CN112505468A

CN112505468A - Capacitance testing system

Info

Publication number: CN112505468A
Application number: CN201910788552.6A
Authority: CN
Inventors: 陈文钟; 陈健忠; 张仕勋; 庄圣敬; 王耀南
Original assignee: To Mao Electronics Suzhou Co ltd
Current assignee: To Mao Electronics Suzhou Co ltd; Chroma ATE Suzhou Co Ltd
Priority date: 2019-08-26
Filing date: 2019-08-26
Publication date: 2021-03-16

Abstract

The application provides a capacitance testing system, contains a plurality of bent frames, first conveyer belt, second conveyer belt and route switching piece. Each bent frame comprises a plurality of clamping parts, and each clamping part is used for clamping the capacitor to be tested. The first conveyor belt is detachably connected with at least one bent frame and conveys the at least one bent frame to the first conveying path. The second conveyor belt is detachably connected with at least one bent frame and is used for conveying the at least one bent frame on a second conveying path. The path switching piece is provided with a switching position, when the switching position is positioned in the extending direction of the first conveying path, the switching position is used for accommodating at least one bent frame conveyed by the first conveying belt, and when the switching position rotates to the extending direction of the second conveying path, the path switching piece conveys the at least one bent frame to the second conveying path.

Description

Capacitance testing system

Technical Field

The present disclosure relates to a capacitance testing system, and more particularly, to a capacitance testing system using a bent frame to load a capacitor to be tested.

Background

With the progress of science and technology, electronic products are more and more diversified and popular. Because each electronic product needs to use different capacitors, the demand of the market for the capacitors is inevitably larger and larger. Large-capacity capacitors such as super-capacitors (EDLCs) have been introduced in the market, and various discharge times and current levels can be selected.

The reliability of the super capacitor may be checked through repeated tests when the super capacitor is shipped. Because discrete supercapacitors are not easily tested, conventional test systems typically require multiple fixtures, such as by first clamping each supercapacitor onto one fixture, and transporting the supercapacitor from the fixture to a test station to enable automated testing. In a conventional testing system, the plurality of clamps are fixed on the same chain, and the chain is pulled to drive the clamps, so as to sequentially send the supercapacitors to different testing stations.

In practice, it is not efficient to move the clamps with the chains, and especially the testing time required for different testing stations is likely to be different, and if all the clamps are fixedly arranged on the same chain, the overall testing speed is likely to be slowed down. For example, high temperature testing requires a long time to heat, and inspecting the pins of the super capacitor may be very fast, so that in order to allow a certain portion of the super capacitor to have enough time to perform high temperature testing, the corresponding fixture needs to stay in the testing station for high temperature testing. Since the system cannot pull the chain at this point, it means that the supercapacitors that have checked the pins are all in-place waiting state. At this moment, because the chain does not move for detect the super capacitor who finishes and can't be moved the website of the ejection of compact, empty anchor clamps also can't be moved the website of pan feeding, thereby can not get new super capacitor again by the clamp.

In addition, if a damaged clamp is found, the system must halt the chain to perform clamp maintenance, which equates to all supercapacitors being in-place waiting. Obviously, the conventional test system has a lot of bottleneck points and is not favorable for rapidly maintaining the clamp. Therefore, there is a need for a new testing system that can reduce the waiting time of the capacitor to be tested and improve the maintenance efficiency.

Disclosure of Invention

In view of this, the present application provides a capacitance testing system, which places the capacitor to be tested in a bent frame, and transports the bent frame by using a conveyor belt. Therefore, when part of capacitors to be tested are tested for a long time, other capacitors to be tested do not need to wait in situ and can move forwards continuously through the bent frame.

The application provides a capacitance testing system, contains a plurality of bent frames, first conveyer belt, second conveyer belt and route switching piece. Each bent frame comprises a plurality of clamping parts, and each clamping part is used for clamping the capacitor to be tested. The first conveyor belt is detachably connected with at least one bent frame and conveys the at least one bent frame to the first conveying path. The second conveyor belt is detachably connected with at least one bent frame and is used for conveying the at least one bent frame on a second conveying path. The path switching piece is respectively connected with the first conveying belt and the second conveying belt and is provided with a switching position, when the switching position is located in the extending direction of the first conveying path, the switching position is used for accommodating at least one bent frame conveyed by the first conveying belt, and when the switching position rotates to the extending direction of the second conveying path, the path switching piece conveys the at least one bent frame to the second conveying path.

