CN112557869A - 一种音频芯片的检测方法及检测设备 - Google Patents
一种音频芯片的检测方法及检测设备 Download PDFInfo
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- CN112557869A CN112557869A CN202011304464.3A CN202011304464A CN112557869A CN 112557869 A CN112557869 A CN 112557869A CN 202011304464 A CN202011304464 A CN 202011304464A CN 112557869 A CN112557869 A CN 112557869A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
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- Microelectronics & Electronic Packaging (AREA)
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CN202011304464.3A CN112557869B (zh) | 2020-11-19 | 2020-11-19 | 一种音频芯片的检测方法及检测设备 |
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CN202011304464.3A CN112557869B (zh) | 2020-11-19 | 2020-11-19 | 一种音频芯片的检测方法及检测设备 |
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CN112557869A true CN112557869A (zh) | 2021-03-26 |
CN112557869B CN112557869B (zh) | 2022-06-28 |
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Citations (12)
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CN1492999A (zh) * | 2001-11-14 | 2004-04-28 | ��ʽ���綫֥ | 超声波检测装置、超声波换能器、检测装置、超声波成像装置 |
JP2007178249A (ja) * | 2005-12-28 | 2007-07-12 | Mitsubishi Electric Corp | 半導体装置の電気特性試験装置、および半導体装置の電気特性試験、外観検査共用装置 |
CN102426303A (zh) * | 2011-08-30 | 2012-04-25 | 上海华碧检测技术有限公司 | 一种晶振失效分析的方法 |
CN102507738A (zh) * | 2011-10-13 | 2012-06-20 | 北京理工大学 | 电子封装内部分层缺陷的超声显微检测方法 |
CN203069556U (zh) * | 2013-01-31 | 2013-07-17 | 奉化市溪口新型墙体材料有限公司 | 公路钢桥用超声波检测装置 |
WO2017026483A1 (ja) * | 2015-08-10 | 2017-02-16 | 国立大学法人 九州工業大学 | 半導体検査装置 |
CN106597252A (zh) * | 2016-12-09 | 2017-04-26 | 江苏海四达电源股份有限公司 | 具有防错功能的pcb检测方法 |
CN106646196A (zh) * | 2016-12-23 | 2017-05-10 | 苏州华碧微科检测技术有限公司 | 一种车载直流降压芯片失效分析方法 |
CN109003924A (zh) * | 2018-08-07 | 2018-12-14 | 南方电网科学研究院有限责任公司 | 一种芯片出厂检验装置 |
CN111495772A (zh) * | 2020-05-07 | 2020-08-07 | 龙南县方成科技有限公司 | 一种全自动smd电感测包机 |
CN111543939A (zh) * | 2019-06-17 | 2020-08-18 | 武汉和视光声科技有限公司 | 一种超声探测装置及医学成像系统 |
CN111665295A (zh) * | 2020-05-28 | 2020-09-15 | 深圳第三代半导体研究院 | 固体材料及半导体器件内部缺陷检测方法 |
-
2020
- 2020-11-19 CN CN202011304464.3A patent/CN112557869B/zh active Active
Patent Citations (12)
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CN1492999A (zh) * | 2001-11-14 | 2004-04-28 | ��ʽ���綫֥ | 超声波检测装置、超声波换能器、检测装置、超声波成像装置 |
JP2007178249A (ja) * | 2005-12-28 | 2007-07-12 | Mitsubishi Electric Corp | 半導体装置の電気特性試験装置、および半導体装置の電気特性試験、外観検査共用装置 |
CN102426303A (zh) * | 2011-08-30 | 2012-04-25 | 上海华碧检测技术有限公司 | 一种晶振失效分析的方法 |
CN102507738A (zh) * | 2011-10-13 | 2012-06-20 | 北京理工大学 | 电子封装内部分层缺陷的超声显微检测方法 |
CN203069556U (zh) * | 2013-01-31 | 2013-07-17 | 奉化市溪口新型墙体材料有限公司 | 公路钢桥用超声波检测装置 |
WO2017026483A1 (ja) * | 2015-08-10 | 2017-02-16 | 国立大学法人 九州工業大学 | 半導体検査装置 |
CN106597252A (zh) * | 2016-12-09 | 2017-04-26 | 江苏海四达电源股份有限公司 | 具有防错功能的pcb检测方法 |
CN106646196A (zh) * | 2016-12-23 | 2017-05-10 | 苏州华碧微科检测技术有限公司 | 一种车载直流降压芯片失效分析方法 |
CN109003924A (zh) * | 2018-08-07 | 2018-12-14 | 南方电网科学研究院有限责任公司 | 一种芯片出厂检验装置 |
CN111543939A (zh) * | 2019-06-17 | 2020-08-18 | 武汉和视光声科技有限公司 | 一种超声探测装置及医学成像系统 |
CN111495772A (zh) * | 2020-05-07 | 2020-08-07 | 龙南县方成科技有限公司 | 一种全自动smd电感测包机 |
CN111665295A (zh) * | 2020-05-28 | 2020-09-15 | 深圳第三代半导体研究院 | 固体材料及半导体器件内部缺陷检测方法 |
Non-Patent Citations (2)
Title |
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张永强 等: "《MEMS麦克风的失效机理及失效分析》", 《电子与封装》 * |
徐健 等: "《扇出型封装结构可靠性试验方法及验证》", 《半导体技术》 * |
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Effective date of registration: 20220607 Address after: 2 / F, North building, 1339 Shuixiu Road, Yushan Town, Kunshan City, Suzhou City, Jiangsu Province Applicant after: HEAD-DIRECT (KUNSHAN) Co.,Ltd. Applicant after: Bian Fang Applicant after: Song Feifei Address before: 2 / F, North building, 1339 Shuixiu Road, Yushan Town, Kunshan City, Suzhou City, Jiangsu Province Applicant before: HEAD-DIRECT (KUNSHAN) Co.,Ltd. |
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Address after: No. 2001, Yingbin West Road, Bacheng Town, Kunshan City, Suzhou City, Jiangsu Province, 215311 Patentee after: Kunshan Haifeiman Technology Group Co.,Ltd. Patentee after: Bian Fang Patentee after: Song Feifei Address before: 2 / F, North building, 1339 Shuixiu Road, Yushan Town, Kunshan City, Suzhou City, Jiangsu Province Patentee before: HEAD-DIRECT (KUNSHAN) Co.,Ltd. Patentee before: Bian Fang Patentee before: Song Feifei |
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CP03 | Change of name, title or address | ||
CP03 | Change of name, title or address |
Address after: 215300 No. 2001 Yingbin West Road, Bacheng Town, Kunshan City, Suzhou City, Jiangsu Province Patentee after: Kunshan Haifeiman Technology Group Co.,Ltd. Patentee after: Bian Fang Patentee after: Song Feifei Address before: No. 2001, Yingbin West Road, Bacheng Town, Kunshan City, Suzhou City, Jiangsu Province, 215311 Patentee before: Kunshan Haifeiman Technology Group Co.,Ltd. Patentee before: Bian Fang Patentee before: Song Feifei |
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Effective date of registration: 20231101 Address after: 215300 No. 2001 Yingbin West Road, Bacheng Town, Kunshan City, Suzhou City, Jiangsu Province Patentee after: Kunshan Haifeiman Technology Group Co.,Ltd. Address before: 215300 No. 2001 Yingbin West Road, Bacheng Town, Kunshan City, Suzhou City, Jiangsu Province Patentee before: Kunshan Haifeiman Technology Group Co.,Ltd. Patentee before: Bian Fang Patentee before: Song Feifei |