CN112484864A - Polarization modulation Hartmann-shack wavefront detection device - Google Patents
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Abstract
The invention discloses a polarization modulation Hartmann-shack wavefront detection device, which utilizes the polarization characteristic difference between wavefront detection target light and background stray light, carries out polarization modulation on incident beams by adding a rotatable wave plate and an analyzer in front of a micro-lens array to obtain intensity distribution arrays under different polarization modulation states, obtains light beam polarization information of a corresponding area of a single micro-lens by utilizing a polarization recovery method, and finally calculates the wavefront slope and recovers the wavefront aberration to realize the wavefront detection of the incident beams. Compared with the traditional Hartmann-shack wavefront detection device, the invention changes the wavefront detection from the intensity detection dimension to the polarization detection dimension, separates the target light from the background stray light by utilizing the polarization characteristic difference of the target light and the background stray light, greatly improves the signal-to-back ratio and realizes the wavefront detection under the strong background. The invention is particularly suitable for the application field of wavefront detection under the strong background condition, expands the application range, improves the detection capability and has simple structure.
Description
Technical Field
The invention belongs to the technical field of wavefront aberration measurement, and particularly relates to a polarization modulation Hartmann-shack wavefront detection device.
Background
The Hartmann-shack wavefront detection technology is a universal classical wavefront phase detection technology and is widely applied to the important fields of adaptive optics, astronomy, optical detection, biomedicine and the like. When the stray light of the background is not strong, the Hartmann-shack wavefront detection technology can be applied to point source target detection and extended target detection, and high-precision wavefront phase information is obtained by respectively adopting a centroid algorithm and a cross-correlation algorithm. When the signal-to-back ratio of target detection is low or background stray light is strong, imaging information of a point source target or an extended target in a sub-aperture of a micro-lens array of a Hartmann-shack sensor is submerged, the contrast is greatly reduced, the position deviation of imaging intensity information in a single sub-aperture cannot be effectively extracted by a traditional centroid algorithm or a cross-correlation algorithm, and the accuracy of wavefront detection is reduced or even fails. Therefore, the traditional Hartmann-shack wavefront detection technology cannot be applied to wavefront detection under the condition of strong background stray light, and the application field and the detection capability are greatly limited. Methods such as reducing a fixed threshold (in Jianghan et al, detection error [ J ] of a Shack-Hartmann wavefront sensor, Quantum electronics, 02:218, 1998), narrow-band spectral filtering (J.Beckers et al, Using laser beacons for a dark adaptive Optics [ J ] of Experimental analysis, 11(2):133,2001), Field-of-view shift (C.Li et al, Field of view shifted Shack-Hartmann wave front sensor for dark adaptive Optics [ J ] of Optics Letters,31(19):2821,2006) can improve the wavefront detection signal-to-background ratio to some extent, but still cannot realize a strong background stray light wavefront detection application scenario.
The root of the above problems lies in the traditional Hartmann-shack wavefront detection technology, the wavefront error information extraction is stopped at the intensity dimension, the target signal light and the background stray light are integrated, although the influence of the background stray light can be weakened to a certain extent by means of reducing a fixed threshold value and the like, the background stray light cannot be fundamentally distinguished. Polarization is an inherent property of light, which reflects the transverse wave characteristics of light. Compared with the traditional intensity imaging technology, the polarization imaging technology can simultaneously acquire the space distribution information and the physicochemical information of the target object, greatly improves the target information content, and has the capability and the characteristics which are not possessed by the traditional intensity imaging.
Based on the above background, the polarization modulation Hartmann-shack wavefront detection device of the invention distinguishes the incident target signal light and the background stray light in the polarization dimension by using the polarization characteristic difference of the target signal light and the background stray light, changes the state that the traditional Hartmann-shack wavefront detection device can not distinguish in the intensity dimension, obviously improves the signal-to-back ratio, and expands the application field and the detection precision of the Hartmann-shack wavefront detection device.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: how to distinguish the incident target signal light from the background stray light in the polarization dimension so as to improve the Hartmann-shack wavefront detection signal-to-back ratio and expand the application field and the detection precision.
