CN112461918A - Adjusting system and adjusting method of eddy current sensor - Google Patents
Adjusting system and adjusting method of eddy current sensor Download PDFInfo
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Abstract
The invention discloses an adjusting system and an adjusting method of an eddy current sensor, and the adjusting system comprises a cloud computing control platform, a sample wafer authentication system and a statistical system, wherein the output end of a sample wafer information loading unit is connected with the input end of a central processing unit. The adjusting system and the adjusting method of the eddy current sensor sample materials to be detected through the processing unit, after general materials can be directly processed through the central processing unit, the automatic identification unit is used for identification, parameters of the eddy current sensor are not required to be adjusted, data searching is carried out on special materials through the data unit, the parameters of the eddy current sensor are adjusted through the parameter updating unit, the whole adjusting process is convenient and intelligent, and the problem that when the existing eddy current sensor detects the materials with special performance, the parameters of the eddy current sensor are adjusted more complicatedly is solved.
Description
Technical Field
The invention relates to the technical field of eddy current sensors, in particular to an adjusting system and an adjusting method of an eddy current sensor.
Background
The eddy current sensor can statically and dynamically measure the distance between a measured metal conductor and the surface of the probe in a non-contact manner, high linearity and high resolution manner. It is a non-contact linearized metrology tool. The eddy current sensor can accurately measure the static and dynamic relative displacement change between a measured body (which must be a metal conductor) and the end surface of the probe. In the state analysis, vibration research and analysis measurement of high-speed rotating machinery and reciprocating machinery, various parameters of the vibration state of a rotor can be continuously and accurately acquired for non-contact high-precision vibration and displacement signals. Such as the radial vibration, amplitude and axial position of the shaft. From theoretical analysis of rotor dynamics and bearing science, the motion state of a large-scale rotating machine mainly depends on a core-rotating shaft, and the eddy current sensor can directly measure the state of the rotating shaft in a non-contact manner, so that the early determination of mechanical problems such as unbalance, misalignment, bearing abrasion, shaft crack and friction of the rotor can provide key information. The eddy current sensor has the advantages of good long-term working reliability, wide measuring range, high sensitivity, high resolution, high response speed, strong interference resistance, no influence of oil stains and other media, simple structure and the like, and is widely applied to the online monitoring and fault diagnosis of the state of large-scale rotating machinery.
The invention discloses a method for adjusting an eddy current sensor, which comprises the steps of informing an eddy current sensor manufacturer of what a material to be measured is before purchasing the existing eddy current sensor, wherein the eddy current sensor can adapt to a ferromagnetic material or a non-ferromagnetic material, if the material has special performance, providing a manufacturer sample wafer, and adjusting parameters of the eddy current sensor by the manufacturer according to the sample wafer in the factory, so that the parameters are not required to be adjusted on the site of a customer, and the parameters are troublesome to adjust.
Disclosure of Invention
Aiming at the defects of the prior art, the invention provides an adjusting system and an adjusting method of an eddy current sensor, and solves the problems that when the existing eddy current sensor detects a material with special performance, a manufacturer needs to adjust some parameters of the eddy current sensor in the factory according to a sample wafer, and the whole process is complicated.
In order to achieve the purpose, the invention is realized by the following technical scheme: an adjusting system of an eddy current sensor comprises a cloud computing control platform, a sample wafer authentication system and a statistical system, wherein the sample wafer authentication system comprises a sample wafer information loading unit, a central processing unit, a data unit, a retrieval unit, a screening unit, a confirmation unit, a parameter updating unit, a use unit, an automatic identification unit and a processing unit, the output end of the sample wafer information loading unit is connected with the input end of the central processing unit, the output end of the central processing unit is respectively connected with the input ends of the data unit, the automatic identification unit and the processing unit, the output end of the data unit is connected with the input end of the retrieval unit, the output end of the retrieval unit is connected with the input end of the screening unit, the output end of the screening unit is connected with the input end of the confirmation unit, and the output ends of the confirmation unit and the processing unit are both connected with the input end of, and the output ends of the parameter updating unit and the automatic identification unit are connected with the input end of the using unit.
Preferably, the processing unit includes a feedback module, a central processing module, an upload module, a data backup module and a sharing module, an output end of the feedback module is connected with an input end of the central processing module, an output end of the central processing module is respectively connected with input ends of the data backup module and the upload module, and an output end of the upload module is connected with an input end of the sharing module.
