CN112484647A - 干涉仪位移测量系统及方法 - Google Patents
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- CN112484647A CN112484647A CN202011293860.0A CN202011293860A CN112484647A CN 112484647 A CN112484647 A CN 112484647A CN 202011293860 A CN202011293860 A CN 202011293860A CN 112484647 A CN112484647 A CN 112484647A
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- 238000005259 measurement Methods 0.000 title claims abstract description 106
- 238000006073 displacement reaction Methods 0.000 title claims abstract description 62
- 238000000034 method Methods 0.000 title claims abstract description 17
- 230000010287 polarization Effects 0.000 claims abstract description 43
- 230000003287 optical effect Effects 0.000 claims abstract description 27
- 239000000835 fiber Substances 0.000 claims description 16
- 238000006243 chemical reaction Methods 0.000 claims description 7
- 238000000691 measurement method Methods 0.000 claims description 7
- 230000005540 biological transmission Effects 0.000 claims description 6
- 238000009434 installation Methods 0.000 claims description 4
- 239000011521 glass Substances 0.000 claims description 3
- 239000000126 substance Substances 0.000 claims 1
- 238000000926 separation method Methods 0.000 description 11
- 238000010586 diagram Methods 0.000 description 6
- 230000010363 phase shift Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 230000033001 locomotion Effects 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000005494 condensation Effects 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02007—Two or more frequencies or sources used for interferometric measurement
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
- G01B9/02019—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations contacting different points on same face of object
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
- G01B9/02076—Caused by motion
- G01B9/02077—Caused by motion of the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Abstract
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Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
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CN202011293860.0A CN112484647B (zh) | 2020-11-18 | 2020-11-18 | 干涉仪位移测量系统及方法 |
US18/037,655 US20230417532A1 (en) | 2020-11-18 | 2021-10-22 | Interferometer displacement measurement system and method |
PCT/CN2021/125623 WO2022105533A1 (zh) | 2020-11-18 | 2021-10-22 | 干涉仪位移测量系统及方法 |
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CN112484647A true CN112484647A (zh) | 2021-03-12 |
CN112484647B CN112484647B (zh) | 2022-06-10 |
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US (1) | US20230417532A1 (zh) |
CN (1) | CN112484647B (zh) |
WO (1) | WO2022105533A1 (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114295227A (zh) * | 2021-12-27 | 2022-04-08 | 华南师范大学 | 一种测量轨道角动量光束拓扑荷值的系统及方法 |
CN114353671A (zh) * | 2022-01-14 | 2022-04-15 | 西安交通大学 | 一种实现位移和角度同步测量的双波长衍射干涉系统及方法 |
WO2022105533A1 (zh) * | 2020-11-18 | 2022-05-27 | 北京华卓精科科技股份有限公司 | 干涉仪位移测量系统及方法 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN117553675B (zh) * | 2023-11-17 | 2024-05-07 | 哈尔滨工业大学 | 基于一体式双偏振分光组件的外差激光干涉仪及测量方法 |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2022105533A1 (zh) * | 2020-11-18 | 2022-05-27 | 北京华卓精科科技股份有限公司 | 干涉仪位移测量系统及方法 |
CN114295227A (zh) * | 2021-12-27 | 2022-04-08 | 华南师范大学 | 一种测量轨道角动量光束拓扑荷值的系统及方法 |
CN114295227B (zh) * | 2021-12-27 | 2023-05-02 | 华南师范大学 | 一种测量轨道角动量光束拓扑荷值的系统及方法 |
CN114353671A (zh) * | 2022-01-14 | 2022-04-15 | 西安交通大学 | 一种实现位移和角度同步测量的双波长衍射干涉系统及方法 |
CN114353671B (zh) * | 2022-01-14 | 2022-11-01 | 西安交通大学 | 实现位移和角度同步测量的双波长衍射干涉系统及方法 |
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US20230417532A1 (en) | 2023-12-28 |
CN112484647B (zh) | 2022-06-10 |
WO2022105533A1 (zh) | 2022-05-27 |
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