CN112285036A - Frequency-reducing synchronous ultrafast transient absorption test system - Google Patents
Frequency-reducing synchronous ultrafast transient absorption test system Download PDFInfo
- Publication number
- CN112285036A CN112285036A CN201910663549.1A CN201910663549A CN112285036A CN 112285036 A CN112285036 A CN 112285036A CN 201910663549 A CN201910663549 A CN 201910663549A CN 112285036 A CN112285036 A CN 112285036A
- Authority
- CN
- China
- Prior art keywords
- light beam
- chopper
- sample
- tested
- focused
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 20
- 238000010521 absorption reaction Methods 0.000 title claims abstract description 17
- 230000001052 transient effect Effects 0.000 title claims abstract description 16
- 230000001360 synchronised effect Effects 0.000 title claims abstract description 7
- 238000001514 detection method Methods 0.000 claims abstract description 37
- 238000006243 chemical reaction Methods 0.000 claims abstract description 24
- 238000005086 pumping Methods 0.000 claims abstract description 7
- 239000000523 sample Substances 0.000 claims description 68
- 238000013519 translation Methods 0.000 claims description 21
- 239000013078 crystal Substances 0.000 claims description 12
- 229910052594 sapphire Inorganic materials 0.000 claims description 7
- 239000010980 sapphire Substances 0.000 claims description 7
- 230000002441 reversible effect Effects 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 abstract description 5
- 238000010586 diagram Methods 0.000 description 10
- 230000005540 biological transmission Effects 0.000 description 7
- 238000000034 method Methods 0.000 description 7
- 230000005284 excitation Effects 0.000 description 5
- 238000005259 measurement Methods 0.000 description 4
- 238000002834 transmittance Methods 0.000 description 4
- 238000002474 experimental method Methods 0.000 description 3
- 230000000630 rising effect Effects 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 230000009022 nonlinear effect Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000008092 positive effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0106—General arrangement of respective parts
- G01N2021/0112—Apparatus in one mechanical, optical or electronic block
Abstract
The invention relates to the field of optical detection of samples, in particular to a frequency-reduction synchronous ultrafast transient absorption test system, wherein a light beam emitted by a pulse laser source is divided into a detection light beam and a pumping light beam by a beam splitter, the detection light beam is focused on a sample to be tested after passing through a white light generating device, the detection light beam transmitted by the sample to be tested is focused and then enters a spectrometer, the spectrometer, the signal acquisition card and the control system are connected in series in sequence, the pump light beam is transmitted into the laser wavelength conversion device after passing through the chopper and the retroreflector, the laser wavelength conversion device is used for emitting a laser beam, the laser beam is focused on a position, which is overlapped with the detection beam, of a tested sample, the pulse laser source and the chopper are respectively connected with the chopper controller, the digital delay pulse generator and the signal acquisition card are sequentially connected in series, and the frequency of an output signal of the digital delay pulse generator is 2 times of that of the output beam of the chopper. The invention can realize down-conversion synchronization to obtain the ultrafast transient absorption test result with high signal-to-noise ratio.
Description
Technical Field
The invention relates to the field of optical detection of samples, in particular to a frequency-reduction synchronous ultrafast transient absorption testing system.
Background
In a general ultrafast transient absorption test system, a pulse laser generates pulse laser with a spectrum center of 800nm and a repetition frequency of 1kHz, and the pulse laser is divided into 2 beams by a beam splitting system, namely a pump beam and a probe beam, wherein the probe beam is expanded to a required detection wavelength by a nonlinear system, and the pump beam changes the wavelength to a characteristic absorption peak of a sample by utilizing a nonlinear effect. In the test process, the pump beam is subjected to frequency reduction to 500Hz after passing through a chopper, the pump beam passes through a linear translation stage in the transmission process, the linear translation stage can change the optical path of the pump beam reaching a tested sample, a detection beam and the pump beam are superposed on the tested sample, a spectrometer receives the detection beam penetrating through the tested sample, and the test result of the ultrafast transient absorption can be expressed as follows:
ΔA(λ)＝-log(I(λ)pumped/I(λ)unpumped)
wherein I (lambda)pumpedThe intensity of the probe beam transmitted through the sample under test when excited by the pump beam pulse, I (lambda)unpumpedThe intensity of the probe beam transmitted through the sample to be tested without the excitation of the pump beam pulse is used as the light intensity of the probe beam transmitted through the sample to be tested. In the test process, the synchronization module acquires the phase information of the chopper and combines the phase information of the detection beam, so that the data acquisition and processing module acquires the condition that the pump beam excites the tested sample, and the excitation condition of the excitation beam borne by the sample when each transmission detection beam pulse collected by the spectrometer transmits through the tested sample is accurately acquired.
