operation, the hydraulic push rod 16 is slid to adjust the position of the detecting head 19 after the integrated circuit board 11 stops working due to problems, so that the detecting head 19 can carry out temperature measurement operation on the chips on the upper side of the integrated circuit board 11 and display the chips through an infrared thermometer, and when the detecting head 19 detects the problem chips, the two probes 21 are slid to enable the probes 21 to measure different pins of the chip, so that the quality of the chip is detected, the damaged part of the integrated circuit board 11 at the test position is easily affected by temperature, and the test operation of the integrated circuit board 11 is further realized. It should be noted that all the electric devices referred to in this application may be powered by a storage battery or an external power source.
The electric push rod 7 is conveniently drawn out from the inside of the box body 2 under the action of the guide rail 6, the positions of the fixing columns 10 are conveniently adjusted under the action of the threaded rod 13 and the electric push rod 7, and further the electric push rod conveniently corresponds to the fixing holes of the integrated circuit board 11, the integrated circuit board 11 is conveniently fixed among the four fixing columns 10, heat insulation operation is conveniently carried out under the action of the heat insulation plate 8, the possibility of heat conduction of the electric push rod 7 is reduced, the temperature of the heating plate 3 is conveniently controlled under the action of the temperature controller 4, the distance between the heating plate 3 and the box body 2 is conveniently adjusted under the sliding action of the heating plate 3, the heating temperature of the heating plate 3 to the box body 2 is further conveniently controlled, the positions of the detecting heads 19 and the probes 21 above the integrated circuit board 11 are conveniently adjusted under the sliding action of the hydraulic push rod 16, and the distances between the detecting heads 19 and the probes 21 and the integrated circuit board 11 are conveniently adjusted under the action of the hydraulic push rod 16, the temperature of each chip after the integrated circuit board 11 is damaged is conveniently measured through the effect of the detecting head 19, the temperature is displayed on an infrared thermometer, the universal meter is convenient to detect the chip measured by the detecting head 19 through the effect of the probe 21 and the universal meter, and the easily damaged chip in the integrated circuit board 11 is conveniently tested.
Please refer to fig. 4, the lower sides of the two electric push rods 7 of the present embodiment are fixed with supporting plates 12, a threaded rod 13 is rotatably fitted between the two supporting plates 12, a partition plate is disposed in the middle of the threaded rod 13, the threaded rods 13 on the two sides of the partition plate have opposite thread directions, and the distance between the two electric push rods 7 is conveniently adjusted according to the fixing holes on the integrated circuit board 11 under the action of the threaded rod 13, so that the fixing column 10 can limit and fix the integrated circuit board 11.
Referring to fig. 1, a temperature controller 4 is disposed on the upper side of the bottom plate 1, the temperature controller 4 is electrically connected to the two heating plates 3, and the heating temperature of the heating plates 3 is conveniently controlled by the temperature controller 4.
Referring to fig. 2-3, an integrated circuit board 11 is disposed between four fixing posts 10 of the embodiment, an input end and an output end of the integrated circuit board 11 are electrically connected to wires, one end of each wire is connected to a power supply, and the integrated circuit board 11 is conveniently limited, fixed and lifted by the fixing posts 10.
Referring to fig. 2-3, in the present embodiment, a transparent cover plate 5 is disposed on an upper side of a case 2, a cabinet door 22 is rotatably fitted on one side of the case, an infrared thermometer and a multimeter are disposed on an upper side of the transparent cover plate 5, a third electric slide rail 15 is slidably fitted between two second electric slide rails 14, a hydraulic push rod 16 is slidably fitted on a lower side of the third electric slide rail 15, a servo motor 17 is disposed at an output end of the hydraulic push rod 16, a fixing plate 18 is disposed on a lower side of the servo motor 17, two fifth electric slide rails 20 are slidably fitted on a lower side of the fixing plate 18, specifically, two fourth electric slide rails are disposed on a lower side of the fixing plate 18, the fifth electric slide rails 20 are disposed on a lower side of the fourth electric slide rails, two probes 21 are respectively slidably fitted on a lower side of the fifth electric slide rails 20, the infrared thermometer is electrically connected to a probe 19, the probes 21 are electrically connected to the multimeter, through the effect of third electronic slide rail 15 sliding fit between two electronic slide rails 14 of second, make things convenient for fixed plate 18 to move on the X axle direction, through the effect of hydraulic push rod 16 sliding fit at the electronic slide rail 15 downside of third, make things convenient for fixed plate 18 to move on the direction of Y axle, the effect through detecting head 19 is convenient to carry out the temperature monitoring that generates heat to the chip of integrated circuit board 11 upside, and then show through the display of infrared ray thermoscope, the stitch electric conductivity of chip is measured and is shown through the universal meter to the convenience of effect through probe 21.
