CN112326660B - Sample detection system - Google Patents
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- CN112326660B CN112326660B CN202011216057.7A CN202011216057A CN112326660B CN 112326660 B CN112326660 B CN 112326660B CN 202011216057 A CN202011216057 A CN 202011216057A CN 112326660 B CN112326660 B CN 112326660B
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- 238000001514 detection method Methods 0.000 title claims abstract description 44
- 230000033001 locomotion Effects 0.000 claims abstract description 13
- 238000000386 microscopy Methods 0.000 claims description 34
- 230000007246 mechanism Effects 0.000 claims description 16
- 239000000758 substrate Substances 0.000 claims description 10
- 239000002699 waste material Substances 0.000 claims description 7
- 239000000428 dust Substances 0.000 abstract description 3
- 239000000969 carrier Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 238000013519 translation Methods 0.000 description 4
- 238000012546 transfer Methods 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 238000004378 air conditioning Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 201000010099 disease Diseases 0.000 description 1
- 208000037265 diseases, disorders, signs and symptoms Diseases 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 210000000582 semen Anatomy 0.000 description 1
- 210000002700 urine Anatomy 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/13—Moving of cuvettes or solid samples to or from the investigating station
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0106—General arrangement of respective parts
- G01N2021/0112—Apparatus in one mechanical, optical or electronic block
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- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Sampling And Sample Adjustment (AREA)
- Microscoopes, Condenser (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
Abstract
The invention relates to a sample detection system, which is used for realizing the alignment of a lens and a carrier through the movement of a microscopic examination platform and adjusting the position of the lens, so that the lens can acquire images at a plurality of different positions, thereby acquiring images of a sample with a larger range for detection. Therefore, the acquired image can relatively accurately reflect the real situation of the sample, thereby improving the detection precision. Moreover, when the carrier is located at the microscopic examination position, the pressing sheet can press the carrier to limit the carrier to move up and down, so that uneven placement of the carrier caused by moving inertia or dust and the like is prevented, the situation that the carrier is not in the same focal length is reduced, complex operation of repeated focusing is greatly reduced, and the using convenience of the microscopic examination device is improved.
Description
The present application is a divisional application of chinese invention patent application with application number 201610750374.4, which is filed by the applicant at 2016, 08 and 29 and is entitled "sample detection system and sample detection method".
Technical Field
The invention relates to the technical field of medical instruments, in particular to a sample detection system.
Background
When a patient is detected, sometimes the sample to be detected (such as stool, urine, semen, leucorrhea and the like) of the patient is detected, the sample is conveyed to a microscopic examination platform during detection, and then a microscope is used for aiming at the sample to collect images, so that the sample is detected. In general, a microscope can detect a small range of samples, and therefore, only a small range of samples can be detected, and the small range of samples sometimes cannot completely represent the whole sample, so that the detection accuracy is low, and the accuracy of disease detection is affected.
Disclosure of Invention
Based on the above, it is necessary to provide a sample detection system with a large sample detection range and high detection accuracy, aiming at the problem that the detection accuracy is affected by a small sample detection range.
The sample detection system comprises a third conveying device and a microscopic examination device, wherein the microscopic examination device comprises a microscopic examination platform and a lens, the microscopic examination platform comprises a first conveying plate, and a microscopic examination position is arranged on the first conveying plate; the third conveying device is used for conveying the carrier to the microscopic examination position and pushing the carrier away from the microscopic examination position; the microscopic examination position can move in a first direction and a second direction so as to adjust the position of the microscopic examination position relative to the lens, and the lens is used for picking up images of the carrier on the microscopic examination position;
the first conveying plate is provided with a guide chute, the microscopic examination position is arranged on the guide chute, a pressing sheet for pressing the carrier positioned at the microscopic examination position is arranged at the position, corresponding to the microscopic examination position, of the first conveying plate, the pressing sheet is fixed outside the guide chute and partially stretches into the guide chute, and a gap is reserved between the part, stretching into the guide chute, of the pressing sheet and the bottom of the guide chute.
In one embodiment, the third conveying device includes a fourth conveying belt, a sixth driving member, a sliding block and a pushing rod, where the sixth driving member, the sliding block and the pushing rod are all connected to the fourth conveying belt and can be driven to move by the fourth conveying belt, and the sixth driving member is used for pushing the sliding block and the pushing rod to move.