In some embodiments, the first conveyor belt may have a plurality of first conveyor units therein, the plurality of first conveyor units are adjacently arranged in the first conveying path, and each first conveyor unit is driven by the first belt and rotates in the first rotation direction. Further, the second conveyor belt may have a plurality of second conveyor units adjacently arranged in the second conveying path, each of the second conveyor units being driven by the second belt and rotated in the second rotational direction, and the plurality of first conveyor units and the plurality of second conveyor units may be rotated at the same speed. The first rotational direction and the second rotational direction may be the same.

In some embodiments, the capacitance testing system may further include a high temperature roller device for receiving the at least one rack at the testing position in the first conveying path and heating and charging the capacitor to be tested held by each of the holding portions of the at least one rack. In addition, the capacitance testing system may further include a feeding device disposed in the first conveying path for each clamping portion of each bent frame to clamp the capacitor to be tested.

The application provides another kind of electric capacity test system, contains transport module, framed bent and high temperature drum device. The conveying module comprises a plurality of conveying units which are adjacently arranged in an annular conveying path, and each conveying unit is driven by a belt and rotates towards one rotation direction. The bent frame is driven by the conveying units to move in the conveying path and is used for clamping the capacitors to be tested. The high-temperature drum device is used for accommodating the bent frame positioned at the testing position in the conveying path and heating and charging the capacitor to be tested in the bent frame.

In some embodiments, the bent frame may include a bottom plate and a side plate. The bottom plate is provided with a positioning piece which is used for contacting at least part of the conveying units so that the bent frame is driven by the conveying units at a fixed angle. The side plate is connected with the bottom plate and provided with a plurality of clamping parts, the clamping parts are adjacently arranged and face to the same side of the side plate, and each clamping part is used for clamping one of the capacitors to be tested. In addition, each clamping part comprises a body, a first arm and a second arm, wherein the first arm and the second arm extend out from the body, the first end of the first arm bends towards the second arm, and the second end of the second arm bends towards the first arm. When the capacitor to be tested is clamped between the clamping parts, the capacitor to be tested is clamped between the first arm and the second arm, and at least one pin of the capacitor to be tested is positioned between the first end and the second end. In addition, each clamping part further comprises an elastic piece and a pushing piece, the pushing piece is positioned between the first arm and the second arm, and the elastic piece is positioned between the body and the pushing piece. When the capacitor to be tested is clamped on the clamping part, the elastic piece pushes the pushing piece to the capacitor to be tested, so that at least one pin of the capacitor to be tested is positioned between the first end and the second end.

To sum up, the capacitor test system that this application provided places the electric capacity that will await measuring in the bent frame, recycles the conveyer belt and transports the bent frame. That is, since not all capacitors to be tested are fixed together but held in different bent frames, when a part of capacitors to be tested are tested for a long time, only the corresponding bent frame is required to stop, and the other bent frames can move forward.

Further details regarding other functions and embodiments of the present application are described below with reference to the accompanying drawings.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments described in the present application, and other drawings can be obtained by those skilled in the art without creative efforts.

FIG. 1 is a functional diagram of a capacitance testing system according to an embodiment of the present application;

FIG. 2 is a schematic diagram illustrating operation of a capacitance test system according to an embodiment of the present application;

FIG. 3 is a schematic perspective view of a bent frame according to an embodiment of the present application;

FIG. 4 is another perspective view of a bent frame according to an embodiment of the present application;

fig. 5 is a perspective view of a clamping portion according to an embodiment of the present application.

