CN109239569A - A kind of quartz resonator test method - Google Patents
A kind of quartz resonator test method Download PDFInfo
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- CN109239569A CN109239569A CN201811220949.7A CN201811220949A CN109239569A CN 109239569 A CN109239569 A CN 109239569A CN 201811220949 A CN201811220949 A CN 201811220949A CN 109239569 A CN109239569 A CN 109239569A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
Abstract
The present invention discloses a kind of quartz resonator test method, and the test method includes: to form the test condition of preset quartz resonator；Quartz resonator to be measured is connected between the frequency adjustment module and the frequency bandspread network module, and passes through the first signal end input test signal；The signal for obtaining the output of second signal end, the performance of quartz resonator is determined by the signal of output.Actual components in oscillation circuit by being connected in quartz resonator branch by the present invention, achieve the purpose that real simulation quartz resonator loading condition, the load type in commercial quartz resonator test device is expanded, the accuracy and efficiency for judging whether quartz resonator is applicable in can be improved, and, test loop of the invention can make subelement fail by means such as short circuits, so as to simulate different true environments, and then there is wider array of applicability, last the device of the invention is simple and easy to operate, accuracy is high, has stronger practicability.
Description
Technical field
The present invention relates to crystal oscillator technologies fields.More particularly, to quartz resonator test method.
Background technique
Quartz resonator is core element in crystal oscillator, and performance largely decides entire oscillator
Performance.Common Colpitts oscillation circuit in crystal oscillator as shown in Figure 1, resonant tank by quartz resonator and two
Feedback capacity composition.The steady operation of oscillating circuit needs quartz resonator to have good resonance characteristic, i.e., in equivalent load
Under the conditions of the resonance frequency of quartz resonator should be near oscillator operating frequency, and undesire frequency is few as far as possible, at undesire frequency
Amplitude it is low as far as possible.In order to realize this purpose, the equivalent capacity CL of capacitor Cb1 and Cb2 are usually first calculated, then using commercialization
Quartz resonator parameter test device carries out the survey of quartz resonator parameter under conditions of quartz resonator Gx load capacitance is CL
Examination, test circuit are as shown in Figure 2.
In most practical oscillating circuit, when in order to realize the functions such as frequency adjustment, overtone mode inhibition, resonance is returned
It will also include frequency modulation capacitor and inductance in road, and combine the mode suppression circuit constituted in series and parallel by inductance and capacitor, quartz
Much more complex in resonator loading condition ratio Fig. 1, the equivalent load capacitance of quartz resonator is difficult accurately to calculate, and carries out quartz
The commercial device of resonator parameter testing is only capable of providing capacitive load.Also, the parasitic frequency between main resonance of quartz resonator
The characteristics such as rate difference and amplitude difference can all change with the variation that quartz resonator loads.Therefore, the test-strips of quartz resonator
Part and actual service conditions gap are larger, can not obtain accurate test result.When the parasitic smaller and distance of quartz resonator
Main resonatnt frequency farther out when, be not easy to find using commercial test device, sometimes for confirmation parasitics may need repeatedly it is micro-
Load capacitance is adjusted, time-consuming, low efficiency, causes the influence for undesire frequency that can not appropriately be assessed, can not arrange in time
Except abnormal phenomenon such as parasitogenic frequency hoppings, product qualification rate and use reliability are seriously affected.
Summary of the invention
At least one of in order to solve the above-mentioned technical problem, one aspect of the present invention provides a kind of quartz resonator
Test method, the test circuit include:
It can access the first signal end and the second signal end of quartz resonator parameter testing jig,
Successively be coupled in frequency adjustment module between the first signal end and second signal end, frequency bandspread network module,
Voltage-controlled or electric tune network module and inhibition network module,
Wherein, quartz resonator to be measured is connected between the frequency adjustment module and the frequency bandspread network module；
The described method includes:
The frequency of oscillation of the test circuit is adjusted, by the frequency bandspread network mould by the frequency adjustment module
Block broaden the test circuit can operating frequency range, by described voltage-controlled or electric tunes network module adjustment crystal oscillator with
The frequency range of additional control voltage change inhibits the overtone of quartz resonator and B mould to vibrate by the inhibition network module,
To form the test condition of preset quartz resonator；
Quartz resonator to be measured is connected between the frequency adjustment module and the frequency bandspread network module, and
Pass through the first signal end input test signal；
The signal for obtaining the output of second signal end, the performance of quartz resonator is determined by the signal of output.