Preferably, the automatic identification unit comprises an analysis module, an information processing module, a data parameter module, a main control module and a proposing module, wherein the output ends of the analysis module and the information processing module are connected with the input end of the data parameter module, the output end of the data parameter module is connected with the input end of the main control module, and the output end of the main control module is connected with the input end of the proposing module.
Preferably, the parameter updating unit comprises a data parameter inputting module, a central control module, a database module, a data reading module, a display module and a data parameter checking module, the output end of the data parameter inputting module is connected with the input end of the central control module, the output ends of the central control module and the data parameter checking module are connected with the input end of the database module, the output end of the database module is connected with the input end of the data reading module, and the output end of the data reading module is connected with the input end of the display module.
Preferably, the retrieval unit comprises an information input module, an information reading module, an information comparison module, a main control information module, an analysis information module and an output module, wherein the output end of the information input module is connected with the input end of the information reading module, the output ends of the information reading module and the information comparison module are connected with the input end of the main control information module, the output end of the main control information module is connected with the input end of the analysis information module, and the output end of the analysis information module is connected with the input end of the output module.
Preferably, the statistical system includes transmission unit, receiving element, memory cell, first database unit, central controller, second database unit, sending unit and terminal unit, transmission unit's output and receiving element's input are connected, receiving element and second database unit's output all are connected with memory cell's input, memory cell's output is connected with first database unit and sending unit's input respectively, first database unit's output is connected with central controller's input, central controller's output is connected with second database unit's input, sending unit's output is connected with terminal unit's input.
Preferably, the terminal unit comprises a receiving module, a control data module, an analysis module, an extraction module, a backup module and a sharing module, wherein the output end of the receiving module is connected with the input end of the control data module, the output end of the control data module is connected with the input end of the analysis module, and the output end of the analysis module is respectively connected with the input ends of the extraction module, the backup module and the sharing module.
Preferably, the memory cell includes that data summarize module, data processing module, categorised module, first derivation module, first module, the second of taking out is derived module and second and is taken out the module, the output of data summarize the module and is connected with data processing module's input, data processing module's output is connected with categorised module's input, categorised module's output is connected with the input of second derivation module first derivation module respectively, the output of first derivation module is connected with the first input of taking out the module, the output of second derivation module is connected with the input that the module was taken out to the second.
Preferably, the output end of the cloud computing control platform is respectively connected with the input ends of the sample wafer authentication system and the statistical system.
The invention also discloses an adjusting method of the eddy current sensor, which specifically comprises the following steps:
s1, sample recognition: firstly, identifying a sample wafer to be detected, directly processing general materials by a central processing unit, and then identifying by using an automatic identification unit, wherein parameters of an eddy current sensor do not need to be adjusted;
s2, parameter adjustment: for special materials, the central processing unit is used for transmitting the sample wafer information to the data unit, data searching is carried out on the parameter database through the retrieval unit and the screening unit, and then the confirmation unit is used for determining, so that the parameter updating unit is used for adjusting the parameters of the eddy current sensor;
s3, data sharing: for unknown materials, processing the unknown materials by using a central processing module, uploading the information of the unknown materials by using an uploading module, and sharing the information by using a sharing module;
s4, parameter data statistics: the information of the unknown material is transmitted through the transmission unit, the storage unit is used for storing the information into the first database unit, the central controller is used for processing the information to obtain the second database unit, the storage unit is used for storing the processed data again, and then the sending unit is used for sending the data.
