CN111413339A

CN111413339A - Microscopic examination device

Info

Publication number: CN111413339A
Application number: CN202010268848.8A
Authority: CN
Inventors: 丁建文
Original assignee: AVE Science and Technology Co Ltd
Current assignee: AVE Science and Technology Co Ltd
Priority date: 2016-08-29
Filing date: 2016-08-29
Publication date: 2020-07-14
Anticipated expiration: 2036-08-29
Also published as: CN107782726A; CN112326659B; CN111413337A; CN111413340A; CN111413338A; CN111413339B; CN112326660A; CN112326660B; CN111413341A; CN112326659A; CN107782726B

Abstract

The invention discloses a microscopic examination device, which comprises a microscopic examination platform and a lens, wherein a microscopic examination position is arranged on the microscopic examination platform, and the lens is used for picking a picture of a carrier on the microscopic examination position; the microscopic examination platform comprises a fixed plate, a sliding plate, a seventh driving piece, a moving plate and an eighth driving piece, the microscopic examination position is arranged on the moving plate, the seventh driving piece is used for driving the sliding plate to move relative to the fixed plate along the first direction, and the eighth driving piece is used for driving the moving plate to move relative to the sliding plate along the second direction. The seventh driving piece is used for driving the sliding plate to move relative to the fixed plate along the first direction, the eighth driving piece is used for driving the moving plate to move relative to the sliding plate along the second direction, and the microscopic examination position arranged on the moving plate can move in the first direction and the second direction so as to adjust the position of the microscopic examination position relative to the lens, so that the lens can conveniently adopt images at a plurality of different positions, and images of samples in a large range can be obtained for detection.

Description

Microscopic examination device

The invention relates to a sample detection system and a sample detection method, which are applied by the applicant at 2016, 08 and 29, and the divisional application of the Chinese patent application with the application number of 201610750374.4

Technical Field

The invention relates to the technical field of medical instruments, in particular to a microscopic examination device.

Background

When a patient is detected, sometimes a sample to be detected (such as stool, urine, semen, leucorrhea and the like) of the patient needs to be detected, and when the sample is detected, the sample needs to be conveyed to a microscopic examination platform, and then a microscope is used for aligning the sample to be picked up, so that the sample is detected. Generally, the microscope can detect a small range of samples, and the small range of samples sometimes cannot completely represent the whole sample, so that the detection accuracy is low, and the accuracy of disease detection is affected.

Disclosure of Invention

Therefore, it is necessary to provide a microscopy device with a large sample detection range and high detection precision for the problem that the detection precision is affected due to the small sample detection range.

A microscopic examination device comprises a microscopic examination platform and a lens, wherein a microscopic examination position is arranged on the microscopic examination platform, and the lens is used for picking pictures of a carrier on the microscopic examination position;

the microscopic examination platform comprises a fixed plate, a sliding plate, a seventh driving piece, a moving plate and an eighth driving piece, the microscopic examination position is arranged on the moving plate, the seventh driving piece is used for driving the sliding plate to move relative to the fixed plate along a first direction, and the eighth driving piece is used for driving the moving plate to move relative to the sliding plate along a second direction.

According to the microscopic examination device, the seventh driving piece is used for driving the sliding plate to move relative to the fixed plate along the first direction, and the eighth driving piece is used for driving the moving plate to move relative to the sliding plate along the second direction, so that the microscopic examination position on the moving plate can move in the first direction and the second direction to adjust the position of the microscopic examination position relative to the lens, the lens can conveniently acquire images at a plurality of different positions, the image of a sample in a large range can be acquired for detection, the acquired image can accurately reflect the real condition of the sample relatively, and the detection precision is improved.

In one embodiment, the microscopic examination platform further comprises a connecting sheet connected with the moving plate and a first conveying sheet connected with the connecting sheet, and the microscopic examination position is arranged on the first conveying sheet.

In one embodiment, the connecting piece is an elastic sheet with elasticity.

In one embodiment, one end of the connecting piece is fixedly connected with the moving plate, and the first conveying plate is pressed between the other end of the connecting piece and the moving plate.

In one embodiment, the connecting piece comprises a third section and a fourth section which are connected with each other, the third section is fixedly connected with the moving plate, and the first conveying plate is pressed between the fourth section and the moving plate;

the third section inclines for a certain angle relative to the fourth section, and the inclination angle between the third section and the fourth section is an obtuse angle facing the moving plate.