Description of the symbols

1 capacitive test system 10 bent

100 bottom plate 102 side plate

104 clamping portion 1040 body

1041 first arm 1041a one end of first arm

1042 second arm 1042a one end of the second arm

1043 pushing component 1044 elastic component

106 positioning element 11 first conveyor belt

110 second conveyor belt of conveying unit 12

120 conveying unit 13 route switching piece

130 conveying unit 131 switching position

14 route switching member 140 conveying unit

141 switching position 15 feeder

16 high-temperature drum device and 17 normal-temperature drum device

18 discharging device 2 capacitor to be tested

20 pin

Detailed Description

The foregoing and other technical matters, features and effects of the present application will be apparent from the following detailed description of a preferred embodiment, which is to be read in connection with the accompanying drawings. Directional terms as referred to in the following examples, for example: up, down, left, right, front or rear, etc., are simply directions with reference to the drawings. Accordingly, the directional terminology used is intended to be in the nature of words of description rather than of limitation.

Referring to fig. 1, fig. 1 is a functional diagram illustrating a capacitance testing system according to an embodiment of the present application. As shown in fig. 1, the capacitive test system 1 may have a plurality of bays 10, a first conveyor belt 11, a second conveyor belt 12, and a path switch 13. The first conveyor belt 11 and the second conveyor belt 12 may be used for conveying the bent frame 10, for example, the first conveyor belt 11 may convey the bent frame 10 from right to left, and the second conveyor belt 12 may convey the bent frame 10 from left to right. In practice, the bent frame 10 of the present embodiment may hold a plurality of capacitors to be measured (not shown in fig. 1), and when the bent frame 10 is conveyed by the first conveyor belt 11 or the second conveyor belt 12, the plurality of capacitors to be measured also move along with the bent frame 10. In other words, unlike the conventional testing system in which the capacitors to be tested are directly clamped on the conveyor belt, the capacitors to be tested in this embodiment are not connected to the first conveyor belt 11 or the second conveyor belt 12, but the first conveyor belt 11 or the second conveyor belt 12 drives the bent frame 10, and the bent frame 10 transports the capacitors to be tested. The components of the capacitance testing system 1 are described below.

The first conveyor belt 11 may have a plurality of conveyor units 110 (first conveyor units), and the plurality of conveyor units 110 may be arranged in a row in sequence. In one example, the plurality of conveying units 110 may be driven by the same belt (first belt) and rotate in the same direction (first rotation direction). For example, the plurality of conveying units 110 may be arranged in parallel, and when the plurality of conveying units 110 rotate in the same direction, the force for driving the bent frame 10 is generated, so that the bent frame 10 moves from right to left along the first conveying belt 11. In other words, the arrangement position of the plurality of conveyor units 110 in the first conveyor belt 11 is substantially the conveying path (first conveying path) of the bent frame 10. Since the same belt drives a plurality of conveying units 110, the rotating speed of each conveying unit 110 is substantially the same, and the rotating direction of each conveying unit 110 is also the same.

Here, the present embodiment does not limit the driving manner of driving the plurality of conveying units 110 by the same belt, for example, each conveying unit 110 may be individually connected to a stepping motor, so that it can be individually driven to have respective rotation speed and rotation direction, i.e. the plurality of conveying units 110 do not necessarily need to be interlocked with each other. The present embodiment is not limited to the kind of the belt, and may be a synthetic leather, a rubber material or a metal-doped material, which can be freely selected by those skilled in the art. Of course, the present embodiment also does not limit the shape of the conveying unit 110, as long as the conveying unit 110 can drive the bent frame 10, which is consistent with the definition of the conveying unit 110 in the present embodiment.

Similarly, the second conveyor belt 12 may have a plurality of conveying units 120 (second conveying units), and the plurality of conveying units 120 may be arranged in a row in sequence. Like the first conveyor belt 11, the plurality of conveyor units 120 of the second conveyor belt 12 may be driven by the same belt (second belt) and rotate in the same direction (second rotational direction). Also, the plurality of conveying units 120 may be arranged in parallel, and when the plurality of conveying units 120 rotate in the same direction at the same time, a conveying path (second conveying path) of one bent 10 is formed, so that the bent 10 placed above the plurality of conveying units 120 may be carried along the conveying path. The present embodiment also does not limit the shape of the conveying unit 120, as long as the conveying unit 120 can drive the bent frame 10, which is consistent with the definition of the conveying unit 120 in this embodiment. The remaining details of the second conveyor belt 12 are substantially the same as the first conveyor belt 11, and are not described in detail herein.