Advantageous effects
The invention provides an adjusting system and an adjusting method of an eddy current sensor. Compared with the prior art, the method has the following beneficial effects:
(1) the adjusting system and the adjusting method of the eddy current sensor comprise a sample information loading unit, a central processing unit, a data unit, a retrieval unit, a screening unit, a confirmation unit, a parameter updating unit, a using unit, an automatic identification unit and a processing unit in a sample authentication system, wherein the output end of the sample information loading unit is connected with the input end of the central processing unit, the output end of the central processing unit is respectively connected with the input ends of the data unit, the automatic identification unit and the processing unit, the output end of the data unit is connected with the input end of the retrieval unit, the output end of the retrieval unit is connected with the input end of the screening unit, the output end of the screening unit is connected with the input end of the confirmation unit, the output ends of the confirmation unit and the processing unit are both connected with the input end of the parameter updating unit, and the output ends of the automatic identification unit are connected, treat the inspection material through the processing unit and sample, can directly handle the back through central processing unit to general material, utilize the automatic identification unit to discern, the eddy current sensor parameter needn't adjust, carry out data lookup through the data unit to special material, utilize parameter updating unit to make the adjustment to the eddy current sensor parameter, whole accommodation process has convenience and intellectuality, when having solved current eddy current sensor and having examined the material that the performance is more special, need the producer can adjust some parameters of eddy current sensor in the mill according to the sample wafer, the more loaded down with trivial details problem of whole process.
(2) The eddy current sensor adjusting system comprises a feedback module, a central processing module, an uploading module, a data backup module and a sharing module in a processing unit, wherein the output end of the feedback module is connected with the input end of the central processing module, the output end of the central processing module is respectively connected with the input ends of the data backup module and the uploading module, the output end of the uploading module is connected with the input end of the sharing module, the information of some unknown materials is conveniently fed back through the cooperation of the uploading module and the sharing module, and the information is timely sent to an eddy current sensor manufacturer.
(3) The output end of the transmission unit is connected with the input end of the receiving unit, the output ends of the receiving unit and the second database unit are both connected with the input end of the storage unit, the output end of the storage unit is respectively connected with the input ends of the first database unit and the sending unit, the output end of the first database unit is connected with the input end of the central controller, the output end of the central controller is connected with the input end of the second database unit, the output end of the sending unit is connected with the input end of the terminal unit, and information is timely transmitted to an eddy current sensor manufacturer through sample wafer information data transmitted to people, the manufacturer can use the information to update the parameter data of the eddy current sensor in time, so that more people can use the eddy current sensor conveniently.
Drawings
FIG. 1 is a schematic block diagram of the system of the present invention;
FIG. 2 is a functional block diagram of a dailies authentication system of the present invention;
FIG. 3 is a functional block diagram of a processing unit of the present invention;
FIG. 4 is a functional block diagram of the automatic identification unit of the present invention;
FIG. 5 is a schematic block diagram of a parameter update unit according to the present invention;
FIG. 6 is a functional block diagram of the retrieval unit of the present invention;
FIG. 7 is a functional block diagram of a statistical system of the present invention;
FIG. 8 is a functional block diagram of a terminal unit of the present invention;
FIG. 9 is a functional block diagram of a memory cell of the present invention;
FIG. 10 is a process flow diagram of the present invention.
In the figure: 1-cloud computing control platform, 2-sample authentication system, 201-sample information loading unit, 202-central processing unit, 203-data unit, 204-retrieval unit, 2041-information entry module, 2042-information reading module, 2043-information comparison module, 2044-main control information module, 2045-analytic information module, 2046-output module, 205-screening unit, 206-confirmation unit, 207-parameter updating unit, 2071-data parameter entry module, 2072-central control module, 2073-database module, 2074-data reading module, 2075-display module, 2076-data parameter viewing module, 208-use unit, 209-automatic identification unit, 2091-analysis module, 2092-information processing module, 2093-data parameter module, 2094-main control module, 2095-lifting module, 210-processing unit, 2101-feedback module, 2102-central processing module, 2103-uploading module, 2104-data backup module, 2105-sharing module, 3-statistical system, 31-transmission unit, 32-receiving unit, 33-storage unit, 331-data summary module, 332-data processing module, 333-classification module, 334-first export module, 335-first fetch module, 336-second export module, 337-second fetch module, 34-first database unit, 35-central controller, 36-second database unit, 37-sending unit, 38-terminal unit, 381-receiving module, 382-a control data module, 383-a parsing module, 384-an extraction module, 385-a backup module and 386-a sharing module.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1-10, the present invention provides a technical solution: an adjusting system of an eddy current sensor comprises a cloud computing control platform 1, a sample authentication system 2 and a statistical system 3, wherein the sample authentication system 2 comprises a sample information loading unit 201, a central processing unit 202, a data unit 203, a retrieval unit 204, a screening unit 205, a confirmation unit 206, a parameter updating unit 207, a using unit 208, an automatic identification unit 209 and a processing unit 210, the output end of the sample information loading unit 201 is connected with the input end of the central processing unit 202, the output end of the central processing unit 202 is respectively connected with the input ends of the data unit 203, the automatic identification unit 209 and the processing unit 210, the output end of the data unit 203 is connected with the input end of the retrieval unit 204, the output end of the retrieval unit 204 is connected with the input end of the screening unit 205, the output end of the screening unit 205 is connected with the input end of the confirmation unit 206, the output ends of the confirmation unit 206 and the processing unit 210 are both connected with the input end, the output ends of the parameter updating unit 207 and the automatic identification unit 209 are connected with the input end of the using unit 208, the material to be detected is sampled through the processing unit 201, general materials can be directly processed through the central processing unit 202, the automatic identification unit 209 is used for identification, parameters of the eddy current sensor do not need to be adjusted, data searching is conducted on special materials through the data unit 203, the parameters of the eddy current sensor are adjusted through the parameter updating unit 207, the whole adjusting process is convenient and intelligent, the problem that when the existing eddy current sensor detects materials with special performance, a manufacturer is required to adjust some parameters of the eddy current sensor in a factory according to sample wafers, and the whole process is complex is solved.