In one embodiment, the connecting piece is point-connected to the first conveyor plate.

In one embodiment, the first conveying plate is provided with a guide chute, and the bottom of the guide chute is provided with a guide sliding bulge;

when the carrier is positioned at the microscopic examination position, the carrier is pressed on the guide sliding bulge.

In one embodiment, the guide chute is further provided with a light-transmitting area, and the microscopic examination position is arranged corresponding to the light-transmitting area;

the guide sliding protrusion is two convex strips which are parallel to each other, and the two convex strips are respectively positioned on two sides of the light transmission area.

In one embodiment, the surface of each convex strip comprises at least two planes arranged at intervals in the connecting line direction of the two convex strips.

In one embodiment, the microscopy platform further comprises a first sensor fixed relative to the fixed plate, a first sensing piece fixed to the moving plate, a second sensor fixed relative to the fixed plate, and a second sensing piece fixed to the sliding plate, wherein the first sensor and the first sensing piece are used for sensing whether the moving plate moves to an original position in the second direction, and the second sensor and the second sensing piece are used for sensing whether the sliding plate moves to the original position in the first direction.

Drawings

FIG. 1 is a schematic overall structure diagram of a preferred embodiment of a sample detection system according to the present invention;

FIG. 2 is a schematic view of a sample application device of the sample testing system shown in FIG. 1;

FIG. 3 is a schematic structural view of a limiting mechanism of the sample detection system shown in FIG. 1;

FIG. 4 is a schematic structural view of a limiting mechanism and a first conveying device of the sample detecting system shown in FIG. 1;

FIG. 5 is a schematic structural view of the elastic member of the spacing mechanism shown in FIG. 3;

FIG. 6 is a schematic diagram of a second transport device of the sample testing system of FIG. 1;

FIG. 7 is a schematic diagram of a third conveyor of the sample testing system of FIG. 1;

FIG. 8 is a schematic view of an angular configuration of the microscopy stage of the sample detection system shown in FIG. 1;

FIG. 9 is a schematic view of another angular configuration of the microscopy platform shown in FIG. 8; and

fig. 10 is a schematic view of a portion of the microscopy platform shown in fig. 8.

Detailed Description

To facilitate an understanding of the invention, the invention will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.

It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may be present.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.

Referring to fig. 1, a sample testing system in a preferred embodiment of the invention includes a substrate 10, a carrier storage device 20, a first conveying device 30, a second conveying device 40, a third conveying device 50, and a microscopic examination device 60, wherein the substrate 10 is provided with a sample loading position 102, a transfer position 104, a push position 106, and an output position 108. The microscopic examination device 60 comprises a microscopic examination platform 62 and a lens 64, wherein a microscopic examination position is arranged on the microscopic examination platform 62. The first transporting device 30 is used for transporting the carrier 100 in the carrier storage device 20 to the sample application position 102, and transporting the carrier to the transfer position 104 after sample application. The second transport device 40 is used to transport the carrier 100 from the transfer position 104 to the push position 106, and the third transport device 50 is used to transport the carrier 100 from the push position 106 to the microscopy position of the microscopy platform 62 of the microscopy device 60 via the output position 108 and to push the carrier away from the microscopy position. The microscopy site of the microscopy platform 62 is movable in the first direction and the second direction to adjust the position of the microscopy site relative to the lens 64 such that the lens 64 is aligned with the carrier 100 of the microscopy site and the lens 64 is used to pick up an image of the carrier 100 at the microscopy site. It is understood that the sample loading position 102, the transfer position 104, the pushing position 106 and the output position 108 may not be disposed on the substrate 10, as long as there is a position for accommodating the carrier 100.

The sample detection system sequentially conveys the carrier 100 from the carrier storage device 20 to the microscopic examination device 60 after sample adding through the three conveying devices, and realizes alignment of the lens 64 and the carrier 100 through movement of the microscopic examination platform 62, so that an operator does not need to operate a sample to be detected in the whole detection process, and the risk of pollution to the operator can be effectively reduced.

In this embodiment, a carrier storage device 20 may be disposed on the substrate 10, which is used for storing clean carriers (e.g., a counting plate).

In this embodiment, the carrier storage device 20 includes a translation plate disposed therein, a plurality of sets of carriers 100 can be disposed on the translation plate side by side, and the sample testing system further includes a carrier translation device 70, wherein the carrier translation device 70 is configured to drive the translation plate to translate relative to the substrate 10, so that different sets of carriers 100 can be respectively aligned with the first conveying device 30. Each of the plurality of sets of carriers 100 may house one or more carriers 100.

