CN112698172B - Device and method for realizing electric aging - Google Patents
Device and method for realizing electric aging Download PDFInfo
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- CN112698172B CN112698172B CN202011359773.0A CN202011359773A CN112698172B CN 112698172 B CN112698172 B CN 112698172B CN 202011359773 A CN202011359773 A CN 202011359773A CN 112698172 B CN112698172 B CN 112698172B
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Abstract
The invention discloses a device and a method for realizing electric aging, which solve the problems that the prior device and the prior method carry out intermittent electric signal excitation on products and the batch of electric aging is insufficient. An electrical burn-in implementation for a discrete crystal filter, comprising: the device comprises a crystal oscillator power-up module and a filter test module; the crystal oscillator power-up module is used for generating a sine wave excitation signal with the same center frequency as that of the discrete crystal filter to be tested; the filter test module is used for receiving the sine wave excitation signal and outputting a filtering signal, and the filtering signal is used for high-temperature electric aging test. The method uses the device. The invention can realize batch high-temperature electric aging test of the discrete crystal filter.
Description
Technical Field
The invention relates to the field of electric aging of discrete crystal filters, in particular to an electric aging implementation device and method.
Background
The discrete crystal filter is a filter device processed based on a plurality of quartz crystal resonators, and is widely applied to industries and fields of communication, aerospace, weaponry and the like due to a series of excellent characteristics of small volume, good frequency selectivity, excellent temperature stability and the like. The purpose of electric aging of the discrete crystal filter is to stabilize the frequency stability and the related performance, and the existing method for electric aging of the discrete crystal filter is to install the discrete crystal filter in a testing device, then put the discrete crystal filter in a high-temperature box, use a network analyzer to carry out periodic signal excitation and monitoring, and finish the electric aging test of the discrete crystal filter. The existing method carries out intermittent electric signal excitation on products in the electric aging process, and meanwhile, although a plurality of products can be simultaneously carried out in one electric aging process, the quantity is limited.
Disclosure of Invention
The invention provides a device and a method for realizing electric aging, which solve the problems that the prior device and the prior method carry out intermittent electric signal excitation on products and the batch of electric aging is insufficient.
In order to solve the problems, the invention is realized as follows:
in a first aspect, an embodiment of the present invention is directed to an electrical burn-in implementing apparatus for a discrete crystal filter, including: the device comprises a crystal oscillator power-up module and a filter test module; the crystal oscillator power-up module is used for generating a sine wave excitation signal with the same center frequency as that of the discrete crystal filter to be tested; the filter test module is used for receiving the sine wave excitation signal and outputting a filtering signal, and the filtering signal is used for high-temperature electric aging test.
Further, the crystal oscillator power-up module comprises: the device comprises a crystal oscillator, a test seat, a test resistor, a test capacitor and a connecting metal needle; the crystal oscillator is detachably arranged on the test seat and used for generating a sine wave signal with the same center frequency as that of the discrete crystal filter to be tested and outputting the sine wave signal from a pin of the test seat; and the sine wave signal output by the pin of the test socket passes through the test resistor, the test capacitor and the connecting metal needle and then outputs the sine wave excitation signal.
Further, the filter testing module comprises: the insulating sheet, the crown spring and the connecting metal needle; the sine wave excitation signal is transmitted to the crown spring through the connecting metal needle to the discrete crystal filter to be tested; the discrete crystal filter to be tested is detachably fixed on the insulating sheet through the crown spring.
Preferably, the crystal oscillator power-up module and the filter test module are mounted on the same circuit board.
Preferably, the apparatus further comprises: a high-temperature electric aging monitoring module; and the high-temperature electric aging monitoring module is used for receiving the filtering signal and carrying out an electric aging test.
Preferably, the crystal oscillator is an SMD7050 crystal oscillator, and the test socket is a DIP14 round hole test socket.
In a second aspect, an embodiment of the present invention further provides an electrical aging implementation method, where the electrical aging implementation apparatus includes the following steps: generating a sine wave excitation signal with the same center frequency as that of the discrete crystal filter to be tested to the discrete crystal filter to be tested; and filtering the sine wave excitation signal and outputting a filtering signal.
Preferably, the method further comprises: and (5) carrying out high-temperature electric aging monitoring.
The beneficial effects of the invention include: the invention adopts continuous electric signal excitation, can batch and simplify the discrete crystal filter electric aging test, and has the characteristics and advantages of quick and convenient operation, high electric aging efficiency and the like; the invention can realize batch electric aging of the discrete crystal filter and continuous excitation signals, and has obvious effect of reinforcing the aging performance of products.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention and not to limit the invention. In the drawings:
FIG. 1 (a) is a general schematic diagram of an embodiment of an electrical aging implementing apparatus;
FIG. 1 (b) is a schematic structural diagram of an embodiment of an electrical aging implementing apparatus;
FIG. 1 (c) is a schematic view showing an assembly relationship of an embodiment of an electric aging implementing apparatus;
fig. 2 is a flow chart of an embodiment of an electrical aging implementation method.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the technical solutions of the present invention will be clearly and completely described below with reference to the specific embodiments of the present invention and the accompanying drawings. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The center frequency of the discrete crystal filter has an aging characteristic, and the magnitude of the change depends mainly on the frequency aging characteristic of the crystal resonator used. When the central frequency of the crystal resonator causes frequency drift due to aging, the central frequency and related parameter indexes of the discrete crystal filter change along with the central frequency, and the electrical performance parameters of the discrete crystal filter are unqualified in severe cases, and the purpose of electrically aging the discrete crystal filter is to stabilize the frequency stability and related performance.