The technical scheme adopted by the invention for solving the technical problems is as follows: a polarization modulation Hartmann-shack wavefront detection device obtains intensity distribution arrays under different polarization modulation states by carrying out polarization modulation on incident beams, obtains light beam polarization information of a corresponding area of a single micro lens by using a polarization recovery method, and finally calculates wavefront slope and recovers wavefront aberration to realize the wavefront detection of the incident beams. Compared with the traditional Hartmann-shack wavefront detection device, the invention utilizes the polarization characteristic difference of the incident target light and the background stray light to carry out wavefront detection in the polarization dimension, is particularly favorable for distinguishing the incident target light from the background stray light, improves the wavefront detection signal-to-back ratio, and expands the application field and the detection precision of wavefront detection.
The device comprises a wave plate 1, a wave plate rotating mechanism 2, an analyzer 3, a micro-lens array 4, a light intensity detector 5 and a data processor 6. The incident light containing the target light and the background stray light enters a polarization modulator formed by the wave plate 1 and the analyzer 3 together, and the polarization state of the incident light is modulated; the incident light after polarization modulation continues to propagate forward and enters the microlens array 4, and is divided into M × N subregions, each subregion is a microlens, and the divided incident light is imaged on the photosensitive surface of the light intensity detector 5 to obtain the imaging intensity distribution I (M, N) of the corresponding subregion.
The wave plate 1 is installed on the wave plate rotating mechanism 2, can rotate together with the wave plate rotating mechanism 2, and rotates to different positions, and the polarization modulation states of the polarization modulator on incident light are also different.
Wherein, M and N are the number of rows and columns of the microlens array, respectively, and I (M, N) is the intensity distribution detected by the microlens with the serial number (M, N) corresponding to the region of the light intensity detector 5.
Incident light under different modulation states passes through the wave plate 1, the analyzer 3 and the micro-lens array 4, and finally light intensity distribution after reaching the light intensity detector 5 is recorded and output to the data processor 6. The data processing process is as follows:
the single sub-aperture area can be regarded as a polarization imaging micro-system, and the light intensities measured under different modulation states are respectively marked as I (m, N,1), I (m, N,2), …, I (m, N, N),1,2, …, and N are the serial numbers of the polarization modulation states. The modulation effect of the polarization modulator composed of the wave plate 1 and the analyzer 3 on the polarization state of the incident light beam is represented by the following formula:
wherein S isinAnd Si outRespectively representing the polarization state of incident light and the polarization state of the initially set light beam after polarization modulation, MP(theta) an analyzer 3 Mueller matrix with an angle theta between the analyzing direction and the horizontal direction, MR(αiDelta) is an angle alpha between the fast axis direction and the horizontal directioniAnd the retardation is delta, and i is a polarization modulation serial number in single measurement. Sin、Si out、MP(theta) and MR(αiδ) expression is as follows:
because the light intensity detector 5 can detect the intensity information of the light beam, the following linear equation for solving the polarization state of the incident light can be obtained by combining the equations (1) to (4):
wherein,
after the polarization state of the incident light is solved by using the formula (5), information such as the polarization degree and the polarization phase angle of the incident light can be further acquired, as shown in the following formula:
so far, the Hartmann-shack sub-aperture image after polarization modulation has been transformed from the traditional intensity dimension to the polarization dimension, and the polarization degree, the polarization phase angle and the like are partial characterization forms of the sub-aperture image information in the polarization dimension. By using a single polarization parameter or a polarization characteristic parameter (marked as P) obtained by fusing multiple polarization parameters, the position deviation and the slope in a single sub-aperture can be obtained by applying a centroid algorithm or a cross-correlation algorithm and the like, and finally the wavefront error of the incident beam is recovered.
