CN112649177A - Laser beam verticality and spot ovality rapid analysis system and test method thereof - Google Patents

Laser beam verticality and spot ovality rapid analysis system and test method thereof Download PDF

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Publication number
CN112649177A
CN112649177A CN202011528046.2A CN202011528046A CN112649177A CN 112649177 A CN112649177 A CN 112649177A CN 202011528046 A CN202011528046 A CN 202011528046A CN 112649177 A CN112649177 A CN 112649177A
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China
Prior art keywords
mask
optical cable
transmission optical
laser transmission
laser
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高放
张先明
丁建武
刘进辉
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Guanghui Shanghai Laser Technology Co ltd
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Guanghui Shanghai Laser Technology Co ltd
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Priority to CN202011528046.2A priority Critical patent/CN112649177A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

The invention discloses a laser beam verticality and spot ovality rapid analysis system, which comprises: the laser transmission optical cable calibration mechanism is used for fixing the laser transmission optical cable and calibrating a central shaft of the output end of the laser transmission optical cable; the semi-transparent mask is arranged right in front of the laser transmission optical cable calibration mechanism; a mask driving mechanism for driving the translucent mask to reciprocate along the central axis direction; a proximity switch mechanism disposed on one side of the translucent mask; the imaging mechanism is arranged right in front of the semitransparent mask and connected with the proximity switch mechanism; and the image analysis module is used for receiving the image shot by the imaging mechanism, processing the received image and calculating the verticality and the ellipticity of the light beam of the laser transmission optical cable. The test method of the laser beam verticality and light spot ovality rapid analysis system is further disclosed. The invention has the advantages of simple structure, low preparation cost, high testing efficiency and more convenient maintenance.