Although fig. 1 illustrates that the first conveying path and the second conveying path are substantially parallel, the embodiment is not limited thereto. It will be understood by those skilled in the art that the positions of the first conveyor belt 11 and the second conveyor belt 12 can be determined according to the space of the factory or the number of the test stations. In one example, to save the factory space, the first conveyor belt 11 and the second conveyor belt 12 may be substantially parallel, and the lengths of the first conveying path and the second conveying path are substantially the same. As can be seen from fig. 1, the first conveyor belt 11 and the second conveyor belt 12 on the left side in the drawing can be connected in series by the path switch 13. The path switching member 13 may have a plurality of conveying units 130 therein, and since the path switching member 13 is to connect the first conveyor belt 11 and the second conveyor belt 12 at the same time, the plurality of conveying units 130 may be actually divided into two rows, wherein the conveying units 130 of one row may be aligned with the extending direction of the first conveyor path, and the conveying units 130 of the other row may be aligned with the extending direction of the second conveyor path. Likewise, the plurality of conveying units 130 may be driven by the same belt, or the conveying units 130 in different rows may be driven by one belt, and the embodiment is not limited herein. In addition, the present embodiment also does not limit the appearance shape of the conveying unit 130, as long as the conveying unit 130 can drive the bent frame 10, which is consistent with the definition of the conveying unit 130 in the present embodiment.

In one example, the two rows of the conveying units 130 of the path switch 13 may be internally rotated and switched in position so that the two rows of the conveying units 130 of the path switch 13 may be alternately aligned with the first conveying path and the second conveying path. Referring to fig. 1 and 2 together, fig. 2 is a schematic diagram illustrating an operation of the capacitance testing system according to the embodiment of fig. 1. As shown in the drawings, assuming that one bent 10 is being conveyed by the first conveyor belt 11 in a practical example, when the bent 10 is conveyed to the leftmost side of the first conveyor belt 11, the bent 10 can be smoothly pushed up to one of the row conveying units 130 of the path switching member 13 at the next point in time. In detail, the path switch 13 may define a switch position 131, and the switch position 131 is exactly on one of the rows of the conveying units 130. When the switching position 131 is aligned with the extending direction of the first conveying path, which means that the switching position 131 is located in the extending direction of the first conveying path, the bent 10 conveyed by the first conveyor belt 11 can be accommodated in the switching position 131. Next, as shown in fig. 2, the path switching member 13 may be rotated at the next time point, so that the row of the conveying units 130 originally aligned with the first conveying path is rotated to be aligned with the second conveying path. The other row of the conveying units 130, which is aligned with the second conveying path, is rotated to be aligned with the first conveying path. At this time, since the bent 10 is accommodated at the switching position 131, it is natural to align the second conveying path following the rotation of the path switching member 13. Then, at the next time point, the bent frame 10 can be smoothly pushed into the second conveying path (the second conveyor belt 12) by driving the conveying unit 130 at the switching position 131, and then conveyed by the conveying unit 120 of the second conveyor belt 12.

In the schematic diagram shown in fig. 1, in order to allow the bent frame 10 to completely circulate in the capacitive test system 1, the capacitive test system 1 may further have another path switch 14, so that the right sides of the first conveyor belt 11 and the second conveyor belt 12 in the drawing can be connected in series through the path switch 14. Here, the path switch 14 may also have a plurality of conveying units 140, and since the path switch 14 also connects the first conveyor belt 11 and the second conveyor belt 12, the plurality of conveying units 140 may be actually divided into two rows, wherein the conveying units 140 of one row may be aligned with the extending direction of the first conveyor path, and the conveying units 140 of the other row may be aligned with the extending direction of the second conveyor path. In addition, the path switch 14 may also define a switch position 141, and the path switch 14 may also rotate in place, so that the two rows of the conveying units 140 of the path switch 14 may be alternately aligned with the first conveying path and the second conveying path. The remaining details of the path switching element 14 are substantially the same as those of the path switching element 13, and are not described herein.