However, under some measurement conditions, the transmittance of a sample to be tested to a detection beam is extremely low, a general ultrafast transient absorption test method is adopted, the spectrometer can only collect the light intensity information of one pulse of a transmission detection beam at each measurement stage, so that the light intensity of the transmission detection beam received by the spectrometer is extremely low, the ultrafast transient absorption signal intensity obtained by the ultrafast transient absorption signal intensity calculation formula is extremely low, the signal to noise ratio is poor, the experiment precision and the experiment accuracy are seriously influenced, and meanwhile, because the signal quantity is excessively low, the noise influence is eliminated by adopting a method of measuring for multiple times and averaging, so that the test period is greatly prolonged.
Disclosure of Invention
The invention aims to provide a frequency reduction synchronization ultrafast transient absorption test system, which can realize frequency reduction synchronization when the transmittance of a tested sample to a detection beam is extremely low, integrates the detection beam in time, obtains an ultrafast transient absorption test result with high signal-to-noise ratio on the premise of not changing an original laser system, and has high measurement precision and short test period.
The purpose of the invention is realized by the following technical scheme:
a frequency-reduction synchronous ultrafast transient absorption test system comprises a pulse laser source, a beam splitting sheet, a white light generating device, a spectrometer, a chopper controller, a linear translation table, a retroreflector, a laser wavelength conversion device, a digital delay pulse generator, a signal acquisition card and a control system, wherein a light beam emitted by the pulse laser source is split into a detection light beam and a pumping light beam after passing through the beam splitting sheet, the detection light beam is focused on a tested sample after passing through the white light generating device and then enters the spectrometer, the signal acquisition card and the control system are sequentially connected in series through a circuit, the pumping light beam enters the laser wavelength conversion device after passing through the chopper and the retroreflector arranged on the linear translation table, and the light beam emitted by the laser wavelength conversion device is focused on the tested sample and is superposed with the detection light beam, the pulse laser light source and the chopper are respectively connected with a chopper controller through lines, the chopper controller, the digital delay pulse generator and the signal acquisition card are sequentially connected in series through the lines, and the frequency of an output signal of the digital delay pulse generator is 2 times of the frequency of an output light beam of the chopper.
The detection light beam is reflected by the first reflecting mirror and then enters the white light generating device, and the light beam emitted by the white light generating device is reflected by the first concave mirror, the second reflecting mirror and the second concave mirror in sequence and then focused on the tested sample.
The detection beam transmitted through the tested sample is incident into the spectrometer after being reflected by the third concave mirror and focused by the first focusing mirror in sequence.
The pump light beam is emitted into the chopper, the light beam output by the chopper is reflected by a third reflector and is emitted into a retroreflector arranged on the linear translation stage, and the light beam emitted in parallel and in reverse direction by the retroreflector is reflected by a fourth reflector and is emitted into the laser wavelength conversion device.
And the light beam emitted by the laser wavelength conversion device sequentially passes through a fifth reflector and a second focusing mirror and then is focused on the position, which is superposed with the detection light beam, on the tested sample.
The white light generating device comprises linear filters, an aperture diaphragm, a focusing mirror and a sapphire crystal which are linearly arranged along the propagation direction of light beams.
The laser wavelength conversion device comprises a half-wave plate, a frequency doubling crystal, a Glan prism and a high-reflection mirror which are linearly arranged along the propagation direction of the light beam.
The focus of the probe beam falls on the tested sample, and the focus of the pump beam is positioned behind the tested sample.
The pump beam transmitted through the tested sample is blocked and intercepted by a light shielding plate.