Description

Laser beam verticality and spot ovality rapid analysis system and test method thereof
Technical Field
The invention relates to the technical field of fiber laser, in particular to a laser beam verticality and light spot ovality rapid analysis system and a test method thereof.
Background
With the development of laser technology, lasers are widely applied to various industries, and the beam quality of the lasers is always an important parameter of the lasers, such as the perpendicularity, the spot ovality, the beam divergence, the energy distribution and the like of the laser beams. For a laser transmission optical cable (QBH), the verticality and the spot ovality only need to be measured quickly. The existing common mode is to adopt a beam quality analyzer to comprehensively detect the beam quality of the laser transmission optical cable, and the defects are as follows:
1. the beam quality analyzer consumes a long time in the beam quality analysis process;
2. the light beam quality analyzer can work under the environment and hardware conditions of an optical platform, a collimating mirror, a spectroscope, a heat dissipation black body, a black room and the like when the light beam quality analyzer performs light beam quality analysis;
3. the light beam quality analyzer needs the matching of a collimating mirror and a spectroscope, and both the lens and the light beam quality analyzer need very professional personnel to carry out operation arrangement and maintenance;
4. most of the existing light beam quality analyzers rely on imports, and the price cost is extremely high;
5. if the beam quality analyzer is frequently used, factory return calibration and maintenance are required, the calibration and maintenance cost is high, and the period is long;
6. the existing beam quality analyzer has many detection functions, can provide detailed parameters for the beam quality analysis of a laser, and wastes resources too much for a laser transmission optical cable or a certain optical accessory which only needs to be analyzed in a small amount.
To this end, the applicant has sought, through useful research and research, a solution to the above-mentioned problems, in the context of which the technical solutions to be described below have been made.
Disclosure of Invention
One of the technical problems to be solved by the present invention is: aiming at the defects of the prior art, the laser beam verticality and spot ellipticity rapid analysis system is simple in structure, low in preparation cost, high in test and analysis effects and convenient to overhaul and maintain.
The second technical problem to be solved by the present invention is: the test method of the laser beam verticality and light spot ovality rapid analysis system is provided.
The invention relates to a laser beam verticality and spot ovality rapid analysis system as a first aspect, which comprises:
the laser transmission optical cable calibration mechanism is used for fixing the laser transmission optical cable and calibrating a central shaft of the output end of the laser transmission optical cable;
the semi-transparent mask is arranged right in front of the laser transmission optical cable calibration mechanism;
a mask driving mechanism for driving the translucent mask to reciprocate along the central axis direction;
a proximity switch mechanism provided on one side of the translucent mask;
the imaging mechanism is arranged right in front of the semitransparent mask and connected with the proximity switch mechanism, and the imaging mechanism is used for carrying out exposure and photographing on the back surface of the semitransparent mask under the control of the proximity switch mechanism; and
and the image analysis module is connected with the imaging mechanism and used for receiving the image shot by the imaging mechanism, processing the received image and calculating the information of the verticality and the ellipticity of the light beam of the laser transmission optical cable.
In a preferred embodiment of the present invention, the laser transmission cable calibration mechanism includes:
fixing the snap ring;
the calipers are circumferentially arranged on the fixed clamping ring at intervals and used for fixing the output end of the laser transmission optical cable; and
the first and second calibration cameras are used for performing center shaft calibration on the output end of the fixed laser transmission optical cable.
In a preferred embodiment of the present invention, the first and second calibration cameras are arranged on a plane perpendicular to the central axis of the output end of the laser transmission optical cable, and an angle formed between a line connecting the center of the first calibration camera and the central axis of the output end of the laser transmission optical cable and a line connecting the center of the second calibration camera and the central axis of the output end of the laser transmission optical cable is 90 °.
In a preferred embodiment of the present invention, a central axis of the translucent mask is on the same axis as a central axis of the output end of the laser transmission cable.
In a preferred embodiment of the invention, the translucent mask is a uniform sheet of translucent high temperature resistant crystal plate.
In a preferred embodiment of the present invention, the mask driving mechanism includes:
the stroke shaft is arranged on one side of the semitransparent mask and extends along the central axis direction of the semitransparent mask;
the mask fixing base is sleeved on the stroke shaft in a sliding manner, is connected with the semitransparent mask and is used for driving the semitransparent mask to move in a reciprocating manner along the central axis direction of the semitransparent mask;
the stroke motor is sleeved on the stroke shaft, is connected with the mask fixing base and can slide in a reciprocating manner along the axial direction of the stroke shaft; and
and the photosensitive switch is arranged behind the semitransparent mask and is connected with the stroke motor.
In a preferred embodiment of the present invention, the proximity switch mechanism is composed of a plurality of hall switches equidistantly distributed along the central axis of the translucent mask, and each hall switch is connected to the imaging mechanism.
In a preferred embodiment of the present invention, the imaging mechanism is an infrared CCD camera, and the center of the infrared CCD camera is on the same axis as the central axis of the translucent mask.
In a preferred embodiment of the present invention, the image analysis module is a finite element gray scale analysis system.