In one embodiment, the microscopy platform comprises a fixed plate, a sliding plate, a seventh driving piece for driving the sliding plate to move along a first direction relative to the fixed plate, a moving plate and an eighth driving piece for driving the moving plate to move along a second direction relative to the sliding plate, wherein the microscopy position is arranged on the moving plate; the microscopic examination platform further comprises a connecting sheet connected with the moving plate and a first conveying plate connected with the connecting sheet, and the guide chute is arranged on the first conveying plate.
In one embodiment, the pressing sheet is disposed on the first conveying plate, and the pressing sheet is fixed outside the sliding guide groove of the first conveying plate, extends into the sliding guide groove partially, and leaves a gap between the part extending into the sliding guide groove and the bottom of the sliding guide groove.
In one embodiment, the microscopy platform further comprises a first sensor fixed relative to the fixed plate, a first sensor fixed to the movable plate, a second sensor fixed relative to the fixed plate, and a second sensor fixed to the sliding plate, wherein the first sensor and the first sensor are used for sensing whether the movable plate moves to an original position in a second direction, and the second sensor are used for sensing whether the sliding plate moves to the original position in the first direction.
In one embodiment, the first conveying device includes a second driving member, a moving block connected to the second driving member, and a weight connected to the moving block; the heavy hammer can rotate to a first position and a second position, when the heavy hammer is in the first position, the heavy hammer is in a natural state, a part of the heavy hammer is positioned on a moving path of a carrier, and when the heavy hammer is in the second position, the heavy hammer is separated from the moving path of the carrier;
the weight is arranged on one end of the rotating shaft of the weight, and the weight is arranged on the other end of the rotating shaft of the weight.
In one embodiment, the second conveying device comprises a fifth driving member and a conveying member, wherein the fifth driving member is used for driving the conveying member to move, so that carriers on the conveying member are driven to move.
In one embodiment, the second conveying device further comprises a plurality of groups of limiting protrusions arranged on two sides of the conveying piece, the plurality of groups of limiting protrusions are sequentially arranged at intervals, and the carrier is located between two adjacent groups of limiting protrusions.
In one embodiment, the sample loading device further comprises a sample loading device, the sample loading device comprises a third driving piece, a sample loading needle and a limiting mechanism arranged corresponding to the sample loading position, the third driving piece drives the sample loading needle to move up and down so as to load a sample on a carrier positioned at the sample loading position, and the limiting mechanism comprises an elastic piece, wherein the elastic piece is used for elastically pressing the carrier along the sample loading direction of the sample loading needle so as to limit the movement of the carrier along the sample loading direction of the sample loading needle.
In one embodiment, the elastic member includes a mounting portion and a contact portion connected to the mounting portion, where the mounting portion is fixed relative to the sample loading position, and the contact portion is used to elastically press against the carrier.
In one embodiment, the contact portion includes a first section and a second section, the first section is connected to one side of the mounting portion, the second section is connected to one end of the first section, the second section is inclined at a certain angle with respect to the first section, and the second section abuts against the carrier.
In one embodiment, the limiting mechanism further comprises a fixing piece, the fixing piece is fixed relative to the sample adding position, and the elastic piece is fixedly connected to the fixing piece through the mounting portion.
When the sample detection system is used for drawing, the alignment of the lens and the carrier is realized through the movement of the microscopic examination platform, and the position of the lens is adjusted, so that the lens can be used for drawing at a plurality of different positions, and the image of a sample with a larger range is obtained for detection. Therefore, the acquired image can relatively accurately reflect the real situation of the sample, thereby improving the detection precision. Moreover, when the carrier is located at the microscopic examination position, the pressing sheet can press the carrier to limit the carrier to move up and down, so that uneven placement of the carrier caused by moving inertia or dust and the like is prevented, the situation that the carrier is not in the same focal length is reduced, complex operation of repeated focusing is greatly reduced, and the using convenience of the microscopic examination device is improved.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of the overall structure of a sample detection system according to a preferred embodiment of the present invention;
FIG. 2 is a schematic diagram of a sample application device of the sample detection system shown in FIG. 1;
FIG. 3 is a schematic diagram of a limiting mechanism of the sample detection system shown in FIG. 1;
FIG. 4 is a schematic diagram illustrating a limiting mechanism and a first conveying device of the sample detection system shown in FIG. 1;
FIG. 5 is a schematic view of the elastic member of the limiting mechanism shown in FIG. 3;
FIG. 6 is a schematic diagram of a second transport device of the sample detection system of FIG. 1;
FIG. 7 is a schematic diagram of a third conveying device of the sample detection system shown in FIG. 1;
FIG. 8 is a schematic view of an angle structure of a microscopy stage of the sample detection system of FIG. 1;
FIG. 9 is a schematic view of another angular configuration of the microscopy stage of FIG. 8; a kind of electronic device with high-pressure air-conditioning system
FIG. 10 is a schematic view of a portion of the microscopy stage of FIG. 8.