Specifically, the carrier translation device 70 may include a first driving member and a first conveying belt, the first conveying belt is connected to the translation plate, and the first driving member rotates to drive the first conveying belt to move, so as to drive the translation plate to move. It is understood that the carrier translation device 70 may also be a piston rod or a cylinder, etc. extending and retracting mechanism, where the cylinder is connected to the translation plate, and the cylinder extends and retracts to drive the translation plate to move.

Referring to fig. 2, 3 and 4, in the present embodiment, the first conveying device 30 includes a second driving member, a moving block 302 driven by the second driving member to move, and a weight 304 rotatably connected to the moving block 302, the weight 304 can rotate to a first position and a second position, when the weight 304 is at the first position, the weight 304 is in a natural state, and the weight 304 is partially located on the moving path of the carrier 100, and when the weight 304 is at the second position, the weight 304 is away from the moving path of the carrier 100. The mass of the rotating shaft of the weight 304 is greater at one end than at the other end, so that the resistance to rotation of the weight 304 in one direction is greater than the resistance to rotation in the opposite direction. In this embodiment, the second driving member is a motor. By arranging the weight 304, when the carriers 100 in the carrier storage device 20 need to be conveyed to the sample application position 102, the moving block 302 and the weight 304 are positioned at the leftmost end shown in fig. 4, the weight 304 contacts the carriers 100 as the second driving member drives the moving block 302 and the weight 304 to move rightwards, and the weight 304 cannot rotate due to the large driving force required by the rotation of the weight 304, so that the carriers 100 are pushed to move rightwards; when the carrier 100 reaches the predetermined position, the moving block 302 and the weight 304 move to the left, and the weight 304 is located at the right side of the carrier storage device 20, when the weight 304 contacts the right end of the carrier 100 in the carrier storage device 20, the driving force required for the weight 304 to rotate is smaller, and the weight 304 is pushed by the carrier 100 to rotate during the leftward movement to avoid the weight being located on the moving path of the carrier 100, so that the weight 304 returns to the left side of the carrier storage device 20 to prepare for pushing the next carrier 100 to the right.

Specifically, the first conveying device 30 further includes a second conveying belt 305 driven by a second driving member, and the moving block 302 is fixed to the second conveying belt 305.

Specifically, the first conveying device 30 may further include a guide 306, and the moving block 302 moves while pressing the guide 306. In this embodiment, the guide rail 306 may be disposed on the substrate 10.

In this embodiment, the sample testing system further includes a sample loading device 80, and the sample loading device 80 includes a sample loading needle 802 for loading the sample on the carrier 100 of the sample loading position 102.

In this embodiment, the sample adding device 100 further includes a third driving member 804, a transmission mechanism connected to the third driving member 804, and a fixing block 810 connected to the transmission mechanism, the sample adding needle 802 is fixedly connected to the fixing block 810, and the third driving member 804 rotates to drive the sample adding needle 802 to move up and down; the sample adding device 100 further includes a fourth driving member, and the fixing block 810 can be driven by the fourth driving member to move in a direction perpendicular to the up-down direction. Thus, the sample application needle 802 can move along two directions, so that sampling is realized, and the sample application needle moves to a position aligned with a sample application position after sampling to apply the sample. Specifically, the third driving member and the fourth driving member may be motors.

Specifically, the carrier 100 is provided with a sample addition hole 1002, and the sample addition needle 802 performs sample addition by aligning with the sample addition hole 1002 during sample addition.

In this embodiment, the sample adding device 80 further includes a limiting mechanism 812 corresponding to the sample adding position 102, the limiting mechanism 812 includes an elastic member 8122, and the elastic member 8122 is used for elastically pressing the carrier 100 to limit the movement of the carrier 100 in the up-and-down direction. When the carrier 100 is located at the sample adding position 102, the elastic part 8122 of the limiting mechanism 812 elastically presses against the carrier 100, and in the process of upward returning after the sample adding needle 802 finishes sample adding, the carrier 100 is pressed by the elastic part 8122 and cannot be taken up, and the carrier 100 can normally enter the subsequent process; meanwhile, in the process that the carrier 100 moves towards the sample adding position 102, after contacting the elastic element 8122, the carrier gradually receives the resistance of the elastic element 8122 and gradually decelerates until the carrier stops, so that the carrier 100 is prevented from deviating from the sample adding position 102 due to the movement inertia, the precise positioning of the carrier 100 is realized, and the sample adding needle 802 is ensured to be aligned to the sample adding hole 1002 of the carrier 100.