The test method of the laser beam verticality and spot ovality rapid analysis system as the second aspect of the invention comprises the following steps:
step S10, fixing the output end of the laser transmission optical cable by adopting a laser transmission optical cable calibration mechanism, and calibrating the central axis of the output end of the laser transmission optical cable to ensure that the central axis of the output end of the laser transmission optical cable and the central axis of the semitransparent mask plate are on the same axis;
step S20, controlling the light source to emit laser beams, and irradiating the laser beams onto the semitransparent mask plate through the output end of the laser transmission optical cable;
step S30, the mask driving mechanism drives the semitransparent mask to move towards the imaging mechanism;
step S40, when the semitransparent mask passes through the proximity switch mechanism, the proximity switch mechanism is triggered to transmit a starting signal to the imaging mechanism;
step S50, after receiving the starting signal transmitted by the proximity switch mechanism, the imaging mechanism carries out exposure and photographing on the back of the semitransparent mask and transmits the photographed image to the graphic analysis module;
step S60, after the image analysis module receives the image transmitted by the imaging mechanism, the image analysis module carries out gray processing on the received image, carries out gray finite element analysis on the image subjected to gray processing, calculates the gray value of each position of the image, calculates the deviation value between the gray value of each position of the image and the central reference point of the image, compares the calculated deviation value with the standard parameters and calculates the beam verticality and ellipticity of the laser transmission optical cable.
Due to the adoption of the technical scheme, the invention has the beneficial effects that:
1. compared with a light beam quality analyzer for testing light spots, the light beam quality analyzer does not need auxiliary components such as collimation or spectroscope, and is simple in structure and low in preparation cost;
2. the invention has high efficiency of testing the single device;
3. the invention does not need any auxiliary mirror to be matched during testing, and can carry out testing only by aligning the output end of the laser transmission optical cable with the central axis of the semitransparent mask plate, so that the operation is simpler;
4. compared with a beam quality analyzer, the beam quality analyzer is more convenient to overhaul and maintain.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic structural view of the present invention.
Fig. 2 is a schematic structural diagram of a laser transmission calibration mechanism of the present invention.
Fig. 3 is a schematic structural view of the mask driving mechanism of the present invention.
Fig. 4 is an imaging schematic of the imaging mechanism of the present invention.
Fig. 5 is a schematic diagram of the present invention for performing gray scale processing on an image.
FIG. 6 is a schematic diagram of a gray finite element analysis of an image according to the present invention.
FIG. 7 is a diagram illustrating the comparison of the deviation values calculated by the present invention with the standard parameters.
FIG. 8 is a flow chart illustrating a testing method of the present invention.
Detailed Description
In order to make the technical means, the creation characteristics, the achievement purposes and the effects of the invention easy to understand, the invention is further explained below by combining the specific drawings.
Referring to fig. 1, a laser beam perpendicularity and spot ovality rapid analysis system is shown, which comprises a laser transmission cable calibration mechanism 100, a semitransparent mask 200, a mask driving mechanism 300, a proximity switch mechanism 400, an imaging mechanism 500 and an image analysis module 600.
Laser delivery cable alignment mechanism 100 is used to secure the laser delivery cable and center the axis of output end 11 of laser delivery cable 10. Specifically, referring to fig. 2, the laser transmission cable calibration mechanism 100 includes a fixing collar 110, three calipers 120, and calibration cameras 130a, 130 b. Three calipers 120 are circumferentially arranged on the fixing snap ring 110 at intervals, and are used for fixing the output end 11 of the laser transmission optical cable 10. Of course, the number of the calipers 120 is not limited to that in the present embodiment, and it should be set according to the fixing requirements. The alignment cameras 130a, 130b are used to center the output end 11 of the fixed laser transmission cable 10. The calibration cameras 130a, 130b are arranged on a plane perpendicular to the central axis (Z-axis) of the output end 11 of the laser transmission cable 10, and the angle formed between the line connecting the center of the calibration camera 130a and the central axis of the output end 11 of the laser transmission cable 10 and the line connecting the center of the calibration camera 130b and the central axis of the output end 11 of the laser transmission cable 10 is 90 °. In the present embodiment, the calibration camera 130a is located directly above the output end 11 of the laser transmission cable 10 on the Y-axis, and the calibration camera 130b is located on the positive side of the output end 11 of the laser transmission cable 10 on the X-axis.
The translucent mask 200 is disposed directly in front of the laser delivery cable alignment mechanism 100. The central axis of the translucent mask 200 is on the same axis as the central axis of the output end 10 of the laser delivery cable alignment mechanism 100. In this embodiment, the translucent mask 200 is a uniform piece of translucent high temperature resistant crystal plate.
The mask driving mechanism 300 is used to drive the translucent mask 200 to reciprocate along the central axis direction thereof. Specifically, referring to fig. 3, the mask driving mechanism 300 includes a stroke shaft 310, a mask fixing base 320, a stroke motor 330, and a photosensitive switch 340. The stroke shaft 310 is provided on one side of the translucent mask 200 (in fig. 3, the stroke shaft 310 is located below the translucent mask 200) and extends in the central axis direction of the translucent mask 200. The mask fixing base 320 is slidably sleeved on the stroke shaft 310 and connected to the translucent mask 200, and is used for driving the translucent mask 200 to reciprocate along the central axis direction thereof. The stroke motor 330 is sleeved on the stroke shaft 310, connected to the mask fixing base 320, and capable of reciprocating and sliding along the axial direction of the stroke shaft 310. The photosensitive switch 340 is disposed behind the translucent mask 200 and connected to the stroke motor 330. When the photosensitive switch 340 detects that the translucent mask 200 is irradiated by the laser, the photosensitive switch 340 is triggered and generates a starting signal to be sent to the stroke motor 330, the stroke motor 330 acts after receiving the starting signal to drive the mask fixing base 320 to move, and the mask fixing base 320 drives the translucent mask 200 to move towards the imaging mechanism along the axial direction of the stroke shaft 310.