In one example, the path switching member 13 (or the path switching member 14) does not necessarily transport only one bent 10 per rotation, and in practice, the path switching member 13 may switch a plurality of bent 10 to the second conveying path at a time as long as the area of the switching position 131 (or the switching position 141) is large enough and can accommodate more bent 10. In addition, since the two ends of the first conveyor belt 11 and the second conveyor belt 12 can be connected in series by the path switching member 13 and the path switching member 14, the first conveyor belt 11, the second conveyor belt 12, the path switching member 13, and the path switching member 14 can be regarded as an endless conveying path, and the bent 10 can move in the conveying path in a clockwise direction. Of course, the conveying path can be modified simply by a person skilled in the art, so that the bent frame 10 moves in the opposite direction (counterclockwise) in the conveying path, and the embodiment is not limited herein. In addition, the first and

second conveyor belts

11 and 12, the path switching element 13 and the path switching element 14 shown in fig. 1 may also be regarded as a single conveying module, and the present embodiment also does not limit the components of the conveying module, for example, only one conveyor belt may be provided in the conveying module without the path switching element, or more conveyor belts or path switching elements may be provided in the conveying module without fail.

In addition, fig. 1 also demonstrates that a plurality of test stations can be provided in the first conveyor belt 11 or in the second conveyor belt 12. For example, the capacitance testing system 1 may have a plurality of feeding devices 15, high temperature drum devices 16, normal temperature drum devices 17, and discharging devices 18. For example, the feeding device 15 may be disposed in the first conveyor belt 11 for loading the capacitors to be tested into the bent frame 10. In fig. 1, the bent 10, which is not loaded with the capacitor to be measured, can be fed from the right side to the feeding device 15 in the first conveying path. Here, the feeding device 15 may place the capacitors to be tested into each clamping portion (not shown in fig. 1) of the bent frame 10 one by one, so that the bent frame 10 loaded with the capacitors to be tested may move from the left side of the feeding device 15 to the next testing station, for example, to the high temperature drum device 16. Since it may take a long time to place the capacitor to be measured in each of the clamping portions of the bent frame 10, the conveyor unit 110 adjacent to the feeding device 15 may have a slower rotation speed than the other conveyor units 110 on the first conveyor belt 11, so that the bent frame 10 moves slower adjacent to the feeding device 15. Of course, if the loading of the capacitor to be tested in one bent frame 10 is not completed by the feeding device 15, and the next bent frame 10 approaches the right side of the feeding device 15, the conveying unit 110 on the right side of the feeding device 15 may be controlled to stop temporarily, so that the next bent frame 10 enters the feeding device 15 after a delay.

Then, since the high temperature drum device 16 may have a feeding port and a discharging port, when the bent frame 10 moves to the feeding port (test position) of the high temperature drum device 16 on the first conveying path, the bent frame 10 then leaves the first conveyor belt 11 to enter the high temperature drum device 16. Since the bent frames 10 usually need to be heated for a while, in one example, a plurality of bent frames 10 can be accommodated in the high temperature roller device 16 according to the sequence of entering the feeding hole, and at the same time, the high temperature roller device 16 heats the plurality of bent frames 10 inside, so that the capacitor to be measured in the bent frames 10 can simulate the aging state. At this time, in order to save time, the high temperature drum device 16 may also charge the capacitor to be measured in the bent frame 10 at the same time. For example, the inside of the high temperature drum device 16 may be a large oven, and each bent 10 is slowly moved inside the high temperature drum device 16 and sequentially advanced toward the discharge hole. In other words, the high temperature roller device 16 is a first-in first-out (FIFO) device, and the shelves 10 entering the high temperature roller device 16 are first heated and charged, and when the shelves 10 are heated to the default temperature and the charging is completed, the shelves are returned to the first conveying path from the outlet.