The invention does not change the basic principle of Hartmann-shack wave-front detection, but converts the wave-front detection beacon from the traditional intensity dimension to the polarization dimension, thereby distinguishing the target light which cannot be distinguished by the traditional intensity dimension from the background stray light in the polarization dimension, and improving the signal-to-back ratio and the detection precision.
The polarization modulator consists of a wave plate and an analyzer, wherein the wave plate is mainly used for introducing different polarization phases, can adopt 1/4 wave plates or other wave plates, and can be made of natural crystals or artificial materials such as liquid crystals and the like; the analyzer is mainly used for outputting linearly polarized light, and can be made of wire grid type materials, crystals and other types of materials.
The wave plate needs to rotate for multiple times to form multiple modulation on incident light, the parameter selection needs to enable the coefficient matrix to be full-rank, the measurement times are at least 4, more data redundancy introduced by measurement is beneficial to suppressing system noise, and the measurement precision is improved.
The polarization modulation Hartmann-shack wavefront detection device can be applied to different Hartmann-shack wavefront detection scenes, and a detection object can be a point target or an expansion target.
The polarization degree and the polarization phase angle are only common parameters for representing polarization information of incident light, and linear polarization degree, circular polarization degree, elliptical polarization angle or other parameters capable of representing polarization characteristics can be adopted according to actual needs, or the polarization characteristic parameters are fused.
The light intensity detector 6 can detect the intensity of the incident light beam, and can adopt a CCD camera, a CMOS camera and an EMCCD camera as long as the light intensity detection and collection functions are met.
The principle of the invention is as follows: the method comprises the steps of utilizing the polarization characteristic difference of incident target signal light and background stray light to carry out wavefront detection in polarization dimension, obtaining intensity distribution arrays under different polarization modulation states, utilizing a polarization recovery method to obtain light beam polarization information of a corresponding area of a single micro lens, finally calculating wavefront slope and recovering wavefront aberration, and achieving the wavefront detection of incident light beams. The device is particularly favorable for distinguishing incident target light from background stray light, improving the signal-to-back ratio of wavefront detection, expanding the application field of wavefront detection and expanding the detection precision
Compared with the prior art, the invention has the following advantages:
the novel wavefront detection device provided by the invention converts the target signal light and the background stray light which cannot be distinguished in the intensity dimension by the traditional Hartmann-shack wavefront detection technology into the polarization dimension for distinguishing by utilizing the polarization characteristic difference between the incident target signal light and the background stray light. Compared with the traditional Hartmann-shack wavefront detector, the device provided by the invention has higher wavefront detection signal-to-back ratio, is particularly suitable for occasions with stronger background stray light, and improves the wavefront detection precision.
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FIG. 1 is a schematic diagram of a polarization-modulated Hartmann-shack wavefront sensor. Wherein, 1 is a wave plate, 2 is a wave plate rotating mechanism, 3 is an analyzer, 4 is a micro-lens array, 5 is a light intensity detector, and 6 is a data processor;
FIG. 2 is a schematic diagram of the sub-aperture arrangement of a 19-unit polarization modulation Hartmann-shack wavefront sensor;
FIG. 3 is a schematic diagram of an image comparison of a point source target with stronger background stray light in a 19-unit conventional Hartmann-shack wavefront detection device (left image) and a 19-unit polarization modulation Hartmann-shack wavefront detection device (right image) according to the present invention;
fig. 4 is a schematic diagram of an image comparison between a 19-unit conventional hartmann-shack wavefront sensing device (left diagram) and a 19-unit polarization modulation hartmann-shack wavefront sensing device (right diagram) according to the present invention for an extended target containing strong background stray light.
Detailed Description
The invention is further described with reference to the following figures and specific examples.