The invention has the advantages and positive effects that:
1. when the transmittance of a tested sample to a detection beam is extremely low, the method can realize down-conversion synchronization, so that a spectrometer can completely acquire a time integral signal of the detection beam transmitted through the tested sample under the excitation of a pump beam output by a chopper, and an ultrafast transient absorption test result with high signal-to-noise ratio is obtained on the premise of not changing an original laser system, and the method has high measurement precision and short test period.
2. The invention can utilize the linear translation stage to drive the retroreflector to move linearly according to requirements, thereby changing the optical path of the pumping light beam.
Drawings
Figure 1 is a schematic structural view of the present invention,
FIG. 2 is a schematic view of the white light generating device of FIG. 1,
figure 3 is a schematic diagram of the laser wavelength conversion device of figure 1,
FIG. 4 is a schematic diagram of a probe beam spectrally broadened by a white light generating device,
FIG. 5 is a schematic diagram of the frequency of the pump beam when it is down-converted by a factor of 4 by the chopper,
FIG. 6 is a schematic diagram of the frequency of the pump beam when it is down-converted by a chopper by a factor of 8,
FIG. 7 is a schematic diagram of the acquisition frequency of the signal acquisition card when the pump beam is down-converted by 4 times,
FIG. 8 is a schematic diagram of the acquisition frequency of the signal acquisition card when the pump beam is down-converted by 8 times,
FIG. 9 is a schematic diagram showing the complete comparison between the acquisition frequency of the signal acquisition card and the original laser frequency during the 4-time down conversion and the 8-time down conversion according to the present invention.
The device comprises a pulse laser light source 1, a beam splitting plate 2, a first reflecting mirror 3, a second reflecting mirror 4, a third reflecting mirror 5, a fourth reflecting mirror 6, a fifth reflecting mirror 7, a first concave mirror 8, a second concave mirror 9, a third concave mirror 10, a white light generator 11, a linear filter 111, an aperture diaphragm 112, a focusing mirror 113, a sapphire crystal 114, a sample 12, a first focusing mirror 13, a second focusing mirror 14, a spectrometer 15, a chopper 16, a chopper controller 17, a linear translation stage 18, a linear translation stage controller 19, a retroreflector 20, a laser wavelength conversion device 21, a half-wave plate 211, a frequency doubling crystal 212, a glan prism 213, a high-reflection mirror 214, a digital delay pulse generator 22, a signal acquisition card 23, a light shielding plate 24 and a control system 25.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings.
As shown in fig. 1 to 3, the present invention includes a pulse laser source 1, a beam splitter 2, a white light generator 11, a spectrometer 15, a chopper 16, a chopper controller 17, a linear translation stage 18, a retroreflector 20, a laser wavelength conversion device 21, a digital delay pulse generator 22, a signal acquisition card 23, a light shielding plate 24, a control system 25, a plurality of mirrors, a plurality of concave mirrors and a plurality of focusing mirrors, wherein a light beam emitted from the pulse laser source 1 is split into a probe beam and a pump beam by the beam splitter 2, as shown in fig. 1, the probe beam is reflected by a first mirror 3 and then enters the white light generator 11, and a light beam emitted from the white light generator 11 is reflected by a first concave mirror 8, a second mirror 4 and a second concave mirror 9 and then focuses on a sample 12 to be tested, wherein the probe beam is reflected by the first concave mirror 8 and collimated into a parallel light beam, the light beam is reflected and focused to the tested sample 12 through the third concave mirror 9, the focus of the focused light beam just falls on the tested sample 12, the detection light beam transmitted through the tested sample 12 is reflected and collimated into a parallel light beam through the third concave mirror 10, and then the parallel light beam is focused through the first focusing mirror 13 and then enters the spectrometer 15, and the spectrometer 15, the signal acquisition card 23 and the control system 25 are sequentially connected in series through a circuit.