Different from the traditional testing device, all capacitors to be tested are connected to the same chain, and when a part of capacitors to be tested are heated and charged, the whole chain must wait for the capacitors to be tested and stop temporarily, so that a bottleneck point often appears in the testing process. The capacitance to be measured of the present embodiment is in the bent frame 10, and the bent frame 10 is not fixed on the first conveyor belt 11 or the second conveyor belt 12. When the capacitor to be tested of the present embodiment needs to be heated and charged, only the corresponding bent frame 10 needs to be moved from the first conveyor belt 11 to the high temperature drum device 16, the capacitor to be tested can also have enough time to be heated and charged, and after the heating and charging are completed, the whole bent frame 10 is moved back to the first conveyor belt 11 from the high temperature drum device 16. Since the bent frame 10 entering the high temperature drum device 16 does not occupy the first conveyor belt 11, and thus does not prevent other bent frames 10 on the first conveyor belt 11 from moving to the next testing station, the capacitance testing system 1 of the present embodiment should greatly improve the efficiency of the detection.

The bent frame 10 can then be moved to the normal temperature roller device 17, so that the charged and aged capacitor under test can be immediately subjected to the discharge test. Since the capacitor to be tested usually needs to be subjected to a discharge test for a certain period of time, similarly, the bent frame 10 may leave the first conveying path and enter the inside of the normal temperature drum device 17 from the feeding port of the normal temperature drum device 17. The plurality of bent frames 10 can be sequentially accommodated in the normal temperature roller device 17, and the normal temperature roller device 17 measures an electrical parameter of each capacitor to be measured in the plurality of bent frames. Each of the bent frames 10 also moves slowly inside the normal temperature drum device 17 and sequentially advances toward the discharge port. When the capacitance to be measured in the bent frame 10 has finished measuring the electrical parameter, the bent frame 10 may return to the first conveying path from the discharge port.

In addition, the capacitance testing system 1 of the present embodiment may further have a discharging device 18, and the discharging device 18 may be disposed on the second conveyor belt 12 for removing the capacitance to be tested from the bent. The rack 10 can thus be transported from the left to the discharge device 18 in the second transport path, and the discharge device 18 can determine where the capacitors to be tested should be discharged according to the electrical parameters of each capacitor to be tested. For example, a capacitor under test with an electrical parameter within a predetermined range may be rejected into a material box indicating pass, while a capacitor under test with an electrical parameter outside the predetermined range may be rejected into a material box indicating fail. Accordingly, the discharging device 18 can remove the capacitor to be tested from each clamping portion (not shown in fig. 1) of the bent frame 10 one by one, so that the empty bent frame 10 can move from the right side of the discharging device 18 to the path switching member 14, for example, return to the feeding device 15 to load the capacitor to be tested.

It should be noted that the test stations described in fig. 1 of this embodiment are only illustrative and are not limited to being on the first conveyor belt 11 or the second conveyor belt 12. In addition, the capacitors to be tested clamped in the bent frame 10 of the present embodiment should be oriented toward the same side of the bent frame 10. Taking fig. 1 as an example, if the first conveyor belt 11, the second conveyor belt 12, the path switching member 13, and the path switching member 14 are regarded as one endless conveying path, the plurality of capacitors to be measured face the outside of the endless conveying path. That is, when the bent frame 10 transports a plurality of capacitors to be tested on the first conveyor belt 11, the bent frame 10 directs the plurality of capacitors to be tested to the lower side of fig. 1, and when the bent frame 10 transports a plurality of capacitors to be tested on the second conveyor belt 12, the bent frame 10 directs the plurality of capacitors to be tested to the upper side of fig. 1, so that the plurality of capacitors to be tested are kept to the outer side of the conveying path.

For explaining the structure of the bent frame 10, please refer to fig. 3 and fig. 4 together, in which fig. 3 is a schematic perspective view illustrating the bent frame according to an embodiment of the present application, and fig. 4 is another schematic perspective view illustrating the bent frame according to an embodiment of the present application. As shown, the bent frame 10 may be composed of a bottom plate 100 and a side plate 102, the bottom plate 100 and the side plate 102 are connected to each other, and the side plate 102 is substantially perpendicular to the bottom plate 100. In an example, the bottom plate 100 and the side plate 102 are combined together in a locking manner, but the embodiment is not limited thereto, for example, the bottom plate 100 and the side plate 102 may be adhered to each other, or the bottom plate 100 and the side plate 102 may be integrally formed.