The existing electric aging method of the discrete crystal filter is to install the discrete crystal filter in a testing device, a plurality of products can be installed at one time, but the quantity is limited based on an implementation method, electric signal processing and the like.
The innovation points of the invention are as follows: the invention designs an electric aging implementation device for a discrete crystal filter, which enables the electric aging test of the discrete crystal filter to be batched and simplified by continuously generating electric signal excitation through a crystal oscillator.
The technical solutions provided by the embodiments of the present invention are described in detail below with reference to the accompanying drawings.
Fig. 1 (a) is a general schematic diagram of an embodiment of an electrical burn-in implementation apparatus, fig. 1 (b) is a schematic diagram of a structure of an embodiment of an electrical burn-in implementation apparatus, and fig. 1 (c) is a schematic diagram of an assembly relationship of an embodiment of an electrical burn-in implementation apparatus, which can be used for electrical burn-in testing of a discrete crystal filter.
Referring to fig. 1 (a), an electrical aging implementing device comprises: a crystal oscillator power-up module 1 and a filter test module 2.
The crystal oscillator power-up module is used for generating a sine wave excitation signal with the same center frequency as that of the discrete crystal filter to be tested; the filter test module is used for receiving the sine wave excitation signal and outputting a filtering signal, and the filtering signal is used for high-temperature electric aging test.
It should be noted that by selecting the type of the crystal oscillator in the crystal oscillator power-up module, the crystal oscillator power-up module can generate a sine wave excitation signal having the same center frequency as that of the discrete crystal filter to be tested.
Further, as shown in fig. 1 (b) and fig. 1 (c), the crystal oscillator power-up module includes: the device comprises a crystal oscillator 17, a test seat 11, a test resistor 12, a test capacitor 13 and a connecting metal needle 14; the filter test module comprises: insulating sheet 15, crown spring 16 and connecting metal pins.
In the embodiment of the invention, the crystal oscillator is detachably arranged on the test seat, and the crystal oscillator is used for generating a sine wave signal with the same center frequency as that of the discrete crystal filter to be tested and outputting the sine wave signal from a pin of the test seat; and the sine wave signal output by the pin of the test socket passes through the test resistor, the test capacitor and the connecting metal needle and then outputs the sine wave excitation signal.
In the embodiment of the invention, the sine wave excitation signal is transmitted to the discrete crystal filter to be tested through the connecting metal needle to the crown spring; the discrete crystal filter to be tested is detachably fixed on the insulating sheet through the crown spring.
In the embodiment of the present invention, the crystal oscillator power-up module and the filter test module are mounted on the same circuit board, as shown in fig. 1 (b) and fig. 1 (c), and the crystal oscillator power-up module and the filter test module are mounted on the circuit board 3.
It should be noted that the insulating sheet provides support for the discrete crystal filter to be tested, prevents the short circuit between the base of the discrete crystal filter to be tested and the connector of the circuit board, the crown spring completes the transmission of the electric signal and fixes the discrete crystal filter to be tested, and the connecting metal pin transmits the electric signal output by the discrete crystal filter to be tested to the test board of the high-temperature electric aging monitoring device of the crystal oscillator.
When the method is used, firstly, a crystal oscillator with the same frequency as the central frequency of the discrete crystal filter to be tested, such as an SMD7050 crystal oscillator, is selected; then, the discrete crystal filter to be tested is installed on the insulating sheet, and the SMD7050 crystal oscillator with the same frequency is installed in the test seat.
Thirdly, the electric aging realizing device provided with the discrete crystal filter to be tested and the SMD7050 crystal oscillator with the same frequency is arranged on a test board of the high-temperature electric aging monitoring equipment of the crystal oscillator.
Fourthly, a test board of the crystal oscillator high-temperature electric aging monitoring equipment provided with the electric aging realizing device is placed on a test frame of a high-temperature box of the crystal oscillator high-temperature electric aging monitoring system, then the product electric aging racking operation is carried out on monitoring software, and the crystal oscillator high-temperature electric aging monitoring system carries out frequency monitoring twice every day.
And finally, after the electric aging is finished, taking out the test board of the high-temperature box of the high-temperature electric aging monitoring system of the crystal oscillator, taking the electric aging realization device off the test board, and respectively taking away the discrete crystal filter to be tested and the SMD7050 crystal oscillator with the same frequency.