As shown in fig. 1, the pump beam enters the chopper 16, the beam output from the chopper 16 is reflected by the third reflector 5 and enters the retroreflector 20 disposed on the linear translation stage 18, the beam emitted in parallel and in reverse direction by the retroreflector 20 is reflected by the fourth reflector 6 and enters the laser wavelength conversion device 21, the beam emitted from the laser wavelength conversion device 21 passes through the fifth reflector 7 and the second focusing mirror 14 in sequence and is focused on the position of the sample 12 to be tested, which is overlapped with the probe beam, and the focal point of the beam is 3cm behind the sample 12 to be tested, the spot size of the pump beam on the sample 12 to be tested is 2 times to 2.5 times of the spot size of the probe beam, and the pump beam transmitted through the sample 12 to be tested is blocked and intercepted by the light blocking plate 24.
As shown in FIG. 1, the pulse laser light source 1 and the chopper 16 are respectively connected with a chopper controller 17 through a line, and the chopper controller 17, the digital delay pulse generator 22 and the signal acquisition card 23 are sequentially connected in series through a line. As shown in fig. 1, the linear translation stage 18 is controlled by a mating linear translation stage controller 19.
As shown in fig. 2, the white light generating device 11 includes a linear filter 111, an aperture stop 112, a focusing mirror 113 and a sapphire crystal 114, which are arranged in a straight line along the propagation direction of the light beam, wherein the linear filter 111 is used for attenuating the laser energy, the aperture stop 112 is used for adjusting the cross-sectional size of the light beam, the focusing mirror 113 focuses the incident parallel detection light beam, the focal point is just on the sapphire crystal 114, and the sapphire crystal 114 widens the light beam with the central wavelength of 800nm into a broad-spectrum laser light beam with the wavelength range of 430nm to 1100 nm. The linear filter 111, the aperture stop 112, the focusing mirror 113 and the sapphire crystal 114 are all well known in the art and commercially available.
As shown in fig. 3, the laser wavelength conversion device 21 includes a half-wave plate 211, a frequency doubling crystal 212, a glan prism 213, and a high-reflection mirror 214, which are arranged in a line along the propagation direction of the light beam. The half-wave plate 211, frequency doubling crystal 212, Glan prism 213 and high-reflection mirror 214 are all well known in the art and commercially available.
The working principle of the invention is as follows:
when the laser device works, the pulse laser light source 1 emits pulse laser with the spectral center of 800nm and the repetition frequency of 1kHz, and the pulse laser is divided into 2 beams by the beam splitting piece 2, wherein the reflected beam is a probe beam, and the transmitted beam is a pumping beam.
The detection beam realizes spectrum broadening when passing through the white light generating device 11, the white light generating device 11 widens the central wavelength of 800nm into a wide-spectrum laser beam with a wavelength range of 430 nm-1100 nm, the broadening schematic diagram is shown in fig. 4, the broadened detection beam passes through the first concave mirror 8, the second reflective mirror 4 and the second concave mirror 9 and is finally focused on the tested sample 12, and the focus is just positioned on the tested sample 12.
The pump beam is frequency-reduced when passing through the chopper 16, the pump beam after frequency reduction continuously outputs pulse beams in the transmission state of the chopper 16, the beam time interval is 1ms (the pulse period of the original pulse laser with the repetition frequency of 1 kHz), no laser is output in the shielding state of the chopper 16, the chopping frequency reduction result is shown in fig. 5-6, wherein fig. 5 is a schematic diagram in 4-time frequency reduction and fig. 6 is a schematic diagram in 8-time frequency reduction, the pump beam after frequency reduction is incident into a retroreflector 20 fixed on a movable platform of a linear translation stage 18, the linear translation stage 18 controls the amount of motion with the linear direction through a linear translation stage controller 19, the retroreflector 20 can reflect the incident beam in the opposite position parallel direction, and the movable platform of the linear translation stage 18 drives the retroreflector 20 to move in the linear direction, the optical path of the pump beam can be changed, the pump beam reflected by the retroreflector 20 changes the wavelength to the characteristic peak of the tested sample 12 by the laser wavelength changing device 21, and finally focuses to the tested sample 12, and the focal point is located at the position 3cm behind the tested sample 12, so that the spot size of the pump beam at the tested sample 12 is 2 times to 2.5 times the spot size of the probe beam at the tested sample.