Preferably, the test circuit further comprises:
Isolation module is isolated for the direct current signal of first signal end and external circuit；And/or the second signal
The direct current signal of end and external circuit is isolated.
Preferably, the frequency adjustment module includes adjusting capacitor.
Preferably, the frequency bandspread network module includes:
The first inductance and tuning capacitance being arranged in parallel.
Preferably, described voltage-controlled or electric tune network module includes:
Be connected on the frequency bandspread network module and inhibit network module between adjusting capacitor and at least one first
Capacitor；
It is connected in the varactor at the both ends of at least one first capacitor in parallel；And
It is connected to the first resistor and second resistance of described varactor one end, the first resistor is far from described
Input voltage signal is accessed in one end of varactor, and the second resistance accesses ground connection far from one end of the varactor
End.
Preferably, described voltage-controlled or electric tune network module includes:
It is connected to the frequency bandspread network module and the varactor inhibited between network module；And
It is connected to the first resistor and second resistance of described varactor one end, the first resistor is far from described
Input voltage signal is accessed in one end of varactor, and the second resistance accesses ground connection far from one end of the varactor
End.
Preferably, described voltage-controlled or electric tune network module further include: respectively separate with the first resistor and second resistance
Second capacitor of one end connection of the varactor.
Preferably, the inhibition network module includes:
With the described voltage-controlled or electric third capacitor for adjusting series network and inhibition inductance；
It is connected in second inductance of the inhibition inductance far from third capacitor one end in parallel and is cascaded
4th capacitor and third inductance, the other end and institute of second inductance and the 4th capacitor and third inductance that are cascaded
State isolation module connection.
Preferably, the inhibition network module includes:
With the described voltage-controlled or electric third capacitor for adjusting series network and inhibition inductance；
It is connected in inhibition second inductance and fourth capacitor of the inductance far from third capacitor one end in parallel, it is described
The other end of second inductance and the 4th capacitor is connect with the isolation module.
Preferably, the inhibition network module includes:
With the described voltage-controlled or electric third capacitor for adjusting series network；
The 4th capacitor and the third electricity for being connected in second inductance of third capacitor one end in parallel and being cascaded
The other end of sense, second inductance and the 4th capacitor and third inductance that are cascaded is connect with the isolation module.
Beneficial effects of the present invention are as follows:
The present invention provides a kind of quartz resonator test method, by the way that the actual components in oscillation circuit are connected on quartz
In resonator branch, achieve the purpose that real simulation quartz resonator loading condition, expands commercial quartz resonator test dress
Load type in setting, and can quickly find the parasitics near working frequency, it can be improved and judge whether quartz resonator fits
Accuracy and efficiency, also, circuit of the invention can make subelement fail by means such as short circuits, so as to
Different true environments to be simulated, and then there is wider array of applicability, last the device of the invention is simple and easy to operate, and accuracy is high,
With stronger practicability.
Detailed description of the invention
Specific embodiments of the present invention will be described in further detail with reference to the accompanying drawing.
Fig. 1 shows the oscillating circuit schematic illustration of background technique.
Fig. 2 shows the quartz resonators of background technique to test circuit diagram.
Fig. 3 shows the electrical block diagram that circuit is tested in the embodiment of the present invention.
Fig. 4 shows one of test device schematic diagram of the embodiment of the present invention.
Fig. 5 shows the two of the test device schematic diagram of the embodiment of the present invention.
Fig. 6 shows the method flow schematic diagram that the embodiment of the present invention is tested using the test circuit.
Specific embodiment
In order to illustrate more clearly of the present invention, the present invention is done further below with reference to preferred embodiments and drawings
It is bright.Similar component is indicated in attached drawing with identical appended drawing reference.It will be appreciated by those skilled in the art that institute is specific below
The content of description is illustrative and be not restrictive, and should not be limited the scope of the invention with this.