The device of the invention also comprises: a high-temperature electric aging monitoring module; and the high-temperature electric aging monitoring module is used for receiving the filtering signal and carrying out the electric aging test.
It should be noted that the crystal oscillator high-temperature electric aging monitoring device and the high-temperature electric aging monitoring system are all general devices for performing an electric aging test, and the two devices form a high-temperature electric aging monitoring module in the embodiment of the invention.
It should be noted that crystal oscillators with different models are selected according to the central frequency of the discrete crystal filter to be tested, and in order to ensure the reuse of the device of the present invention, the crystal oscillator is detachably mounted on the test base, and the discrete crystal filter to be tested is detachably mounted on the insulating sheet.
In the embodiment of the invention, the SMD7050 crystal oscillator is selected as the crystal oscillator, and the test seat is a DIP14 round hole test seat. It should be noted that the crystal oscillator and the test socket may be of other types, and are not limited herein.
The electric aging implementation device for the discrete crystal filter organically connects the crystal oscillator and the discrete crystal filter, solves the problem of continuous electric signal excitation of electric aging of the discrete crystal filter, is small and convenient in structure, and can be used for placing the discrete crystal filter on a test board of a high-temperature electric aging monitoring system of the crystal oscillator in batches to realize batch electric aging tests.
Fig. 2 is a flowchart embodiment of an electrical aging implementation method, and an electrical aging implementation method using the electrical aging implementation apparatus of the embodiment of the present invention specifically includes the following steps:
In step 101, the sine wave excitation signal is generated by the crystal oscillator power-up module.
And 102, filtering the sine wave excitation signal and outputting a filtering signal.
In step 102, the sine wave excitation signal passes through a discrete crystal filter to be tested and then outputs the filtering signal, and the output filtering signal can be used for high-temperature electrical aging test.
The method of the embodiment of the present invention may further include the following step 103.
And 103, carrying out high-temperature electric aging monitoring.
In step 103, the high temperature electrical aging monitoring is performed by the high temperature electrical aging monitoring module.
It should be noted that the method used in the embodiment of the present invention has been described in detail in the first embodiment of the present invention, and will not be repeated here, and the method in the first embodiment of the present invention can be used in the present embodiment.
It is to be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrases "comprising a," "8230," "8230," or "comprising" does not exclude the presence of other like elements in a process, method, article, or apparatus comprising the element.
The above description is only an example of the present invention, and is not intended to limit the present invention. Various modifications and alterations to this invention will become apparent to those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the scope of the claims of the present invention.
Claims (6)
1. An electrical burn-in implementation for a discrete crystal filter, comprising: the device comprises a crystal oscillator power-up module and a filter test module;
the crystal oscillator power-up module is used for generating a sine wave excitation signal with the same central frequency as that of the discrete crystal filter to be tested;
the filter test module is used for receiving the sine wave excitation signal and outputting a filtering signal, and the filtering signal is used for high-temperature electrical aging test;
the crystal oscillator power-up module comprises: the device comprises a crystal oscillator, a test seat, a test resistor, a test capacitor and a connecting metal needle;
the crystal oscillator is detachably arranged on the test seat and used for generating a sine wave signal with the same center frequency as that of the discrete crystal filter to be tested and outputting the sine wave signal from a pin of the test seat;
the sine wave signal output by the pin of the test socket passes through the test resistor, the test capacitor and the connecting metal needle and then outputs the sine wave excitation signal;
the filter test module comprises: the insulating sheet, the crown spring and the connecting metal needle;
the sine wave excitation signal is transmitted to the crown spring through the connecting metal needle to the discrete crystal filter to be tested;
the discrete crystal filter to be tested is detachably fixed on the insulating sheet through the crown spring;
the insulating piece provides the support for the discrete crystal filter that awaits measuring, prevents that the discrete crystal filter base that awaits measuring and circuit board connector from short circuit, and the crown spring accomplishes the signal of telecommunication transmission and fixes the discrete crystal filter that awaits measuring, connects the metal needle with the discrete crystal filter output signal of telecommunication transmission to the survey test panel that awaits measuring.
2. The electrical burn-in apparatus of claim 1 wherein said crystal energizing module and said filter testing module are mounted on the same circuit board.
3. The electrical burn realization apparatus of claim 1, further comprising: a high-temperature electric aging monitoring module;
and the high-temperature electric aging monitoring module is used for receiving the filtering signal and carrying out an electric aging test.
4. The electrical burn-in apparatus of claim 1 wherein said crystal oscillator is an SMD7050 crystal oscillator and said test socket is a DIP14 circular test socket.
5. An electric aging implementation method using the electric aging implementation apparatus of any one of claims 1 to 4, characterized by comprising the steps of:
generating a sine wave excitation signal with the same central frequency as that of the discrete crystal filter to be tested to the discrete crystal filter to be tested;
and filtering the sine wave excitation signal and outputting a filtering signal.
6. The electrical aging implementation of claim 5, further comprising:
and (5) carrying out high-temperature electric aging monitoring.
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