The frequency reduction synchronization principle of the invention is as follows: in the frequency reducing process, a pulse signal synchronous with the original laser pulse is generated by the pulse laser light source 1 to trigger the chopper controller 17, the chopper controller 17 controls the rotating speed and the phase of the chopper 16, so that the chopper 16 can reduce the frequency of the original 1kHz pulse beam in an even-number multiple mode as shown in figures 5-6, as can be seen from figures 5-6, the pump beam after frequency reduction can continuously pass through 1 or more pulses in the transmission state of the chopper 16, no laser is output in the shielding state of the chopper 16, the transmission state and the shielding state have the same duration, the chopper controller 17 also generates a pulse signal with the same frequency as the pump beam after frequency reduction output by the chopper 16 and transmits the pulse signal to the digital delay pulse generator 22 through a line, as shown in figures 7-8, the digital delay pulse generator 22 outputs a pulse signal with the frequency 2 times of the pump beam output by the chopper 16 and transmits the pulse signal to the signal acquisition card 23, under the condition that the rising edge triggers the spectrometer 15 to collect signals, the spectrometer 15 is controlled by the signal acquisition card 23 to collect signals only within a half period output by the chopper 16 in each acquisition period, that is, as shown in fig. 7 to 8, within a time interval of occurrence of every two rising edges, the spectrometer 15 can completely collect a time integral signal of a detection beam transmitted through the tested sample 12 under excitation of a pump beam output by the chopper 16, or completely collect a time integral signal of a detection beam transmitted through the tested sample 12 under a state that the pump beam is shielded by the chopper 16 within a time interval of occurrence of every two rising edges. As shown in fig. 9, since the present invention collects the time-integrated signal of the probe beam transmitted through the tested sample 12 under specific conditions, a larger signal amount and a higher signal-to-noise ratio can be obtained in one collection process, so that an ultra-fast transient absorption experiment can obtain an accurate and high-precision test result under the condition that the transmittance of the tested sample to the probe beam is extremely low without changing the original 1kHz pulsed laser light source, thereby saving the test time.
In this embodiment, the spectrometer 15 is manufactured by Avantas, and has a model of AvaSpec-ULS2048 CL-EVO-RS; the manufacturers of the Chopper 16 and the Chopper controller 17 are New Focus, and the model is 3051Optical Chopper; the manufacturer of the linear translation stage 18 and the linear translation stage controller 19 is Aerotech, and the model is ALS10045-S-M-10-MT-LT45 AS-CM; the manufacturing manufacturer of the retroreflector 20 is PLX Inc., and the model is OW-25-3C; the manufacturer of the digital delay pulse generator 22 is Stanford Research Systems, inc, and the model is DG 645; the manufacturer of the signal acquisition card 23 is National Instruments, model PCI-6602.
Claims (9)
1. A frequency-reducing synchronous ultrafast transient absorption test system is characterized in that: the device comprises a pulse laser source (1), a beam splitting sheet (2), a white light generating device (11), a spectrometer (15), a chopper (16), a chopper controller (17), a linear translation table (18), a retroreflector (20), a laser wavelength conversion device (21), a digital delay pulse generator (22), a signal acquisition card (23) and a control system (25), wherein a light beam emitted by the pulse laser source (1) is split into a detection light beam and a pumping light beam through the beam splitting sheet (2), the detection light beam passes through the white light generating device (11) and is focused at a tested sample (12), the detection light beam transmitted through the tested sample (12) is focused and then enters the spectrometer (15), the signal acquisition card (23) and the control system (25) are sequentially connected in series through a line, the pumping light beam passes through the chopper (16) and the retroreflector (20) arranged on the linear translation table (18) and then enters the laser wavelength conversion device (21), and the light beam emitted by the laser wavelength conversion device (21) is focused on a tested sample (12) and at the position of the coincidence position of the detection light beam, the pulse laser light source (1) and the chopper (16) are respectively connected with the chopper controller (17) through lines, the chopper controller (17), the digital delay pulse generator (22) and the signal acquisition card (23) are sequentially connected in series through the lines, and the frequency of the output signal of the digital delay pulse generator (22) is 2 times of the frequency of the output light beam of the chopper (16).