The various sectional views for disclosing embodiment according to the present invention are shown in the attached drawings.These figures are not drawn to scale
, wherein some details are magnified for the purpose of clear expression, and some details may be omitted.It is shown in the drawings
Various regions, the shape of layer and relative size, positional relationship between them are merely exemplary, in practice may be due to system
It makes tolerance or technical restriction and is deviated, and those skilled in the art may be additionally designed as required with not similar shape
Shape, size, the regions/layers of relative position.
The test condition of quartz resonator and actual service conditions gap are larger, can not obtain accurate test result, right
It can not appropriately be assessed in the influence of undesire frequency, lead to that the abnormal phenomenon such as parasitogenic frequency hopping cannot be excluded in time,
Seriously affect product qualification rate and use reliability.
In view of this, the embodiment of the present invention provides a kind of test circuit for quartz resonator, in conjunction with Fig. 3, comprising: can
Access the first signal end and second signal end, first signal end and the second signal end of quartz resonator parameter testing jig
One of input signal, another output signal；First signal end accesses quartz resonator parameter by the first contact pin X1
Quartz resonator parameter testing jig is accessed by the second contact pin X2 in test fixture, second signal end.First is successively coupled in insert
Frequency between needle X1 and the second contact pin X2 adjusts mould 1, frequency bandspread network module 2, voltage-controlled or electric tunes network module 3 and presses down
Network module 4 processed, wherein quartz resonator to be measured is connected to the frequency adjustment module 1 and the frequency bandspread network module 2
Between；The frequency adjustment module 1 is used to adjust the resonance frequency of the test circuit；The frequency bandspread network module 2 is used
In broaden it is described test circuit can resonant frequency range；Described voltage-controlled or electric tune network module 3 is for adjusting crystal oscillator
With the frequency range of additional control voltage change；The inhibition network module 4 is for inhibiting the unwanted overtone of quartz resonator
It is vibrated with B mould etc..
The present invention provides a kind of test circuit for quartz resonator, by the way that the actual components in oscillation circuit are connected
In quartz resonator branch, achievees the purpose that real simulation quartz resonator loading condition, expanded commercial quartz resonator
The accuracy and efficiency for judging whether quartz resonator is applicable in can be improved in load type in test device, also, of the invention
Circuit can make subelement fail by means such as short circuits, so as to simulate different true environments, and then have more
Wide applicability, last the device of the invention is simple and easy to operate, and accuracy is high, has stronger practicability.
In a specific embodiment, the frequency adjustment module includes adjusting capacitor (the capacitor C2 in figure).
Preferably, the test circuit further comprises: isolation module 5, is used for first signal end and/or output end
It is isolated with the direct current signal of external circuit.That is, isolation mode can be set at least one of the first signal end and second signal end
Block.In other words, in a specific embodiment, one of them of the first signal end or output end are provided with isolation module,
Or first signal end and second signal end be provided with isolation module.Preferably, isolation module can be isolation capacitance, example
Such as, the C3 in figure be mainly and C2 be used for together it is straight between isolation test device and commercial quartz resonator parameter testing jig
Signal is flowed, to ensure that test device and commercial fixture will not cause unnecessary damage due to direct current from each other.
Further, in one embodiment, the frequency bandspread network module includes: the first inductance being arranged in parallel
(Lt in figure) and inhibit capacitor (Cs in figure).
In an alternative embodiment, it can choose the first inductance (figure that a biggish inductance replaces being arranged in parallel
In Lt) and inhibit capacitor (Cs in figure).
In addition, in the embodiment of figure 3, described voltage-controlled or electric tune network module includes: to be connected on the frequency bandspread
Adjusting capacitor (Ct in figure) and at least one first capacitor (C5 in figure) between network module and inhibition network module；And
Connection is connected to the varactor (D1 in figure) at the both ends of at least one first capacitor；And it is connected to the change
Hold the first resistor (R1 in figure) and second resistance (R2 in figure) of diode one end, the first resistor is far from the transfiguration
Input voltage signal (Vc) is accessed in one end of diode, and the second resistance accesses ground connection far from one end of the varactor
It holds (GND).
But as shown in connection with fig. 3, capacitor Ct and C5 needs to be adjusted according to desired voltage-controlled range in use.?