The processing unit 210 comprises a feedback module 2101, a central processing module 2102, an uploading module 2103, a data backup module 2104 and a sharing module 2105, an output end of the feedback module 2101 is connected with an input end of the central processing module 2102, an output end of the central processing module 2102 is respectively connected with input ends of the data backup module 2104 and the uploading module 2103, an output end of the uploading module 2103 is connected with an input end of the sharing module 2105, and the uploading module 2103 and the sharing module 2105 are matched for use, so that feedback on information of some unknown materials is facilitated, and the information is timely transmitted to an eddy current sensor manufacturer.
The automatic identification unit 209 includes an analysis module 2091, an information processing module 2092, a data parameter module 2093, a main control module 2094 and a proposed module 2095, wherein output terminals of the analysis module 2091 and the information processing module 2092 are connected to an input terminal of the data parameter module 2093, an output terminal of the data parameter module 2093 is connected to an input terminal of the main control module 2094, and an output terminal of the main control module 2094 is connected to an input terminal of the proposed module 2095.
The parameter updating unit 207 includes a data parameter inputting module 2071, a central control module 2072, a database module 2073, a data reading module 2074, a display module 2075 and a data parameter checking module 2076, an output end of the data parameter inputting module 2071 is connected with an input end of the central control module 2072, output ends of the central control module 2072 and the data parameter checking module 2076 are connected with an input end of the database module 2073, an output end of the database module 2073 is connected with an input end of the data reading module 2074, and an output end of the data reading module 2074 is connected with an input end of the display module 2075.
The retrieval unit 204 includes an information entry module 2041, an information reading module 2042, an information comparison module 2043, a main control information module 2044, an analysis information module 2045 and an output module 2046, an output end of the information entry module 2041 is connected with an input end of the information reading module 2042, output ends of the information reading module 2042 and the information comparison module 2043 are both connected with an input end of the main control information module 2044, an output end of the main control information module 2044 is connected with an input end of the analysis information module 2045, and an output end of the analysis information module 2045 is connected with an input end of the output module 2046.
The statistical system 3 comprises a transmission unit 31, a receiving unit 32, a storage unit 33, a first database unit 34, a central controller 35, a second database unit 36, a sending unit 37 and a terminal unit 38, wherein an output end of the transmission unit 31 is connected with an input end of the receiving unit 32, output ends of the receiving unit 32 and the second database unit 36 are both connected with an input end of the storage unit 33, an output end of the storage unit 33 is respectively connected with input ends of the first database unit 34 and the sending unit 37, an output end of the first database unit 34 is connected with an input end of the central controller 35, an output end of the central controller 35 is connected with an input end of the second database unit 36, an output end of the sending unit 37 is connected with an input end of the terminal unit 38, information is timely transmitted to an eddy current sensor manufacturer through sample information data transmitted by people, and the manufacturer can update parameter data of the eddy current sensor in time by using the information, so as to be convenient for more people to use.