2. The system according to claim 1, wherein: the detection light beam is reflected by the first reflecting mirror (3) and then enters the white light generating device (11), and the light beam emitted by the white light generating device (11) is reflected by the first concave mirror (8), the second reflecting mirror (4) and the second concave mirror (9) in sequence and then focused on the tested sample (12).
3. The system according to claim 1, wherein: the detection beam transmitted through the tested sample (12) is reflected by the third concave mirror (10) and focused by the first focusing mirror (13) in sequence and then enters the spectrometer (15).
4. The system according to claim 1, wherein: the pump light beam is incident into the chopper (16), the light beam output by the chopper (16) is reflected by the third reflector (5) and incident into the retroreflector (20) arranged on the linear translation stage (18), and the light beam emitted in parallel and in reverse direction by the retroreflector (20) is reflected by the fourth reflector (6) and incident into the laser wavelength conversion device (21).
5. The system according to claim 1, wherein: and the light beam emitted by the laser wavelength conversion device (21) sequentially passes through a fifth reflector (7) and a second focusing mirror (14) and is focused on the position, which is superposed with the detection light beam, on the tested sample (12).
6. The system according to claim 1, wherein: the white light generating device (11) comprises a linear filter (111), an aperture diaphragm (112), a focusing mirror (113) and a sapphire crystal (114) which are linearly arranged along the propagation direction of light beams.
7. The system according to claim 1, wherein: the laser wavelength conversion device (21) comprises a half-wave plate (211), a frequency doubling crystal (212), a Glan prism (213) and a high-reflection mirror (214) which are arranged in a straight line along the propagation direction of the light beam.
8. The system according to claim 1, wherein: the probe beam focus falls on the sample (12) to be tested, and the pump beam focus is located behind the sample (12) to be tested.
9. The system according to claim 1, wherein: the pump beam transmitted through the sample (12) to be tested is intercepted by a light shield (24).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910663549.1A CN112285036A (en) | 2019-07-22 | 2019-07-22 | Frequency-reducing synchronous ultrafast transient absorption test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910663549.1A CN112285036A (en) | 2019-07-22 | 2019-07-22 | Frequency-reducing synchronous ultrafast transient absorption test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN112285036A true CN112285036A (en) | 2021-01-29 |
Family
ID=74419172
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910663549.1A Pending CN112285036A (en) | 2019-07-22 | 2019-07-22 | Frequency-reducing synchronous ultrafast transient absorption test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112285036A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113670581A (en) * | 2021-07-30 | 2021-11-19 | 重庆邮电大学 | Transient absorption test system and method for optical element |
| CN113834791A (en) * | 2021-09-22 | 2021-12-24 | 电子科技大学 | Pumping light excitation distinguishable femtosecond transient absorption system and measurement method |
| CN114577146A (en) * | 2022-01-25 | 2022-06-03 | 东莞市三航军民融合创新研究院 | Multi-focal-length laser collimation scanning measuring system |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1258210A (en) * | 1997-03-14 | 2000-06-28 | 艾维希恩公司 | Short pulse mid-infrared parametric generator for surgery |
| CN201378238Y (en) * | 2009-02-24 | 2010-01-06 | 福州高意通讯有限公司 | Beam splitting crystal frequency multiplier |
| CN108667426A (en) * | 2018-07-10 | 2018-10-16 | 中国工程物理研究院激光聚变研究中心 | Carrier dynamics process measurement device applied to photovoltaic device |
| CN109374134A (en) * | 2018-10-30 | 2019-02-22 | 北京工业大学 | Superfast time resolution transient state reflectance spectrum imaging system |
| CN109632726A (en) * | 2018-12-13 | 2019-04-16 | 中山大学 | A kind of molecular dynamics measurement method and its device based on quantum coherent control |
-
2019