The proximity switch mechanism 400 is disposed at one side of the translucent mask 200. The proximity switch mechanism 400 is composed of five hall switches 410 that are equidistantly spaced along the central axis of the translucent mask 200, and each hall switch 410 is connected to the imaging mechanism 500. Of course, the number of the hall switches 410 is not limited to that in the present embodiment, and it should be set according to the photographing requirement. When the translucent mask 200 approaches any one of the hall switches 410, the hall switch 410 is triggered and generates an activation signal to the imaging mechanism 500.
The imaging mechanism 500 is disposed right in front of the translucent mask 200 and connected to the proximity switch mechanism 400, and the imaging mechanism 500 performs exposure photographing on the back surface of the translucent mask 200 under the control of the proximity switch mechanism 400. In the present embodiment, the imaging mechanism 500 is an infrared CCD camera, and the center of the infrared CCD camera is on the same axis as the central axis of the translucent mask 200. When the infrared CCD camera receives a start signal sent by any one of the hall switches 410, the infrared CCD camera will expose and photograph the back of the translucent mask 200.
The image analysis module 600 is connected to the imaging mechanism 500, and is configured to receive the image captured by the imaging mechanism 500, process the received image, and calculate information on the perpendicularity and ellipticity of the light beam of the laser transmission optical cable. In this embodiment, the image analysis module 600 is a finite element gray scale analysis system.
Referring to fig. 8, a method for testing a system for rapidly analyzing perpendicularity and ovality of a laser beam and a spot ovality is provided, which comprises the following steps:
step S10, fixing the output end 11 of the laser transmission cable 10 by using the laser transmission cable calibration mechanism 100, and performing center axis calibration on the output end 11 of the laser transmission cable 10, so that the center axis of the output end 11 of the laser transmission cable 10 is on the same axis as the center axis of the translucent mask 200. Specifically, referring to fig. 2, the output end 11 of the laser transmission optical cable 10 is inserted into the fixing clamp ring 110, and the outer circumferential surface of the output end 11 of the laser transmission optical cable 10 is clamped by three calipers 120, so that the output end 11 of the laser transmission optical cable 10 is fixed; and then the system automatically or manually corrects the central axis of the output end 11 of the laser transmission optical cable 10 according to the imaging of the two cameras 130a and 130b which are at an angle of 90 degrees with each other by an operator, so as to ensure that the central axis of the output end 11 of the laser transmission optical cable 10 and the central axis of the semitransparent mask 200 are on the same axis.
Step S20, the light source is controlled to emit a laser beam, and the laser beam is irradiated onto the translucent mask 200 through the output end 11 of the laser transmission optical cable 10.
In step S30, the mask driving mechanism 300 drives the translucent mask 200 to move toward the imaging mechanism 500. Specifically, referring to fig. 3, when the photosensitive switch 340 detects that the translucent mask 200 is irradiated by the laser, the photosensitive switch 340 is triggered and generates a start signal to be sent to the stroke motor 330, the stroke motor 330 acts after receiving the start signal to drive the mask fixing base 320 to move, and the mask fixing base 320 drives the translucent mask 200 to move towards the imaging mechanism along the axial direction of the stroke shaft 310.
In step S40, when the translucent mask 200 passes the proximity switch mechanism 400, the proximity switch mechanism 400 is triggered to transmit an activation signal to the imaging mechanism 500. Specifically, when the translucent mask 200 approaches any one of the hall switches 410, the hall switch 410 is triggered and generates an activation signal to the imaging mechanism 500.
In step S50, after receiving the start signal transmitted by the proximity switch mechanism 400, the imaging mechanism 500 performs exposure photographing on the back surface of the semitransparent mask 200, and transmits the photographed image to the image analysis module 600. Specifically, when the infrared CCD camera receives the start signal sent by any one of the hall switches 410, the infrared CCD camera will expose and photograph the back surface of the semitransparent mask 200, as shown in fig. 4, and transmit the photographed image to the graphic analysis module.
Step S60, after the image analysis module 600 receives the image transmitted by the imaging mechanism 500, perform gray scale processing on the received image, as shown in fig. 5, perform gray scale finite element analysis on the image subjected to gray scale processing, as shown in fig. 6, calculate the gray scale value of each position of the image, calculate the deviation value between the calculated deviation value and the central reference point of the image according to the gray scale values of different positions of the image, compare the calculated deviation value with the standard parameter (as shown in fig. 7), and calculate the beam perpendicularity and ellipticity of the laser transmission optical cable.
The foregoing shows and describes the general principles and broad features of the present invention and advantages thereof. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are described in the specification and illustrated only to illustrate the principle of the present invention, but that various changes and modifications may be made therein without departing from the spirit and scope of the present invention, which fall within the scope of the invention as claimed. The scope of the invention is defined by the appended claims and equivalents thereof.