In practice, the bottom plate 100 is used to contact the first conveyor belt 11 and the second conveyor belt 12, the side plate 102 has a plurality of clamping portions 104 with the same structure, the clamping portions 104 are detachably fixed to the side plate 102, and each clamping portion 104 is used to clamp a capacitor to be tested. As can be seen in fig. 3 and 4, the plurality of clamping portions 104 are located on the same side of the side plate 102 and are aligned. In order to allow the plurality of clamping portions 104 to face a fixed direction when the bent frame 10 is transported by the first and

second conveyor belts

11 and 12, a side of the bottom plate 100 contacting the first conveyor belt 11 (a side opposite to the side plate 102) may have a positioning member 106. As will be understood by those skilled in the art, since the relative positions of the bottom plate 100, the side plate 102 and the plurality of clamping portions 104 are fixed, as long as the positioning member 106 can ensure that the bottom plate 100 will face the fixed direction and will not rotate arbitrarily when being transported by the first transporting belt 11 and the second transporting belt 12, it should be understood that the plurality of clamping portions 104 can also face the fixed direction.

In one example, the first conveyor belt 11 and the second conveyor belt 12 may also have a structure corresponding to the positioning member 106, so that the bottom plate 100 can be transported by the first conveyor belt 11 and the second conveyor belt 12 at a fixed angle. That is, when the bent frame 10 is driven by the conveying units of the first and

second conveyor belts

11 and 12 at a fixed angle, the clamping portions 104 are kept facing the outside of the conveying path, i.e., the capacitors to be measured clamped by the clamping portions 104 are also kept facing the outside of the conveying path. The embodiment is not limited to the structure of the bent frame 10, for example, the bent frame 10 may further have other weights or guiding grooves for assisting the clamping portion 104 to face the fixing direction, and the design can be freely designed by those skilled in the art.

To illustrate how the clamping portions 104 of the bent frame 10 clamp the capacitor to be tested, please refer to fig. 5, in which fig. 5 is a schematic perspective view illustrating the clamping portions according to an embodiment of the present application. As shown in fig. 5, the clamping portion 104 may include a body 1040, a first arm 1041, and a second arm 1042, wherein the first arm 1041 and the second arm 1042 extend from the body 1040. Here, one end 1041a (first end) of the first arm 1041 is bent toward the second arm 1042, and one end 1042a (second end) of the second arm 1042 is bent toward the first arm 1041, forming a pincer-like structure. That is, when the capacitor 2 to be measured is clamped between the clamping portion 104, the capacitor 2 to be measured is clamped between the first arm 1041 and the second arm 1042, and the pin 20 of the capacitor 2 to be measured penetrates through between the end 1041a of the first arm 1041 and the end 1042a of the second arm 1042, thereby being exposed outside the clamping portion 104.

In order to enable the capacitor 2 to be measured to be clamped on the clamping portion 104 more firmly, the clamping portion 104 may further have an abutting member 1043 and an elastic member 1044. The pushing element 1043 is located between the first arm 1041 and the second arm 1042, and the elastic element 1044 is located between the body 1040 and the pushing element 1043. In practice, the first arm 1041 and the second arm 1042 can serve as a track of the pushing element 1043, so that the pushing element 1043 can slide between the first arm 1041 and the second arm 1042 to a certain extent. When the capacitor 2 to be tested is clamped by the clamping portion 104, the capacitor 2 to be tested will push the pushing element 1043 to the body 1040 due to its volume, and at this time, the elastic element 1044 is squeezed to have a restoring force, so that the pushing element 1043 can be pushed to the capacitor 2 to be tested. Thus, the clamping portion 104 of the present embodiment can maintain the pin 20 of the capacitor 2 to be measured between the end 1041a of the first arm 1041 and the end 1042a of the second arm 1042, and is exposed outside the clamping portion 104.

To sum up, the capacitor test system that this application provided places the electric capacity that will await measuring in the bent frame, recycles the conveyer belt and transports the bent frame. And, because the electric capacity that awaits measuring in the bent can keep towards the conveyer belt outside, can be more convenient for carry out the measuring of electric capacity that awaits measuring. In addition, because the capacitors to be tested in different bent frames can carry out different detection items, when part of the capacitors to be tested are tested for a long time, only the corresponding bent frame is required to stop, and other bent frames can continue to move forwards. Therefore, the capacitance testing system provided by the application can more efficiently detect the capacitance to be tested.