The transparent cover plate 5 is made of high-temperature resistant glass fiber reinforced plastic.
The above embodiments may be combined with each other.
It should be noted that in the description of the present specification, descriptions such as "first", "second", etc. are only used for distinguishing features, and do not have an actual order or meaning, and the present application is not limited thereto.
In the description herein, references to the description of "one embodiment," "an example," "a specific example," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
The preferred embodiments of the present invention disclosed above are intended only to help illustrate the present invention. The preferred embodiments are not intended to be exhaustive or to limit the invention to the precise embodiments disclosed. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the invention and its practical applications, to thereby enable others skilled in the art to best understand the invention for and utilize the invention. The present invention is limited only by the claims and their full scope and equivalents.
Claims (6)
1. A testing arrangement for integrated circuit temperature resistant aging tests, characterized by, includes: bottom plate (1), the upside of bottom plate (1) is equipped with box (2), sliding fit has two hot plate (3), two relative inboards of box (2) all are equipped with guide rail (6), be equipped with two second electric slide rail (14) between, one side of guide rail (6) is equipped with two electric putter (7), the output of two electric putter (7) all is equipped with heat-insulating board (8), one side of heat-insulating board (8) is equipped with layer board (9), the upside of layer board (9) is equipped with fixed column (10), slip hydraulic push rod (16) between two second electric slide rail (14), the output normal running fit of hydraulic push rod (16) has fixed plate (18), the downside of fixed plate (18) is equipped with detecting head (19) and sliding fit has two probes (21).
2. The testing device for the temperature-resistant aging test of the integrated circuit according to claim 1, characterized in that the lower sides of the two electric push rods (7) are respectively fixed with a supporting plate (12), a threaded rod (13) is matched between the two supporting plates (12) in a rotating way, a partition plate is arranged in the middle of the threaded rod (13), and the threaded rods (13) on the two sides of the partition plate have opposite thread directions.
3. The testing device for the temperature-resistant aging test of the integrated circuit according to claim 1, characterized in that a temperature controller (4) is arranged on the upper side of the bottom plate (1), and the temperature controller (4) is electrically connected with the two heating plates (3).
4. The testing device for the temperature-resistant aging test of the integrated circuit according to claim 1, wherein an integrated circuit board (11) is arranged between the four fixing posts (10), both the input end and the output end of the integrated circuit board (11) are electrically connected with wires, and one end of each wire is connected with a power supply.
5. The testing device for the temperature-resistant aging test of the integrated circuit according to claim 1, characterized in that a transparent cover plate (5) is arranged on the upper side of the box body (2), a cabinet door (22) is rotatably matched on one side, and an infrared thermometer and a universal meter are arranged on the upper side of the transparent cover plate (5).
6. The testing device for the temperature-resistant aging test of the integrated circuit according to claim 5, wherein a third electric slide rail (15) is slidably fitted between the two second electric slide rails (14), a hydraulic push rod (16) is slidably fitted on the lower side of the third electric slide rail (15), a servo motor (17) is mounted at the output end of the hydraulic push rod (16), a fixing plate (18) is mounted on the lower side of the servo motor (17), two fifth electric slide rails (20) are slidably fitted on the lower side of the fixing plate (18), the two probes (21) are respectively slidably fitted on the lower sides of the fifth electric slide rails (20), the infrared thermometer is electrically connected with the detecting head (19), and the probes (21) are electrically connected with the multimeter.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220332668.6U CN217305425U (en) | 2022-02-16 | 2022-02-16 | Testing device for temperature-resistant aging test of integrated circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220332668.6U CN217305425U (en) | 2022-02-16 | 2022-02-16 | Testing device for temperature-resistant aging test of integrated circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217305425U true CN217305425U (en) | 2022-08-26 |
Family
ID=82928238
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202220332668.6U Expired - Fee Related CN217305425U (en) | 2022-02-16 | 2022-02-16 | Testing device for temperature-resistant aging test of integrated circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217305425U (en) |
-
2022
- 2022-02-16 CN CN202220332668.6U patent/CN217305425U/en not_active Expired - Fee Related
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| Date | Code | Title | Description |
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| GR01 | Patent grant | ||
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| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20220826 |
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| CF01 | Termination of patent right due to non-payment of annual fee |