Claims (10)

1. Laser beam hangs down straightness and facula ovality rapid analysis system, its characterized in that includes:
the laser transmission optical cable calibration mechanism is used for fixing the laser transmission optical cable and calibrating a central shaft of the output end of the laser transmission optical cable;
the semi-transparent mask is arranged right in front of the laser transmission optical cable calibration mechanism;
a mask driving mechanism for driving the translucent mask to reciprocate along the central axis direction;
a proximity switch mechanism provided on one side of the translucent mask;
the imaging mechanism is arranged right in front of the semitransparent mask and connected with the proximity switch mechanism, and the imaging mechanism is used for carrying out exposure and photographing on the back surface of the semitransparent mask under the control of the proximity switch mechanism; and
and the image analysis module is connected with the imaging mechanism and used for receiving the image shot by the imaging mechanism, processing the received image and calculating the verticality and the ellipticity of the light beam of the laser transmission optical cable.
2. The system for rapidly analyzing laser beam perpendicularity and spot ovality according to claim 1, wherein the laser transmission cable calibration mechanism comprises:
fixing the snap ring;
the calipers are circumferentially arranged on the fixed clamping ring at intervals and used for fixing the output end of the laser transmission optical cable; and
the first and second calibration cameras are used for performing center shaft calibration on the output end of the fixed laser transmission optical cable.
3. The system for rapid analysis of laser beam perpendicularity and spot ovality according to claim 2, wherein the first and second calibration cameras are arranged on a plane perpendicular to the central axis of the output end of the laser transmission optical cable, and an angle formed between a line connecting the center of the first calibration camera and the central axis of the output end of the laser transmission optical cable and a line connecting the center of the second calibration camera and the central axis of the output end of the laser transmission optical cable is 90 °.
4. The system for rapid analysis of laser beam perpendicularity and spot ovality according to claim 1, wherein a central axis of the translucent mask is on the same axis as a central axis of the output end of the laser transmission cable.
5. The system for rapidly analyzing the perpendicularity of the laser beam and the ovality of the laser spot according to claim 1, wherein the translucent mask is a uniform translucent high-temperature-resistant crystal plate.
6. The system for rapidly analyzing perpendicularity and ovality of a laser beam according to claim 1, wherein the mask driving mechanism comprises:
the stroke shaft is arranged on one side of the semitransparent mask and extends along the central axis direction of the semitransparent mask;
the mask fixing base is sleeved on the stroke shaft in a sliding manner, is connected with the semitransparent mask and is used for driving the semitransparent mask to move in a reciprocating manner along the central axis direction of the semitransparent mask;
the stroke motor is sleeved on the stroke shaft, is connected with the mask fixing base and can slide in a reciprocating manner along the axial direction of the stroke shaft; and
and the photosensitive switch is arranged behind the semitransparent mask and is connected with the stroke motor.
7. The system for rapidly analyzing the perpendicularity of the laser beam and the ovality of the laser spot according to claim 1, wherein the proximity switch mechanism is composed of a plurality of hall switches which are equidistantly distributed along the central axis direction of the semitransparent mask at intervals, and each hall switch is respectively connected with the imaging mechanism.
8. The system for rapidly analyzing the perpendicularity of the laser beam and the ovality of the light spot according to claim 1, wherein the imaging mechanism is an infrared CCD camera, and the center of the infrared CCD camera is on the same axis as the central axis of the semitransparent mask.
9. The system of claim 1, wherein the image analysis module is a finite element gray scale analysis system.
10. A method for testing a system for rapidly analyzing perpendicularity and ovality of a laser beam according to any one of claims 1 to 9, comprising the steps of:
step S10, fixing the output end of the laser transmission optical cable by adopting a laser transmission optical cable calibration mechanism, and calibrating the central axis of the output end of the laser transmission optical cable to ensure that the central axis of the output end of the laser transmission optical cable and the central axis of the semitransparent mask plate are on the same axis;
step S20, controlling the light source to emit laser beams, and irradiating the laser beams onto the semitransparent mask plate through the output end of the laser transmission optical cable;
step S30, the mask driving mechanism drives the semitransparent mask to move towards the imaging mechanism;
step S40, when the semitransparent mask passes through the proximity switch mechanism, the proximity switch mechanism is triggered to transmit a starting signal to the imaging mechanism;
step S50, after receiving the starting signal transmitted by the proximity switch mechanism, the imaging mechanism carries out exposure and photographing on the back of the semitransparent mask and transmits the photographed image to the graphic analysis module;
step S60, after the image analysis module receives the image transmitted by the imaging mechanism, the image analysis module carries out gray processing on the received image, carries out gray finite element analysis on the image subjected to gray processing, calculates the gray value of each position of the image, calculates the deviation value between the gray value of each position of the image and the central reference point of the image, compares the calculated deviation value with the standard parameters and calculates the information of the verticality and the ellipticity of the light beam of the laser transmission optical cable.
CN202011528046.2A 2020-12-22 2020-12-22 Laser beam verticality and spot ovality rapid analysis system and test method thereof Pending CN112649177A (en)

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Application Number Priority Date Filing Date Title
CN202011528046.2A CN112649177A (en) 2020-12-22 2020-12-22 Laser beam verticality and spot ovality rapid analysis system and test method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202011528046.2A CN112649177A (en) 2020-12-22 2020-12-22 Laser beam verticality and spot ovality rapid analysis system and test method thereof

Publications (1)

Publication Number Publication Date
CN112649177A true CN112649177A (en) 2021-04-13

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