In this embodiment, referring to fig. 5, the elastic element 8122 includes an installation portion 81222 fixedly connected to the substrate 10 and a contact portion 81224 elastically pressing against the carrier 100, the contact portion 81224 is connected to the installation portion 81222, and the contact portion 81224 is an elastic sheet having elasticity.

In this embodiment, the contact portion 81224 includes a first section connected to one side of the mounting portion 81222 and a second section connected to one end of the first section, and the second section is inclined at a certain angle with respect to the first section. Specifically, the inclination angle may be an obtuse angle. When the carrier 100 is located at the sample loading position 102, the contact part 81224 is lifted by the carrier 100 to deform, and the second section of the elastic element 8122 presses against the carrier 100.

In this embodiment, the moving direction of the carrier 100 is a direction along the connection between the second section and the first section of the elastic member 8122 and pointing to the end of the second section far away from the first section. Thus, the carrier 100 can smoothly enter the lower surface of the second section under the guidance of the second section in the process of entering the sample adding position 102, and cannot be abutted by the end of the second section far away from the first section, and meanwhile, the carrier 100 can also smoothly move out from the lower surface of the second section after sample adding without any interference.

In this embodiment, the limiting mechanism 812 further includes a fixing element 8124, the fixing element 8124 is fixedly connected to the substrate 10, and the elastic element 8122 is fixedly connected to the fixing element 8124 through the mounting portion 81222. Specifically, the contact portion 81224 of the elastic member 8122 is located below the fixing member 8124.

In this embodiment, referring to fig. 6, the second conveying device 40 includes a fifth driving member, a cam (not shown), and a conveying member 402, wherein the fifth driving member is used for driving the cam to rotate, so as to drive the conveying member 402 to move through the connecting rod, thereby driving the carrier 100 on the conveying member 402 to move to the pushing position 106. Specifically, two sides of the conveying member 402 are provided with a plurality of sets of limiting protrusions 404, and the plurality of sets of limiting protrusions 404 are sequentially arranged at intervals. In this way, the carrier 100 can be located right between two adjacent sets of limiting protrusions 404, and the carrier 100 can be placed neatly. In this embodiment, the fifth driving member is a motor.

In this embodiment, the second conveying device 40 further includes a first detector 406 corresponding to the pushing position 106, and when the first detector 406 detects that the carrier 100 is at the pushing position 106, the third conveying device 50 is activated to push the carrier 100 to the microscopy device 60.

In this embodiment, referring to fig. 7, the third conveying device 50 includes a sixth driving element 502, a fourth conveying belt 504, a sliding block 506 and a push rod 508, the sixth driving element 502, the sliding block 506 and the push rod 508 are all connected to the fourth conveying belt 504 and can be driven by the fourth conveying belt 504 to move, the sixth driving element 502 is used for pushing the sliding block 506 and the push rod 508 to move and rotate for driving the fourth conveying belt 504 to move, and is fixedly connected to the sliding block 506 and can move along with the sliding block 506, so as to push the carrier 100. During operation, the fourth conveying belt 504 drives the sixth driving member 502 and the push rod 508 to move together at a slow speed, and after the fourth conveying belt 504 stops, the sixth driving member 502 drives the push rod 508 to move fast, so that fast and slow two-stage pushing is realized.

Specifically, the third conveying device 50 further includes a mounting plate 510 and a guide rail 512 fixed to the mounting plate 510, and the sliding block 506 is slidably disposed on the guide rail 512, so as to be movable along the guide rail 512, so as to ensure the smoothness of movement of the sliding block 506. Mounting plate 510 may be fixedly attached to base plate 10.

In this embodiment, referring to fig. 8 and 9, the microscopy platform 62 of the microscopy device 60 includes a fixed plate 622, a sliding plate 624, a seventh driving element 625 for driving the sliding plate 624 to move relative to the fixed plate 622 along a first direction, a moving plate 626 and an eighth driving element 627 for driving the moving plate 626 to move relative to the sliding plate 624 along a second direction, and the microscopy site is disposed on the moving plate 626, so that the microscopy site can move along the first direction and the second direction. When the carrier 100 is located at the microscopy position, the sliding plate 624 and the moving plate 626 are driven to move along the first direction and the second direction, and the position of the microscopy position relative to the lens 64 is adjusted, so that the lens 64 can conveniently capture images at a plurality of different positions, images of samples in a large range can be obtained for detection, and therefore the captured images can accurately reflect the real situation of the samples relatively, and the detection precision is improved.