The terminal unit 38 includes a receiving module 381, a control data module 382, an analyzing module 383, an extracting module 384, a backup module 385 and a sharing module 386, wherein an output end of the receiving module 381 is connected to an input end of the control data module 382, an output end of the control data module 382 is connected to an input end of the analyzing module 383, and an output end of the analyzing module 383 is connected to input ends of the extracting module 384, the backup module 385 and the sharing module 386, respectively.
The storage unit 33 includes a data summarization module 331, a data processing module 332, a classification module 333, a first derivation module 334, a first extraction module 335, a second derivation module 336 and a second extraction module 337, an output end of the data summarization module 331 is connected with an input end of the data processing module 332, an output end of the data processing module 332 is connected with an input end of the classification module 333, an output end of the classification module 333 is connected with input ends of the first derivation module 334 and the second derivation module 336, an output end of the first derivation module 334 is connected with an input end of the first extraction module 335, and an output end of the second derivation module 336 is connected with an input end of the second extraction module 337.
The output end of the cloud computing control platform 1 is respectively connected with the input ends of the sample wafer authentication system 2 and the statistical system 3.
The invention also discloses an adjusting method of the eddy current sensor, which specifically comprises the following steps:
s1, sample recognition: firstly, a sample wafer to be detected is identified through 201, general materials can be directly processed through a central processing unit 202, then the identification is carried out through an automatic identification unit 209, and parameters of an eddy current sensor do not need to be adjusted;
s2, parameter adjustment: for special materials, the central processing unit 202 is used for transmitting the sample information to the data unit 203, the data is searched in the parameter database through the retrieval unit 204 and the screening unit 205, and then the confirmation unit 206 is used for determining, so that the parameter updating unit 207 is used for adjusting the parameters of the eddy current sensor;
s3, data sharing: for the unknown material, the unknown material is processed by the central processing module 2102, the information of the unknown material is uploaded by the uploading module 2103 and shared by the sharing module 2105;
s4, parameter data statistics: the information of the unknown material is transmitted by the transmission unit 31, stored in the first database unit 34 by the storage unit 33, processed by the central controller 35 to obtain the second database unit 36, stored again by the storage unit 33, and then transmitted by the transmission unit 37.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (10)
1. The utility model provides an eddy current sensor's governing system, includes cloud computing control platform (1), sample wafer authentication system (2) and statistical system (3), its characterized in that: the dailies authentication system (2) comprises a dailies information loading unit (201), a central processing unit (202), a data unit (203), a retrieval unit (204), a screening unit (205), a confirmation unit (206), a parameter updating unit (207), a using unit (208), an automatic identification unit (209) and a processing unit (210), wherein the output end of the dailies information loading unit (201) is connected with the input end of the central processing unit (202), the output end of the central processing unit (202) is respectively connected with the input ends of the data unit (203), the automatic identification unit (209) and the processing unit (210), the output end of the data unit (203) is connected with the input end of the retrieval unit (204), the output end of the retrieval unit (204) is connected with the input end of the screening unit (205), the output end of the screening unit (205) is connected with the input end of the confirmation unit (206), the output ends of the confirming unit (206) and the processing unit (210) are connected with the input end of the parameter updating unit (207), and the output ends of the parameter updating unit (207) and the automatic identification unit (209) are connected with the input end of the using unit (208).
2. The system for conditioning an eddy current sensor as recited in claim 1, wherein: the processing unit (210) comprises a feedback module (2101), a central processing module (2102), an uploading module (2103), a data backup module (2104) and a sharing module (2105), wherein the output end of the feedback module (2101) is connected with the input end of the central processing module (2102), the output end of the central processing module (2102) is respectively connected with the input ends of the data backup module (2104) and the uploading module (2103), and the output end of the uploading module (2103) is connected with the input end of the sharing module (2105).
3. The system for conditioning an eddy current sensor as recited in claim 1, wherein: the automatic identification unit (209) comprises an analysis module (2091), an information processing module (2092), a data parameter module (2093), a main control module (2094) and a proposed module (2095), wherein output ends of the analysis module (2091) and the information processing module (2092) are connected with an input end of the data parameter module (2093), an output end of the data parameter module (2093) is connected with an input end of the main control module (2094), and an output end of the main control module (2094) is connected with an input end of the proposed module (2095).