In some cases, Ct may be replaced with short-circuit line, and C5 may be replaced with open circuit, and voltage-controlled range ratio Ct and C5 exists at this time
Shi Yao great.
Therefore, in another embodiment not shown in the figure, described voltage-controlled or electric tune network module includes: to be connected to institute
State frequency bandspread network module and the varactor inhibited between network module；And it is connected to the transfiguration two
The first resistor and second resistance of pole pipe one end, the first resistor access input voltage far from one end of the varactor
Signal, the second resistance access ground terminal far from one end of the varactor.
In addition, the second capacitor (C6 in figure), i.e. institute can be set in order to filter out the interference such as the ripple on control voltage Vc
State voltage-controlled or electric tune network module further include: with the first resistor and second resistance respectively far from the varactor one
Hold the second capacitor of connection.Further, in the embodiment illustrated in figure 3, the inhibition network module includes: and the pressure
Control or electricity adjust the third capacitor (C4 in figure) of series network and inhibit inductance (Ls in figure)；It is connected in the inhibition electricity in parallel
Feeling far from third capacitor one end the second inductance (L2 in figure) and the 4th capacitor and third inductance that are cascaded
The other end and the isolation mode of (L1 in figure), second inductance and the 4th capacitor and third inductance that are cascaded
Block connection.
The embodiment is more comprehensively to inhibit latticed form, but substantially, inhibit network module that can also use other
Form, for example, in an alternative embodiment, the inhibition network module includes: and described voltage-controlled or electric tune series network
Third capacitor and inhibit inductance；Be connected in parallel second inductance of the inhibition inductance far from third capacitor one end and
The other end of 4th capacitor, second inductance and the 4th capacitor is connect with the isolation module.
Alternatively, in another alternative embodiment, the inhibition network module includes: and described voltage-controlled or electric tune network
Concatenated third capacitor；It is connected in parallel second inductance of third capacitor one end and the 4th capacitor being cascaded and
The other end and the isolation module of three inductance, second inductance and the 4th capacitor and third inductance that are cascaded connect
It connects.
The specific structure of above-mentioned three kinds of inhibition network module can according to need setting, and it will not go into details by the present invention.
Fig. 3 is described in detail below, circuit of the invention includes: quartz resonator G1, inductance Lt and Ls, capacitor Ct
It (is printing in the present embodiment with Cs, inductance L1 and L2, capacitor C1~C6, varactor D1, resistance R1 and R2, the first contact pin
The first signal end of plate contact pin) X1 and the second contact pin (being output end contact pin in the present embodiment) X2, voltage-controlled positive voltage terminal binding post connect
Enter input voltage signal Vc, voltage-controlled voltage negativing ending grounding column access ground terminal GND, stud and nut.One end of capacitor C2 is to survey
The first signal end of circuit is tried, commercial quartz resonator parameter test device is connected to by printed board the first signal end contact pin X1
One end.The other end of capacitor C2 is connect with one end of quartz resonator jack G1.The other end and electricity of quartz resonator jack G1
Feel one end connection of Lt.The other end of inductance Lt is connect with one end of capacitor Ct.Capacitor Cs is in parallel with inductance Lt.Capacitor Ct's is another
One end is connect with one end of one end of capacitor C5, one end of varactor D1, resistance R1.The other end of capacitor C5, transfiguration two
The other end of pole pipe D1 and one end of resistance R2 are connect with one end of capacitor C4.The other end of resistance R1 and one end of capacitor C6 connect
It connects, and is connected to voltage-controlled positive voltage terminal binding post.Voltage-controlled positive voltage terminal binding post Vc is connected with the anode of additional voltage-controlled power supply.Electricity
The other end of resistance R2 is connect with the other end of capacitor C6, and is connect with earthing rod.The negative terminal phase of earthing rod and additional voltage-controlled power supply
Even.The other end of capacitor C4 is connect with inductance Ls.The other end of inductance Ls is connect with one end of one end of capacitor C1 and inductance L2.