The above-described embodiments and/or implementations are only illustrative of the preferred embodiments and/or implementations for implementing the technology of the present application, and are not intended to limit the implementations of the technology of the present application in any way, and those skilled in the art can make many changes or modifications to the equivalent embodiments without departing from the scope of the technology disclosed in the present application, but should still be considered as the technology or implementations substantially the same as the present application.

Claims

1. A capacitance testing system, comprising:

the device comprises a plurality of bent frames, a plurality of clamping parts and a plurality of clamping parts, wherein each bent frame comprises a plurality of clamping parts;

the first conveying belt is detachably connected with at least one bent frame and conveys the at least one bent frame to a first conveying path;

the second conveying belt is detachably connected with at least one bent frame and is used for conveying the at least one bent frame on a second conveying path; and

the path switching piece is respectively connected with the first conveying belt and the second conveying belt and provided with a switching position, when the switching position is positioned in the extending direction of the first conveying path, the switching position is used for accommodating at least one bent frame conveyed by the first conveying belt, and when the switching position rotates to the extending direction of the second conveying path, the path switching piece conveys at least one bent frame to the second conveying path.

2. The capacitance testing system according to claim 1, wherein the first conveyor belt has a plurality of first conveyor units arranged adjacently in the first conveying path, and each of the first conveyor units is driven by a first belt and rotates in a first rotation direction.

3. The capacitance testing system according to claim 2, wherein the second conveyor belt has a plurality of second conveyor units, the second conveyor units are adjacently arranged in the second conveyor path, each second conveyor unit is driven by a second conveyor belt and rotates in a second rotation direction, and the rotation speed of the first conveyor units is the same as that of the second conveyor units.

4. The capacitance testing system of claim 3, wherein the first rotational direction is the same as the second rotational direction.

5. The capacitance testing system according to claim 1, further comprising a high temperature roller device for receiving at least one of the racks at a testing position in the first conveying path and heating and charging the capacitor to be tested held by each of the holding portions of the at least one of the racks.

6. The capacitance testing system according to claim 1, further comprising a feeding device disposed in the first conveying path for enabling each of the clamping portions of each of the plurality of racks to clamp the capacitor to be tested.

7. A capacitance testing system, comprising:

the conveying module comprises a plurality of conveying units which are adjacently arranged in an annular conveying path, and each conveying unit is driven by a belt and rotates towards a rotating direction;

the bent frame is driven by the conveying units to move in the conveying path and is used for clamping a plurality of capacitors to be tested; and

and the high-temperature drum device is used for accommodating the bent frame positioned at a testing position in the conveying path and heating and charging the capacitors to be tested in the bent frame.

8. The capacitance testing system of claim 7, wherein the bent comprises:

a bottom plate having a positioning member for contacting at least a portion of the conveying units to drive the bent frame at a fixed angle by the conveying units; and

the side plate is connected with the bottom plate and provided with a plurality of clamping parts, the clamping parts are adjacently arranged and face to the same side of the side plate, and each clamping part is used for clamping one of the capacitors to be tested.

9. The capacitance testing system of claim 8, wherein each of the clamping portions includes a body, a first arm and a second arm, the first arm and the second arm extending from the body, a first end of the first arm being bent toward the second arm, a second end of the second arm being bent toward the first arm; when the capacitor to be tested is clamped on the clamping part, the capacitor to be tested is clamped between the first arm and the second arm, and at least one pin of the capacitor to be tested is positioned between the first end and the second end.

10. The capacitance test system according to claim 9, wherein each of the clamping portions further comprises an elastic member and a pushing member, the pushing member is located between the first arm and the second arm, the elastic member is located between the body and the pushing member, and when the capacitor to be tested is clamped between the clamping portions, the elastic member pushes the pushing member toward the capacitor to be tested, so that at least one of the leads of the capacitor to be tested is located between the first end and the second end.