4. The system for conditioning an eddy current sensor as recited in claim 1, wherein: the parameter updating unit (207) comprises a data parameter inputting module (2071), a central control module (2072), a database module (2073), a data reading module (2074), a display module (2075) and a data parameter checking module (2076), wherein the output end of the data parameter inputting module (2071) is connected with the input end of the central control module (2072), the output ends of the central control module (2072) and the data parameter checking module (2076) are connected with the input end of the database module (2073), the output end of the database module (2073) is connected with the input end of the data reading module (2074), and the output end of the data reading module (2074) is connected with the input end of the display module (2075).
5. The system for conditioning an eddy current sensor as recited in claim 1, wherein: the retrieval unit (204) comprises an information entry module (2041), an information reading module (2042), an information comparison module (2043), a master control information module (2044), an analytic information module (2045) and an output module (2046), wherein the output end of the information entry module (2041) is connected with the input end of the information reading module (2042), the output ends of the information reading module (2042) and the information comparison module (2043) are connected with the input end of the master control information module (2044), the output end of the master control information module (2044) is connected with the input end of the analytic information module (2045), and the output end of the analytic information module (2045) is connected with the input end of the output module (2046).
6. The system for conditioning an eddy current sensor as recited in claim 1, wherein: the statistical system (3) comprises a transmission unit (31), a receiving unit (32), a storage unit (33), a first database unit (34), a central controller (35), a second database unit (36), a sending unit (37) and a terminal unit (38), the output end of the transmission unit (31) is connected with the input end of the receiving unit (32), the output ends of the receiving unit (32) and the second database unit (36) are connected with the input end of the storage unit (33), the output of the memory unit (33) is connected to the input of a first database unit (34) and a transmitting unit (37) respectively, the output of the first database unit (34) is connected to the input of a central controller (35), the output of the central controller (35) is connected to the input of a second database unit (36), the output of the transmission unit (37) is connected to the input of a terminal unit (38).
7. An eddy current sensor regulation system according to claim 6 wherein: the terminal unit (38) comprises a receiving module (381), a control data module (382), an analyzing module (383), an extracting module (384), a backup module (385) and a sharing module (386), wherein the output end of the receiving module (381) is connected with the input end of the control data module (382), the output end of the control data module (382) is connected with the input end of the analyzing module (383), and the output end of the analyzing module (383) is connected with the input ends of the extracting module (384), the backup module (385) and the sharing module (386) respectively.
8. An eddy current sensor regulation system according to claim 6 wherein: the storage unit (33) comprises a data summarizing module (331), a data processing module (332), a classification module (333), a first derivation module (334), a first retrieval module (335), a second derivation module (336) and a second retrieval module (337), wherein the output end of the data summarizing module (331) is connected with the input end of the data processing module (332), the output end of the data processing module (332) is connected with the input end of the classification module (333), the output end of the classification module (333) is respectively connected with the input ends of the first derivation module (334) and the second derivation module (336), the output end of the first derivation module (334) is connected with the input end of the first retrieval module (335), and the output end of the second derivation module (336) is connected with the input end of the second retrieval module (337).
9. The system for conditioning an eddy current sensor as recited in claim 1, wherein: and the output end of the cloud computing control platform (1) is respectively connected with the input ends of the sample wafer authentication system (2) and the statistical system (3).
10. A method of tuning an eddy current sensor, comprising: the method specifically comprises the following steps:
s1, sample recognition: firstly, identifying a sample wafer to be detected through a central processing unit (202), directly processing general materials through the central processing unit (201), and then identifying the general materials through an automatic identification unit (209), wherein parameters of an eddy current sensor do not need to be adjusted;
s2, parameter adjustment: for special materials, the central processing unit (202) is used for transmitting the sample information to the data unit (203), the retrieval unit (204) and the screening unit (205) are used for carrying out data search in the parameter database, and the confirmation unit (206) is used for determining, so that the parameter updating unit (207) is used for adjusting the parameters of the eddy current sensor;
s3, data sharing: for unknown materials, processing the unknown materials by using a central processing module (2102), uploading the information of the unknown materials by using an uploading module (2103), and sharing the information by using a sharing module (2105);
s4, parameter data statistics: the information of the unknown material is transmitted by a transmission unit (31), the information is stored in a first database unit (34) by a storage unit (33), a second database unit (36) is obtained by processing of a central controller (35), the processed data is stored again by the storage unit (33), and then the data is transmitted by a transmission unit (37).
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