The other end of capacitor C1 is connect with one end of inductance L1.One end of the other end of inductance L1 and the other end of inductance L2 and capacitor C3
Connection.The other end of capacitor C3 is test circuit second signal end, is connected to commercialization by printed board second signal end contact pin X2
The other end of quartz resonator parameter test device.The edge of printed board is placed on commercial test by stud and nut support
Above fixture, so that quartz resonator jack position is not too near on the commercial test fixture of printed board distance.When test, quartz is humorous
The device that shakes is inserted into the corresponding position of quartz resonator jack G1, and printed board input terminal contact pin X1 and output end contact pin X2 are inserted into quotient
With in the corresponding jack of quartz resonator parameter testing jig.
Specific works state of the invention is described in detail below:
It (1), can be from times selected in Fig. 3 in C2, Ct, C5, C4, C3 when needing to connect capacitive load for quartz resonator
It anticipates a position, places the load capacitance of requirement, short-circuit lines or 0 Ω resistance are placed in four positions of remaining non-selected.Meanwhile
The position of Lt, Ls, L2 are replaced with short-circuit line, the position open circuit of D1, R1, R2, C6, C1 and L1, Cs.
(2) when needing to connect inductive load for quartz resonator, any one position that may be selected in Lt, Ls, L2 is placed
Short-circuit line is placed in inductance, remaining another position.Meanwhile C2, Ct, C5, C4 and C3 are replaced with short-circuit line or 0 Ω resistance, Cs,
It opens a way the position of C1, L1, D1, R1, R2, C6.
(3) it when needing to connect resistive load for quartz resonator, may be selected in C2, Lt, Ct, C5, C4, Ls, L2 and C3
Resistance is placed in any one position, and six position short-circuit lines of remaining non-selected or 0 Ω resistance replaces, at the same Cs, C1, L1, D1,
It opens a way the position of R1, R2, C6.
It (4), can be according to actual circuit form when needing accurately to connect the load in real work circuit for quartz resonator
The corresponding position in Fig. 3 is selected to place corresponding element.If there is no electric frequency adjustment or voltage-controlled function in actual circuit, only
The position of D1, R1, R2, C6 need to be opened a way, the short circuit of the position Ct, C5.
Another aspect of the present invention provides a kind of quartz resonator test method, is surveyed using above-mentioned quartz resonator circuit
Examination, the circuit of testing includes: the first contact pin and the second contact pin in pluggable quartz resonator parameter testing jig, successively coupling
Connect frequency adjustment module between the first contact pin and the second contact pin, frequency bandspread network module, voltage-controlled or electric tune network module
And inhibit network module and isolation module；Quartz resonator to be measured is connected to the frequency adjustment module and the frequency bandspread
Between network module；In conjunction with Fig. 6, the test method includes:
S1: the resonance frequency of the test circuit is adjusted, by the frequency bandspread net by the frequency adjustment module
Network module broaden the test circuit can resonant frequency range, by described voltage-controlled or electric tunes network module adjustment crystal oscillation
Device inhibits the overtone of quartz resonator, B mould to shake with the frequency range of additional control voltage change, by the inhibition network module
It is dynamic, to form the test condition of preset quartz resonator；
S2: quartz resonator to be measured is connected between the frequency adjustment module and the frequency bandspread network module,
And pass through the first signal end input test signal；
S3: the signal of second signal end output is obtained, the performance of quartz resonator is determined by the signal of output.
It can more fully reflect quartz resonator in oscillating circuit compared to conventional test methodologies using this test method
Adaptability, find oscillating circuit abnormal phenomenon, avoid for bad quartz resonator being assembled in oscillating circuit and cause frequency not
The problems such as standard, frequency hopping, to improve crystal oscillator functional reliability.It can be according to practical oscillating circuit form, by survey
It tries element in circuit and carries out short circuit appropriate or open circuit, the conversion of test circuit can be completed, it is simple and easy to operate, make to test circuit
Adaptability with higher.
It is different can to check frequency hopping etc. in oscillating circuit while guaranteeing on-line testing quartz resonator parameter in time by the present invention
Often occur as.Circuit is simple and easy to operate, and accuracy is high, has stronger practicability.
Further, as shown in Figure 4 and Figure 5, the present invention also provides it is a kind of for quartz resonator test test device,
Including quartz resonator parameter testing jig 6, and such as the test circuit that first aspect present invention provides, the of the test circuit
One contact pin X1 and the second contact pin X2 are inserted into corresponding jack on the quartz resonator parameter testing jig 6 respectively, so that
The test circuit is electrically connected with quartz resonator parameter testing jig formation.