As shown in fig. 1, a polarization modulation hartmann-shack wavefront sensor comprises a wave plate 1, a wave plate rotating mechanism 2, an analyzer 3, a micro-lens array 4, a light intensity detector 5 and a data processor 6. The incident light containing the target light and the background stray light enters a polarization modulator formed by the wave plate 1 and the analyzer 3 together, and the polarization state of the incident light is modulated; the incident light after polarization modulation continues to propagate forward and enters the microlens array 4, and is divided into M × N subregions, each subregion is a microlens, and the divided incident light is imaged on the photosensitive surface of the light intensity detector 5 to obtain the imaging intensity distribution of the corresponding subregion. The wave plate 1 is installed on the wave plate rotating mechanism 2, can rotate together with the wave plate rotating mechanism 2, and rotates to different positions, and the polarization modulation states of the polarization modulator on incident light are also different. Incident light under different modulation states passes through the wave plate 1, the analyzer 3 and the micro-lens array 4, and finally light intensity distribution after reaching the light intensity detector 5 is recorded and output to the data processor 6. The data processing procedures are respectively shown by formulas (1) to (7).
So far, the Hartmann-shack sub-aperture image after polarization modulation has been transformed from the traditional intensity dimension to the polarization dimension, and the polarization degree, the polarization phase angle and the like are partial characterization forms of the sub-aperture image information in the polarization dimension. By using a single polarization parameter or a polarization characteristic parameter (marked as P) obtained by fusing multiple polarization parameters, the position deviation and the slope in a single sub-aperture can be obtained by applying a centroid algorithm or a cross-correlation algorithm and the like, and finally the wavefront error of the incident beam is recovered.
Fig. 2 shows a possible layout of the sub-apertures of the microlens array (19 units) of the polarization-modulated hartmann-shack wavefront sensor according to the present invention. Fig. 3 and 4 show image comparison schematic diagrams of a point source target containing stronger background stray light and an extended target in a 19-unit traditional hartmann-shack wavefront detection device (left image) and a 19-unit polarization modulation hartmann-shack wavefront detection device (right image) of the invention respectively. It can be seen from the schematic diagram that by adopting the polarization modulation Hartmann-shack wavefront detection device, the signal-to-back ratio of the point source target and the extended target in a single sub-aperture relative to the background stray light is obviously enhanced, the extraction precision of the wavefront detection beacon is higher, and the wavefront detection is more accurate.
It should be noted that fig. 2 only shows single polarization degree information of the point source target and the extended target, and in practical applications, polarization phase angle information, polarization ellipticity information, and other parameters that can characterize the polarization state and their fusion may also be given, and there are many possibilities in the expression of polarization information.
The above description is only an embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can understand that the replacement or addition and subtraction within the technical scope of the present invention shall be covered within the scope of the present invention, therefore, the scope of the present invention shall be subject to the protection scope of the claims.
The invention as set forth in detail herein is well within the skill of the art.
Claims (7)
1. A polarization modulation Hartmann-shack wavefront detection device is characterized in that: the device comprises a wave plate (1), a wave plate rotating mechanism (2), an analyzer (3), a micro-lens array (4), a light intensity detector (5) and a data processor (6), wherein incident light containing target light and background stray light enters a polarization modulator jointly formed by the wave plate (1) and the analyzer (3) to modulate the polarization state of the incident light; the incident light after polarization modulation continuously transmits forwards and enters the micro-lens array (4) and is divided into M multiplied by N sub-regions, each sub-region is a micro-lens, and the divided incident light is imaged on a photosensitive surface of the light intensity detector (5) to obtain imaging intensity distribution I (M, N) of the corresponding sub-region;
the wave plate (1) is arranged on the wave plate rotating mechanism (2), can rotate together with the wave plate rotating mechanism (2) and rotates to different positions, and the polarization modulation states of the polarization modulator on incident light are different;
m and N are respectively the number of rows and columns of the micro-lens array, and I (M, N) is the intensity distribution detected by the area of the light intensity detector (5) corresponding to the micro-lens with the serial number (M, N);