Detailed Description
In order that the above objects, features and advantages of the invention will be readily understood, a more particular description of the invention will be rendered by reference to the appended drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. The present invention may be embodied in many other forms than described herein and similarly modified by those skilled in the art without departing from the spirit of the invention, whereby the invention is not limited to the specific embodiments disclosed below.
In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings are merely for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the device or element being referred to must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the present invention.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present invention, the meaning of "plurality" means at least two, for example, two, three, etc., unless specifically defined otherwise.
In the present invention, unless explicitly specified and limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; either directly or indirectly, through intermediaries, or both, may be in communication with each other or in interaction with each other, unless expressly defined otherwise. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to the specific circumstances.
In the present invention, unless expressly stated or limited otherwise, a first feature "up" or "down" a second feature may be the first and second features in direct contact, or the first and second features in indirect contact via an intervening medium. Moreover, a first feature being "above," "over" and "on" a second feature may be a first feature being directly above or obliquely above the second feature, or simply indicating that the first feature is level higher than the second feature. The first feature being "under", "below" and "beneath" the second feature may be the first feature being directly under or obliquely below the second feature, or simply indicating that the first feature is less level than the second feature.
It will be understood that when an element is referred to as being "fixed" or "disposed" on another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and the like are used herein for illustrative purposes only and are not meant to be the only embodiment.
Referring to fig. 1, a sample detection system in a preferred embodiment of the present invention includes a substrate 10, a carrier storage device 20, a first conveying device 30, a second conveying device 40, a third conveying device 50, and a microscopic examination device 60, wherein a sample loading station 102, a transfer station 104, a pushing station 106, and an output station 108 are disposed on the substrate 10. The microscopic examination device 60 comprises a microscopic examination platform 62 and a lens 64, wherein the microscopic examination platform 62 comprises a first conveying plate 634, and a microscopic examination position is arranged on the first conveying plate 634. The first conveying device 30 is used for conveying the carrier 100 in the carrier storage device 20 to the loading position 102 and conveying the carrier to the transfer position 104 after loading. The second conveyor 40 is used to convey the carrier 100 from the transfer station 104 to the push station 106, and the third conveyor 50 is used to convey the carrier 100 from the push station 106 via the output station 108 to the microscopy station 62 of the microscopy apparatus 60 and to push the carrier away from the microscopy station. The mirror position of the mirror platform 62 is movable in a first direction and a second direction to adjust the position of the mirror position of the lens 64, so that the lens 64 is aligned with the mirror position carrier 100, and the lens 64 is used to map the mirror position carrier 100.
It should be understood that the loading station 102, the transferring station 104, the pushing station 106, and the output station 108 may not be disposed on the substrate 10, as long as there is a position for accommodating the carrier 100.
According to the sample detection system, the carrier 100 is sequentially conveyed to the microscopic examination device 60 after being loaded from the carrier storage device 20 through the three conveying devices, the lens 64 and the carrier 100 are aligned through movement of the microscopic examination platform 62, an operator is not required to operate a sample to be detected in the whole detection process, and the risk of pollution to the operator can be effectively reduced.
Referring to fig. 8 to 10, a guide chute 6342 is disposed on the first conveying plate 634 of the microscopy platform 62, a pressing plate 636 for pressing the carrier 100 at the microscopy position is disposed at a position of the first conveying plate 634 corresponding to the microscopy position, the pressing plate 636 is fixed outside the guide chute 6342 and partially extends into the guide chute 6342, and a gap is left between the portion of the pressing plate 636 extending into the guide chute 6342 and the bottom of the guide chute 6342.