The quartz resonator parameter test device includes printed circuit board 7, and production has above-mentioned test on printed circuit board
Circuit.
Obviously, test device of the invention should have effect possessed by above-mentioned test circuit, and details are not described herein.
Belong to " first ", " second " etc. in description and claims of this specification and above-mentioned attached drawing are for distinguishing
Different objects, is not use to describe a particular order.In addition, term " includes " and " having " and their any deformations, meaning
Figure, which is to cover, non-exclusive includes.Such as contain process, method, system, product or the device of a series of steps or units
It is not limited to listed step or unit, but optionally further comprising the step of not listing or unit, or optionally also
Include the steps that or unit intrinsic for these process, methods or device.
Obviously, the above embodiment of the present invention be only to clearly illustrate example of the present invention, and not be pair
The restriction of embodiments of the present invention may be used also on the basis of the above description for those of ordinary skill in the art
To make other variations or changes in different ways, all embodiments can not be exhaustive here, it is all to belong to this hair
The obvious changes or variations that bright technical solution is extended out are still in the scope of protection of the present invention.
Claims (10)
1. a kind of quartz resonator test method, which is characterized in that wherein, test circuit includes:
It can access the first signal end and the second signal end of quartz resonator parameter testing jig, first signal end is wherein
One input signal, another output signal；
Successively it is coupled in frequency adjustment module between the first signal end and second signal end, frequency bandspread network module, voltage-controlled
Or electricity adjusts network module and inhibits network module,
Wherein, quartz resonator to be measured is connected between the frequency adjustment module and the frequency bandspread network module；
The described method includes:
The resonance frequency of the test circuit is adjusted, by the frequency bandspread network module exhibition by the frequency adjustment module
The width test circuit can resonant frequency range, by described voltage-controlled or electric tunes network module adjustment crystal oscillator with additional
It controls the frequency range of voltage change, inhibit the overtone of quartz resonator and B mould to vibrate by the inhibition network module, with shape
At the test condition of preset quartz resonator；
Quartz resonator to be measured is connected between the frequency adjustment module and the frequency bandspread network module, and is passed through
First signal end input test signal；
The signal for obtaining the output of second signal end, the performance of quartz resonator is determined by the signal of output.
2. test method according to claim 1, which is characterized in that the test circuit further comprises:
Isolation module is isolated for the direct current signal of first signal end and external circuit；And/or the second signal end and
The direct current signal of external circuit is isolated.
3. test method according to claim 1, which is characterized in that the frequency adjustment module includes adjusting capacitor.
4. test method according to claim 1, which is characterized in that the frequency bandspread network module includes:
The first inductance and tuning capacitance being arranged in parallel.
5. test method according to claim 1, which is characterized in that described voltage-controlled or electric tune network module includes:
It is connected on the frequency bandspread network module and inhibits the adjusting capacitor and at least one first capacitor between network module；
It is connected in the varactor at the both ends of at least one first capacitor in parallel；And
It is connected to the first resistor and second resistance of described varactor one end, the first resistor is far from the transfiguration
Input voltage signal is accessed in one end of diode, and the second resistance accesses ground terminal far from one end of the varactor.
6. test method according to claim 1, which is characterized in that described voltage-controlled or electric tune network module includes:
It is connected to the frequency bandspread network module and the varactor inhibited between network module；And
It is connected to the first resistor and second resistance of described varactor one end, the first resistor is far from the transfiguration
Input voltage signal, one end access ground connection letter of the second resistance far from the varactor are accessed in one end of diode
Number.
7. test method according to claim 5 or 6, which is characterized in that described voltage-controlled or electric tune network module further include:
With the first resistor and second resistance the second capacitor that respectively one end far from the varactor is connect.
8. test method according to claim 1, which is characterized in that the inhibition network module includes:
With the described voltage-controlled or electric third capacitor for adjusting series network and inhibition inductance；
It is connected in second inductance for inhibiting inductance far from third capacitor one end and the be cascaded the 4th in parallel
The other end of capacitor, third inductance, second inductance and the 4th capacitor and third inductance that are cascaded and it is described every
It is connected from module.