In this embodiment, the microscopy platform 62 further comprises a first connecting plate 629 connecting the seventh driving element 625 and the sliding plate 624 and a second connecting plate 630 connecting the eighth driving element 627 and the moving plate 626.

In this embodiment, referring to fig. 10, the microscopy platform 62 further includes a connecting sheet 632 connected to the moving plate 626 and a first transport plate 634 connected to the connecting sheet 632, and the microscopy site is disposed on the first transport plate 634.

In this embodiment, the first conveying plate 634 is provided with a sliding guide slot 6342, the bottom of the sliding guide slot 6342 is provided with a sliding guide protrusion 6344, and the microscopic examination position is provided on the sliding guide slot 6342. The arrangement of the sliding guide protrusion 6344 can reduce the contact area between the bottom of the sliding guide groove 6342 and the carrier 100, reduce friction, reduce the probability of dust accumulation at the top end of the sliding guide protrusion 6344, improve the levelness of the object carrying device, reduce the levelness reduction of the microscopic examination platform 62 caused by dust accumulation, cause the carrier 100 not to be in the same focal length, greatly reduce the tedious operation of repeated focusing, and improve the convenience of use of the microscopic examination device 60. In this embodiment, the sliding guide protrusion 6344 is two parallel protruding strips, and it can be understood that the sliding guide protrusion 6344 may also have other structures such as protruding points.

In this embodiment, an inlet 6346 is provided at one end of the first conveying plate 634 close to the third conveying device 50, and the inlet is formed in a trumpet shape, so that the carrier 100 can enter the guide 6342 conveniently.

In this embodiment, the microscopy platform 62 further includes a pressing piece 636 disposed on the first transport plate 634, the pressing piece 636 is fixed outside the guide slot 6342 of the first transport plate 634, and partially extends into the guide slot 6342, and a gap is left between the portion extending into the guide slot 6342 and the bottom of the guide slot 6342. When the carrier 100 is located in the guide groove 6342, the pressing piece 636 presses the carrier 100 to restrict the up-and-down movement of the carrier. Specifically, the guide groove 6342 is provided at both sides thereof with pressing tabs 636, respectively, to press both sides of the carrier 100. The position of the pad 636 corresponds to the microscopic position. By arranging the pressing sheet 636, the carrier 100 can be pressed during drawing, so that the phenomenon that images are not focused on the same layer during drawing due to uneven placement of the carrier 100 caused by moving inertia or dust on a rail is prevented.

In this embodiment, the microscopy platform 62 further includes a first sensor 638 fixed to the fixed plate 622, a first sensing piece 639 fixed to the moving plate 626, a second sensor 640 fixed to the fixed plate 622, and a second sensing piece 642 fixed to the sliding plate 624, wherein the first sensor 638 and the first sensing piece 639 are used for sensing whether the moving plate 626 moves to the home position in the second direction, and the second sensor 640 and the second sensing piece 642 are used for sensing whether the sliding plate 624 moves to the home position in the first direction. When a carrier 100 is detected and removed from the microscopy platform 62, the seventh driving element 625 and the eighth driving element 627 start to drive the moving plate 626 and the sliding plate 624 to move, and when the moving plate 626 and the sliding plate 624 stop moving when moving to the original position, the slide guide slot 6342 of the first conveying plate 634 is aligned with the third conveying device 50, and the third conveying device 50 starts to push the carrier 100 in the push position 106 onto the first conveying plate 634. It can be understood that when it is required to push the next carrier 100 to the microscopy position, when the moving plate 626 and the sliding plate 624 move to the original position, the push rod 508 of the third conveying device 50 is used to push away the previous carrier 100 located at the microscopy position, and then the push rod 508 pushes the next carrier 100 to the microscopy position; it is also possible to push the next carrier 100 directly to the microscopy site when the moving plate 626 and the sliding plate 624 are moved to the home position, while the next carrier 100 pushes away the previous carrier 100 located at the microscopy site during the movement.

In this embodiment, the output station 108 is provided with a second transfer plate fixed to the base plate 10, and the second transfer plate is butted against the first transfer plate 634 when the moving plate 626 and the sliding plate 624 are moved to the home position.