incident light under different modulation states passes through the wave plate (1), the analyzer (3) and the micro-lens array (4), and finally the light intensity distribution after reaching the light intensity detector (5) is recorded and output to the data processor (6), wherein the data processing process is as follows:
the single sub-aperture area can be regarded as a polarization imaging micro-system, the light intensities measured under different modulation states are respectively marked as I (m, N,1), I (m, N,2), …, I (m, N, N),1,2, …, N are polarization modulation state serial numbers, and the modulation effect of the polarization modulator formed by the wave plate (1) and the analyzer (3) on the polarization state of an incident beam is represented by the following formula:
wherein S isinAnd Si outRespectively representing the polarization state of incident light and the polarization state of the initially set light beam after polarization modulation, MP(theta) an analyzer (3) with an angle theta between the analyzing direction and the horizontal direction, and M is a Mueller matrixR(αiDelta) is an angle alpha between the fast axis direction and the horizontal directioniA wave plate (1) with a retardation delta, i is a polarization modulation serial number in single measurement, and Sin、Si out、MP(theta) and MR(αiδ) expression is as follows:
because the light intensity detector (5) can detect the intensity information of the light beam, the following linear equation for solving the polarization state of the incident light can be obtained after the equations (1) to (4) are combined:
wherein,
after the polarization state of the incident light is solved by using the formula (5), information such as the polarization degree and the polarization phase angle of the incident light can be further acquired, as shown in the following formula:
so far, the Hartmann-shack sub-aperture image after polarization modulation is converted from the traditional intensity dimension into the polarization dimension, the polarization degree, the polarization phase angle and the like are partial representation forms of the sub-aperture image information in the polarization dimension, the polarization characteristic parameter (marked as P) after single polarization parameter or multiple polarization parameters are fused is utilized, the centroid algorithm or the cross-correlation algorithm and the like are applied to obtain the position offset and the slope in a single sub-aperture, and finally the wavefront error of an incident beam is recovered.
2. The polarization-modulated hartmann-shack wavefront-sensing device of claim 1, wherein: the device does not change the basic principle of Hartmann-shack wavefront detection, but converts the wavefront detection beacon from the traditional intensity dimension to the polarization dimension, thereby distinguishing the target light which cannot be distinguished by the traditional intensity dimension from the background stray light in the polarization dimension, and improving the signal-to-back ratio and the detection precision.
3. The polarization-modulated hartmann-shack wavefront-sensing device of claim 1, wherein: the polarization modulator consists of a wave plate and an analyzer, wherein the wave plate is mainly used for introducing different polarization phases, can adopt 1/4 wave plates or other wave plates, and can be made of natural crystals or artificial materials such as liquid crystals and the like; the analyzer is mainly used for outputting linearly polarized light, and can be made of wire grid type materials, crystals and other types of materials.
4. The polarization-modulated hartmann-shack wavefront-sensing device of claim 1, wherein: the wave plate needs to rotate for multiple times to form multiple modulation on incident light, the parameter selection needs to enable the coefficient matrix of the formula (5) to be full-rank, the measurement times are at least 4, more data redundancy introduced by measurement is beneficial to inhibiting system noise, and the measurement precision is improved.
5. The polarization-modulated hartmann-shack wavefront-sensing device of claim 1, wherein: the method can be applied to different Hartmann-shack wavefront detection scenes, and a detection object can be a point target or an expansion target.
6. The polarization-modulated hartmann-shack wavefront-sensing device of claim 1, wherein: the polarization degree and the polarization phase angle are only common parameters for representing polarization information of incident light, and linear polarization degree, circular polarization degree, elliptical polarization angle or other parameters capable of representing polarization characteristics can be adopted according to actual needs, or the polarization characteristic parameters are fused.
7. The polarization-modulated hartmann-shack wavefront-sensing device of claim 1, wherein: the light intensity detector (6) can detect the intensity of an incident light beam, and can adopt a CCD camera, a CMOS camera and an EMCCD camera as long as the light intensity detection and acquisition functions are met.
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