9. test method according to claim 1, which is characterized in that the inhibition network module includes:
With the described voltage-controlled or electric third capacitor for adjusting series network and inhibition inductance；
It is connected in second inductance and the 4th capacitor of third capacitor one end, second inductance and the 4th capacitor in parallel
The other end connect with the isolation module.
10. test method according to claim 1, which is characterized in that the inhibition network module includes:
With the described voltage-controlled or electric third capacitor for adjusting series network；
The 4th capacitor, the third inductance for being connected in second inductance of third capacitor one end in parallel and being cascaded, institute
The other end of the 4th capacitor and third inductance stating the second inductance and be cascaded is connect with the isolation module.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109828141A (en) * | 2019-02-27 | 2019-05-31 | 西北工业大学 | Highly sensitive voltage measuring apparatus and measurement method based on weak coupling micromechanical resonator |
| CN112698172A (en) * | 2020-11-27 | 2021-04-23 | 北京无线电计量测试研究所 | Device and method for realizing electric aging |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030179008A1 (en) * | 2002-03-19 | 2003-09-25 | Transat Corp. | Temperature test system with test rings concentric with a centrifugal fan |
| CN106134453B (en) * | 2011-12-22 | 2014-07-09 | 北京遥测技术研究所 | A kind of measuring system of quartz resonator impedance operator parameter |
| CN104734658A (en) * | 2013-12-24 | 2015-06-24 | 精工爱普生株式会社 | Oscillator, electronic apparatus, and moving object |
| US20170212399A1 (en) * | 2013-06-16 | 2017-07-27 | Tang System | W5RS: Anlinx & Milinx & Zilinx for Green Energy Smart Window |
| CN107703437A (en) * | 2017-09-14 | 2018-02-16 | 西安交通大学 | A kind of high frequency body modal resonance device method of testing based on half frequency Electrostatic Excitation |
| CN107991561A (en) * | 2017-11-29 | 2018-05-04 | 北京无线电计量测试研究所 | A kind of ageing properties test device and method for quartz-crystal resonator |
-
2018
- 2018-10-19 CN CN201811220949.7A patent/CN109239569B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030179008A1 (en) * | 2002-03-19 | 2003-09-25 | Transat Corp. | Temperature test system with test rings concentric with a centrifugal fan |
| CN106134453B (en) * | 2011-12-22 | 2014-07-09 | 北京遥测技术研究所 | A kind of measuring system of quartz resonator impedance operator parameter |
| US20170212399A1 (en) * | 2013-06-16 | 2017-07-27 | Tang System | W5RS: Anlinx & Milinx & Zilinx for Green Energy Smart Window |
| CN104734658A (en) * | 2013-12-24 | 2015-06-24 | 精工爱普生株式会社 | Oscillator, electronic apparatus, and moving object |
| CN107703437A (en) * | 2017-09-14 | 2018-02-16 | 西安交通大学 | A kind of high frequency body modal resonance device method of testing based on half frequency Electrostatic Excitation |
| CN107991561A (en) * | 2017-11-29 | 2018-05-04 | 北京无线电计量测试研究所 | A kind of ageing properties test device and method for quartz-crystal resonator |
Non-Patent Citations (3)
| Title |
|---|
| JING NIE: ""Dew point measurement using dual quartz crystal resonator sensor "", 《SENSORS AND ACTUATORS B: CHEMICAL》 * |
| 于振欢: ""石英晶体自动测试及分选系统设计"", 《计算机测量与控制》 * |
| 倪厚强: ""陶瓷谐振器特性参数测试方法研究"", 《电子工程师》 * |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109828141A (en) * | 2019-02-27 | 2019-05-31 | 西北工业大学 | Highly sensitive voltage measuring apparatus and measurement method based on weak coupling micromechanical resonator |
| CN109828141B (en) * | 2019-02-27 | 2021-02-02 | 西北工业大学 | High-sensitivity voltage measuring device and method based on weak coupling micromechanical resonator |
| CN112698172A (en) * | 2020-11-27 | 2021-04-23 | 北京无线电计量测试研究所 | Device and method for realizing electric aging |
| CN112698172B (en) * | 2020-11-27 | 2023-03-21 | 北京无线电计量测试研究所 | Device and method for realizing electric aging |
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