When the carrier 100 is in the microscopy position within the guide rail 6342, the tab 636 presses against the carrier 100 to limit its up and down movement. Specifically, one pressing piece 636 is provided on each side of the guide chute 6342, thereby pressing both sides of the carrier 100. The position of the tab 636 corresponds to the microscopy position. By providing the pressing sheet 636, the carrier 100 can be pressed at the time of drawing, thereby preventing uneven placement of the carrier 100 due to moving inertia or dust on the rail, etc., and causing images not to be focused on the same layer at the time of drawing.
In this embodiment, the carrier storage device 20 may be disposed on the substrate 10, and is used for storing clean carriers (such as a counting plate).
In this embodiment, the carrier storage device 20 includes a translation plate disposed therein, on which multiple groups of carriers 100 can be placed side by side, and the sample detection system further includes a carrier translation device 70, where the carrier translation device 70 is configured to drive the translation plate to translate relative to the substrate 10 so that different groups of carriers 100 can be aligned with the first conveying device 30 respectively. Each of the plurality of sets of carriers 100 may house one or more carriers 100.
Specifically, the carrier translating device 70 may include a first driving member and a first conveying belt, where the first conveying belt is connected to the translating plate, and the first driving member rotates to drive the first conveying belt to move, so as to drive the translating plate to move. It will be appreciated that the carrier translating device 70 may also be a telescopic mechanism, such as an oil cylinder, with a piston rod or a cylinder body connected to the translating plate, where the oil cylinder stretches to drive the translating plate to move.
Referring to fig. 2, 3 and 4, in the present embodiment, the first conveying device 30 includes a second driving member, a moving block 302 driven to move by the second driving member, and a weight 304 rotatably connected to the moving block 302, wherein the weight 304 can be rotated to a first position and a second position, when the weight 304 is in the first position, the weight 304 is in a natural state, and the weight 304 is partially located on the moving path of the carrier 100, and when the weight 304 is in the second position, the weight 304 is separated from the moving path of the carrier 100. The weight of the weight 304 at one end of the shaft is greater than the weight at the other end, so that the resistance to rotation of the weight 304 in one direction is greater than the resistance to rotation in the opposite direction. In this embodiment, the second driving member is a motor. By arranging the weight 304, when the carrier 100 in the carrier storage device 20 needs to be transported to the sample loading position 102, the moving block 302 and the weight 304 are positioned at the leftmost end as shown in fig. 4, and the weight 304 contacts the carrier 100 as the second driving member drives the moving block 302 and the weight 304 to move rightwards, and at this time, the driving force required for the rotation of the weight 304 is larger, the weight 304 cannot rotate, so as to push the carrier 100 to move rightwards; when carrier 100 reaches the predetermined position, moving block 302 and weight 304 move to the left, and weight 304 is located at the right side of carrier storage device 20, and when weight 304 contacts the right end of carrier 100 in carrier storage device 20, the driving force required for rotation of weight 304 is smaller, and weight 304 is pushed by carrier 100 to rotate during the leftward movement to avoid being located on the moving path of carrier 100, so that weight 304 returns to the left side of carrier storage device 20 and is ready for pushing the next carrier 100 to the right.
Specifically, the first conveying device 30 further includes a second conveying belt 305 driven by the second driving member, and the moving block 302 is fixed to the second conveying belt 305.
Specifically, the first conveying device 30 may further include a guide rail 306, and the moving block 302 moves against the guide rail 306. In this embodiment, the guide rail 306 may be disposed on the substrate 10.
In this embodiment, the sample detection system further comprises a loading device 80, the loading device 80 comprising a loading needle 802 for loading the sample onto the carrier 100 at the loading station 102.
In this embodiment, the sample loading device 100 further includes a third driving member 804, a transmission mechanism connected to the third driving member 804, and a fixed block 810 connected to the transmission mechanism, where the sample loading needle 802 is fixedly connected to the fixed block 810, and the third driving member 804 rotates to drive the sample loading needle 802 to move up and down; the loading device 100 further includes a fourth driving member, and the fixing block 810 is driven by the fourth driving member to move in a direction perpendicular to the up-down direction. The loading needle 802 is thus movable in two directions to effect sampling and, after sampling, to a position aligned with the loading site for loading. Specifically, the third driving member and the fourth driving member may each be a motor.
Specifically, the carrier 100 is provided with a loading hole 1002, and the loading needle 802 is aligned with the loading hole 1002 for loading during loading.
In this embodiment, the sample loading device 80 further includes a limiting mechanism 812 disposed corresponding to the sample loading position 102, where the limiting mechanism 812 includes an elastic member 8122, and the elastic member 8122 is used to elastically support the carrier 100, so as to limit the movement of the carrier 100 in the up-down direction. When the carrier 100 is located at the sample loading position 102, the elastic piece 8122 of the limiting mechanism 812 elastically abuts against the carrier 100, and the carrier 100 is pressed by the elastic piece 8122 and cannot be carried up in the process of upward withdrawal after the sample loading of the sample loading needle 802 is completed, so that the carrier 100 can normally enter the subsequent process; meanwhile, in the process of moving the carrier 100 towards the loading position 102, the carrier 100 gradually receives the resistance of the elastic piece 8122 after contacting the elastic piece 8122 and gradually decelerates until stopping, thus, the carrier 100 is prevented from deviating from the loading position 102 due to the motion inertia, the accurate positioning of the carrier 100 is realized, and the loading needle 802 is ensured to be aligned with the loading hole 1002 of the carrier 100.
In this embodiment, referring to fig. 5, the elastic member 8122 includes a mounting portion 81222 fixedly connected to the substrate 10 and a contact portion 81224 elastically pressing against the carrier 100, the contact portion 81224 is connected to the mounting portion 81222, and the contact portion 81224 is an elastic sheet.
In this embodiment, the contact portion 81224 includes a first section connected to one side of the mounting portion 81222 and a second section connected to one end of the first section, and the second section is inclined at an angle with respect to the first section. Specifically, the inclination angle may be an obtuse angle. When the carrier 100 is located at the loading position 102, the contact portion 81224 is lifted by the carrier 100 to deform, and the second section of the elastic member 8122 abuts against the carrier 100.
In this embodiment, the moving direction of the carrier 100 is a direction along the connection between the second section and the first section of the elastic member 8122 and pointing to the end of the second section away from the first section. In this way, the carrier 100 can smoothly enter the lower surface of the second section under the guidance of the second section in the process of entering the sample adding position 102, and can not be propped against the end, far away from the first section, of the second section, and meanwhile, the carrier 100 can be smoothly removed from the lower surface of the second section after sample adding, and no interference can be generated.
In this embodiment, the limiting mechanism 812 further includes a fixing member 8124, the fixing member 8124 is fixedly connected to the substrate 10, and the elastic member 8122 is fixedly connected to the fixing member 8124 through the mounting portion 81222. Specifically, the contact portion 81224 of the elastic member 8122 is located below the fixing member 8124.
In this embodiment, referring to fig. 6, the second conveying device 40 includes a fifth driving member, a cam (not shown), and a conveying member 402, where the fifth driving member is configured to drive the cam to rotate, and further drive the conveying member 402 to move through a connecting rod, so as to drive the carrier 100 on the conveying member 402 to move to the pushing position 106. Specifically, a plurality of groups of spacing protrusions 404 are disposed on two sides of the conveying member 402, and the plurality of groups of spacing protrusions 404 are sequentially arranged at intervals. In this way, the carrier 100 may be positioned exactly between two adjacent sets of the positioning protrusions 404, ensuring that the carrier 100 is placed in order. In this embodiment, the fifth driving member is a motor.
In this embodiment, the second conveying device 40 further includes a first detector 406 corresponding to the pushing position 106, and when the first detector 406 detects that the carrier 100 is in the pushing position 106, the third conveying device 50 is started to push the carrier 100 onto the microscopy device 60.
In this embodiment, referring to fig. 7, the third conveying apparatus 50 includes a sixth driving member 502, a fourth conveying belt 504, a sliding block 506 and a pushing rod 508, where the sixth driving member 502, the sliding block 506 and the pushing rod 508 are all connected to the fourth conveying belt 504 and can be driven to move by the fourth conveying belt 504, and the sixth driving member 502 is used for pushing the sliding block 506 and the pushing rod 508 to move and rotate to drive the fourth conveying belt 504 to move, and is fixedly connected to the sliding block 506 and can move along with the sliding block 506, so as to push the carrier 100. When the pushing device works, the fourth conveying belt 504 drives the sixth driving piece 502 and the pushing rod 508 to move slowly, and after the fourth conveying belt 504 stops, the sixth driving piece 502 drives the pushing rod 508 to move quickly, so that the pushing at high speed and low speed is realized.
Specifically, the third conveying apparatus 50 further includes a mounting plate 510 and a guide rail 512 fixed to the mounting plate 510, and the sliding block 506 is slidably disposed on the guide rail 512, so as to be movable along the guide rail 512, so as to ensure the smoothness of the movement of the sliding block 506. Mounting plate 510 may be fixedly attached to base plate 10.
In this embodiment, referring to fig. 8 and 9 again, the microscopy platform 62 of the microscopy apparatus 60 includes a fixed plate 622, a sliding plate 624, a seventh driving member 625 for driving the sliding plate 624 to move along a first direction relative to the fixed plate 622, a moving plate 626, and an eighth driving member 627 for driving the moving plate 626 to move along a second direction relative to the sliding plate 624, and the microscopy position is disposed on the moving plate 626, so that the microscopy position can move along the first direction and the second direction. When the carrier 100 is located at the microscopic position, the sliding plate 624 and the moving plate 626 are driven to move along the first direction and the second direction, and the position of the lens 64 is adjusted to facilitate the lens 64 to capture images at a plurality of different positions, so that images of samples in a larger range are acquired for detection, and thus the captured images can relatively accurately drop to reflect the real situation of the samples, thereby improving the detection accuracy.
In this embodiment, the microscopy stage 62 further comprises a first connection plate 629 connecting the seventh driver 625 with the sliding plate 624 and a second connection plate 630 connecting the eighth driver 627 with the moving plate 626.
In this embodiment, referring to fig. 10 again, the microscopy stage 62 further includes a connecting plate 632 connected to the moving plate 626 and a first conveying plate 634 connected to the connecting plate 632, and the sliding guide groove 6342 is disposed on the first conveying plate 634. Also, a pressing sheet 636 is provided to the first conveying plate 634. Specifically, the sliding guide 6344 has two parallel ribs, and it is understood that the sliding guide 6344 may have other structures such as a bump.
In this embodiment, an inlet 6346 is provided at an end of the first conveying plate 634 near the third conveying device 50, where the inlet is trumpet-shaped, so that the carrier 100 can enter the inlet 6342 conveniently.
In this embodiment, the microscopy platform 62 further includes a first sensor 638 fixed to the fixed plate 622, a first sensor tab 639 fixed to the movable plate 626, a second sensor 640 fixed to the fixed plate 622, and a second sensor tab 642 fixed to the sliding plate 624, the first sensor 638 and the first sensor tab 639 being configured to sense whether the movable plate 626 moves to the original position in the second direction, and the second sensor 640 and the second sensor tab 642 being configured to sense whether the sliding plate 624 moves to the original position in the first direction. When one carrier 100 is detected and removed from the microscopy stage 62, the seventh and eighth driving units 625 and 627 are activated to drive the moving plate 626 and the sliding plate 624 to move, and the moving plate 626 and the sliding plate 624 are stopped when moved to the original position, the slide guide groove 6342 of the first conveying plate 634 is aligned with the third conveying device 50, and the third conveying device 50 is activated to push the carrier 100 of the pushing station 106 onto the first conveying plate 634. It will be appreciated that when it is desired to push the next carrier 100 to the microscopy position, the pusher 508 of the third conveying device 50 may be utilized to push the previous carrier 100 located in the microscopy position when the moving plate 626 and the sliding plate 624 are moved to the original position, and then the pusher 508 pushes the next carrier 100 to the microscopy position; it is also possible to push the next carrier 100 directly to the microscopy position while the next carrier 100 pushes the previous carrier 100 located in the microscopy position out during the movement, when the moving plate 626 and the sliding plate 624 are moved to the original position.
In this embodiment, the output position 108 is provided with a second conveying plate fixed to the substrate 10, and when the moving plate 626 and the sliding plate 624 move to the original positions, the second conveying plate is abutted with the first conveying plate 634.
Referring to fig. 1 again, in the present embodiment, the sample detection system further includes a waste device 90, the waste device 90 is disposed on one side of the microscopy stage 62, and the waste device 90 and the third conveying device 50 are respectively disposed on two sides of the microscopy stage 62. Specifically, the inspected carrier 100 located on the microscopy stage 62 is pushed to the waste device 90 by the third conveyor 50.
The technical features of the above-described embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above-described embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The above examples illustrate only a few embodiments of the invention, which are described in detail and are not to be construed as limiting the scope of the invention. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the invention, which are all within the scope of the invention. Accordingly, the scope of protection of the present invention is to be determined by the appended claims.
Claims (12)
1. The sample detection system is characterized by comprising a third conveying device, a microscopic examination device and a waste device, wherein the microscopic examination device comprises a microscopic examination platform and a lens, the microscopic examination platform comprises a first conveying plate, and a microscopic examination position is arranged on the first conveying plate; the waste device and the third conveying device are respectively positioned at two sides of the microscopic examination platform, and the third conveying device is used for conveying the carrier to the microscopic examination position and pushing the carrier away from the microscopic examination position; the microscopic examination position can move in a first direction and a second direction so as to adjust the position of the microscopic examination position relative to the lens, the lens is used for drawing a carrier on the microscopic examination position, and the detected carrier on the microscopic examination platform is pushed to the waste device through the third conveying device;
the first conveying plate is provided with a guide chute, the microscopic examination position is arranged on the guide chute, a pressing sheet for pressing the carrier positioned at the microscopic examination position is arranged at the position, corresponding to the microscopic examination position, of the first conveying plate, the pressing sheet is fixed outside the guide chute and partially stretches into the guide chute, and a gap is reserved between the part, stretching into the guide chute, of the pressing sheet and the bottom of the guide chute;
the guide chute is provided with an inlet at one end close to the third conveying device, the inlet is horn-shaped, the guide chute is provided with an outlet at one end far away from the third conveying device, the bottom wall of the guide chute is provided with a guide slide protrusion, and the guide slide protrusion is two mutually parallel raised strips arranged along the width direction of the guide chute and extends to the outlet along the inlet.
2. The sample detection system of claim 1, wherein the third transport device comprises a fourth conveyor belt, a sixth drive member, a slider, and a pusher, the sixth drive member, the slider, and the pusher each being coupled to and movable by the fourth conveyor belt, the sixth drive member being configured to urge the slider and the pusher to move.
3. The sample detection system of claim 1, wherein the microscopy stage comprises a stationary plate, a sliding plate, a seventh drive to drive the sliding plate to move relative to the stationary plate in a first direction, a moving plate, and an eighth drive to drive the moving plate to move relative to the sliding plate in a second direction, the microscopy station being disposed on the moving plate; the microscopic examination platform further comprises a connecting sheet connected with the moving plate and a first conveying plate connected with the connecting sheet, the guide chute is arranged on the first conveying plate, and the pressing sheet is arranged on the first conveying plate.
4. The sample detection system of claim 3, wherein the microscopy platform further comprises a first sensor fixed relative to the stationary plate, a first sensor fixed relative to the movable plate, a second sensor fixed relative to the stationary plate, and a second sensor fixed to the sliding plate, the first sensor and the first sensor being configured to sense whether the movable plate is moved to an original position in a second direction, and the second sensor being configured to sense whether the sliding plate is moved to an original position in the first direction.
5. The sample detection system of claim 1, further comprising a carrier storage device, a first conveying device and a second conveying device, wherein the first conveying device is used for conveying the carrier in the carrier storage device to a sample adding position for sample adding, and the second conveying device is used for conveying the carrier after sample adding to a pushing position; the third conveying device is used for conveying the carrier from the pushing position to the microscopic examination position through the output position.
6. The sample detection system according to claim 5, wherein the first transporting device comprises a second driving member, a moving block and a weight, wherein the moving block is connected to the second driving member, and the weight is connected to the moving block; the heavy hammer can rotate to a first position and a second position, when the heavy hammer is in the first position, the heavy hammer is in a natural state, a part of the heavy hammer is positioned on a moving path of a carrier, and when the heavy hammer is in the second position, the heavy hammer is separated from the moving path of the carrier;
the weight is arranged on one end of the rotating shaft of the weight, and the weight is arranged on the other end of the rotating shaft of the weight.
7. The sample testing system of claim 5, wherein said second transport means comprises a fifth drive member and a transport member, said fifth drive member for driving movement of said transport member and thereby movement of a carrier on said transport member.
8. The sample detection system according to claim 7, wherein the second conveying device further comprises a plurality of sets of limiting protrusions arranged on two sides of the conveying member, the plurality of sets of limiting protrusions are sequentially arranged at intervals, and the carrier is located between two adjacent sets of limiting protrusions.
9. The sample testing system of claim 5, further comprising a loading device, wherein said loading device comprises a third driving member, a loading needle and a limiting mechanism disposed corresponding to said loading position, said third driving member rotationally drives said loading needle to move up and down to load a sample onto a carrier positioned at said loading position, said limiting mechanism comprises an elastic member for elastically pressing said carrier along a loading direction of said loading needle to limit movement of said carrier along said loading direction of said loading needle.
10. The sample detection system of claim 9, wherein the elastic member comprises a mounting portion fixedly connected to the substrate and a contact portion connected to the mounting portion, the mounting portion being fixed relative to the sample application site, the contact portion being configured to elastically press against the carrier.
11. The sample detection system of claim 10, wherein the contact portion comprises a first section and a second section, the first section is connected to one side of the mounting portion, the second section is connected to one end of the first section, the second section is inclined at an angle relative to the first section, and the second section is pressed against the carrier.
12. The sample testing system of claim 10, wherein said spacing mechanism further comprises a securing member fixedly attached to the base plate and secured relative to said sample application site, said resilient member being fixedly attached to said securing member by said mounting portion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202011216057.7A CN112326660B (en) | 2016-08-29 | 2016-08-29 | Sample detection system |
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| CN202011216057.7A CN112326660B (en) | 2016-08-29 | 2016-08-29 | Sample detection system |
| CN201610750374.4A CN107782726B (en) | 2016-08-29 | 2016-08-29 | Sample detection system and sample detection method |
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| CN201610750374.4A Division CN107782726B (en) | 2016-08-29 | 2016-08-29 | Sample detection system and sample detection method |
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| CN202010268438.3A Pending CN111413337A (en) | 2016-08-29 | 2016-08-29 | Microscopic examination platform and microscopic examination device comprising same |
| CN202010268674.5A Pending CN111413338A (en) | 2016-08-29 | 2016-08-29 | Sample detection system |
| CN201610750374.4A Active CN107782726B (en) | 2016-08-29 | 2016-08-29 | Sample detection system and sample detection method |
| CN202011215206.8A Active CN112326659B (en) | 2016-08-29 | 2016-08-29 | Sample detection system |
| CN202010269200.2A Active CN111413340B (en) | 2016-08-29 | 2016-08-29 | Sample adding device and sample detection system |
| CN202010268848.8A Active CN111413339B (en) | 2016-08-29 | 2016-08-29 | Microscopic examination device |
| CN202011216057.7A Active CN112326660B (en) | 2016-08-29 | 2016-08-29 | Sample detection system |
| CN202010282823.3A Pending CN111413341A (en) | 2016-08-29 | 2016-08-29 | Sample detection system |
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| CN202010268438.3A Pending CN111413337A (en) | 2016-08-29 | 2016-08-29 | Microscopic examination platform and microscopic examination device comprising same |
| CN202010268674.5A Pending CN111413338A (en) | 2016-08-29 | 2016-08-29 | Sample detection system |
| CN201610750374.4A Active CN107782726B (en) | 2016-08-29 | 2016-08-29 | Sample detection system and sample detection method |
| CN202011215206.8A Active CN112326659B (en) | 2016-08-29 | 2016-08-29 | Sample detection system |
| CN202010269200.2A Active CN111413340B (en) | 2016-08-29 | 2016-08-29 | Sample adding device and sample detection system |
| CN202010268848.8A Active CN111413339B (en) | 2016-08-29 | 2016-08-29 | Microscopic examination device |
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Also Published As
| Publication number | Publication date |
|---|---|
| CN111413340B (en) | 2024-05-28 |
| CN111413337A (en) | 2020-07-14 |
| CN111413338A (en) | 2020-07-14 |
| CN107782726A (en) | 2018-03-09 |
| CN107782726B (en) | 2020-11-27 |
| CN111413339A (en) | 2020-07-14 |
| CN111413339B (en) | 2023-06-09 |
| CN111413341A (en) | 2020-07-14 |
| CN111413340A (en) | 2020-07-14 |
| CN112326659B (en) | 2024-04-26 |
| CN112326660A (en) | 2021-02-05 |
| CN112326659A (en) | 2021-02-05 |
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