Referring to fig. 1 again, in the present embodiment, the sample testing system further includes a waste device 90, the waste device 90 is disposed on one side of the microscopy platform 62, and the waste device 90 and the third conveyor 50 are respectively disposed on two sides of the microscopy platform 62. Specifically, the inspected carrier 100 on the microscopy platform 62 is pushed to the waste device 90 by the third conveyor 50.

The sample detection method of an embodiment of the present invention can utilize the sample detection system to perform sample detection, and includes the following steps:

s20: the third conveying device 50 conveys the carrier 100 to the microscopy position of the microscopy platform 62 of the microscopy device 60;

s22: moving the microscopy position in a first direction and a second direction perpendicular to each other to adjust the relative position of the microscopy position and the lens 64;

s24: moving the microscopy position in a first direction and a second direction perpendicular to each other to adjust the microscopy position to the original position, so that the third conveying device 50 is aligned with the microscopy position; (ii) a And

s28: the third conveying device 50 pushes the carrier 100 away from the microscopy position, so that the third conveying device 50 can conveniently push the next carrier 100 to the microscopy position; or the third conveying device 50 pushes the next carrier 100 to the microscopy position, and simultaneously pushes the carrier which is positioned at the microscopy position before away from the microscopy position through the next carrier.

According to the sample detection method, the position of the microscopic examination position relative to the lens 64 is adjusted during image collection, so that the lens 64 can collect images at a plurality of different positions conveniently, images of samples in a large range can be obtained for detection, the collected images can reflect the real conditions of the samples relatively accurately, and the detection precision is improved.

In this embodiment, the sample detection method further includes, before step S20:

s12: the first transporting device 30 transports the carrier 100 in the carrier storing device 20 to the sample application site 102;

s14: loading the carrier 100 at the loading position 102;

s16: the first conveying device 30 conveys the loaded carrier 100 to the transfer position 104;

s18: the second transport device 40 transports the carrier 100 from the transfer station 104 to the push station 106.

In this embodiment, step S14 specifically includes loading the sample by the sample loading device 80, and before loading the sample, the carrier 100 is pressed by the limiting mechanism 812 and limited at the sample loading position, so as to prevent the carrier 100 from being carried in the process of returning upwards after loading the sample, and ensure that the sample loading device 80 is aligned with the carrier 100, thereby achieving the precise positioning of the carrier 100.

In this embodiment, the sample detection method further includes a step S26 before the step S12: the carrier translation device 70 translates the carriers 100 within the carrier storage device 20 into alignment with the first conveyor 30.

The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims

1. A microscopic examination device is characterized by comprising a microscopic examination platform and a lens, wherein a microscopic examination position is arranged on the microscopic examination platform, and the lens is used for picking pictures of a carrier on the microscopic examination position;

2. The microscopy device of claim 1, wherein the microscopy platform further comprises a connecting sheet connected to the moving plate and a first transport plate connected to the connecting sheet, the microscopy site being located on the first transport plate.

3. The microscopy device of claim 2, wherein the connecting piece is a resilient spring.

4. The microscopy device according to claim 2, wherein one end of the connecting sheet is fixedly connected with the moving plate, and the first transport plate is pressed between the other end of the connecting sheet and the moving plate.

5. The microscopic examination device according to claim 4, wherein the connecting sheet comprises a third section and a fourth section which are connected with each other, the third section is fixedly connected with the moving plate, and the first conveying plate is pressed between the fourth section and the moving plate;

6. An microscopy device according to claim 4, wherein the connection pad is point connected to the first transport plate.

7. The microscopic examination device according to claim 2, wherein the first conveying plate is provided with a guide chute, and a guide chute protrusion is arranged at the bottom of the guide chute;

8. The microscopy device according to claim 7, wherein the guide chute is further provided with a light-transmitting area, and the microscopy site is arranged corresponding to the light-transmitting area;

9. The microscopy device according to claim 8, wherein the surface of the rib comprises at least two planes spaced apart from each other in a direction of a line connecting the two ribs.

10. The microscopy apparatus according to claim 1, wherein the microscopy platform further comprises a first sensor fixed to the fixed plate, a first sensing piece fixed to the moving plate, a second sensor fixed to the fixed plate, and a second sensing piece fixed to the sliding plate, wherein the first sensor and the first sensing piece are used for sensing whether the moving plate moves to an original position in the second direction, and the second sensor and the second sensing piece are used for sensing whether the sliding plate moves to an original position in the first direction.