- 2019-07-22 CN CN201910663549.1A patent/CN112285036A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1258210A (en) * | 1997-03-14 | 2000-06-28 | 艾维希恩公司 | Short pulse mid-infrared parametric generator for surgery |
| CN201378238Y (en) * | 2009-02-24 | 2010-01-06 | 福州高意通讯有限公司 | Beam splitting crystal frequency multiplier |
| CN108667426A (en) * | 2018-07-10 | 2018-10-16 | 中国工程物理研究院激光聚变研究中心 | Carrier dynamics process measurement device applied to photovoltaic device |
| CN109374134A (en) * | 2018-10-30 | 2019-02-22 | 北京工业大学 | Superfast time resolution transient state reflectance spectrum imaging system |
| CN109632726A (en) * | 2018-12-13 | 2019-04-16 | 中山大学 | A kind of molecular dynamics measurement method and its device based on quantum coherent control |
Non-Patent Citations (1)
| Title |
|---|
| 朱江峰;杜强;王向林;滕浩;韩海年;魏志义;侯洵;: "飞秒钛宝石放大激光脉冲的载波包络相位测量与控制", 物理学报, no. 12, 15 December 2008 (2008-12-15), pages 7755 * |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113670581A (en) * | 2021-07-30 | 2021-11-19 | 重庆邮电大学 | Transient absorption test system and method for optical element |
| CN113670581B (en) * | 2021-07-30 | 2022-07-22 | 重庆邮电大学 | Transient absorption test system and method for optical element |
| CN113834791A (en) * | 2021-09-22 | 2021-12-24 | 电子科技大学 | Pumping light excitation distinguishable femtosecond transient absorption system and measurement method |
| CN113834791B (en) * | 2021-09-22 | 2023-04-11 | 电子科技大学 | Pumping light excitation distinguishable femtosecond transient absorption system and measurement method |
| CN114577146A (en) * | 2022-01-25 | 2022-06-03 | 东莞市三航军民融合创新研究院 | Multi-focal-length laser collimation scanning measuring system |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN112285036A (en) | Frequency-reducing synchronous ultrafast transient absorption test system | |
| CN106769971B (en) | A kind of infrared spectroscopy system based on femtosecond pump probe | |
| CN109186958A (en) | A kind of coaxial laser damage threshold test device of more light and implementation method | |
| CN102128715B (en) | Method for measuring reflectivity of dual-wavelength high reflecting mirror | |
| TWI546533B (en) | Measurement system of real-time spatial-resolved spectrum and time-resolved spectrum and measurement module thereof | |
| WO2021228187A1 (en) | Pulse-type delay dispersion spectrum measurement method and apparatus, and spectral imaging method and apparatus | |
| CN109406441B (en) | Terahertz time-domain spectrometer | |
| CN104849244B (en) | A kind of multi-pulse laser induced breakdown spectroscopy measurement method and system | |
| CN111504612A (en) | Testing arrangement of many light sources laser damage threshold value | |
| EP2559992A1 (en) | Flash photolysis system | |
| CN116165141A (en) | Nanosecond transient absorption spectrum test system and test method thereof | |
| CN102928081A (en) | Acousto-optic adjustable filtering type near-infrared spectrometer | |
| CN110632038A (en) | Light path time-delay double-pulse LIBS device | |
| CN210322772U (en) | Frequency-reduction synchronous ultrafast transient absorption test system | |
| CN112505016A (en) | Compact portable multi-wavelength in-situ Raman detector and detection method thereof | |
| CN112213297B (en) | Paraxial double-pulse LIBS system based on annular light beam | |
| CN112903123B (en) | Method and device for measuring single signal-to-noise ratio boost degree of plasma mirror based on synchronous chirp probe pulse | |
| CN106404695B (en) | Spectrophotometer | |
| CN109781683B (en) | Optical system for synchronously performing time-resolved absorption, fluorescence and terahertz detection | |
| CN110966928B (en) | Laser processing morphological performance time-resolved differential confocal spectrum measuring method and device | |
| CN211927689U (en) | Spectrum detection device | |
| CN204718958U (en) | A kind of multi-pulse laser induced breakdown spectroscopy measuring system | |
| CN217638674U (en) | High-flux nanosecond transient absorption spectrum measuring system | |
| CN102854134B (en) | A kind of optical system of the enhancing optical excitation ripple signal based on energy recovery principle | |
| CN116593399B (en) | Ultra-fast time-resolved shadow imaging system and testing method based on sCMOS |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |